JP2003224162A - Ultrasonic flip chip mounting method and its device - Google Patents

Ultrasonic flip chip mounting method and its device

Info

Publication number
JP2003224162A
JP2003224162A JP2002023226A JP2002023226A JP2003224162A JP 2003224162 A JP2003224162 A JP 2003224162A JP 2002023226 A JP2002023226 A JP 2002023226A JP 2002023226 A JP2002023226 A JP 2002023226A JP 2003224162 A JP2003224162 A JP 2003224162A
Authority
JP
Japan
Prior art keywords
ultrasonic
chip mounting
bump
amplitude
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002023226A
Other languages
Japanese (ja)
Inventor
Tadahiro Iwatsuki
忠宏 岩月
Hirobumi Nishiyama
博文 西山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Avionics Co Ltd
Original Assignee
Nippon Avionics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Avionics Co Ltd filed Critical Nippon Avionics Co Ltd
Priority to JP2002023226A priority Critical patent/JP2003224162A/en
Publication of JP2003224162A publication Critical patent/JP2003224162A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/1134Stud bumping, i.e. using a wire-bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01021Scandium [Sc]

Landscapes

  • Wire Bonding (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To reduce damage to an IC chip and a circuit board caused by ultrasonic vibration. <P>SOLUTION: In this ultrasonic flip chip mounting method, a sharp-pointed bump formed on an electrode of an IC chip is positioned at an electrode of the circuit board for ultrasonic bonding. A pressurizing force of the bump for the electrode of the circuit board is increased over time, meanwhile the amplitude of ultrasonic vibration applied to a joint part is decreased in proportion to the increase of the pressurizing force. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】ICチップを単体(ベアチッ
プ)の状態で回路基板に実装する場合に、ICチップの
電極に形成したバンプを回路基板の電極に押圧しつつ超
音波振動を与えて接合する超音波フリップチップ実装方
法と、装置とに関するものである。
BACKGROUND OF THE INVENTION When an IC chip is mounted on a circuit board as a single body (bare chip), the bumps formed on the electrodes of the IC chip are pressed against the electrodes of the circuit board while ultrasonic vibration is applied to bond them. The present invention relates to an ultrasonic flip chip mounting method and device.

【0002】[0002]

【従来の技術】近年、モバイル情報通信関連商品等にお
いては、回路実装基板のよりいっそうの小型、軽量、高
周波化による高性能化と、コストダウンとが切望されて
いる。そのため、ICと回路基板の直接実装が可能なフ
リップチップ実装が有効となる。中でも超音波振動を利
用した金属拡散接合は、低接続抵抗、高接合強度、短時
間接合等の特徴があり、ますます注目を集めている。
2. Description of the Related Art In recent years, in mobile information communication related products and the like, there is a strong demand for higher performance by further miniaturization, weight reduction, and higher frequency of circuit mounting boards and cost reduction. Therefore, flip-chip mounting, which enables direct mounting of the IC and the circuit board, is effective. Among them, metal diffusion bonding using ultrasonic vibration has characteristics such as low connection resistance, high bonding strength and short-time bonding, and is attracting more and more attention.

【0003】ここで図4、図5および図6に基づいて従
来の超音波フリップチップ実装方法を説明する。図4は
ICチップの電極に対するワイヤボンディング工法を利
用したバンプの形成方法を示す。まず、図4(a)にお
いて、キャピラリ201に保持された金ワイヤ202の
先端に放電作用によりボール203を形成し、キャピラ
リ201を矢印アの方向に移動させることによりボール
203をICチップ204の電極205に押圧し接合す
る。
A conventional ultrasonic flip chip mounting method will be described with reference to FIGS. 4, 5 and 6. FIG. 4 shows a method for forming bumps using a wire bonding method for electrodes of an IC chip. First, in FIG. 4A, a ball 203 is formed on the tip of the gold wire 202 held by the capillary 201 by an electric discharge action, and the capillary 201 is moved in the direction of arrow A to move the ball 203 to the electrode of the IC chip 204. 205 is pressed and joined.

【0004】この接合には熱圧着あるいはこれに超音波
振動を加える方法がある。さらに図4(b)で示すよう
に、金ワイヤ202と共にキャピラリ201を矢印イの
方向に移動させることにより金ワイヤ202を引きちぎ
り、電極205上にバンプ206を形成する。このよう
にして形成されたバンプ206は先端206Aが尖った
鋲状の形態を呈する。
For this joining, there is a method of thermocompression bonding or a method of applying ultrasonic vibration thereto. Further, as shown in FIG. 4B, the gold wire 202 is torn off by moving the capillary 201 together with the gold wire 202 in the direction of arrow A, and bumps 206 are formed on the electrodes 205. The bump 206 thus formed has a rivet-like shape with a sharp tip 206A.

【0005】図5は従来の一般的な超音波フリップチッ
プ実装装置の主要部を示す。図6はその接合過程を説明
する図である。まず、前述した方法でバンプ206が形
成されたICチップ204をバンプ206の形成面を下
にして、接合ツール先端101にエア流路10を利用し
て発生させた負圧により吸着保持する。
FIG. 5 shows a main part of a conventional general ultrasonic flip chip mounting apparatus. FIG. 6 is a diagram for explaining the joining process. First, the IC chip 204 on which the bumps 206 are formed by the method described above is sucked and held on the tip 101 of the bonding tool by the negative pressure generated by using the air flow path 10 with the surface on which the bumps 206 are formed facing down.

