JP2002310619A - 測定装置 - Google Patents

測定装置

Info

Publication number
JP2002310619A
JP2002310619A JP2002023533A JP2002023533A JP2002310619A JP 2002310619 A JP2002310619 A JP 2002310619A JP 2002023533 A JP2002023533 A JP 2002023533A JP 2002023533 A JP2002023533 A JP 2002023533A JP 2002310619 A JP2002310619 A JP 2002310619A
Authority
JP
Japan
Prior art keywords
area
image
measured
virtual shape
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002023533A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002310619A5 (https=
Inventor
David Neil Slatter
デビッド・ニール・スレッター
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2002310619A publication Critical patent/JP2002310619A/ja
Publication of JP2002310619A5 publication Critical patent/JP2002310619A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Processing Or Creating Images (AREA)
JP2002023533A 2001-01-31 2002-01-31 測定装置 Pending JP2002310619A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0102413.2 2001-01-31
GB0102413A GB2371866A (en) 2001-01-31 2001-01-31 Measuring apparatus

Publications (2)

Publication Number Publication Date
JP2002310619A true JP2002310619A (ja) 2002-10-23
JP2002310619A5 JP2002310619A5 (https=) 2005-08-11

Family

ID=9907838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002023533A Pending JP2002310619A (ja) 2001-01-31 2002-01-31 測定装置

Country Status (4)

Country Link
US (1) US6760117B2 (https=)
JP (1) JP2002310619A (https=)
DE (1) DE10203851A1 (https=)
GB (2) GB2371866A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005040721A1 (ja) * 2003-10-29 2005-05-06 Waro Iwane ３ｄ自動測量装置
JP2010210458A (ja) * 2009-03-11 2010-09-24 Omron Corp ３次元視覚センサによる認識結果の表示方法および３次元視覚センサ
KR101296605B1 (ko) * 2011-02-20 2013-09-17 김준규 이미지를 이용한 체적 측량 방법 및 그 장치

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3867143B2 (ja) * 2003-06-25 2007-01-10 独立行政法人産業技術総合研究所 三次元顕微鏡システムおよび画像表示方法
WO2008002958A2 (en) * 2006-06-27 2008-01-03 Parlour, Barbara, E. Internal and external measuring device
US7518740B2 (en) * 2006-07-10 2009-04-14 Tokyo Electron Limited Evaluating a profile model to characterize a structure to be examined using optical metrology
US20080013107A1 (en) * 2006-07-11 2008-01-17 Tokyo Electron Limited Generating a profile model to characterize a structure to be examined using optical metrology
US8078436B2 (en) 2007-04-17 2011-12-13 Eagle View Technologies, Inc. Aerial roof estimation systems and methods
US8145578B2 (en) 2007-04-17 2012-03-27 Eagel View Technologies, Inc. Aerial roof estimation system and method
US8184909B2 (en) 2008-06-25 2012-05-22 United Technologies Corporation Method for comparing sectioned geometric data representations for selected objects
US8170840B2 (en) * 2008-10-31 2012-05-01 Eagle View Technologies, Inc. Pitch determination systems and methods for aerial roof estimation
US8209152B2 (en) * 2008-10-31 2012-06-26 Eagleview Technologies, Inc. Concurrent display systems and methods for aerial roof estimation
US9911228B2 (en) 2010-02-01 2018-03-06 Eagle View Technologies, Inc. Geometric correction of rough wireframe models derived from photographs
US9456768B2 (en) * 2010-08-18 2016-10-04 Stefano Soatto Spirometry system and disposable volume spirometry apparatus
US10663294B2 (en) 2012-02-03 2020-05-26 Eagle View Technologies, Inc. Systems and methods for estimation of building wall area and producing a wall estimation report
US8774525B2 (en) 2012-02-03 2014-07-08 Eagle View Technologies, Inc. Systems and methods for estimation of building floor area
US12140419B2 (en) 2012-02-03 2024-11-12 Eagle View Technologies, Inc. Systems and methods for estimation of building wall area and producing a wall estimation report
US9933257B2 (en) 2012-02-03 2018-04-03 Eagle View Technologies, Inc. Systems and methods for estimation of building wall area
US10515414B2 (en) 2012-02-03 2019-12-24 Eagle View Technologies, Inc. Systems and methods for performing a risk management assessment of a property
US9599466B2 (en) 2012-02-03 2017-03-21 Eagle View Technologies, Inc. Systems and methods for estimation of building wall area
US9959581B2 (en) 2013-03-15 2018-05-01 Eagle View Technologies, Inc. Property management on a smartphone
US10909482B2 (en) 2013-03-15 2021-02-02 Pictometry International Corp. Building materials estimation
US11587176B2 (en) 2013-03-15 2023-02-21 Eagle View Technologies, Inc. Price estimation model
EP3486607B1 (de) * 2017-11-20 2021-09-01 Leica Geosystems AG Bildbasierte kantenvermessung
US10503843B2 (en) 2017-12-19 2019-12-10 Eagle View Technologies, Inc. Supervised automatic roof modeling
US12332660B2 (en) 2018-11-21 2025-06-17 Eagle View Technologies, Inc. Navigating unmanned aircraft using pitch
IT201900007281A1 (it) * 2019-05-27 2020-11-27 West Systems Srl Apparato e metodo per l’acquisizione di misure lineari, angolari e di superficie di animali vivi o di carcasse di animali macellati
CN116608782A (zh) * 2022-02-08 2023-08-18 广州视源电子科技股份有限公司 检测物体尺寸的方法、存储介质以及电子设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127466A (ja) * 1982-01-26 1983-07-29 Fuji Xerox Co Ltd 画像拡大縮小方式
KR940007111B1 (ko) * 1985-06-14 1994-08-05 더브로큰 힐 프로프라이어터리 컴패니 리미티드 물체의 단면형상 및 윤곽의 측정방법 및 장치
US4730190A (en) * 1986-10-29 1988-03-08 Winlam Company Hand-held measuring device
US5440396A (en) * 1993-03-25 1995-08-08 United States Surgical Corporation Video comparator system
AUPO981997A0 (en) * 1997-10-15 1997-11-06 Lions Eye Institute Of Western Australia Incorporated, The Stereo optic disc analyser

