JP2003066081A - Charge distribution measuring device and image forming device - Google Patents
Charge distribution measuring device and image forming deviceInfo
- Publication number
- JP2003066081A JP2003066081A JP2001254024A JP2001254024A JP2003066081A JP 2003066081 A JP2003066081 A JP 2003066081A JP 2001254024 A JP2001254024 A JP 2001254024A JP 2001254024 A JP2001254024 A JP 2001254024A JP 2003066081 A JP2003066081 A JP 2003066081A
- Authority
- JP
- Japan
- Prior art keywords
- charging
- cylindrical drum
- surface potential
- unit
- drum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Photoreceptors In Electrophotography (AREA)
- Cleaning In Electrography (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明は、例えば電子写真
方式で画像を形成する複写機やプリンタ等に使用する感
光体ドラム等の光導電体の帯電分布を測定する帯電分布
測定装置及び画像形成装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a charge distribution measuring apparatus and an image forming apparatus for measuring the charge distribution of a photoconductor such as a photoconductor drum used in a copying machine or a printer for forming an image by electrophotography. It is about.
【0002】[0002]
【従来の技術】例えば電子写真方式で画像を形成する複
写機等に使用する有機感光体ドラムを作製するときに、
ドラム表面全体の状態、例えば、塗工時のゴミ混入によ
る塗膜欠陥や膜厚ムラ等を非破壊、非接触で知るため
に、人の目による外観検査を行うとともにCCDラインセ
ンサーあるいはCCDカメラを利用して画像処理で検査を
行う方法がとられている。この検査方法はピンホールや
付着したゴミ等の検出にはよいが、電子写真プロセスで
使われる際に感光体に必要となる電子写真特性、例えば
帯電特性が場所により異ならないかどうか等の情報を得
ることができない。このような電子写真特性を測定する
ためには、電子写真プロセスの帯電方式で感光体ドラム
表面全体を直接帯電させて表面電位を計測し、表面全体
の電位分布図を作成して電子写真特性を把握する方法
が、例えば文献:Ming-Kay etc. QEA.inc."Advanced Co
mputer-controlled Instrumentation for Electrophoto
graphy",Japan Hardcopy '98 P415-420 .1998に示すよ
うに採用されている。2. Description of the Related Art For example, when manufacturing an organic photosensitive drum used in a copying machine or the like for forming an image by electrophotography,
In order to know non-destructively, non-contact, the condition of the entire surface of the drum, such as coating film defects and film thickness unevenness due to the inclusion of dust during coating, a visual inspection is performed with human eyes, and a CCD line sensor or CCD camera is used. A method of performing inspection by image processing is used. Although this inspection method is good for detecting pinholes and dust that has adhered, information such as whether or not the electrophotographic characteristics required for the photoconductor when it is used in the electrophotographic process, such as whether the charging characteristics differ from place to place, is provided. Can't get In order to measure such electrophotographic characteristics, the entire surface of the photosensitive drum is directly charged by the charging method of the electrophotographic process, the surface potential is measured, and a potential distribution map of the entire surface is created to determine the electrophotographic characteristics. For example, see: Ming-Kay etc. QEA.inc. "Advanced Co
mputer-controlled Instrumentation for Electrophoto
graphy ", Japan Hardcopy '98 P415-420 .1998.
【0003】[0003]
【発明が解決しようとする課題】しかしながら表面電位
の計測から感光体ドラム表面全体の電位分布図を作成す
る場合、電子写真特性を測定するのに一般的に使用され
る空間分解能の低い市販の表面電位計は、測定対象との
距離が2mmで検出範囲が直径で10〜15mm程度あ
るため、この表面電位計を使用して1直線の帯電電位計
測を繰り返し、それをつないだ電位分布図を作成して
も、空間分解能の点で高密度に存在する微細な欠陥すな
わち電子写真特性の欠陥に検出には使用できないという
短所がある。However, when a potential distribution map of the entire surface of the photosensitive drum is prepared from the measurement of surface potential, a commercially available surface having a low spatial resolution generally used for measuring electrophotographic characteristics. Since the electrometer has a distance of 2 mm from the measurement target and a detection range of about 10 to 15 mm in diameter, using this surface electrometer, one line of charged potential is repeatedly measured to create a potential distribution map connecting them. However, there is a disadvantage in that it cannot be used for detection of fine defects existing at high density in terms of spatial resolution, that is, defects of electrophotographic characteristics.
【0004】また、市販の表面電位計から電位の分布図
を得る従来の装置は、電子写真プロセスをそのまま装置
化し、感光体ドラムを帯電し、場合によっては露光して
電位計測するようにしたものであるが、感光体ドラム全
表面にわたり、種々の特徴を検出する目的のために有意
なデータを得るには目的ごとに計測装置と計測方式に工
夫が必要であるが、そのような目的と計測方法を組み合
わせたものはなかった。Further, a conventional apparatus for obtaining a potential distribution chart from a commercially available surface electrometer is one in which an electrophotographic process is directly implemented, a photosensitive drum is charged, and in some cases, exposed to measure the potential. However, in order to obtain meaningful data for the purpose of detecting various characteristics over the entire surface of the photosensitive drum, it is necessary to devise a measuring device and a measuring method for each purpose. There was no combination of methods.
【0005】また、感光体ドラム表面全体の電位分布を
測定することは大量のデータを扱うことになり、計測そ
のものに多くの時間を要し、計測の効率化を図ることが
必要であった。Further, measuring the potential distribution on the entire surface of the photoconductor drum requires a large amount of data, which requires a lot of time for the measurement itself, and it is necessary to improve the efficiency of the measurement.
【0006】さらに、電位分布を計測する方法としてA
FMという計測方法でデバイスの電位分布を計測する方
法もあるが、これは空間分解能がnmのオーダーであ
り、したがって測定サンプルのサイズが限定されてしま
う。また、電子写真プロセスで感光体ドラムに与えられ
る電位レベルは絶対値で500V〜1000Vであり、
このような電位を測定することは測定が困難であり、感
光体ドラムの電子写真特性の計測に適用することはでき
なかった。Further, as a method for measuring the potential distribution, A
There is also a method of measuring the potential distribution of the device by a measuring method called FM, but this has a spatial resolution of the order of nm, and therefore the size of the measurement sample is limited. Further, the electric potential level applied to the photosensitive drum in the electrophotographic process is 500 V to 1000 V in absolute value,
It is difficult to measure such a potential and it cannot be applied to the measurement of the electrophotographic characteristics of the photosensitive drum.
【0007】この発明は係る短所を改善し、感光体等の
光導電体の帯電特性と感度特性の全表面にわたる分布デ
ータを高精度で短時間に測定することができる帯電分布
測定装置及び感光体の帯電特性の変化を検出して信頼性
を高めることができる画像形成装置を提供することを目
的とするものである。The present invention solves the above disadvantages, and a charge distribution measuring device and a photoconductor capable of measuring the distribution data of the charging property and the sensitivity property of a photoconductor such as a photoconductor over the entire surface with high accuracy and in a short time. It is an object of the present invention to provide an image forming apparatus capable of increasing the reliability by detecting a change in the charging characteristic of the.
【0008】[0008]
【課題を解決するための手段】この発明に係る帯電分布
測定装置は、光導電体又は絶縁体の膜が形成され、回転
駆動装置に装着された円筒状ドラムの周囲に少なくとも
帯電ユニットと表面電位測定ユニットを個別に配置し、
帯電ユニットを送り装置により円筒状ドラムの軸方向に
移動しながら円筒状ドラム表面を帯電し、表面電位測定
ユニットを、帯電ユニットで帯電するときの移動方向と
同じ方向で帯電ユニットの移動速度と同じ速度で送り装
置により円筒状ドラムの軸方向に移動して、帯電した円
筒状ドラムの各位置の表面電位を、帯電してから同じ時
間が経過後に測定し、各位置における表面電位の測定条
件を同じにすることを特徴とする。A charge distribution measuring apparatus according to the present invention is provided with at least a charging unit and a surface potential around a cylindrical drum mounted on a rotary driving device, in which a film of a photoconductor or an insulator is formed. Place the measuring units individually,
While moving the charging unit in the axial direction of the cylindrical drum by the feeding device, the surface of the cylindrical drum is charged, and the surface potential measuring unit is in the same direction as the charging unit when charging the same as the moving speed of the charging unit. The surface potential at each position of the charged cylindrical drum is measured by moving it in the axial direction of the cylindrical drum at a speed by the same time after charging, and the measurement conditions of the surface potential at each position are measured. The feature is that they are the same.
