JPS6385782A - Detection of pinhole of photosensitive body for image forming device - Google Patents
Detection of pinhole of photosensitive body for image forming deviceInfo
- Publication number
- JPS6385782A JPS6385782A JP23223586A JP23223586A JPS6385782A JP S6385782 A JPS6385782 A JP S6385782A JP 23223586 A JP23223586 A JP 23223586A JP 23223586 A JP23223586 A JP 23223586A JP S6385782 A JPS6385782 A JP S6385782A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- photoreceptor
- pinhole
- dielectric breakdown
- photosensitive body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 10
- 230000015556 catabolic process Effects 0.000 claims abstract description 17
- 108091008695 photoreceptors Proteins 0.000 claims description 53
- 238000000034 method Methods 0.000 claims description 8
- 239000000523 sample Substances 0.000 abstract description 7
- 239000000758 substrate Substances 0.000 abstract description 4
- 238000009413 insulation Methods 0.000 abstract description 2
- 230000001960 triggered effect Effects 0.000 abstract description 2
- 230000005611 electricity Effects 0.000 abstract 1
- 238000007689 inspection Methods 0.000 description 4
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000004323 axial length Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Discharging, Photosensitive Material Shape In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は、画像形成装置用感光体のピンホール検出方法
に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for detecting pinholes in a photoreceptor for an image forming apparatus.
（従来の技術）
画像形成装置、例えば、レーザプリンタ、電子写真複写
機等に用いられる感光体の表面は、ＣｄＳ系、セレン系
等の材料による感光層により構成さ“れている、この感
光体の感光層にピンホールがあると、画像品質に悪影響
が生じる。従って、感光体を複写機等に実装する前に、
感光体を個々に検査してピンホールの有無を検出してい
る。(Prior Art) The surface of a photoreceptor used in an image forming apparatus, such as a laser printer, an electrophotographic copying machine, etc., is composed of a photosensitive layer made of a CdS-based material, selenium-based material, etc. If there are pinholes in the photosensitive layer of the photoconductor, the image quality will be adversely affected.
Each photoreceptor is individually inspected to detect the presence or absence of pinholes.
このような感光体の検査は、検査員の目視によって行わ
れているのが通常である。従って、検査には経験を要し
、小さなピンホールは見落とす可能性が高いという問題
がある。また、検査に長時間を要するという問題もある
。Such photoreceptor inspections are normally performed visually by an inspector. Therefore, inspection requires experience, and there is a problem that small pinholes are likely to be overlooked. Another problem is that the inspection takes a long time.
特開昭５９−４９５７３号公報には、そのような目視検
査の問題点を解決するものとして、感光体の異常検査の
ための装置が提案されている。この提案された装置は、
円筒状感光体を回転させながら、感光層表面上を電位検
出用プローブによって走査して、感光層の欠陥を表面電
位の異常として検出する。Japanese Patent Application Laid-Open No. 59-49573 proposes an apparatus for inspecting photoreceptors for abnormalities in order to solve the problems of such visual inspection. This proposed device is
While rotating the cylindrical photoreceptor, the surface of the photosensitive layer is scanned by a potential detection probe to detect defects in the photosensitive layer as abnormalities in the surface potential.
（発明が解決しようとする問題点）
しかし、そのような提案された装置には次のような問題
点がある。電位検出用プローブの先端（通常は、３−φ
程度）が、ピンホールの大きさに比較して大きいので、
小さいピンホールを検出することができない、また、電
位検出用プローブを感光体の軸方向に走査しなければな
らないので、検査に長時間を要する。更には、感光層の
電位を検出する構成であるため、検査は暗所で行わなけ
ればならず、装置の設置には困難を伴う。(Problems to be Solved by the Invention) However, such proposed devices have the following problems. The tip of the potential detection probe (usually 3-φ
degree) is large compared to the size of the pinhole, so
Small pinholes cannot be detected, and the potential detection probe must be scanned in the axial direction of the photoreceptor, so inspection takes a long time. Furthermore, since the device is configured to detect the potential of the photosensitive layer, the test must be conducted in a dark place, making installation of the device difficult.