【0006】さらにステージ103上に回路基板104
を載置し、ICチップ204に形成されたバンプ206
と回路基板104上の電極105とを位置合わせしたの
ち、接合ツール101を加圧手段1により矢印エの方向
に下降させる。この結果バンプ206の先端206Aが
電極105に当接し、先端206Aが僅かにつぶれる。
ここで超音波発振器106は電気エネルギーを振動子1
07に出力し、振動子107は前記電気エネルギーを機
械的な超音波振動に変換する。
Further, a circuit board 104 is mounted on the stage 103.
And the bump 206 formed on the IC chip 204
After aligning the electrode 105 on the circuit board 104 with the electrode 105, the joining tool 101 is lowered in the direction of arrow D by the pressing means 1. As a result, the tip 206A of the bump 206 contacts the electrode 105, and the tip 206A is slightly crushed.
Here, the ultrasonic oscillator 106 transfers electric energy to the vibrator 1
07, and the vibrator 107 converts the electric energy into mechanical ultrasonic vibration.

【0007】さらに前記超音波振動は超音波ホーン10
8により矢印ウ方向の縦波として伝達され、これに連結
あるいは形成された接合ツール101に所定の超音波振
動を与える。このようにして、接合部に回路基板104
の表面と平行方向の超音波振動を付与し、同時に回路基
板104の表面に対して垂直に押圧する矢印エ方向の加
圧力を加える。さらにこの接合部を所定の温度に加熱し
ておくことでバンプ206は図6(a)から図6(b)
のように変形しながら電極105に接合する。
Further, the ultrasonic vibration is generated by the ultrasonic horn 10.
8 transmits as a longitudinal wave in the direction of arrow c, and a predetermined ultrasonic vibration is applied to the welding tool 101 connected or formed thereto. In this way, the circuit board 104 is attached to the joint.
The ultrasonic vibration is applied in a direction parallel to the surface of the circuit board, and at the same time, a pressing force is applied in the direction of arrow D to press the surface of the circuit board 104 perpendicularly. Further, by heating this bonding portion to a predetermined temperature, the bump 206 is formed in the bumps 206 shown in FIGS.
While being deformed as described above, the electrode 105 is joined.

【0008】[0008]

【発明が解決しようとする課題】ここで接合初期の段
階、つまり図6(a)の段階においては、回路基板10
4の表面と平行方向の超音波振動が加わったとしても、
バンプ206の細く突出した部分の撓み変形により超音
波振動の過剰な振幅成分は吸収される。
At the initial stage of joining, that is, the stage of FIG. 6A, the circuit board 10 is to be solved.
Even if ultrasonic vibration in the direction parallel to the surface of 4 is applied,
Excessive amplitude component of ultrasonic vibration is absorbed by the bending deformation of the thin protruding portion of the bump 206.

【0009】しかし、その後矢印エ方向の加圧力を増加
させつつ接合が進行し、バンプ206の形状が図6
(b)のようにつぶれた状態になったときには、バンプ
206におけるあらゆる高さでの水平断面の面積が大き
くなり、前記したバンプ206の撓み変形がほぼ生じな
くなる。
However, after that, the bonding progresses while increasing the pressing force in the direction of arrow D, and the shape of the bump 206 becomes as shown in FIG.
When the bump 206 is in the crushed state, the area of the horizontal cross section of the bump 206 at any height becomes large, and the above-described flexural deformation of the bump 206 almost does not occur.

【0010】このとき超音波振動は、バンプ206と回
路基板104の電極105との接合面、バンプ206と
ICチップ204の電極205との接合面、さらには回
路基板104本体と電極105との接合面、およびIC
チップ204本体と電極205との接合面に対して剪断
力を加えることになる。
At this time, the ultrasonic vibration causes the bonding surface between the bump 206 and the electrode 105 of the circuit board 104, the bonding surface between the bump 206 and the electrode 205 of the IC chip 204, and further the bonding between the main body of the circuit board 104 and the electrode 105. Surface and IC
A shearing force is applied to the joint surface between the body of the chip 204 and the electrode 205.

【0011】また前記4箇所の接合面には、前記剪断力
に加えて、バンプ206の高さ方向の軸心が傾斜しよう
とする力が各接合面に与えるモーメントとなり、特に各
電極の端部では引き剥がし力と押圧力が繰り返し加えら
れることになる。
In addition to the shearing force, a force that the axial center of the bump 206 inclines in the height direction gives a moment to each of the bonding surfaces at the four bonding surfaces. Then, the peeling force and the pressing force are repeatedly applied.

