JP2003139794A - Multi-terminal structure for measuring impedance - Google Patents

Multi-terminal structure for measuring impedance

Info

Publication number
JP2003139794A
JP2003139794A JP2001341478A JP2001341478A JP2003139794A JP 2003139794 A JP2003139794 A JP 2003139794A JP 2001341478 A JP2001341478 A JP 2001341478A JP 2001341478 A JP2001341478 A JP 2001341478A JP 2003139794 A JP2003139794 A JP 2003139794A
Authority
JP
Japan
Prior art keywords
flexible shaft
insulating layer
contact
terminal structure
insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001341478A
Other languages
Japanese (ja)
Other versions
JP3943372B2 (en
Inventor
Seiichi Hori
誠一 堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP2001341478A priority Critical patent/JP3943372B2/en
Publication of JP2003139794A publication Critical patent/JP2003139794A/en
Application granted granted Critical
Publication of JP3943372B2 publication Critical patent/JP3943372B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a multi-terminal structure for measuring the impedance capable of coping with a narrow measured part, and exercising the characteristic of high strength. SOLUTION: A flexible shaft body 11 is formed by twisting two conductive metallic wires 14, 14 respectively coated with insulating layers 22, a tip part 12 of the flexible shaft body 11 is formed as an independent contact end 15 for the measured part, by respectively exposing a tip of each metallic fine wire 14 from the insulating layer 22 while keeping the mutually insulated- condition, and a rear end part 13 is formed as a connection end 16 for a lead wire 31, by respectively exposing a rear end face 14a of each metallic wire 14 from the insulating layer 22 while keeping the mutually insulated-condition.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、インサーキットテ
スタなどの基板検査機が備える例えば四端子測定用プロ
ーブのような多端子であっても狭小な被測定部位への接
触を可能にするとともに、強度的にも優れた特性を発揮
させることができるインピーダンス測定用の多端子構造
に関する技術である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention makes it possible to make contact with a narrow measurement site even with a multi-terminal such as a four-terminal measurement probe provided in a substrate inspection machine such as an in-circuit tester. This is a technique relating to a multi-terminal structure for impedance measurement that can exhibit excellent characteristics in strength.

【0002】[0002]

【従来の技術】多端子インピーダンス測定法のひとつに
は、四端子測定法がある。この測定法は、抵抗体である
被測定物に電流を流すための一対の定電流端子と、その
際における電圧降下状態を検出するための一対の電圧検
出端子とを用意し、これらの端子に各別に接続された計
4本のリード線を利用して行われている。
2. Description of the Related Art One of the multi-terminal impedance measuring methods is a four-terminal measuring method. This measurement method prepares a pair of constant current terminals for flowing a current through the object to be measured, which is a resistor, and a pair of voltage detection terminals for detecting the voltage drop state at that time, and these terminals are connected to these terminals. It is performed using a total of four lead wires connected to each.

【0003】また、このようにして行われる四端子測定
法は、リード線の抵抗を測定値に含めずに測定すること
ができるので、高精度の抵抗測定器であるディジタルマ
ルチメータやLCRメータなどに多く採用されている。
Further, in the four-terminal measuring method performed in this way, the resistance of the lead wire can be measured without including it in the measured value, so that a highly accurate resistance measuring device such as a digital multimeter or an LCR meter can be used. Has been adopted by many.

【0004】図3と図4とは、上記四端子測定法に対応
させるべく従来から使用されてきているコンタクトプロ
ーブの構造例を示すものである。
FIGS. 3 and 4 show an example of the structure of a contact probe that has been conventionally used to support the above-mentioned four-terminal measuring method.

【0005】このうち、図3に示すコンタクトプローブ
は、いわゆる平行型タイプと称されているものであり、
その全体は、先端部に電圧測定ピン1aを有するプラン
ジャー1bをバレル1c内にその進退を自在に付勢して
保持させてなる電圧測定用プローブ1と、先端部に電流
測定ピン2aを有するプランジャー2bをバレル2c内
にその進退を自在に付勢して保持させてなる電流測定用
プローブ2と、これらプローブ1,2相互を絶縁体3を
介在させて一体的に抱持するスリーブ4とで形成されて
いる。
Of these, the contact probe shown in FIG. 3 is of the so-called parallel type,
The whole has a voltage measuring probe 1 in which a plunger 1b having a voltage measuring pin 1a at its tip is held in the barrel 1c by freely urging it forward and backward, and a current measuring pin 2a at its tip. A current measuring probe 2 which holds the plunger 2b in the barrel 2c by freely urging the plunger 2b forward and backward, and a sleeve 4 which integrally holds these probes 1 and 2 with an insulator 3 interposed therebetween. It is formed by.