本発明は、上記従来の問題点を解決するものであり、そ
の目的とするところは、ピンホールを確実に、しかも短
時間で検出できる画像形成装置用感光体のピンホール検
出方法を提供することにある。The present invention solves the above-mentioned conventional problems, and its purpose is to provide a method for detecting pinholes in photoreceptors for image forming apparatuses, which can detect pinholes reliably and in a short time. It is in.
（問題点を解決するための手段）
本発明の画像形成装置用感光体のピンホール検出方法は
、該感光体に対向し且つ該感光層表面から間隙をもって
配され少なくとも一方向に延伸する電極と、該感光体と
の間の絶縁破壊電圧値より低（、且つ、該感光体の感光
層が形成されていないとした場合の該電極と該感光体と
の間の絶縁破壊電圧値より高い値の電圧を、該電極と該
感光体との間に印加すること、及び該電圧印加と共に、
該電極と該感光体とを互いに相対的に移動させること、
を包含しており、このことにより上記目的が達成される
。(Means for Solving the Problems) The method for detecting pinholes in a photoreceptor for an image forming apparatus according to the present invention includes an electrode that faces the photoreceptor and is disposed with a gap from the surface of the photoreceptor layer and extends in at least one direction. , lower than the dielectric breakdown voltage value between the photoconductor (and higher than the dielectric breakdown voltage value between the electrode and the photoconductor when the photoconductor's photosensitive layer is not formed) applying a voltage between the electrode and the photoreceptor, and together with the voltage application,
moving the electrode and the photoreceptor relative to each other;
, thereby achieving the above objective.
（実施例） 以下に本発明の実施例について説明する。(Example) Examples of the present invention will be described below.
本発明のピンホール検出方法の一実施例を第１図に示す
０本実施例は電子写真複写機用のドラム状感光体１のピ
ンホールを検出するものである。An embodiment of the pinhole detection method of the present invention is shown in FIG. 1. This embodiment is for detecting pinholes in a drum-shaped photoreceptor 1 for an electrophotographic copying machine.
感光体ｌは円筒状のアルミニウム製の基体２を有してい
る。基体２の表５面には、セレンテルルが−様な膜厚ｔ
（第２図参照）に蒸着されて感光層３が形成されている
。従って、基体２上に感光層３は円筒状に形成されてい
る。感光層３の軸方向長さの大部分は感光体ｌの有効画
像領域の幅Ｗである。感光体１は子図、示の回転手段に
回転自在に取り付けられるようにされており、該回転手
段よって軸ぶれを起こすことなく回転可能である。取り
付けられた感光体１の基体２は接地される。The photoreceptor 1 has a cylindrical base 2 made of aluminum. The five surfaces of the substrate 2 have a film thickness t of selenium telluride.
(See FIG. 2) is deposited to form a photosensitive layer 3. Therefore, the photosensitive layer 3 is formed on the substrate 2 in a cylindrical shape. Most of the axial length of the photosensitive layer 3 is the width W of the effective image area of the photosensitive member l. The photoreceptor 1 is rotatably attached to a rotating means shown in the subfigure, and can be rotated by the rotating means without causing shaft wobbling. The base 2 of the attached photoreceptor 1 is grounded.
感光体ｌが回転手段に取り付けられると、感光体１の上
方には略矩形板状の電極４がその一端４ａが所定の間隙
ｇ（第２図参照）を介して感光層３と対向するように配
置される。尚、電極４を第２図に於いて上下方向に可動
して、間隙ｇを可変としてもよい、第２図に示すように
、電極４の長辺側の一端４ａは円弧状とされて電界集中
の緩和が図られている。該一端４ａの長さは感光体１の
有効画像領域の輻Ｗと等しく、一端４ａが該領域の幅方
向全体の上方を延伸している。When the photoreceptor 1 is attached to the rotating means, a substantially rectangular plate-shaped electrode 4 is placed above the photoreceptor 1 such that one end 4a thereof faces the photosensitive layer 3 with a predetermined gap g (see FIG. 2). will be placed in Incidentally, the gap g may be made variable by moving the electrode 4 in the vertical direction in FIG. 2. As shown in FIG. Efforts are being made to ease concentration. The length of the one end 4a is equal to the radius W of the effective image area of the photoreceptor 1, and the one end 4a extends above the entire width direction of the area.
