JP2002340740A - Method for inspecting address of display defect in liquid crystal display unit - Google Patents

Abstract

PROBLEM TO BE SOLVED: To allow a line defect to be displayed readily distinguishably from a background screen and to allow the display defect to be easily inspected in a step of specifying a causing address of a line defect fault of a liquid crystal display unit. SOLUTION: A method for inspecting the address of the display defect in the liquid crystal display unit comprises a step of inspecting the display defect address of the display unit by using a display pattern of the display unit of a repeating pattern of two color dots on the background screen in the pattern which can specify the address of the desired position by moving a cursor on the display screen in the image display pattern for searching the display defect address while lighting a panel. For example, a lateral line defect pattern 2 of a central part is displayed by dots of a relatively slightly dense halftone display, and lateral line defect pattern 2 except them is displayed by dots of a halftone display near a relatively white display. Thus, the address of the defect part can be accurately taken.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to a method for inspecting addresses of display defects in a liquid crystal display device which drives a liquid crystal using a thin film transistor (TFT) array substrate on which a plurality of transistors are formed.

[0002]

2. Description of the Related Art When a liquid crystal display device is turned on, a line defect (hereinafter referred to as a line defect) such as a short circuit between lines due to a pattern defect, or all pixels using a specific line always looks bright sometimes occurs. In such a case, a wiring pattern is processed by a laser or the like, and a line defect is made invisible through a redundant circuit of an array pattern to make a normal display.

As a method of addressing a defective pixel, a charged-coupled device (CCD) camera for defect detection, an observation camera, and a laser are arranged at the same time, and the luminance difference of the defective portion is monitored by the CCD camera for defect detection. Addressing methods have been used in the prior art.

[0004]

Conventionally, when normalizing such a line defect, it is necessary to specify the location of a defective portion. Hereinafter, this method will be described. FIGS. 2A and 2B are image display patterns in a case where a defective portion of a line defect is specified. In FIG. 2A, reference numeral 1 denotes a vertical line defect pattern of the liquid crystal display device;
Is a horizontal line defect pattern of the liquid crystal display device, 3 is a line cursor pattern for detecting addresses of vertical line defects, 4 is a line cursor pattern for detecting addresses of horizontal line defects, and 5 is a cursor pattern. 3 and 4 are the address display of the location where the display is performed, the source line number and the gate line number are displayed in coordinates, and 6 is a portion which causes a display defect. FIG. 2B is an enlarged view of a display dot near the display defect causing portion 6. This image display pattern is a repeated pattern of two-color dots as a background screen, and a cursor pattern on a line of a color different from that of the background screen is overlapped in the vertical and horizontal directions. The gate wiring and source wiring numbers of the cross portion are simultaneously displayed in a different color from the background screen. The vertical and horizontal line cursor patterns can be selected within the entire range on the liquid crystal display screen, and by overlapping the line defect / point defect portion with the line pattern, the The address of the line defect can be specified.

[0005] However, a visible line defect may be displayed very difficult to see due to, for example, which of the two color dots on the background screen is short-circuited. For example, in FIG. 2B, the line defect in the vertical direction is easy to see, but has no gradation difference from the background screen in the horizontal direction, and is in a very hard to see state. In such a case, there is a problem that it is difficult to obtain the address of the display defect.

According to the present invention, in order to solve the above-mentioned conventional problems, in a step of specifying an origin address of a line defect defect of a liquid crystal display device, a displayed line defect is easily distinguished from a background screen so that a display defect can be distinguished. The purpose of the present invention is to clarify the discrimination of the address.

[0007]

According to the present invention, there is provided a method for inspecting a display defect address in a liquid crystal display device, the method comprising the steps of: displaying a display defect address of the liquid crystal display device while turning on a panel; Inspection using a display pattern of a liquid crystal display device, which is a pattern that can specify an address of a desired portion by moving a cursor on a display screen and a background screen is a repeating pattern of two-color dots. It is characterized by.

In the above method, it is preferable to change the two-color dots on the background screen to an arbitrary color.

Further, in the above method, the horizontal line defect pattern at the center is a dot of a relatively dark halftone display, and the other horizontal line defect patterns are relatively dark white display. It is preferable to use dots.

