JP2002296559A - Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device - Google Patents

Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device

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Publication number
JP2002296559A
JP2002296559A JP2001097471A JP2001097471A JP2002296559A JP 2002296559 A JP2002296559 A JP 2002296559A JP 2001097471 A JP2001097471 A JP 2001097471A JP 2001097471 A JP2001097471 A JP 2001097471A JP 2002296559 A JP2002296559 A JP 2002296559A
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JP
Japan
Prior art keywords
display element
static electricity
liquid crystal
static
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001097471A
Other languages
Japanese (ja)
Inventor
Suenobu Sekiuchi
季宣 関内
Hiroshi Otaguro
洋 大田黒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2001097471A priority Critical patent/JP2002296559A/en
Publication of JP2002296559A publication Critical patent/JP2002296559A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To prevent defects due to static electricity generated at the time of manufacturing a planar display element, to improve the display quality even for a large-sized, high definition and high image quality planar display element and to reduce costs by improving a manufacture yield. SOLUTION: A static electricity evaluation substrate 10 composed by enclosing a liquid crystal composition 18 in a gap surrounded by a sealing agent 17 between first and second transparent glass plates 11 and 12 composed by oppositely arranging alignment layers 14 and 16 in the almost same size as a liquid crystal display element to be actually manufactured is made to flow along the manufacturing process of a planar display element manufacturing device. The change of light transmissivity on the static electricity evaluation substrate 10 generated by the static electricity generated at the time of making it flow is observed, the generation condition of the static electricity in the manufacturing process is accurately recognized and appropriate measures against the static electricity are taken.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、液晶表示素子等平
面表示素子の製造装置に係り、特に製造工程における静
電気の発生状態を調べる平面表示素子製造装置の静電気
評価基板及び平面表示素子製造装置静電気評価方法に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for manufacturing a flat display element such as a liquid crystal display element, and more particularly to a static evaluation board and a flat display element manufacturing apparatus for a flat display element manufacturing apparatus for examining a state of generation of static electricity in a manufacturing process. Regarding the evaluation method.

【0002】[0002]

【従来の技術】コンピュータ端末等の画像表示装置に用
いられ、一対の電極基板を対向配置してなる表示セルの
間隙に液晶やエレクトロ・ルミネセンス等の光変調層を
備えてなる平面表示素子にあっては、コンピュータ等の
性能向上に伴う表示容量及び表示面積の拡大、さらには
高画質、高精細化の要求により、近年配線層の加工が微
細化され、又光変調層が薄層化されている。
2. Description of the Related Art A flat display element used in an image display device such as a computer terminal and provided with a light modulation layer such as liquid crystal or electroluminescence in a gap between display cells in which a pair of electrode substrates are arranged opposite to each other. In recent years, due to the demand for higher display capacity and display area as well as higher image quality and higher definition due to the improvement of the performance of computers and the like, the processing of wiring layers has been miniaturized in recent years, and the light modulation layer has been made thinner. ing.

【0003】一方平面表示素子の製造時その製造工程に
おいて、ステージから電極基板を剥離する際に平面表示
素子製造装置と平面表示素子との間で静電気を生じ易
く、静電気を発生すると配線層間のショートを招くおそ
れがあり、特に配線層を微細加工した場合には静電気に
よる影響が大きくショートにより配線層が破壊され、点
欠陥や線状欠陥を生じ、表示品位を著しく低下しひいて
は製造歩留まりを低下する原因になっている。しかも静
電気は製造工程のどこで発生しているのか予想がつきに
くく、又静電気の発生は製造装置や平面表示素子の状態
によっても大きく変わることから、常に製造装置全体に
わたり静電気の発生状況を調査し把握することが重要と
されている。
On the other hand, in manufacturing a flat display element, in the manufacturing process, when the electrode substrate is separated from the stage, static electricity is easily generated between the flat display element manufacturing apparatus and the flat display element. In particular, when the wiring layer is finely processed, the influence of static electricity is large, and the wiring layer is destroyed due to short-circuit, causing point defects and linear defects, significantly lowering the display quality and consequently lowering the production yield. Cause. In addition, it is difficult to predict where static electricity is generated in the manufacturing process, and since the generation of static electricity varies greatly depending on the state of the manufacturing equipment and the flat display element, it is always necessary to investigate and understand the state of static electricity generation throughout the manufacturing equipment. It is important to:

