JP2003043517A - Liquid crystal display panel and lighting inspection method therefor - Google Patents

Liquid crystal display panel and lighting inspection method therefor

Info

Publication number
JP2003043517A
JP2003043517A JP2001231588A JP2001231588A JP2003043517A JP 2003043517 A JP2003043517 A JP 2003043517A JP 2001231588 A JP2001231588 A JP 2001231588A JP 2001231588 A JP2001231588 A JP 2001231588A JP 2003043517 A JP2003043517 A JP 2003043517A
Authority
JP
Japan
Prior art keywords
terminal
lead
liquid crystal
crystal display
pitch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001231588A
Other languages
Japanese (ja)
Other versions
JP4803692B2 (en
Inventor
Tojutsu Sai
東術 崔
Tamotsu Fukui
有 福井
Satoshi Takato
聡 高藤
Koichi Fun
孝一 枌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Display Corp
Original Assignee
Kyocera Display Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Display Corp filed Critical Kyocera Display Corp
Priority to JP2001231588A priority Critical patent/JP4803692B2/en
Publication of JP2003043517A publication Critical patent/JP2003043517A/en
Application granted granted Critical
Publication of JP4803692B2 publication Critical patent/JP4803692B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PROBLEM TO BE SOLVED: To make it possible to confirm the presence or absence of positional deviation by a contact state of an actual probe. SOLUTION: To perform lighting inspection of a liquid crystal display panel 1 provided with a group of lead terminals 12 including a plurality of lead terminals 11 on a terminal part 10, the terminal part 10 is provided with a pairs of dummy terminals 141 for detecting the deviation, which are arranged at the same pitch as the minimum terminal pitch in the lead terminal group 12 and have the minimum terminal width in the lead terminal group 12 and are continuous with each other, on both sides of the lead terminal group 12 with a distance spaced by an integral multiple of the minimum terminal pitch; each pair of current probe pins 24a, 24b; 24c, 24d corresponding to the dummy terminals 141, 141 is arranged on a probe head 22 side; a continuity check current is made to flow across the current probe pins 24a, 24b; 24c, 24d before applying lighting voltage to each of the lead terminal 11; and the presence or absence of the positional deviation is detected by the continuity or discontinuity.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、液晶表示パネルお
よびその点灯検査方法に関し、さらに詳しく言えば、端
子部に形成されている各リード端子にプローブピンを同
時に接触させて点灯電圧を印加する際のリード端子とプ
ローブピン間の位置ずれ検出技術に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display panel and a lighting inspection method for the same, and more particularly, when a probe pin is simultaneously brought into contact with each lead terminal formed in a terminal portion to apply a lighting voltage. The present invention relates to a technology for detecting the positional deviation between the lead terminal and the probe pin.

【0002】[0002]

【従来の技術】どの製品でも同じく組み立て後に最終な
性能検査が行われるが、液晶表示パネルの場合には点灯
検査がそれに該当する。液晶表示パネルの点灯検査は、
端子部に形成されているリード端子にチェックユニット
のプローブピンを接触させて所定の点灯電圧を印加し、
その点灯状態によって透明電極の断線もしくは短絡の有
無を検査する。
2. Description of the Related Art A final performance inspection is performed on all products after assembly, and in the case of a liquid crystal display panel, a lighting inspection corresponds to that. The lighting inspection of the liquid crystal display panel is
Apply a predetermined lighting voltage by contacting the probe pin of the check unit with the lead terminal formed on the terminal part,
Depending on the lighting state, the transparent electrode is inspected for a wire break or short circuit.

【0003】この点灯検査には、リード端子とプローブ
ピンとの正確な位置合わせが要求される。例えば、TF
T液晶表示パネルにおいては、位置ずれによりリード端
子を間違えて電圧をかけると、その電圧印加のタイミン
グによってはTFTが破壊されることがある。そのため
多くの場合、オートアライメント機構を有する検査装置
が用いられている。
This lighting inspection requires accurate alignment between the lead terminals and the probe pins. For example, TF
In the T liquid crystal display panel, if a lead terminal is mistakenly applied with a voltage due to a positional shift, the TFT may be broken depending on the timing of the voltage application. Therefore, in many cases, an inspection device having an automatic alignment mechanism is used.

