JP2000338158A - Method for testing semiconductive endless plastic belt - Google Patents

Abstract

PROBLEM TO BE SOLVED: To shorten a measuring time for an electric resistance value, and to enhance evaluation precision for uniformness of the resistance value. SOLUTION: A voltage is impressed between both positive and negative electrodes fixed onto an insulation block 30 to measure a current flowing in a semi-conductive endless plastic belt B between the both electrodes, while the belt B is kept under running, in a condition that the both electrodes fixed onto the insulation block 30 are brought into contact with an inner face of of the semiconductive endless belt B, and an electric resistance value of the belt B between both electrodes is calculated thereby.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test of a semiconductive endless plastic belt used as a transfer intermediate for copying a toner image on a photoreceptor in an apparatus employing electrophotography such as a full-color copying machine and a printer. It is about the method.

[0002]

2. Description of the Related Art In recent years, with the practical use of electrophotographic copying machines such as full-color copying machines, when a toner image developed on a photoreceptor is transferred to copying paper, the toner image is temporarily copied to a transfer intermediate. After that, a process of transferring the image to copy paper is adopted.

One example is shown in FIG. That is, in this process, after the surface of the photosensitive drum 1 is charged by the charging roll 2, the slit exposure 4 of the original light image reaches the surface of the photosensitive drum 1 via the exposure mechanism unit 3 and corresponds to the original image. An electrostatic latent image is formed on the surface of the photosensitive drum 1, and a developer is supplied by the developing device 5 to form a toner image. An endless belt 6 as a transfer intermediate is pressed against the photosensitive drum 1 via a primary transfer roller 7 below the photosensitive drum 1, and a toner image developed on the photosensitive drum 1 is The repetitive running of the endless belt 6 in both the forward and reverse directions causes the color to be transferred to the surface of the endless belt 6 in the order of each color. And
As the endless belt 6 travels, the toner image is transferred to a copy sheet 9 sandwiched between the endless belt 6 and the secondary transfer roller 8. The developer remaining on the surface of the endless belt 6 after the secondary transfer is collected by the cleaning blade 10, and the endless belt 6 is prepared for the next transfer. Further, the developer remaining on the surface of the photosensitive drum 1 after the primary transfer is collected by the cleaning device 11, and thereafter, the surface of the photosensitive drum 1 is neutralized by the eraser lamp 12.

The endless belt 6 is manufactured, for example, as follows. That is, first, a resin liquid film is formed on the outer periphery of the liquid film forming shaft by spraying, dipping, or the like. Then, by drying and removing the solvent,
A solid coating layer is formed on the outer periphery of the liquid film forming shaft. The endless belt 6 is obtained by extracting the shaft for forming a liquid film.

[0005] The electric resistance of the endless belt 6 affects the image quality. That is, if there is a portion where the electric resistance value is non-uniform, a problem such as uneven density occurs on the image. Therefore, the obtained endless belt 6 is tested and evaluated for the uniformity of the electric resistance value in addition to the absolute value of the electric resistance.

Therefore, at present, the endless belt 6 is generally tested using a resistance measuring machine having a measuring probe.
Has been evaluated. That is, the measurement probe is brought into contact with a plurality of positions on the surface of the endless belt 6 to measure the electric resistance values of the contact portions, thereby evaluating the uniformity of the electric resistance values.

[0007]

However, the measurement of the electric resistance value by the measuring probe is a local measurement in a range of the size (about 30 mm in diameter) of the measuring probe. Therefore, in order to evaluate the uniformity of the electric resistance value of the endless belt 6 over a wide range, multipoint measurement is required, and the measurement requires much time. Further, when the measurement points are thinned out in order to shorten the measurement time, it is not possible to detect a local nonuniform electric resistance value existing between the measurement points. For this reason, image defects could not be found unless image output was performed on an actual machine.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a method for testing a semiconductive endless plastic belt in which the measurement time of an electric resistance value is shortened and the accuracy of evaluating uniformity of the electric resistance value is improved. Its purpose is to provide.