【0009】この発明に係る第2の帯電分布測定装置
は、光導電体又は絶縁体の膜が形成され、回転駆動装置
に装着された円筒状ドラムの周囲に少なくとも帯電ユニ
ットと露光ユニット及び表面電位測定ユニットを個別に
配置し、帯電ユニットを送り装置により円筒状ドラムの
軸方向に移動しながら円筒状ドラム表面を帯電し、露光
ユニットを送り装置により円筒状ドラムの軸方向に帯電
ユニットの移動速度と同じ速度で移動しながら帯電した
円筒状ドラム表面を露光し、表面電位測定ユニットを、
帯電ユニットで帯電するときの移動方向と同じ方向で帯
電ユニットの移動速度と同じ速度で送り装置により円筒
状ドラムの軸方向に移動して帯電・露光した円筒状ドラ
ムの表面電位を測定し、帯電・露光した円筒状ドラムの
各位置における表面電位の測定条件を同じにする。In a second charge distribution measuring device according to the present invention, a film of a photoconductor or an insulator is formed, and at least a charging unit, an exposure unit, and a surface potential are provided around a cylindrical drum mounted on a rotation driving device. The measurement units are individually arranged, the charging unit moves in the axial direction of the cylindrical drum by the feeding device, and the surface of the cylindrical drum is charged, and the exposure unit moves by the feeding device in the axial direction of the cylindrical drum. Exposing the surface of the charged cylindrical drum while moving at the same speed as
The surface potential of the cylindrical drum that has been charged / exposed by moving in the axial direction of the cylindrical drum by the feeder at the same speed as the moving speed of the charging unit and moving at the same speed as the moving speed of the charging unit is measured and charged.・ Measure the same measurement conditions for the surface potential at each position of the exposed cylindrical drum.
【0010】上記各ユニットを円筒状ドラムの周方向に
沿って等角度θで配置し、角度θ(度)は360/N・
(使用ユニット数−1)、但しNは2以上の整数で、か
つ測定する円筒状ドラムの半径がrのとき、表面電位計
を除く配置ユニットの内円筒状ドラムへの周方向の作用
範囲が最大なものの値kに対して、θ・(2πr/36
0)≧kの関係を有するように定め、円筒状ドラムを角
度θずつ回動し、帯電と表面電位の測定又は帯電と露光
及び表面電位の測定を繰り返し、円筒状ドラムが1回転
したところで、円筒体を任意角度回転させ、上記動作を
最初から繰り返すことにより、1回前の測定による帯電
及び露光の影響を除去して表面電位を正確に測定する。The above units are arranged at an equal angle θ along the circumferential direction of the cylindrical drum, and the angle θ (degree) is 360 / N.
(The number of used units-1), where N is an integer of 2 or more, and when the radius of the cylindrical drum to be measured is r, the operating range in the circumferential direction of the arrangement unit excluding the surface electrometer on the inner cylindrical drum is For the maximum value k, θ · (2πr / 36
0) ≧ k, the cylindrical drum is rotated by an angle θ, and charging and surface potential measurement or charging, exposure, and surface potential measurement are repeated, and when the cylindrical drum rotates once, By rotating the cylindrical body at an arbitrary angle and repeating the above-mentioned operation from the beginning, the influence of charging and exposure due to the previous measurement is removed and the surface potential is accurately measured.
【0011】また、円筒状ドラムの帯電と表面電位の測
定を連続的に行い、帯電直後に正常部と異常部の差がは
っきりしやすい局所的欠陥を検知すると良い。Further, it is preferable that the charging of the cylindrical drum and the measurement of the surface potential are continuously performed to detect a local defect in which a difference between a normal portion and an abnormal portion is apt to become clear immediately after the charging.
【0012】また、円筒状ドラムの一部の領域が疲労し
ている場合、帯電から時間をおくと、疲労部分の電位減
衰(暗減衰)が進行し、正常部との差が明確になり異常
を検出しやすくなる。そこで円筒状ドラムを帯電してか
ら一定時間経過後に表面電位の測定を行い疲労部分や疲
労の状態を明確にすると良い。Further, in the case where a part of the cylindrical drum is fatigued, the potential decay (dark decay) of the fatigued part progresses as time elapses from the charging, and the difference from the normal part becomes clear and abnormal. Is easier to detect. Therefore, it is advisable to measure the surface potential after a lapse of a certain time after charging the cylindrical drum to clarify the fatigued portion and the state of fatigue.
【0013】この発明に係る他の帯電分布測定装置は、
帯電ユニットと表面電位測定ユニット又は帯電ユニット
と露光ユニット及び表面電位測定ユニットを、光導電体
又は絶縁体の膜が形成され、回転駆動装置に装着された
た円筒状ドラムの軸方向に並べて一体にした計測ユニッ
トを送り装置により円筒状ドラムの軸方向に移動しなが
ら円筒状ドラム表面の帯電と露光及び表面電位の測定を
行い、円筒状ドラムの各位置のおける表面電位の測定条
件を同じにする。Another charge distribution measuring apparatus according to the present invention is
The charging unit and the surface potential measuring unit or the charging unit, the exposing unit and the surface potential measuring unit are integrally arranged by arranging them in the axial direction of the cylindrical drum on which the photoconductive or insulating film is formed and which is mounted on the rotation driving device. While moving the measured unit in the axial direction of the cylindrical drum by the feeding device, the surface of the cylindrical drum is charged and exposed, and the surface potential is measured, and the measurement conditions of the surface potential at each position of the cylindrical drum are made the same. .
【0014】上記計測ユニットを複数組、円筒状ドラム
の外周に沿って等角度で配置し、表面電位の測定効率を
高めることが望ましい。It is desirable that a plurality of sets of the above-mentioned measuring units are arranged at equal angles along the outer circumference of the cylindrical drum to enhance the measurement efficiency of the surface potential.
【0015】さらに、円筒状ドラムの表面電位を測定し
た後に円筒状ドラムを除電して、引き続いて表面電位を
測定するときに、先の帯電の影響を除き、精度良く表面
電位を測定することが望ましい。Furthermore, when the surface potential of the cylindrical drum is measured and then the charge is removed from the cylindrical drum, and the surface potential is subsequently measured, it is possible to accurately measure the surface potential by removing the influence of the previous charging. desirable.
【0016】また、円筒状ドラムとして感光体ドラムを
使用し、感光体ドラムを帯電してから一定時間経過後に
表面電位の測定を行う帯電分布測定装置を画像形成装置
に設け、感光体ドラムの特定の部位が疲労して劣化して
いないかどうかの判定を行うことが望ましい。Further, the photoconductor drum is used as the cylindrical drum, and the image forming apparatus is provided with a charge distribution measuring device for measuring the surface potential after a lapse of a certain time after charging the photoconductor drum to identify the photoconductor drum. It is desirable to judge whether or not the part of is deteriorated due to fatigue.
【0017】[0017]
【発明の実施の形態】図1はこの発明の帯電分布測定装
置の構成を示す正面図である。図に示すように、帯電分
布測定装置1は、例えば感光体ドラム2の表面を帯電し
て、その表面電位分布を測定するものであり、帯電ユニ
ット3と露光ユニット4と表面電位計5が感光体ドラム
2の周方向に沿って角度θ、例えばθ=45度の角度で
配置されている。この角度θは、360/N・(使用ユニ
ット数−1)、但しNは2以上の整数で、かつ測定する
円筒状ドラムの半径がrのとき、表面電位計を除く配置
ユニットの内円筒状ドラムへの周方向の作用範囲が最大
なものの値kに対して、θ・(2πr/360)≧kの関
係を有するように定められている。表面電位計5は、電
子写真プロセスで通常使用されるものを使用しても良い
し、あるいは、それよりも空間分解能の高いものすなわ
ち検出範囲が狭いものを使用しても良い。感光体ドラム
2は、図2の帯電分布測定装置1の側面図に示すよう
に、感光体ドラム回転モータ6を有する回転駆動装置7
に装着されている。帯電ユニット3は帯電ユニット送り
モータ8により感光体ドラム2の軸方向に沿って往復移
動する送り装置9に設けられ、露光ユニット4は露光ユ
ニット送りモータ10により感光体ドラム2の軸方向に
沿って往復移動する送り装置11に設けられ、表面電位
計5は表面電位計送りモータ12により感光体ドラム2
の軸方向に沿って往復移動する送り装置13に設けられ
ている。1 is a front view showing the structure of a charge distribution measuring apparatus of the present invention. As shown in the figure, the charge distribution measuring device 1 charges the surface of, for example, the photosensitive drum 2 and measures the surface potential distribution, and the charging unit 3, the exposure unit 4, and the surface potential meter 5 are exposed to light. It is arranged at an angle θ, for example, θ = 45 degrees, along the circumferential direction of the body drum 2. This angle θ is 360 / N · (number of units used-1), where N is an integer of 2 or more, and when the radius of the cylindrical drum to be measured is r, the inner cylindrical shape of the arrangement unit excluding the surface electrometer It is determined to have a relationship of θ · (2πr / 360) ≧ k with respect to the value k of the maximum operating range in the circumferential direction on the drum. The surface electrometer 5 may be one normally used in an electrophotographic process, or one having a higher spatial resolution than that, that is, one having a narrow detection range. As shown in the side view of the charge distribution measuring device 1 in FIG. 2, the photoconductor drum 2 includes a rotation driving device 7 having a photoconductor drum rotation motor 6.