【0004】このため従来は、平面表示素子製造装置の
必要箇所に非接触のセンサを配置して、製造工程におけ
る静電気の発生状況をモニタし、そのデータから製造装
置の異常または、平面表示素子を構成する部材の異常帯
電を監視して、異常箇所に除電設備を配置して静電気対
策を行い、製造歩留まりの向上を図っていた。
For this reason, conventionally, a non-contact sensor is arranged at a required position of a flat panel display device manufacturing apparatus, and the state of generation of static electricity in the manufacturing process is monitored. Abnormal charging of the constituent members is monitored, and static elimination equipment is disposed at an abnormal location to take measures against static electricity, thereby improving the production yield.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記従
来の必要箇所に非接触のセンサを用いて静電気の発生を
モニタする監視方法では、モニタの設置ポイント近傍で
の静電気の発生状況は判明するものの、広い製造工程の
全体にわたり静電気の発生状況を監視するのが不可能で
あった。しかもモニタが設置されるポイントにあって
も、平面表示素子の大型化に伴い、モニタから離れた平
面表示素子中央部での静電気の発生状況を把握できず、
平面表示素子全面に渡る正確なデータを得られず、有効
な静電気対策を施せないことから、平面表示素子の製造
歩留まりを低下してしまい、製造コストの低価格化の妨
げとなっていた。
However, according to the conventional monitoring method for monitoring the generation of static electricity by using a non-contact sensor at a necessary location, the state of generation of static electricity in the vicinity of the monitor installation point can be determined. It has not been possible to monitor static electricity generation throughout a wide manufacturing process. Moreover, even at the point where the monitor is installed, it is not possible to grasp the state of generation of static electricity at the center of the flat display element away from the monitor due to the increase in the size of the flat display element,
Since accurate data over the entire surface of the flat panel display element cannot be obtained and effective static electricity countermeasures cannot be taken, the manufacturing yield of the flat panel display element has been reduced, which has hindered a reduction in manufacturing cost.

【0006】そこで本発明は上記課題を除去するもの
で、平面表示素子製造装置の製造工程全体にわたり、又
平面表示素子の全面に渡る静電気の発生状況を正確に認
識して、有効な静電気対策を施す事により、平面表示素
子の表示品位の向上ひいては製造歩留まり向上を図り、
更には除電状況を把握して、より有効な静電気対策によ
る一層の生産性向上による低コスト化を実現する平面表
示素子製造装置の静電気評価基板及び平面表示素子製造
装置の静電気評価方法を提供することを目的とする。
Accordingly, the present invention has been made to solve the above-mentioned problems, and accurately recognizes the state of generation of static electricity over the entire manufacturing process of a flat display element manufacturing apparatus and over the entire flat display element to take effective countermeasures against static electricity. By applying, to improve the display quality of the flat display element, and eventually to improve the manufacturing yield,
Further, it is intended to provide a static electricity evaluation board for a flat display element manufacturing apparatus and a static electricity evaluation method for a flat display element manufacturing apparatus, which grasp the state of static elimination and realize cost reduction by further improving productivity by more effective measures against static electricity. With the goal.

【0007】[0007]

【課題を解決するための手段】本発明は上記課題を解決
するために、少なくともいずれか一方に電極を有し対向
配置される一対の電極基板の間隙に光変調層を封入して
なる平面表示素子と略同等サイズの一対の透明板と、こ
の一対の透明板に成膜され配向処理される配向膜と、こ
の配向膜を対向配置してなる前記一対の透明板の間隙に
封入される光変調層と、前記一対の透明板の外面に形成
される偏光板とを設けるものである。
In order to solve the above-mentioned problems, the present invention provides a flat display comprising a light modulation layer sealed in a gap between a pair of electrode substrates which have electrodes on at least one of the electrodes. A pair of transparent plates having substantially the same size as the element, an alignment film formed on the pair of transparent plates and subjected to an alignment treatment, and light sealed in a gap between the pair of transparent plates having the alignment films arranged to face each other. A modulation layer and a polarizing plate formed on the outer surfaces of the pair of transparent plates are provided.

【0008】又本発明は上記課題を解決するために、少
なくともいずれか一方に電極を有し対向配置される一対
の電極基板の間隙に光変調層を封入してなる平面表示素
子を製造する平面表示素子製造装置の静電気評価方法に
おいて、前記平面表示素子と略同等サイズであり、配向
処理してなる配向膜を有する一対の透明板の間隙に光変
調層を封入すると共に前記一対の透明板の外面に偏光板
を形成してなる静電気評価基板を、前記平面表示素子製
造装置における前記平面表示素子の製造工程に沿って搬
送し、前記静電気評価基板の表示状態を観察するもので
ある。
According to another aspect of the present invention, there is provided a flat display device for manufacturing a flat display element in which a light modulating layer is sealed in a gap between a pair of electrode substrates having electrodes on at least one of the electrodes. In the static electricity evaluation method of the display device manufacturing apparatus, the light modulation layer is sealed in a gap between a pair of transparent plates having substantially the same size as the flat display element and having an alignment film formed by performing an alignment process, and A static electricity evaluation substrate having a polarizing plate formed on its outer surface is transported along the flat display element manufacturing process in the flat display element manufacturing apparatus, and a display state of the static electricity evaluation substrate is observed.

