JP2003104947A - Method for purifying liquid crystal compound by magnetic field application - Google Patents

Method for purifying liquid crystal compound by magnetic field application

Info

Publication number
JP2003104947A
JP2003104947A JP2001301170A JP2001301170A JP2003104947A JP 2003104947 A JP2003104947 A JP 2003104947A JP 2001301170 A JP2001301170 A JP 2001301170A JP 2001301170 A JP2001301170 A JP 2001301170A JP 2003104947 A JP2003104947 A JP 2003104947A
Authority
JP
Japan
Prior art keywords
group
liquid crystal
fluorine
substituted
crystal compound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001301170A
Other languages
Japanese (ja)
Inventor
Shunji Suzuki
俊自 鈴木
Makoto Sasaki
誠 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIC Corp
Original Assignee
Dainippon Ink and Chemicals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Ink and Chemicals Co Ltd filed Critical Dainippon Ink and Chemicals Co Ltd
Priority to JP2001301170A priority Critical patent/JP2003104947A/en
Publication of JP2003104947A publication Critical patent/JP2003104947A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a method for purifying a liquid crystal compound, with which the reliability of a liquid crystal compound is improved and to obtain a liquid crystal composition having excellent reliability using the compound obtained by the method as a constituent component and a liquid crystal element using the liquid crystal composition. SOLUTION: This method for purifying a liquid crystal compound comprises applying a magnetic field to a liquid crystal compound in a liquid state, in a liquid crystal state or in a dissolved state in a solvent and subjecting the liquid crystal compound to a process for washing in water. The liquid crystal compound purified by the method has high reliability and is useful as a constituent material for a liquid crystal composition.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は液晶化合物の新規精
製法と、その精製法により精製された液晶化合物、その
化合物を含む液晶組成物及びその組成物を用いた液晶表
示素子に関する。
TECHNICAL FIELD The present invention relates to a novel method for purifying a liquid crystal compound, a liquid crystal compound purified by the purification method, a liquid crystal composition containing the compound, and a liquid crystal display device using the composition.

【0002】[0002]

【従来の技術】液晶表示素子は、時計、電卓をはじめと
して、各種測定機器、自動車用パネル、ワープロ、電子
手帳、プリンター、コンピューター、テレビ等に用いら
れるようになっている。液晶表示方式としては、その代
表的なものにTN(捩れネマチック)型、STN(超捩れネマチ
ック)型、DS(動的光散乱)型、GH(ゲスト・ホスト)型あ
るいは高速応答が可能なFLC(強誘電性液晶)等を挙げる
ことができる。また駆動方式としても従来のスタティッ
ク駆動からマルチプレックス駆動が一般的になり、さら
に単純マトリックス方式、最近ではアクティブマトリッ
クス方式が実用化されている。これらに用いられる液晶
材料としては、これまでに非常に多種類の化合物が合成
されており、その用途に応じて液晶組成物の構成成分と
して使用されている。
2. Description of the Related Art Liquid crystal display devices have come to be used in watches, calculators, various measuring instruments, automobile panels, word processors, electronic notebooks, printers, computers, televisions and the like. Typical liquid crystal display systems are TN (twisted nematic) type, STN (super twisted nematic) type, DS (dynamic light scattering) type, GH (guest host) type, or FLC capable of high-speed response. (Ferroelectric liquid crystal) and the like. Also, as the drive system, the conventional static drive has become more common, and the multiplex drive is becoming more common, and the simple matrix system and recently the active matrix system have been put into practical use. As liquid crystal materials used for these, a great variety of compounds have been synthesized so far, and they are used as a constituent component of a liquid crystal composition depending on the application.

【0003】液晶組成物の物性(ネマチック相温度範
囲、屈折率異方性(Δn)、誘電率異方性(Δε)、粘度、
弾性定数等)や電気光学的特性(応答時間、閾値電圧、V-
T曲線の急峻性等)は目的とする液晶素子の表示方式や駆
動方式に応じて、種々の値が要求されている。更に、そ
れに加えてマトリックス駆動方式の場合には、熱、光に
対する高い信頼性が要求される。
Physical properties of liquid crystal compositions (nematic phase temperature range, refractive index anisotropy (Δn), dielectric anisotropy (Δε), viscosity,
Elastic constants) and electro-optical characteristics (response time, threshold voltage, V-
Various values are required for the steepness of the T curve, etc., depending on the target display system and drive system of the liquid crystal element. Further, in addition to this, in the case of the matrix driving method, high reliability against heat and light is required.