【0012】したがって、矢印エ方向の加圧力が増大し
バンプ206がつぶれた状態においては、超音波振動の
過剰振幅成分はICチップ204と回路基板104の両
電極部にダメージを与える危険因子となる他、せっかく
進行したバンプ206と電極105との接合面や予め接
合していたバンプ206と電極205との接合面にも悪
影響を与える。
Therefore, when the pressure applied in the direction of arrow D increases and the bump 206 is crushed, the excessive amplitude component of the ultrasonic vibration becomes a risk factor that damages both electrode parts of the IC chip 204 and the circuit board 104. In addition, the bonding surface of the bump 206 and the electrode 105, which has advanced with great care, and the bonding surface of the bump 206 and the electrode 205, which have been bonded in advance, are also adversely affected.

【0013】前記した超音波振動の過剰振幅成分による
悪影響は従来の技術では、図5で示す接合ツール101
の吸着面とICチップ204の上面である被吸着面の滑
り作用により回避するしかなかった。前記吸着面と被吸
着面間には矢印エ方向の加圧力により摩擦力が発生する
が、この摩擦力は前記吸着面と被吸着面双方の摩擦係数
と前記加圧力により左右されるため、ワークであるIC
チップ204のバンプ数、あるいはバンプ206の形状
や大きさに応じてコントロールすることが困難であっ
た。
In the prior art, the adverse effect of the above-mentioned excessive amplitude component of the ultrasonic vibration is that of the welding tool 101 shown in FIG.
There is no choice but to avoid it due to the sliding action of the suction surface and the suction surface which is the upper surface of the IC chip 204. A frictional force is generated between the attracted surface and the attracted surface due to the pressing force in the direction of arrow D. Since this frictional force depends on the friction coefficient of both the attracted surface and the attracted surface and the applied pressure, the work IC
It was difficult to control according to the number of bumps on the chip 204 or the shape and size of the bumps 206.

【0014】また接合の繰り返しによる摩耗で前記摩擦
係数が変化するため、長期間摩擦力を一定に保つのが困
難であり、更には矢印エ方向の加圧力が増大するのに伴
ってバンプがつぶれ、超音波振動の過剰振幅成分を吸収
する作用として前記吸着面の滑りに依存する割合が高ま
るのに対して、吸着面の摩擦力は前記加圧力の増大に伴
って増大し滑りにくくなるため、接合の進行に伴う時間
の経過において両者は理想と逆方向の相対的変化を示
す。
Further, since the friction coefficient changes due to wear due to repeated joining, it is difficult to keep the friction force constant for a long period of time, and further, the bump is crushed as the pressing force in the arrow D direction increases. , While the proportion of the action of absorbing the excessive amplitude component of the ultrasonic vibrations that depends on the slip of the suction surface increases, the frictional force of the suction surface increases with the increase of the pressing force and becomes difficult to slip. Both show relative changes in the opposite direction to the ideal over the course of time as the joining progresses.

【0015】つまり、前記加圧力が増大しても前記吸着
面の滑り量が減少しないという、従来から一般に見られ
る超音波接合の現象は、吸着面の摩擦力の増大にもかか
わらず吸着面に滑りを生じさせ得る力でもって、ICチ
ップ204や回路基板104の電極部、更にはバンプ2
06と電極の接合面に機械的負荷(ダメージ)を与えて
いることになる。
In other words, the phenomenon of ultrasonic bonding generally found in the past, in which the amount of slippage of the suction surface does not decrease even if the applied pressure increases, is a phenomenon that the suction surface does not contact the suction surface despite the increase in the friction force. The IC chip 204, the electrode portion of the circuit board 104, and the bumps 2 can be moved by a force that can cause slippage.
This means that a mechanical load (damage) is given to the joint surface between 06 and the electrode.

【0016】本発明は、上記課題を解決するためになさ
れたもので、ICチップ204の電極205や回路基板
104の電極105、加えてバンプ206と両電極20
5,105との接合面に対して与えるダメージを低減す
ることで不良率の低い接合を実現することにより、信頼
性の高い超音波フリップチップ実装方法および装置を提
供することを目的とする。
The present invention has been made in order to solve the above-mentioned problems, and includes the electrodes 205 of the IC chip 204 and the electrodes 105 of the circuit board 104, as well as the bumps 206 and both electrodes 20.
It is an object of the present invention to provide a highly reliable ultrasonic flip chip mounting method and apparatus by realizing a bonding with a low defect rate by reducing the damage given to the bonding surface with 5, 105.

【0017】[0017]

【課題を解決するための手段】本発明は、ICチップの
電極に形成した先端の尖った形状のバンプを、回路基板
の電極に位置合わせして超音波接合する超音波フリップ
チップ実装方法であって、第1の態様として、前記回路
基板の電極に対する前記バンプの加圧力を時間の経過に
伴い増大させる一方、接合部に加える超音波振動の振幅
を、前記加圧力の増大に応じて減少させることを特徴と
する超音波フリップチップ実装方法を提供する。
SUMMARY OF THE INVENTION The present invention is an ultrasonic flip chip mounting method in which bumps having sharp tips formed on electrodes of an IC chip are aligned with electrodes of a circuit board and ultrasonically bonded. As a first aspect, the pressing force of the bump with respect to the electrode of the circuit board is increased with the passage of time, while the amplitude of ultrasonic vibration applied to the joint is decreased in accordance with the increase of the pressing force. An ultrasonic flip chip mounting method is provided.

