JP2002305158A - Substrate processing apparatus - Google Patents

Substrate processing apparatus

Info

Publication number
JP2002305158A
JP2002305158A JP2001109870A JP2001109870A JP2002305158A JP 2002305158 A JP2002305158 A JP 2002305158A JP 2001109870 A JP2001109870 A JP 2001109870A JP 2001109870 A JP2001109870 A JP 2001109870A JP 2002305158 A JP2002305158 A JP 2002305158A
Authority
JP
Japan
Prior art keywords
substrate
temperature
processing
lamp
heating device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001109870A
Other languages
Japanese (ja)
Inventor
Kenji Shinozaki
賢次 篠崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Kokusai Electric Inc
Original Assignee
Hitachi Kokusai Electric Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Kokusai Electric Inc filed Critical Hitachi Kokusai Electric Inc
Priority to JP2001109870A priority Critical patent/JP2002305158A/en
Publication of JP2002305158A publication Critical patent/JP2002305158A/en
Pending legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To make the processing of a substrate uniform. SOLUTION: A rotary housing 2 is provided rotatably in a housing 1, and a rotary driving device 3 which rotates the rotary housing 2 is provided; and a platform 4 is provided at the upper part of the rotary housing 2, and a substrate 5 is supported on the platform 4. In a processing state, the heating temperature of a lamp heating device 11 is held at, for example 1,000 deg.C and in a conveyance stage, the substrate is conveyed, while the lamp heating device 11 is placed in operation.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はランプ加熱装置を有
する基板処理装置に関するものである。
The present invention relates to a substrate processing apparatus having a lamp heating device.

【0002】[0002]

【従来の技術】図3は従来の基板処理装置を示す概略断
面図である。図に示すようにハウジング1内に回転可能
に回転ハウジング2が設けられ、回転ハウジング2を回
転する回転駆動装置3が設けられ、回転ハウジング2の
上部に石英等からなるプラットフォーム4が設けられ、
プラットフォーム4上に基板5が支持され、ハウジング
1とプラットフォーム4との間の処理チャンバ6に処理
ガスを供給するガス供給装置7が設けられ、処理チャン
バ6に供給された処理ガスをプラズマ化するプラズマ発
生装置8が設けられ、処理チャンバ6が排気された状態
で装置の外部からプラットフォーム4上に基板5を搬送
し、プラットフォーム4上から装置の外部に基板5を搬
送するためのチャンババルブ9が設けられ、ピン(図示
せず)によりプラットフォーム4上に基板5を降下し、
ピンによりプラットフォーム4上から基板5を上昇する
ための基板昇降装置10が設けられ、プラットフォーム
4の下方部にランプ加熱装置11が設けられ、ランプ加
熱装置11に電気を供給するための電気供給線12が設
けられ、プラットフォーム4上に支持された基板5の温
度を測定する温度測定装置13が設けられ、温度測定装
置13は制御装置14に接続され(接続線図示せず)、
制御装置14に電気供給線12を介してランプ加熱装置
11が接続され、制御装置14はランプ加熱装置11の
動作シーケンスについての設定入力に基づいてランプ加
熱装置11の加熱温度を制御する。
2. Description of the Related Art FIG. 3 is a schematic sectional view showing a conventional substrate processing apparatus. As shown in the drawing, a rotatable housing 2 is provided in a housing 1 so as to be rotatable, a rotary drive device 3 for rotating the rotatable housing 2 is provided, and a platform 4 made of quartz or the like is provided on an upper portion of the rotatable housing 2.
A substrate 5 is supported on a platform 4, and a gas supply device 7 for supplying a processing gas to a processing chamber 6 between the housing 1 and the platform 4 is provided, and a plasma for converting the processing gas supplied to the processing chamber 6 into plasma is provided. A generator 8 is provided, and a chamber valve 9 for transferring the substrate 5 from outside the apparatus to the platform 4 while the processing chamber 6 is evacuated, and for transferring the substrate 5 from above the platform 4 to the outside of the apparatus is provided. Lowering the substrate 5 onto the platform 4 by means of pins (not shown),
A substrate elevating device 10 for elevating the substrate 5 from above the platform 4 by pins is provided, a lamp heating device 11 is provided below the platform 4, and an electric supply line 12 for supplying electricity to the lamp heating device 11. Is provided, and a temperature measuring device 13 for measuring the temperature of the substrate 5 supported on the platform 4 is provided. The temperature measuring device 13 is connected to a control device 14 (not shown in a connection line),
The lamp heating device 11 is connected to the control device 14 via the electric supply line 12, and the control device 14 controls the heating temperature of the lamp heating device 11 based on the setting input for the operation sequence of the lamp heating device 11.