【0004】液晶組成物の信頼性(比抵抗等)は、組成物
を構成する個々の液晶化合物が高い信頼性(比抵抗等)を
有し、かつ高いパネル中での信頼性を有する必要があ
る。しかしながら、除去しにくい微量不純物の存在のた
めに化合物の信頼性やパネル中での信頼性の向上が困難
な場合が多く精製方法の検討が行われてきた。従来この
ような不純物を除去するためには、必要に応じて再結晶
やカラムクロマトグラフィー、吸着剤処理、イオン交換
処理、又は蒸留等の操作を組み合わせて精製しなければ
ならず、液晶化合物の製造上において生産性を著しく低
下させていた。また、上記の精製操作だけではいくら繰
り返しても液晶化合物単体としての信頼性(比抵抗等)や
パネル中での信頼性を充分に向上させることができず、
そのために物性や電気光学特性は優れているにもかかわ
らず、実用化できない化合物も存在した。
Regarding the reliability (specific resistance etc.) of the liquid crystal composition, it is necessary that the individual liquid crystal compounds constituting the composition have high reliability (specific resistance etc.) and high reliability in the panel. is there. However, in many cases, it is difficult to improve the reliability of the compound or the reliability in the panel due to the presence of trace impurities that are difficult to remove, and the purification method has been studied. Conventionally, in order to remove such impurities, it has been necessary to purify by combining operations such as recrystallization, column chromatography, adsorbent treatment, ion exchange treatment, or distillation, if necessary, to produce a liquid crystal compound. In the above, productivity was remarkably reduced. In addition, it is not possible to sufficiently improve the reliability (specific resistance etc.) of the liquid crystal compound alone or the reliability in the panel no matter how many times the above refining operation is repeated,
Therefore, there were some compounds that could not be put to practical use, although they had excellent physical properties and electro-optical properties.

【0005】[0005]

【発明が解決しようとする課題】本発明が解決しようと
する課題は、簡便な操作により、液晶化合物の信頼性
(比抵抗等)やパネル中での信頼性を向上させる精製方法
を提供することにあり、またそれによって得られた化合
物を構成成分として使用した、パネル中での信頼性に優
れた液晶組成物を提供し、さらにその液晶組成物を使用
した高信頼性液晶表示素子を提供することにある。
The problem to be solved by the present invention is to improve the reliability of a liquid crystal compound by a simple operation.
A liquid crystal composition excellent in reliability in a panel, which is to provide a refining method for improving the reliability in a panel (specific resistance, etc.) and a compound obtained thereby is used as a constituent component. And to provide a highly reliable liquid crystal display device using the liquid crystal composition.

【0006】[0006]

【課題を解決するための手段】本発明者らは上記課題を
解決するために鋭意検討した結果、液晶化合物を液体状
態もしくは液晶状態又は溶剤に溶解した状態で磁場を印
加した後、水洗浄工程を加えることを特徴とする液晶化
合物の精製方法を見いだした。
Means for Solving the Problems As a result of intensive studies for solving the above problems, the present inventors have found that a liquid crystal compound is in a liquid state or in a liquid crystal state or in a state of being dissolved in a solvent, and then a magnetic field is applied, followed by a water washing step. The present inventors have found a method for purifying a liquid crystal compound, which is characterized by adding

【0007】さらに得られた化合物を構成成分として使
用することにより、高い信頼性(比抵抗等)とパネル中で
の信頼性を有する液晶組成物が調製できるようになり、
これを用いた単純マトリックス駆動方式、アクティブマ
トリックス駆動方式等の高信頼性液晶表示素子の製造が
可能となり、本発明を完成するに至った。
Further, by using the obtained compound as a constituent, a liquid crystal composition having high reliability (specific resistance etc.) and reliability in a panel can be prepared,
It has become possible to manufacture a highly reliable liquid crystal display device such as a simple matrix drive system and an active matrix drive system using this, and the present invention has been completed.

【0008】[0008]

【発明の実施の形態】本発明の精製方法は、前述のよう
に液晶化合物を液体状態もしくは液晶状態又は溶剤に溶
解した状態で磁場を印加した後、水洗浄工程を加えるこ
とを特徴とするものである。
BEST MODE FOR CARRYING OUT THE INVENTION The purification method of the present invention is characterized by applying a magnetic field in a liquid state or a liquid crystal state or in a state of being dissolved in a solvent as described above, and then adding a water washing step. Is.

【0009】本発明で使用する磁場の強度は0.1Tから10
Tが好ましく、0.3Tから7Tがより好ましく、0.5Tから5T
がさらに好ましく、1Tから3Tが特に好ましい。又、磁場
の発生源としては永久磁石、電磁石、超電導磁石又はこ
れらの複合磁石を用いることができる。
The strength of the magnetic field used in the present invention is from 0.1 T to 10
T is preferable, 0.3T to 7T is more preferable, 0.5T to 5T
Is more preferable, and 1T to 3T is particularly preferable. Further, a permanent magnet, an electromagnet, a superconducting magnet or a composite magnet of these can be used as a magnetic field generation source.

【0010】磁場の印加時間は10分間から24時間が好ま
しく、15分間から18時間がより好ましく、1時間から6時
間が特に好ましい。
The magnetic field application time is preferably 10 minutes to 24 hours, more preferably 15 minutes to 18 hours, and particularly preferably 1 hour to 6 hours.