【0009】そしてこのような構成により本発明は、平
面表示素子製造装置の製造工程に沿って実際に流品され
る静電気評価基板の表示状態を観察し、その結果から製
造工程における正確な静電気の発生状況更には除電設備
の状態等を認識して有効な静電気対策を実施し、平面表
示素子の表示品位向上更にはその製造歩留まり向上を図
るものである。
With such a configuration, the present invention observes the display state of the static electricity evaluation substrate actually circulated along the manufacturing process of the flat panel display device manufacturing apparatus, and, based on the result, accurately detects static electricity in the manufacturing process. An effective countermeasure against static electricity is recognized by recognizing the state of occurrence and the state of the static elimination equipment, thereby improving the display quality of the flat display element and the production yield thereof.

【0010】[0010]

【発明の実施の形態】以下、本発明の実施の形態を図1
を参照して説明する。図1は、静電気評価基板10を示
し、透明板である第1の透明ガラス板11及び第2の透
明ガラス板12をスペーサ13を介して配向膜14、1
6が対向する様対向配置し、更にシール剤17で囲繞さ
れる間隙に液晶組成物18を封入し、又第1及び第2の
透明ガラス板11、13の外面にそれぞれ第1及び第2
の偏光板20、21を貼り付けてなっている。
FIG. 1 is a block diagram showing an embodiment of the present invention.
This will be described with reference to FIG. FIG. 1 shows a static electricity evaluation substrate 10, in which a first transparent glass plate 11 and a second transparent glass plate 12, which are transparent plates, are aligned with an alignment film 14, 1 through a spacer 13.
6 are opposed to each other, a liquid crystal composition 18 is sealed in a gap surrounded by a sealant 17, and first and second transparent glass plates 11 and 13 are respectively provided on outer surfaces of the first and second transparent glass plates 11 and 13.
Polarizing plates 20 and 21 are attached.

【0011】この静電気評価基板10は、平面表示素子
製造装置で製造されるそれぞれの液晶表示素子のサイズ
と同一サイズの例えば400×500mmサイズを有
し、又配向膜14、16の配向特性、液晶組成物18材
料、スペーササイズ等、全て液晶表示素子と略同様に形
成されている。
The static evaluation board 10 has a size of, for example, 400 × 500 mm, which is the same as the size of each liquid crystal display element manufactured by the flat display element manufacturing apparatus. All of the composition 18, the material, the spacer size, etc. are formed in substantially the same manner as the liquid crystal display element.

【0012】次に静電気評価基板10の製造方法につい
て述べる。400×500mmサイズの第1の透明ガラ
ス板11の表面に、図示しない液晶表示素子に用いるの
と同様のポリイミド等からなる配向膜14を成膜する。
一方第2の透明ガラス板12にはフォトリソグラフィに
より液晶表示素子と同様サイズのスペーサ13を形成
後、配向膜16を成膜する。この後配向膜14、16を
それぞれ製造する液晶表示素子(図示せず)と同様にラ
ビングにより配向処理し、第1の透明ガラス板11の周
縁にシール剤17を塗布した後、第1及び第2の透明ガ
ラス板11、12を対向配置してシール剤17で貼り合
わせる。
Next, a method for manufacturing the static evaluation board 10 will be described. On the surface of the first transparent glass plate 11 having a size of 400 × 500 mm, an alignment film 14 made of polyimide or the like similar to that used for a liquid crystal display element (not shown) is formed.
On the other hand, after forming a spacer 13 having the same size as that of the liquid crystal display element on the second transparent glass plate 12 by photolithography, an alignment film 16 is formed. Thereafter, the alignment films 14 and 16 are subjected to an alignment treatment by rubbing in the same manner as in a liquid crystal display element (not shown) for producing each, and a sealant 17 is applied to the peripheral edge of the first transparent glass plate 11, and then the first and second liquid crystal display elements are coated. The two transparent glass plates 11 and 12 are opposed to each other, and are bonded with a sealant 17.

【0013】更に第1及び第2の透明ガラス板11、1
2のシール剤17で囲繞される間隙に液晶表示素子(図
示せず)と同様の液晶組成物18を注入後、図示しない
注入口を封止し、再配向のためのアニールを行った後第
1及び第2の透明ガラス板11、12の外面にそれぞれ
第1及び第2の偏光板20、21を貼り付けて例えばノ
ーマリーホワイトの静電気評価基板10を完成する。
Further, the first and second transparent glass plates 11, 1
After injecting a liquid crystal composition 18 similar to that of a liquid crystal display element (not shown) into a gap surrounded by the second sealant 17, sealing an inlet (not shown) and performing annealing for realignment, The first and second polarizing plates 20 and 21 are attached to the outer surfaces of the first and second transparent glass plates 11 and 12, respectively, to complete a normally white static evaluation board 10, for example.