【0006】また、図4に示すコンタクトプローブは、
いわゆる同軸型タイプと称されているものであり、その
全体は、先端部に電圧測定ピン5aを有するプランジャ
ー5bをバレル5c内にその進退を自在に付勢して保持
させてなる電圧測定用プローブ5と、該電圧測定用プロ
ーブ5を絶縁体6を介在させた軸の中心に位置させてそ
の周囲を囲繞するように配置される電流測定ピン7aを
備えてなる電流測定用プローブ7と、該電流測定用プロ
ーブ7との間に介装配置させたスプリング材8により電
流測定用プローブ7を軸方向への進退を自在にして保持
するスリーブ9とで形成されている。
Further, the contact probe shown in FIG.
It is a so-called coaxial type, and its entirety is for voltage measurement in which a plunger 5b having a voltage measuring pin 5a at its tip is urged and held freely in a barrel 5c to advance and retract. A current measuring probe 7 including a probe 5 and a current measuring pin 7a arranged so as to surround the periphery of the probe 5 by arranging the voltage measuring probe 5 at the center of an axis with an insulator 6 interposed; The current measuring probe 7 is formed of a sleeve 9 which holds the current measuring probe 7 so as to be movable back and forth in the axial direction by a spring member 8 which is interposed between the current measuring probe 7 and the current measuring probe 7.

【0007】[0007]

【発明が解決しようとする課題】ところで、図3と図4
とに示すいずれのコンタクトプローブを用いても、四端
子測定法により被測定物を測定することはできるもの
の、そのいずれもが構造的に複雑であり、製品コストを
押し上げる不都合があった。
By the way, FIG. 3 and FIG.
Although it is possible to measure an object to be measured by the four-terminal measurement method using any of the contact probes shown in 1) and 2), all of them have a structurally complicated structure, which disadvantageously increases the product cost.

【0008】また、図3と図4とに示すコンタクトプロ
ーブは、ともに電圧測定ピン1a又は5aと電流測定ピ
ン2a又は7aとの相互の離間距離が比較的大きいこと
から、被接触面が比較的広い場合には対応することがで
きるものの、被接触面が狭小である場合には使用できな
いといった不具合もあった。
Further, in the contact probes shown in FIGS. 3 and 4, the distance between the voltage measuring pin 1a or 5a and the current measuring pin 2a or 7a is relatively large, so that the contacted surface is relatively large. Although it is possible to deal with the case where it is wide, there is a problem that it cannot be used when the contacted surface is narrow.

【0009】しかも、狭小な被接触面にも対応させよう
としてコンタクトプローブ全体の細径化を図る場合に
は、ピン間距離を相対的に短くすることはできるもの
の、ピン自体も極細となって強度的に弱化してしまい、
結果的に耐久性の低下を招いて実用に供し得なくなって
しまう問題もあった。
Moreover, when the contact probe is made to have a small diameter in order to cope with a narrow contact surface, the distance between the pins can be made relatively short, but the pins themselves are also very thin. Weakened in strength,
As a result, there is also a problem that the durability is lowered and it cannot be put to practical use.

【0010】本発明は、従来からあるコンタクトプロー
ブにみられた上記課題に鑑み、狭小な被測定部位への対
応を可能とするとともに、強度的にも優れた特性を発揮
させることができるインピーダンス測定用の多端子構造
の提供を目的とする。
In view of the above-mentioned problems that have been observed in conventional contact probes, the present invention makes it possible to cope with a narrow measurement site and to perform impedance measurement capable of exhibiting excellent strength characteristics. It is intended to provide a multi-terminal structure for a vehicle.

【0011】[0011]

【課題を解決するための手段】本発明は、上記目的を達
成すべくなされたものであり、それぞれの表面が絶縁層
で覆われた二本以上の導電性の金属細線相互を撚り合わ
せて可撓性軸状体を形成するとともに、該可撓性軸状体
の少なくとも長さ方向での一端部には、相互の絶縁状態
を維持させながら各金属細線の一端を前記絶縁層からそ
れぞれ露出させて被測定部位のための独立した接触端を
形成し、他端部には、相互の絶縁状態を維持させながら
各金属細線の他端を前記絶縁層からそれぞれ露出させて
リード線のための接続端を形成したことに構成上の特徴
がある。
The present invention has been made to achieve the above object, and it is possible to twist two or more conductive thin metal wires, each surface of which is covered with an insulating layer. A flexible shaft-like body is formed, and at least one end portion of the flexible shaft-like body in the longitudinal direction is exposed at one end thereof from the insulating layer while maintaining a mutually insulated state. To form an independent contact end for the measured part, and at the other end, expose the other end of each thin metal wire from the insulating layer while maintaining a mutual insulation state, and connect for the lead wire. There are structural features in forming the edges.