【0004】この検査装置によると、液晶表示パネルに
設けられているアライメントマークをCCDカメラにて
撮像し、その撮像信号を画像処理ユニットで処理して液
晶表示パネルのリード端子位置を特定する。そして、そ
の位置データに基づいてプローブピンもしくはパネルの
いずれかを移動させて、リード端子とプローブピンとを
位置合わせする。
According to this inspection apparatus, the alignment mark provided on the liquid crystal display panel is imaged by the CCD camera, and the image signal is processed by the image processing unit to specify the lead terminal position of the liquid crystal display panel. Then, either the probe pin or the panel is moved based on the position data to align the lead terminal and the probe pin.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記の
オートアライメント機構を有する検査装置を含めて従来
の検査装置は、位置合わせ後において、最終的に位置合
わせ状態を確認する手段を備えていないため、信頼性に
欠ける嫌いがあった。
However, since the conventional inspection apparatus including the inspection apparatus having the above-mentioned auto-alignment mechanism does not have means for finally confirming the alignment state after alignment, There was a dislike of lack of reliability.

【0006】本発明は、上記課題を解決するためになさ
れたもので、その目的は、リード端子に点灯電圧を印加
するに先だって、リード端子とプローブピンの位置合わ
せ状態を、実際にプローブピンを接触させた状態で確実
に検出することができる信頼性の高い液晶表示パネルの
点灯検査方法を提供することにある。また、本発明の別
の目的は、リード端子とプローブピンの位置合わせ状態
を確実に検出することができる信頼性の高いずれ検出用
のダミー端子を備えた液晶表示パネルを提供することに
ある。
The present invention has been made in order to solve the above-mentioned problems, and its purpose is to check the alignment state between the lead terminal and the probe pin before actually applying a lighting voltage to the lead terminal. An object of the present invention is to provide a highly reliable lighting inspection method for a liquid crystal display panel that can be surely detected in a contact state. Another object of the present invention is to provide a liquid crystal display panel provided with a highly reliable dummy terminal for detection, which is capable of surely detecting the alignment state of the lead terminal and the probe pin.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、本願の第1発明は、端子部に所定のピッチで配列さ
れた複数本のリード端子を含むリード端子群を備えてい
る液晶表示パネルを検査対象とし、上記リード端子の各
々に電圧プローブピンを接触させてチェックユニットよ
り上記液晶表示パネルに所定の点灯電圧を印加してその
点灯状態を検査する液晶表示パネルの点灯検査方法にお
いて、上記端子部に、ピッチが上記リード端子群内の最
小端子ピッチと同一、かつ、端子幅が上記リード端子群
内の最小端子幅と同一であって、互いに導通するパター
ンとして形成されたずれ検出用の一対のダミー端子を上
記リード端子群の両側に上記最小端子ピッチの整数倍の
距離を置いて配置するとともに、上記電圧プローブピン
を保持するプローブヘッド側に、上記ダミー端子を介し
て導通チェック電流を流す各一対の電流プローブピンを
設け、上記電圧プローブピンおよび上記電流プローブピ
ンを上記端子部に接触させたのち、上記電圧プローブピ
ンから上記リード端子の各々に上記点灯電圧を印加する
に先だって、上記電流プローブピン間に導通チェック電
流を流し、その導通・非導通により、上記電圧プローブ
ピンと上記リード端子との間の位置ずれの有無を検出す
ることを特徴としている。
In order to achieve the above object, the first invention of the present application is a liquid crystal display panel having a lead terminal group including a plurality of lead terminals arranged in a terminal portion at a predetermined pitch. In the lighting inspection method of a liquid crystal display panel, in which a voltage probe pin is brought into contact with each of the lead terminals and a predetermined lighting voltage is applied from the check unit to the liquid crystal display panel to inspect its lighting state, In the terminal portion, the pitch is the same as the minimum terminal pitch in the lead terminal group, the terminal width is the same as the minimum terminal width in the lead terminal group, and for the deviation detection formed as a mutually conductive pattern. A probe having a pair of dummy terminals arranged on both sides of the lead terminal group with a distance that is an integral multiple of the minimum terminal pitch and holding the voltage probe pin. On the battery side, each pair of current probe pins for flowing a conduction check current through the dummy terminal is provided, and after the voltage probe pin and the current probe pin are brought into contact with the terminal portion, the voltage probe pin is used to Prior to applying the lighting voltage to each of the lead terminals, a continuity check current is passed between the current probe pins, and the presence / absence of displacement between the voltage probe pin and the lead terminal is detected by the conduction / non-conduction. It is characterized by doing.