【0018】第2の態様として、接合部に加える超音波
振動の振幅を、前記加圧力に基づいて制御することを特
徴とする第1の態様として記載の超音波フリップチップ
実装方法を提供する。
As a second aspect, the ultrasonic flip-chip mounting method according to the first aspect is provided, in which the amplitude of the ultrasonic vibration applied to the bonded portion is controlled based on the applied pressure.

【0019】第3の態様として、前記バンプの加圧力を
時間の経過に基づいて制御する一方、接合部に加える超
音波振動の振幅を、前記加圧力と対応付けられた前記時
間の経過に基づいて制御することを特徴とする第1の態
様として記載の超音波フリップチップ実装方法を提供す
る。
In a third aspect, the pressure applied to the bumps is controlled based on the passage of time, while the amplitude of ultrasonic vibration applied to the joint is determined based on the passage of the time associated with the pressure applied. An ultrasonic flip-chip mounting method according to the first aspect is provided.

【0020】第4の態様として、接合部に加える超音波
振動の振幅を、前記加圧力の増大に伴って変化する前記
バンプの変形量に基づいて制御することを特徴とする第
1の態様として記載の超音波フリップチップ実装方法を
提供する。
As a fourth aspect, the amplitude of the ultrasonic vibration applied to the joint is controlled based on the deformation amount of the bump which changes with the increase of the pressing force. An ultrasonic flip chip mounting method as described is provided.

【0021】第5の態様として、接合部に加える超音波
振動の振幅を、前記加圧力の増大に応じて、ほぼ連続的
に減少させることを特徴とする第1から第4のいずれか
の態様として記載の超音波フリップチップ実装方法を提
供する。
As a fifth aspect, any one of the first to fourth aspects is characterized in that the amplitude of ultrasonic vibration applied to the joint is reduced substantially continuously in accordance with the increase in the pressing force. And an ultrasonic flip-chip mounting method described above.

【0022】第6の態様として、回路基板の電極に対す
るバンプの加圧力は、時間経過に対してほぼ連続的に増
大する第1から第5のいずれかの態様として記載の超音
波フリップチップ実装方法を提供する。
As a sixth aspect, the ultrasonic flip-chip mounting method according to any one of the first to fifth aspects, in which the pressure applied to the bump on the electrode of the circuit board increases substantially continuously over time. I will provide a.

【0023】第7の態様として、バンプは、ボンディン
グワイヤの先端に放電作用によって形成したボールをI
Cチップの電極に加圧あるいは加圧に超音波振動を付加
して接合した後、ワイヤを引きちぎることにより形成さ
れる第1から第6のいずれかの態様として記載の超音波
フリップチップ実装方法を提供する。
As a seventh aspect, the bump is a ball formed by a discharge action at the tip of the bonding wire.
The ultrasonic flip-chip mounting method according to any one of the first to sixth aspects, which is formed by tearing a wire after joining the electrode of the C chip by applying pressure or applying ultrasonic vibration to the pressure. provide.

【0024】第8の態様として、ICチップの電極に形
成した先端が尖った形状のバンプを、回路基板の電極に
位置合わせして超音波接合する超音波フリップチップ実
装装置であって、回路基板を載置し保持するステージ
と、ICチップをそのバンプを前記回路基板の電極に位
置合わせして保持する接合ツールと、この接合ツールを
介して、前記バンプに前記回路基板の電極に対する加圧
力を発生させる加圧手段と、前記接合ツールに振動子の
超音波振動を伝達する超音波ホーンと、前記振動子を駆
動する超音波発振器と、前記加圧手段による加圧力を時
間の経過に伴い増大させる一方、超音波振動の振幅を前
記加圧力の増大に応じて減少させるように前記超音波発
振器を制御するコントローラとを備えることを特徴とす
る超音波フリップチップ実装装置を提供する。
As an eighth aspect, there is provided an ultrasonic flip chip mounting device for aligning ultrasonically bonded bumps formed on electrodes of an IC chip and having sharp tips to electrodes of a circuit board. A stage for mounting and holding the IC chip, a bonding tool for aligning and holding the IC chip with the bump on the electrode of the circuit board, and a pressing force applied to the bump on the electrode of the circuit board via the bonding tool. Pressurizing means for generating, ultrasonic horn for transmitting ultrasonic vibration of the vibrator to the welding tool, ultrasonic oscillator for driving the vibrator, and pressure applied by the pressing means increases with time. On the other hand, a controller for controlling the ultrasonic oscillator so as to decrease the amplitude of the ultrasonic vibration in accordance with the increase of the pressing force is provided. To provide a flop mounting apparatus.

【0025】[0025]

【発明の実施の形態】図1は本発明の1実施形態を示す
超音波フリップチップ実装装置の斜視図である。図1に
おいて、回路基板104はステージ103に載置され図
示しない保持手段により位置ずれしないように保持され
る。また、ICチップ204は超音波ホーン108に具
設された接合ツール101の吸着面に、エア流路10を
利用して発生させた負圧により吸着保持される。
1 is a perspective view of an ultrasonic flip-chip mounting apparatus showing an embodiment of the present invention. In FIG. 1, the circuit board 104 is placed on the stage 103 and held by a holding means (not shown) so as not to be displaced. Further, the IC chip 204 is suction-held on the suction surface of the welding tool 101 provided on the ultrasonic horn 108 by the negative pressure generated by using the air flow path 10.

