JP2009047630A - Lighting inspection device and lighting inspection method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a lighting inspection device and a lighting inspection method achieving high speed lighting inspection of a display apparatus such as a display. <P>SOLUTION: The lighting inspection device 1 includes a signal generator 6 for displaying an inspection image on a display screen of a liquid crystal panel 8 and a detection means 3 including a plurality of sensors 2A-2D. The sensors 2A-2D scan the display screen. The signal generator 6 displays a screen pattern 4A to be inspected in a region 15 including a detection object position 9A by one certain sensor 2A, and displays a screen pattern 4B to be inspected different from the screen pattern 4A to be inspected in the region 15 including a detection object position 9B by the other sensor 2B different from the sensor 2A. During the scanning by the sensors, the signal generator 6 displays the same screen pattern to be inspected in the region including the object position for each sensor. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a lighting inspection device and a lighting inspection method used for lighting inspection of a display device such as a display.

  In order to ensure the quality of flat panel displays (FPD) such as liquid crystal panels, lighting inspections are performed for minute point defects, line defects, defects due to contamination of foreign objects, defects due to spots or unevenness, etc. in the display surface. It is.

  The minute point defect includes a point having a higher or lower luminance than a desired luminance level when driven by giving a display signal due to an abnormality of a TFT (Thin Film Transistor) constituting the display element of the liquid crystal panel. The polarization state is disturbed by the displayed defect, the minute foreign matter mixed between the liquid crystal layer or the polarizing plate group and the TFT substrate, or the fine foreign matter mixed between the polarizing plate group and the CF (Color Filter) substrate. Thus, there is a defect that a point having a higher or lower luminance than the desired luminance level is displayed.

  FIG. 8 shows an example in which a point whose luminance is higher than a desired luminance level is displayed due to abnormality of the TFT. The liquid crystal panel 200 includes minute point defects 201 and 202. Liquid crystal panels 203 and 204 are obtained by enlarging a minute region including point defects 201 and 202. In the liquid crystal panel 203, only one point with high luminance is displayed in a mixed manner with points with low luminance. One picture element 205 of the color liquid crystal panel is composed of three dots 210r, 210g, and 210b as shown in the white frame in the figure of the liquid crystal panel 203, and these dots are generally red ( It has three colors: R) dot 210r, green (G) dot 210g, and blue (B) dot 210b. For example, assuming that R, G, and B are arranged in order from the left, the liquid crystal panel 203 has an abnormality in the red (R) dot 210r, and a point defect having a high red luminance has occurred. On the other hand, in the liquid crystal panel 204, there is an abnormality in the red (R) dot 220r, indicating a point defect in which the luminance of red is lower than other colors.

  A line defect is a line with a higher or lower luminance than a desired luminance level due to an abnormality of a driver for driving the TFT or a disconnection or a short circuit of a signal line. Further, spots or unevenness is caused by an abnormality in the thickness of the thin film in the manufacturing process of the TFT substrate or the CF substrate, an abnormality in the cell gap of the liquid crystal layer between the TFT substrate and the CF substrate, or the like.

  In order to detect these defects, the inspection screen pattern of the liquid crystal panel is changed for each type of defect for inspection.

  For example, when detecting a point defect with high brightness as shown in the liquid crystal panel 203, the inspection screen pattern is black and inspected. In order to make the screen pattern to be inspected black, all the pixels 205 of the color liquid crystal panel are set so that the luminance is the lowest in any of the red dots 210r, green dots 210g, and blue dots 210b shown in the liquid crystal panel 203. Realized by controlling.

  In addition, in order to detect a red point defect having a low luminance shown in the liquid crystal panel 204, the inspection screen pattern is red and inspected. In order to make the screen pattern to be inspected red, only the red dots 220r shown on the liquid crystal panel 204 are in the highest luminance state, and the green dots 220g and blue dots 220b are all in the lowest luminance state. This is realized by controlling the picture element 205. Similarly, in order to detect a point defect with low green luminance, the inspection screen pattern is made green, and to detect a point defect with low blue luminance, the inspection screen pattern is made blue.

  The reason why the inspection screen pattern is changed according to the color to be inspected in this way is that the inspection screen pattern is white (the red dot 210r, the green dot 210g, and the blue dot 210b have the highest luminance). When all point defects with low luminance of all colors are inspected at the same time, even if there is a point defect with low luminance, the luminance is controlled to the highest level. This is because it becomes difficult to observe point defects with low luminance due to the wraparound of light from the surrounding dots. Thus, in the lighting inspection, various inspections are performed using a plurality of inspection screen patterns.

  Conventionally, these inspections have been carried out by visual observation with the display turned on. However, with the recent increase in size of FPDs, minute point defects and foreign object defects present in a large screen are visually detected. This required a lot of time, and in addition, problems such as oversight of micro defects due to fatigue of the visual inspector occurred. Therefore, recently, a method has been adopted in which the display surface of the panel to be inspected is read using an imaging device such as a CCD camera and various defects generated in the panel to be inspected are automatically detected by image processing technology. ing.

  FIG. 9 is a schematic diagram showing a configuration of a general lighting inspection apparatus using a detection sensor such as a CCD camera.

  The lighting inspection apparatus 100 shown in FIG. 9 includes a scanning stage 103 that can change the relative position of the detection sensor 102 and the panel 101 to be inspected, and the entire surface of the panel 101 to be inspected is scanned by the detection sensor 102. The The scanning stage 103 has no difference in function regardless of whether the detection sensor 102 or the panel 101 to be inspected is moved. The scanning stage 103 is controlled by a stage control device 104. The signal generator 105 transmits a signal for displaying the screen pattern to be inspected on the panel 101 to be inspected. The image processing apparatus 106 detects the defective part by performing image processing on image data from the detection sensor 102 that scans and images the panel 101 to be inspected, and realizes inspection.

  As a specific example of the method for detecting various defects described above, Patent Document 1 discloses an apparatus that detects a display screen of a panel to be inspected while changing a relative position between a detection sensor and the panel to be inspected. In the lighting state inspection apparatus described in Patent Literature 1, the detection sensor displays the display screen of the panel to be inspected while continuously changing the relative position between the detection sensor and the panel to be turned on by applying a drive signal. Detected. The lighting state inspection apparatus inspects display pixels for defects by processing a detected image in a signal processing unit. Each process such as the movement of the panel to be inspected or the detection sensor, the detection of the display screen, and the image processing is automated, thereby promptly detecting the panel to be inspected.

  Further, Patent Document 2 discloses an apparatus that uses an imaging element (CCD) to shorten the evaluation time of moving image display characteristics in a display device. The evaluation apparatus described in Patent Document 2 evaluates moving image display characteristics by capturing a moving image as a time-series still image and combining a plurality of time-series still images while shifting them. As a method of supplying a moving image signal to the display device, a rectangular region having a gradation different from that of the background is displayed in the vertical direction, and this is scrolled in the horizontal direction.

Further, Patent Document 3 discloses a method of measuring the speedup by dividing the display screen of the panel to be inspected into a plurality of areas and assigning a luminance measuring device to each divided area. In the inspection apparatus described in Patent Document 3, the display area of the image display device is divided into a plurality of blocks each including a plurality of pixels, and one luminance measurement device is sequentially moved on each block, whereby the entire display screen is displayed. Measurement is possible over a wide range. Further, by arranging a luminance measuring device in each of the divided blocks, the luminance measuring time over the entire display screen is shortened.
JP 2002-0986651 A (published on April 5, 2002) JP 2001-204049 A (released on July 27, 2001) JP 2004-071557 A (published March 4, 2004)

  However, the techniques disclosed in Patent Document 1 to Patent Document 3 have a problem that a large increase in speed cannot be expected when a large panel is inspected or when there are a plurality of inspection image patterns. The above problem will be specifically described as follows.