[0009]

In order to achieve the above object, a method for testing a semiconductive endless plastic belt according to the present invention comprises the steps of: providing a positive and negative electrode in contact with a surface of the semiconductive endless plastic belt; By relatively moving the two electrodes and the semiconductive endless plastic belt, applying a voltage between the two electrodes, and measuring the current flowing through the semiconductive endless plastic belt between the two electrodes, The configuration is such that the electrical resistance of the semiconductive endless plastic belt between both electrodes is calculated.

That is, in the method for testing a semiconductive endless plastic belt according to the present invention, both the positive and negative electrodes are in contact with the surface of the semiconductive endless plastic belt, and the two electrodes are connected to the semiconductive endless plastic belt. Since the measurement is performed while relatively moving, the current flowing through the belt between the positive and negative electrodes can be continuously measured over the entire circumference of the belt. And, when the current value is within a predetermined range,
It can be evaluated that the electric resistance value of the semiconductive endless plastic belt is uniform. If the electric resistance value is out of the above range, it can be evaluated that the electric resistance value is non-uniform. Therefore, the uniformity of the electric resistance value of the semiconductive endless plastic belt over a wide range can be evaluated in a short time, and the evaluation accuracy is high. Therefore, it is possible to estimate an image defect without performing image drawing on an actual device.

Further, in the present invention, when each of the positive and negative electrodes is provided with a rotating body which is rotated by the relative movement between the two electrodes and the semiconductive endless plastic belt, the semiconductive endless plastic belt may be used. Less risk of surface damage.

[0012]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, embodiments of the present invention will be described in detail with reference to the drawings.

FIG. 1 to FIG. 8 show one embodiment of a method for testing a semiconductive endless plastic belt of the present invention. In this embodiment, as shown in FIG. 1, a test is performed by running a semiconductive endless plastic belt (hereinafter simply referred to as “belt”) B and fixing an electrode portion E.

For this purpose, the following test apparatus is prepared. That is, the test apparatus includes a base 21 and three rollers 22, 23, 24 provided on the upper surface of the base 21.
The positive and negative electrodes 25 (FIGS. 2 and 3) are provided on the inner surface (back surface) of the belt B that is hung on the rollers 22, 23, and 24.
And a measuring device M for measuring a current flowing through the belt B between the electrode section E and the electrode section E arranged so as to be in contact with each other.
(See FIG. 6).

More specifically, the three rollers 22, 23 and 24 are arranged at three vertices forming a triangle, and are erected on the upper surface of the base 21. And
One of the three rollers 22, 23, and 24 is a drive roller 22 that is driven to rotate by a motor (not shown) provided in the pedestal 21.
The individual rollers 23 and 24 are rotatable rotating rollers 23 and 24 that rotate together with the traveling of the belt B. Further, one of the two rotating rollers 23, 24 is slidable inward and outward of the triangle. This slidable rotary roller 23
Is rotatably supported by a base plate 27 having a through-hole 26 (see FIG. 7) formed thereon. The upper surface of the base 21 formed at a position corresponding to the through-hole 26 and the through-hole 26 is formed. The hole 28 (see FIG. 7) is overlapped and fixed by fitting a pin 29 into the through hole 26 and the hole 28.
The slide becomes free by pulling out 9 (see FIG. 8).

As shown in FIGS. 2 and 3, the electrode section E includes a phenol resin insulating table 30 fixed to the upper surface of the base section 21 and an electrode 25 fixed to the insulating table 30. It consists of The electrode 25 is
A pair of the positive and negative electrodes 25 as shown in FIG.
As shown in FIG. 3, three sets are fixed at equal intervals in the height direction.

Further, as shown in FIGS. 4 and 5, each of the electrodes 25 includes a rotating body 31 that rotates together with the running of the belt B, a rotating shaft 32 of the rotating body 31, and a rotating shaft 32. A spring 33 elastically supported so as to be pressed in the direction of the inner surface of the belt B;
And a holding body 34 holding the spring 33 and the rotating shaft 3
2 is connected to the lead wire 35. Further, the rotating body 31 and the rotating shaft 32 are made of a material that can be energized. The lead wire 35 is connected to the measuring device M as shown in FIG.