【0026】回路基板104上の電極105とICチッ
プ204の下面に形成してある図示しないバンプ206
を位置合わせしたのち、制御部2から加圧手段1に指令
が発せられ、接合ツール101の下降に伴ってICチッ
プ204が下降する。
Electrodes 105 on the circuit board 104 and bumps 206 (not shown) formed on the lower surface of the IC chip 204.
After aligning, the controller 2 issues a command to the pressurizing means 1 and the IC chip 204 descends as the welding tool 101 descends.

【0027】やがてバンプ206の先端が電極105に
当接し、その後加圧手段1が更に加圧力を増大させると
共に制御部2から発振器106に指令が発せられ、発振
器106は超音波振動の電気エネルギーを振動子107
に出力する。
Eventually, the tip of the bump 206 comes into contact with the electrode 105, and then the pressurizing means 1 further increases the pressing force and a command is issued from the control section 2 to the oscillator 106, which causes the oscillator 106 to generate electric energy of ultrasonic vibration. Oscillator 107
Output to.

【0028】振動子107は入力された電気エネルギー
を機械的な超音波振動に変換して超音波ホーン108に
出力する。超音波ホーン108はこの超音波振動を接合
ツール101に伝達し、バンプ206と電極105は矢
印エ方向の圧力が加えられると共に回路基板104の表
面と平行方向の超音波振動が加えられる。
The vibrator 107 converts the input electric energy into mechanical ultrasonic vibration and outputs it to the ultrasonic horn 108. The ultrasonic horn 108 transmits this ultrasonic vibration to the bonding tool 101, and pressure is applied to the bump 206 and the electrode 105 in the arrow D direction and ultrasonic vibration parallel to the surface of the circuit board 104 is applied.

【0029】このときの加圧力と超音波振動の振幅と時
間との関係を図2に示す。まずバンプ206の先端が電
極105表面に接触した時点Taにおいては、1バンプ
あたりの加圧力Paはゼロである。その後加圧力を増加
させることにより尖ったバンプの先端が所定量(約20
μm)つぶれる。圧力特性Qで示すように、この時刻T
b加圧力Pbの状態で、全てのバンプが電極105に当
接し先端が若干つぶれた状態となり、超音波接合の開始
準備が整う。このPbを第1設定荷重とする。
FIG. 2 shows the relationship between the applied pressure, the amplitude of ultrasonic vibration, and time at this time. First, at the time point Ta when the tip of the bump 206 contacts the surface of the electrode 105, the pressure Pa per bump is zero. After that, the tip of the sharp bump is increased by a predetermined amount (about 20
μm) It collapses. As shown by the pressure characteristic Q, this time T
In the state of b pressure Pb, all the bumps come into contact with the electrodes 105 and the tips are slightly crushed, and the preparation for starting ultrasonic bonding is completed. This Pb is the first set load.

【0030】その後第1設定荷重Pbから更に加圧力を
ほぼ連続的に増大させるのであるが、本実施例では加圧
力がほぼ増減しない時間帯TRが存在する。この時間T
Rは加圧力Pbをトリガーとして、加圧力制御系を高速
圧力制御系に切換えるために設けている時間帯であり、
バンプ206と電極105の接触当初から接合終了まで
制御系を切換えない場合には必要ないものである。
After that, the pressing force is further increased substantially continuously from the first set load Pb, but in this embodiment, there is a time zone TR in which the pressing force does not increase or decrease. This time T
R is a time zone provided for switching the pressure control system to the high-speed pressure control system by using the pressure Pb as a trigger,
It is not necessary if the control system is not switched from the initial contact between the bump 206 and the electrode 105 to the end of bonding.

【0031】圧力特性Qが第1設定荷重Pbから第2設
定荷重Pcに向けて上昇し始めたのち、時刻Tcにおい
て超音波振動の印加を開始する。このときの振幅が最大
設定振幅Scであるのは、接合面の超音波振動による摩
擦熱を利用しバンプ206の接合面を短時間で加熱する
目的に基づいている。またこの時、過剰振幅成分が存在
してもバンプ先端の細く突出した部分の撓み変形で吸収
されるため、ICチップ204と回路基板104の両電
極部に対して大きなダメージを与える心配はない。
After the pressure characteristic Q starts to rise from the first set load Pb toward the second set load Pc, application of ultrasonic vibration is started at time Tc. The reason why the amplitude at this time is the maximum set amplitude Sc is based on the purpose of heating the bonding surface of the bump 206 in a short time by using frictional heat generated by ultrasonic vibration of the bonding surface. At this time, even if there is an excessive amplitude component, it is absorbed by the bending deformation of the thin projecting portion at the tip of the bump, so that there is no fear of serious damage to both electrode parts of the IC chip 204 and the circuit board 104.