電極４は、直流高圧発生装置５の負極側に接続されてい
る。高圧発生装置５の正極側は接地されている。The electrode 4 is connected to the negative electrode side of the DC high voltage generator 5. The positive electrode side of the high pressure generator 5 is grounded.
また、電極４はオシロスコープ６のプローブ７にも接続
されている。オシロスコープ６は接地されている。The electrode 4 is also connected to a probe 7 of an oscilloscope 6. Oscilloscope 6 is grounded.
このような構成に於いて、間隙ｇを６．３＋ｓａ＋とし
、感光体１の怒光Ｎ３の膜厚ｔが６０μｍである感光体
１の感光層３に発生しているピンホールＰの検出の仕方
を説明する。In such a configuration, the gap g is 6.3+sa+, and the thickness t of the angry light N3 on the photoreceptor 1 is 60 μm. How to detect the pinhole P generated in the photosensitive layer 3 of the photoreceptor 1. Explain.
電極４と感光体１との間の絶縁破壊電圧をＶＡとする。Let VA be the dielectric breakdown voltage between the electrode 4 and the photoreceptor 1.
一方、感光層３が形成されていないとした場合の電極４
と感光体１との間の絶縁破壊電圧をＶＢとする。On the other hand, the electrode 4 in the case where the photosensitive layer 3 is not formed
Let VB be the dielectric breakdown voltage between the photoreceptor 1 and the photoreceptor 1.
直流高圧発生装置５の出力電圧値を、絶縁破壊電圧ＶＡ
より低く、絶縁破壊電圧ＶＢより高い−５ｋＶに設定す
る。この電圧を電極４と感光体１との間に印加しながら
、感光体１を回転させる。感光層３のピンホールＰがな
い部分が電極４の下を通っている時には、電極４と感光
体１との間には放電は起こらない、従って、その間はプ
ローブ７の電位は一５ｋＶである。第２図に示すように
、感光体１が回転してピンホールＰが電極４の下に位置
すると、該ピンホールＰによって露出している基体２の
表面と電極４との間の絶縁が破壊されて放電する。この
放電によってプローブ７の電位は一５ｋＶからグランド
電位（ＯｋＶ）に急激に上昇する。The output voltage value of the DC high voltage generator 5 is expressed as the dielectric breakdown voltage VA.
It is set to −5 kV, which is lower and higher than the dielectric breakdown voltage VB. While applying this voltage between the electrode 4 and the photoreceptor 1, the photoreceptor 1 is rotated. When the part of the photosensitive layer 3 without the pinhole P passes under the electrode 4, no discharge occurs between the electrode 4 and the photosensitive member 1. Therefore, during that time, the potential of the probe 7 is -5 kV. . As shown in FIG. 2, when the photoreceptor 1 rotates and the pinhole P is positioned below the electrode 4, the insulation between the surface of the substrate 2 exposed by the pinhole P and the electrode 4 is destroyed. discharged. Due to this discharge, the potential of the probe 7 rapidly rises from -5 kV to the ground potential (OkV).
この変化によってオシロスコープ６はトリガされ、該変
化はオシロスコープ６によって第３図に示すような波形
として観測され、ピンホールＰの存在が検出される。The oscilloscope 6 is triggered by this change, and the change is observed by the oscilloscope 6 as a waveform as shown in FIG. 3, and the presence of the pinhole P is detected.
実験によれば、長さ２２０＋＋ｓ＋ 、厚さ０．１＋ａ
＋の電極４を用い、長さ２３３ＩＩ１１、直径７８１の
感光体ｌを毎分６０回転の速度で回転させた場合、直径
約２０μｍのピンホールを検出することができた。According to experiments, length 220++s+, thickness 0.1+a
When the + electrode 4 was used and the photoreceptor l having a length of 233II11 and a diameter of 781 was rotated at a speed of 60 revolutions per minute, a pinhole with a diameter of about 20 μm could be detected.
尚、上述の実施例では、直流電圧を印加しているが、交
流電圧の印加によっても同様の効果が得られる。In the above-described embodiment, a DC voltage is applied, but the same effect can be obtained by applying an AC voltage.