【0011】溶剤に溶解した状態で精製を行う場合、溶
剤としては、炭化水素系溶剤が好ましく、脂肪族炭化水
素系溶剤ではn-ヘキサン、ヘプタン、オクタン、ノナ
ン、デカン、芳香族炭化水素系溶剤ではベンゼン、トル
エン、キシレンが好ましく、n-ヘキサン、ヘプタン、ト
ルエン、キシレンがさらに好ましく、n-ヘキサン、トル
エンが特に好ましい。
When purification is carried out in a state of being dissolved in a solvent, the solvent is preferably a hydrocarbon solvent, and in the case of an aliphatic hydrocarbon solvent, n-hexane, heptane, octane, nonane, decane, an aromatic hydrocarbon solvent. Then, benzene, toluene and xylene are preferable, n-hexane, heptane, toluene and xylene are more preferable, and n-hexane and toluene are particularly preferable.

【0012】水洗浄工程とは、液体状態、液晶状態もし
くは溶剤に溶解した液晶化合物と水との二相系で水洗及
び分液する工程をいう。
The step of washing with water is a step of washing and separating with a two-phase system of a liquid state, a liquid crystal state or a liquid crystal compound dissolved in a solvent and water.

【0013】水洗浄工程に用いる水はイオン交換水、蒸
留水又は超純水が好ましく、イオン交換水が特に好まし
い。また、イオン交換水の導電率は1.0μS/cm2以下が好
ましく、0.5μS/cm2以下が特に好ましい。
The water used in the water washing step is preferably ion-exchanged water, distilled water or ultrapure water, and ion-exchanged water is particularly preferable. The electric conductivity of the deionized water is preferably 1.0 .mu.s / cm 2 or less, 0.5 .mu.s / cm 2 or less is particularly preferred.

【0014】水洗浄工程後の精製工程は、再結晶、カラ
ムクロマトグラフィー、吸着剤処理から選ばれる1種も
しくは2種以上を行うことが好ましく、吸着剤処理を行
うことがより好ましく、吸着剤処理の後再結晶を行うこ
とが特に好ましい。
In the purification step after the water washing step, it is preferable to carry out one or more selected from recrystallization, column chromatography and adsorbent treatment, more preferably adsorbent treatment, and more preferably adsorbent treatment. It is particularly preferred to carry out post-recrystallization.

【0015】本発明の精製方法の対象となる液晶化合物
としては、一般式(I)
The liquid crystal compound which is the object of the purification method of the present invention is represented by the general formula (I)

【化2】 (式中、Rは水素原子、炭素原子数1〜20のアルキル基、
アルコキシル基、アルコキシルアルキル基、アルケニル
基又はアルケニルオキシ基を表しこれらは炭素原子数1
〜7のアルコキシル基又はアルケニルオキシ基で置換さ
れていてもよく、鎖中の任意の1個以上の水素原子はフ
ッ素原子で置換されていてもよい。A、B、C及びDはそれ
ぞれ独立的にトランス-1,4-シクロへキシレン基、1個以
上のフッ素原子で置換されていてもよい1,4-フェニレン
基、1個以上のフッ素原子で置換されていてもよいナフ
タレン-2,6-ジイル基、1個以上のフッ素原子で置換され
ていてもよいテトラヒドロナフタレン-2,6-ジイル基、
デカヒドロナフタレン-2,6-ジイル基、1個以上のフッ素
原子で置換されていてもよいフェナントレン-3,8-ジイ
ル基、1個以上のフッ素原子で置換されていてもよいテ
トラヒドロフェナントレン-3,8-ジイル基、1個以上のフ
ッ素原子で置換されていてもよいオクタヒドロフェナン
トレン-3,8-ジイル基、パーヒドロフェナントレン-3,8-
ジイル基、ピリジン-2,5-ジイル基、ピリミジン-2,5-ジ
イル基、ピラジン-2,5-ジイル基、ピリダジン-3,6-ジイ
ル基、又はトランス-1,3-ジオキサン-2,5-ジイル基を表
し、L1〜L4はそれぞれ独立的に-COO-、-OCO-、-CH2CH
2-、-CH2CH(CH3)-、-CH(CH3)CH2-、-CH2O-、-OCH2-、-C
F2O-、-OCF2-、-CH2CH2CH2CH2-、-CH=CHCH2CH2-、-CH2C
H=CHCH 2-、-CH2CH2CH=CH-、-OCH2CH2CH2-、-CH2OCH2CH2
-、-CH2CH2OCH2-、-CH2CH2CH2O-、-CF2OCH2CH2-、-CH2C
H2OCF2-、-CF=CF-、-CH=CH-、-C≡C-又は単結合を表
す。a、b、c及びdはそれぞれ独立的に0又は1を表すが、
少なくとも1個は1を表す。Zはシアノ基、フッ素原子、
塩素原子、トリフルオロメチル基、トリフルオロメトキ
シ基、ジフルオロメトキシ基、炭素原子数2〜3のフッ素
置換されたアルコキシル基、炭素原子数2〜7の直鎖状ア
ルキル基又はアルケニル基を表す。)で表される化合物
の精製に好適である。
[Chemical 2] (In the formula, R is a hydrogen atom, an alkyl group having 1 to 20 carbon atoms,
Alkoxyl group, alkoxyl alkyl group, alkenyl
Represents a group or alkenyloxy group, which has 1 carbon atom
Substituted with an alkoxyl group or an alkenyloxy group of
Any one or more hydrogen atoms in the chain
It may be substituted with a nitrogen atom. A, B, C and D are
Independently trans-1,4-cyclohexylene groups, 1 or more
1,4-phenylene optionally substituted with the above fluorine atoms
Group, naphth optionally substituted with one or more fluorine atoms
Talen-2,6-diyl group, substituted with one or more fluorine atoms
An optionally tetrahydronaphthalene-2,6-diyl group,
Decahydronaphthalene-2,6-diyl group, one or more fluorine
Phenanthrene-3,8-di, optionally substituted with atoms
Group, a group which may be substituted with one or more fluorine atoms.
Trahydrophenanthrene-3,8-diyl group, 1 or more
Octahydrophenane optionally substituted with a fluorine atom
Tren-3,8-diyl group, perhydrophenanthrene-3,8-
Diyl group, pyridine-2,5-diyl group, pyrimidine-2,5-di
Yl group, pyrazine-2,5-diyl group, pyridazine-3,6-diyl group
Group or trans-1,3-dioxane-2,5-diyl group
Then L1~ LFourAre independently -COO-, -OCO-, -CH2CH
2-, -CH2CH (CH3)-,-CH (CH3) CH2-, -CH2O-, -OCH2-, -C
F2O-, -OCF2-, -CH2CH2CH2CH2-, -CH = CHCH2CH2-, -CH2C
H = CHCH 2-, -CH2CH2CH = CH-, -OCH2CH2CH2-, -CH2OCH2CH2
-, -CH2CH2OCH2-, -CH2CH2CH2O-, -CF2OCH2CH2-, -CH2C
H2OCF2-, -CF = CF-, -CH = CH-, -C≡C- or single bond
You a, b, c and d each independently represent 0 or 1,
At least one represents 1. Z is a cyano group, a fluorine atom,
Chlorine atom, trifluoromethyl group, trifluoromethoxy
Si group, difluoromethoxy group, fluorine having 2 to 3 carbon atoms
Substituted alkoxyl group, straight-chain alkenyl group having 2 to 7 carbon atoms
It represents a alkyl group or an alkenyl group. Compound represented by)
It is suitable for purification.