【0032】また本実施例では時刻Tcにおいて、超音
波振動の振幅が2値的な立ち上がり方をしているが、こ
れが振幅特性Vで示すような連続的に振幅を増加させる
ような立ち上がりでも良いし、図示しないが段階的に振
幅Scに立ち上がっていく設定を行っても良い。
Further, in the present embodiment, the amplitude of the ultrasonic vibration has a binary rise at time Tc, but this may be such a rise that the amplitude continuously increases as shown by the amplitude characteristic V. However, although not shown, the amplitude Sc may be set to rise gradually.

【0033】その後接合が進行し加圧力(特性Q)の増
加と共にバンプが変形しつぶれていくが、第2設定荷重
Pcに近づいた時点Tdにおいて超音波振動を振幅特性
Aのように振幅Sbに切換える。従来の振幅特性Wのよ
うに接合が終了するまで最大設定振幅Scを維持するの
ではなく、振幅を小さくすることにより過剰振幅成分の
発生を抑える。(請求項1)
Thereafter, the bonding progresses and the bump is deformed and crushed as the applied pressure (characteristic Q) increases, but at the time Td when the second set load Pc is approached, the ultrasonic vibration is changed to the amplitude Sb like the amplitude characteristic A. Switch. Unlike the conventional amplitude characteristic W, the maximum set amplitude Sc is not maintained until the joining is completed, but the amplitude is reduced to suppress the generation of an excessive amplitude component. (Claim 1)

【0034】ここで、振幅特性Aのように2段階あるい
は3段階以上にして段階的に振幅を減少させる方法のほ
か、振幅特性Bのように一定の変化率で減少させる方法
や振幅特性Cのように2次曲線等の関数曲線に沿うよう
に減少させる方法をとって、振幅を連続的に減少させる
方法も有効である。(請求項5)
Here, in addition to the method of gradually decreasing the amplitude in two steps or three or more steps like the amplitude characteristic A, the method of decreasing the amplitude at a constant change rate like the amplitude characteristic B and the amplitude characteristic C. It is also effective to use a method of decreasing along the function curve such as a quadratic curve and a method of continuously decreasing the amplitude. (Claim 5)

【0035】前述したように加圧力の増大に応じて超音
波振動の振幅を減少させる方法として、次の方法が可能
である。第1には図1で示すように、加圧手段の下にロ
ードセル等の圧力センサ3を設け、これから加圧力を制
御部2にフィードバックすることにより、加圧力に基づ
いた超音波振動の振幅制御を行う。(請求項2)
As described above, the following method can be used as a method of decreasing the amplitude of ultrasonic vibrations in response to an increase in pressure. First, as shown in FIG. 1, a pressure sensor 3 such as a load cell is provided below the pressurizing means, and the applied pressure is fed back to the control unit 2 to control the amplitude of ultrasonic vibration based on the applied pressure. I do. (Claim 2)

【0036】第2には図2で示すように、加圧力の制御
を接合工程において経過する時間に基づいて行い、この
加圧力と対応付けられた時間に基づいて超音波振動の振
幅制御を行う。(請求項3)
Secondly, as shown in FIG. 2, the control of the pressing force is performed based on the time elapsed in the joining process, and the amplitude control of the ultrasonic vibration is performed based on the time associated with this pressing force. . (Claim 3)

【0037】第3には図1で示すように、モータである
加圧手段1にあるエンコーダ4から得られる位置(高
さ)情報により、バンプの変形量の最も主要な要素であ
るつぶれ量を制御部2にフィードバックし、このつぶれ
量に基づいて超音波振動の振幅制御を行う。図3にこの
場合の高さ特性Hと超音波振動の振幅制御との関係を示
す。(請求項4)
Thirdly, as shown in FIG. 1, the collapse amount, which is the most important factor of the deformation amount of the bump, is determined by the position (height) information obtained from the encoder 4 in the pressurizing means 1 which is a motor. The amplitude is fed back to the control unit 2 and the amplitude of ultrasonic vibration is controlled based on this amount of collapse. FIG. 3 shows the relationship between the height characteristic H and the amplitude control of ultrasonic vibration in this case. (Claim 4)

【0038】[0038]

【発明の効果】本発明によれば、加圧力の増大に応じて
超音波振動の振幅を減少させることにより、接合が進行
することによりつぶれたバンプが超音波振動の過剰振幅
成分を吸収できなくなり、ICチップ204や回路基板
104の電極部にダメージを与えることを防ぎ、接合の
工程での歩留まりを向上させ、信頼性の高いフリップチ
ップ実装を実現することが可能となる。(請求項1)
According to the present invention, the amplitude of ultrasonic vibration is reduced in accordance with the increase of the pressing force, so that the bumps crushed due to the progress of bonding cannot absorb the excessive amplitude component of ultrasonic vibration. It is possible to prevent damage to the electrode parts of the IC chip 204 and the circuit board 104, improve the yield in the joining process, and realize highly reliable flip chip mounting. (Claim 1)

【0039】また発明の詳細な説明で示した鋲状バンプ
に限らず、あらゆる製法で形成されたミクロな目で見て
複数の尖った先端を有するバンプに関しても同様の作用
が生じ、フリップチップ実装の品質を高めるのに有効で
ある。(請求項1)
Further, not only the tack-shaped bumps described in the detailed description of the invention, but also the bumps having a plurality of sharp tips as seen by microscopic eyes formed by any manufacturing method, the same action occurs, and flip chip mounting is performed. It is effective in improving the quality of. (Claim 1)

