JP2003043119A5 - - Google Patents

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Publication number
JP2003043119A5
JP2003043119A5 JP2002099870A JP2002099870A JP2003043119A5 JP 2003043119 A5 JP2003043119 A5 JP 2003043119A5 JP 2002099870 A JP2002099870 A JP 2002099870A JP 2002099870 A JP2002099870 A JP 2002099870A JP 2003043119 A5 JP2003043119 A5 JP 2003043119A5
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JP
Japan
Prior art keywords
parallel
scan
target system
tree
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002099870A
Other languages
English (en)
Japanese (ja)
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JP2003043119A (ja
Filing date
Publication date
Priority claimed from US09/834,023 external-priority patent/US6742152B2/en
Application filed filed Critical
Publication of JP2003043119A publication Critical patent/JP2003043119A/ja
Publication of JP2003043119A5 publication Critical patent/JP2003043119A5/ja
Withdrawn legal-status Critical Current

Links

JP2002099870A 2001-04-11 2002-04-02 パラレルスキャンテストソフトウェア Withdrawn JP2003043119A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/834,023 US6742152B2 (en) 2001-04-11 2001-04-11 Parallel scan test software
US09/834023 2001-04-11

Publications (2)

Publication Number Publication Date
JP2003043119A JP2003043119A (ja) 2003-02-13
JP2003043119A5 true JP2003043119A5 (cg-RX-API-DMAC7.html) 2005-09-15

Family

ID=25265904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002099870A Withdrawn JP2003043119A (ja) 2001-04-11 2002-04-02 パラレルスキャンテストソフトウェア

Country Status (2)

Country Link
US (1) US6742152B2 (cg-RX-API-DMAC7.html)
JP (1) JP2003043119A (cg-RX-API-DMAC7.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7020699B2 (en) * 2001-09-11 2006-03-28 Sun Microsystems, Inc. Test result analyzer in a distributed processing framework system and methods for implementing the same
US7009625B2 (en) * 2003-03-11 2006-03-07 Sun Microsystems, Inc. Method of displaying an image of device test data
JP2006201088A (ja) * 2005-01-21 2006-08-03 Canon Inc 集積回路とその検査装置および検査方法
US20060242508A1 (en) * 2005-04-26 2006-10-26 Texas Instruments Incorporation Simultaneous scan testing for identical modules
US8914673B2 (en) * 2012-02-20 2014-12-16 Microsoft Corporation Distributed testing within a serial testing infrastructure
CN103487747B (zh) * 2013-09-30 2016-08-17 桂林电子科技大学 符合边界扫描标准的扫描子链型测试结构及测试方法
US11393195B2 (en) 2019-10-07 2022-07-19 Fortress Cyber Security, LLC Systems and methods for augmented reality inventory tracking
US20260086907A1 (en) * 2024-09-20 2026-03-26 L&T Technology Services Limited Artificial intelligence based automated testing and early failure prediction system and method thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4602210A (en) * 1984-12-28 1986-07-22 General Electric Company Multiplexed-access scan testable integrated circuit
WO1997021107A1 (en) * 1995-12-05 1997-06-12 Atg Technology, Inc. Partial scan logic

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