JP2003229262A - Test method of short-circuited pixel of organic el panel, and test device of the same - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a test method of a short-circuited pixel of an organic EL panel capable of easily and simply test the short-circuited pixel. <P>SOLUTION: A direct current voltage for testing the short-circuited pixel, generated at a direct current source 18B, is impressed between a plurality of positive electrodes 13 exposed at the side end part of the organic EL panel 11 and a plurality of negative electrodes 17 with a polarity reversed from that at the light emission, namely, the voltage is impressed by reversing the positive side and negative side. As the voltage with reversed polarity is impressed, current does not flow through the normal pixels G and ammeters 21, 22 do not work. On the contrary, when a short-circuited pixel exists, as the current of the direct current source 18B flows, the existence of the short-circuited pixel and its coordinate can be detected with the two ammeters 21, 22. <P>COPYRIGHT: (C)2003,JPO

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a short-circuited pixel inspection method for an organic EL display panel and its apparatus.

[0002]

2. Description of the Related Art In this type of organic EL display panel, an anode arranged in parallel stripes and a cathode arranged in parallel stripes so as to intersect the anodes intersect each other. An organic EL layer made of an organic electroluminescent material (hereinafter, simply referred to as an organic EL material) is interposed. A pixel as a light emitting element is formed by this one intersection. The organic EL display panel is formed by arranging innumerably the pixels in a matrix. The inspection method of the short-circuited pixel of this organic EL display panel is as follows.
A method is generally used in which a person or an image processing device examines whether or not there is a pixel that does not emit light in a state where each pixel is illuminated by the lighting inspection device.

[0003]

However, in the conventional short-circuit pixel inspection method for an organic EL display panel described above, one pixel is very small, so that it takes a lot of time and labor to find the short-circuit pixel. There is a problem that the inspection work efficiency of the short-circuited pixel cannot be improved. In addition, when a human visually inspects, the defect may be overlooked, and there is a risk that an organic EL display panel having a short-circuited pixel may be distributed in the market. Furthermore, if there is a short-circuited pixel, an excessive current may flow to the short-circuited pixel during the light emission operation, which may result in display failure.

The present invention has been made in view of the conventional problems described above, and an object thereof is to provide a short-circuit pixel inspection method for an organic EL display panel and an apparatus therefor capable of inspecting a short-circuit pixel accurately and easily. Especially.

[0005]

In order to solve the above-mentioned problems, the invention according to claim 1 forms an anode or a cathode in a stripe shape parallel to the inner surface of a transparent substrate. A thin film organic EL layer made of an organic electroluminescent material is formed on the inner surface, and a cathode or an anode is formed in parallel stripes on the inner surface of the organic EL layer so as to intersect with the anode or the cathode. And the organic E present between the intersections of
A method for inspecting a short-circuit pixel of an organic EL display panel in which pixels formed by an L layer are formed in a matrix, wherein a positive voltage of a DC power source for inspecting the short-circuit pixel is applied to the cathode of the organic EL display panel. The gist is that the negative voltage of the DC power supply is applied to the anode of the EL display panel, and the short-circuited pixel is inspected based on the inspection means operated by the current or voltage generated by the short-circuited pixel.

According to the first aspect of the invention, a voltage is applied to the cathode and the anode of the organic EL display panel from the DC power source for short-circuit pixel inspection in the direction opposite to the voltage application direction of the DC power source for light emission. did. Therefore, since the current does not flow to the normal pixel, the inspection unit does not detect the short circuit, and the current from the DC power supply flows through the short circuit portion of the short circuit pixel only when the short circuit pixel exists. Detects a short circuit. Therefore, the presence of the short-circuited pixel and its coordinates can be inspected accurately and easily.

According to a second aspect of the invention, in the short-circuit pixel inspection method for the organic EL display panel according to the first aspect, the inspection of the short-circuit pixels is performed simultaneously for all the pixels of the organic EL display panel. The gist is that it is something that is called.

According to the second aspect of the invention, the inspection of the short-circuited pixels is simultaneously performed on all the pixels, so that the inspection efficiency of the short-circuited pixels can be improved. According to a third aspect of the present invention, in the short-circuit pixel inspection method for the organic EL display panel according to the first or second aspect, the applied voltage of the DC power source for the short-circuit pixel inspection is for light emission for causing the pixel to emit light. The gist is that it is set to 20 V or less, which is equal to or lower than the operating voltage value of the DC power supply.