【0012】この場合、前記接触端のそれぞれは、先鋭
化させて形成するのが好ましい。また、前記絶縁層は、
絶縁樹脂チューブと絶縁被覆膜と絶縁塗布膜とのいずれ
かで形成することができる。さらに、前記可撓性軸状体
は、少なくとも前記接触端を除く部位を可撓性に富む絶
縁性筒材内に収納保持させておくこともできる。
In this case, each of the contact ends is preferably sharpened. In addition, the insulating layer,
It can be formed of any of an insulating resin tube, an insulating coating film, and an insulating coating film. Further, the flexible shaft-like body may be housed and held in at least a portion excluding the contact end in a highly flexible insulating tubular material.

【0013】[0013]

【発明の実施の形態】図1は本発明の一例を示すもので
あり、そのうちの(a)は一部を省略した拡大正面図
を、(b)は(a)におけるA−A線矢視方向での断面
図を、(c)は(a)についての底面図(先端側)をそ
れぞれ示す。これらの図によれば、それぞれの表面が絶
縁層22で覆われた2本の導電性の金属細線14,14
相互を密に撚り合わせてなる可撓性軸状体11が形成さ
れている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an example of the present invention, in which (a) is an enlarged front view with a part omitted, and (b) is a view taken along the line AA in (a). A cross-sectional view in the direction, and (c) is a bottom view (front end side) of (a). According to these figures, two conductive metal wires 14, 14 each surface of which is covered with the insulating layer 22 are shown.
A flexible shaft-shaped body 11 formed by closely twisting each other is formed.

【0014】このうち、適宜線径の金属細線14は、銅
や高速度工具鋼(ハイス)などの適宜の導電材を用いて
形成することができ、その長さも用途に応じて適宜選択
することができる。
Among them, the thin metal wire 14 having an appropriate wire diameter can be formed by using an appropriate conductive material such as copper or high speed tool steel (high speed steel), and its length can be appropriately selected according to the application. You can

【0015】また、金属細線14の周面を覆う絶縁層2
2は、フッ素樹脂などの絶縁樹脂を焼き付けた絶縁被着
膜や、塗布した絶縁塗布膜により形成することができる
ほか、絶縁性合成樹脂からなる熱収縮性チューブなどの
ようなチューブ材を覆設することにより形成することも
できる。
Further, the insulating layer 2 covering the peripheral surface of the thin metal wire 14
2 can be formed by an insulation coating film obtained by baking an insulation resin such as a fluororesin or an applied insulation coating film, and a tube material such as a heat-shrinkable tube made of an insulating synthetic resin is covered. It can also be formed by

【0016】さらに、可撓性軸状体11は、その一端部
である先端部12の側を被測定部位への接触側とし、他
端部である基端部13の側をリード線31との接続側と
することでその全体が形成されている。
Further, the flexible shaft 11 has a tip end 12 which is one end thereof as a contact side to the site to be measured and a base end 13 which is the other end as a lead wire 31. The whole is formed by making it the connection side of.

【0017】すなわち、可撓性軸状体11の長さ方向で
の一端部としての先端部12には、相互の絶縁状態を維
持させながら各金属細線14の一端である先端を絶縁層
22からそれぞれ露出させて被測定部位のための独立し
た接触端15が形成されている。
That is, at the tip portion 12 as one end portion in the length direction of the flexible shaft-like body 11, the tip end which is one end of each metal thin wire 14 from the insulating layer 22 is maintained while maintaining the mutual insulation state. Independently exposed contact ends 15 are formed for each measured part.

【0018】この場合、各接触端15は、可撓性軸状体
11の先端部12をその先端方向に向かって先細りとな
るように少なくとも対面二方向から切除することによ
り、先鋭化され、かつ、それぞれの絶縁層22を介して
微小間隔をおいて相互が離間された状態のもとで露出さ
れることになる。
In this case, each contact end 15 is sharpened by cutting off the tip portion 12 of the flexible shaft-like body 11 from at least two facing directions so as to be tapered toward the tip end direction, and , And they are exposed in a state in which they are spaced apart from each other via the respective insulating layers 22 with a minute interval.

