JP2003106944A5 - - Google Patents

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Publication number
JP2003106944A5
JP2003106944A5 JP2002241958A JP2002241958A JP2003106944A5 JP 2003106944 A5 JP2003106944 A5 JP 2003106944A5 JP 2002241958 A JP2002241958 A JP 2002241958A JP 2002241958 A JP2002241958 A JP 2002241958A JP 2003106944 A5 JP2003106944 A5 JP 2003106944A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002241958A
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Japanese (ja)
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JP2003106944A (ja
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Publication date
Priority claimed from US09/938,100 external-priority patent/US6914681B2/en
Application filed filed Critical
Publication of JP2003106944A publication Critical patent/JP2003106944A/ja
Publication of JP2003106944A5 publication Critical patent/JP2003106944A5/ja
Pending legal-status Critical Current

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JP2002241958A 2001-08-22 2002-08-22 干渉計を用いた光学部品の特性測定システム及びその測定方法 Pending JP2003106944A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/938,100 US6914681B2 (en) 2001-08-22 2001-08-22 Interferometric optical component analyzer based on orthogonal filters
US938100 2001-08-22

Publications (2)

Publication Number Publication Date
JP2003106944A JP2003106944A (ja) 2003-04-09
JP2003106944A5 true JP2003106944A5 (enExample) 2005-11-04

Family

ID=25470896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002241958A Pending JP2003106944A (ja) 2001-08-22 2002-08-22 干渉計を用いた光学部品の特性測定システム及びその測定方法

Country Status (4)

Country Link
US (2) US6914681B2 (enExample)
EP (1) EP1286150B1 (enExample)
JP (1) JP2003106944A (enExample)
DE (1) DE60218250T2 (enExample)

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US7609385B2 (en) * 2005-08-18 2009-10-27 Alcatel-Lucent Usa Inc. Method and apparatus for characterization of the response of optical devices
JP2007071790A (ja) * 2005-09-08 2007-03-22 Saitama Univ Ｍｅｍｓの動作診断装置及び動作診断方法
US7639368B2 (en) * 2005-09-13 2009-12-29 Halliburton Energy Services, Inc. Tracking algorithm for linear array signal processor for Fabry-Perot cross-correlation pattern and method of using same
US7684051B2 (en) 2006-04-18 2010-03-23 Halliburton Energy Services, Inc. Fiber optic seismic sensor based on MEMS cantilever
WO2007126475A2 (en) 2006-04-26 2007-11-08 Davidson Instruments, Inc. Fiber optic mems seismic sensor with mass supported by hinged beams
WO2008013705A2 (en) * 2006-07-26 2008-01-31 Luna Innovations Incorporated High resolution interferometric optical frequency domain reflectometry ( ofdr) beyond the laser coherence length
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US8149419B2 (en) 2007-02-28 2012-04-03 Nippon Telegraph And Telephone Corporation Optical reflectometry and optical reflectometer
US8380457B2 (en) 2007-08-29 2013-02-19 Canon U.S. Life Sciences, Inc. Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes
US8306773B2 (en) * 2007-08-29 2012-11-06 Canon U.S. Life Sciences, Inc. Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes
US9221056B2 (en) * 2007-08-29 2015-12-29 Canon U.S. Life Sciences, Inc. Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes
US8180216B2 (en) * 2007-12-20 2012-05-15 Verizon Patent And Licensing Inc. Latency measurement in optical networks
JP5194963B2 (ja) * 2008-04-03 2013-05-08 株式会社ニコン 波形解析装置、波形解析プログラム、干渉計装置、パターン投影形状測定装置、及び波形解析方法
EP2627966B1 (en) * 2010-10-14 2018-08-01 Fibersonics Inc. Interferometer systems
CN102749035B (zh) * 2012-06-29 2015-04-15 浙江睿思特智能科技有限公司 光纤光栅位移传感器及传感方法
CN104792502B (zh) * 2015-04-29 2017-12-08 重庆大学 一种测量弱光纤光栅反射率的方法
JP7074311B2 (ja) * 2017-08-30 2022-05-24 国立研究開発法人産業技術総合研究所 光学的距離測定装置および測定方法
EP3743679B1 (en) 2018-01-23 2023-06-28 AMO Development, LLC Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity
JP7020385B2 (ja) * 2018-11-29 2022-02-16 日本電信電話株式会社 位相測定方法、信号処理装置、およびプログラム
JP7042975B2 (ja) * 2019-06-25 2022-03-28 三菱電機株式会社 信号処理装置、信号処理方法及びレーダ装置
CN110601754B (zh) * 2019-09-02 2022-03-04 东南大学 一种基于微波光子下变频的光器件光谱响应测试装置及方法
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