オシロスコープ６等の電気的手段を用いず、目視によっ
て該放電を見出してピンホールＰを検出するようにして
もよい、更には、電位の急上昇によってブザー等の鳴動
装置を鳴動させて検出したり、該放電を持続させて肉眼
で見える程度にピンホールＰを拡大して検出することも
できる。The pinhole P may be detected by visually detecting the discharge without using an electrical means such as the oscilloscope 6. Furthermore, detection may be performed by making a sounding device such as a buzzer sound due to a sudden increase in the potential. The pinhole P can also be detected by continuing the discharge and enlarging the pinhole P to the extent that it can be seen with the naked eye.
電極４は感光体１又は感光層３の軸方向に延伸する長尺
電極とされているが、その大きさ及び形状は感光体の大
きさ等に応じて適宜に決定される。The electrode 4 is a long electrode extending in the axial direction of the photoreceptor 1 or the photosensitive layer 3, and its size and shape are appropriately determined depending on the size of the photoreceptor and the like.
空気の絶縁破壊電圧は気圧、気温、湿度等により変動す
るので、それらの値をマイクロコンピュータに入力して
該コンピュータの出力によって高圧発生装置５の出力電
圧値を制御することもできる。これによって、該出力電
圧値が絶縁破壊電圧Ｖ＾と絶縁破壊電圧ＶＢの中間の値
に自動的に設定される。或いは、電極４を移動させて間
隙ｇを変化させ、絶縁破壊電圧ＶＡが出力電圧値より高
く、絶縁破壊電圧値ＶＢが出力電圧値より該出力電圧値
より低くなるようにすることもできる。Since the dielectric breakdown voltage of air varies depending on atmospheric pressure, temperature, humidity, etc., it is also possible to input these values into a microcomputer and control the output voltage value of the high pressure generator 5 based on the output of the computer. As a result, the output voltage value is automatically set to an intermediate value between the dielectric breakdown voltage V^ and the dielectric breakdown voltage VB. Alternatively, the electrode 4 can be moved to change the gap g so that the dielectric breakdown voltage VA is higher than the output voltage value and the dielectric breakdown voltage value VB is lower than the output voltage value.
上述の実施例では感光体１への電圧印加は空気中で行わ
れるようにされているが、適当な電気絶縁性を有し且つ
感光体に悪影響を及ぼさないものであれば、ガス中或い
は液中で該電圧印加を行ってもよいことは勿論である。In the above embodiment, the voltage is applied to the photoreceptor 1 in the air, but it may be applied in a gas or liquid as long as it has appropriate electrical insulation and does not adversely affect the photoreceptor. Of course, the voltage application may be performed inside the chamber.
また、本発明はドラム式の感光体に限らず、ベルト式の
感光体にも当然適用可能である。Furthermore, the present invention is naturally applicable not only to drum-type photoreceptors but also to belt-type photoreceptors.
（発明の効果）
本発明の画像形成装置用感光体のピンホール検出方法は
、このように、！８練した検査員によらずともピンホー
ルを確実にしかも短時間で検出することができるので、
感光体の品質が向上し、作業性が向上するようになる。(Effects of the Invention) The method for detecting pinholes in a photoreceptor for an image forming apparatus according to the present invention is as follows! 8 Pinholes can be detected reliably and in a short time without the need for trained inspectors.
The quality of the photoreceptor improves, and workability improves.
しかも、本発明方法は暗所を必要としないので、感光体
の製造ライン等に於いて容易に実施することができる。Moreover, since the method of the present invention does not require a dark place, it can be easily carried out on a photoreceptor production line or the like.
４、 ゛ の ゛な萱゛■
第１図は本発明方法の一実施例の説明図、第２図はその
実施例の感光体と電極の一部を示す要部拡大断面図、第
３図はその実施例により得られた電圧波形を示す図であ
る。4. Figure 1 is an explanatory diagram of an embodiment of the method of the present invention, Figure 2 is an enlarged sectional view of the main part showing a part of the photoreceptor and electrode of the embodiment, and Figure 3 FIG. 2 is a diagram showing a voltage waveform obtained by the example.
ｌ・・・感光体、２・・・基体、３・・・感光層、４電
極、Ｐ・・・ピンホール。L...Photoreceptor, 2...Base, 3...Photosensitive layer, 4 electrodes, P...Pinhole.