【0003】つぎに、図3に示した基板処理装置による
基板処理方法について説明する。まず、処理チャンバ6
が排気された状態で、自動移載ロボット等によりチャン
ババルブ9から処理すべき基板5を処理チャンバ6内に
搬送して、基板5を基板昇降装置10のピン上に載置す
る。つぎに、基板昇降装置10により基板5をプラット
フォーム4上に降下する(搬送工程)。つぎに、ガス供
給装置7により処理チャンバ6に処理ガスを供給し、プ
ラズマ発生装置8により処理チャンバ6に供給された処
理ガスをプラズマ化して、基板5を処理する(処理工
程)。つぎに、基板昇降装置10により処理された基板
5をプラットフォーム4上から上昇する。つぎに、自動
移載ロボット等によりチャンババルブ9から基板5を処
理チャンバ6外に搬送する。つぎに、自動移載ロボット
等によりチャンババルブ9から処理すべき基板5を処理
チャンバ6内に搬送して、基板5を基板昇降装置10の
ピン上に載置する。つぎに、基板昇降装置10により基
板5をプラットフォーム4上に降下する(搬送工程)。
つぎに、ガス供給装置7により処理チャンバ6に処理ガ
スを供給し、プラズマ発生装置8により処理チャンバ6
に供給された処理ガスをプラズマ化して、基板5を処理
する(処理工程)。このようにして、つぎつぎと基板5
を処理する。
Next, a substrate processing method using the substrate processing apparatus shown in FIG. 3 will be described. First, the processing chamber 6
The substrate 5 to be processed is transported from the chamber valve 9 into the processing chamber 6 by an automatic transfer robot or the like in a state where is exhausted, and the substrate 5 is placed on the pins of the substrate elevating device 10. Next, the substrate 5 is lowered onto the platform 4 by the substrate lifting device 10 (transportation step). Next, the processing gas is supplied to the processing chamber 6 by the gas supply device 7, and the processing gas supplied to the processing chamber 6 is converted into plasma by the plasma generator 8, and the substrate 5 is processed (processing step). Next, the substrate 5 processed by the substrate lifting device 10 is lifted from above the platform 4. Next, the substrate 5 is transferred out of the processing chamber 6 from the chamber valve 9 by an automatic transfer robot or the like. Next, the substrate 5 to be processed is transferred from the chamber valve 9 into the processing chamber 6 by an automatic transfer robot or the like, and the substrate 5 is placed on the pins of the substrate lifting device 10. Next, the substrate 5 is lowered onto the platform 4 by the substrate lifting device 10 (transportation step).
Next, a processing gas is supplied to the processing chamber 6 by the gas supply device 7, and the processing chamber 6 is supplied by the plasma generator 8.
The substrate 5 is processed by converting the processing gas supplied to the substrate into plasma (processing step). In this manner, the substrate 5
Process.

【0004】この場合、従来においては、図4に示すよ
うに、処理工程Aにおいては、制御装置14によりラン
プ加熱装置11を制御して、ランプ加熱装置11の加熱
温度を処理温度tたとえば1000℃に保持し、搬送
工程Bにおいては、制御装置14によりランプ加熱装置
11を制御して、処理工程Aの終了直後にランプ加熱装
置11の加熱を停止し、処理工程Aを開始する前にラン
プ加熱装置11の加熱を開始する。この場合、ランプ加
熱装置11の加熱温度は室温tまで降温し、ランプ加
熱装置11の加熱温度は一定時間室温tに保持され、
処理工程Aの開始までにランプ加熱装置11の加熱温度
が処理温度tまで昇温する。
[0004] In this case, conventionally, as shown in FIG. 4, in step A, and controls the lamp heating device 11 by the controller 14, it processes the heating temperature of the lamp heater 11 temperature t 1 for example 1000 ° C, and in the transporting process B, the lamp heating device 11 is controlled by the control device 14 so that the heating of the lamp heating device 11 is stopped immediately after the processing process A is completed, and the lamp is heated before the processing process A is started. The heating of the heating device 11 is started. In this case, the heating temperature of the lamp heater 11 is lowered to room t 2, the heating temperature of the lamp heater 11 is held in a fixed time at room temperature t 2,
The heating temperature of the lamp heater 11 before the start of the process A is heated to the processing temperature t 1.