According to a third aspect of the present invention, when a short-circuited pixel is inspected, an excessive current is prevented from flowing to a normal pixel,
It is possible to prevent the destruction of pixels. According to a fourth aspect of the present invention, an anode or a cathode is formed in a stripe shape parallel to the inner surface of a transparent substrate, and a thin organic EL layer made of an organic electroluminescence (EL) material is formed on the inner surface of the anode or the cathode. And forming cathodes or anodes in parallel stripes on the inner surface of the organic EL layer so as to intersect with the anodes or cathodes, and present between the intersections of the anodes and cathodes and between the intersections. Organic E in which pixels formed by the organic EL layer are formed in a matrix
A short-circuit pixel inspection device for an L display panel, which is connected to a DC power source for short-circuit pixel inspection, an anode terminal of this DC power source through a first lead wire, and is electrically connected to each cathode of each pixel. The first lead is provided with a first contactor and a second contactor which is connected to a cathode terminal of a DC power source for inspecting a short-circuited pixel through a second lead wire and which is electrically connected to the anode of each pixel. The gist of the present invention is to include at least one of the first inspection means provided on the wire and the second inspection means provided on the second lead wire.

According to the fourth aspect of the invention, the presence of the short-circuited pixel can be easily inspected based on the current flowing through the lead wire. According to a fifth aspect of the invention, in the short-circuit pixel inspection device for an organic EL display panel according to the fourth aspect, the first inspection means provided on the first lead wire and the second inspection wire are provided on the second lead wire. The gist of the present invention is to include a second inspection means.

According to the fifth aspect of the present invention, the existence and coordinates of the short-circuited pixel can be accurately and easily inspected based on the current flowing through the lead wire. The invention according to claim 6 is the short-circuit pixel inspection device for an organic EL display panel according to claim 5, wherein the first contact and the second contact are all cathodes and anodes of pixels of the organic EL display panel. The plurality of first inspection means and the second inspection means are provided so as to be simultaneously contacted with each other, and the first inspection means and the second inspection means are respectively provided on the first contactors and the second contactors.

According to the invention described in claim 6, the inspection efficiency of the short-circuited pixel can be improved similarly to the invention described in claim 2. The invention described in claim 7 is the organic E according to claim 6.
In the short-circuit pixel inspection device for the L display panel, each of the first
The gist of the contactor and each second contactor is to utilize a contactor group of a lighting inspection device for pixels of an organic EL display panel.

Since the invention according to claim 7 uses the contact group of the pixel lighting inspection device, it is not necessary to form the inspection device for the short-circuited pixel exclusively, and the number of parts is reduced and the cost is reduced. Can be achieved.

The invention according to claim 8 is the short-circuit pixel inspection apparatus for an organic EL display panel according to any one of claims 5 to 7, wherein the repair is for repairing the short-circuited pixel of the organic EL display panel. The main point is to have a device.

According to the eighth aspect of the invention, the short-circuited pixel can be easily repaired by the repairing device. According to a ninth aspect of the invention, in the short-circuit pixel inspection device for an organic EL display panel according to the eighth aspect, the repairing device is arranged so that a pixel of the organic EL display panel supported at a predetermined position has an X coordinate direction and a Y coordinate direction. The gist is that it is a laser irradiation head that is positionally adjustable.

According to the invention described in claim 9, the short-circuited pixel can be easily repaired by the laser irradiation head.
The invention according to claim 10 is the organic EL according to claim 8.
In the short-circuit pixel inspection device for a display panel, the restoration device is characterized in that it includes a photographing means for magnifying and photographing a pixel of the organic EL display panel.

According to the tenth aspect of the invention, the short-circuited pixel can be enlarged and displayed on the display by the photographing means, and the repair work can be performed accurately and easily.

[0018]

BEST MODE FOR CARRYING OUT THE INVENTION An embodiment of the present invention will be described below with reference to the graphs of FIGS. First, the basic structure of the organic EL display panel 11 will be described with reference to FIG. 2. The organic EL display panel 11 includes a glass substrate 12, an anode 13 formed on the inner surface of the glass substrate 12, and the anode 13. And an organic EL layer M made of an organic electroluminescent material (organic EL material) formed on the inner surface of the. The organic EL layer M includes a hole transport layer 14, a light emitting layer 15 formed on the inner surface of the hole transport layer 14, and an electron transport layer 1 formed on the inner surface of the light emitting layer 15.
6 and 6. Further, the electron transport layer 1
A cathode 17 is formed on the inner surface of 6. Then, a voltage of a DC power supply 18A for lighting inspection or light emission is applied between the anode 13 and the cathode 17 through the first lead wire 19A and the second lead wire 19B, and the hole transport layer 14, the light emitting layer 15 and A current flows in the order of the electron transport layer 16 and the light emitting layer 1
5 is designed to emit light.

