JP2003214945A - 発光素子の外部量子効率測定方法及び装置 - Google Patents

発光素子の外部量子効率測定方法及び装置

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Publication number
JP2003214945A
JP2003214945A JP2002015940A JP2002015940A JP2003214945A JP 2003214945 A JP2003214945 A JP 2003214945A JP 2002015940 A JP2002015940 A JP 2002015940A JP 2002015940 A JP2002015940 A JP 2002015940A JP 2003214945 A JP2003214945 A JP 2003214945A
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JP
Japan
Prior art keywords
light
quantum efficiency
external quantum
integrating sphere
emitting element
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Pending
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JP2002015940A
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English (en)
Japanese (ja)
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JP2003214945A5 (enExample
Inventor
Yoshiaki Ichino
善朗 市野
Ichiro Saito
一朗 齊藤
Yoji Shitomi
洋司 蔀
Kiyoshi Yatsuse
清志 八瀬
Tokuyuki Takada
徳幸 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
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National Institute of Advanced Industrial Science and Technology AIST
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Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Priority to JP2002015940A priority Critical patent/JP2003214945A/ja
Publication of JP2003214945A publication Critical patent/JP2003214945A/ja
Publication of JP2003214945A5 publication Critical patent/JP2003214945A5/ja
Pending legal-status Critical Current

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Led Devices (AREA)
JP2002015940A 2002-01-24 2002-01-24 発光素子の外部量子効率測定方法及び装置 Pending JP2003214945A (ja)

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JP2002015940A JP2003214945A (ja) 2002-01-24 2002-01-24 発光素子の外部量子効率測定方法及び装置

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JP2002015940A JP2003214945A (ja) 2002-01-24 2002-01-24 発光素子の外部量子効率測定方法及び装置

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JP2003214945A true JP2003214945A (ja) 2003-07-30
JP2003214945A5 JP2003214945A5 (enExample) 2004-07-15

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Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009001846A1 (ja) * 2007-06-27 2008-12-31 Shinshu University 発光量子効率測定装置
WO2011108813A3 (en) * 2010-03-02 2012-01-12 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
WO2012018182A3 (en) * 2010-08-02 2012-05-31 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
CN103308280A (zh) * 2013-05-24 2013-09-18 中国电子科技集团公司第四十一研究所 一种ccd器件量子效率校准装置及校准方法
CN103808497A (zh) * 2014-03-05 2014-05-21 中国科学院半导体研究所 一种测量led内量子效率的方法
CN104142226A (zh) * 2014-08-12 2014-11-12 中国电子科技集团公司第四十一研究所 一种ccd器件量子效率测量装置及方法
CN105277340A (zh) * 2015-11-17 2016-01-27 中国科学院长春光学精密机械与物理研究所 采用光谱分解技术识别白光led光源组件的方法
CN105738339A (zh) * 2016-03-30 2016-07-06 东南大学 一种荧光粉量子效率测量装置
JP2017120200A (ja) * 2015-12-28 2017-07-06 国立研究開発法人産業技術総合研究所 分光放射測定装置
CN107228710A (zh) * 2017-05-26 2017-10-03 厦门大学 一种发光二极管量子效率测量装置及其测量方法
CN109211524A (zh) * 2018-12-10 2019-01-15 中国人民解放军国防科技大学 大功率光纤激光器参数一体化同步测试装置
CN111323408A (zh) * 2020-03-31 2020-06-23 上海复享光学股份有限公司 微区下发光件的外量子效率检测系统及其检测方法
CN112539831A (zh) * 2020-12-11 2021-03-23 中国科学院西安光学精密机械研究所 面阵探测器的标定方法、系统及积分球均匀性标定方法
CN117411546A (zh) * 2023-12-11 2024-01-16 南昌大学 一种led通信能力评价方法及系统

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009001846A1 (ja) * 2007-06-27 2008-12-31 Shinshu University 発光量子効率測定装置
JP2009008509A (ja) * 2007-06-27 2009-01-15 Shinshu Univ 発光量子効率測定装置
WO2011108813A3 (en) * 2010-03-02 2012-01-12 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
KR101108604B1 (ko) 2010-03-02 2012-01-31 한국표준과학연구원 적분구 광도계 및 그 측정 방법
US8451438B2 (en) 2010-03-02 2013-05-28 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
WO2012018182A3 (en) * 2010-08-02 2012-05-31 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
US8749774B2 (en) 2010-08-02 2014-06-10 Korea Research Institute Of Standards And Science Integrating sphere photometer and measuring method of the same
CN103308280A (zh) * 2013-05-24 2013-09-18 中国电子科技集团公司第四十一研究所 一种ccd器件量子效率校准装置及校准方法
CN103808497A (zh) * 2014-03-05 2014-05-21 中国科学院半导体研究所 一种测量led内量子效率的方法
CN104142226A (zh) * 2014-08-12 2014-11-12 中国电子科技集团公司第四十一研究所 一种ccd器件量子效率测量装置及方法
CN105277340A (zh) * 2015-11-17 2016-01-27 中国科学院长春光学精密机械与物理研究所 采用光谱分解技术识别白光led光源组件的方法
JP2017120200A (ja) * 2015-12-28 2017-07-06 国立研究開発法人産業技術総合研究所 分光放射測定装置
CN105738339A (zh) * 2016-03-30 2016-07-06 东南大学 一种荧光粉量子效率测量装置
CN105738339B (zh) * 2016-03-30 2018-09-21 东南大学 一种荧光粉量子效率测量装置
CN107228710A (zh) * 2017-05-26 2017-10-03 厦门大学 一种发光二极管量子效率测量装置及其测量方法
CN107228710B (zh) * 2017-05-26 2018-08-07 厦门大学 一种发光二极管量子效率测量装置及其测量方法
CN109211524A (zh) * 2018-12-10 2019-01-15 中国人民解放军国防科技大学 大功率光纤激光器参数一体化同步测试装置
CN111323408A (zh) * 2020-03-31 2020-06-23 上海复享光学股份有限公司 微区下发光件的外量子效率检测系统及其检测方法
CN112539831A (zh) * 2020-12-11 2021-03-23 中国科学院西安光学精密机械研究所 面阵探测器的标定方法、系统及积分球均匀性标定方法
CN112539831B (zh) * 2020-12-11 2021-10-12 中国科学院西安光学精密机械研究所 面阵探测器的标定方法、系统及积分球均匀性标定方法
CN117411546A (zh) * 2023-12-11 2024-01-16 南昌大学 一种led通信能力评价方法及系统
CN117411546B (zh) * 2023-12-11 2024-02-09 南昌大学 一种led通信能力评价方法及系统

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