【0008】本発明において、ずれ検出用の一対のダミ
ー端子は導通していれば、その導通箇所はどこでもよい
が、電流プローブピンの配設位置精度を考慮してリード
端子と同じく短冊状であることが好ましく、また誤判定
をなくすためには、互いに導通するU字状(もしくは逆
U字状)パターンがよい。
In the present invention, as long as the pair of dummy terminals for detecting the deviation are conductive, the conductive portions may be at any positions, but in consideration of the position accuracy of the current probe pin, they are strip-shaped like the lead terminals. It is preferable that a U-shaped (or inverted U-shaped) pattern that conducts each other is preferable in order to eliminate erroneous determination.

【0009】また、本願の第2発明は、端子部に所定の
ピッチで配列された複数本のリード端子を含むリード端
子群を備えている液晶表示パネルにおいて、上記端子部
には、ピッチが上記リード端子群内の最小端子ピッチと
同一、かつ、端子幅が上記リード端子群内の最小端子幅
と同一であって、互いに導通するパターンとして形成さ
れた一対のずれ検出用のダミー端子が、上記リード端子
群の両側に上記最小端子ピッチの整数倍の距離を置いて
配置されていることを特徴としている。
A second invention of the present application is a liquid crystal display panel comprising a lead terminal group including a plurality of lead terminals arranged in a terminal portion at a predetermined pitch, wherein the terminal portion has the pitch described above. A pair of dummy terminals for deviation detection, which are the same as the minimum terminal pitch in the lead terminal group and have the same terminal width as the minimum terminal width in the lead terminal group, and which are formed as patterns that conduct each other, It is characterized in that the lead terminals are arranged on both sides of the lead terminal group at a distance of an integral multiple of the minimum terminal pitch.

【0010】[0010]

【発明の実施の形態】次に、図面を参照して、本発明の
実施形態について説明する。図1に液晶表示パネル1の
端子部10の構成を示し、図2に端子部10と点灯検査
装置であるチェックユニット20との相対位置関係を示
す。
BEST MODE FOR CARRYING OUT THE INVENTION Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows the configuration of the terminal portion 10 of the liquid crystal display panel 1, and FIG. 2 shows the relative positional relationship between the terminal portion 10 and the check unit 20 which is a lighting inspection device.

【0011】端子部10には、複数本のリード端子11
を含むリード端子群12が設けられており、各リード端
子11は、液晶表示パネル1内の図示しない透明電極に
接続されている。各リード端子11は、透明電極と同じ
くITO(インジウム・錫酸化物)よりなり、短冊状パ
ターンとして形成されている。
The terminal portion 10 includes a plurality of lead terminals 11
Is provided, and each lead terminal 11 is connected to a transparent electrode (not shown) in the liquid crystal display panel 1. Each lead terminal 11 is made of ITO (indium tin oxide) like the transparent electrode, and is formed as a strip pattern.

【0012】この実施形態において、各リード端子11
の端子間ピッチおよび端子幅はともに同一とされている
が、そのいずれか一方もしくは双方が異なっている場合
も、本発明の検査対象に含まれる。
In this embodiment, each lead terminal 11
Although the inter-terminal pitch and the terminal width are the same, the case where any one or both of them is different is also included in the inspection object of the present invention.

【0013】リード端子群12の両側には、ずれ検出部
14,14が設けられている。このずれ検出部14,1
4は同一構成であるため、その一方について説明する
と、ずれ検出部14は、一対のダミー端子141,14
1を備えている。
Displacement detectors 14 and 14 are provided on both sides of the lead terminal group 12. This deviation detection unit 14, 1
Since 4 has the same configuration, one of them will be described. The deviation detecting unit 14 includes a pair of dummy terminals 141 and 14
1 is provided.