【0016】一般式(I)において、Rが炭素原子数1〜7の
直鎖状アルキル基又は炭素原子数2〜7の直鎖状アルケニ
ル基を表す化合物が好ましく、Zがシアノ基、フッ素原
子、塩素原子、トリフルオロメチル基、トリフルオロメ
トキシ基、ジフルオロメトキシ基又は炭素原子数2〜3の
フッ素置換されたアルコキシル基を表し、存在するL1
L4が-COO-、-OCO-、-CF2O-、-OCF2-又は-C≡C-を表す化
合物の精製により好適である。これらの化合物は、誘電
率異方性が分子長軸方向でかつその絶対値が大きい強P
型液晶材料であり、不純物を取り込み易いため従来の精
製方法では充分な信頼性が得られなかった。
In the general formula (I), a compound in which R represents a linear alkyl group having 1 to 7 carbon atoms or a linear alkenyl group having 2 to 7 carbon atoms is preferable, and Z is a cyano group or a fluorine atom. Represents a chlorine atom, a trifluoromethyl group, a trifluoromethoxy group, a difluoromethoxy group or a fluorine-substituted alkoxyl group having 2 to 3 carbon atoms, and exists L 1 to
It is more preferable to purify a compound in which L 4 represents —COO—, —OCO—, —CF 2 O—, —OCF 2 — or —C≡C—. These compounds have a strong anisotropy of P
Since it is a type liquid crystal material and impurities are easily taken in, sufficient reliability could not be obtained by the conventional refining method.

【0017】また、本精製方法は、液晶化合物を単体で
精製しても良く、2種以上の液晶化合物を混合した液晶
組成物として精製しても良い。
In the present purification method, the liquid crystal compound may be purified alone or as a liquid crystal composition in which two or more kinds of liquid crystal compounds are mixed.

【0018】[0018]

【実施例】以下に本発明の実施例を示し、本発明を更に
説明する。しかし、本発明はこれらの実施例に限定され
るものではない。
The present invention will be further described below by showing Examples of the present invention. However, the present invention is not limited to these examples.

【0019】化合物の信頼性評価 母体液晶組成物(H)Evaluation of reliability of compound Base liquid crystal composition (H)

【化3】 (式中、%は質量%を表す。)に本発明の方法により精製し
た液晶化合物を10質量%添加した後、加熱溶解し液晶組
成物を作製した。作製した液晶組成物の比抵抗(Ω・cm)
を測定し化合物の信頼性を評価を行った。
[Chemical 3] A liquid crystal composition was prepared by adding 10% by mass of the liquid crystal compound purified by the method of the present invention to (in the formula,% represents mass%) and heating and dissolving. Resistivity of prepared liquid crystal composition (Ωcm)
Was measured to evaluate the reliability of the compound.