  For example, in the lighting state inspection apparatus described in Patent Document 1, it is possible to shorten the reciprocating scanning distance and realize high speed by arranging a plurality of detection sensors in a direction in which the detection sensors are moved relative to the panel to be inspected. is there. However, the acceleration / deceleration time when starting and ending relative movement cannot be shortened. Further, when there are a plurality of patterns of inspection images, reciprocal scanning must be performed for each pattern. When inspecting a large-sized liquid crystal panel, the acceleration time and the deceleration time cannot be ignored because they are large and heavy regardless of which of the panel to be inspected and the detection sensor are moved. Therefore, when there are a plurality of patterns of inspection images, an acceleration / deceleration time proportional to the number of patterns is required, and a significant increase in speed cannot be expected.

  The evaluation device described in Patent Document 2 is a device for evaluating the moving image display characteristics of the display device. The evaluation of the moving image display characteristics is for evaluating the performance of the display device, and the acquired image does not have to be an image shown in the entire display area, and a partial area of the display area is set as an inspection target. It is good. Therefore, knowledge about speeding up when the entire display area is inspected and knowledge about speeding up when the panel is enlarged cannot be obtained from the apparatus described in Patent Document 2.

  Further, in the prior art described in Patent Document 3, the display screen of the panel to be inspected is divided into a plurality of areas, and a luminance measuring device is assigned to each of the divided areas, thereby performing measurement over the entire display screen, The measurement time is further shortened. However, even in this case, when there are a plurality of patterns of the inspection image and the measurement is performed by turning on the driving measurement elements for each pattern, acceleration and movement are performed for the movement of the luminance measuring device for each measurement of each element. It is necessary to decelerate and further speedup cannot be expected.

  Therefore, the present invention has been made in view of the above-described problems, and the purpose thereof is to determine the time required for acceleration and deceleration when moving the detection sensor or the panel to be inspected in the lighting inspection of a plurality of inspection screen patterns. An object of the present invention is to provide a lighting inspection device and a lighting inspection method that can be realized without increasing the number.

  In order to solve the above problems, a lighting inspection apparatus according to the present invention supplies a signal to a panel to be inspected and displays a test image on a display screen of the panel to be inspected, and displays the inspection image on the display A plurality of sensors that detect from a position facing the screen includes a detecting unit arranged in series, and a lighting unit that includes a moving unit that relatively moves the panel to be inspected and the detecting unit along the arrangement direction of the sensors. In the inspection apparatus, the interval between the detection positions of the adjacent sensors is shorter than the total length in the arrangement direction of one panel to be inspected, and the signal generator includes the detection target position by a certain sensor, Different images are displayed at positions to be detected by other sensors different from a certain sensor, and while the panel to be inspected and the detection means are relatively moved, the sensor is moved. The same inspection image is displayed at the detection target position for each of the sensors, and the moving means moves the certain sensor and the other sensor relative to each other from one end to the other end in the arrangement direction of one panel to be inspected. It is made to move. Here, the detection target position is a part of the inspection screen in the panel to be detected which is detected by the sensor.

  According to the said structure, the relative position of a to-be-inspected panel and a detection means changes with a moving means, and a sensor can be relatively moved from one end to the other end of a to-be-inspected panel. Therefore, the sensor arranged in the detection means can inspect the entire display screen of the panel to be inspected. At that time, the signal generator displays the same type of inspection image at the detection target position of the sensor for each sensor while the detection target position of the sensor is changing. Therefore, the entire display screen of the panel to be inspected can be inspected for a certain type of inspection image by an arbitrary sensor.

  Furthermore, according to the said structure, the adjacent sensors are arrange | positioned so that the space | interval of each test object position may have opened the length which can test | inspect the display screen of a to-be-inspected panel simultaneously. Each adjacent sensor can inspect different types of inspection images displayed in different regions of the panel display screen to be inspected. That is, while a certain sensor inspects a display screen for a certain type of inspection image, another sensor inspects another area of the display screen for another type of inspection image. And since the relative position of a to-be-inspected panel and a detection means changes to one direction, it is not necessary for a sensor to reciprocate on a display screen and to test | inspect. Therefore, even when there are a plurality of inspection images, acceleration and deceleration when moving the panel to be inspected or the detecting means are performed only once, and the time required for acceleration and deceleration can be reduced. In addition, since reciprocal scanning is not performed, the configuration of the apparatus can be simplified, thereby reducing the cost.

  The relative movement may be a case where the detection means (sensor) moves with respect to the fixed panel to be inspected, or the inspection target with respect to the fixed detection means (sensor). The panel may move, or both the panel to be inspected and the detection means (sensor) may move.

  Furthermore, in the lighting inspection apparatus of the present invention, the signal generator displays a certain type of the inspection image for each region obtained by dividing the display screen into a plurality of regions along the arrangement direction, and the sensor includes the arrangement direction. It is preferable that the width of the region along the arrangement direction is wider than the predetermined detection width of the sensor.

  According to the above configuration, the display area of the inspection image has a width wider than the detection width of the sensor along the movement direction on the display screen of the panel to be inspected, and the inspection area is inspected. The same inspection image is displayed in the area. Therefore, while the detection target position of the sensor is changing, a shift is less likely to occur between the detection target position and the display screen displaying the inspection image to be detected.

  Furthermore, in the lighting inspection apparatus of the present invention, the signal generator may be between the region corresponding to the detection target position of the certain sensor and the region corresponding to the detection target position of a sensor adjacent to the certain sensor. It is preferable to display a blank image having a predetermined width along the arrangement direction.

  According to the above configuration, when the inspection of the first inspection image by an arbitrary sensor is completed in a certain area while the relative position between the panel to be inspected and the sensor is changing, the detection target position of the arbitrary sensor is set. It becomes a region that is not included and is not detected by any sensor, and a blank image is displayed. Thereafter, the detection target position of the sensor adjacent to the arbitrary sensor is included, and the inspection of the second inspection image is started. By switching the blank image to the inspection image, the display of the second inspection image can be completed in advance before the inspection of the second inspection image is started. Thereby, when the inspection of the second inspection image is started, it becomes difficult to be influenced by the first inspection image such as an afterimage. Further, it is possible to prevent the inspection image from being displayed when detection is started.

  Furthermore, in the lighting inspection apparatus of the present invention, it is preferable that the blank image is a black image.

  According to the said structure, the area | region adjacent to the area | region currently inspected is displayed black on the display screen. When the inspection image is dark display such as black lighting, it is easily affected by ambient light. Therefore, in this case, a dark display inspection image such as black lighting can be inspected satisfactorily by darkening the display screen of the adjacent region to black display.

  Furthermore, in the lighting inspection apparatus according to the present invention, the signal generator is configured to provide a gap between the region corresponding to the detection target position of the certain sensor and the region corresponding to the detection target position of a sensor adjacent to the certain sensor. The non-lighting state is preferable in a predetermined width along the arrangement direction.