【0019】また、可撓性軸状体11の長さ方向での他
端部としての後端部13には、それぞれの絶縁層22を
介することで相互が非導通となった状態のもとで各金属
細線14の他端面である後端面14aがそれぞれ露出さ
れ、これらの後端面14aによりリード線31のための
接続端16が形成されることになる。
Further, the rear end portion 13 as the other end portion in the length direction of the flexible shaft-like body 11 is in a state of being non-conducting with each other by interposing each insulating layer 22. Then, the rear end face 14a which is the other end face of each metal fine wire 14 is exposed, and the connecting end 16 for the lead wire 31 is formed by these rear end faces 14a.

【0020】一方、図2は本発明の他例を示すものであ
り、そのうちの(a)は一部を省略した拡大正面図を、
(b)は(a)についての底面図(先端側)をそれぞれ
示す。これらの図によれば、図1におけると同様にそれ
ぞれの表面が絶縁層22で覆われた2本の導電性の金属
細線14,14相互を密に撚り合わせてなる可撓性軸状
体11が形成されている。なお、図2に示す可撓性軸状
体11は、図1に示す例とその基本構造を同じくしてい
るので、図1と同一の部位には同一の符号を付してその
説明を省略する。
On the other hand, FIG. 2 shows another example of the present invention, in which (a) is an enlarged front view with a part omitted.
(B) shows the bottom view (tip side) about (a), respectively. According to these figures, as in the case of FIG. 1, the flexible shaft-like body 11 is obtained by closely twisting two conductive metal wires 14, 14 each surface of which is covered with an insulating layer 22. Are formed. Since the flexible shaft 11 shown in FIG. 2 has the same basic structure as the example shown in FIG. 1, the same parts as those in FIG. To do.

【0021】図2に示す例においても、可撓性軸状体1
1の長さ方向での一端部である先端部12には、相互の
絶縁状態を維持させながら各金属細線14の一端である
先端を絶縁層22からそれぞれ露出させて被測定部位の
ための独立した接触端15が形成されている。
Also in the example shown in FIG. 2, the flexible shaft-shaped body 1
In the tip portion 12 which is one end portion in the length direction of 1, the tip portion which is one end of each thin metal wire 14 is exposed from the insulating layer 22 while maintaining the mutual insulation state, and is independent for the measurement site. The contact end 15 is formed.

【0022】この場合、可撓性軸状体11の先端部12
側は、図1の例におけるように先端方向に向かって先細
りとなるように切除することは特にせず、そのままの状
態で絶縁層22のみを除去し、これにより各金属細線1
4の先端側を各別に露出させ、被測定部位に対する接触
端15としてそれぞれが用いられることになる。
In this case, the tip 12 of the flexible shaft 11 is
As shown in the example of FIG. 1, the side is not particularly cut so as to taper toward the tip direction, and only the insulating layer 22 is removed as it is, whereby each thin metal wire 1 is removed.
The front end side of 4 is exposed separately, and each is used as the contact end 15 for the measurement site.

【0023】また、可撓性軸状体11の長さ方向での他
端部としての後端部13は、絶縁層22で覆われた金属
細線14,14相互の撚り合わせ状態を解消して引き離
した上で、各金属細線14の別にその他端面である後端
面14aをそれぞれ露出させ、これらの後端面14aに
よりリード線31のための接続端16が形成されること
になる。
The rear end portion 13 as the other end portion in the length direction of the flexible shaft 11 eliminates the twisted state of the thin metal wires 14, 14 covered with the insulating layer 22. After separating, the rear end faces 14a, which are the other end faces, are exposed separately for each metal thin wire 14, and the connecting end 16 for the lead wire 31 is formed by these rear end faces 14a.

【0024】さらに、可撓性軸状体11は、上記いずれ
の例においても、例えば図2に破線で示されているよう
に少なくとも接触端15を除く部位を可撓性に富む絶縁
性筒材25内に収納保持させておくこともできる。
Further, in any of the above examples, the flexible shaft 11 is an insulating tubular material having a high flexibility at least at a portion except the contact end 15 as shown by a broken line in FIG. It is also possible to store and hold in 25.

【0025】本発明は、このようにして構成されている
ので、その使用に際しては、例えば図示しない基板検査
機などが備える基台部の面方向に対し、その長さ方向を
直交させた位置関係のもとで可撓性軸状体11を垂下さ
せ、その基端部12側を介して固定する。
Since the present invention is constructed in this way, when it is used, for example, the positional relationship is such that its length direction is orthogonal to the plane direction of the base portion provided in a substrate inspection machine (not shown) or the like. The flexible shaft-like body 11 is hung down under the pressure and fixed via the base end portion 12 side.

