JP2003106944A5 - - Google Patents
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- Publication number
- JP2003106944A5 JP2003106944A5 JP2002241958A JP2002241958A JP2003106944A5 JP 2003106944 A5 JP2003106944 A5 JP 2003106944A5 JP 2002241958 A JP2002241958 A JP 2002241958A JP 2002241958 A JP2002241958 A JP 2002241958A JP 2003106944 A5 JP2003106944 A5 JP 2003106944A5
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- JP
- Japan
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US938100 | 2001-08-22 | ||
US09/938,100 US6914681B2 (en) | 2001-08-22 | 2001-08-22 | Interferometric optical component analyzer based on orthogonal filters |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2003106944A JP2003106944A (ja) | 2003-04-09 |
JP2003106944A5 true JP2003106944A5 (ja) | 2005-11-04 |
Family
ID=25470896
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002241958A Pending JP2003106944A (ja) | 2001-08-22 | 2002-08-22 | 干渉計を用いた光学部品の特性測定システム及びその測定方法 |
Country Status (4)
Country | Link |
---|---|
US (2) | US6914681B2 (ja) |
EP (1) | EP1286150B1 (ja) |
JP (1) | JP2003106944A (ja) |
DE (1) | DE60218250T2 (ja) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BRPI0400231A (pt) * | 2004-01-13 | 2005-09-13 | Fiberwork Comunicacoees Optica | Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas |
EP1721138A1 (en) * | 2004-02-26 | 2006-11-15 | Agilent Technologies, Inc., A Delaware Corporation | Interferometric transfer function determination |
US7492463B2 (en) * | 2004-04-15 | 2009-02-17 | Davidson Instruments Inc. | Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor |
US7305158B2 (en) * | 2004-04-15 | 2007-12-04 | Davidson Instruments Inc. | Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer |
US20050259270A1 (en) * | 2004-05-21 | 2005-11-24 | The Regents Of The University Of California | Fiberoptic fabry-perot optical processor |
CA2817631C (en) * | 2004-12-14 | 2015-06-02 | Luna Innovations Inc. | Compensating for time varying phase changes in interferometric measurements |
US7864329B2 (en) | 2004-12-21 | 2011-01-04 | Halliburton Energy Services, Inc. | Fiber optic sensor system having circulators, Bragg gratings and couplers |
EP1681540A1 (en) * | 2004-12-21 | 2006-07-19 | Davidson Instruments, Inc. | Multi-channel array processor |
US20060274323A1 (en) * | 2005-03-16 | 2006-12-07 | Gibler William N | High intensity fabry-perot sensor |
KR100719892B1 (ko) * | 2005-03-23 | 2007-05-18 | 광주과학기술원 | 다중모드광섬유의 모드간 차등지연시간 측정장치 |
US7609385B2 (en) * | 2005-08-18 | 2009-10-27 | Alcatel-Lucent Usa Inc. | Method and apparatus for characterization of the response of optical devices |
JP2007071790A (ja) * | 2005-09-08 | 2007-03-22 | Saitama Univ | Memsの動作診断装置及び動作診断方法 |
WO2007033069A2 (en) * | 2005-09-13 | 2007-03-22 | Davidson Instruments Inc. | Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same |
US7684051B2 (en) | 2006-04-18 | 2010-03-23 | Halliburton Energy Services, Inc. | Fiber optic seismic sensor based on MEMS cantilever |
WO2007126475A2 (en) | 2006-04-26 | 2007-11-08 | Davidson Instruments, Inc. | Fiber optic mems seismic sensor with mass supported by hinged beams |
US7515276B2 (en) * | 2006-07-26 | 2009-04-07 | Luna Innovations Incorporated | High resolution interferometric optical frequency domain reflectometry (OFDR) beyond the laser coherence length |
US8115937B2 (en) * | 2006-08-16 | 2012-02-14 | Davidson Instruments | Methods and apparatus for measuring multiple Fabry-Perot gaps |
CA2676246C (en) * | 2007-01-24 | 2013-03-19 | Halliburton Energy Services, Inc. | Transducer for measuring environmental parameters |
US8149419B2 (en) | 2007-02-28 | 2012-04-03 | Nippon Telegraph And Telephone Corporation | Optical reflectometry and optical reflectometer |
US8306773B2 (en) | 2007-08-29 | 2012-11-06 | Canon U.S. Life Sciences, Inc. | Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes |
US9492826B2 (en) * | 2007-08-29 | 2016-11-15 | Canon U.S. Life Sciences, Inc. | Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes |
US8380457B2 (en) | 2007-08-29 | 2013-02-19 | Canon U.S. Life Sciences, Inc. | Microfluidic devices with integrated resistive heater electrodes including systems and methods for controlling and measuring the temperatures of such heater electrodes |
US8180216B2 (en) * | 2007-12-20 | 2012-05-15 | Verizon Patent And Licensing Inc. | Latency measurement in optical networks |
JP5194963B2 (ja) * | 2008-04-03 | 2013-05-08 | 株式会社ニコン | 波形解析装置、波形解析プログラム、干渉計装置、パターン投影形状測定装置、及び波形解析方法 |
EP2627966B1 (en) | 2010-10-14 | 2018-08-01 | Fibersonics Inc. | Interferometer systems |
CN102749035B (zh) * | 2012-06-29 | 2015-04-15 | 浙江睿思特智能科技有限公司 | 光纤光栅位移传感器及传感方法 |
CN104792502B (zh) * | 2015-04-29 | 2017-12-08 | 重庆大学 | 一种测量弱光纤光栅反射率的方法 |
JP7074311B2 (ja) * | 2017-08-30 | 2022-05-24 | 国立研究開発法人産業技術総合研究所 | 光学的距離測定装置および測定方法 |
US11026575B2 (en) | 2018-01-23 | 2021-06-08 | Amo Development, Llc | Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity |
JP7020385B2 (ja) * | 2018-11-29 | 2022-02-16 | 日本電信電話株式会社 | 位相測定方法、信号処理装置、およびプログラム |
WO2020261391A1 (ja) * | 2019-06-25 | 2020-12-30 | 三菱電機株式会社 | 信号処理装置、信号処理方法及びレーダ装置 |
CN110601754B (zh) * | 2019-09-02 | 2022-03-04 | 东南大学 | 一种基于微波光子下变频的光器件光谱响应测试装置及方法 |
Family Cites Families (17)
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US4856899A (en) * | 1985-12-20 | 1989-08-15 | Yokogawa Electric Corporation | Optical frequency analyzer using a local oscillator heterodyne detection of incident light |
US4905244A (en) * | 1986-09-26 | 1990-02-27 | United States Department Of Energy | Heterodyne laser spectroscopy system |
US5062703A (en) * | 1988-01-21 | 1991-11-05 | Hewlett-Packard Company | Method and apparatus for measuring the length of, or distances to discontinuities in, an optical transmission medium |
US4921347A (en) * | 1988-01-25 | 1990-05-01 | Hewlett-Packard Company | Method and apparatus for calibrating a lightwave component measurement system |
US5202745A (en) * | 1990-11-07 | 1993-04-13 | Hewlett-Packard Company | Polarization independent optical coherence-domain reflectometry |
US5293213A (en) * | 1992-08-12 | 1994-03-08 | Klein Uwe K A | Utilization of a modulated laser beam in heterodyne interferometry |
JP3222562B2 (ja) * | 1992-08-25 | 2001-10-29 | 株式会社東芝 | 光ネットワークアナライザ |
DE4333423C2 (de) * | 1993-09-30 | 1997-04-10 | Fraunhofer Ges Forschung | Interferometrisches Verfahren und Interferometer mit einem Diodenlaser |
US5801830A (en) * | 1996-02-14 | 1998-09-01 | Wavelinq, Inc. | Apparatus and associated methods of detecting optical carriers and measuring characteristics thereof |
FR2745082B1 (fr) * | 1996-02-16 | 1998-04-30 | Univ Geneve | Procede et dispositif de mesure de la dispersion de polarisation d'une fibre optique |
US5780843A (en) * | 1996-07-16 | 1998-07-14 | Universite Laval | Absolute optical frequency calibrator for a variable frequency optical source |
US6312373B1 (en) * | 1998-09-22 | 2001-11-06 | Nikon Corporation | Method of manufacturing an optical system |
US6434176B1 (en) * | 1999-02-05 | 2002-08-13 | Zygo Corporation | Frequency stabilized laser system |
US6204924B1 (en) * | 1999-02-23 | 2001-03-20 | Exfo Electro-Optical Engineering Inc. | Method and apparatus for measuring polarization mode dispersion of optical devices |
US6359692B1 (en) * | 1999-07-09 | 2002-03-19 | Zygo Corporation | Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry |
EP1113250B1 (en) * | 2000-11-17 | 2003-02-05 | Agilent Technologies, Inc. (a Delaware corporation) | Method and apparatus for determining the polarisation mode dispersion of an optical device |
US6486961B1 (en) * | 2001-05-08 | 2002-11-26 | Agilent Technologies, Inc. | System and method for measuring group delay based on zero-crossings |
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2001
- 2001-08-22 US US09/938,100 patent/US6914681B2/en not_active Expired - Fee Related
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2002
- 2002-03-15 US US10/098,702 patent/US6900896B2/en not_active Expired - Fee Related
- 2002-07-22 EP EP02016433A patent/EP1286150B1/en not_active Expired - Fee Related
- 2002-07-22 DE DE60218250T patent/DE60218250T2/de not_active Expired - Fee Related
- 2002-08-22 JP JP2002241958A patent/JP2003106944A/ja active Pending