【0005】[0005]

【発明が解決しようとする課題】しかし、このような基
板処理装置においては、搬送工程Bにおいて、処理チャ
ンバ6内の温度が室温tまで低下するから、処理工程
Aにおいてランプ加熱装置11の加熱温度を処理温度t
にしたときに、処理チャンバ6内の温度が不安定とな
るので、基板5の処理を基板5の表面内において均一に
することができない。たとえば、処理が基板5上への成
膜のときには、基板5上に形成された膜の膜厚、膜質を
基板5の表面内において均一にすることができない。
[SUMMARY OF THE INVENTION However, in such a substrate processing apparatus, the conveyance step B, because the temperature in the processing chamber 6 is lowered to room temperature t 2, the heating of the lamp heater 11 in process step A Temperature to processing temperature t
When set to 1 , the temperature inside the processing chamber 6 becomes unstable, so that the processing of the substrate 5 cannot be made uniform within the surface of the substrate 5. For example, when the process is to form a film on the substrate 5, the thickness and quality of the film formed on the substrate 5 cannot be made uniform within the surface of the substrate 5.

【0006】本発明は上述の課題を解決するためになさ
れたもので、基板の処理を均一にすることができる基板
処理装置を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and has as its object to provide a substrate processing apparatus capable of uniformly processing a substrate.

【0007】[0007]

【課題を解決するための手段】この目的を達成するた
め、本発明においては、ランプ加熱装置を有しかつ処理
チャンバ内で基板を処理する基板処理装置において、上
記ランプ加熱装置を作動させた状態で上記基板を搬送す
る。
According to the present invention, there is provided a substrate processing apparatus having a lamp heating apparatus for processing a substrate in a processing chamber, wherein the lamp heating apparatus is operated. Transports the substrate.

【0008】[0008]

【発明の実施の形態】図1は本発明に係る基板処理装置
を示す概略断面図である。図に示すように、温度測定装
置13に接続された(接続線図示せず)制御装置21が
設けられ、制御装置21に電気供給線12を介してラン
プ加熱装置11が接続され、制御装置21はランプ加熱
装置11の動作シーケンスについての設定入力に基づい
てランプ加熱装置11の加熱温度を制御する。
FIG. 1 is a schematic sectional view showing a substrate processing apparatus according to the present invention. As shown in the figure, a control device 21 connected to the temperature measurement device 13 (not shown in the drawing) is provided. The lamp heating device 11 is connected to the control device 21 via the electric supply line 12. Controls the heating temperature of the lamp heating device 11 based on the setting input regarding the operation sequence of the lamp heating device 11.