【0040】ここで、超音波振動の振幅制御を加圧力情
報に基づいて行うことにより、加圧力の変化が何らかの
要因で時間的に前後しても、その時点での加圧力に最適
な超音波振動の振幅が得られる。(請求項2)
Here, by controlling the amplitude of the ultrasonic vibration based on the pressing force information, even if the change in the pressing force fluctuates in time due to some factor, the ultrasonic wave that is optimal for the pressing force at that time is The amplitude of vibration is obtained. (Claim 2)

【0041】また、加圧力の制御を時間の経過に基づい
て行い、超音波振動の振幅制御を加圧力と対応付けられ
た時間に基づいて行うことにより、接合動作の時間管理
が容易に行え、さらに制御が単純に統一されて制御系全
体のコントロールが容易になる。(請求項3)
Further, the control of the pressing force is performed based on the passage of time, and the amplitude control of the ultrasonic vibration is performed based on the time associated with the pressing force, whereby the time management of the bonding operation can be easily performed. Furthermore, the controls are simply unified to facilitate control of the entire control system. (Claim 3)

【0042】また、超音波振動の振幅制御をバンプの変
形量に基づいて行うことにより、最も制御の目的に近い
情報をフィードバックすることができ、バンプの素材の
違いや物性のばらつきに左右されない制御が実現でき
る。(請求項4)
Further, by controlling the amplitude of ultrasonic vibration based on the amount of deformation of the bump, information closest to the purpose of control can be fed back, and control that is not affected by differences in the material of the bump or variations in physical properties. Can be realized. (Claim 4)

【0043】また、超音波振動の振幅を加圧力の増大に
応じてほぼ連続的に減少させることで、段階的に減少さ
せるよりも、拡散接合自体に与える振幅変動の影響を適
切にコントロールできる。(請求項5)
Further, by decreasing the amplitude of the ultrasonic vibration almost continuously in accordance with the increase of the pressing force, the influence of the amplitude fluctuation on the diffusion bonding itself can be appropriately controlled rather than decreasing it stepwise. (Claim 5)

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の1実施の形態を示す超音波フリップチ
ップ実装装置の斜視図
FIG. 1 is a perspective view of an ultrasonic flip-chip mounting apparatus showing an embodiment of the present invention.

【図2】加圧力制御と超音波振動の振幅制御の一例を示
す図
FIG. 2 is a diagram showing an example of pressure control and ultrasonic vibration amplitude control.

【図3】バンプの高さ情報と超音波振動の振幅制御の一
例を示す図
FIG. 3 is a diagram showing an example of bump height information and amplitude control of ultrasonic vibration.

【図4】バンプ形成方法を示す断面図FIG. 4 is a sectional view showing a bump forming method.

【図5】従来の超音波フリップチップ実装装置の主要部
を示す図
FIG. 5 is a diagram showing a main part of a conventional ultrasonic flip chip mounting device.

【図6】従来の接合過程を説明する図FIG. 6 is a diagram illustrating a conventional joining process.

【符号の説明】[Explanation of symbols]

1 加圧手段 2 制御部 3 圧力センサ 4 エンコーダ 10 エア流路 101 接合ツール 103 ステージ 104 回路基板 105 電極 106 超音波発振器 107 振動子 108 超音波ホーン 204 ICチップ 205 電極 206 バンプ 1 Pressurizing means 2 control unit 3 Pressure sensor 4 encoder 10 air flow paths 101 welding tool 103 stage 104 circuit board 105 electrode 106 ultrasonic oscillator 107 oscillator 108 Ultrasonic horn 204 IC chip 205 electrode 206 bump