  According to the above configuration, when the panel to be inspected is a normally black panel, an image is not displayed in the area adjacent to the area being inspected, and the display screen is in a black state. When the inspection image is dark display such as black lighting, it is easily affected by ambient light. Therefore, in this case, by setting the display screen in the adjacent region to a black state as a non-lighting state in which no image is displayed, it is possible to satisfactorily inspect a dark display inspection image such as black lighting.

  Furthermore, in the lighting inspection apparatus of the present invention, it is preferable that the number of sensors is determined by the number of the regions. The number of sensors arranged in the detection means may be a number determined by the number of the regions, or a plurality of sensors are arranged in advance, and some of the sensors are arranged according to the number of divisions. It may be used.

  According to the above configuration, when the number of sensors determined by the number of regions is arranged, there is no sensor that is not used for detection, and a process for selecting the sensor to be used is not required. Can be achieved. In addition, when a plurality of sensors are arranged in advance and the number of units to be used is adjusted according to the number of divisions, the number of patterns on the screen to be inspected during the forward scan and the backward scan is made equal to the image processing. The load can be equalized.

  Furthermore, in the lighting inspection apparatus of the present invention, it is preferable that the signal generator displays the same inspection image at the detection target position for each sensor based on a relative position between the sensor and the panel to be inspected. .

  According to the said structure, a signal generator displays the test | inspection image according to the detection target position of a sensor on a display screen. That is, the inspection image to be captured by the sensor is always displayed at the detection target position of the sensor. Therefore, an arbitrary sensor can surely inspect a certain inspection image over the entire surface of the display screen.

  Furthermore, in the lighting inspection apparatus of the present invention, it is preferable that the signal generator displays the same inspection image at the detection target position for each sensor based on a predetermined time.

  According to the configuration, when the inspection is started, the inspection images are automatically and sequentially switched at a predetermined time. Therefore, a mechanism for recognizing the relative position between the panel to be inspected and the sensor is not required, and the configuration of the apparatus can be simplified.

  Further, in the lighting inspection apparatus of the present invention, the number of the sensors is m, the time required for acceleration of the moving means is a, the time required for deceleration of the moving means is d, and the moving means is configured to cover the certain sensor. Assuming that the time required for relative movement from one end to the other end of the inspection panel in the arrangement direction is t, the interval between the detection target positions of the adjacent sensors is the one end to the other end of the inspection panel in the arrangement direction. W / pm, where p is a positive integer, and the signal generator has the inspection image such that the width along the arrangement direction of the inspection image is w / 2 pm. It is preferable that w / pm is larger than a predetermined detection width value of the sensor along the arrangement direction and satisfy (a + d)> (t / pm). The time required for acceleration of the moving means is the time required to reach the speed in order to inspect the panel to be inspected at a constant speed, and the time required for deceleration of the moving means ends the inspection at the constant speed. And the time taken to stop the moving means. Further, the width along the arrangement direction of the inspection image refers to the width along the arrangement direction of the display screen displaying the inspection image when an arbitrary inspection image is displayed on the display screen. It is.

  According to the above configuration, for example, when there are m types of inspection images, the time required for inspection of all inspection images is [a + (1+ (m−1) / pm) t + d]. Then, the signal generator displays only one type of inspection image on the entire display screen, accelerates and decelerates the moving means each time inspection of one inspection image is completed, and inspects the next inspection image In, the time required for inspection of all inspection images is [(a + (t / m) + d) m]. According to the configuration that satisfies the relationship (a + d)> (t / pm), the relationship [[a + (t / m) + d) m]> [a + (1+ (m−1) / pm) t + d] is always satisfied. Fulfill. That is, the time required for inspection of all inspection images is always shorter in the lighting inspection apparatus according to the present invention than in the prior art. Therefore, even if the panel to be inspected becomes larger and the inspection section becomes longer, the inspection speed can always be higher than that of the conventional technique.

  Furthermore, as the value of p increases, the value of [a + (1+ (m−1) / pm) t + d] decreases, and the time required for inspection of all inspection images decreases. That is, when the interval between the detection target positions of adjacent sensors is reduced and the width along the arrangement direction of the inspection images is also reduced, the time required for inspection of all inspection images can be shortened.

  A lighting inspection method according to the present invention is a lighting inspection method for performing a lighting inspection of a display screen by scanning an inspection image displayed on a display screen of a panel to be inspected by a plurality of sensors arranged in series. Different images are displayed at a detection target position by a certain sensor and a detection target position by another sensor different from the certain sensor, and the certain sensor and the other sensor are While the sensor panel is relatively moved from one end to the other end in the arrangement direction of the sensors, the same inspection image is displayed at the detection target position for each sensor.

  According to the above configuration, the sensor can inspect the entire display screen of the panel to be inspected. Further, while the detection target position of the sensor is changing, the same type of inspection image is displayed at the detection target position of the sensor for each sensor. Therefore, the entire display screen of the panel to be inspected can be inspected for a certain inspection image by an arbitrary sensor.

  Furthermore, according to the said structure, the adjacent sensor is arrange | positioned at the space | interval which can test | inspect the display screen of a to-be-inspected panel simultaneously. Therefore, a plurality of inspection images displayed in different areas of the panel display screen to be inspected can be inspected simultaneously by a plurality of sensors. That is, while one sensor is inspecting a display screen for a certain inspection image, another sensor is inspecting another inspection image in another area of the display screen, and each inspection image is inspected. The direction to do is always the same. That is, when inspecting a plurality of inspection images, the change in the relative position between the panel to be inspected and the sensor is always in one direction, and the sensor does not need to inspect the display screen back and forth. Therefore, even when there are a plurality of inspection images, acceleration and deceleration when moving the panel or sensor to be inspected are each performed only once, and the time required for acceleration and deceleration can be shortened.

  As described above, the lighting inspection apparatus according to the present invention displays different images at a detection target position by a certain sensor and a detection target position by another sensor different from the certain sensor, Since the signal generator for displaying the same inspection image at the detection target position is provided for each sensor while the panel to be inspected and the detection unit are relatively moved, the lighting inspection according to the present invention is provided. By using the apparatus, even when a plurality of inspection images are inspected, an inspection for another inspection image can be started before the inspection of one inspection image is completed. Therefore, the number of accelerations and decelerations of the moving means can be reduced, and the time required for acceleration and deceleration can be reduced. In addition, expansion of the footprint of the apparatus can be suppressed.

  Further, the lighting inspection method according to the present invention displays different images at a detection target position by a certain sensor and a detection target position by another sensor different from the certain sensor, and the or Since the same inspection image is displayed at the detection target position for each sensor while the sensor and the other sensor are relatively moved from one end to the other end in the arrangement direction of one panel to be inspected, Even when an inspection image is inspected, an inspection for another inspection image can be started before the inspection of one inspection image is completed. Therefore, the number of accelerations and decelerations of the moving means can be reduced, and the time required for acceleration and deceleration can be reduced.

[Embodiment 1]
An embodiment of a lighting inspection apparatus according to the present invention and a lighting inspection method using the same will be described with reference to FIGS.

  In the following embodiments, a liquid crystal panel having a display screen that displays an image using a change in orientation of liquid crystal molecules will be described as an object to be inspected, but the present invention is not limited to this. In other words, the present invention can be applied to various display devices. For example, an FPD (flat panel display) such as a plasma display, an SED display, and an EL display can be an inspection target.

(Lighting inspection device)
First, the configuration of the lighting inspection apparatus in the present embodiment will be described with reference to FIGS. 1 and 2. In the following description, an example in which four different screen patterns (inspection images) are inspected using four sensors will be described as an example. However, the number of sensors and the number of screen patterns (types) ) Is not necessarily limited to this.