【0009】図2により図1に示した基板処理装置のラ
ンプ加熱装置の加熱温度制御を説明する。まず、処理工
程Aにおいては、制御装置21によりランプ加熱装置1
1を制御して、ランプ加熱装置11の加熱温度を処理温
度tたとえば1000℃に保持する。そして、搬送工
程Bにおいては、制御装置21によりランプ加熱装置1
1を制御して、ランプ加熱装置11を作動させた状態
で、基板昇降装置10により処理された基板5をプラッ
トフォーム4上から上昇し、自動移載ロボット等により
チャンババルブ9から基板5を処理チャンバ6外に搬送
し、自動移載ロボット等によりチャンババルブ9から処
理すべき基板5を処理チャンバ6内に搬送し、基板5を
基板昇降装置10のピン上に載置し、基板昇降装置10
により基板5をプラットフォーム4上に降下して、基板
5を搬送する。すなわち、搬送工程Bにおいては、ラン
プ加熱装置11の加熱温度を室温tより高い待機温度
たとえば150℃まで降温し、ランプ加熱装置11
の加熱温度を一定時間待機温度tに保持し、処理工程
Aの開始までにランプ加熱装置11の加熱温度を処理温
度tまで昇温する。ここで、処理工程Aに要する時間
は約60秒であり、また搬送工程Bに要する時間は約1
30秒であり、処理温度tから待機温度tまで降温
するのに要する時間は約30秒であり、待機温度t
ら処理温度tまで昇温するのに要する時間は約40秒
である。
The heating temperature control of the lamp heating device of the substrate processing apparatus shown in FIG. 1 will be described with reference to FIG. First, in processing step A, the controller 21 controls the lamp heating device 1
And controls the 1, to hold the heating temperature of the lamp heater 11 treatment temperature t 1 for example, 1000 ° C.. Then, in the transport step B, the control device 21 controls the lamp heating device 1
The substrate 5 processed by the substrate lifting / lowering device 10 is lifted from the platform 4 while the lamp heating device 11 is operated by controlling the lamp heating device 11, and the substrate 5 is moved from the chamber valve 9 to the processing chamber by an automatic transfer robot or the like. The substrate 5 to be processed is transferred from the chamber valve 9 into the processing chamber 6 by an automatic transfer robot or the like, and the substrate 5 is placed on the pins of the substrate lifting device 10.
, The substrate 5 is lowered onto the platform 4 to transport the substrate 5. That is, in the conveyance step B, the temperature is lowered the heating temperature of the lamp heater 11 to a higher standby temperature t 3 for example 0.99 ° C. above room temperature t 2, the lamp heater 11
The heating temperature was kept constant time standby temperature t 3, the temperature is raised to the heating temperature up to the processing temperature t 1 of the lamp heater 11 before the start of the process steps A. Here, the time required for the processing step A is about 60 seconds, and the time required for the transporting step B is about 1 second.
Is 30 seconds, the time required to lowering the processing temperatures t 1 to a standby temperature t 3 is about 30 seconds, the time required for raising the temperature from the standby temperature t 3 to the treatment temperature t 1 is about 40 seconds is there.

【0010】このような基板処理装置においては、搬送
工程Bにおいて、処理チャンバ6内の温度が室温t
で低下しないから、処理工程Aにおいてランプ加熱装置
11の加熱温度を処理温度tにしたときに、処理チャ
ンバ6内の温度が不安定となることがないので、基板5
の処理を基板5の表面内において均一にすることができ
る。たとえば、処理が基板5上への成膜のときには、基
板5上に形成された膜の膜厚、膜質を基板5の表面内に
おいて均一にすることができる。たとえば、図3に示し
た従来の基板処理装置においては、基板5に形成された
膜の膜厚の均一性が±10%であったが、図1に示した
基板処理装置においては、基板5に形成された膜の膜厚
の均一性が±3%であった。また、処理が基板5の熱処
理のときには、基板5の表面内において均一に熱処理を
行なうことができる。
[0010] In this substrate processing apparatus, the conveyance step B, because the temperature in the processing chamber 6 is not reduced to room temperature t 2, the heating temperature of the lamp heater 11 process temperature t 1 in process step A Sometimes, the temperature in the processing chamber 6 does not become unstable.
Can be made uniform within the surface of the substrate 5. For example, when the process is to form a film on the substrate 5, the thickness and quality of the film formed on the substrate 5 can be made uniform within the surface of the substrate 5. For example, in the conventional substrate processing apparatus shown in FIG. 3, the uniformity of the thickness of the film formed on the substrate 5 is ± 10%, but in the substrate processing apparatus shown in FIG. The uniformity of the film thickness of the film formed was ± 3%. When the processing is a heat treatment of the substrate 5, the heat treatment can be uniformly performed in the surface of the substrate 5.

【0011】なお、上述実施の形態においては、処理温
度tをたとえば1000℃としたが、処理温度t
400〜1150℃としてもよい。また、上述実施の形
態においては、待機温度tをたとえば150℃とした
が、待機温度tは室温tよりも高くかつ処理温度t
よりも低ければよく、待機温度tを100〜200
℃とするのが望ましい。
[0011] Incidentally, in the above-described embodiment, although the processing temperature t 1 for example 1000 ° C., the process temperature t 1 may be 400 to 1,150 ° C.. Also, in the above-described embodiment, although the standby temperature t 3 for example, the 0.99 ° C., the standby temperature t 3 is higher than room temperature t 2 and the treatment temperature t
May be lower than 1, the standby temperature t 3 100~200
C is desirable.

【0012】[0012]

【発明の効果】本発明に係る基板処理装置においては、
処理工程において処理チャンバ内の温度が不安定となる
ことがないから、基板の処理を均一にすることができ
る。
According to the substrate processing apparatus of the present invention,
Since the temperature in the processing chamber does not become unstable in the processing step, the processing of the substrate can be made uniform.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る基板処理装置を示す概略断面図で
ある。
FIG. 1 is a schematic sectional view showing a substrate processing apparatus according to the present invention.