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005040721A1 (ja) * 2003-10-29 2005-05-06 Waro Iwane ３ｄ自動測量装置
JPWO2005040721A1 (ja) * 2003-10-29 2007-04-19 岩根　和郎 ３ｄ自動測量装置
JP4545093B2 (ja) * 2003-10-29 2010-09-15 株式会社岩根研究所 ３ｄ自動測量装置
JP2010210458A (ja) * 2009-03-11 2010-09-24 Omron Corp ３次元視覚センサによる認識結果の表示方法および３次元視覚センサ
KR101296605B1 (ko) * 2011-02-20 2013-09-17 김준규 이미지를 이용한 체적 측량 방법 및 그 장치

Also Published As

Publication number Publication date
US6760117B2 (en) 2004-07-06
GB0102413D0 (en) 2001-03-14
DE10203851A1 (de) 2002-08-22
GB2371866A (en) 2002-08-07
GB2371867A (en) 2002-08-07
US20020101594A1 (en) 2002-08-01
GB2371867B (en) 2003-10-29
GB0129925D0 (en) 2002-02-06

Similar Documents

Publication Publication Date Title
JP2002310619A (ja) 測定装置
US20240153143A1 (en) Multi view camera registration
US7746377B2 (en) Three-dimensional image display apparatus and method
US9430871B2 (en) Method of generating three-dimensional (3D) models using ground based oblique imagery
JP4981135B2 (ja) 斜めモザイク画像の作成方法
EP2546806B1 (en) Image based rendering for ar - enabling user generation of 3d content
US20040202364A1 (en) Calibration object
US9454822B2 (en) Stereoscopic measurement system and method
CN101294793A (zh) 测量设备和控制方法
JP2002310619A5 (https=)
JP2003042732A (ja) 表面形状測定装置及びその方法、表面形状測定プログラム、並びに表面状態図化装置
EP2310799B1 (en) Stereoscopic measurement system and method
Al-Zahrani et al. Applications of a direct algorithm for the rectification of uncalibrated images
CN112082486A (zh) 一种手持式智能3d信息采集设备
EP2286297B1 (en) Stereoscopic measurement system and method
EP2283314A1 (en) Stereoscopic measurement system and method
JP4017351B2 (ja) ３次元モデル生成装置および３次元モデル生成プログラム
JP3385783B2 (ja) ステレオ計測における三次元位置計測方法
JPH0916653A (ja) 図形処理装置および図形処理方法
JP2005121674A (ja) 複数の三次元形状計測装置の座標系を一致させる方法
CN116612254A (zh) 点云数据处理方法、装置、计算机设备和存储介质
Matsubuchi et al. Square deformed map with simultaneous expression of close and distant view
HK1189067A (en) System for reproducing virtual objects

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050124

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050124

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070410

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070710

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080418

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20081003