The anodes 13 of the organic EL display panel 11 are arranged in parallel stripes, and the cathodes 17 are the anodes 13.
Are arranged in parallel stripes. A pixel G as a light emitting element is formed by the intersection of the anode 13 and the cathode 17 and the organic EL layer M interposed therebetween. The organic EL display panel 11 is
The pixels G are formed by arranging innumerably in a matrix.

As shown in FIG. 1, the organic EL display panel 11 is formed in a planar quadrangular shape, and the ends of the respective anodes 13 are exposed at regular intervals at the side edges of the front side edge. The ends of the cathodes 17 are exposed at the edge at a predetermined pitch.

As shown in FIG. 1, an apparatus for inspecting a pixel G having a defect in a manufacturing process among a large number of pixels G of the organic EL display panel 11 has an anode of a DC power source 18B for inspecting a short-circuited pixel. The terminal and the terminal of the cathode 17 are connected in parallel by a first lead wire 19A. or,
The cathode terminal of the DC power source 18B and the anode 13 are connected in parallel by a second lead wire 19B. Then, the first lead wire 19A is provided with a first inspection means as a first inspection means.
The ammeters 21 are connected in series and the second
Also on the lead wire 19B, the second ammeter 2 as the second inspection means.
2 are connected in series. The switch 20 is connected to the first lead wire 19A.

A method of inspecting a short-circuited pixel generated in the manufacturing process by the short-circuited pixel inspection device configured as described above will be described below. In FIG. 1, the switch 20 is turned on, and the voltage of the DC power source 18B for short-circuit pixel inspection is supplied to the cathodes 17 via the first lead wire 19A and the second lead wire 19B.
And the anode 13 respectively. Then, the DC voltage is applied to the cathodes 17 and the anodes 13 of all the pixels G in the direction opposite to the voltage application direction when the pixels emit light. In this voltage applied state, since no current flows through most of the normal pixels G, the first ammeter 21 and the second ammeter 22 are not activated. On the contrary, when a specific pixel G is short-circuited, a current from the DC power supply 18B flows through the pixel G, so that the first ammeter 21 and the second ammeter 22 corresponding to the short-circuited pixel are activated. The operation of the two ammeters 21 and 22 makes it possible to confirm that a short-circuited pixel exists.

The applied voltage of the DC power source 18B for inspecting the short-circuited pixel is equal to or less than the light emission voltage value of the DC power source 18A for light emission for causing the pixel G to emit light, and is set to, for example, 20 V or less. Has been done.

This embodiment has the following effects. (1) DC power source 1 for short-circuit pixel inspection in the direction opposite to the voltage application direction of the DC power source 18A for light emission with respect to the cathode 17 and the anode 13 exposed at the side edge of the organic EL display panel 11.
A DC voltage was applied from 8B. Therefore, no current flows through the normal pixel G, so that the ammeters 21, 22
Does not operate, and the current from the DC power supply 18B flows through the short-circuited portion of the short-circuited pixel G only when there is the short-circuited pixel G, so the ammeters 21 and 22 are operated. Therefore, the existence of the short-circuited pixel G and its coordinates can be accurately and easily inspected.

(2) Since the DC voltage for inspecting the short circuit from the DC power source 18B is applied to all the pixels of the organic EL display panel 11 at the same time, the existence of the short-circuited pixel and its coordinates are rapidly inspected. be able to.

Next, another embodiment of the present invention will be described with reference to FIG. In this another embodiment, a device for short-circuit pixel inspection is configured by using a part of the lighting inspection device for the organic EL display panel 11, and a laser repair device 35 as a device for repairing the discovered short-circuit pixel is provided. It is equipped with.