Is attached to. The charging unit 3 is provided in the feeding device 9 which reciprocates along the axial direction of the photoconductor drum 2 by the charging unit feed motor 8, and the exposure unit 4 is moved along the axial direction of the photoconductor drum 2 by the exposure unit feed motor 10. The surface electrometer 5 is provided on the reciprocating feeding device 11, and the surface electrometer 5 is driven by the surface electrometer feeding motor 12 to the photosensitive drum 2
It is provided in the feeding device 13 that reciprocates along the axial direction of.
【0018】この帯電分布測定装置1の制御装置14
は、図3のブロック図に示すように、コントローラ15
と帯電・露光制御部16と駆動制御部17を有する。コ
ントローラ15は入力装置18から入力した測定条件と
あらかじめ格納した制御プログラムにより帯電・露光制
御部16と駆動制御部17に制御信号を送り、表面電位
計5で測定した表面電位信号をサンプリングして保存す
るとともに、保存した表面電位信号をデータ処理してグ
ラフ化し、デイスプレーやプリンタ等の出力装置19に
表示して記録する。帯電・露光制御部16はコントロー
ラ15から送られる制御信号により、高圧電源20から
帯電ユニット3に出力する電圧を制御するとともに、露
光光源21をオン・オフするとともにシャッタ22を開
閉して露光ユニット4に送る露光ビームを制御する。す
なわち、例えばハロゲンランプやLEDを使用した露光
光源21はオンしてから光強度が安定するまで一定時間
例えば5〜10分かかる。さらに、点灯中に点灯電圧を
変化すると安定するまでに時間がかかる。そこで、測定
を開始する前に露光光源21をオンにしておいて、露光
するときにシャッタ22の開閉により露光ユニット4に
露光ビームを送り安定した強度の光で露光する。駆動制
御部17はコントローラ15から送られる制御信号によ
り、帯電ユニット送りモータ8と露光ユニット送りモー
タ10と表面電位計送りモータ12及び感光体ドラム回
転モータ6の駆動を制御する。The control device 14 of the charge distribution measuring device 1
Is the controller 15 as shown in the block diagram of FIG.
It has a charging / exposure controller 16 and a drive controller 17. The controller 15 sends a control signal to the charging / exposure control unit 16 and the drive control unit 17 according to the measurement conditions input from the input device 18 and a control program stored in advance, and samples and saves the surface potential signal measured by the surface potential meter 5. At the same time, the stored surface potential signal is processed into a graph and displayed on an output device 19 such as a display or a printer for recording. The charging / exposure control unit 16 controls the voltage output from the high-voltage power supply 20 to the charging unit 3 by a control signal sent from the controller 15, turns on / off the exposure light source 21 and opens / closes the shutter 22 to open / close the exposure unit 4. Control the exposure beam sent to. That is, it takes a certain time, for example, 5 to 10 minutes until the light intensity becomes stable after the exposure light source 21 using a halogen lamp or LED is turned on. Furthermore, if the lighting voltage is changed during lighting, it takes time to stabilize. Therefore, the exposure light source 21 is turned on before the measurement is started, and when the exposure is performed, the exposure beam is sent to the exposure unit 4 by opening and closing the shutter 22 to perform exposure with light of stable intensity. The drive control unit 17 controls the drive of the charging unit feed motor 8, the exposure unit feed motor 10, the surface potential meter feed motor 12, and the photoconductor drum rotation motor 6 by the control signal sent from the controller 15.
【0019】上記のように構成した帯電分布測定装置1
で感光体ドラム2の表面を帯電して表面電位を測定する
ときは、まず、感光体ドラム2を回転駆動装置7に装着
し、帯電ユニット3と露光ユニット4及び表面電位計5
を感光体ドラム2の一方の端部側の初期位置に配置す
る。そして感光体ドラム2の表面を清浄にして埃等を除
去する。すなわち感光体ドラム2の表面に埃等が付着し
ていると、感光体ドラム2を帯電したときに埃等が電位
欠陥スポットになり、表面上のキズや塗工時の異物付着
等による欠陥と区別がつかなくなるので、あらかじめ埃
等を除去しておく。この埃等はエアーを利用して取り去
ることができるが、エアーを吹きつけだけでは埃等が舞
い、また表面に付着することがあるため、吸い込み、あ
るいはエアー吹きつけと吸い込みを組み合わせると良
い。Charge distribution measuring device 1 constructed as described above
When the surface of the photoconductor drum 2 is charged with and the surface potential is measured, first, the photoconductor drum 2 is mounted on the rotation driving device 7, and the charging unit 3, the exposure unit 4, and the surface potential meter 5 are connected.
Is arranged at the initial position on one end side of the photosensitive drum 2. Then, the surface of the photosensitive drum 2 is cleaned to remove dust and the like. In other words, if dust or the like adheres to the surface of the photoconductor drum 2, the dust or the like becomes a potential defect spot when the photoconductor drum 2 is charged, which causes defects such as scratches on the surface or foreign matter adhered during coating. Dust and the like should be removed beforehand, as they will not be distinguishable. The dust and the like can be removed by using air, but since dust and the like may fly and adhere to the surface only by blowing the air, it is preferable to inhale or combine air blowing and inhalation.
【0020】感光体ドラム2の表面を清浄にした状態で
1回目の測定に入ると、高圧電源20から帯電ユニット
3にあらかじめ設定された帯電電圧を印加しながら送り
装置9を駆動して帯電ユニット3を感光体ドラム2の軸
方向に一定速度Vで移動して感光体ドラム2の表面を帯
電する。帯電ユニット3が感光体ドラム2の他方の端部
の測定終端位置に達すると、帯電ユニット3に供給して
いる電圧をオフにして帯電ユニット3を初期位置に戻
し、回転駆動装置7により感光体ドラム2を一定角度、
例えば45度回動し、露光ユニット4を送り装置10に
より、帯電ユニット3で感光体ドラム2の表面を帯電す
るときの移動方向と同じ方向で、帯電ユニット3を移動
した速度と同じ速度Vで移動しながら、帯電した感光体
ドラム2の表面を露光する。感光体ドラムの表面を露光
すると、再び、回転駆動装置7により感光体ドラム2を
一定角度、例えば45度回動し、表面電位計5を送り装
置13により、帯電ユニット3で感光体ドラム2の表面
を帯電するときの移動方向と同じ方向で、帯電ユニット
3を移動した速度と同じ速度Vで移動しながら、感光体
ドラム2の表面の電位を測定する。コントローラ15は
表面電位計5で測定した表面電位信号を一定タイミン
グ、例えば感光体ドラム2の軸方向0.1mmピッチでサ
ンプリングして保存する。With the surface of the photosensitive drum 2 clean
When the first measurement is started, the feeding device 9 is driven while applying the preset charging voltage from the high-voltage power supply 20 to the charging unit 3 to move the charging unit 3 in the axial direction of the photosensitive drum 2 at a constant speed V. Then, the surface of the photosensitive drum 2 is charged. When the charging unit 3 reaches the measurement end position of the other end of the photosensitive drum 2, the voltage supplied to the charging unit 3 is turned off to return the charging unit 3 to the initial position, and the rotation driving device 7 rotates the photosensitive member. Drum 2 at a certain angle,
For example, the exposure unit 4 is rotated by 45 degrees and is moved by the feeding device 10 in the same direction as the moving direction when the surface of the photoconductor drum 2 is charged by the charging unit 3 at the same speed V as the moving speed of the charging unit 3. While moving, the surface of the charged photosensitive drum 2 is exposed. When the surface of the photosensitive drum 2 is exposed, the rotation driving device 7 rotates the photosensitive drum 2 again at a fixed angle, for example, 45 degrees, and the surface electrometer 5 is fed by the feeding device 13 by the charging unit 3 of the photosensitive drum 2. The potential of the surface of the photoconductor drum 2 is measured while moving at the same speed V as the moving speed of the charging unit 3 in the same direction as the moving direction when charging the surface. The controller 15 samples and stores the surface potential signal measured by the surface potential meter 5 at a constant timing, for example, at a pitch of 0.1 mm in the axial direction of the photosensitive drum 2.