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 ICチップの電極に形成した先端の尖っ
た形状のバンプを、回路基板の電極に位置合わせして超
音波接合する超音波フリップチップ実装方法であって、 前記回路基板の電極に対する前記バンプの加圧力を時間
の経過に伴い増大させる一方、 接合部に加える超音波振動の振幅を、前記加圧力の増大
に応じて減少させることを特徴とする超音波フリップチ
ップ実装方法。
1. An ultrasonic flip-chip mounting method in which bumps having sharp tips formed on electrodes of an IC chip are aligned with the electrodes of a circuit board and ultrasonically bonded to the electrodes of the circuit board. An ultrasonic flip-chip mounting method characterized in that the pressure applied to the bumps is increased with the passage of time, while the amplitude of ultrasonic vibration applied to the joint is decreased in accordance with the increase in the pressure applied.
【請求項2】 接合部に加える超音波振動の振幅を、前
記加圧力に基づいて制御することを特徴とする請求項1
の超音波フリップチップ実装方法。
2. The amplitude of ultrasonic vibration applied to the joint portion is controlled based on the applied pressure.
Ultrasonic flip chip mounting method.
【請求項3】 前記バンプの加圧力を時間の経過に基づ
いて制御する一方、 接合部に加える超音波振動の振幅を、前記加圧力と対応
付けられた前記時間の経過に基づいて制御することを特
徴とする請求項1の超音波フリップチップ実装方法。
3. The pressure applied to the bumps is controlled based on the passage of time, while the amplitude of ultrasonic vibration applied to the joint is controlled based on the passage of the time associated with the applied pressure. The ultrasonic flip-chip mounting method according to claim 1, wherein
【請求項4】 接合部に加える超音波振動の振幅を、前
記加圧力の増大に伴って変化する前記バンプの変形量に
基づいて制御することを特徴とする請求項1の超音波フ
リップチップ実装方法。
4. The ultrasonic flip-chip mounting according to claim 1, wherein the amplitude of ultrasonic vibration applied to the bonded portion is controlled based on the deformation amount of the bump which changes with the increase of the pressing force. Method.
【請求項5】 接合部に加える超音波振動の振幅を、前
記加圧力の増大に応じて、ほぼ連続的に減少させること
を特徴とする請求項1から4のいずれかに記載の超音波
フリップチップ実装方法。
5. The ultrasonic flip according to any one of claims 1 to 4, wherein the amplitude of ultrasonic vibration applied to the joint is reduced substantially continuously in accordance with the increase in the pressing force. Chip mounting method.
【請求項6】 回路基板の電極に対するバンプの加圧力
は、時間経過に対してほぼ連続的に増大する請求項1か
ら5のいずれかに記載の超音波フリップチップ実装方
法。
6. The ultrasonic flip-chip mounting method according to claim 1, wherein the pressure applied to the bump on the electrode of the circuit board increases substantially continuously over time.
【請求項7】 バンプは、ボンディングワイヤの先端に
放電作用によって形成したボールをICチップの電極に
加圧あるいは加圧に超音波振動を付加して接合した後、
ワイヤを引きちぎることにより形成される請求項1から
6のいずれかに記載の超音波フリップチップ実装方法。
7. The bump is bonded to a ball formed by a discharge action at the tip of a bonding wire by pressure or ultrasonic vibration applied to the electrode of the IC chip, and then bonded.
The ultrasonic flip-chip mounting method according to claim 1, wherein the ultrasonic flip-chip mounting method is formed by tearing a wire.
【請求項8】 ICチップの電極に形成した先端が尖っ
た形状のバンプを、回路基板の電極に位置合わせして超
音波接合する超音波フリップチップ実装装置であって、 回路基板を載置し保持するステージと、 ICチップをそのバンプを前記回路基板の電極に位置合
わせして保持する接合ツールと、 この接合ツールを介して、前記バンプに前記回路基板の
電極に対する加圧力を発生させる加圧手段と、 前記接合ツールに振動子の超音波振動を伝達する超音波
ホーンと、 前記振動子を駆動する超音波発振器と、 前記加圧手段による加圧力を時間の経過に伴い増大させ
る一方,超音波振動の振幅を前記加圧力の増大に応じて
減少させるように前記超音波発振器を制御するコントロ
ーラと、 を備えることを特徴とする超音波フリップチップ実装装
置。
8. An ultrasonic flip-chip mounting device for ultrasonically bonding a bump having a sharp tip formed on an electrode of an IC chip to an electrode of a circuit board by positioning the bump on the circuit board. A stage for holding, a bonding tool for holding the IC chip with its bump aligned with the electrode of the circuit board, and a pressurizing force for generating a pressing force to the electrode of the circuit board on the bump via the bonding tool. Means, an ultrasonic horn for transmitting ultrasonic vibration of a vibrator to the welding tool, an ultrasonic oscillator for driving the vibrator, and a pressure applied by the pressurizing means that increases with the passage of time. An ultrasonic flip-chip mounting device, comprising: a controller that controls the ultrasonic oscillator so as to reduce the amplitude of the sonic vibration according to the increase in the pressing force.
JP2002023226A 2002-01-31 2002-01-31 Ultrasonic flip chip mounting method and its device Pending JP2003224162A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002023226A JP2003224162A (en) 2002-01-31 2002-01-31 Ultrasonic flip chip mounting method and its device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002023226A JP2003224162A (en) 2002-01-31 2002-01-31 Ultrasonic flip chip mounting method and its device

Publications (1)

Publication Number Publication Date
JP2003224162A true JP2003224162A (en) 2003-08-08

Family

ID=27745996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002023226A Pending JP2003224162A (en) 2002-01-31 2002-01-31 Ultrasonic flip chip mounting method and its device

Country Status (1)

Country Link
JP (1) JP2003224162A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008147367A (en) * 2006-12-08 2008-06-26 Sony Corp Semiconductor device and its manufacturing method
CN106206339A (en) * 2016-07-12 2016-12-07 中南大学 A kind of micro-the hottest ultrasonic back bonding method of copper intercolumniation copper copper and device thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008147367A (en) * 2006-12-08 2008-06-26 Sony Corp Semiconductor device and its manufacturing method
CN106206339A (en) * 2016-07-12 2016-12-07 中南大学 A kind of micro-the hottest ultrasonic back bonding method of copper intercolumniation copper copper and device thereof
CN106206339B (en) * 2016-07-12 2018-12-21 中南大学 The ultrasonic back bonding method and device thereof of copper copper directly heat between a kind of micro- copper post

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