A haptic holder 25 is connected via a flexible lead wire 24 to the first ammeter unit 23 supported at a predetermined position by a bracket on a machine frame (not shown). For example, needle-shaped first contacts 26 are attached to the contact holder 25 at a plurality of positions at a predetermined pitch similar to the arrangement pitch of the anodes 13. These first contacts 26
Are electrically contacted with the anode 13 of the organic EL display panel 11, respectively. Further, a probe holder 29 is connected to the second ammeter unit 27 via a flexible lead wire 28. A plurality of, for example, needle-shaped second contacts 30 are attached to the contact holder 29 at a plurality of positions at a predetermined pitch similar to the arrangement pitch of the cathodes 17. These second contacts 30 are electrically contacted with the cathode 17 of the organic EL display panel 11, respectively.

In each of the first ammeter unit 23 and the second ammeter unit 27, each pixel G of the organic EL display panel 11 is connected through a lighting inspection lead wire 31 on the anode side and a lighting inspection lead wire 32 on the cathode side. DC power supply 18A for lighting inspection
DC voltage is applied.

The first ammeter unit 23 and the second ammeter unit 27 include the DC power source 18 for short-circuit pixel inspection.
B is connected by the first lead wire 19A and the second lead wire 19B. The switch 20 applies a short-circuit pixel inspection DC voltage in the opposite direction to the lighting inspection DC voltage application direction, that is, applies a negative voltage to the anode 13 and a positive voltage to the cathode 17. .

A laser repair device 35 as a device for repairing short-circuited pixels is mounted above the lighting / short-circuit inspection device. Explaining this laser repair device 35, a pair of left and right X-axis guide rails 36, 37 mounted via a column (not shown) at a predetermined position of the machine frame has X-axis saddles 38, 39 in the X-axis direction. It is mounted so that it can reciprocate. In addition, Y is placed between both X-axis saddles 38, 39.
An axis guide rail 40 is erected and connected, and a Y axis saddle 41 is mounted below the Y axis guide rail 40 so as to be capable of reciprocating in the Y axis direction. A laser irradiation head 42 is mounted below the Y-axis saddle 41.
An irradiation nozzle 43 is attached to the lower end portion of 2.
Then, a laser beam output from a laser oscillator (not shown) is irradiated toward the found short-circuited pixel G to repair the defective pixel G.

When repairing the short-circuited pixel, since one pixel itself is very small, the operator of the irradiation nozzle 43 can see the laser while watching the monitor television with the microscope 44 as a photographing means provided in the vicinity of the irradiation nozzle 43. Aim the optical axis of the beam at the short-circuited portion of the actual short-circuited pixel G,
I am trying to do repair work.

Next, the operation of the lighting / short-circuited pixel inspection / restoration device constructed as described above will be described. At first,
The organic EL display panel 11 is placed on a support table (not shown), and the organic EL display panel 11 is attached to the first contact 26.
And the cathode 17 is brought into contact with the second contact 30. In this state, the anode 13 is placed between the anode 13 and the cathode 17 from the lighting inspection DC power source 18A.
A voltage is applied so that a DC current flows from the cathode 17 to the cathode 17. Then, almost all the pixels G are energized, and the pixels G emit light.

After the above-mentioned lighting inspection work is completed, the application of the voltage from the lighting inspection DC power supply 18A is stopped, and the short-circuit pixel inspection switch 20 is turned on. Similarly, the short-circuited pixel G is inspected. The X-axis coordinate and the Y-axis coordinate where the short-circuited pixel is located are specified by the ammeters 21 and 22 through which the current flows. Therefore, based on the X and Y coordinate data, an operation signal from a control device (not shown) is sent to the X axis saddle 38,
39 and the Y-axis saddle 41, and the laser irradiation head 42 is moved to the intersection of the X and Y coordinates where the short-circuited pixel G exists. In this state, the operator accurately aligns the optical axis of the irradiation nozzle 43 with the optical axis of the laser at the short-circuited portion of the short-circuited pixel G from the image data taken by the microscope 44. In this state, for example, a laser oscillation device (not shown) transmits a transparent substrate and irradiates laser light whose wavelength and output are adjusted so that only the organic EL layer and the electrodes can be melted, and the short-circuited portion is melted and removed for repair.

The effects of the above-described another embodiment will be described below. (3) A short-circuit pixel inspection device is configured by using the flexible lead wires 24 and 28 on the anode side and the cathode side, which are a part of the lighting inspection device, the contact holders 25 and 29, and the contacts 26 and 30. did. Therefore, the number of parts can be reduced and the manufacturing can be easily and easily performed, as compared with the case where the existing lighting inspection device is effectively used and the short-circuit pixel inspection device is exclusively provided.