【0014】ダミー端子141,141は、リード端子
11と同じくITOにより短冊状に形成されているとと
もに、短絡パターン142にて互いに導通されている。
この実施形態において、短絡パターン142は、ダミー
端子141,141の各一端側に配置されている。これ
により、ずれ検出部14は全体してU字状パターンを呈
している。
Like the lead terminals 11, the dummy terminals 141 and 141 are made of ITO in a strip shape and are electrically connected to each other by a short circuit pattern 142.
In this embodiment, the short circuit pattern 142 is arranged on one end side of each of the dummy terminals 141 and 141. As a result, the shift detection unit 14 has a U-shaped pattern as a whole.

【0015】短絡パターン142は、端子部10の基端
部側(パネル表示部側)に配置され、かつ、その線幅W
2は基端部から0.5mm以下であることが好ましい。
なお、変形例の一つとして、短絡パターン142をダミ
ー端子141,141の中央に配置して、ずれ検出部1
4をH字状パターンとしてもよい。
The short circuit pattern 142 is arranged on the base end side (panel display side) of the terminal portion 10 and has a line width W.
2 is preferably 0.5 mm or less from the base end.
As a modification, the short-circuit pattern 142 is arranged in the center of the dummy terminals 141 and 141, and the shift detection unit 1
4 may be an H-shaped pattern.

【0016】ダミー端子141,141の端子幅W1
は、リード端子11の端子幅と同一幅である。なお、リ
ード端子群12に異なる端子幅のリード端子が含まれる
場合には、その中の最小端子幅と同一とされる。
The terminal width W1 of the dummy terminals 141 and 141
Is the same width as the terminal width of the lead terminal 11. When the lead terminal group 12 includes lead terminals having different terminal widths, the lead terminal group 12 has the same width as the minimum terminal width.

【0017】また、ダミー端子141,141間のピッ
チP1は、リード端子11,11間のピッチと同一であ
る。なお、リード端子群12に異なるピッチのリード端
子が含まれる場合には、その中の最小端子ピッチと同一
とされる。
The pitch P1 between the dummy terminals 141 and 141 is the same as the pitch between the lead terminals 11 and 11. When the lead terminal group 12 includes lead terminals having different pitches, the minimum terminal pitch among them is the same.

【0018】ずれ検出部14とリード端子群12との間
の距離Lも、本発明にとって重要な要素である。すなわ
ち、この距離Lは、リード端子11,11間のピッチ
(リード端子群12に異なるピッチのリード端子が含ま
れる場合には、その中の最小端子ピッチ)の整数倍に設
定される。
The distance L between the deviation detecting portion 14 and the lead terminal group 12 is also an important factor for the present invention. That is, this distance L is set to an integral multiple of the pitch between the lead terminals 11 and 11 (the minimum terminal pitch among the lead terminals when the lead terminal group 12 includes lead terminals having different pitches).

【0019】なお、整数倍であることを条件として、リ
ード端子群12に対する図1の右側ずれ検出部14と左
側ずれ検出部14の各距離Lを異ならせてもよい。例え
ば、図1の右側ずれ検出部14の距離Lを端子間ピッチ
の2倍とし、左側ずれ検出部14の距離Lを端子間ピッ
チの3倍としてもよい。
It should be noted that the distance L between the right-side deviation detection unit 14 and the left-side deviation detection unit 14 in FIG. 1 with respect to the lead terminal group 12 may be different, provided that the distance is an integral multiple. For example, the distance L of the right side deviation detection unit 14 in FIG. 1 may be twice the pitch between terminals, and the distance L of the left side deviation detection unit 14 may be three times the pitch between terminals.

【0020】図2を参照して、チェックユニット20
は、測定部21とプローブヘッド22とを備えている。
プローブヘッド22は、図示しない駆動手段により端子
部10に対して接近・離反するように動かされる。
Referring to FIG. 2, the check unit 20
Includes a measuring unit 21 and a probe head 22.
The probe head 22 is moved so as to move toward and away from the terminal portion 10 by a driving unit (not shown).

