JP2002510879A - 静電チャック電源 - Google Patents
静電チャック電源Info
- Publication number
- JP2002510879A JP2002510879A JP2000542796A JP2000542796A JP2002510879A JP 2002510879 A JP2002510879 A JP 2002510879A JP 2000542796 A JP2000542796 A JP 2000542796A JP 2000542796 A JP2000542796 A JP 2000542796A JP 2002510879 A JP2002510879 A JP 2002510879A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- power supply
- current
- chucking
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T279/00—Chucks or sockets
- Y10T279/23—Chucks or sockets with magnetic or electrostatic means
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
- Jigs For Machine Tools (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/054,575 | 1998-04-03 | ||
| US09/054,575 US6198616B1 (en) | 1998-04-03 | 1998-04-03 | Method and apparatus for supplying a chucking voltage to an electrostatic chuck within a semiconductor wafer processing system |
| PCT/US1999/007192 WO1999052144A1 (en) | 1998-04-03 | 1999-03-31 | Electrostatic chuck power supply |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011109948A Division JP5583633B2 (ja) | 1998-04-03 | 2011-05-16 | 静電チャック電源 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002510879A true JP2002510879A (ja) | 2002-04-09 |
| JP2002510879A5 JP2002510879A5 (enExample) | 2009-04-16 |
Family
ID=21992049
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000542796A Pending JP2002510879A (ja) | 1998-04-03 | 1999-03-31 | 静電チャック電源 |
| JP2011109948A Expired - Lifetime JP5583633B2 (ja) | 1998-04-03 | 2011-05-16 | 静電チャック電源 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011109948A Expired - Lifetime JP5583633B2 (ja) | 1998-04-03 | 2011-05-16 | 静電チャック電源 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6198616B1 (enExample) |
| JP (2) | JP2002510879A (enExample) |
| WO (1) | WO1999052144A1 (enExample) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004535039A (ja) * | 2001-06-07 | 2004-11-18 | ラム リサーチ コーポレーション | プラズマ処理装置方法および装置 |
| JP2008156746A (ja) * | 2006-11-30 | 2008-07-10 | Canon Anelva Corp | 電力導入装置及び成膜方法 |
| JP2010010236A (ja) * | 2008-06-25 | 2010-01-14 | Hitachi High-Technologies Corp | プラズマ処理装置及びプラズマ処理方法 |
| JP2013511814A (ja) * | 2009-11-19 | 2013-04-04 | ラム リサーチ コーポレーション | プラズマ処理システムを制御するための方法および装置 |
| JP2014533436A (ja) * | 2011-11-04 | 2014-12-11 | ラム リサーチ コーポレーションLam Research Corporation | 基板クランプシステム及び該システムを動作させるための方法 |
| US9799546B2 (en) | 2015-08-28 | 2017-10-24 | Toshiba Memory Corporation | Semiconductor manufacturing apparatus and method of operating the same |
| JP2021185600A (ja) * | 2016-08-05 | 2021-12-09 | アプライド マテリアルズ インコーポレイテッドApplied Materials, Incorporated | グリーンシートセラミック上へのメタライゼーション材料の、サブミクロン均一性を有する高精度スクリーン印刷 |
Families Citing this family (181)
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| JP3296292B2 (ja) * | 1998-06-26 | 2002-06-24 | 松下電器産業株式会社 | エッチング方法、クリーニング方法、及びプラズマ処理装置 |
| US6361645B1 (en) * | 1998-10-08 | 2002-03-26 | Lam Research Corporation | Method and device for compensating wafer bias in a plasma processing chamber |
| US6430022B2 (en) * | 1999-04-19 | 2002-08-06 | Applied Materials, Inc. | Method and apparatus for controlling chucking force in an electrostatic |
| WO2001003176A1 (en) * | 1999-07-02 | 2001-01-11 | Matsushita Electric Industrial Co., Ltd. | Electric charge generating semiconductor substrate bump forming device, method of removing electric charge from electric charge generating semiconductor substrate, device for removing electric charge from electric charge generating semiconductor substrate, and electric charge generating semiconductor substrate |
| KR100368116B1 (ko) * | 2000-08-07 | 2003-01-15 | 삼성전자 주식회사 | 반도체설비의 정전척 구동전원 자동 방전장치 |
| WO2002017384A1 (en) * | 2000-08-23 | 2002-02-28 | Applied Materials, Inc. | Electrostatic chuck temperature control method and system |