【0026】可撓性軸状体11は、前記基台部と図示し
ない測定部材とを相対的に昇降させることにより、その
先端部13側が前記測定部材の被測定部位と当接するに
至る。
The flexible shaft 11 is moved up and down relatively with respect to the base and a measuring member (not shown), so that the tip 13 side of the flexible shaft 11 comes into contact with the measured portion of the measuring member.

【0027】このとき、可撓性軸状体11は、2本の金
属細線12の各先端を絶縁層22からそれぞれ露出させ
ることにより、前記被測定部位のための独立した接触端
15を形成しているので、これらの各接触端15を相互
の離間間隔を狭小にして前記被測定部位に対し同時に接
触させることができる。
At this time, the flexible shaft 11 forms an independent contact end 15 for the measured portion by exposing the tips of the two thin metal wires 12 from the insulating layer 22. Therefore, each of these contact ends 15 can be brought into contact with the measurement site at the same time by narrowing the mutual spacing.

【0028】しかも、可撓性軸状体11は、相互に撚り
合わせた2本の金属細線12を主材としているので、こ
れらの金属細線12の各接触端15を前記被測定部位に
押し当てた際に座屈して撓み、強いばね性を伴わせて前
記被測定部位に圧接させることができる。したがって、
前記被測定部位に対し各接触端15を確実に接触させる
ことができる。
Moreover, since the flexible shaft-shaped body 11 is mainly composed of two metal thin wires 12 twisted together, each contact end 15 of these metal thin wires 12 is pressed against the measurement site. When it is bent, it can buckle and bend, and it can be pressed against the measurement site with a strong spring property. Therefore,
Each contact end 15 can be reliably brought into contact with the measurement site.

【0029】また、可撓性軸状体11を構成している金
属細線12は、単線ではなく2本を撚り合わせることに
よりスパイラル状となって相互が密に一体化されている
ので、それだけ強度を高めてやることができる。
Further, the fine metal wires 12 constituting the flexible shaft-like body 11 are not a single wire but are twisted into two in a spiral shape so that they are densely integrated with each other. Can be raised.

【0030】さらに、本発明の可撓性軸状体11は、図
3(a)の従来例のように電圧測定用プローブ1と電流
測定用プローブ2とを相互に離間させて平行に配列させ
るものは異なり、金属細線12を撚り合わせることで接
触端15,15相互の離間間隔を狭小化することができ
る。
Further, in the flexible shaft-like body 11 of the present invention, the voltage measuring probe 1 and the current measuring probe 2 are arranged in parallel with each other so as to be separated from each other as in the conventional example of FIG. Different from each other, the spacing between the contact ends 15 and 15 can be narrowed by twisting the thin metal wires 12 together.

【0031】したがって、個々の金属細線12を相対的
に大径化しても、接触端15,15相互に狭小な離間間
隔を確保させながら、全体強度の向上を図ることができ
る。
Therefore, even if the diameters of the individual thin metal wires 12 are relatively increased, the overall strength can be improved while ensuring a narrow spacing between the contact ends 15, 15.

【0032】特に、図1に示す可撓性軸状体11のよう
に、その先端部12を先端方向に向かって先細りとなる
ように先鋭化させた各接触端15を露出させてある場合
には、より好ましい微小間隔のもと接触端15,15相
互を離間させることができる。
In particular, as in the case of the flexible shaft 11 shown in FIG. 1, when each contact end 15 whose tip 12 is sharpened so as to be tapered toward the tip is exposed. Can separate the contact ends 15 and 15 from each other with a more preferable minute gap.

【0033】また、可撓性軸状体11は、撚り合わせ構
造を採用したことにより、絶縁層22で覆われた金属細
線14,14相互を図2に示すように極く簡単に引き離
すことができるので、接続端16に対するリード線31
のはんだ付け等の接続作業もより円滑に遂行することが
できる。
Further, since the flexible shaft 11 has a twisted structure, the thin metal wires 14, 14 covered with the insulating layer 22 can be separated from each other very easily as shown in FIG. Therefore, the lead wire 31 for the connection end 16
The connection work such as soldering can be performed more smoothly.

