JP2003203218A - Visual inspection device and method - Google Patents

Visual inspection device and method

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Publication number
JP2003203218A
JP2003203218A JP2002001141A JP2002001141A JP2003203218A JP 2003203218 A JP2003203218 A JP 2003203218A JP 2002001141 A JP2002001141 A JP 2002001141A JP 2002001141 A JP2002001141 A JP 2002001141A JP 2003203218 A JP2003203218 A JP 2003203218A
Authority
JP
Japan
Prior art keywords
shape
data
inspection
image data
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002001141A
Other languages
Japanese (ja)
Inventor
Toshiro Ishii
敏郎 石井
Katsumi Fujiwara
勝美 藤原
Susumu Haga
進 芳賀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2002001141A priority Critical patent/JP2003203218A/en
Publication of JP2003203218A publication Critical patent/JP2003203218A/en
Withdrawn legal-status Critical Current

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  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To shorten the inspection time without increasing the mounting scale by collectively performing the visual inspections of two or more shapes. <P>SOLUTION: This visual inspection device for determining the quality of an object of inspection by inputting the image data of the object of inspection and comparing the standard data of the object of inspection with the input image data comprises an adjacent shape integrating means for integrating two or more adjacent inspection object shapes of the input image data to one inspection object shape, and an inspection means. The inspection means compares the standard data with the integrated shape data. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、外観検査装置、お
よび外観検査方法に関し、特に、ICパッケージやプリ
ント基板上の端子等の(検査対象の)形状を検査する、
外観検査装置および外観検査方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a visual inspection apparatus and a visual inspection method, and in particular, it inspects shapes (objects to be inspected) of IC packages, terminals on printed circuit boards, and the like.
The present invention relates to an appearance inspection device and an appearance inspection method.

【0002】[0002]

【従来の技術】一般に外観検査装置では、あらかじめC
AD等の設計データから外観検査対象の形状情報と形状
の位置情報とを含む標準データを生成して保持し、カメ
ラ等で構成される撮像系により検査すべき画像データが
入力されると、入力画像データ中の、形状情報と形状の
位置情報とを含む形状データを抽出する。
2. Description of the Related Art Generally, in a visual inspection apparatus, C
The standard data including the shape information of the appearance inspection target and the position information of the shape is generated from the design data such as AD and held, and when the image data to be inspected is input by the imaging system including the camera, the input is performed. Shape data including shape information and shape position information in the image data is extracted.

【0003】図2は、外観検査装置における入力画像と
検査対象形状の抽出概要例を示す。この例では、カメラ
からの入力画像に、検査対象となる形状Aの端子3個、
形状Bの端子1個のほかに、周囲の検査対象外の不要な
パターンが含まれている。外観検査装置では、あらかじ
め保持する標準データから検査対象のエリア信号を生成
し、検査対象形状のあるべき位置以外の検査に不要なパ
ターンを除去し、検査対象の形状データを抽出する。
FIG. 2 shows an example of an outline of extraction of an input image and an inspection target shape in the appearance inspection apparatus. In this example, in the input image from the camera, three terminals of the shape A to be inspected,
In addition to one terminal of shape B, the surrounding unnecessary patterns not included in the inspection target are included. The appearance inspection apparatus generates an area signal to be inspected from standard data held in advance, removes a pattern unnecessary for inspection other than a position where the shape to be inspected should be, and extracts shape data to be inspected.

【0004】次に、抽出した形状データと標準データと
を比較し、形状の欠け/突起、消失等の不良を検出し、
良否判定を行う。図3は検出したい不良例と検出不要の
小変形例を示す。左上側に示す端子の多少の変形は動作
上問題がないため検出不要であるが、左下の大きな変形
や、右側の端子の欠落(消失不良)は検出する必要があ
る。
Next, the extracted shape data is compared with the standard data to detect defects such as chipping / protrusion and disappearance of the shape,
Pass / fail judgment is performed. FIG. 3 shows a defect example to be detected and a small modification example not requiring detection. A slight deformation of the terminal shown on the upper left side does not need to be detected because it has no problem in operation, but a large deformation on the lower left side and a missing (disappearing defect) of the right side terminal need to be detected.