【0021】プローブヘッド22には、各リード端子1
1に対応して配置された点灯電圧印加用の電圧プローブ
23と、ずれ検出部14に対応して配置され、その各ダ
ミー端子141,141を介して導通チェック電流を流
す各一対の電流プローブピン24a,24b;24c,
24dとが設けられている。
Each lead terminal 1 is attached to the probe head 22.
The voltage probe 23 for applying the lighting voltage arranged corresponding to No. 1 and the pair of current probe pins arranged corresponding to the deviation detecting unit 14 and flowing the conduction check current through each dummy terminal 141, 141 thereof. 24a, 24b; 24c,
24d is provided.

【0022】この実施形態において、測定部21は、導
通チェック用の電源である電池25を有し、この電池2
5の例えば正極側には、対をなす内のそれぞれ一方の電
流プローブピン24aと電流プローブピン25dとがス
イッチ26を介して接続されている。
In this embodiment, the measuring unit 21 has a battery 25 as a power source for continuity check.
One of the pair of current probe pins 24 a and 25 d of current probe pins is connected to the positive electrode side of 5 via a switch 26.

【0023】対をなすそれぞれ他方の電流プローブピン
24bと電流プローブピン25cは、アンド回路27の
入力側に接続され、アンド回路27の出力側は図示しな
い判定部に接続されている。なお、電圧プローブ23に
対する点灯電圧制御回路は本発明の要旨でないため、そ
の図示を省略している。
The other current probe pin 24b and the current probe pin 25c forming a pair are connected to the input side of the AND circuit 27, and the output side of the AND circuit 27 is connected to a determination unit (not shown). The lighting voltage control circuit for the voltage probe 23 is not shown because it is not the subject matter of the present invention.

【0024】次に、本発明の動作について説明する。例
えば、液晶表示パネル10が図示しない位置合わせ用の
X−Y移動テーブルに載置され、オートアライメント機
構などにより位置合わせが終了すると、本発明の点灯検
査が行われる。
Next, the operation of the present invention will be described. For example, when the liquid crystal display panel 10 is placed on an XY moving table for alignment (not shown) and the alignment is completed by an auto alignment mechanism or the like, the lighting inspection of the present invention is performed.

【0025】まず、プローブヘッド22を下降させてす
べてのプローブピン23,24を端子部10に接触させ
る。そして、電圧プローブピン23から各リード端子1
1に点灯電圧を印加する前に、スイッチ26をオンして
電流プローブピン24aと電流プローブピン25dとに
電圧を加える。
First, the probe head 22 is lowered to bring all the probe pins 23 and 24 into contact with the terminal portion 10. Then, from the voltage probe pin 23 to each lead terminal 1
Before applying the lighting voltage to No. 1, the switch 26 is turned on to apply a voltage to the current probe pin 24a and the current probe pin 25d.

【0026】このとき、電流プローブピン24a,24
b;24c,24dの各々が、ずれ検出部14のダミー
端子141,141に接触していれば、電流プローブピ
ン24a,24b間および電流プローブピン24c,2
4d間に電流が流れ、アンド回路27の各入力側「H」
となるため、アンド回路27の出力が「H」となる。
At this time, the current probe pins 24a, 24
b; if each of 24c and 24d is in contact with the dummy terminals 141 and 141 of the deviation detection unit 14, between the current probe pins 24a and 24b and between the current probe pins 24c and 2
Current flows between 4d and each input side of the AND circuit 27 is "H"
Therefore, the output of the AND circuit 27 becomes "H".

【0027】これにより、判定部にて位置ずれ「なし
(OK)」と判定され、次のステップとして電圧プロー
ブピン23から各リード端子11に点灯電圧が印加され
る。スイッチ26をオンしても、アンド回路27の出力
が「L」のままであると、判定部にて位置ずれ「あり
(NG)」と判定され、例えばブザーなどにより警告が
発せられる。
As a result, the determination section determines that the positional deviation is “none (OK)”, and as a next step, the lighting voltage is applied from the voltage probe pin 23 to each lead terminal 11. If the output of the AND circuit 27 remains "L" even when the switch 26 is turned on, the determination unit determines that the positional deviation is "present (NG)", and a warning is issued by, for example, a buzzer.