【0034】さらに、図2に示すように少なくとも接触
端15を除く部位の可撓性軸状体11を絶縁性筒材25
内に収納保持させてある場合には、絶縁層22の保護を
より確実なものとすることができるので、測定精度の向
上に有効に寄与させることができる。
Furthermore, as shown in FIG. 2, the flexible shaft-shaped member 11 except for at least the contact end 15 is covered with an insulating tubular member 25.
When the insulating layer 22 is housed and held inside, the insulating layer 22 can be protected more reliably, which can effectively contribute to the improvement of the measurement accuracy.

【0035】したがって、本発明によれば、2本の可撓
性軸状体11を用いることによりファイピッチ化を実現
したインピーダンス測定用の多端子、例えば四端子測定
用プローブとして好適に使用することができる。
Therefore, according to the present invention, it can be suitably used as a multi-terminal for impedance measurement, for example, a four-terminal measurement probe, which realizes a fine pitch by using two flexible shaft-like bodies 11. You can

【0036】以上は、本発明を図示例に即して説明した
ものであり、その具体的な実施の形態内容はこれに限定
されるものではない。例えば、絶縁層22で覆われた金
属細線12は、所望に応じて3本以上を用い、これらを
相互に撚り合わせて可撓性軸状体11を形成することも
できる。また、金属細線12は、その線径に特に制限は
ないものの、例えば70〜100μm程度の線径のもの
を好適に用いることができる。さらに、可撓性軸状体1
1の長さも所望に応じて長短いずれのものを採用しても
よい。
The present invention has been described above with reference to the illustrated example, and the specific contents of the embodiment are not limited to this. For example, three or more thin metal wires 12 covered with the insulating layer 22 may be used as desired, and these may be twisted together to form the flexible shaft 11. Moreover, although the wire diameter of the metal thin wire 12 is not particularly limited, for example, a wire diameter of about 70 to 100 μm can be preferably used. Furthermore, the flexible shaft 1
The length of 1 may be either long or short as desired.

【0037】[0037]

【発明の効果】以上述べたように本発明によれば、可撓
性軸状体は、複数本の金属細線の各先端を絶縁層からそ
れぞれ露出させて相互に独立させた接触端を備えている
ので、各接触端を相互の離間間隔を狭小にして被測定部
位に対し同時に接触させることができる。
As described above, according to the present invention, the flexible shaft-like body is provided with the contact ends in which the tips of the plurality of thin metal wires are exposed from the insulating layer and are independent of each other. Therefore, the contact ends can be brought into contact with the measurement site at the same time by narrowing the mutual spacing.

【0038】しかも、可撓性軸状体は、撚り合わせて座
屈力を付与した複数本の金属細線を主材とすることによ
り、コイルスプリング材を介装させることなく強いばね
性を伴わせて被測定部位に圧接させることができるの
で、構造を簡素化しつつ被測定部位に対し各接触端を確
実に接触させることができる。
Moreover, the flexible shaft-like body is made of a plurality of thin metal wires twisted together to give a buckling force, and has a strong spring property without interposing a coil spring material. Since it is possible to press-contact the measurement site with each other, it is possible to reliably bring each contact end into contact with the measurement site while simplifying the structure.

【0039】また、可撓性軸状体を構成している金属細
線は、単線ではなく複数本を撚り合わせることによりス
パイラル状となって相互が密に一体化されているので、
スリーブを用いて一体化することなく強度を高めてやる
ことができる。したがって、個々の金属細線を相対的に
大径化しても、接触端相互に狭小な離間間隔を確保させ
ながら、全体強度の向上を図ることができる。
Further, since the thin metal wires constituting the flexible shaft-like body are not single wires but a plurality of wires are twisted into a spiral shape and are closely integrated with each other,
The strength can be increased without using a sleeve for integration. Therefore, even if the diameter of each thin metal wire is relatively increased, it is possible to improve the overall strength while ensuring a narrow gap between the contact ends.

【0040】特に、可撓性軸状体の先端部を先端方向に
向かって先細りとなるように先鋭化させた各接触端を露
出させてある場合には、より好ましい微小間隔のもと接
触端相互を離間させることができる。また、可撓性軸状
体は、撚り合わせ構造を採用したことにより、絶縁層で
覆われた金属極細線相互を極く簡単に引き離すことがで
きるので、接続端に対するリード線の接続作業もより円
滑に遂行することができる。
In particular, in the case where the contact ends of the flexible shaft-like body which are sharpened so as to be tapered toward the front end are exposed to expose the contact ends, the contact ends are formed at a more preferable minute interval. They can be separated from each other. Further, since the flexible shaft-like body adopts the twisted structure, it is possible to separate the metal fine wires covered with the insulating layer from each other very easily, so that the work of connecting the lead wire to the connection end is further facilitated. It can be carried out smoothly.