【0005】図4は従来例を示し、検査対象となる入力
画像として図3に示した、形状Aが3個(p1〜p
3)、形状Bが1個(p4)の場合を示す。ここでは、
あらかじめエリア信号発生手段により標準データから検
査対象形状のエリア信号を生成し、形状抽出手段により
入力画像データから検査対象のエリア内の形状を抽出
し、各々標準データと比較し、良否判定を行う。
FIG. 4 shows a conventional example, which has three shapes A (p1 to p) shown in FIG. 3 as an input image to be inspected.
3) shows the case where the shape B is one (p4). here,
The area signal generating means generates an area signal of the shape of the inspection object from the standard data in advance, the shape extracting means extracts the shape in the area of the inspection object from the input image data, and compares each shape with the standard data to determine the quality.

【0006】[0006]

【発明が解決しようとする課題】しかし、一般に入力画
像中には検査対象の形状(端子)が複数存在し、検査を
同時に実行するためには検査対象の形状の数だけ形状抽
出手段およびエリア信号発生手段が必要である。図4の
例の場合は、形状抽出手段とエリア信号発生手段が4組
必要となる。したがって、外観検査装置の実装条件等に
より実現できる規模が制限されている場合には、同時に
処理可能な検査対象の形状の数が制限され、検査対象に
よっては検査できない場合がある。
However, in general, there are a plurality of shapes (terminals) to be inspected in the input image, and in order to execute the inspections at the same time, the number of shape extraction means and area signals as many as the shapes to be inspected. Generating means are needed. In the case of the example of FIG. 4, four sets of shape extraction means and area signal generation means are required. Therefore, when the scale that can be realized is limited due to the mounting conditions of the visual inspection apparatus, the number of shapes of the inspection target that can be processed at the same time is limited, and the inspection may not be possible depending on the inspection target.

【0007】逆に、各形状の検査を時系列で行う場合に
は、検査対象の数が多くなると、処理時間が長くなる。
本発明は、複数の形状の外観検査を一括して行い、実装
規模を増大させることなく、検査時間を短縮することを
目的とする。
On the contrary, when the inspection of each shape is performed in time series, the processing time becomes longer as the number of inspection objects increases.
An object of the present invention is to perform visual inspections of a plurality of shapes at once, and to shorten the inspection time without increasing the mounting scale.

【0008】[0008]

【課題を解決するための手段】本発明は、検査対象の画
像データを入力し、検査対象の標準データと入力画像デ
ータとを比較し検査対象の良否を判定する外観検査装置
であって、入力画像データ中の、隣接する複数の形状を
1つの形状に一体化する隣接形状一体化手段と、検査手
段とを有し、検査手段は、標準データと一体化形状デー
タとを比較することを特徴とする。
SUMMARY OF THE INVENTION The present invention is an appearance inspection apparatus for inputting image data of an inspection object, comparing standard data of the inspection object with input image data, and determining pass / fail of the inspection object. An adjoining shape unifying means for unifying a plurality of adjoining shapes in the image data into one shape, and an inspecting means, and the inspecting means compares the standard data with the integrated shape data. And

【0009】図1は、本発明による外観検査装置の構成
概要を示す。前記従来例と同様に、あらかじめCAD等
の設計データから外観検査対象の形状情報と形状の位置
情報とを含む標準データを生成し、保持する。入力画像
データは、隣接形状一体化手段1により画像中の隣接す
る形状が一体化され、一体化形状データと検査対象のエ
リア信号とが生成される。
FIG. 1 shows the outline of the structure of an appearance inspection apparatus according to the present invention. Similar to the conventional example, standard data including shape information of a visual inspection object and shape position information is previously generated from design data such as CAD and is stored. Adjacent shapes in the image of the input image data are integrated by the adjacent shape integration means 1, and integrated shape data and an area signal of the inspection target are generated.