【0028】このように、本発明によれば、点灯電圧を
印加する前に位置ずれの有無を実際のプローブの接触状
態で確認できるため、信頼性の高い点灯検査を行うこと
ができる。特に、TFTパネルの場合、間違った電圧印
加によるTFTの破壊を防止できるので好適である。
As described above, according to the present invention, since it is possible to confirm the presence or absence of the positional deviation in the actual contact state of the probe before applying the lighting voltage, it is possible to perform a highly reliable lighting inspection. In particular, in the case of a TFT panel, it is possible to prevent destruction of the TFT due to wrong voltage application, which is preferable.

【0029】なお、本明細書において、点灯電圧を印加
するプローブピンを電圧プローブピン、導通チェック用
のプローブピンを電流プローブピンとしているが、これ
は説明の都合上のものであって、実際には同じプローブ
ピンが用いられている。
In the present specification, the probe pin for applying the lighting voltage is a voltage probe pin and the probe pin for continuity check is a current probe pin. However, this is for convenience of description, and actually. Use the same probe pin.

【0030】[0030]

【発明の効果】以上説明したように、本発明によれば、
端子部に複数本のリード端子を含むリード端子群を備え
ている液晶表示パネルを点灯検査するにあたって、端子
部にピッチがリード端子群内の最小端子ピッチと同一、
かつ、端子幅がリード端子群内の最小端子幅と同一であ
って、互いに導通している一対のずれ検出用のダミー端
子をリード端子群の両側に最小端子ピッチの整数倍の距
離を置いて配置するとともに、プローブヘッド側にダミ
ー端子を介して導通チェック電流を流す各一対の電流プ
ローブピンを設け、リード端子の各々に点灯電圧を印加
する前に、電流プローブピン間に導通チェック電流を流
し、その導通・非導通により、位置ずれの有無を検出す
るようにしたことにより、信頼性の高い液晶表示パネル
の点灯検査を行うことができる。
As described above, according to the present invention,
In the lighting inspection of a liquid crystal display panel having a lead terminal group including a plurality of lead terminals in the terminal portion, the pitch of the terminal portion is the same as the minimum terminal pitch in the lead terminal group,
In addition, the pair of dummy terminals for deviation detection, which have the same terminal width as the minimum terminal width in the lead terminal group and are electrically connected to each other, are arranged on both sides of the lead terminal group at an integer multiple of the minimum terminal pitch. The probe head side is equipped with a pair of current probe pins that allow conduction check current to flow through the dummy terminals, and a conduction check current is applied between the current probe pins before applying the lighting voltage to each lead terminal. Since the presence / absence of the positional deviation is detected by the conduction / non-conduction, it is possible to perform a highly reliable lighting inspection of the liquid crystal display panel.

【0031】また、本発明によれば、リード端子とプロ
ーブピンの位置合わせ状態を確実に検出することができ
る信頼性の高いずれ検出用のダミー端子を備えた液晶表
示パネルが提供される。
Further, according to the present invention, there is provided a liquid crystal display panel provided with a dummy terminal for highly reliable detection capable of surely detecting the alignment state of the lead terminal and the probe pin.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施形態に係る液晶表示パネルの端子
部を示した要部平面図。
FIG. 1 is a plan view of an essential part showing a terminal portion of a liquid crystal display panel according to an embodiment of the present invention.

【図2】上記液晶表示パネルとチェックユニットの相対
位置関係を示す説明図。
FIG. 2 is an explanatory diagram showing a relative positional relationship between the liquid crystal display panel and a check unit.

【符号の説明】[Explanation of symbols]

1 液晶表示パネル 10 端子部 11 リード端子 12 リード端子群 14 ずれ検出部 141 ダミー端子 142 短絡パターン 20 チェックユニット 21 測定部 22 プローブヘッド 23 電圧プローブピン 24a〜24d 電流プローブピン 1 Liquid crystal display panel 10 terminals 11 Lead terminal 12 lead terminal group 14 Deviation detection unit 141 dummy terminal 142 short circuit pattern 20 check units 21 Measuring unit 22 Probe head 23 Voltage probe pin 24a-24d Current probe pin