(4) Since the laser repair device 35 as a repair device is mounted, it is possible to easily repair the short-circuited pixel after inspecting the short-circuited pixel. (5) Laser irradiation head 42 of laser repair device 35
Since the laser beam output by irradiates the short-circuited portion of the short-circuited pixel, only the short-circuited portion can be accurately repaired.

(6) Since the microscope 44 is provided, the short-circuited pixel is enlarged and photographed, and the optical axis of the laser irradiation device is accurately aligned with the short-circuited portion of one short-circuited pixel.
A short-circuit repair work can be performed quickly and reliably.

The above embodiment may be configured, for example, as follows. In the above embodiment, the laser irradiation head 42 of the laser repair device 35 is movable along the X and Y axis coordinates. However, the laser irradiation head 42 is fixed at a predetermined position and is supported to support the organic EL display panel 11. The table may be configured to be movable to arbitrary coordinates of X and Y coordinates.

In the embodiment shown in FIG. 3, the function of the lighting inspection device may be omitted. A negative voltage may be applied to all of the anodes 13 and a positive voltage may be applied to each of the cathodes 17, so that the short-circuited pixels are sequentially inspected. In this case, the cathode side ammeter 21 is not always necessary.

A positive voltage is applied to all of the cathodes 17 and a negative voltage is applied to each of the anodes 13.
The short-circuited pixels may be sequentially inspected. in this case,
The anode side ammeter 22 is not always necessary.

The pixels of the image display section of the organic EL display panel 11 are divided into a plurality of groups of regions, and the anode 1 for each region is divided.
It is also possible to apply the inspection working voltage of the short-circuited pixel to 3 and the cathode 17.

The voltage for short-circuited pixel inspection may be sequentially applied to each pixel. In this case, the ammeter may be either the cathode side or the anode side. -In place of the ammeter, a voltmeter may be used at a position where the voltage applied to each pixel can be measured. In this case, it is necessary to provide voltage control means (for example, a resistor) between the positive terminal of the DC power supply and the positive terminal of the voltmeter.

In place of the ammeters 21 and 22, for example, a light emitting diode which emits light by an electric current may be used. In the above-described embodiment, the anode 13 and the cathode 17 are exposed to the side edge of the organic EL display panel 11, but lead wires are connected to the anode 13 and the cathode 17, and the ends of the lead wires are connected. A DC voltage for inspecting a short-circuited pixel may be applied to the section.

The technical idea other than the claims understood from the above embodiment will be described below. (Technical idea 1) In the inspection of the short-circuited pixels, a negative voltage is applied to all the anodes, a positive voltage is applied to each cathode, and the short-circuited pixels are sequentially inspected. Display panel short-circuit pixel inspection method.

(Technical idea 2) The inspection of the short-circuited pixel is as follows.
The method for inspecting a short-circuited pixel of an organic EL display panel according to claim 1, wherein a positive voltage is applied to all of the cathodes, a negative voltage is applied to each of the anodes, and short-circuited pixels are sequentially inspected.

(Technical idea 3) The inspection of the short-circuited pixel is as follows.
The organic EL display panel according to claim 1, wherein the pixels of the image display portion of the organic EL display panel are divided into a plurality of groups of regions, and a voltage for inspecting a short-circuited pixel is applied to the anode and the cathode of each region. Short circuit pixel inspection method.

(Technical idea 4) The inspection of the short-circuited pixel is as follows.
The method for inspecting a short-circuited pixel of an organic EL display panel according to claim 1, which is performed by sequentially applying a voltage for inspecting a short-circuited pixel to each pixel.

[0047]

As described in detail above, the present invention is not limited to organic E
The short-circuited pixel of the L display panel can be inspected reliably and easily.

[Brief description of drawings]

FIG. 1 is a schematic perspective view showing an embodiment of a short-circuit pixel inspection device for an organic EL display panel.

FIG. 2 is an explanatory diagram showing light emission and inspection principles of pixels of an organic EL display panel.

FIG. 3 is a schematic perspective view showing an emission / short-circuit pixel inspection / repair device of an organic EL display panel.