【0010】検査手段2は、検査対象のエリア内の形状
データと、標準データとを比較し、良否の判定を行い、
検査結果を出力する。この場合、検査対象のエリア内に
ついては、複数の標準データと形状データとの比較が一
括処理できるため、処理時間が短縮できる。なお、検査
手段2による比較は、標準データと形状データとのパタ
ーンマッチングであっても、標準データから抽出した特
徴と、形状データの特徴との比較であっても良い。
The inspection means 2 compares the shape data in the area to be inspected with the standard data to judge the quality,
Output the inspection result. In this case, in the area to be inspected, the comparison of a plurality of standard data and the shape data can be collectively processed, so that the processing time can be shortened. The comparison by the inspection unit 2 may be pattern matching between the standard data and the shape data, or may be comparison between the feature extracted from the standard data and the feature of the shape data.

【0011】さらに前記発明において、標準データ中
の、隣接する複数の標準形状を1つの標準形状に一体化
する標準形状一体化手段を備え、一体化標準データと一
体化形状データとを比較するとしても良い。これによ
り、一体化された複数の標準データの参照を一回とする
ことが可能となり、処理時間が短縮できる。
Further, in the above invention, the standard shape unifying means for unifying a plurality of adjacent standard shapes in the standard data into one standard shape is provided, and the integrated standard data and the integrated shape data are compared. Is also good. This makes it possible to refer to a plurality of integrated standard data only once, and the processing time can be shortened.

【0012】また、一体化形状のエリアを検査対象のエ
リアとして抽出することにより、検査処理で参照するエ
リアを限定することが可能となり、処理時間が短縮でき
る。
Further, by extracting the area of the integrated shape as the area to be inspected, it is possible to limit the area to be referred in the inspection processing, and the processing time can be shortened.

【0013】[0013]

【発明の実施の形態】図5は外観検査装置の実施例1を
示す。入力画像データは、2値化手段aにより2値化画
像データに変換される。2値化画像データは、膨張/収
縮手段bにより隣接する形状が一体化される。図6は、
膨張/収縮処理の動作を示す。膨張/収縮手段bでは、
まず、所定回数の膨張処理を行う。
FIG. 5 shows a first embodiment of the appearance inspection apparatus. The input image data is converted into binarized image data by the binarizing means a. In the binarized image data, adjacent shapes are integrated by the expansion / contraction means b. Figure 6
The operation of expansion / contraction processing is shown. In the expansion / contraction means b,
First, expansion processing is performed a predetermined number of times.

【0014】図7は、膨張/収縮処理のアルゴリズムの
例を示す。ここでは、黒画素を”1”、白画素を”0”
で表す。図7−aに示す膨張処理では、処理対象の画素
(注目画素)を囲む8個の画素の中に“1”の画素がひ
とつでもあれば注目画素を“1”に置きかえる処理を全
画素について注目しながら順次行う。ここで所定回数と
は、図3に示す、検出したい(形状)不良を残し、検出
不要の小変形を消失させ、かつ、一体化させるべき隣接
する形状が連結するという条件で定まる。例えば、11
画素以上の変形を検出し、10画素以内の距離の形状を
一体化させる場合は、所定回数は5回とする。
FIG. 7 shows an example of an expansion / contraction processing algorithm. Here, black pixels are "1" and white pixels are "0".
It is represented by. In the expansion processing shown in FIG. 7A, if there is at least one "1" pixel among the eight pixels surrounding the pixel to be processed (target pixel), the processing of replacing the target pixel with "1" is performed for all pixels. Perform sequentially while paying attention. Here, the predetermined number of times is determined under the conditions shown in FIG. 3 in which defects (shapes) to be detected are left, small deformations that do not need to be detected are eliminated, and adjacent shapes to be integrated are connected. For example, 11
When the deformation of more than pixels is detected and the shapes with a distance of 10 pixels or less are integrated, the predetermined number of times is five times.

【0015】5回の上記膨張処理により、10画素以内
の形状の欠け、および形状の隙間(白画素)は黒画素で
埋めつくされる。このようにして、10画素以内の、形
状の欠けは消失し、隣接形状は連結して、外形が5画素
分太くなった一つの一体化形状となる。次に膨張処理を
行った画像に対して所定回数の収縮処理を行う。例えば
図7−bに示すごとく、注目画素を囲む8個の画素中に
“0”の画素がひとつでもあれば注目画素を“0”に置
きかえる処理を全画素について注目しながら順次行う。
By the above-described expansion process five times, the shape defect within 10 pixels and the shape gap (white pixel) are filled with black pixels. In this way, shape defects within 10 pixels disappear, adjacent shapes are connected, and the outer shape is thickened by 5 pixels to form one integrated shape. Next, the contraction process is performed a predetermined number of times on the image subjected to the expansion process. For example, as shown in FIG. 7-b, if there is at least one pixel of "0" among the eight pixels surrounding the pixel of interest, the process of replacing the pixel of interest with "0" is sequentially performed while paying attention to all the pixels.