【0020】比抵抗値(Ω・cm)の測定は川口電気(株)製
エレクトロメーターMMAII-17Aにて、セルギャップ1mmの
液体電極LP-05型を用いて1VDCを印加して行った。
The specific resistance value (Ω · cm) was measured with an electrometer MMAII-17A manufactured by Kawaguchi Electric Co., Ltd. by applying 1VDC using a liquid electrode LP-05 type having a cell gap of 1 mm.

【0021】パネル中での信頼性評価 比抵抗測定用に作製した液晶組成物を、TN用液晶セル
(セルギャップ8.3μm)に真空注入し、UV硬化性樹脂(ス
リーボンド社製、Three Bond 3026)で封止し、液晶セル
を作製した。液晶セル作成後、すぐに電流値を測定した
サンプルを初期サンプル(以下初期と略す)とした。液晶
セルに対しサンテスト(オリジナルハナウ社製)を用いて
UV照射を16時間行ったサンプルをUV照射サンプル(以下U
Vと略す)とした。液晶セルをオーブンを用い80℃で210
時間加熱したサンプルを加熱サンプル(以下加熱と略す)
とした。
Evaluation of reliability in panel Liquid crystal composition prepared for measuring specific resistance was used as a liquid crystal cell for TN.
(Cell gap 8.3 μm) was vacuum-injected and sealed with a UV curable resin (Three Bond 3026 manufactured by Three Bond Co., Ltd.) to prepare a liquid crystal cell. A sample whose current value was measured immediately after the liquid crystal cell was prepared was used as an initial sample (hereinafter abbreviated as initial). Using Suntest (Original Hanau) for liquid crystal cells
UV irradiation sample (UV
(Abbreviated as V). Use a liquid crystal cell at 210
A sample that has been heated for a period of time is a heated sample
And

【0022】電流値の測定は、図1に示す回路を用い
て、作製した液晶セルに矩形波(Vap=2.5V)を印加し回路
中の50KΩの抵抗の両端に掛かる電圧波形を観測するこ
とにより行った。観測された電圧波形(図2)よりVr(V)を
求め、以下の式
The current value is measured by applying a rectangular wave (Vap = 2.5V) to the produced liquid crystal cell using the circuit shown in FIG. 1 and observing the voltage waveform applied across the 50KΩ resistor in the circuit. Went by. Calculate Vr (V) from the observed voltage waveform (Fig. 2), and use the following formula

【数1】 により電流値を算出した。この際、それぞれの条件にお
いて3枚の液晶セルを作製しその電流値を測定し、3枚の
セルから得られた電流値の値を平均し電流値とした。
[Equation 1] The current value was calculated by. At this time, three liquid crystal cells were produced under each condition, their current values were measured, and the values of the current values obtained from the three cells were averaged to obtain the current value.

【0023】(実施例1) 1.1Tの磁場を1時間印加したと
きの比抵抗及び電流値
Example 1 Specific resistance and current value when a 1.1 T magnetic field was applied for 1 hour

【化4】 化合物(II) 5gをトルエン25mLに溶解し、1.1Tの磁場を
印加し、1時間攪拌した。イオン交換水25mL(0.35μS/cm
2)により、有機層を2回洗浄後、吸着剤としてシリカゲ
ル0.25g/アルミナ0.25gを加え、30分間攪拌した。1μm
ミリポアフィルターで吸着剤を濾別後、溶剤を減圧留去
した。ヘキサンから再結晶し、晶析した結晶を濾過後、
乾燥し、精製した化合物(II)を4.7g得た。得られた化合
物(II)を使用した評価用液晶組成物の比抵抗及び電流値
の測定結果は以下の通りであった。
[Chemical 4] 5 g of compound (II) was dissolved in 25 mL of toluene, a magnetic field of 1.1 T was applied, and the mixture was stirred for 1 hour. 25 mL of ion-exchanged water (0.35 μS / cm
After washing the organic layer twice with 2 ), 0.25 g of silica gel / 0.25 g of alumina was added as an adsorbent, and the mixture was stirred for 30 minutes. 1 μm
After the adsorbent was filtered off with a Millipore filter, the solvent was distilled off under reduced pressure. After recrystallizing from hexane and filtering the crystallized crystals,
4.7 g of the dried and purified compound (II) was obtained. The measurement results of the specific resistance and current value of the liquid crystal composition for evaluation using the obtained compound (II) are as follows.

