JP2003156643A5 - - Google Patents

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Publication number
JP2003156643A5
JP2003156643A5 JP2001354114A JP2001354114A JP2003156643A5 JP 2003156643 A5 JP2003156643 A5 JP 2003156643A5 JP 2001354114 A JP2001354114 A JP 2001354114A JP 2001354114 A JP2001354114 A JP 2001354114A JP 2003156643 A5 JP2003156643 A5 JP 2003156643A5
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JP
Japan
Prior art keywords
waveguide
optical
light
support substrate
light emitting
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001354114A
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English (en)
Japanese (ja)
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JP2003156643A (ja
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Priority to JP2001354114A priority Critical patent/JP2003156643A/ja
Priority claimed from JP2001354114A external-priority patent/JP2003156643A/ja
Publication of JP2003156643A publication Critical patent/JP2003156643A/ja
Publication of JP2003156643A5 publication Critical patent/JP2003156643A5/ja
Pending legal-status Critical Current

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JP2001354114A 2001-11-20 2001-11-20 光学素子及びそれを用いた計測装置 Pending JP2003156643A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001354114A JP2003156643A (ja) 2001-11-20 2001-11-20 光学素子及びそれを用いた計測装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001354114A JP2003156643A (ja) 2001-11-20 2001-11-20 光学素子及びそれを用いた計測装置

Publications (2)

Publication Number Publication Date
JP2003156643A JP2003156643A (ja) 2003-05-30
JP2003156643A5 true JP2003156643A5 (zh) 2005-07-14

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001354114A Pending JP2003156643A (ja) 2001-11-20 2001-11-20 光学素子及びそれを用いた計測装置

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JP (1) JP2003156643A (zh)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005156178A (ja) * 2003-11-20 2005-06-16 Kri Inc 圧力評価方法及び光導波路型圧力センサ
JP4742336B2 (ja) * 2004-04-12 2011-08-10 一正 佐々木 光ファイバー歪みセンサーとそれを用いた測定機器
WO2006138587A2 (en) * 2005-06-18 2006-12-28 The Regents Of The University Of Colorado, A Body Corporate Three-dimensional direct-write lithography
JP4830415B2 (ja) * 2005-09-12 2011-12-07 株式会社デンソー 光学装置およびその製造方法
US7228017B2 (en) * 2005-09-30 2007-06-05 General Electric Company Fiber optic sensing device and method of making and operating the same
JP2008122265A (ja) * 2006-11-14 2008-05-29 Toshiba Corp 発色反応検出機器及びその製造方法
US7336862B1 (en) * 2007-03-22 2008-02-26 General Electric Company Fiber optic sensor for detecting multiple parameters in a harsh environment
JP2009216638A (ja) * 2008-03-12 2009-09-24 Nec Corp 微小変位測定装置とその測定方法
KR101018198B1 (ko) 2008-11-15 2011-02-28 부산대학교 산학협력단 방향성 광 결합을 이용한 광 압력 센서 및 이의 제조방법
JP5375856B2 (ja) * 2011-02-25 2013-12-25 株式会社デンソー 光学装置およびその製造方法
KR101308270B1 (ko) 2011-12-30 2013-09-13 한양대학교 산학협력단 고분자 화합물이 충진된 광섬유 기반 방사선량계
CN104185799B (zh) 2012-02-03 2017-06-30 梅卡雷斯系统有限责任公司 补偿线路板上的光学传感器
GB2502313A (en) * 2012-05-24 2013-11-27 Ibm Manufacturing three dimensional photonic device by two photon absorption polymerization
DE102012214440B3 (de) * 2012-08-14 2013-10-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Planaroptisches Element, Sensorelement und Verfahren zu deren Herstellung
JP6051253B2 (ja) * 2015-03-30 2016-12-27 沖電気工業株式会社 光双方向通信モジュール
JP2017181442A (ja) * 2016-03-31 2017-10-05 京セラ株式会社 応力センサ
CN107843367A (zh) * 2017-09-29 2018-03-27 上海理工大学 光学压力传感器
CN110631658A (zh) * 2018-06-22 2019-12-31 艾默生环境优化技术(苏州)有限公司 用于压力设备的检测装置和压缩机

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