【0021】このように感光体ドラム2の表面を帯電す
るために、帯電ユニット3を感光体ドラム2の軸方向に
沿って移動したときと同じ方向で、かつ帯電ユニット3
を移動したときと同じ速度Vで露光ユニット4と表面電
位計5を移動しながら露光し、露光後の感光体ドラム2
の表面電位を測定することにより、感光体ドラム2の表
面の各位置で、帯電ユニット3で帯電したときから同じ
時間を経過したときに表面電位計5で表面電位を測定す
ることができ、感光体ドラム2の各位置における表面電
位の測定条件を同じにすることができる。また、感光体
ドラム2の表面電位を測定するときに、表面電位計5と
して電子写真プロセスで通常使用されるものを使用する
と、表面電位計5の検出範囲は、例えば直径10mm〜15
mmであり、帯電ユニット3は少なくともこの範囲をカ
バーする周方向のサイズが必要であり、露光ユニット4
はさらにこの帯電領域を全てカバーする露光範囲を持つ
必要があり、感光体ドラム2を一定角度θだけ回動しな
がら帯電と露光及び表面電位の測定を繰り返したとき
に、角度θが一定大きさ以上ないと測定した表面電位は
1回前の測定による影響を受ける。そこで角度θを、36
0/N・(使用ユニット数−1)、但しNは2以上の整
数で、かつ測定する円筒状ドラムの半径がrのとき、表
面電位計を除く配置ユニットの内円筒状ドラムへの周方
向の作用範囲が最大なものの値kに対して、θ・(2π
r/360)≧kの関係を有するように定めることによ
り、1回前の測定のによる影響を除去して表面電位を正
確に測定することができる。In order to charge the surface of the photosensitive drum 2 in this way, the charging unit 3 is in the same direction as when the charging unit 3 is moved along the axial direction of the photosensitive drum 2, and the charging unit 3
The exposure unit 4 and the surface electrometer 5 at the same speed V as when moving the
By measuring the surface potential of the surface of the photosensitive drum 2, the surface potential can be measured by the surface potential meter 5 at the respective positions on the surface of the photosensitive drum 2 when the same time has elapsed since the charging by the charging unit 3. The measurement conditions of the surface potential at each position of the body drum 2 can be the same. Further, when measuring the surface potential of the photoconductor drum 2, if a surface electrometer 5 that is usually used in an electrophotographic process is used, the detection range of the surface electrometer 5 is, for example, 10 mm to 15 mm in diameter.
mm, and the charging unit 3 needs to have a size in the circumferential direction that covers at least this range.
Needs to have an exposure range that covers all of this charging area, and when the charging, exposure and measurement of the surface potential are repeated while rotating the photosensitive drum 2 by a certain angle θ, the angle θ has a certain magnitude. Otherwise, the measured surface potential will be affected by the previous measurement. Therefore, the angle θ is 36
0 / N- (number of units used-1), where N is an integer of 2 or more, and when the radius of the cylindrical drum to be measured is r, the circumferential direction to the inner cylindrical drum of the arrangement unit excluding the surface electrometer For the value k of the maximum operating range of θ, (2π
By determining that the relationship of r / 360) ≧ k is satisfied, the influence of the previous measurement can be removed and the surface potential can be measured accurately.
【0022】また、感光体ドラム2を一定角度で回動し
ながら帯電と露光及び表面電位の測定を繰り返すとき、
帯電ユニット3と露光ユニット4及び表面電位計5を感
光体ドラム2の周方向に対して一定角度で配置すること
により、露光ユニット4で感光体ドラム2の表面を露光
しているときに同時に帯電ユニット3で感光体ドラム2
の次の測定位置の表面を帯電することができる等、帯電
と露光と表面電位の測定を並列して行うことができ、測
定の効率化を図ることができる。When repeating the charging, the exposure and the measurement of the surface potential while rotating the photosensitive drum 2 at a constant angle,
By arranging the charging unit 3, the exposure unit 4, and the surface electrometer 5 at a constant angle with respect to the circumferential direction of the photoconductor drum 2, the exposure unit 4 simultaneously charges the surface of the photoconductor drum 2 while exposing it. Unit 3 is photoconductor drum 2
Since the surface of the next measurement position can be charged, charging, exposure, and measurement of the surface potential can be performed in parallel, and the efficiency of measurement can be improved.
【0023】コントローラ15は、この感光体ドラム2
の帯電と露光及び表面電位の測定を、感光体ドラム2を
一定角度ずつ回動しながら繰り返し、感光体ドラム2が
1回転したら、例えば帯電ユニット3に交流電圧を印加
して帯電ユニット3の移動と感光体ドラム2の回動を繰
り返して、感光体ドラム2の表面を除電し、第1回転目
の測定位置から感光体ドラム2の周方向に一定ピッチ例
えば1mmから5mmの範囲でずらして第2回転目の帯
電と露光及び表面電位の測定を行う。この帯電と露光及
び表面電位の測定繰り返して感光体ドラム2の全表面の
表面電位信号を一定ピッチでサンプリングする。このサ
ンプリングした表面電位信号をデータ処理してグラフ化
し、デイスプレーやプリンタ等の出力装置19に表示し
て記録する。The controller 15 uses the photosensitive drum 2
Charging, exposure, and measurement of surface potential are repeated while rotating the photosensitive drum 2 by a constant angle, and when the photosensitive drum 2 makes one rotation, for example, an AC voltage is applied to the charging unit 3 to move the charging unit 3. And the rotation of the photoconductor drum 2 are repeated to remove the charge on the surface of the photoconductor drum 2, and the charge is displaced from the measurement position at the first rotation in the circumferential direction of the photoconductor drum 2 by a constant pitch, for example, in the range of 1 mm to 5 mm. At the second rotation, charging, exposure, and surface potential measurement are performed. By repeating the charging, the exposure, and the measurement of the surface potential, the surface potential signal of the entire surface of the photosensitive drum 2 is sampled at a constant pitch. The sampled surface potential signal is data-processed into a graph, which is displayed and recorded on the output device 19 such as a display or a printer.
【0024】上記説明では感光体ドラム2を1回転して
第1回転目の測定が終了した後に、帯電ユニット3に交
流電圧を印加して、感光体ドラム2の表面を除電した場
合について説明したが、表面電位を測定した表面電位計
5を初期位置に戻すときに除電ブラシ等で感光体ドラム
2の表面を除電しても良い。In the above description, the case where the surface of the photoconductor drum 2 is neutralized by applying an AC voltage to the charging unit 3 after the photoconductor drum 2 has been rotated once and the measurement of the first rotation has been completed has been described. However, when returning the surface electrometer 5 whose surface potential has been measured to the initial position, the surface of the photosensitive drum 2 may be neutralized with a static elimination brush or the like.
【0025】上記帯電分布測定装置1は、帯電ユニット
3と露光ユニット4を異なる送り装置9,11に設けた
場合について示したが、図4の側面図に示すように、帯
電ユニット3と露光ユニット4を同じ送り装置23に設
け、送り装置23により帯電ユニット3と露光ユニット
4を感光体ドラム2の軸方向に移動しながら帯電と露光
を行い、その後、表面電位計5で表面電位を測定するよ
うにしても良い。このように、帯電ユニット3と露光ユ
ニット4を同じ送り装置23に設けることにより帯電分
布測定装置1の構造をより簡単にすることができるとと
もに感光体ドラム2の表面の帯電と露光を連続的に行う
ことにより、感光体ドラム2を1回転したときの、測定
時間の短縮が図れ、表面電位の測定効率を向上させるこ
とができる。The charging distribution measuring device 1 has been shown in the case where the charging unit 3 and the exposure unit 4 are provided in different feeding devices 9 and 11, but as shown in the side view of FIG. 4 is provided in the same feeding device 23, and the feeding device 23 performs charging and exposure while moving the charging unit 3 and the exposure unit 4 in the axial direction of the photoconductor drum 2, and then the surface potential is measured by the surface potential meter 5. You may do it. In this way, by providing the charging unit 3 and the exposure unit 4 in the same feeding device 23, the structure of the charge distribution measuring device 1 can be simplified, and the surface of the photoconductor drum 2 can be continuously charged and exposed. By doing so, it is possible to shorten the measurement time when the photosensitive drum 2 is rotated once, and it is possible to improve the measurement efficiency of the surface potential.
【0026】さらに、図5に示すように、帯電ユニット
3と露光ユニット4及び表面電位計5を感光体ドラム2
の軸方向に配置して計測ユニット24を構成し、この計
測ユニット24を送り装置25で移動するようにしても
良い。このように帯電ユニット3と露光ユニット4及び
表面電位計5を感光体ドラム2の軸方向に配置して計測
ユニット24を構成することにより帯電分布測定装置1
の構成をより単純化することができる。Further, as shown in FIG. 5, the charging unit 3, the exposure unit 4, and the surface electrometer 5 are connected to the photosensitive drum 2.
Alternatively, the measuring unit 24 may be arranged in the axial direction, and the measuring unit 24 may be moved by the feeding device 25. As described above, the charging unit 3, the exposure unit 4, and the surface potential meter 5 are arranged in the axial direction of the photoconductor drum 2 to form the measuring unit 24.
The configuration of can be simplified.