【0024】[0024]

【表1】 [Table 1]

【0025】(実施例2) 1.1Tの磁場を5時間印加したと
きの比抵抗及び電流値 化合物(II) 5gをトルエン25mLに溶解し、1.1Tの磁場を
印加し、5時間攪拌した。イオン交換水25mL(0.35μS/cm
2)により、有機層を2回洗浄後、吸着剤としてシリカゲ
ル0.25g/アルミナ0.25gを加え、30分間攪拌した。1μm
ミリポアフィルターで吸着剤を濾別後、溶剤を減圧留去
した。ヘキサンから再結晶し、晶析した結晶を濾過後、
乾燥し、精製した化合物(II)を4.7g得た。得られた化合
物(II)を使用した評価用液晶組成物の比抵抗及び電流値
の測定結果は以下の通りであった。
(Example 2) Resistivity and current value when a magnetic field of 1.1 T was applied for 5 hours 5 g of compound (II) was dissolved in 25 mL of toluene, and a magnetic field of 1.1 T was applied, and the mixture was stirred for 5 hours. 25 mL of ion-exchanged water (0.35 μS / cm
After washing the organic layer twice with 2 ), 0.25 g of silica gel / 0.25 g of alumina was added as an adsorbent, and the mixture was stirred for 30 minutes. 1 μm
After the adsorbent was filtered off with a Millipore filter, the solvent was distilled off under reduced pressure. After recrystallizing from hexane and filtering the crystallized crystals,
4.7 g of the dried and purified compound (II) was obtained. The measurement results of the specific resistance and current value of the liquid crystal composition for evaluation using the obtained compound (II) are as follows.

【0026】[0026]

【表2】 [Table 2]

【0027】(比較例1)化合物(II) 5gをトルエン25mLに
溶解し、イオン交換水25mL(0.35μS/cm2)により、有機
層を2回洗浄後、吸着剤としてシリカゲル0.25g/アルミ
ナ0.25gを加え、30分間攪拌した。1μmミリポアフィル
ターで吸着剤を濾別後、溶剤を減圧留去した。ヘキサン
から再結晶し、晶析した結晶を濾過後、乾燥し、精製し
た化合物(II)を4.6g得た。得られた化合物(II)を使用し
た評価用液晶組成物の比抵抗及び電流値の測定結果は以
下の通りであった。
Comparative Example 1 5 g of the compound (II) was dissolved in 25 mL of toluene, and the organic layer was washed twice with 25 mL of ion-exchanged water (0.35 μS / cm 2 ) and then 0.25 g of silica gel / 0.25 g of alumina as an adsorbent. g was added and stirred for 30 minutes. After the adsorbent was filtered off with a 1 μm Millipore filter, the solvent was distilled off under reduced pressure. The crystals were recrystallized from hexane, and the crystallized crystals were filtered and dried to obtain 4.6 g of purified compound (II). The measurement results of the specific resistance and current value of the liquid crystal composition for evaluation using the obtained compound (II) are as follows.

【0028】[0028]

【表3】 本発明の精製方法による実施例1及び2で得られた化合物
と、公知の方法で精製して得られた比較例1の化合物の
結果を比較する。実施例1及び2において、比抵抗は比較
例1と較べ2倍以上に向上している。電流値は初期で約30
%、UVで約20%、加熱で約10%低減されていることがわか
る。
[Table 3] The results of the compound obtained in Examples 1 and 2 by the purification method of the present invention and the compound of Comparative Example 1 obtained by purification by a known method are compared. In Examples 1 and 2, the specific resistance is more than doubled as compared with Comparative Example 1. Initial current value is about 30
%, UV is about 20%, and heating is about 10%.

【0029】従って、本発明の精製方法は、液晶化合物
の信頼性及びパネル中での信頼性の向上に有効である。
Therefore, the purification method of the present invention is effective in improving the reliability of the liquid crystal compound and the reliability in the panel.

【0030】[0030]

【発明の効果】本発明の液晶化合物の精製方法は、従来
の精製方法では信頼性(比抵抗等)やパネル中での信頼性
の向上が困難であった液晶化合物を液体状態もしくは液
晶状態、又は溶剤に溶解した状態で磁場を印加した後、
水洗浄工程を加えることにより、簡便にかつ容易にその
液晶化合物の信頼性及びパネル中での信頼性を向上させ
ることが可能となった。
The method for purifying a liquid crystal compound of the present invention is a liquid crystal compound in a liquid state or a liquid crystal state, which is difficult to improve reliability (specific resistance etc.) or reliability in a panel by a conventional purification method. Or after applying a magnetic field in the state of being dissolved in a solvent,
By adding the water washing step, it became possible to easily and easily improve the reliability of the liquid crystal compound and the reliability in the panel.

【0031】以上から、本発明の方法により精製された
液晶化合物を含有する液晶組成物は、高い信頼性を有し
TN型、STN型、TFT型の液晶表示素子の構成材料として有
用である。
From the above, the liquid crystal composition containing the liquid crystal compound purified by the method of the present invention has high reliability.
It is useful as a constituent material for TN, STN, and TFT liquid crystal display devices.