【0016】5回の収縮処理により、小変形は消失した
まま、連結した形状は一体化されたままで、外形は5画
素分細く、すなわち膨張処理前の元の太さとなる。一体
化形状データは検査対象形状検出手段cに入力され、検
査対象の一体化形状データが検出される。エリア信号発
生手段dでは、検査対象形状検出手段cで検出した一体
化形状から、その周辺領域を表す検査対象形状のエリア
信号を発生する。
After the contraction process 5 times, the small deformations disappear, the connected shapes remain integrated, and the outer shape is thinned by 5 pixels, that is, the original thickness before the expansion process. The integrated shape data is input to the inspection target shape detection means c, and the integrated shape data of the inspection target is detected. The area signal generating means d generates an area signal of the shape of the inspection object representing the peripheral region from the integrated shape detected by the inspection object shape detecting means c.

【0017】図4に示す検査対象形状に対して、以上の
膨張/収縮処理を行い、隣接形状を一体化した場合の例
を図8に示す。この例では、p1〜p4の形状が一体化
された形状p5と、p5を含む検査対象形状のエリア信
号とが生成される。図8では、互いに隣接する形状を一
体化した例を示すが、検査対象の形状が離散して配置さ
れている場合には、複数の一体化形状とエリア信号とが
生成されることになる。
FIG. 8 shows an example in which the above-described expansion / contraction processing is performed on the shape to be inspected shown in FIG. 4 to integrate adjacent shapes. In this example, the shape p5 in which the shapes of p1 to p4 are integrated and the area signal of the inspection target shape including p5 are generated. FIG. 8 shows an example in which adjacent shapes are integrated, but when the shapes to be inspected are discretely arranged, a plurality of integrated shapes and area signals are generated.

【0018】つぎに、論理積eにおいて、エリア信号と
一体化形状データとの論理積を取り、図9に示すごとく
エリア信号外のパターンを除去し、一体化形状データの
みを画像メモリfに入力する。なお、検査に不要なパタ
ーンの除去は、図2に示す検査対象のエリア信号によ
り、膨張/収縮処理の前におこなっておいてもよい。
Next, in the logical product e, the logical product of the area signal and the integrated shape data is taken, the pattern outside the area signal is removed as shown in FIG. 9, and only the integrated shape data is input to the image memory f. To do. The pattern unnecessary for the inspection may be removed before the expansion / contraction processing according to the area signal of the inspection target shown in FIG.

【0019】判定手段gは、画像メモリfから一体化形
状データを読み出して標準データと比較し、良否判定を
行う。なお、判定手段gを複数備え、複数の判定処理を
並行して実施することで、さらに速度向上がはかれる。
図10に示すごとく、検査対象の形状のいくつかが消失
している不良が存在する場合には、一体化形状が標準デ
ータから想定される形状と異なるため、正しい検査対象
形状のエリア信号が発生されない。したがって、判定手
段gは、標準データを参照して検査対象の形状があるべ
き位置について画像メモリfを探索し、形状データが存
在しない場合、形状消失不良と判定する。
The judging means g reads the integrated shape data from the image memory f, compares it with the standard data, and judges the quality. By providing a plurality of determination means g and performing a plurality of determination processes in parallel, the speed can be further improved.
As shown in FIG. 10, when there is a defect in which some of the shapes of the inspection object have disappeared, the integrated shape is different from the shape assumed from the standard data, and therefore the area signal of the correct inspection object shape is generated. Not done. Therefore, the determination unit g refers to the standard data, searches the image memory f for the position where the shape of the inspection target should be, and determines that there is no shape disappearance defect when the shape data does not exist.