  FIG. 1 is a diagram illustrating a configuration of the lighting inspection apparatus 1. As shown in FIG. 1, the lighting inspection apparatus 1 moves a detection means 3 having four scanning sensors (sensors) 2 </ b> A to 2 </ b> D, a signal generator 6 that supplies a signal to the liquid crystal panel 8, and the liquid crystal panel 8. A moving means 7 for moving in the direction 11 and an image processing apparatus 10 are provided.

[Detection means]
The scanning sensors 2 </ b> A to 2 </ b> D are line sensors in which detection pixels are arranged in a direction orthogonal to the moving direction 11. As the scanning sensors 2A to 2D, known sensors may be used. In this embodiment, 96-stage TDI sensors that can be suitably used when the subject is moving are used. The detection width of the scanning sensors 2A to 2D is a length along the moving direction 11 of the liquid crystal panel that can be detected (imaged) by each sensor at a time.

  The detection means 3 includes scanning sensors 2A to 2D, and the scanning sensors 2A to 2D are arranged in a line in series. The direction in which the scanning sensors 2 </ b> A to 2 </ b> D are arranged (arrangement direction) is a direction parallel to the moving direction 11. The interval between the detection target positions of the adjacent scanning sensors is arranged to be shorter than the length (width) 18 along the moving direction 11 in the liquid crystal panel 8, and preferably, the scanning sensors arranged in a line are arranged in a row. The distance between the detection target position of the scanning sensor (scanning sensor 2A) located at one end and the detection target position of the scanning sensor (scanning sensor 2D) located at the other end is 18 in length. It arrange | positions so that it may become shorter. Thus, the relative movement distance between the detection means 3 and the liquid crystal panel 8 is shortened by configuring the distance between the detection target positions of the scanning sensor 2A and the scanning sensor 2D to be shorter than the length 18. Can do. In this embodiment, the interval 17a between the detection target positions 9A and 9B, the interval 17b between the detection target positions 9B and 9C, and the interval 17c between the detection target positions 9C and 9D are all in the moving direction 11 in the liquid crystal panel 8. The scanning sensors 2 </ b> A to 2 </ b> D are arranged so as to be ¼ of the length 18 along the line.

[transportation]
The moving means 7 moves the liquid crystal panel 8 in the moving direction 11 so that all the scanning sensors can detect from one end to the other end of the liquid crystal panel 8. Accordingly, any of the scanning sensors 2A to 2D can detect the entire display screen of the liquid crystal panel 8. Examples of the moving means include a single-axis stage and a conveyor.
In the present embodiment, the moving means 7 is configured to move the liquid crystal panel 8, but the present invention is not limited to this, and the detecting means 3 may be moved. That is, when the liquid crystal panel 8 is moved in the movement direction 11, detection by the scanning sensor 2 </ b> A starts from the right side edge 13 of the liquid crystal panel 8. Conversely, when the detection means 3 is moved in the movement direction 11, detection by the scanning sensor 2 </ b> D starts from the left end 14 of the liquid crystal panel 8.

  Detection by the scanning sensors 2 </ b> A to 2 </ b> D is performed in a state where the liquid crystal panel is moved at a constant speed by the moving means 7. Therefore, before the detection by the sensor starts, the liquid crystal panel 8 needs to be accelerated to a desired speed by the moving means 7. Further, after the detection of all the sensors is completed, it is necessary to decelerate by the moving means 7 in order to stop the movement of the liquid crystal panel 8.

[Signal generator]
The signal generator 6 supplies the liquid crystal panel 8 with a signal for displaying the screen patterns 4A to 4D for lighting inspection on the display screen of the liquid crystal panel 8.

  In the liquid crystal panel to be inspected in the present embodiment, each picture element is composed of three dots of red (R) dots, green (G) dots, and blue (B) dots. Further, the inspection screen patterns 4A to 4D described in the present embodiment are set according to the defect type as described above. That is, in each screen pattern to be inspected, the picture element is set to one of red (R), green (G), blue (B), and black (BL) as in the configuration described in FIG. These color display methods can be performed using a conventionally known method. Then, when inspecting for any of red (R), green (G), and blue (B), the luminance of the dots of the color to be inspected is made highest and the luminance of the dots of the other colors is lowered. To do. On the other hand, when inspecting for black (BL), the luminance of all color dots in the picture element is set to the lowest. Specifically, it is as described with reference to FIG.

  The signal generator 6 displays a different screen pattern to be inspected on the display screen of the liquid crystal panel 8 as described above. At this time, the signal applied to the screen pattern to be inspected is predetermined along the moving direction 11 of the liquid crystal panel 8. For each region having a length of. In the present embodiment, the display screen of the liquid crystal panel 8 is divided by a length of 1/8 along the moving direction 11 and is defined as one area (hereinafter referred to as a divided area 15). A certain screen pattern to be inspected is displayed, or a blank image is displayed as will be described later.

  Further, the signal generator 6 supplies a signal such that the length (display width) 16 along the moving direction of each divided region is wider than the detection width of the scanning sensors 2A to 2D described above. By setting the display width 16 in this way, while the detection target position of the sensor is changing, between the detection target position and the display screen displaying the screen pattern to be inspected to be detected. Misalignment is less likely to occur.

  Thus, as a method of partitioning the display screen of the liquid crystal panel 8 into regions, as will be described later, the wiring of the liquid crystal panel 8 that provides a signal for displaying the screen pattern to be inspected is grouped for each block. A method of partitioning the display area of the liquid crystal panel 8 into a plurality of examples is given.

  Further, as a characteristic configuration of the present invention, the signal generator 6 includes a divided region 15 facing an arbitrary scanning type sensor while the relative position between the scanning type sensor and the liquid crystal panel 8 is changed by the moving unit 7. Is supplied with a signal so that the same (type of) screen pattern to be inspected is always displayed. Specifically, as described above, the relative position between the liquid crystal panel 8 and the detection unit 3 is changed by the moving unit 7, and the scanning sensor 2 </ b> A first starts detection from the right side edge 13 of the liquid crystal panel 8, Subsequently, the scanning sensors 2B, 2C, and 2D face the display screen of the liquid crystal panel 8 in this order. Even if the detection target position of the scanning sensor 2A changes, the signal generator 6 is always displayed at the detection target position of the scanning sensor 2A so that the same screen pattern 4A to be inspected is displayed as red if red. Provides a signal. Similarly, even if the scanning sensor 2B starts detection from the right side edge 13 of the liquid crystal panel 8 and the detection target position of the scanning sensor 2B changes, the detection target position of the scanning sensor 2B is the same. The signal generator 6 supplies a signal so that the screen pattern 4B to be inspected is displayed. Similarly, even when the scanning sensor 2C starts detection from the right side edge 13 of the liquid crystal panel 8 and the detection target position of the scanning sensor 2C changes, the detection target position of the scanning sensor 2C is the same. The signal generator 6 supplies a signal so that the screen pattern 4C to be inspected is displayed. Similarly, even if the scanning sensor 2D starts detection from the right side edge 13 of the liquid crystal panel 8 and the detection target position of the scanning sensor 2D changes, the detection target position of the scanning sensor 2D is the same. The signal generator 6 supplies a signal so that the screen pattern 4D to be inspected is displayed. As described above, the signal generator 6 changes the display area of the screen pattern to be inspected according to the change in the detection target position of the scanning sensor. Details will be described later with reference to FIG.