【図面の簡単な説明】[Brief description of drawings]

【図1】電流値の測定回路[Figure 1] Current value measurement circuit

【図2】観測波形とVr[Figure 2] Observed waveform and Vr

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) C09K 19/20 C09K 19/20 19/30 19/30 19/32 19/32 19/34 19/34 G02F 1/13 500 G02F 1/13 500 Fターム(参考) 4H006 AA02 AA03 AB64 AD16 AD17 BB11 4H027 BA01 BB03 BB04 BC04 BC05 BD04 BE07 CD04 CL01 CM04 CQ04 ─────────────────────────────────────────────────── ─── Continued Front Page (51) Int.Cl. 7 Identification Code FI Theme Coat (Reference) C09K 19/20 C09K 19/20 19/30 19/30 19/32 19/32 19/34 19/34 G02F 1/13 500 G02F 1/13 500 F term (reference) 4H006 AA02 AA03 AB64 AD16 AD17 BB11 4H027 BA01 BB03 BB04 BC04 BC05 BD04 BE07 CD04 CL01 CM04 CQ04

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 液晶化合物を液体状態もしくは液晶状
態、又は溶剤に溶解した状態で磁場を印加した後、水洗
浄工程を加えることを特徴とする液晶化合物の精製方
法。
1. A method for purifying a liquid crystal compound, which comprises applying a magnetic field in a liquid state or a liquid crystal state or in a state of being dissolved in a solvent, and then adding a water washing step.
【請求項2】 印加する磁場が0.1Tから10Tであり、そ
の印加時間が10分間以上24時間以内である請求項1記載
の方法。
2. The method according to claim 1, wherein the applied magnetic field is 0.1 T to 10 T, and the applied time is 10 minutes or more and 24 hours or less.
【請求項3】 水洗浄工程において、導電率が1.0μS/c
m2以下のイオン交換水を用いる請求項1又は2記載の方
法。
3. The conductivity in the water washing step is 1.0 μS / c.
The method according to claim 1 or 2, wherein ion-exchanged water of m 2 or less is used.
【請求項4】 液晶化合物が一般式(I) 【化1】 (式中、Rは水素原子、炭素原子数1〜20のアルキル基、
アルコキシル基、アルコキシルアルキル基、アルケニル
基又はアルケニルオキシ基を表しこれらは炭素原子数1
〜7のアルコキシル基又はアルケニルオキシ基で置換さ
れていてもよく、鎖中の任意の1個以上の水素原子はフ
ッ素原子で置換されていてもよい。A、B、C及びDはそれ
ぞれ独立的にトランス-1,4-シクロへキシレン基、1個以
上のフッ素原子で置換されていてもよい1,4-フェニレン
基、1個以上のフッ素原子で置換されていてもよいナフ
タレン-2,6-ジイル基、1個以上のフッ素原子で置換され
ていてもよいテトラヒドロナフタレン-2,6-ジイル基、
デカヒドロナフタレン-2,6-ジイル基、1個以上のフッ素
原子で置換されていてもよいフェナントレン-3,8-ジイ
ル基、1個以上のフッ素原子で置換されていてもよいテ
トラヒドロフェナントレン-3,8-ジイル基、1個以上のフ
ッ素原子で置換されていてもよいオクタヒドロフェナン
トレン-3,8-ジイル基、パーヒドロフェナントレン-3,8-
ジイル基、ピリジン-2,5-ジイル基、ピリミジン-2,5-ジ
イル基、ピラジン-2,5-ジイル基、ピリダジン-3,6-ジイ
ル基、又はトランス-1,3-ジオキサン-2,5-ジイル基を表
し、L1〜L4はそれぞれ独立的に-COO-、-OCO-、-CH2CH
2-、-CH2CH(CH3)-、-CH(CH3)CH2-、-CH2O-、-OCH2-、-C
F2O-、-OCF2-、-CH2CH2CH2CH2-、-CH=CHCH2CH2-、-CH2C
H=CHCH 2-、-CH2CH2CH=CH-、-OCH2CH2CH2-、-CH2OCH2CH2
-、-CH2CH2OCH2-、-CH2CH2CH2O-、-CF2OCH2CH2-、-CH2C
H2OCF2-、-CF=CF-、-CH=CH-、-C≡C-又は単結合を表
す。a、b、c及びdはそれぞれ独立的に0又は1を表すが、
少なくとも一つは1を表す。Zはシアノ基、フッ素原子、
塩素原子、トリフルオロメチル基、トリフルオロメトキ
シ基、ジフルオロメトキシ基、炭素原子数2〜3のフッ素
置換されたアルコキシル基、炭素原子数2〜7の直鎖状ア
ルキル基又はアルケニル基を表す。)で表される請求項3
記載の精製方法。
4. A liquid crystal compound represented by the general formula (I) [Chemical 1] (In the formula, R is a hydrogen atom, an alkyl group having 1 to 20 carbon atoms,
Alkoxyl group, alkoxyl alkyl group, alkenyl
Represents a group or alkenyloxy group, which has 1 carbon atom
Substituted with an alkoxyl group or an alkenyloxy group of
Any one or more hydrogen atoms in the chain
It may be substituted with a nitrogen atom. A, B, C and D are
Independently trans-1,4-cyclohexylene groups, 1 or more
1,4-phenylene optionally substituted with the above fluorine atoms
Group, naphth optionally substituted with one or more fluorine atoms
Talen-2,6-diyl group, substituted with one or more fluorine atoms
An optionally tetrahydronaphthalene-2,6-diyl group,
Decahydronaphthalene-2,6-diyl group, one or more fluorine
Phenanthrene-3,8-di, optionally substituted with atoms
Group, a group which may be substituted with one or more fluorine atoms.
Trahydrophenanthrene-3,8-diyl group, 1 or more