フロントページの続き (72)発明者 高藤 聡 兵庫県尼崎市上坂部1丁目2番1号 オプ トレックス株式会社尼崎工場内 (72)発明者 枌 孝一 兵庫県尼崎市上坂部1丁目2番1号 オプ トレックス株式会社尼崎工場内 Fターム(参考) 2G011 AA02 AA15 AC06 AE01 AF07 2H088 FA13 MA20 2H092 GA32 GA40 JB77 MA57 NA29 NA30 Continued front page    (72) Inventor Satoshi Takafuji             1-2-1, Kamisakabe, Amagasaki-shi, Hyogo Op             Trex Co., Ltd. Amagasaki factory (72) Inventor Koichi Baku             1-2-1, Kamisakabe, Amagasaki-shi, Hyogo Op             Trex Co., Ltd. Amagasaki factory F-term (reference) 2G011 AA02 AA15 AC06 AE01 AF07                 2H088 FA13 MA20                 2H092 GA32 GA40 JB77 MA57 NA29                       NA30

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 端子部に所定のピッチで配列された複数
本のリード端子を含むリード端子群を備えている液晶表
示パネルを検査対象とし、上記リード端子の各々に電圧
プローブピンを接触させてチェックユニットより上記液
晶表示パネルに所定の点灯電圧を印加してその点灯状態
を検査する液晶表示パネルの点灯検査方法において、 上記端子部に、ピッチが上記リード端子群内の最小端子
ピッチと同一、かつ、端子幅が上記リード端子群内の最
小端子幅と同一であって、互いに導通するパターンとし
て形成されたずれ検出用の一対のダミー端子を上記リー
ド端子群の両側に上記最小端子ピッチの整数倍の距離を
置いて配置するとともに、 上記電圧プローブピンを保持するプローブヘッド側に、
上記ダミー端子を介して導通チェック電流を流す各一対
の電流プローブピンを設け、 上記電圧プローブピンおよび上記電流プローブピンを上
記端子部に接触させたのち、上記電圧プローブピンから
上記リード端子の各々に上記点灯電圧を印加するに先だ
って、上記電流プローブピン間に導通チェック電流を流
し、その導通・非導通により、上記電圧プローブピンと
上記リード端子との間の位置ずれの有無を検出すること
を特徴とする液晶表示パネルの点灯検査方法。
1. A liquid crystal display panel having a lead terminal group including a plurality of lead terminals arranged at a predetermined pitch in a terminal portion is an object to be inspected, and a voltage probe pin is brought into contact with each of the lead terminals. In a lighting inspection method for a liquid crystal display panel, wherein a predetermined lighting voltage is applied to the liquid crystal display panel from a check unit to inspect its lighting state, a pitch is the same as the minimum terminal pitch in the lead terminal group in the terminal portion, And, the terminal width is the same as the minimum terminal width in the lead terminal group, and a pair of dummy terminals for deviation detection, which are formed as conductive patterns, are formed on both sides of the lead terminal group and are integers of the minimum terminal pitch. While arranging with a double distance, on the probe head side that holds the voltage probe pin,
Providing a pair of current probe pins for flowing a conduction check current through the dummy terminals, and after contacting the voltage probe pin and the current probe pin to the terminal portion, from the voltage probe pin to each of the lead terminals Prior to applying the lighting voltage, a continuity check current is passed between the current probe pins, and the presence / absence of a position deviation between the voltage probe pin and the lead terminal is detected by the conduction / non-conduction. Lighting inspection method for liquid crystal display panels.
【請求項2】 上記一対のダミー端子が、互いに導通す
るU字状パターンとして形成されている請求項1に記載
の液晶表示パネルの点灯検査方法。
2. The lighting inspection method for a liquid crystal display panel according to claim 1, wherein the pair of dummy terminals are formed as a U-shaped pattern that is electrically connected to each other.
【請求項3】 端子部に所定のピッチで配列された複数
本のリード端子を含むリード端子群を備えている液晶表
示パネルにおいて、 上記端子部には、ピッチが上記リード端子群内の最小端
子ピッチと同一、かつ、端子幅が上記リード端子群内の
最小端子幅と同一であって、互いに導通するパターンと
して形成された一対のずれ検出用のダミー端子が、上記
リード端子群の両側に上記最小端子ピッチの整数倍の距
離を置いて配置されていることを特徴とする液晶表示パ
ネル。
3. A liquid crystal display panel comprising a lead terminal group including a plurality of lead terminals arranged at a predetermined pitch in the terminal portion, wherein the terminal portion has the smallest pitch in the lead terminal group. A pair of dummy terminals for deviation detection, which have the same pitch and the same terminal width as the minimum terminal width in the lead terminal group and which are formed as a pattern electrically connected to each other, are provided on both sides of the lead terminal group. A liquid crystal display panel, which is arranged at a distance that is an integral multiple of the minimum terminal pitch.
JP2001231588A 2001-07-31 2001-07-31 LCD panel lighting inspection method Expired - Fee Related JP4803692B2 (en)

