JP2002341306A - Method for inspecting address of display defect in liquid crystal display device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To accurately specify an address of a display defect of a liquid crystal display device by inspecting a panel using a picture display pattern to inspect it while turning the panel on. SOLUTION: The display pattern of the liquid crystal display device specifies an address of a desired position by moving a cursor on a display screen and the cursor moving on the display screen linearly continues with a combination of a color of the background picture and a color other than that. For example, when linear defective patterns 1, 2 and cursor patterns 3, 4 are superimposed, a linear defect is easily distinguished from the cursor or the background picture because the linear defective pattern is superimposed through parts where the cursor pattern is cut off. Thereby the address of the display defect is accurately specified.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to a method for inspecting addresses of display defects in a liquid crystal display device which drives a liquid crystal using a thin film transistor (TFT) array substrate on which a plurality of transistors are formed.

[0002]

2. Description of the Related Art When a liquid crystal display device is turned on, a line defect (hereinafter referred to as a line defect) such as a short circuit between lines due to a pattern defect, or all pixels using a specific line always looks bright sometimes occurs. In such a case, a wiring pattern is processed by a yttrium aluminum garnet (YAG) laser or the like, and a line defect is made invisible through a redundant circuit of an array pattern to perform normal display.

As a method of addressing defective pixels, a defect detection charge-coupled device (CCD) camera, an observation camera, and a laser are arranged at the same time, and the luminance difference of the defective portion is monitored by the defect detection CCD camera. , Addressing methods are used as prior art.

[0004]

Conventionally, when normalizing such a line defect, it is necessary to specify the location of a defective portion. Hereinafter, this method will be described.

FIG. 2 shows an image display pattern in the case where a defect origin of a line defect is specified. In this figure, 1
Is a vertical line defect pattern of the liquid crystal display device, 2 is a horizontal line defect pattern of the liquid crystal display device, 3 is a line cursor pattern for detecting an address of a vertical line defect, and 4 is an address detection of a horizontal line defect. Is an address display of the location where the cursor patterns 3 and 4 are displayed, and the coordinates of the source line number and the gate line number are displayed. In this image display pattern, the cursor pattern on the line of a different color from the background screen is superimposed on the normal display screen in the vertical and horizontal directions, and the gate wiring and source wiring numbers of the vertical and horizontal cross parts are simultaneously displayed. Are displayed in a color different from that of the background screen. The vertical and horizontal line cursor patterns can be selected within the entire range on the liquid crystal display screen, and by overlapping the line defect / point defect portion with the line pattern, the The address of the line defect can be specified.

However, if the visible line defect has no difference in color gradation as compared with the background screen, the cursor pattern is held at the line defect portion when inspecting the address of a defective portion as in the preceding stage. As you go, you lose track of the location of this line defect. This causes a problem that the address of the line defect cannot be accurately specified, and that it takes a very long time to obtain the address.

SUMMARY OF THE INVENTION An object of the present invention is to make it possible to accurately obtain an address in a process of specifying a source address of a line defect failure of a liquid crystal display device.

[0008]

According to a first aspect of the present invention, there is provided a first method for inspecting a display defect in a liquid crystal display device, wherein the display defect address of the liquid crystal display device is inspected while a panel is lit. This is an image display pattern for specifying the address of a desired location by moving the cursor on the display screen, and the cursor moving on the display screen is linearly connected with the background screen and a combination of colors other than the background screen. The inspection is performed using the display pattern of the liquid crystal display device.

Next, a second address inspection method is an image display pattern for inspecting a display defect address of a liquid crystal display device while turning on a panel. A desired address is moved by moving a cursor on a display screen. It is characterized by specifying an address of a location and inspecting using a display pattern of a liquid crystal display device which is not arranged in a straight line from one end to the other in a display screen in the same color in parallel with a gate wiring and a source wiring. .

In the first and second methods, when a line defect pattern and a cursor pattern are superimposed,
It is preferable to overlap the line defect pattern through the portion where the cursor pattern is cut.