【図2】図1に示した基板処理装置のランプ加熱装置の
加熱温度制御の説明図である。
FIG. 2 is an explanatory diagram of heating temperature control of a lamp heating device of the substrate processing apparatus shown in FIG.

【図3】従来の基板処理装置を示す概略断面図である。FIG. 3 is a schematic sectional view showing a conventional substrate processing apparatus.

【図4】図3に示した基板処理装置のランプ加熱装置の
加熱温度制御の説明図である。
4 is an explanatory diagram of heating temperature control of a lamp heating device of the substrate processing apparatus shown in FIG.

【符号の説明】[Explanation of symbols]

5…基板 6…処理チャンバ 11…ランプ加熱装置 5: substrate 6: processing chamber 11: lamp heating device

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】ランプ加熱装置を有しかつ処理チャンバ内
で基板を処理する基板処理装置において、上記ランプ加
熱装置を作動させた状態で上記基板を搬送することを特
徴とする基板処理装置。
1. A substrate processing apparatus having a lamp heating device and processing a substrate in a processing chamber, wherein the substrate is transferred while the lamp heating device is operated.
JP2001109870A 2001-04-09 2001-04-09 Substrate processing apparatus Pending JP2002305158A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001109870A JP2002305158A (en) 2001-04-09 2001-04-09 Substrate processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001109870A JP2002305158A (en) 2001-04-09 2001-04-09 Substrate processing apparatus

Publications (1)

Publication Number Publication Date
JP2002305158A true JP2002305158A (en) 2002-10-18

Family

ID=18961748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001109870A Pending JP2002305158A (en) 2001-04-09 2001-04-09 Substrate processing apparatus

Country Status (1)

Country Link
JP (1) JP2002305158A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005311270A (en) * 2004-03-26 2005-11-04 Ushio Inc Heating stage

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005311270A (en) * 2004-03-26 2005-11-04 Ushio Inc Heating stage
JP4710255B2 (en) * 2004-03-26 2011-06-29 ウシオ電機株式会社 Heating stage

Similar Documents

Publication Publication Date Title
JP5478280B2 (en) Substrate heating apparatus, substrate heating method, and substrate processing system
JP6838010B2 (en) Substrate processing equipment, semiconductor equipment manufacturing methods and programs
KR101999230B1 (en) Method of processing substrate, substrate processing apparatus and non-transitory computer-readable recording medium
KR20190112785A (en) Substrate processing apparatus, manufacturing method and program of semiconductor device
US7393797B2 (en) Method for thermal processing a semiconductor wafer
JP2011066254A (en) Substrate treatment apparatus
JP3869499B2 (en) Substrate processing method
JP2002305158A (en) Substrate processing apparatus
KR20210050614A (en) Apparatus for processing substrate
US6781086B2 (en) Method for removing photoresist
JP2003100608A (en) Drying apparatus and drying method for film forming liquid
JP5358201B2 (en) Deposition method
JP2003124134A (en) System and method for heat treatment
JPH1129392A (en) Gas phase epitaxial growth and device therefor
JP4722416B2 (en) Semiconductor manufacturing apparatus, substrate transfer method, and semiconductor device manufacturing method
JPH04125948A (en) Heat treatment method
JP2010098247A (en) Substrate processing device
JP2002198320A (en) Heat treatment apparatus and its method, and method for manufacturing semiconductor device
JP4456727B2 (en) Semiconductor device manufacturing method and substrate processing apparatus
JP2000243719A (en) Lamp annealing method and apparatus thereof
JPH11135598A (en) Substrate carrying system
JP6906559B2 (en) Substrate processing equipment, semiconductor equipment manufacturing methods and programs
JP2007194481A (en) Substrate treatment apparatus
JP5385024B2 (en) Semiconductor manufacturing apparatus and semiconductor manufacturing method
JPH1098037A (en) Formation of sog material film and sog material film-forming device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050930

A131 Notification of reasons for refusal

Effective date: 20090630

Free format text: JAPANESE INTERMEDIATE CODE: A131

A977 Report on retrieval

Effective date: 20090630

Free format text: JAPANESE INTERMEDIATE CODE: A971007

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20091117