JP2003214958A5 - - Google Patents

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Publication number
JP2003214958A5
JP2003214958A5 JP2002011498A JP2002011498A JP2003214958A5 JP 2003214958 A5 JP2003214958 A5 JP 2003214958A5 JP 2002011498 A JP2002011498 A JP 2002011498A JP 2002011498 A JP2002011498 A JP 2002011498A JP 2003214958 A5 JP2003214958 A5 JP 2003214958A5
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JP
Japan
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JP2002011498A
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JP2003214958A (ja
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Priority to JP2002011498A priority Critical patent/JP2003214958A/ja
Priority claimed from JP2002011498A external-priority patent/JP2003214958A/ja
Priority to US10/341,364 priority patent/US7196796B2/en
Publication of JP2003214958A publication Critical patent/JP2003214958A/ja
Publication of JP2003214958A5 publication Critical patent/JP2003214958A5/ja
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JP2002011498A 2002-01-21 2002-01-21 波長検出装置、レーザ装置及び波長検出方法 Pending JP2003214958A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002011498A JP2003214958A (ja) 2002-01-21 2002-01-21 波長検出装置、レーザ装置及び波長検出方法
US10/341,364 US7196796B2 (en) 2002-01-21 2003-01-14 Wavelength detecting apparatus, laser apparatus, and wavelength detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002011498A JP2003214958A (ja) 2002-01-21 2002-01-21 波長検出装置、レーザ装置及び波長検出方法

Publications (2)

Publication Number Publication Date
JP2003214958A JP2003214958A (ja) 2003-07-30
JP2003214958A5 true JP2003214958A5 (ja) 2005-07-21

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JP2002011498A Pending JP2003214958A (ja) 2002-01-21 2002-01-21 波長検出装置、レーザ装置及び波長検出方法

Country Status (2)

Country Link
US (1) US7196796B2 (ja)
JP (1) JP2003214958A (ja)

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US7310153B2 (en) * 2004-08-23 2007-12-18 Palo Alto Research Center, Incorporated Using position-sensitive detectors for wavelength determination
US7317536B2 (en) * 2005-06-27 2008-01-08 Cymer, Inc. Spectral bandwidth metrology for high repetition rate gas discharge lasers
US8437582B2 (en) * 2005-12-22 2013-05-07 Palo Alto Research Center Incorporated Transmitting light with lateral variation
JP2008016698A (ja) * 2006-07-07 2008-01-24 Sony Corp レーザ光源システムおよびレーザ光源の制御方法
JP5286670B2 (ja) * 2007-01-17 2013-09-11 株式会社島津製作所 分光光度計
US9164037B2 (en) * 2007-01-26 2015-10-20 Palo Alto Research Center Incorporated Method and system for evaluation of signals received from spatially modulated excitation and emission to accurately determine particle positions and distances
US8821799B2 (en) 2007-01-26 2014-09-02 Palo Alto Research Center Incorporated Method and system implementing spatially modulated excitation or emission for particle characterization with enhanced sensitivity
US7817281B2 (en) * 2007-02-05 2010-10-19 Palo Alto Research Center Incorporated Tuning optical cavities
US7817276B2 (en) * 2007-02-05 2010-10-19 Palo Alto Research Center Incorporated Distinguishing objects
US7633629B2 (en) * 2007-02-05 2009-12-15 Palo Alto Research Center Incorporated Tuning optical cavities
US7852490B2 (en) * 2007-02-05 2010-12-14 Palo Alto Research Center Incorporated Implanting optical cavity structures
US7936463B2 (en) 2007-02-05 2011-05-03 Palo Alto Research Center Incorporated Containing analyte in optical cavity structures
US8320983B2 (en) * 2007-12-17 2012-11-27 Palo Alto Research Center Incorporated Controlling transfer of objects affecting optical characteristics
US8373860B2 (en) 2008-02-01 2013-02-12 Palo Alto Research Center Incorporated Transmitting/reflecting emanating light with time variation
US8629981B2 (en) 2008-02-01 2014-01-14 Palo Alto Research Center Incorporated Analyzers with time variation based on color-coded spatial modulation
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JP6210526B2 (ja) 2011-07-06 2017-10-11 ギガフォトン株式会社 波長検出器、波長較正システム
US8723140B2 (en) 2011-08-09 2014-05-13 Palo Alto Research Center Incorporated Particle analyzer with spatial modulation and long lifetime bioprobes
US9029800B2 (en) 2011-08-09 2015-05-12 Palo Alto Research Center Incorporated Compact analyzer with spatial modulation and multiple intensity modulated excitation sources
JP5969193B2 (ja) * 2011-10-31 2016-08-17 京セラクリスタルデバイス株式会社 エタロンフィルタ
US9207354B2 (en) * 2012-12-21 2015-12-08 Baker Hughes Incorporated Apparatus and method for estimating characteristics of a sensor containing interferometer
JP6201484B2 (ja) * 2013-07-26 2017-09-27 セイコーエプソン株式会社 光学フィルターデバイス、光学モジュール、電子機器、及びｍｅｍｓデバイス
JP6384239B2 (ja) 2014-09-29 2018-09-05 セイコーエプソン株式会社 光学フィルターデバイス、光学モジュール、及び電子機器
WO2016084263A1 (ja) 2014-11-28 2016-06-02 ギガフォトン株式会社 狭帯域化レーザ装置
ITUB20160888A1 (it) * 2016-02-19 2017-08-19 Getters Spa Sistema led
JP6770574B2 (ja) * 2016-05-19 2020-10-14 ギガフォトン株式会社 波長検出装置
CN109314366A (zh) * 2016-07-22 2019-02-05 极光先进雷射株式会社 窄带化KrF准分子激光装置
US11073440B2 (en) * 2018-07-31 2021-07-27 Namuga, Co., Ltd. Hermetic sealed beam projector module and method for manufacturing the same
WO2020137629A1 (ja) * 2018-12-28 2020-07-02 株式会社フジキン 濃度測定装置
US11131595B2 (en) * 2019-07-26 2021-09-28 Raytheon Technologies Corporation Pressure sensing device and method for using the same
CN111289124B (zh) 2020-03-31 2021-03-05 北京科益虹源光电技术有限公司 激光器波长测量装置及方法
US10948356B1 (en) * 2020-06-22 2021-03-16 Quantum Valley Ideas Laboratories Measuring wavelength of light
CN115720624A (zh) * 2020-06-24 2023-02-28 西默有限公司 标准具中测量误差的确定
US11048047B1 (en) 2021-02-03 2021-06-29 Quantum Valley Ideas Laboratories Housing an etalon in a frequency reference system
JP7128315B1 (ja) 2021-03-26 2022-08-30 アンリツ株式会社 光スペクトラムアナライザ及び波長校正制御方法

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