[0011]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention is an image display pattern for inspecting a display defect address of a liquid crystal display device while turning on a panel, and by moving a cursor on a display screen, an address of a desired portion can be set. By inspecting using a display pattern of a liquid crystal display device, which is a pattern that can be specified, and a cursor moving on the display screen is linearly connected in a combination of colors other than the background screen and the background screen,
Addressing accuracy is improved when a display defect of the liquid crystal display device is difficult to distinguish from other display portions.

An image display pattern for inspecting a display defect address of the liquid crystal display device while the panel is turned on, wherein the address of a desired portion can be specified by moving a cursor on the display screen. By inspecting using a display pattern that is not aligned in a straight line from one end to the other in the display screen in the same color in parallel with the gate wiring and the source wiring, the display defects of the liquid crystal display device are compared with other display parts. In the case where it is difficult to distinguish the address, the address acquisition accuracy is improved.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(Embodiment) FIG. 1 shows an image display pattern in a case where a defective portion of a line defect is specified. FIG.
Wherein 1 is a vertical line defect pattern of the liquid crystal display device,
2 is a horizontal line defect pattern of the liquid crystal display device, 3 is a line cursor pattern for detecting an address of a vertical line defect, 4 is a line cursor pattern for detecting an address of a horizontal line defect, and 5 is a cursor. This is an address display where patterns 3 and 4 are displayed, in which the source line number and the gate line number are displayed in coordinates.

The middle line cursor patterns 3 and 4 in FIG. 1 are a combination of a color other than the cursor and a color other than the cursor.

The line defect patterns 1 and 2 and the cursor patterns 3 and 3 are determined by the defect address detection patterns.
When 4 is superimposed, the line defect pattern can be superimposed through the portion where the cursor pattern is cut, so that the line defect can be easily distinguished from the cursor or the background screen.

From the above, it has been found that it is possible to obtain an accurate address in the step of specifying the address at which the line defect of the liquid crystal display device is caused.

[0018]

According to the above invention, when the display defect address of the liquid crystal display device is obtained, the cursor moving on the display screen is linearly formed by the combination of the color of the portion other than the cursor and the background screen. By using the display pattern of the liquid crystal display device characterized in that the address of the defective portion can be accurately obtained.

[Brief description of the drawings]

FIG. 1 is a display pattern of a liquid crystal display device for addressing a defective portion according to an embodiment of the present invention.

FIG. 2 is a display pattern of a conventional liquid crystal display device for addressing a defective portion.

[Explanation of symbols]

 Reference Signs List 1 vertical line defect 2 horizontal line defect 3 vertical address line cursor pattern 4 horizontal address line cursor pattern 5 address display section

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (Reference) G09G 3/20 G09G 3/20 670Q 5G435 3/36 3/36 // H04N 17/04 H04N 17/04 Z (72) Inventor Nobuyuki Tsuboi 1006 Kadoma, Kazuma, Osaka Prefecture F-term in Matsushita Electric Industrial Co., Ltd. BB05 DD15 DD28 EE17 FF11 JJ01 5G435 AA17 BB12 CC09 KK05 KK10

Claims (3)

[Claims] 1. An image display pattern for inspecting a display defect address of a liquid crystal display device while lighting a panel, wherein an address of a desired portion is specified by moving a cursor on the display screen, and An address inspection method for a display defect in a liquid crystal display device, wherein an inspection is performed using a display pattern of a liquid crystal display device in which a cursor moving thereon is linearly connected in a combination of a background screen and a color other than the background screen. 2. An image display pattern for inspecting a display defect address of a liquid crystal display device while turning on a panel, wherein an address of a desired portion is specified by moving a cursor on a display screen, and a gate wiring is specified. Address inspection for display defects in a liquid crystal display device, wherein the inspection is performed using a display pattern of a liquid crystal display device which is not arranged in a straight line from one end to the other in the display screen in the same color in parallel with the source wiring. Method. 3. The address inspection for a display defect in the liquid crystal display device according to claim 1, wherein when the line defect pattern and the cursor pattern are overlapped, the line defect pattern is overlapped through a portion where the cursor pattern is cut. Method.