【0020】あるいは、画像メモリfから読み出した形
状との比較に使用した標準データを記録しておき、画像
メモリf中の全ての形状について比較が完了した後に未
使用の標準データが残っている場合は形状消失不良と判
定する、としても良い。また、一体化形状では検出不能
な欠陥については、論理積hで2値化形状を抽出し、従
来例と同様に2値化形状データと標準データとを比較す
ることで全体の機能を補間しても良い。
Alternatively, the standard data used for comparison with the shape read from the image memory f is recorded, and unused standard data remains after the comparison is completed for all the shapes in the image memory f. May be determined to be a shape loss defect. For defects that cannot be detected by the integrated shape, the binarized shape is extracted with the logical product h, and the entire function is interpolated by comparing the binarized shape data with the standard data as in the conventional example. May be.

【0021】図11は標準形状一体化手段をそなえた外
観検査理装置の実施例2を示す。この実施例では、検査
対象の入力画像データ中の形状と同様に標準形状につい
ても一体化するため、比較処理を簡略化でき、さらに速
度が向上する。
FIG. 11 shows a second embodiment of the appearance inspection processing device provided with the standard shape integrating means. In this embodiment, the standard shape is integrated as well as the shape in the input image data to be inspected, so that the comparison process can be simplified and the speed is further improved.

【0022】[0022]

【発明の効果】以上説明したごとく、隣接する複数の検
査対象の形状を一体化して1つの検査対象の形状とする
事で、1.外観検査装置の規模を削減できる。2.検査
すべきデータ量を削減でき、速度が向上する。3.処理
が簡略化されて、速度が向上する。
As described above, the shapes of a plurality of adjacent inspection objects are integrated to form one inspection object. The scale of the appearance inspection device can be reduced. 2. The amount of data to be inspected can be reduced and speed can be improved. 3. The process is simplified and speed is increased.

【図面の簡単な説明】[Brief description of drawings]

【図1】外観検査装置の構成概要[Figure 1] Configuration overview of appearance inspection device

【図2】入力画像と検査対象形状データの抽出概要例[Fig. 2] Example of outline of extraction of input image and inspection target shape data

【図3】検出したい不良例と検出不要の小変形例FIG. 3 is a defect example to be detected and a small modification example not requiring detection.

【図4】従来例FIG. 4 Conventional example

【図5】実施例1FIG. 5: Example 1

【図6】膨張/収縮処理の動作FIG. 6 Operation of expansion / contraction processing

【図7】膨張/収縮処理のアルゴリズムFIG. 7 Algorithm for expansion / contraction processing

【図8】形状の一体化[Figure 8] Shape integration

【図9】検査対象形状の抽出FIG. 9: Extraction of inspection target shape

【図10】形状消失不良FIG. 10: Shape loss defect

【図11】実施例2FIG. 11: Example 2

【符号の説明】 1 隣接形状一体化手段 2 検査手段 3 標準形状一体化手段 a 2値化手段 b 膨張/収縮手段 c 検査対象形状検出手段 d エリア信号発生手段 e、h 論理積 f 画像メモリ g 判定手段[Explanation of symbols] 1 Adjacent shape integration means 2 inspection means 3 Standard shape integration means a Binarization means b Expansion / contraction means c Inspection target shape detection means d area signal generation means e, h AND f image memory g Judgment means

フロントページの続き (72)発明者 芳賀 進 神奈川県川崎市中原区上小田中4丁目1番 1号 富士通株式会社内 Fターム(参考) 2F065 AA51 BB02 CC01 CC28 DD06 FF04 FF61 JJ03 JJ26 QQ04 QQ24 QQ25 QQ31 QQ32 QQ39 RR08 2G051 AA62 AA65 AB02 AB20 AC21 EA11 EA30 ED04 5B057 AA03 BA29 DA03 DB02 DB08 DC09 DC33 5L096 AA07 BA03 EA02 EA43 FA18 GA22 HA07 Continued front page    (72) Inventor Susumu Haga             4-1, Kamiodanaka, Nakahara-ku, Kawasaki-shi, Kanagawa             No. 1 within Fujitsu Limited F term (reference) 2F065 AA51 BB02 CC01 CC28 DD06                       FF04 FF61 JJ03 JJ26 QQ04                       QQ24 QQ25 QQ31 QQ32 QQ39                       RR08                 2G051 AA62 AA65 AB02 AB20 AC21                       EA11 EA30 ED04                 5B057 AA03 BA29 DA03 DB02 DB08                       DC09 DC33                 5L096 AA07 BA03 EA02 EA43 FA18                       GA22 HA07