【0041】さらに、少なくとも接触端を除く部位の可
撓性軸状体を絶縁性筒材内に収納保持させてある場合に
は、絶縁層の保護をより確実なものとすることができる
ので、測定精度の向上に有効に寄与させることができ
る。
Furthermore, when the flexible shaft-like body at least at the portion excluding the contact end is housed and held in the insulating tubular member, the protection of the insulating layer can be made more reliable. It can effectively contribute to the improvement of measurement accuracy.

【0042】したがって、本発明によれば、複数本の可
撓性軸状体を用いることによりファイピッチ化を実現し
たインピーダンス測定用の多端子として好適に使用する
ことができる。
Therefore, according to the present invention, by using a plurality of flexible shaft-like bodies, it can be suitably used as a multi-terminal for impedance measurement which realizes a fine pitch.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一例を示すものであり、そのうちの
(a)は一部を省略した拡大正面図を、(b)は(a)
におけるA−A線矢視方向での断面図を、(c)は
(a)についての底面図をそれぞれ示す。
FIG. 1 shows an example of the present invention, in which (a) is an enlarged front view with a part omitted, and (b) is (a).
3A is a cross-sectional view taken along the line AA in FIG.

【図2】本発明の他例を示すものであり、そのうちの
(a)は一部を省略した拡大正面図を、(b)は同底面
図をそれぞれ示す。
FIG. 2 shows another example of the present invention, in which (a) is an enlarged front view with a part omitted, and (b) is a bottom view thereof.

【図3】いわゆる平行型タイプの四端子測定用プローブ
の従来構造例を示す説明図。
FIG. 3 is an explanatory view showing an example of a conventional structure of a so-called parallel type four-terminal measurement probe.

【図4】いわゆる同軸型タイプの四端子測定用プローブ
の従来構造例を示す説明図。
FIG. 4 is an explanatory view showing an example of a conventional structure of a so-called coaxial type four-terminal measurement probe.

【符号の説明】[Explanation of symbols]

11 可撓性軸状体 12 先端部 13 後端部 14 金属細線 14a 後端面 15 接触端 16 接続端 22 絶縁層 25 絶縁性筒材 31 リード線 11 Flexible shaft 12 Tip 13 Rear end 14 thin metal wires 14a rear end face 15 Contact end 16 connection end 22 Insulation layer 25 Insulating tube material 31 lead wire

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 それぞれの表面が絶縁層で覆われた二本
以上の導電性の金属細線相互を撚り合わせて可撓性軸状
体を形成するとともに、該可撓性軸状体の少なくとも長
さ方向での一端部には、相互の絶縁状態を維持させなが
ら各金属細線の一端を前記絶縁層からそれぞれ露出させ
て被測定部位のための独立した接触端を形成し、他端部
には、相互の絶縁状態を維持させながら各金属細線の他
端を前記絶縁層からそれぞれ露出させてリード線のため
の接続端を形成したことを特徴とするインピーダンス測
定用の多端子構造。
1. A flexible shaft-shaped body is formed by twisting together two or more conductive metal thin wires each surface of which is covered with an insulating layer, and at least the length of the flexible shaft-shaped body is increased. At one end in the vertical direction, one end of each thin metal wire is exposed from the insulating layer while maintaining a mutually insulated state to form an independent contact end for the measurement site, and at the other end, A multi-terminal structure for impedance measurement, characterized in that the other end of each metal thin wire is exposed from the insulating layer while maintaining a mutual insulation state to form a connection end for a lead wire.
【請求項2】 前記接触端のそれぞれは、先鋭化されて
いる請求項1に記載のインピーダンス測定用の多端子構
造。
2. The multi-terminal structure for impedance measurement according to claim 1, wherein each of the contact ends is sharpened.
【請求項3】 前記絶縁層は、絶縁樹脂チューブと絶縁
被着膜と絶縁塗着膜とのいずれかで形成されている請求
項1又は2に記載のインピーダンス測定用の多端子構
造。
3. The multi-terminal structure for impedance measurement according to claim 1, wherein the insulating layer is formed of any one of an insulating resin tube, an insulating coating film, and an insulating coating film.
【請求項4】 前記可撓性軸状体は、少なくとも前記接
触端を除く部位が可撓性に富む絶縁性筒材内に収納保持
されている請求項1ないし3のいずれかに記載のインピ
ーダンス測定用の多端子構造。
4. The impedance according to claim 1, wherein at least the portion of the flexible shaft-shaped body excluding the contact end is housed and held in a highly flexible insulating tubular material. Multi-terminal structure for measurement.
JP2001341478A 2001-11-07 2001-11-07 Multi-terminal structure for impedance measurement Expired - Lifetime JP3943372B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001341478A JP3943372B2 (en) 2001-11-07 2001-11-07 Multi-terminal structure for impedance measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001341478A JP3943372B2 (en) 2001-11-07 2001-11-07 Multi-terminal structure for impedance measurement