【0027】この場合は、計測ユニット24を送り装置
25で移動しながら感光体ドラム2の表面の帯電と露光
及び表面電位の測定を連続的に行ったり、帯電ユニット
3で帯電した後、計測ユニット24を初期位置に戻した
後、露光ユニット4で露光し、その後、計測ユニット2
4を初期位置に戻して表面電位計5で表面電位を測定す
るように、帯電と露光及び表面電位の測定を間欠的に行
っても良い。いずれの場合も、表面電位計5で表面電位
を測定して、計測ユニット24を測定終了位置から初期
位置に戻すときに帯電ユニット3に交流電圧を印加して
感光体ドラム2の表面を除電したり、除電ブラシ等で除
電することにより、感光体ドラム2の周方向で例えば1
mmピッチずつ測定ラインをずらしながら帯電と露光及
び表面電位の測定を行うことができる。このようにして
さらに測定時間の短縮を図ることができる。In this case, while the measuring unit 24 is moved by the feeding device 25, the charging and exposure of the surface of the photosensitive drum 2 and the measurement of the surface potential are continuously performed, or after the charging unit 3 charges the measuring unit 24. After returning 24 to the initial position, exposure is performed by the exposure unit 4, and then the measurement unit 2
The charging, the exposure, and the measurement of the surface potential may be performed intermittently so that 4 is returned to the initial position and the surface potential is measured by the surface potential meter 5. In either case, the surface potential is measured by the surface potential meter 5, and when the measurement unit 24 is returned from the measurement end position to the initial position, an AC voltage is applied to the charging unit 3 to eliminate the surface of the photoconductor drum 2. Or by removing the charge with a charge removing brush or the like, for example, in the circumferential direction of the photosensitive drum 2,
It is possible to perform charging, exposure, and measurement of the surface potential while shifting the measurement line by mm pitch. In this way, the measurement time can be further shortened.
【0028】また、帯電と露光及び表面電位の計測を連
続的に行うと、帯電直後に正常部と異常部の差がはっき
りしやすい局所的欠陥、例えばピンホール等や電荷発生
層の塗工ムラによる感度特性の違い、あるいは電荷移動
層の膜厚ムラに起因した感度特性の違い等を精度良く検
出することができる。すなわち帯電してから時間が経過
するとピンホール部分の低下した電位は変わらないが、
正常部の電位が暗減衰で低下し、正常部と異常部の電位
コントラストが小さくなりピンホール部分の検出は困難
になるが、帯電直後に電位を測定することにより、この
影響を除くことができる。また、使い込まれた感光体ド
ラム2の一部領域が疲労している場合、帯電から時間を
おくと、疲労部分の電位減衰(暗減衰)が進行し、正常
部との差がはっきりし、異常を検出し易くすることがで
きる。Further, when the charging, the exposure and the measurement of the surface potential are continuously carried out, a local defect such as a pinhole or coating unevenness of the charge generation layer, in which the difference between the normal part and the abnormal part is easily clarified immediately after the charging. It is possible to accurately detect a difference in sensitivity characteristic due to the above, or a difference in sensitivity characteristic due to uneven thickness of the charge transfer layer. In other words, the potential dropped in the pinhole does not change with the passage of time after charging,
The potential of the normal part decreases due to dark decay, and the potential contrast between the normal part and the abnormal part becomes small, making it difficult to detect pinhole parts, but this effect can be eliminated by measuring the potential immediately after charging. . In addition, when a part of the used photoconductor drum 2 is fatigued, the potential decay (dark decay) of the fatigued part progresses after a lapse of time from charging, and the difference from the normal part becomes clear and abnormal. Can be easily detected.
【0029】また、感光体ドラム2の疲労劣化部位を検
出する場合は、帯電と露光を行った後、あらかじめ指定
された時間、例えば10〜20秒をおいて表面電位を測
定すると疲労部分や疲労の状態を明確にすることができ
る。そこで帯電分布測定装置1を小型化して複写機やプ
リンタ等の画像形成装置に搭載し、印刷枚数が進んだと
き、起動時や待機時に感光体ドラム2の電位分布を測定
することにより、感光体ドラム2の特定の部位が疲労し
て劣化していないかどうかの判定を行うことができる。
その結果から例えば、感光体ドラム2近傍あるいは内部
に設けたヒータを使って疲労回復を図ったり、表示部に
感光体ドラム2の交換時期であることを表示する等、画
像形成装置の信頼性を高めることができる。Further, when detecting a fatigue-deteriorated portion of the photosensitive drum 2, if the surface potential is measured after a predetermined time, for example, 10 to 20 seconds, after charging and exposure, the fatigued portion or fatigue is detected. The state of can be clarified. Therefore, the charge distribution measuring device 1 is downsized and mounted on an image forming apparatus such as a copying machine or a printer, and the potential distribution of the photoconductor drum 2 is measured when the number of printed sheets is increased, at the time of startup or standby, and It is possible to determine whether or not a specific portion of the drum 2 is fatigued and deteriorated.
From the results, it is possible to improve the reliability of the image forming apparatus by, for example, using a heater provided in the vicinity of or inside the photoconductor drum 2 to recover from fatigue and displaying on the display unit that the photoconductor drum 2 is about to be replaced. Can be increased.
【0030】また、帯電ユニット3と露光ユニット4及
び表面電位計5を有する計測ユニット24を、図5に示
すように、感光体ドラム2の周方向で角度が180度異
なる位置に2組設けたり、測定する感光体ドラム2の径
が大きい場合は、図6の正面図に示すように、感光体ド
ラム2の周方向で角度が90度異なる位置に4組設ける
ことにより、表面電位の測定時間を大幅に短縮して測定
効率を高めることができる。例えば直径が30mmで、
長さが340mmの感光体ドラム2を、計測ユニット2
4を速度50mm/sで移動しながら帯電と露光及び表
面電位の測定を連続的に行った場合、計測ユニット24
を初期位置から測定終了位置まで移動する時間は6.8
秒である。そして感光体ドラム2の周方向に1mmピッ
チで測定を繰り返すと、1組の計測ユニット24で感光
体ドラム2の全表面を測定する時間は、6.8×2×94.2=
1281秒(約21分)かかるが、2組の計測ユニット24
を使用することにより、この測定時間を半減することが
できる。Further, as shown in FIG. 5, two sets of measuring units 24 having the charging unit 3, the exposure unit 4 and the surface electrometer 5 may be provided at positions where the angles differ by 180 degrees in the circumferential direction of the photosensitive drum 2. When the diameter of the photoconductor drum 2 to be measured is large, as shown in the front view of FIG. 6, four sets are provided at positions where the angles differ by 90 degrees in the circumferential direction of the photoconductor drum 2, so that the measurement time of the surface potential is increased. Can be significantly shortened to improve the measurement efficiency. For example, the diameter is 30mm,
Measure the photoconductor drum 2 with a length of 340 mm with the measurement unit 2
4 is moved at a speed of 50 mm / s, the charging unit, the exposure unit, and the surface potential are continuously measured.
Takes 6.8 to move from the initial position to the measurement end position.
Seconds. When the measurement is repeated at a pitch of 1 mm in the circumferential direction of the photoconductor drum 2, the time required to measure the entire surface of the photoconductor drum 2 with one set of measurement units 24 is 6.8 × 2 × 94.2 =
It takes 1281 seconds (about 21 minutes), but two sets of measurement units 24
This measurement time can be halved by using.
【0031】上記帯電分布測定装置1は感光体ドラム2
の表面を帯電してから露光し、その後、表面電位を測定
した場合について説明したが、ピンホール等の局所的欠
陥の検出のために、感光体ドラム2の表面を帯電し、露
光せずに表面電位を直ちに測定しても良い。The charge distribution measuring device 1 is a photosensitive drum 2.
Although the case where the surface of the photosensitive drum 2 is exposed after being charged and then the surface potential is measured has been described, in order to detect a local defect such as a pinhole, the surface of the photosensitive drum 2 is charged and exposed. The surface potential may be measured immediately.
【0032】また、帯電分布測定装置1で感光体ドラム
2の表面電位分布を測定する場合について説明したが、
感光体ドラム2のように光導電体表面の表面電位分布だ
けでなく絶縁体表面の表面電位分布も同様にして測定す
ることができる。The case of measuring the surface potential distribution of the photosensitive drum 2 with the charge distribution measuring device 1 has been described.
As with the photoconductor drum 2, not only the surface potential distribution on the surface of the photoconductor but also the surface potential distribution on the surface of the insulator can be measured in the same manner.
【0033】[0033]
【実施例】例えば表面電位計5としてはトレックジャパ
ン(株)のモデル344、プローブはモデル555P-4を使用
し、帯電ユニット3はスコロトロン方式のコロナ帯電装
置を使用し、露光ユニット4から出射する露光ビームは
ハロゲンランプ光源にバンドパスフィルタを組み合わせ
た単色光として、図1に示す帯電分布測定装置1を構成
し、感光体ドラム2の除電には赤色のLEDを使用し
た。そして感光体ドラム2としては、直径が30mmで、
長さ256mmと340mmの2種類を使用して表面電位を測
定し、サンプリングした表面電位信号をデータ処理して
グラフ化した結果を図7から図14に示す。図7から図
14において、X軸は感光体ドラム2の軸方向、Y軸は
周方向の測定位置を示し、Z軸は各位置における表面電
位の測定値(V)を示す。また、この測定において、帯
電ユニット3を感光体ドラム2の軸方向に移動速度60m
m/s(グラフ中のX軸のタイトルに(×0.12mm)と表
示)と50mm/s(グラフ中のX軸のタイトルに(×0.