[Explanation of symbols]

11 ... Organic EL display panel, 12 ... Substrate, 13 ... Anode,
M ... Organic EL layer, 17 ... Cathode, 18B ... DC power supply for short-circuit pixel inspection, 21, 22 ... Ammeter, 23 ... First ammeter unit, 26 ... First contactor, 27 ... Second ammeter unit, 30 ... 2nd contactor, 35 ... Laser repair device as a repair device, 42 ... Laser irradiation head, 43 ... Irradiation nozzle.

   ─────────────────────────────────────────────────── ─── Continued front page    F-term (reference) 2G036 AA22 AA25 BA32                 3K007 AB11 CC04 DB03                 5C094 AA41 AA43 BA03 BA27 CA19                       GB10                 5G435 AA17 AA19 BB05 CC09 KK05                       KK09 KK10

Claims (10)

[Claims] 1. A transparent substrate is provided with an anode or a cathode in stripes parallel to the inner surface, and a thin organic EL layer made of an organic electroluminescence (EL) material is formed on the inner surface of the anode or the cathode. A cathode or an anode is formed in parallel stripes on the inner surface of the organic EL layer so as to intersect with the anode or the cathode, and the respective intersections of the anode and the cathode, and the organic EL layer existing between the intersections. Organic E in which pixels formed by and are formed in a matrix
A method for inspecting a short-circuit pixel of an L display panel, comprising applying a positive voltage of a DC power supply for inspecting a short-circuit pixel to a cathode of the organic EL display panel and applying a negative voltage of the DC power supply to an anode of the organic EL display panel. However, the organic EL is adapted to inspect the short-circuited pixel based on the inspection means operated by the current or voltage generated by the short-circuited pixel.
Display panel short-circuit pixel inspection method. 2. The method for inspecting a short-circuited pixel for an organic EL display panel according to claim 1, wherein the inspection for the short-circuited pixel is performed simultaneously for all the pixels of the organic EL display panel. 3. The applied voltage of the DC power supply for inspecting the short-circuited pixel is set to 20 V or less, which is equal to or lower than an operating voltage value of the light emission DC power supply for causing the pixel to emit light. 2. The short-circuit pixel inspection method for the organic EL display panel according to 2. 4. An anode or a cathode is formed in a stripe shape parallel to the inner surface of a transparent substrate, and a thin film organic EL layer made of an organic electroluminescence (EL) material is formed on the inner surface of the anode or the cathode. A cathode or an anode is formed in parallel stripes on the inner surface of the organic EL layer so as to intersect with the anode or the cathode, and the respective intersections of the anode and the cathode, and the organic EL layer existing between the intersections. Organic E in which pixels formed by and are formed in a matrix
A short-circuit pixel inspection device for an L display panel, comprising: a DC power source for inspecting a short-circuit pixel and an anode terminal of this DC power source connected via a first lead wire, and electrically contacting each cathode of each pixel. A first contact; and a second contact that is connected to a cathode terminal of a direct current power source for inspecting a short-circuited pixel through a second lead wire and is in electrical contact with the anode of each pixel, the first lead A short-circuit pixel inspection device for an organic EL display panel including at least one of a first inspection means provided on a line and a second inspection means provided on the second lead wire. 5. The short circuit of the organic EL display panel according to claim 4, further comprising a first inspection means provided on the first lead wire and a second inspection means provided on the second lead wire. Pixel inspection device. 6. A plurality of the first contactors and the second contactors are provided so as to simultaneously contact all the cathodes and anodes of the pixels of the organic EL display panel, and the first inspection means and the second inspection means. The short-circuit pixel inspection device for an organic EL display panel according to claim 5, wherein is provided in each of the first contactors and each of the second contactors. 7. The first contactors and the second contactors,
7. The short-circuit pixel inspection device for an organic EL display panel according to claim 6, wherein a contact group of a pixel lighting inspection device for the organic EL display panel is used. 8. The short-circuit pixel inspection device for an organic EL display panel according to claim 5, further comprising a repair device for repairing a short-circuit pixel of the organic EL display panel. 9. The organic EL device according to claim 8, wherein the repairing device is a laser irradiation head mounted so that the position of the pixel of the organic EL display panel supported at a predetermined position can be adjusted in the X coordinate and Y coordinate directions. Display panel short circuit pixel inspection device. 10. The short-circuit pixel inspection device for an organic EL display panel according to claim 9, wherein the repairing device includes a photographing unit for magnifying and photographing a pixel of the organic EL display panel.