| US6376795B1 (en) * | 2000-10-24 | 2002-04-23 | Lsi Logic Corporation | Direct current dechucking system |
| TWI234417B (en) * | 2001-07-10 | 2005-06-11 | Tokyo Electron Ltd | Plasma procesor and plasma processing method |
| US6853953B2 (en) * | 2001-08-07 | 2005-02-08 | Tokyo Electron Limited | Method for characterizing the performance of an electrostatic chuck |
| JP2003110012A (ja) * | 2001-09-28 | 2003-04-11 | Nissin Electric Co Ltd | 基板保持方法およびその装置 |
| US6727655B2 (en) | 2001-10-26 | 2004-04-27 | Mcchesney Jon | Method and apparatus to monitor electrical states at a workpiece in a semiconductor processing chamber |
| US20030210510A1 (en) * | 2002-05-07 | 2003-11-13 | Hann Thomas C. | Dynamic dechucking |
| TW200404334A (en) * | 2002-06-17 | 2004-03-16 | Mitsubishi Heavy Ind Ltd | Method and apparatus for measuring wafer voltage or temperature |
| US6898065B2 (en) * | 2002-07-26 | 2005-05-24 | Brad Mays | Method and apparatus for operating an electrostatic chuck in a semiconductor substrate processing system |
| US20040031699A1 (en) * | 2002-08-19 | 2004-02-19 | Applied Materials, Inc. | Method for performing real time arcing detection |
| DE10247051A1 (de) * | 2002-10-09 | 2004-04-22 | Polymer Latex Gmbh & Co Kg | Latex und Verfahren zu seiner Herstellung |
| DE10260614B4 (de) * | 2002-12-23 | 2008-01-31 | Advanced Micro Devices, Inc., Sunnyvale | Plasmaparametersteuerung unter Verwendung von Lerndaten |
| US7100954B2 (en) * | 2003-07-11 | 2006-09-05 | Nexx Systems, Inc. | Ultra-thin wafer handling system |
| US7636999B2 (en) * | 2005-01-31 | 2009-12-29 | Molecular Imprints, Inc. | Method of retaining a substrate to a wafer chuck |
| US7798801B2 (en) * | 2005-01-31 | 2010-09-21 | Molecular Imprints, Inc. | Chucking system for nano-manufacturing |
| US8149562B2 (en) * | 2007-03-09 | 2012-04-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | System for decharging a wafer or substrate after dechucking from an electrostatic chuck |
| US7813103B2 (en) * | 2007-10-11 | 2010-10-12 | Applied Materials, Inc. | Time-based wafer de-chucking from an electrostatic chuck having separate RF BIAS and DC chucking electrodes |
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| US8861170B2 (en) | 2009-05-15 | 2014-10-14 | Entegris, Inc. | Electrostatic chuck with photo-patternable soft protrusion contact surface |
| SG176059A1 (en) | 2009-05-15 | 2011-12-29 | Entegris Inc | Electrostatic chuck with polymer protrusions |
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| US8514544B2 (en) * | 2009-08-07 | 2013-08-20 | Trek, Inc. | Electrostatic clamp optimizer |
| US8501631B2 (en) * | 2009-11-19 | 2013-08-06 | Lam Research Corporation | Plasma processing system control based on RF voltage |
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| JP2010010236A (ja) * | 2008-06-25 | 2010-01-14 | Hitachi High-Technologies Corp | プラズマ処理装置及びプラズマ処理方法 |
| JP2016054159A (ja) * | 2009-11-19 | 2016-04-14 | ラム リサーチ コーポレーションLam Research Corporation | プラズマ処理システムを制御するための方法および装置 |
| JP2013511814A (ja) * | 2009-11-19 | 2013-04-04 | ラム リサーチ コーポレーション | プラズマ処理システムを制御するための方法および装置 |
| JP2014533436A (ja) * | 2011-11-04 | 2014-12-11 | ラム リサーチ コーポレーションLam Research Corporation | 基板クランプシステム及び該システムを動作させるための方法 |
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| JP7297822B2 (ja) | 2016-08-05 | 2023-06-26 | アプライド マテリアルズ インコーポレイテッド | グリーンシートセラミック上へのメタライゼーション材料の、サブミクロン均一性を有する高精度スクリーン印刷 |
| KR102624581B1 (ko) * | 2016-08-05 | 2024-01-12 | 어플라이드 머티어리얼스, 인코포레이티드 | 그린 시트 세라믹 상의 금속화 재료들의 서브-미크론 균일성을 갖는 정밀 스크린 프린팅 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6198616B1 (en) | 2001-03-06 |
| JP2011238934A (ja) | 2011-11-24 |
| WO1999052144A1 (en) | 1999-10-14 |
| JP5583633B2 (ja) | 2014-09-03 |
| WO1999052144A9 (en) | 2000-02-24 |
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