[0010]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention relates to an image display pattern for investigating a display defect address of a liquid crystal display device while turning on a panel, wherein an address of a desired portion is moved by moving a cursor on a display screen. By using a display pattern in which the background screen is a repeating pattern of two-color dots, the address of a display defect in the background screen in a repeating pattern of two-color dots can be inspected.

Further, by changing the two-color dots on the background screen to an arbitrary color, it is possible to improve the address acquisition accuracy when a display defect is difficult to distinguish from other background screens.

Hereinafter, an embodiment of the present invention will be described with reference to FIG.
This will be described with reference to FIG.

(Embodiment 1) FIGS. 1 (a) to 1 (c)
9 is an image display pattern in a case where a defect origin of a line defect is specified. In FIG. 1A, 1 is a vertical line defect pattern of the liquid crystal display device, 2 is a horizontal line defect pattern of the liquid crystal display device, 3 is a line cursor pattern for detecting an address of a vertical line defect, 4 Is a line cursor pattern for detecting the address of a horizontal line defect, 5 is an address display of a position where the cursor patterns 3 and 4 are displayed, and a source line number and a gate line number are displayed as coordinates. Is a portion that causes display defects. FIG.
(B) is an enlarged view of a display dot near the display defect causing part 6 in a conventional state. FIG. 1C is an enlarged view of a display dot in the vicinity of the display defect causing portion 6 so that a displayed line defect can be easily seen.

In FIG. 1 (c), the halftone display dots in FIG. 1 (b) can be made closer to white display, so that the horizontal line defect pattern 2 can be obtained.
Is made easier to see compared with the pattern of the background screen, and it was found that the line defect can be made more conspicuous. For example, the horizontal line defect pattern 2 at the center is a relatively dark halftone display dot, and the other horizontal line defect patterns 2 are halftone display dots relatively closer to white display. By the above, in the step of specifying the source address of the line defect failure of the liquid crystal display device,
It has been found that the displayed line defect can be easily distinguished from the background screen so that the address of the display defect can be easily obtained.

[0015]

According to the invention described above, in the step of specifying the origin address of the line defect failure of the liquid crystal display device, the background screen is a repetition pattern of two-color dots, and the two-color repetition dots can be arbitrarily set. By using a display pattern that can be changed to a color, the address of a defective portion can be accurately obtained.

[Brief description of the drawings]

FIG. 1 is a display pattern of a liquid crystal display device for addressing a defective portion according to an embodiment of the present invention;
(A) is an image diagram of a display pattern of the entire panel,
(B) is an enlarged view of the vicinity of the conventional (a) middle display failure cause part, and (c) is an enlarged view of the (a) middle display failure cause part 6 according to the embodiment of the present invention.

FIGS. 2A and 2B are image display patterns in a case where a defect caused by a line defect is specified in the related art; FIG. 2A is an image diagram of a display pattern of the entire panel; FIG. It is an enlarged view of the vicinity.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Vertical line defect 2 Horizontal line defect 3 Vertical address line cursor pattern 4 Horizontal address line cursor pattern 5 Address display part 6 Display failure origin part

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (Reference) G09F 9/00 352 G09F 9/00 352 5C094 9/30 338 9/30 338 5G435 9/35 9/35 ( 72) Inventor Nobuyuki Tsuboi 1006 Kazuma Kadoma, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.F-term (reference) AA41 AA43 BA03 BA43 CA19 EA03 EA04 EA07 5G435 AA17 AA19 BB12 CC09 KK05 KK09 KK10

Claims (3)

[Claims] 1. An image display pattern for investigating a display defect address of a liquid crystal display device while turning on a panel, wherein the address of a desired portion can be specified by moving a cursor on a display screen. And a method of inspecting the address of a display defect in a liquid crystal display device, wherein the inspection is performed using a display pattern of the liquid crystal display device in which a background screen is a repeating pattern of two-color dots. 2. The method according to claim 1, wherein the two-color dots on the background screen are changed to an arbitrary color. 3. The horizontal line defect pattern in the center portion is a relatively dark halftone display dot, and the other horizontal line defect patterns are relatively halftone display dots relatively closer to white display. Item 3. An address inspection method for a display defect in the liquid crystal display device according to item 1 or 2.