1mm)と表示)にして感光体ドラム2の表面を露光し
た。また、露光ユニット4と表面電位計5をそれぞれ帯
電ユニット3と同じ速度で同じ方向に移動して露光と表
面電位の測定を行った。また、いずれの移動速度におい
てもデータのサンプリング速度は500s/sとした。但
し、サンプリングデータ量が多くなるため、グラフ表示
において、データを半分に間引いているものもある(グ
ラフ中のX軸のタイトルに(×0.2mm)と表示)。ま
た、測定においては感光体ドラム2の一方の端部より長
さの2/3程度とし、周方向の測定回数は周長94.2mm
に対して1mmピッチ(グラフ中のY軸のタイトルに(m
m)と表示)と2mmピッチ(グラフ中のY軸のタイトル
に(×2mm)と表示とした。[Example] For example, a model 344 of Trek Japan Co., Ltd. is used as the surface electrometer 5, a model 555P-4 is used as the probe, a corona charging device of the scorotron system is used as the charging unit 3, and the light is emitted from the exposure unit 4. The exposure beam is a monochromatic light in which a halogen lamp light source is combined with a bandpass filter, and the charge distribution measuring apparatus 1 shown in FIG. 1 is configured, and a red LED is used for discharging the photosensitive drum 2. The photosensitive drum 2 has a diameter of 30 mm,
Surface potentials were measured using two types of lengths of 256 mm and 340 mm, and the sampled surface potential signals were subjected to data processing and graphed results are shown in FIGS. 7 to 14. 7 to 14, the X axis represents the measurement position in the axial direction of the photosensitive drum 2, the Y axis represents the measurement position in the circumferential direction, and the Z axis represents the measured value (V) of the surface potential at each position. In this measurement, the charging unit 3 is moved in the axial direction of the photosensitive drum 2 at a moving speed of 60 m.
m / s (displayed as (× 0.12mm) in the X-axis title in the graph) and 50mm / s (in the X-axis title in the graph (× 0.
The surface of the photoconductor drum 2 was exposed. The exposure unit 4 and the surface potential meter 5 were moved in the same direction at the same speed as the charging unit 3 to measure the exposure and the surface potential. The data sampling rate was set to 500 s / s at any moving speed. However, since the amount of sampling data is large, some data are thinned out in the graph display ((X 0.2 mm) is displayed in the X-axis title in the graph). In the measurement, the length from one end of the photosensitive drum 2 is about ⅔, and the number of times of measurement in the circumferential direction is 94.2 mm.
1mm pitch (for the Y-axis title in the graph (m
m)) and 2 mm pitch (Y axis title in the graph is indicated as (× 2 mm)).
【0034】図7は、正常な感光体ドラム2の表面にカ
ッターナイフの刃先をあて1点に傷をつけた。傷の位置
は端部より100mm前後の位置で、周方向の測定開始位
置より20mm程度の位置にした。図7に示すように、電
位分布は全体にフラットで良好なデータが得られたが、
傷をつけた位置で帯電に異常があることが判定ができ
る。In FIG. 7, a blade of a cutter knife was put on the surface of the normal photosensitive drum 2 to scratch one point. The position of the scratch was about 100 mm from the end and about 20 mm from the measurement start position in the circumferential direction. As shown in FIG. 7, the potential distribution was flat and good data were obtained.
It can be determined that the charging is abnormal at the scratched position.
【0035】図8は、感光体ドラム2を軸方向中央部60
mm幅を、幅40mmの範囲で帯電し、その部分を幅60m
mで露光し、幅120mmで除電することを繰り返して、
感光体の静電特性を部分的に劣化させたサンプルを使用
した。そして表面電位を測定するときに、帯電ユニット
3で帯電電位レベルを800〜850V程度とし、帯電後に表
面電位計5で表面電位を測定してサンプリングした。図
に示すように、軸方向の一部に周方向に沿って特性が劣
化した帯状の部分が明らかになっている。この帯電ユニ
ット3の帯電電位レベルを900〜950Vと高くして帯電
し、表面電位を測定した結果を図9に示す。このように
帯電電位レベルを高くすることにより、劣化部分をより
明確にすることができた。この劣化部分を示す3次元グ
ラフ表示を視点を変えて表示すると図10に示すように
なり、中央部に劣化による電位降下があることが認めら
れた。この測定後に感光体ドラム2の表面を観察すると
異物が認められたので、エアーの吹き付け吸引により表
面を清浄にした後、再度帯電と電位測定を繰り返した結
果、図11に示すように異物による電位降下が認められ
なくなった。FIG. 8 shows the photosensitive drum 2 in the central portion 60 in the axial direction.
mm width, electrified in the range of width 40mm, the part is width 60m
Repeatedly exposing with m and removing static electricity with a width of 120 mm,
A sample in which the electrostatic characteristics of the photoconductor were partially deteriorated was used. When measuring the surface potential, the charging unit 3 sets the charging potential level to about 800 to 850 V, and after charging, the surface potential meter 5 measures the surface potential and samples it. As shown in the figure, a band-shaped portion whose characteristics are deteriorated along the circumferential direction is clarified in a part of the axial direction. FIG. 9 shows the result of measuring the surface potential by charging the charging unit 3 by raising the charging potential level to 900 to 950V. By increasing the charging potential level in this way, the deteriorated portion could be made clearer. When a three-dimensional graph display showing this deteriorated portion is displayed from a different viewpoint, it becomes as shown in FIG. 10, and it was confirmed that there is a potential drop due to deterioration in the central portion. After observing the surface of the photosensitive drum 2 after this measurement, foreign matter was recognized. Therefore, after the surface was cleaned by blowing and sucking air, the charging and the potential measurement were repeated again. As a result, as shown in FIG. The descent is no longer recognized.
【0036】また、帯電ユニット3の帯電電位レベルを
900〜950Vとして帯電後、15秒待機してから表面電位を
測定した結果を図12に示す。図12に示すように、劣
化部分の暗減衰特性が劣化しているため、周囲に対する
電位降下が大きく劣化部分はより明確になっている。Further, the charging potential level of the charging unit 3 is
The result of measuring the surface potential after charging for 15 seconds after charging at 900 to 950 V is shown in FIG. As shown in FIG. 12, since the dark attenuation characteristic of the deteriorated portion is deteriorated, the potential drop with respect to the surroundings is large and the deteriorated portion is more clear.
【0037】さらに、膜厚が約30μmの電荷移動層の
膜厚に異常がある感光体ドラム2について帯電して表面
電位の測定を行った結果を図13に示し、帯電したのち
帯電電位レベルの900Vを600Vに減衰させる条件
で露光を行ってから表面電位を測定した結果を図14に
示す。図13,図14に示すように、電荷移動層の膜厚
に異常により電位レベルが乱れていることが明確にでき
た。Further, FIG. 13 shows the result of measuring the surface potential by charging the photosensitive drum 2 having a thickness of about 30 μm and having an abnormal thickness of the charge transfer layer. FIG. 14 shows the result of measuring the surface potential after performing exposure under the condition that 900 V is attenuated to 600 V. As shown in FIGS. 13 and 14, it was clarified that the potential level was disturbed due to an abnormality in the film thickness of the charge transfer layer.
【0038】[0038]
【発明の効果】この発明は以上説明したように、円筒状
ドラムの表面を帯電して表面電位を測定するときに、表
面電位測定ユニットを、帯電ユニットで帯電するときの
移動方向と同じ方向で帯電ユニットの移動速度と同じ速
度で円筒状ドラムの軸方向に移動して、帯電した円筒状
ドラムや帯電・露光した円筒状ドラムの表面電位を測定
することにより、円筒状ドラムの各位置における表面電
位の測定条件を同じにして、円筒状ドラムの表面電位分
布を精度良く測定することができる。As described above, according to the present invention, when the surface of the cylindrical drum is charged and the surface potential is measured, the surface potential measuring unit is moved in the same direction as the moving direction when the charging unit charges. By moving in the axial direction of the cylindrical drum at the same speed as the moving speed of the charging unit and measuring the surface potential of the charged and charged / exposed cylindrical drum, the surface at each position of the cylindrical drum is measured. The surface potential distribution of the cylindrical drum can be accurately measured under the same potential measurement conditions.
【0039】また、帯電ユニットと表面電位測定ユニッ
ト又は帯電ユニットと露光ユニット及び表面電位測定ユ
ニットを円筒状ドラムの周方向に沿って等角度θで配置
し、角度θ(度)は360/N・(使用ユニット数−
1)、但しNは2以上の整数で、かつ測定する円筒状ド
ラムの半径がrのとき、表面電位計を除く配置ユニット
の内円筒状ドラムへの周方向の作用範囲が最大なものの
値kに対して、θ・(2πr/360)≧kの関係を有す
るように定め、円筒状ドラムを角度θずつ回動し、帯電
と表面電位の測定又は帯電と露光及び表面電位の測定を
繰り返し、円筒状ドラムが1回転したところで、円筒体
を任意角度回転させ、上記動作を最初から繰り返すこと
により、1回前の測定による帯電及び露光の影響を除去
して表面電位を正確に測定することができる。Further, the charging unit and the surface potential measuring unit or the charging unit, the exposing unit and the surface potential measuring unit are arranged at an equal angle θ along the circumferential direction of the cylindrical drum, and the angle θ (degree) is 360 / N. (Number of units used −
1) where N is an integer of 2 or more, and when the radius of the cylindrical drum to be measured is r, the value k of the maximum operating range in the circumferential direction of the inner cylindrical drum of the arrangement unit excluding the surface electrometer , Θ · (2πr / 360) ≧ k, the cylindrical drum is rotated by an angle of θ, and charging and surface potential measurement or charging, exposure, and surface potential measurement are repeated. When the cylindrical drum makes one rotation, rotate the cylindrical body at an arbitrary angle and repeat the above operation from the beginning to remove the effects of charging and exposure from the previous measurement, and to accurately measure the surface potential. it can.