  As described above, the signal generator 6 changes the position of the divided region 15 that displays the screen patterns 4A to 4D to be inspected according to the change of the detection target position of the scanning sensors 2A to 2D as described above. There are two approaches.

  The first is a method of switching the type of screen pattern to be inspected based on the relative position between the liquid crystal panel 8 and the detection means 3. In this case, the signal generator 6 displays an inspection screen pattern corresponding to the detection target position of the sensor on the display screen. In this case, the signal generator 6 can synchronize the detection target position and the switching of the display screen by communicating with the moving means 7.

  As a second technique, the signal generator 6 receives the imaging start trigger, that is, after displaying the first screen pattern to be inspected at the start of imaging, the screen pattern to be inspected at a predetermined time. It is a technique to switch the type of. In this case, when the inspection is started, the screen pattern to be inspected is automatically and sequentially switched in a fixed sequence (time). Further, as shown in FIG. 1, the signal generator 6 includes an area in which a certain screen pattern to be inspected is displayed and a screen pattern to be inspected adjacent to the screen pattern to be inspected. Between the two, a blank region is formed. If it demonstrates using FIG. 1, there exists an area | region where the blank images 5A-5D are displayed between two adjacent to-be-inspected screen patterns. The areas displaying the blank images 5A to 5D are areas that do not correspond to the detection target positions 9A to 9D of the scanning sensors 2A to 2D. The blank image is preferably a screen pattern to be inspected next. By displaying the screen pattern to be inspected in advance, a shift between the detection target position and the area displaying the screen pattern to be inspected is prevented, and an afterimage caused by the screen pattern to be inspected before is displayed. It can prevent being affected.

  FIG. 4 is a diagram showing a display screen of the liquid crystal panel 8 during the lighting inspection. As shown in FIG. 4, the blank images 5A to 5D displayed in the areas adjacent to the areas displaying the screen patterns 4A to 4D to be inspected on the display screen may be black. When the screen patterns 4A to 4D to be inspected are dark display such as black lighting, they are easily affected by ambient light. Therefore, in this case, by darkening the display screen by making the blank image displayed adjacently black, it is possible to inspect the screen pattern to be inspected darkly such as black lighting.

  Moreover, the area | region adjacent to the area | region which displays to-be-inspected screen pattern 4A-4D may be the non-lighting state which is not displaying any image. When the panel to be inspected is a normally black panel, the display screen is black in the non-lighted state. Therefore, even if a black blank image is not displayed, the inspection screen pattern can be inspected satisfactorily even in the case of a dark display such as black lighting.

[Image processing device]
The scanning sensors 2A to 2D output the detected images as signals to the image processing apparatus 10. The image processing apparatus 10 detects image defects by processing image signals from the scanning sensors 2A to 2D as input data, thereby realizing inspection. In the image processing apparatus 10, a dot having a large difference is detected as a defective portion by comparing with surrounding dots. In addition, as a method for detecting a defective portion, there are other methods such as binarization processing and filter processing. In addition, the inspection result data can be displayed on a monitor or transmitted to a host host via a network. It should be noted that the detection of a defective portion by image processing is performed every time image data is sequentially captured.

(Lighting inspection method)
Next, a lighting inspection method for the liquid crystal panel 8 performed using the lighting inspection apparatus 1 having the above-described configuration will be described. In the lighting inspection method of the present embodiment, as described above, the display on the liquid crystal panel 8 is performed on the four types of screen patterns 4A to 4D to be inspected: red (R), green (G), blue (B), and black (BL). Inspect the screen.

  FIG. 2A illustrates screen patterns 4A to 4D to be inspected displayed on the liquid crystal panel 8 when the screen patterns 4A to 4D are inspected using the lighting inspection apparatus 1 illustrated in FIG. It is a figure showing change of detection object position of scanning type sensors 2A-2D. For convenience of explanation, the size of the liquid crystal panel 8 is shown by shortening the vertical direction (direction perpendicular to the moving direction of the liquid crystal panel 8). FIG. 2A shows only the liquid crystal panel 8 and the scanning sensors 2 </ b> A to 2 </ b> D extracted from the lighting inspection apparatus 1 shown in FIG. 1 for explanation.

  FIG. 2A shows a relative position in the moving direction of the liquid crystal panel 8 with respect to the scanning sensors 2A to 2D in a state in which the liquid crystal panel 8 is moving at a constant speed from the left to the right of the page. The intervals from the liquid crystal panel 8a to the liquid crystal panel 8q are constant.

  The liquid crystal panel 8 has completed acceleration in a state (not shown) before the liquid crystal panel 8a shown in FIG. 2A, and in the state of the liquid crystal panel 8a, the liquid crystal panel 8 moves at a constant speed.

  In the state of the liquid crystal panel 8b, the signal generator 6 (FIG. 1) supplies a signal for displaying the screen pattern 4A to be inspected in an area corresponding to the detection target position 9A of the scanning sensor 2A.

  In the state of the liquid crystal panel 8c in which the inspection has progressed more than the state of the liquid crystal panel 8b, the detection target position 9A of the scanning sensor 2A has moved further to the left on the panel upper surface than the state of the liquid crystal panel 8b. A screen pattern 4A to be inspected is displayed in an area corresponding to the detection target position 9A of the detection sensor 2A.

  In the state of the liquid crystal panel 8d in which the inspection state has further advanced, the detection target position 9A of the scanning sensor 2A has moved further to the left on the panel surface than the state of the liquid crystal panel 8c, and the detection target position 9A of the detection sensor 2A. A screen pattern 4A to be inspected is displayed in the area corresponding to. Also, inspection by the scanning sensor 2B has started, and a screen pattern 4B to be inspected is displayed in an area corresponding to the detection target position 9B of the scanning sensor 2B.

  As described above, there is a blank image between the area corresponding to the detection target position 9A of the scanning sensor 2A and the area corresponding to the detection target position 9B of the scanning sensor 2B adjacent to the scanning sensor 2A. There is an area to display. As described above, the blank image may be an inspection screen pattern to be inspected next, or may be black. The region displaying the blank image is not detected by the scanning sensor.

  In the state of the liquid crystal panel 8e in which the inspection state has further advanced, the detection target position 9A of the scanning sensor 2A has moved further to the left on the panel surface than the state of the liquid crystal panel 8d, and the detection target position of the scanning sensor 2A. A screen pattern 4A to be inspected is displayed in the area corresponding to 9A. Further, the detection target position 9B of the scanning sensor 2B is also moved to the left on the panel surface of the liquid crystal panel 8d, and the screen pattern to be inspected is located in the region corresponding to the detection target position 9B of the scanning sensor 2B. 4B is displayed. A region displaying a blank image is provided between a region corresponding to the detection target position 9A of the scanning sensor 2A and a region corresponding to the detection target position 9B of the scanning sensor 2B.

  Thus, the lighting inspection method performed using the lighting inspection apparatus 1 according to the present embodiment changes the screen pattern to be inspected on the inspection panel 8 in accordance with the change in the detection target positions 9A to 9D of the scanning sensors 2A to 2D. Switch and display sequentially. And in the state of the liquid crystal panel 8i shown to Fig.2 (a), it is a screen state as shown in FIG.2 (b). That is, screen patterns 4A to 4D to be inspected are displayed in the areas corresponding to the detection target positions 9A to 9D of the scanning sensors 2A to 2D, respectively. In addition, there is a region for displaying blank images 5A to 5D between the regions displaying the screen patterns to be inspected.

