JP2002534675A5 - - Google Patents

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Publication number
JP2002534675A5
JP2002534675A5 JP2000592621A JP2000592621A JP2002534675A5 JP 2002534675 A5 JP2002534675 A5 JP 2002534675A5 JP 2000592621 A JP2000592621 A JP 2000592621A JP 2000592621 A JP2000592621 A JP 2000592621A JP 2002534675 A5 JP2002534675 A5 JP 2002534675A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000592621A
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Japanese (ja)
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JP2002534675A (ja
JP5346421B2 (ja
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Publication date
Priority claimed from DE19900346A external-priority patent/DE19900346A1/de
Application filed filed Critical
Publication of JP2002534675A publication Critical patent/JP2002534675A/ja
Publication of JP2002534675A5 publication Critical patent/JP2002534675A5/ja
Application granted granted Critical
Publication of JP5346421B2 publication Critical patent/JP5346421B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2000592621A 1999-01-07 2000-01-07 試料分析システムの光学装置及び試料位置の検出方法 Expired - Lifetime JP5346421B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19900346A DE19900346A1 (de) 1999-01-07 1999-01-07 Präzisions-Probendrehvorrichtung
DE19900346.7 1999-01-07
PCT/EP2000/000088 WO2000040952A2 (de) 1999-01-07 2000-01-07 Präzisions-probendrehvorrichtung

Publications (3)

Publication Number Publication Date
JP2002534675A JP2002534675A (ja) 2002-10-15
JP2002534675A5 true JP2002534675A5 (US06573293-20030603-C00009.png) 2007-03-15
JP5346421B2 JP5346421B2 (ja) 2013-11-20

Family

ID=7893714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000592621A Expired - Lifetime JP5346421B2 (ja) 1999-01-07 2000-01-07 試料分析システムの光学装置及び試料位置の検出方法

Country Status (10)

Country Link
US (2) US6621085B1 (US06573293-20030603-C00009.png)
EP (2) EP1144988B1 (US06573293-20030603-C00009.png)
JP (1) JP5346421B2 (US06573293-20030603-C00009.png)
AT (1) ATE279721T1 (US06573293-20030603-C00009.png)
AU (1) AU2106500A (US06573293-20030603-C00009.png)
DE (2) DE19900346A1 (US06573293-20030603-C00009.png)
DK (1) DK1144988T3 (US06573293-20030603-C00009.png)
ES (1) ES2225079T3 (US06573293-20030603-C00009.png)
PT (1) PT1144988E (US06573293-20030603-C00009.png)
WO (1) WO2000040952A2 (US06573293-20030603-C00009.png)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19900346A1 (de) * 1999-01-07 2000-07-13 Europ Lab Molekularbiolog Präzisions-Probendrehvorrichtung
US6404849B1 (en) * 1999-08-11 2002-06-11 Abbott Laboratories Automated sample handling for X-ray crystallography
GB0222334D0 (en) * 2001-10-04 2002-10-30 X Ray Res Gmbh Automatic adjusting method for a goniometer and associated device
US6918698B2 (en) * 2001-12-12 2005-07-19 The Regents Of The University Of California Integrated crystal mounting and alignment system for high-throughput biological crystallography
DE10336110B4 (de) * 2003-08-06 2008-01-03 Proteros Biostructures Gmbh Vorrichtung und Verfahren zum Behandeln eines Proteinkristalls
JP5096747B2 (ja) * 2006-03-02 2012-12-12 株式会社神戸製鋼所 ビーム検出部材およびそれを用いたビーム検出器
DE102009018570B4 (de) * 2009-04-24 2018-12-20 Carl Zeiss Industrielle Messtechnik Gmbh Computertomograph mit einer Werkstückauflage zur Lagerung eines Werkstückes
JP6108674B2 (ja) * 2012-03-16 2017-04-05 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置及び試料搬送装置
US9613728B2 (en) * 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
DE102015118017B4 (de) * 2015-10-22 2017-06-08 Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh Drehmodul für eine Beschleunigeranlage
CN113877699B (zh) * 2021-09-28 2024-01-23 上海金自天正信息技术有限公司 自动破碎装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH595945A5 (US06573293-20030603-C00009.png) * 1975-06-06 1978-02-28 Robert Habib
CA1257714A (en) 1985-11-12 1989-07-18 Michael Goldowsky Goniometer
DE3546095A1 (de) * 1985-12-24 1987-06-25 Zeiss Carl Fa Goniometertisch
US4821303A (en) * 1986-12-05 1989-04-11 The Dow Chemical Company Combined thermal analyzer and x-ray diffractometer
JP2533169B2 (ja) * 1988-07-14 1996-09-11 株式会社東芝 X線回折装置
JPH0235343A (ja) * 1988-07-26 1990-02-05 Rigaku Corp 微小領域x線回折装置及びその試料セッティング方法
JP2857406B2 (ja) * 1989-03-10 1999-02-17 住友重機械工業株式会社 荷電粒子ビームモニタ
JPH02248899A (ja) * 1989-03-22 1990-10-04 Nippon Steel Corp X線の拡大・単色化装置及びこの装置を利用したx線ct装置
JPH06100677B2 (ja) * 1989-05-26 1994-12-12 株式会社島津製作所 X線回折装置
JPH0390845A (ja) * 1989-09-01 1991-04-16 Hitachi Ltd 表面分析方法およびその装置
JPH03216537A (ja) * 1990-01-22 1991-09-24 Rigaku Corp 中性子回折装置のダイレクトビームストッパ位置調節装置
US5434901A (en) * 1992-12-07 1995-07-18 Olympus Optical Co., Ltd. Soft X-ray microscope
JPH0738989U (ja) * 1993-12-22 1995-07-14 アロカ株式会社 放射線ビーム位置決め装置
US6091796A (en) * 1994-11-23 2000-07-18 Thermotrex Corporation Scintillator based microscope
JP3468623B2 (ja) * 1995-08-08 2003-11-17 理学電機株式会社 X線回折装置の光学系切換装置
US5786600A (en) * 1995-12-19 1998-07-28 Eastman Kodak Company (Barium hafnate:Ti, Ce, Pb) phosphors phosphor screens and phosphor preparation methods
JP3263920B2 (ja) * 1996-02-01 2002-03-11 日本電子株式会社 電子顕微鏡用試料作成装置および方法
US5912939A (en) * 1997-02-07 1999-06-15 Hirsch; Gregory Soft x-ray microfluoroscope
DE19726884C1 (de) * 1997-06-24 1998-10-15 Fraunhofer Ges Forschung Fiberoptische Röntgenkamera
US5898179A (en) * 1997-09-10 1999-04-27 Orion Equipment, Inc. Method and apparatus for controlling a workpiece in a vacuum chamber
US6269144B1 (en) * 1998-03-04 2001-07-31 William P. Dube Method and apparatus for diffraction measurement using a scanning x-ray source
JPH11248651A (ja) * 1998-03-04 1999-09-17 Canon Inc 微小領域x線回折装置
DE19900346A1 (de) * 1999-01-07 2000-07-13 Europ Lab Molekularbiolog Präzisions-Probendrehvorrichtung
US6567497B2 (en) * 2001-04-20 2003-05-20 Lockheed Martin Corporation Method and apparatus for inspecting a structure using X-rays

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