【0040】また、円筒状ドラムの帯電と表面電位の測
定を連続的に行うことにより、帯電直後に正常部と異常
部の差がはっきりしやすい局所的欠陥を正確に検知する
ことができる。Further, by continuously charging the cylindrical drum and measuring the surface potential, it is possible to accurately detect a local defect in which the difference between the normal portion and the abnormal portion is apt to become clear immediately after the charging.
【0041】また、円筒状ドラムの一部の領域が疲労し
ている場合、帯電から時間をおくと、疲労部分の電位減
衰(暗減衰)が進行し、正常部との差が明確になり異常
を検出しやすくなるので、円筒状ドラムを帯電してから
一定時間経過後に表面電位の測定を行うことにより、疲
労部分や疲労の状態を明確にすることができる。In addition, when a partial area of the cylindrical drum is fatigued, the potential attenuation (dark attenuation) of the fatigued part progresses with time after charging, and the difference from the normal part becomes clear and abnormal. Since it becomes easier to detect, the fatigued portion and the fatigued state can be clarified by measuring the surface potential after a lapse of a fixed time after charging the cylindrical drum.
【0042】さらに、帯電ユニットと表面電位測定ユニ
ット又は帯電ユニットと露光ユニット及び表面電位測定
ユニットを、光導電体又は絶縁体の膜が形成され、回転
駆動装置に装着されたた円筒状ドラムの軸方向に並べて
一体にした計測ユニットを送り装置により円筒状ドラム
の軸方向に移動しながら円筒状ドラム表面の帯電と露光
及び表面電位の測定を行うことにより、円筒状ドラムの
軸方向各位置における表面電位の測定条件を同じにする
ことができる。Further, the charging unit and the surface potential measuring unit or the charging unit, the exposing unit and the surface potential measuring unit are provided with a photoconductive or insulating film, and the shaft of a cylindrical drum mounted on the rotary driving device. The surface of the cylindrical drum at each axial position is measured by charging and exposing the surface of the cylindrical drum and measuring the surface potential while moving the measuring units, which are arranged side by side and integrated, in the axial direction of the cylindrical drum by the feeder. The measurement conditions of the electric potential can be the same.
【0043】また、円筒状ドラムの外周に沿って上記一
体の計測ユニットを複数組等角度で配置することによ
り、表面電位の測定効率を高めることができる。By arranging a plurality of sets of the above-mentioned integral measuring units at equal angles along the outer circumference of the cylindrical drum, the measurement efficiency of the surface potential can be improved.
【0044】さらに、円筒状ドラムの表面電位を測定し
た後に円筒状ドラムを除電して、引き続いて表面電位を
測定するときに、先の帯電の影響を除き、精度良く表面
電位を測定することができる。Furthermore, when the surface potential of the cylindrical drum is measured and then the charge is removed from the cylindrical drum, and the surface potential is subsequently measured, the surface potential can be accurately measured by removing the influence of the previous charging. it can.
【0045】また、円筒状ドラムとして感光体ドラムを
使用し、感光体ドラムを帯電してから一定時間経過後に
表面電位の測定を行う帯電分布測定装置を画像形成装置
に設け、感光体ドラムの特定の部位が疲労して劣化して
いないかどうかの判定を行うことにより画像形成装置の
信頼性を高めることができる。Further, the photoconductor drum is used as the cylindrical drum, and the image forming apparatus is provided with a charge distribution measuring device for measuring the surface potential after a lapse of a certain time after the photoconductor drum is charged to identify the photoconductor drum. It is possible to improve the reliability of the image forming apparatus by determining whether or not the part is fatigued and deteriorated.
【図1】この発明の帯電分布測定装置の構成を示す正面
図である。FIG. 1 is a front view showing the configuration of a charge distribution measuring apparatus of the present invention.
【図2】帯電分布測定装置の構成を示す側面図である。FIG. 2 is a side view showing the configuration of a charge distribution measuring device.
【図3】制御装置の構成を示すブロック図である。FIG. 3 is a block diagram showing a configuration of a control device.
【図4】第2の帯電分布測定装置の構成を示す側面図で
ある。FIG. 4 is a side view showing a configuration of a second charge distribution measuring device.
【図5】第3の帯電分布測定装置の構成を示す側面図で
ある。FIG. 5 is a side view showing a configuration of a third charge distribution measuring device.
【図6】第4の帯電分布測定装置の構成を示す正面図で
ある。FIG. 6 is a front view showing the configuration of a fourth charge distribution measuring device.
【図7】点状の傷を有する感光体ドラムの表面電位分布
図である。FIG. 7 is a surface potential distribution diagram of a photosensitive drum having a dot-like scratch.
【図8】中央部が劣化した感光体ドラムの表面電位分布
図である。FIG. 8 is a surface potential distribution diagram of the photosensitive drum whose central portion is deteriorated.
【図9】中央部が劣化した感光体ドラムを高電位で帯電
したときの表面電位分布図である。FIG. 9 is a surface potential distribution diagram when a photosensitive drum having a deteriorated central portion is charged with a high potential.
【図10】中央部が劣化した感光体ドラムを高電位で帯
電したときの視点を変えて示す表面電位分布図である。FIG. 10 is a surface potential distribution diagram showing a different viewpoint when the photosensitive drum whose central portion is deteriorated is charged at a high potential.
【図11】異物を除去した感光体ドラムの表面電位分布
図である。FIG. 11 is a surface potential distribution diagram of the photosensitive drum from which foreign matter is removed.
【図12】帯電後一定時間経過後に表面電位を測定した
ときの感光体ドラムの表面電位分布図である。FIG. 12 is a surface potential distribution diagram of the photosensitive drum when the surface potential is measured after a lapse of a fixed time after charging.
【図13】電荷移動層の膜厚に異常がある感光体ドラム
を帯電して表面電位を測定したときの表面電位分布図で
ある。FIG. 13 is a surface potential distribution diagram when the surface potential is measured by charging a photosensitive drum having an abnormal thickness of the charge transfer layer.
【図14】電荷移動層の膜厚に異常がある感光体ドラム
を帯電・露光して表面電位を測定したときの表面電位分
布図である。FIG. 14 is a surface potential distribution diagram when the surface potential is measured by charging and exposing a photosensitive drum having an abnormal thickness of the charge transfer layer.
1;帯電分布測定装置、2;感光体ドラム、3;帯電ユ
ニット、4;露光ユニット、5;表面電位計、6;回転
モータ、7;回転駆動装置、8;帯電ユニット送りモー
タ、9;送り装置、10;露光ユニット送りモータ、1
1;送り装置、12;表面電位計送りモータ、13;送
り装置、14;制御装置、15;コントローラ、16;
帯電・露光制御部、17;駆動制御部、18;入力装
置、19;出力装置、20;高圧電源、21;露光光
源、22;シャッタ。1; Charge distribution measuring device, 2; Photosensitive drum, 3; Charging unit, 4; Exposure unit, 5; Surface potential meter, 6; Rotation motor, 7; Rotation drive device, 8; Charging unit feed motor, 9; Feed Device, 10; exposure unit feed motor, 1
1; Feeding device, 12; Surface electrometer feed motor, 13; Feeding device, 14; Control device, 15; Controller, 16;
Charging / exposure controller, 17; drive controller, 18; input device, 19; output device, 20; high-voltage power supply, 21; exposure light source, 22; shutter.
Claims (9)
転駆動装置に装着された円筒状ドラムの周囲に少なくと
も帯電ユニットと表面電位測定ユニットを個別に配置
し、帯電ユニットを送り装置により円筒状ドラムの軸方
向に移動しながら円筒状ドラム表面を帯電し、表面電位
測定ユニットを、帯電ユニットで帯電するときの移動方
向と同じ方向で帯電ユニットの移動速度と同じ速度で、
送り装置により円筒状ドラムの軸方向に移動して帯電し
た円筒状ドラムの表面電位を測定することを特徴とする
帯電分布測定装置。1. A photoconductor or an insulator film is formed, and at least a charging unit and a surface potential measuring unit are separately arranged around a cylindrical drum mounted on a rotary driving device, and the charging unit is fed by a feeding device. The surface of the cylindrical drum is charged while moving in the axial direction of the cylindrical drum, and the surface potential measuring unit is in the same direction as the moving direction when charging by the charging unit, at the same speed as the moving speed of the charging unit,
A charge distribution measuring device characterized by moving a surface of a cylindrical drum by a feeder to measure the surface potential of the charged cylindrical drum.