  Before moving from the liquid crystal panel 8a to the liquid crystal panel 8j, the scanning sensor 2A detects from the right edge of the liquid crystal panel 8 to the left edge of the paper, and during that time, the detection target position 9A of the scanning sensor 2A is always covered. An inspection screen pattern 4A is displayed. That is, the inspection screen pattern 4A is inspected over the entire display screen of the liquid crystal panel 8.

  Similarly, before moving from the liquid crystal panel 8c to the liquid crystal panel 8l, the scanning sensor 2B detects from the right edge of the liquid crystal panel 8 to the left edge of the paper, and in the meantime, at the detection target position 9B of the scanning sensor 2B. The screen pattern 4B to be inspected is always displayed. That is, the inspection screen pattern 4B is inspected over the entire display screen of the liquid crystal panel 8.

  Similarly, before moving from the liquid crystal panel 8e to the liquid crystal panel 8n, the scanning sensor 2C detects from the right edge of the liquid crystal panel 8 to the left edge of the paper, and during that time, the detection target position 9C of the scanning sensor 2C is at the detection target position 9C. The screen pattern 4C to be inspected is always displayed. That is, the inspection screen pattern 4C is inspected over the entire display screen of the liquid crystal panel 8.

  Similarly, before moving from the liquid crystal panel 8g to the liquid crystal panel 8p, the scanning sensor 2D detects from the right edge of the liquid crystal panel 8 to the left edge of the paper, and in the meantime, at the detection target position 9D of the scanning sensor 2D. The screen pattern 4D to be inspected is always displayed. That is, the inspection screen pattern 4D is inspected over the entire display screen of the liquid crystal panel 8.

  As described above, the inspection over the entire display screen of the liquid crystal panel 8 can be completed for all the screen patterns 4A to 4D to be inspected before moving from the liquid crystal panel 8a to the liquid crystal panel 8p. During this time, the moving means 7 needs to perform acceleration and deceleration only once.

(Lighting inspection time)
Next, the time required for inspecting the display screen of the liquid crystal panel 8 for the four types of screen patterns 4A to 4D to be inspected using the lighting inspection device 1 will be described.

  The time required to accelerate the liquid crystal panel to a predetermined speed using the moving means 7 is a, and each scanning sensor 2A to 2D moves from the end of the liquid crystal panel 8 to the opposite end at a predetermined speed. Let t be the time required to detect the entire display screen, and d be the deceleration time required for the liquid crystal panel to stop from a predetermined speed.

  After the acceleration time a elapses, detection by the scanning sensor 2A starts. When the constant speed movement proceeds and the detection target positions of the scanning sensors 2B to 2D reach the position included in the liquid crystal panel 8, detection by each sensor is started. When the time t has elapsed since the start of detection, the detection by the scanning sensor 2A has ended, the detection by the scanning sensors 2B, 2C and 2D has already started, and the scanning sensor 4D For the screen pattern 4D to be inspected, 1/4 detection of the liquid crystal panel 8 has been completed. Therefore, the time required to detect the remaining screen is 3t / 4. That is, when 7t / 4 elapses from the start of detection, inspection of all screen patterns to be inspected is completed, and when the deceleration time d elapses, the moving means is stopped and the detection is completed. Therefore, as shown in FIG. 2C, the time required for performing the inspection using the lighting inspection apparatus 1 is [a + (7/4) t + d].

(Time required for lighting inspection by comparative configuration (1))
On the other hand, using the same lighting inspection apparatus as that of the conventional configuration described above (hereinafter referred to as the lighting inspection apparatus of the comparative configuration (1)), the inspection and inspection time by four types of screen patterns to be inspected are shown in FIG. This will be described with reference to FIGS. FIG. 10A shows only the panel 101 to be inspected and the scanning sensor 102 for the description in the lighting inspection apparatus 100 having the comparative configuration (1) shown in FIG.

  The lighting inspection apparatus 100 having the comparative configuration (1) displays a screen pattern to be inspected on the entire surface of the panel 101 to be inspected, and the scanning sensor 102 detects the entire surface of the panel 101 to be inspected, whereby image data on the entire surface of the panel to be inspected 101 The inspection is executed by imaging. The time required for this is shown in FIG. FIG. 10B is a graph with time on the horizontal axis and speed on the vertical axis. In this case, [a + t + d] is required to scan the entire surface of the panel 101 to be inspected once.

  When inspecting the four types of screen patterns 4A to 4D to be inspected, the first screen pattern 4A to be inspected is first displayed on the panel 101 to be inspected, and then the scanning sensor 102 detects the entire surface of the panel 101 to be inspected. Thus, image data of the entire panel 101 to be inspected is obtained. Next, after a second screen pattern 4B to be inspected is displayed on the panel 101 to be inspected, which is different from the screen pattern 4A to be inspected, the scanning sensor 102 moves in the opposite direction to the previous direction while moving the entire surface of the panel 101 to be inspected. By detecting, image data of the entire panel 101 to be inspected is obtained. The display process of the second screen pattern to be inspected is performed within the deceleration time when scanning the first screen pattern to be inspected and the acceleration time when scanning the second screen pattern to be inspected. By repeating this and performing two reciprocating scans, four types of screen patterns 4A to 4D to be inspected can be inspected. The inspection time at this time is [4a + 4t + 4d] as shown in FIG.

  FIG. 11 shows a method similar to the conventional method in which a plurality of scanning sensors are arranged and inspected in order to speed up the above-described processing. In the lighting inspection apparatus 110 shown in FIG. 11A, four scanning sensors 102 are arranged in the scanning direction, and the inspection target screen of the panel 101 to be inspected is divided into four sections. The inspection time is shortened by reducing the scanning distance to ¼. Each scanning sensor 102 is arranged so that the interval between the imaging parts of adjacent detection sensors is 1/4 of the length of the panel along the scanning direction.

  FIG. 11B shows the time required for inspecting one screen pattern to be inspected using the lighting inspection device 110. [A + (1/4) t + d] time is required to inspect the entire surface of the panel 101 to be inspected once. Compared with the case of the lighting inspection apparatus 100 shown in FIG. 10A, the time of (3/4) t is reduced per scan.

  FIG. 11C shows the time required for inspecting the four types of screen patterns to be inspected 4 </ b> A to 4 </ b> D using the lighting inspection device 110. As shown in FIG. 11C, the time required for inspecting the four types of screen patterns 4A to 4D to be inspected is [4a + t + 4d]. In this method, the constant velocity section is shortened in inverse proportion to the increase in the number of cameras.

(Comparison of lighting inspection time)
When comparing the inspection time required when using the lighting inspection apparatus 1 of the present embodiment shown in FIG. 1 with the inspection time required when using the lighting inspection apparatus 110 shown in FIG. 11A, (a + d) When> (t / 4), [4a + t + 4d]> [a + (7/4) t + d] is always satisfied. That is, in this case, as compared with the lighting inspection device 110, the time required for the lighting inspection by the lighting inspection device 1 is increased.

  Here, for example, when the acceleration time a is 1 second, the time t in the constant velocity section is 2 seconds, and the deceleration time d is 1 second, the lighting inspection device 110 has an inspection time of 10 seconds. Thus, it is 5.5 seconds, and it can be seen that the configuration of the present invention achieves higher speed.