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JP2005062354A (en) * 2003-08-08 2005-03-10 Seiko Epson Corp Electro-optical panel, electro-optical apparatus, and electronic equipment
JP2006276115A (en) * 2005-03-28 2006-10-12 Sanyo Epson Imaging Devices Corp Liquid crystal module
CN100339881C (en) * 2003-06-04 2007-09-26 友达光电股份有限公司 Driving IC sealing assembly of liquid-crystal displaying device
JP2008007008A (en) * 2006-06-30 2008-01-17 Yokohama Rubber Co Ltd:The Pneumatic tire
US7636146B2 (en) * 2003-08-08 2009-12-22 Seiko Epson Corporation Electro-optical panel, system with terminals having different corresponding characteristics
CN102790305A (en) * 2011-05-18 2012-11-21 无锡夏普电子元器件有限公司 Connecting device and connecting method for evaluation
CN105785607A (en) * 2016-03-31 2016-07-20 京东方科技集团股份有限公司 Display substrate, light-on equipment and detection method of light-on test pin alignment
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60237431A (en) * 1984-05-10 1985-11-26 Optrex Corp Positioning method of display cell
JPH0643473A (en) * 1992-07-24 1994-02-18 Sanyo Electric Co Ltd Liquid crystal display device
JP2000047164A (en) * 1998-07-27 2000-02-18 Sharp Corp Method and device of inspecting liquid crystal display device
JP2000250435A (en) * 1999-03-04 2000-09-14 Tohoku Pioneer Corp Display device, display panel, and driving circuit for display panel

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60237431A (en) * 1984-05-10 1985-11-26 Optrex Corp Positioning method of display cell
JPH0643473A (en) * 1992-07-24 1994-02-18 Sanyo Electric Co Ltd Liquid crystal display device
JP2000047164A (en) * 1998-07-27 2000-02-18 Sharp Corp Method and device of inspecting liquid crystal display device
JP2000250435A (en) * 1999-03-04 2000-09-14 Tohoku Pioneer Corp Display device, display panel, and driving circuit for display panel

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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JP2005062354A (en) * 2003-08-08 2005-03-10 Seiko Epson Corp Electro-optical panel, electro-optical apparatus, and electronic equipment
US7636146B2 (en) * 2003-08-08 2009-12-22 Seiko Epson Corporation Electro-optical panel, system with terminals having different corresponding characteristics
JP2006276115A (en) * 2005-03-28 2006-10-12 Sanyo Epson Imaging Devices Corp Liquid crystal module
JP4661300B2 (en) * 2005-03-28 2011-03-30 エプソンイメージングデバイス株式会社 LCD module
JP2008007008A (en) * 2006-06-30 2008-01-17 Yokohama Rubber Co Ltd:The Pneumatic tire
CN102790305A (en) * 2011-05-18 2012-11-21 无锡夏普电子元器件有限公司 Connecting device and connecting method for evaluation
CN105785607A (en) * 2016-03-31 2016-07-20 京东方科技集团股份有限公司 Display substrate, light-on equipment and detection method of light-on test pin alignment
US10670629B2 (en) 2016-03-31 2020-06-02 Boe Technology Group Co., Ltd. Display substrate, light-on device and method for testing alignment of light-on testing pin
CN107463014A (en) * 2017-09-26 2017-12-12 武汉华星光电技术有限公司 Array base palte and array base palte test structure
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