転駆動装置に装着された円筒状ドラムの周囲に少なくと
も帯電ユニットと露光ユニット及び表面電位測定ユニッ
トを個別に配置し、帯電ユニットを送り装置により円筒
状ドラムの軸方向に移動しながら円筒状ドラム表面を帯
電し、露光ユニットを送り装置により円筒状ドラムの軸
方向に帯電ユニットの移動速度と同じ速度で移動しなが
ら帯電した円筒状ドラム表面を露光し、表面電位測定ユ
ニットを、帯電ユニットで帯電するときの移動方向と同
じ方向で帯電ユニットの移動速度と同じ速度で、送り装
置により円筒状ドラムの軸方向に移動して帯電・露光し
た円筒状ドラムの表面電位を測定することを特徴とする
帯電分布測定装置。2. A photoconductor or insulator film is formed, and at least a charging unit, an exposure unit, and a surface potential measuring unit are individually arranged around a cylindrical drum mounted on a rotary driving device, and the charging unit is The transfer device charges the surface of the cylindrical drum while moving in the axial direction of the cylindrical drum, and the charging unit charges the exposure unit while moving the exposure unit in the axial direction of the cylindrical drum at the same speed as the moving speed of the charging unit. The drum surface is exposed, and the surface potential measuring unit is moved in the axial direction of the cylindrical drum by the feeding device at the same speed as the moving speed of the charging unit in the same direction as the moving direction when charging by the charging unit and charging A charge distribution measuring device characterized by measuring the surface potential of an exposed cylindrical drum.
に沿って等角度θで配置し、角度θ(度)は360/N・
(使用ユニット数−1)、但しNは2以上の整数で、か
つ測定する円筒状ドラムの半径がrのとき、表面電位計
を除く配置ユニットの内円筒状ドラムへの周方向の作用
範囲が最大なものの値kに対して、θ・(2πr/36
0)≧kの関係を有するように定め、円筒状ドラムを角
度θずつ回動し、帯電と表面電位の測定又は帯電と露光
及び表面電位の測定を繰り返し、円筒状ドラムが1回転
したところで、円筒体を任意角度回転させ、上記動作を
最初から繰り返す請求項1又は2記載の帯電分布測定装
置。3. The units are arranged at an equal angle θ along the circumferential direction of the cylindrical drum, and the angle θ (degree) is 360 / N.
(The number of used units-1), where N is an integer of 2 or more, and when the radius of the cylindrical drum to be measured is r, the operating range in the circumferential direction of the arrangement unit excluding the surface electrometer on the inner cylindrical drum is For the maximum value k, θ · (2πr / 36
0) ≧ k, the cylindrical drum is rotated by an angle θ, and charging and surface potential measurement or charging, exposure, and surface potential measurement are repeated, and when the cylindrical drum rotates once, The charge distribution measuring device according to claim 1, wherein the cylindrical body is rotated by an arbitrary angle and the above operation is repeated from the beginning.
定を連続的に行う請求項1,2又は3記載の帯電分布測
定装置。4. The charge distribution measuring device according to claim 1, wherein the charging of the cylindrical drum and the measurement of the surface potential are continuously performed.
間経過後に表面電位の測定を行う請求項1,2又は3記
載の帯電分布測定装置。5. The charge distribution measuring device according to claim 1, wherein the surface potential is measured after a lapse of a fixed time after charging the cylindrical drum.
は帯電ユニットと露光ユニット及び表面電位測定ユニッ
トを、光導電体又は絶縁体の膜が形成され、回転駆動装
置に装着されたた円筒状ドラムの軸方向に並べて一体に
した計測ユニットを送り装置により円筒状ドラムの軸方
向に移動しながら円筒状ドラム表面の帯電と露光及び表
面電位の測定を行うことを特徴とする帯電分布測定装
置。6. A shaft of a cylindrical drum having a charging unit and a surface potential measuring unit or a charging unit, an exposing unit and a surface potential measuring unit, on which a photoconductive or insulating film is formed and which is mounted on a rotation driving device. A charging distribution measuring device characterized by performing charging and exposure of the surface of a cylindrical drum and measurement of the surface potential while moving a measuring unit which is lined up and integrated in one direction in the axial direction of the cylindrical drum by a feeding device.
ムの外周に沿って等角度で配置した請求項5記載の帯電
分布測定装置。7. The charge distribution measuring device according to claim 5, wherein a plurality of sets of the measuring units are arranged at equal angles along the outer circumference of the cylindrical drum.
後に円筒状ドラムを除電する請求項1乃至6のいずれか
に記載の帯電分布測定装置。8. The charge distribution measuring device according to claim 1, wherein the charge is removed from the cylindrical drum after the surface potential of the cylindrical drum is measured.
ることを特徴とする画像形成装置。9. An image forming apparatus comprising the charge distribution measuring device according to claim 5.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001254024A JP2003066081A (en) | 2001-08-24 | 2001-08-24 | Charge distribution measuring device and image forming device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001254024A JP2003066081A (en) | 2001-08-24 | 2001-08-24 | Charge distribution measuring device and image forming device |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2003066081A true JP2003066081A (en) | 2003-03-05 |
Family
ID=19082242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001254024A Pending JP2003066081A (en) | 2001-08-24 | 2001-08-24 | Charge distribution measuring device and image forming device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2003066081A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008129372A (en) * | 2006-11-22 | 2008-06-05 | Ricoh Co Ltd | Characteristic evaluation apparatus of photoreceptor drum |
JP2009020454A (en) * | 2007-07-13 | 2009-01-29 | Ricoh Co Ltd | Device for measuring latent image in minute area on photoreceptor |
JP2011048300A (en) * | 2009-08-28 | 2011-03-10 | Ricoh Co Ltd | Potential control device, and device for evaluating characteristic of electrophotographic photoreceptor |
JP2012098659A (en) * | 2010-11-05 | 2012-05-24 | Ricoh Co Ltd | Characteristic evaluation method and characteristic evaluation device for electrophotographic photoreceptor |
-
2001
- 2001-08-24 JP JP2001254024A patent/JP2003066081A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008129372A (en) * | 2006-11-22 | 2008-06-05 | Ricoh Co Ltd | Characteristic evaluation apparatus of photoreceptor drum |
JP2009020454A (en) * | 2007-07-13 | 2009-01-29 | Ricoh Co Ltd | Device for measuring latent image in minute area on photoreceptor |
JP2011048300A (en) * | 2009-08-28 | 2011-03-10 | Ricoh Co Ltd | Potential control device, and device for evaluating characteristic of electrophotographic photoreceptor |
JP2012098659A (en) * | 2010-11-05 | 2012-05-24 | Ricoh Co Ltd | Characteristic evaluation method and characteristic evaluation device for electrophotographic photoreceptor |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2003066081A (en) | Charge distribution measuring device and image forming device | |
JP5293100B2 (en) | Method and apparatus for evaluating characteristics of electrophotographic photosensitive member | |
JPH07128240A (en) | Inspection device of electrophotographic photoreceptor defect | |
US4189642A (en) | Method and apparatus for drum corona current measurement and alignment | |
JP2003005578A (en) | Characteristic evaluation device and characteristic evaluation method for photoreceptor | |
US5929640A (en) | Automated stationary/portable test system for photoconductive drums | |
US6469513B1 (en) | Automated stationary/portable test system for applying a current signal to a dielectric material being tested | |
JP5821224B2 (en) | Electrophotographic photosensitive member characteristic evaluation apparatus and characteristic evaluation method | |
JPS59136771A (en) | Checking method of electrophotographic sensitive body | |
Tse | Quality control test equipment for photoreceptors, charge rollers and magnetic rollers | |
JP4964702B2 (en) | Device for evaluating characteristics of electrophotographic photosensitive member | |
JP2003005389A (en) | Method and apparatus for evaluating characteristic of photoreceptor | |
US5307120A (en) | Method for measuring electrostatic potential | |
JP2003131520A (en) | Photoreceptor drum inspection method and device therefor | |
JP3845230B2 (en) | Photosensitive drum inner surface inspection device | |
CA2375064C (en) | Electrophotographic process control and diagnostic system | |
JP2007086167A (en) | Photoreceptor characteristic measuring instrument | |
JP2674002B2 (en) | Image defect evaluation device for electrophotographic photoconductor | |
JPS63301082A (en) | Inspecting method for photosensitive body characteristic | |
JPS6385782A (en) | Detection of pinhole of photosensitive body for image forming device | |
JP2005189163A (en) | Abnormality determination method, abnormality determination device and image forming device | |
JP5447838B2 (en) | Electrophotographic photoconductor characteristic evaluation device | |
JP2000338158A (en) | Method for testing semiconductive endless plastic belt | |
JP3599638B2 (en) | Image forming device | |
JP2010286612A (en) | Device for evaluating characteristic of electrophotographic photoreceptor |