Publications (2)

Publication Number Publication Date
JP2003139794A true JP2003139794A (en) 2003-05-14
JP3943372B2 JP3943372B2 (en) 2007-07-11

Family

ID=19155496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001341478A Expired - Lifetime JP3943372B2 (en) 2001-11-07 2001-11-07 Multi-terminal structure for impedance measurement

Country Status (1)

Country Link
JP (1) JP3943372B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010048729A (en) * 2008-08-25 2010-03-04 Hioki Ee Corp Probe and probe unit
JP2013002976A (en) * 2011-06-17 2013-01-07 Hioki Ee Corp Probe unit, circuit board inspection device and probe unit manufacturing method
JP2014126422A (en) * 2012-12-26 2014-07-07 Totoku Electric Co Ltd Duplex contact probe, duplex contact probe unit, and method of manufacturing duplex contact probe
CN108254647A (en) * 2017-11-30 2018-07-06 无锡友方电工股份有限公司 A kind of 200KHZ high frequency transformers conducting wire break-make drive test method for testing
KR102382854B1 (en) * 2020-10-16 2022-04-05 주식회사 오킨스전자 Buffered multi-contact test pin

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010048729A (en) * 2008-08-25 2010-03-04 Hioki Ee Corp Probe and probe unit
JP2013002976A (en) * 2011-06-17 2013-01-07 Hioki Ee Corp Probe unit, circuit board inspection device and probe unit manufacturing method
JP2014126422A (en) * 2012-12-26 2014-07-07 Totoku Electric Co Ltd Duplex contact probe, duplex contact probe unit, and method of manufacturing duplex contact probe
CN108254647A (en) * 2017-11-30 2018-07-06 无锡友方电工股份有限公司 A kind of 200KHZ high frequency transformers conducting wire break-make drive test method for testing
CN108254647B (en) * 2017-11-30 2021-01-15 无锡友方电工股份有限公司 Lead on-off circuit testing method for 200KHZ high-frequency transformer
KR102382854B1 (en) * 2020-10-16 2022-04-05 주식회사 오킨스전자 Buffered multi-contact test pin

Also Published As

Publication number Publication date
JP3943372B2 (en) 2007-07-11

Similar Documents

Publication Publication Date Title
JP5378273B2 (en) Contact probe and socket, method for manufacturing tubular plunger, and method for manufacturing contact probe
TWI422829B (en) Inspection fixture, electrode structure and method for manufacturing electrode structure
US6809535B2 (en) Notched electrical test probe tip
JP6305754B2 (en) Contact probe unit
TW201229519A (en) Contact probe and probe unit
JP2003139794A (en) Multi-terminal structure for measuring impedance
JP3165066B2 (en) Elastic connector with tubular spring
JP5707270B2 (en) Outlet measuring probe and voltage measuring instrument
WO2002010780A1 (en) Electrical test probe wedge tip
JP5192899B2 (en) Probe needle and manufacturing method thereof
JP7005939B2 (en) Contact probe
JP5840689B2 (en) Electrical probe and related methods
JP2005114393A (en) Contact probe with lead wire, and manufacturing method therefor
JP2003194849A (en) Contact probe
CN112013758A (en) Multi-parameter detection method and device for coiled cable and detection clamp
JP4562122B2 (en) Two-probe Kelvin probe for solder ball inspection
JPH02124469A (en) Probe card
JPH08160074A (en) Four-terminal measuring probe
JP2606819Y2 (en) Probe structure for four-terminal measurement
WO2022074888A1 (en) Contact probe
JPS63154970A (en) Terminal for measuring resistance
KR20230151879A (en) Contact probe
JPH09138250A (en) Probe for four-terminal measurement
JPH0348170A (en) Probe for electrical measurement and measuring method for low resistance
JP2002334746A (en) Electric wire connecting tool

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20041029

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20061114

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20061122

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070111

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070307

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070405

R150 Certificate of patent or registration of utility model

Ref document number: 3943372

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120413

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140413

Year of fee payment: 7

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term