以上that's all
Claims (1)
て、 該感光体に対向し且つ該感光層表面から間隙をもって配
され少なくとも一方向に延伸する電極と、該感光体との
間の絶縁破壊電圧値より低く、且つ、該感光体の感光層
が形成されていないとした場合の該電極と該感光体との
間の絶縁破壊電圧値より高い値の電圧を、該電極と該感
光体との間に印加すること、及び 該電圧印加と共に、該電極と該感光体とを互いに相対的
に移動させること、 を包含する画像形成装置用感光体のピンホール検出方法
。 ２、前記感光体が円筒状に形成されており、前記電極が
該円筒の軸方向と実質的に並行に延伸する長尺電極であ
る特許請求の範囲第１項に記載のピンホール検出方法。 ３、前記電極と前記感光体との間の相対移動が該感光体
の回動によってなされる特許請求の範囲第２項に記載の
ピンホール検出方法。 ４、前記長尺電極の長さが前記感光体の有効画像領域の
前記軸方向の長さと実質的に等しい特許請求の範囲第２
項又は第３項に記載のピンホール検出方法。[Claims] 1. A method for detecting pinholes in a photoreceptor for an image forming apparatus, which comprises: an electrode facing the photoreceptor and disposed with a gap from the surface of the photoreceptor layer and extending in at least one direction; A voltage lower than the dielectric breakdown voltage value between the electrode and the photoreceptor and higher than the dielectric breakdown voltage value between the electrode and the photoreceptor when the photoreceptor layer is not formed, A method for detecting pinholes in a photoreceptor for an image forming apparatus, comprising: applying voltage between the electrode and the photoreceptor; and moving the electrode and the photoreceptor relative to each other while applying the voltage. . 2. The pinhole detection method according to claim 1, wherein the photoreceptor is formed in a cylindrical shape, and the electrode is a long electrode extending substantially parallel to the axial direction of the cylinder. 3. The pinhole detection method according to claim 2, wherein the relative movement between the electrode and the photoreceptor is performed by rotation of the photoreceptor. 4. Claim 2, wherein the length of the elongated electrode is substantially equal to the length of the effective image area of the photoreceptor in the axial direction.
The pinhole detection method according to item 1 or 3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23223586A JPS6385782A (en) | 1986-09-30 | 1986-09-30 | Detection of pinhole of photosensitive body for image forming device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23223586A JPS6385782A (en) | 1986-09-30 | 1986-09-30 | Detection of pinhole of photosensitive body for image forming device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6385782A true JPS6385782A (en) | 1988-04-16 |
Family
ID=16936090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23223586A Pending JPS6385782A (en) | 1986-09-30 | 1986-09-30 | Detection of pinhole of photosensitive body for image forming device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6385782A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6288554B1 (en) * | 1996-02-16 | 2001-09-11 | Joven Denki Kabushiki Kaisha | Method for inspecting hermetically sealed package |
| JP2007285965A (en) * | 2006-04-19 | 2007-11-01 | Kyocera Mita Corp | Method and device for continuity inspection |
| JP2009025447A (en) * | 2007-07-18 | 2009-02-05 | Ricoh Co Ltd | Latent image carrier defect detection method and image forming apparatus |
| JP2013501232A (en) * | 2009-08-04 | 2013-01-10 | ボール パッケージング ユーロップ ゲゼルシャフト ミット ベシュレンクテル ハフツング | Apparatus and method for performing surface treatment using an inspection station |
-
1986
- 1986-09-30 JP JP23223586A patent/JPS6385782A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6288554B1 (en) * | 1996-02-16 | 2001-09-11 | Joven Denki Kabushiki Kaisha | Method for inspecting hermetically sealed package |
| JP2007285965A (en) * | 2006-04-19 | 2007-11-01 | Kyocera Mita Corp | Method and device for continuity inspection |
| JP2009025447A (en) * | 2007-07-18 | 2009-02-05 | Ricoh Co Ltd | Latent image carrier defect detection method and image forming apparatus |
| JP2013501232A (en) * | 2009-08-04 | 2013-01-10 | ボール パッケージング ユーロップ ゲゼルシャフト ミット ベシュレンクテル ハフツング | Apparatus and method for performing surface treatment using an inspection station |
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