The measuring device M includes a voltage section 36 applied between the positive and negative electrodes 25 of each set and an ammeter 37 for measuring a current flowing by the application.

When such a test apparatus is prepared, the belt B manufactured in the test apparatus is mounted as follows. That is, first, as shown in FIG.
By pulling out 9 (see FIG. 1), the slidable rotation roller 23 is slid inward of the triangle. Next, the belt B is set so that the three rollers 22, 23, and 24 and the electrode portion E are located inside the belt B. Next, as shown in FIG. 8, the slidable rotary roller 23 is slid outwardly of the triangle so that the belt B is stretched, and is fixed with the pin 29. In this way,
Attach belt B to the test device.

When the belt B is mounted on the test apparatus, the rotating body 31 of each electrode 25 is in contact with the inner surface of the belt B as shown in FIGS.

In the above configuration, when the driving roller 22 is rotationally driven, the belt B runs. In this state, when a voltage is applied between the positive and negative electrodes 25 of each set, the belt B between the positive and negative electrodes 25 of each set is driven. Can be continuously measured over the entire circumference of the belt B. If the current value is within a certain range, it can be evaluated that the electric resistance value of the belt B is uniform. Further, if the current value falls below or exceeds the above range, it indicates that the portion of the belt B that has traveled between the two electrodes 25 at that time has a larger or smaller electric resistance value than the other portions. In addition, it can be evaluated that the electric resistance value of the belt B is non-uniform.

According to the above embodiment, both the positive and negative electrodes 25
Since the current flowing through the belt B can be continuously measured over the entire circumference of the belt B, the uniformity of the electric resistance value of the belt B over a wide range can be evaluated in a short time.
Moreover, the evaluation accuracy is high. Furthermore, if the electric resistance value is non-uniform, the location can be specified.

The rotation of the rotating body 3
Since 1 rotates together, the inner surface of the belt B is less likely to be damaged by the electrode.

FIG. 9 shows another embodiment of the method for testing a semiconductive endless plastic belt of the present invention. In this embodiment, the positive and negative electrodes 25 are in contact with the outer side surface (surface) of the belt B, and the other parts are the same as those in the above-described embodiment.
The same reference numerals are given. Then, the same operation and effect as those of the above embodiment can be obtained.

FIG. 10 shows still another embodiment of the method for testing a semiconductive endless plastic belt of the present invention. In this embodiment, both the positive and negative electrodes 25 are in contact with the inner and outer surfaces (front and rear surfaces) of the belt B, and the other parts are the same as those in the above embodiment. , Are denoted by the same reference numerals. And
The same operation and effect as those of the above-described embodiment can be obtained.

Next, examples will be described together with comparative examples.

First, the belt of sample a whose electric resistance value is within the specified range, the belt of sample b whose electric resistance value exceeds the upper limit of the specified range, and the belt whose electric resistance value is lower than the lower limit of the specified range are described. A sample c belt is prepared.

[0028]

Example 1 A test apparatus similar to that of the above-described embodiment was prepared, and the belts of the samples a, b, and c were mounted on the test apparatus, and current values flowing through these belts were measured. The result is shown in FIG.

[0029]

Comparative Example 1 In the same manner as in the prior art, the electrical resistance of the belts of the samples a, b and c was measured using a resistance measuring machine provided with a measuring probe. In this measurement, each belt was divided into 16 parts in the circumferential direction, and a measurement probe was sequentially brought into contact with these 16 parts.

With respect to Example 1, the case where the measured current value is within the standard (pass) range over the entire circumference is indicated by “○”, and the case where the measured value is out of the standard range is indicated by “×”. displayed. Further, for Comparative Example 1, a portion where the measured electric resistance value is within the specified range is indicated by “、”, and a portion outside the specified range is indicated by “×” in Table 1 below.

[0031]

[Table 1]

From the results shown in Table 1, it can be confirmed that in Example 1, evaluation can be performed in a short time, and in Comparative Example 1, the number of measurement points increases and time is required.

In each of the above embodiments, the electrode 25
Although three sets of positive and negative electrodes 25 are fixed at equal intervals in the height direction, the present invention is not limited to this. That is, the number of sets may be other than three. Then, as the number of sets increases, the measurement area increases, and the evaluation accuracy improves. Further, the electrode 25 may be slid in the height direction. Even in this case, the measurement area is widened, and the evaluation accuracy is improved.