Octahydrophenane optionally substituted with a fluorine atom
Tren-3,8-diyl group, perhydrophenanthrene-3,8-
Diyl group, pyridine-2,5-diyl group, pyrimidine-2,5-di
Yl group, pyrazine-2,5-diyl group, pyridazine-3,6-diyl group
Group or trans-1,3-dioxane-2,5-diyl group
Then L1~ LFourAre independently -COO-, -OCO-, -CH2CH
2-, -CH2CH (CH3)-,-CH (CH3) CH2-, -CH2O-, -OCH2-, -C
F2O-, -OCF2-, -CH2CH2CH2CH2-, -CH = CHCH2CH2-, -CH2C
H = CHCH 2-, -CH2CH2CH = CH-, -OCH2CH2CH2-, -CH2OCH2CH2
-, -CH2CH2OCH2-, -CH2CH2CH2O-, -CF2OCH2CH2-, -CH2C
H2OCF2-, -CF = CF-, -CH = CH-, -C≡C- or single bond
You a, b, c and d each independently represent 0 or 1,
At least one represents 1. Z is a cyano group, a fluorine atom,
Chlorine atom, trifluoromethyl group, trifluoromethoxy
Si group, difluoromethoxy group, fluorine having 2 to 3 carbon atoms
Substituted alkoxyl group, straight-chain alkenyl group having 2 to 7 carbon atoms
It represents a alkyl group or an alkenyl group. ) Claim 3 represented by
The described purification method.
【請求項5】 一般式(I)において、Zがシアノ基、フッ
素原子、塩素原子、トリフルオロメチル基、トリフルオ
ロメトキシ基、ジフルオロメトキシ基又は炭素原子数2
〜3のフッ素置換されたアルコキシル基を表し、存在す
るL1〜L4が-COO-、-OCO-、-CF2O-、-OCF2-又は-C≡C-を
表す請求項4記載の精製方法。
5. In the general formula (I), Z is a cyano group, a fluorine atom, a chlorine atom, a trifluoromethyl group, a trifluoromethoxy group, a difluoromethoxy group or 2 carbon atoms.
Represent to 3 of fluorine-substituted alkoxy group, present L 1 ~L 4 is -COO -, - OCO -, - CF 2 O -, - OCF 2 - or -C≡C- claim 4, wherein representing the Purification method.
【請求項6】 水洗浄工程後にさらに再結晶、カラムク
ロマトグラフィー及び吸着剤処理から選ばれる1種もし
くは2種以上の精製工程を行う請求項1〜5の何れかに記
載の精製方法。
6. The purification method according to claim 1, further comprising one or more purification steps selected from recrystallization, column chromatography and adsorbent treatment after the water washing step.
【請求項7】 請求項1〜6の何れかに記載の方法により
精製された液晶化合物。
7. A liquid crystal compound purified by the method according to claim 1.
【請求項8】 請求項7記載の液晶化合物を含有する液
晶組成物。
8. A liquid crystal composition containing the liquid crystal compound according to claim 7.
【請求項9】 請求項8記載の液晶組成物を構成要素と
する液晶表示素子。
9. A liquid crystal display device comprising the liquid crystal composition according to claim 8 as a constituent element.
JP2001301170A 2001-09-28 2001-09-28 Method for purifying liquid crystal compound by magnetic field application Pending JP2003104947A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005035938A (en) * 2003-07-16 2005-02-10 National Institute Of Advanced Industrial & Technology Method for isolating and refining organic material in magnetic field
JP2006249179A (en) * 2005-03-09 2006-09-21 Dainippon Ink & Chem Inc Liquid crystal composition and liquid crystal display element
CN101173172B (en) * 2006-10-30 2011-01-26 比亚迪股份有限公司 Liquid crystal purifying method
CN101210183B (en) * 2006-12-27 2011-01-26 比亚迪股份有限公司 Method for purifying liquid crystal material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005035938A (en) * 2003-07-16 2005-02-10 National Institute Of Advanced Industrial & Technology Method for isolating and refining organic material in magnetic field
JP2006249179A (en) * 2005-03-09 2006-09-21 Dainippon Ink & Chem Inc Liquid crystal composition and liquid crystal display element
CN101173172B (en) * 2006-10-30 2011-01-26 比亚迪股份有限公司 Liquid crystal purifying method
CN101210183B (en) * 2006-12-27 2011-01-26 比亚迪股份有限公司 Method for purifying liquid crystal material

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