JP2003043119A - パラレルスキャンテストソフトウェア - Google Patents

パラレルスキャンテストソフトウェア

Info

Publication number
JP2003043119A
JP2003043119A JP2002099870A JP2002099870A JP2003043119A JP 2003043119 A JP2003043119 A JP 2003043119A JP 2002099870 A JP2002099870 A JP 2002099870A JP 2002099870 A JP2002099870 A JP 2002099870A JP 2003043119 A JP2003043119 A JP 2003043119A
Authority
JP
Japan
Prior art keywords
scan
parallel
test
data
tree
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002099870A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003043119A5 (cg-RX-API-DMAC7.html
Inventor
W Terry Steven
スティーブン・ダブリュー・テリー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2003043119A publication Critical patent/JP2003043119A/ja
Publication of JP2003043119A5 publication Critical patent/JP2003043119A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G01R31/318563—Multiple simultaneous testing of subparts

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2002099870A 2001-04-11 2002-04-02 パラレルスキャンテストソフトウェア Withdrawn JP2003043119A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/834,023 US6742152B2 (en) 2001-04-11 2001-04-11 Parallel scan test software
US09/834023 2001-04-11

Publications (2)

Publication Number Publication Date
JP2003043119A true JP2003043119A (ja) 2003-02-13
JP2003043119A5 JP2003043119A5 (cg-RX-API-DMAC7.html) 2005-09-15

Family

ID=25265904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002099870A Withdrawn JP2003043119A (ja) 2001-04-11 2002-04-02 パラレルスキャンテストソフトウェア

Country Status (2)

Country Link
US (1) US6742152B2 (cg-RX-API-DMAC7.html)
JP (1) JP2003043119A (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006201088A (ja) * 2005-01-21 2006-08-03 Canon Inc 集積回路とその検査装置および検査方法
CN103487747A (zh) * 2013-09-30 2014-01-01 桂林电子科技大学 符合边界扫描标准的扫描子链型测试结构及测试方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7020699B2 (en) * 2001-09-11 2006-03-28 Sun Microsystems, Inc. Test result analyzer in a distributed processing framework system and methods for implementing the same
US7009625B2 (en) * 2003-03-11 2006-03-07 Sun Microsystems, Inc. Method of displaying an image of device test data
US20060242508A1 (en) * 2005-04-26 2006-10-26 Texas Instruments Incorporation Simultaneous scan testing for identical modules
US8914673B2 (en) * 2012-02-20 2014-12-16 Microsoft Corporation Distributed testing within a serial testing infrastructure
US11393195B2 (en) 2019-10-07 2022-07-19 Fortress Cyber Security, LLC Systems and methods for augmented reality inventory tracking
US20260086907A1 (en) * 2024-09-20 2026-03-26 L&T Technology Services Limited Artificial intelligence based automated testing and early failure prediction system and method thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4602210A (en) * 1984-12-28 1986-07-22 General Electric Company Multiplexed-access scan testable integrated circuit
WO1997021107A1 (en) * 1995-12-05 1997-06-12 Atg Technology, Inc. Partial scan logic

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006201088A (ja) * 2005-01-21 2006-08-03 Canon Inc 集積回路とその検査装置および検査方法
CN103487747A (zh) * 2013-09-30 2014-01-01 桂林电子科技大学 符合边界扫描标准的扫描子链型测试结构及测试方法

Also Published As

Publication number Publication date
US6742152B2 (en) 2004-05-25
US20020152438A1 (en) 2002-10-17

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