In the embodiment shown in FIGS. 6 and 9, the positive and negative electrodes 25 of each set are arranged horizontally. However, the present invention is not limited to this. Alternatively, they may be arranged vertically as shown in FIG. In particular, the arrangement shown in FIG. 12 is advantageous when the electrode 25 is slid in the height direction.

In the embodiment shown in FIG. 10, the positive and negative electrodes of each set are arranged so as to face the front. However, the present invention is not limited to this, and the electrodes are arranged in an offset state as shown in FIG. May be.

[0036]

As described above, the method for testing a semiconductive endless plastic belt according to the present invention provides a method for testing a semiconductive endless plastic belt in a state where both electrodes are in contact with the surface of the semiconductive endless plastic belt. Since the measurement is performed while the endless plastic belt is relatively moved, the current flowing through the belt between the positive and negative electrodes can be continuously measured over the entire circumference of the belt. When the current value is within a predetermined range, it can be evaluated that the electric resistance value of the semiconductive endless plastic belt is uniform, and when the current value is out of the range, the electric resistance value is non-uniform. Can be evaluated. Therefore, the uniformity of the electric resistance value of the semiconductive endless plastic belt over a wide range can be evaluated in a short time, and the evaluation accuracy is high. Therefore, it is possible to estimate an image defect without performing image drawing on an actual device.

In the present invention, when each of the positive and negative electrodes is provided with a rotator which is rotated by the relative movement between the two electrodes and the semiconductive endless plastic belt, the semiconductive endless plastic belt may be rotated. Less risk of surface damage.

[Brief description of the drawings]

FIG. 1 is a perspective view showing one embodiment of a method for testing a semiconductive endless plastic belt of the present invention.

FIG. 2 is a top view of an electrode used in the test method.

FIG. 3 is a cross-sectional view of the electrode section as viewed from the side.

FIG. 4 is an explanatory view of the electrodes of the electrode section as viewed from above.

FIG. 5 is an explanatory view of the electrode as viewed from the side.

FIG. 6 is a schematic explanatory view for explaining a test method of the semiconductive endless plastic belt.

FIG. 7 is an explanatory view showing a method of mounting the semiconductive endless plastic belt on a test device.

FIG. 8 is an explanatory view showing a method of mounting the semiconductive endless plastic belt on a test device.

FIG. 9 is a schematic explanatory view showing another embodiment of the method for testing a semiconductive endless plastic belt of the present invention.

FIG. 10 is a schematic explanatory view showing still another embodiment of the method for testing a semiconductive endless plastic belt of the present invention.

FIG. 11 is a chart showing current values in the circumferential direction of the belt.

FIG. 12 is a schematic explanatory view showing a modification of the arrangement of the electrodes.

FIG. 13 is a schematic explanatory view showing a modification of the arrangement of the electrodes.

FIG. 14 is a schematic explanatory view showing a modification of the arrangement of the electrodes.

FIG. 15 is a configuration diagram showing a copying mechanism of the electrophotographic copying machine.

[Explanation of symbols]

 B Semi-conductive endless plastic belt 30 Insulation stand

 ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G028 AA01 BC01 CG02 DH03 HM10 HN09 JP02 2G036 AA03 BA28 2G060 AA08 AA20 AF07 AG11 HE01 2H032 AA15 BA09 BA18

Claims (2)

[Claims] In a state where both the positive and negative electrodes are in contact with the surface of the semiconductive endless plastic belt, while moving both the electrodes and the semiconductive endless plastic belt relatively,
By applying a voltage between the two electrodes and measuring the current flowing through the semiconductive endless plastic belt between the two electrodes, the electrical resistance of the semiconductive endless plastic belt between the two electrodes is calculated. Test method for semiconductive endless plastic belts. 2. The method for testing a semiconductive endless plastic belt according to claim 1, wherein each of the positive and negative electrodes is provided with a rotating body that is rotated by the relative movement between the electrodes and the semiconductive endless plastic belt.