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 検査対象の画像データを入力し、検査対
象の標準データと入力画像データとを比較し検査対象の
良否を判定する外観検査装置であって、 入力画像データ中の、隣接する複数の形状を1つの形状
に一体化する隣接形状一体化手段と、検査手段とを有
し、 検査手段は、標準データと一体化形状データとを比較す
ることを特徴とする外観検査装置。
1. An appearance inspection apparatus for inputting image data to be inspected and comparing standard data of the inspected object with the input image data to judge pass / fail of the inspected object, wherein a plurality of adjacent image data in the input image data are included. An appearance inspection apparatus comprising: an adjoining shape unifying means for unifying the shapes of 1 into one shape; and an inspecting means, wherein the inspecting means compares standard data with integrated shape data.
【請求項2】 請求項1に記載の外観検査装置であっ
て、 標準データ中の、隣接する複数の標準形状を1つの標準
の形状に一体化する標準形状一体化手段を有し、 検査手段は、一体化標準データと一体化形状データとを
比較することを特徴とする外観検査装置。
2. The appearance inspection apparatus according to claim 1, further comprising a standard shape unifying means for unifying a plurality of adjacent standard shapes in the standard data into one standard shape. Is an appearance inspection device characterized by comparing integrated standard data with integrated shape data.
【請求項3】 検査対象の画像データを入力し、検査対
象の標準データと入力画像データとを比較し検査対象の
良否を判定する外観検査装置であって、 入力画像データ中の、隣接する複数の形状を1つの形状
に一体化する隣接形状一体化手段と、検査手段とを有
し、 隣接形状一体化手段は、一体化形状データから検査対象
のエリアを抽出することを特徴とする外観検査装置。
3. An appearance inspection apparatus for inputting image data of an inspection object and comparing standard data of the inspection object with the input image data to judge pass / fail of the inspection object, wherein a plurality of adjacent image data in the input image data are included. Has an adjoining shape unifying means for unifying the shapes of 1 into one shape, and an inspecting means, wherein the adjoining shape unifying means extracts an area to be inspected from the integrated shape data. apparatus.
【請求項4】 請求項2に記載の外観検査装置であっ
て、 検査手段は、一体化標準データと一体化形状データとを
順次比較し、一体化標準データに対応する一体化形状デ
ータが無い場合、不良とすることを特徴とする外観検査
装置。
4. The appearance inspection apparatus according to claim 2, wherein the inspection means sequentially compares the integrated standard data with the integrated shape data, and there is no integrated shape data corresponding to the integrated standard data. In this case, the appearance inspection device is characterized by a defect.
【請求項5】 検査対象の画像データを入力し、検査対
象の標準データと入力画像データとを比較し検査対象の
良否を判定する外観検査方法であって、 入力画像データ中の、隣接する複数の検査対象形状を1
つの検査対象の形状に一体化し、 標準データと一体化した形状データとを比較することを
特徴とする外観検査方法。
5. A visual inspection method for inputting image data of an inspection target and comparing standard data of the inspection target with the input image data to determine whether the inspection target is good or bad, which is a method of adjoining a plurality of adjacent input image data. The inspection target shape of 1
A visual inspection method characterized by integrating two shapes to be inspected and comparing the standard data with the integrated shape data.
JP2002001141A 2002-01-08 2002-01-08 Visual inspection device and method Withdrawn JP2003203218A (en)

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Country Link
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005186341A (en) * 2003-12-24 2005-07-14 Seiko Epson Corp Inspection method for liquid storage bag
JP2005311971A (en) * 2004-04-26 2005-11-04 Mitsutoyo Corp Image processing apparatus, method, and program
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JP2008175545A (en) * 2007-01-16 2008-07-31 Matsushita Electric Ind Co Ltd Electrode state judging device and electrode state deciding method
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