  Here, a comparison was made with a configuration in which four scanning sensors are arranged using four types of screen patterns 4A to 4D, but the number of screen patterns to be inspected and the number of scanning sensors are the same. It is not limited. For example, when compared with a configuration in which eight scanning sensors are arranged using eight types of screen patterns to be inspected, [8a + t + 8d] is 18 seconds in the conventional configuration. On the other hand, in the lighting inspection apparatus of the present invention, [a + (15/8) t + d], which is approximately 5.8 seconds. That is, the configuration of the present invention achieves higher speed.

  In general, for m types of screen patterns to be inspected, using m scanning sensors, the width of the panel to be inspected along the array direction of the scanning sensors is w, and the interval between the detection target positions of the scanning sensors is defined as w. In the case where the inspection is performed with w / m being set so that the width of the inspection image along the arrangement direction of the scanning sensor is w / 2 m, the lighting inspection apparatus of the present invention can inspect all inspection images. The time required is [a + (2- (1 / m)) t + d]. Then, the signal generator displays only one type of inspection image on the entire display screen, accelerates and decelerates the moving means each time inspection of one inspection image is completed, and inspects the next inspection image In (1), the time required for inspection of all inspection images is [(a + (t / m) + d) m]. Therefore, if (a + d)> (t / m) is satisfied, the relationship of [(a + (t / m) + d) m]> [a + (2- (1 / m)) t + d] is always satisfied. Become. That is, the lighting inspection apparatus of the present invention always has a shorter inspection time than the comparative configuration (1). Therefore, even if the panel to be inspected becomes larger and the inspection section becomes longer, the inspection speed can always be higher than that of the conventional technique. However, the interval between the detection target positions of adjacent scanning sensors is w / m, and the signal generator has the screen pattern to be inspected so that the width along the inspection direction of the screen pattern to be inspected is w / 2 m. Is displayed.

(Comparison of lighting inspection time with comparative configuration (2))
FIG. 5A shows a lighting inspection device similar to the conventional one in which the scanning sensors 32A to 32D are arranged at intervals wider than the width of the liquid crystal panel 8 in the inspection direction (hereinafter, the lighting inspection of the comparative configuration (2)). Described as a device). The lighting inspection apparatus of the comparative configuration (2) performs inspection for each screen pattern to be inspected while transporting the liquid crystal panel 8 in one direction. FIG. 5B shows this embodiment. Both the configurations shown in FIGS. 5A and 5B do not require reciprocal scanning when inspecting a plurality of screen patterns to be inspected. Here, when the configuration of FIG. 5A and the configuration of FIG. 5B are compared, the inspection time (throughput) required for each type of screen pattern to be inspected is the same. However, in the embodiment of the present invention shown in FIG. 5B, the time (lead time) required for inspecting all types of screen patterns to be inspected and the footprint of the apparatus are shown in FIG. Compared with the lighting inspection apparatus, each can be reduced to ¼.

  In recent years, with an increase in the size of the liquid crystal panel, an increase in the weight of the optical system constituting the scanning sensor and the liquid crystal panel 8 itself is remarkable. Therefore, the scanning stage for moving them is steadily increasing in size, increasing the time required for acceleration and deceleration, leading to an increase in energy cost for inspection. Therefore, the embodiment of the present invention shown in FIG. 5B reduces the time required for acceleration and deceleration, simplifies the configuration of the apparatus, and realizes energy cost reduction. That is, the embodiment of the present invention shown in FIG. 5B is a form suitable for a liquid crystal panel that is enlarged.

(Scanning sensor layout pattern)
In another embodiment, the scanning sensor can be arranged at the following intervals.

  6A to 6C are diagrams schematically showing the arrangement position of the scanning sensor 19 in another embodiment. In FIG. 6A, two scanning sensors 19 are arranged, and the interval 20 between the detection target positions is 2/3 of the length 18 along the moving direction of the liquid crystal panel 8. It is arranged. In this case, the signal generator 6 preferably displays the pattern to be inspected by dividing the display screen into three. In FIG. 6B, three scanning sensors 19 are arranged, and the interval 20 between the detection target positions of adjacent sensors is 2/5 of the length 18 along the moving direction of the liquid crystal panel 8. Are arranged as follows. In this case, the signal generator 6 preferably displays the pattern to be inspected by dividing the display screen into five. In FIG. 6C, four scanning sensors 19 are arranged, and the interval 20 between the detection target positions of adjacent sensors is 2/7 of the length 18 along the moving direction of the liquid crystal panel 8. Are arranged as follows. In this case, the signal generator 6 preferably displays the pattern to be inspected by dividing the display screen into seven.

  When the lighting inspection apparatus of the present invention is used to perform inspection by dividing the display screen into n, it is preferable to arrange scanning sensors of (n + 1) / 2 or less.

  It is also possible to arrange a plurality of scanning sensors in advance, obtain the division number of the display screen from the inspection information data, and adjust the number of scanning sensors used at the time of inspection according to the division number.

(LCD panel)
FIG. 7 is a schematic diagram of a liquid crystal panel in which wiring is grouped for each block. In the initial stage of the manufacturing process of the liquid crystal panel, the wirings 21 for supplying a signal for displaying the screen pattern to be inspected are grouped for each block. As shown in FIG. However, some screen patterns can only be changed. In order to apply the inspection method of the present invention, it is preferable to design the panel so that the number of display blocks is increased in accordance with the number of screen patterns to be inspected.

[Embodiment 2]
Another embodiment according to the present invention will be described below with reference to FIG. In addition, in this embodiment, in order to explain a difference from the first embodiment, for the sake of convenience of explanation, members having the same functions as those described in the first embodiment are denoted by the same member numbers. The description is omitted.

  The lighting inspection apparatus according to the present embodiment can achieve higher speed than the lighting inspection apparatus according to the first embodiment described above.

  In the first embodiment described above, the scanning sensors 2A to 2D are arranged such that the interval between the detection target positions of the adjacent scanning sensors is ¼ of the length along the moving direction of the liquid crystal panel 8. It was the arrangement which has been arranged. In contrast, the lighting inspection apparatus 12 of the present embodiment has four scanning sensors 2A to 2D arranged in the movement direction as shown in FIG. 3A, but the distance between the sensors is shortened. The distance between the scanning sensors 2A and 2D is halved compared to the lighting inspection apparatus 1 shown in FIG. That is, the lighting inspection apparatus 12 of the present embodiment is configured so that the interval between the detection target positions of adjacent scanning sensors is 1/8 of the length along the moving direction of the liquid crystal panel 8. 2A to 2D are arranged.

  In this case, there is no change in the time required for acceleration and deceleration as compared with the lighting inspection apparatus 1 shown in FIG. However, when the scanning sensor 2A completes the detection of the first screen pattern 4A to be inspected, that is, after the time (a + t) has elapsed since the start of the inspection, the scanning sensor 2D has the fourth screen pattern to be inspected. For 4D, detection has been completed for 5/8 of the display screen, and the time required to detect the remaining display screen is 3t / 8. Therefore, the inspection time in this case is [a + (11/8) t + d] as shown in FIG. Here, when the acceleration time a is 1 second, the constant velocity section t is 2 seconds, and the deceleration time d is 1 second, the inspection time by the lighting inspection device 12 is 4.8 seconds, and the lighting inspection device shown in FIG. Higher speed than 1 is achieved.

  In general, for m types of screen patterns to be inspected, using m scanning sensors, the width of the panel to be inspected along the array direction of the scanning sensors is w, and the interval between the detection target positions of the scanning sensors is defined as w. When the inspection is performed with w / pm being set so that the width of the inspection image along the arrangement direction of the scanning sensor is w / 2 pm, the lighting inspection apparatus according to the present invention can inspect all inspection images. The time required is [a + (1+ (m−1) / pm)) t + d]. This time decreases as the value of p increases. That is, the lighting inspection apparatus of the present invention can shorten the inspection time by increasing the value of p, that is, by reducing the installation distance between scanning sensors and reducing the width of the inspection image. It becomes.

  In addition, this invention is not limited to embodiment mentioned above, A various change is possible in the range shown to the claim. In other words, embodiments obtained by combining technical means appropriately changed within the scope of the claims are also included in the technical scope of the present invention.

(Additional notes)
In addition, it can be paraphrased that the lighting inspection apparatus of the present invention has the following points as characteristic points. That is, in a lighting inspection apparatus in which a plurality of scanning sensors are arranged in series, a sensor group installed so that the interval between the imaging target portions of the sensor is smaller than the panel size in the scanning direction, A signal generator that sequentially switches in a direction opposite to the direction of relative movement so as to maintain the type of screen pattern to be inspected in the imaging target region of each sensor in correspondence with the relative movement of the sensor group; In other words.

  The lighting inspection apparatus according to the present invention can be suitably used for a lighting inspection for inspecting a lighting state in a display screen in a manufacturing process of a flat panel display such as a liquid crystal panel.

It is a schematic diagram which shows the structure of the lighting test | inspection apparatus in embodiment of this invention. (A) is the figure which represented the transition of the test | inspection at the time of using the lighting test | inspection apparatus shown in FIG. 1, (b) is the lighting test | inspection apparatus and liquid crystal panel in the time of a test | inspection. It is the figure represented typically, (c) is the figure which showed the time required for the test | inspection at the time of using the lighting test | inspection apparatus shown in FIG. (A) is the figure which represented typically the lighting test | inspection apparatus in another embodiment of this invention, (b) showed the time required for the test | inspection at the time of using the lighting test | inspection apparatus of (a). FIG. It is the schematic diagram which represented typically the lighting test | inspection apparatus and liquid crystal panel in embodiment of this invention. (A) is a schematic diagram showing the scanning method of the conventional lighting test | inspection apparatus, (b) is a schematic diagram showing the lighting test | inspection apparatus in embodiment of this invention. (A)-(c) is the figure showing the arrangement pattern of the scanning sensor in embodiment of this invention. (A) And (b) is a schematic diagram which shows the liquid crystal panel which put together wiring for every block. It is a schematic diagram which shows the defect of a liquid crystal panel. It is a schematic diagram which shows the basic composition of the conventional lighting test | inspection apparatus. (A) is a schematic diagram showing the scanning method of the conventional lighting inspection apparatus, and (b) and (c) are diagrams showing the time required for inspection when the lighting inspection apparatus of (a) is used. is there. (A) is a schematic diagram showing the scanning method of another conventional lighting inspection apparatus, (b) and (c) show the time required for the inspection when the lighting inspection apparatus of (a) is used. FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Lighting inspection apparatus 2A-2D Scan type sensor (sensor)
3 Detection means 4A to 4D Screen pattern to be inspected (inspection image)
5A to 5D Blank image 6 Signal generator 7 Stage control device (moving means)
8 LCD panel (panel to be inspected)
8a to 8e, 8g, 8i, 8j, 8l, 8n, 8p liquid crystal panel (test panel)
9A to 9D Detection target position 10 Image processing device 11 Movement direction 12 Lighting inspection device 13 Right end 14 Left end 15 Divided region 16 Display width 17a to 17c Detection target position interval 18 Panel length (width)
19 Scanning sensor (sensor)
DESCRIPTION OF SYMBOLS 20 Detection target position 21 Wiring 32A-32D Scanning sensor 100 Lighting inspection apparatus 101 Panel to be inspected 102 Detection sensor 103 Scanning stage 104 Stage control apparatus 105 Signal generator 106 Image processing apparatus 110 Lighting inspection apparatus 200 Liquid crystal panel 201, 202 Point defect 203, 204 LCD panel 205 Picture element 210r, 220r Red dot 210g, 220g Green dot 210b, 220b Blue dot

Claims (10)

A signal generator for supplying a signal to the panel to be inspected and displaying an inspection image on a display screen of the panel to be inspected;
A plurality of sensors for detecting the inspection image from a position facing the display screen, detection means arranged in series,
A lighting inspection apparatus comprising a moving means for relatively moving the panel to be inspected and the detecting means along an arrangement direction of the sensors,
The interval between the detection target positions of the adjacent sensors is shorter than the total length in the arrangement direction in one panel to be inspected,
The signal generator displays different images at a detection target position by a certain sensor and a detection target position by another sensor different from the certain sensor, and the panel to be inspected and the detection means While the relative movement is, for each of the sensors, the same inspection image is displayed at the detection target position,
The lighting inspection apparatus, wherein the moving means relatively moves the certain sensor and the other sensor from one end to the other end in the arrangement direction of one panel to be inspected. The signal generator displays the inspection image of a certain type for each region obtained by dividing the display screen into a plurality along the arrangement direction,
The sensor has a predetermined detection width along the arrangement direction,
The lighting inspection apparatus according to claim 1, wherein a width of the region along the arrangement direction is wider than the predetermined detection width of the sensor.   The signal generator has a predetermined direction along the arrangement direction between the region corresponding to the detection target position of the certain sensor and the region corresponding to the detection target position of a sensor adjacent to the certain sensor. The lighting inspection apparatus according to claim 2, wherein a blank image having a width is displayed.   The lighting inspection apparatus according to claim 3, wherein the blank image is a black image.   The signal generator has a predetermined direction along the arrangement direction between the region corresponding to the detection target position of the certain sensor and the region corresponding to the detection target position of a sensor adjacent to the certain sensor. The lighting inspection apparatus according to claim 2, wherein the lighting inspection apparatus is in a non-lighting state in width.   The lighting inspection apparatus according to claim 2, wherein the number of sensors is determined by the number of the regions.   The signal generator displays the same inspection image at the detection target position for each of the sensors based on a relative position between the sensor and the panel to be inspected. The lighting inspection device according to claim 1.   The said signal generator displays the said same test | inspection image in the said detection target position for every said sensor based on predetermined time, The any one of Claim 1 to 6 characterized by the above-mentioned. Lighting inspection device. The number of sensors is m, the time required for acceleration of the moving means is a, the time required for deceleration of the moving means is d, and the moving means moves the certain sensor from one end in the arrangement direction of the panel to be inspected. If the time taken for relative movement to the other end is t,
The interval between the detection target positions of the adjacent sensors is w / pm, where w is the width from one end to the other end in the arrangement direction of the panel to be inspected and p is a positive integer,
The signal generator displays the inspection image such that a width along the arrangement direction of the inspection image is w / 2 pm,
The w / pm is larger than a predetermined detection width value of the sensor along the arrangement direction and satisfies (a + d)> (t / pm). Lighting inspection device according to item. A lighting inspection method that scans an inspection image displayed on a display screen of a panel to be inspected by a plurality of sensors arranged in series, and inspects the lighting of the display screen,
Different images are displayed at a detection target position by a certain sensor and a detection target position by another sensor different from the certain sensor, and the certain sensor and the other sensor are A lighting inspection method, wherein the same inspection image is displayed at the detection target position for each sensor while the sensor panel is relatively moved from one end to the other end in the arrangement direction of the sensors.