【0014】このようにしてなる静電気評価基板10
は、静電気に対して反応し、静電気が発生した部分では
液晶組成物18中の液晶分子(図示せず)が立ち上が
る。従ってノーマリーホワイトの静電気評価基板10で
は、光を透過すると静電気発生部分が黒く表示されるの
で、この光透過状況を観察すれば、静電気発生状況を把
握出来る。尚、静電気評価基板をノーマリーブラックと
すれば、光を透過すると静電気発生部分は白く表示され
る。
The static evaluation board 10 thus constructed
Reacts with static electricity, and the liquid crystal molecules (not shown) in the liquid crystal composition 18 rise in the portion where the static electricity is generated. Therefore, in the normally white static evaluation board 10, when light is transmitted, the portion where the static electricity is generated is displayed in black. Therefore, by observing the light transmission status, the static electricity generation status can be grasped. If the static evaluation board is normally black, the portion where static electricity is generated is displayed white when light is transmitted.

【0015】しかして、平面表示素子製造装置(図示せ
ず)にて実際に液晶表示素子(図示せず)の製造工程を
実施する前に、先ず、液晶表示素子と同じサイズの静電
気評価基板10を、平面表示素子製造装置の製造工程に
従い実際に流品する。この静電評価基板10の流品時、
例えば配向膜14、16のラビング処理位置にあっては
実際の製造工程における静電気発生状態に近づけるよ
う、静電評価基板10表面を擦る等する。この様に静電
評価基板10を流品する間に静電評価基板10を擦った
り、製造装置のステージから剥離する等の操作を行う
と、第1あるいは第2の透明ガラス板11、12に静電
気が発生し、静電評価基板10内部に電界を形成する。
静電評価基板10には電極などが形成されていないため
直ちに放電される事無く、この静電評価基板10内部に
形成された電界は静電気を発生した箇所にある一定時間
留まり、その静電気発生箇所の液晶分子を立ち上がら
せ、光の透過率を変化させることとなる。
Before actually carrying out the manufacturing process of the liquid crystal display element (not shown) in the flat display element manufacturing apparatus (not shown), first, the static electricity evaluation substrate 10 having the same size as the liquid crystal display element is used. Is actually flowed out according to the manufacturing process of the flat panel display device manufacturing apparatus. When the electrostatic evaluation substrate 10 is flown,
For example, at the rubbing positions of the alignment films 14 and 16, the surface of the electrostatic evaluation substrate 10 is rubbed or the like so as to approach the state of generating static electricity in the actual manufacturing process. As described above, when an operation such as rubbing the electrostatic evaluation substrate 10 while peeling the electrostatic evaluation substrate 10 or peeling off the electrostatic evaluation substrate 10 from the stage of the manufacturing apparatus is performed, the first or second transparent glass plate 11 or 12 is formed. Static electricity is generated, and an electric field is formed inside the static evaluation board 10.
Since no electrodes and the like are formed on the electrostatic evaluation board 10, the electric field is not immediately discharged, and the electric field formed inside the electrostatic evaluation board 10 stays at a place where static electricity is generated for a certain period of time. This causes the liquid crystal molecules to rise, thereby changing the light transmittance.

【0016】従って、静電評価基板10を流品しなが
ら、例えば各製造工程にて静電評価基板10を擦ったり
ステージから剥離する毎に、静電評価基板10の光の透
過状況を目視により観察して、製造工程での静電評価基
板10への電荷の蓄積や製造装置と静電評価基板10間
での放電の様子等、静電気の発生状況及びイオナイザ等
の除電設備による除電状態等を把握する。そして静電評
価基板10の光透過状況を目視して得られた静電気の発
生状況に従い、製造装置に設置される除電設備の再調整
を行い、適切な静電気対策を行う。
Therefore, while the electrostatic evaluation substrate 10 is being distributed, for example, every time the electrostatic evaluation substrate 10 is rubbed or peeled off from the stage in each manufacturing process, the light transmission state of the electrostatic evaluation substrate 10 is visually observed. Observation, such as accumulation of electric charge on the electrostatic evaluation substrate 10 in the manufacturing process and the state of discharge between the manufacturing apparatus and the electrostatic evaluation substrate 10, the state of generation of static electricity, and the state of static elimination by static elimination equipment such as an ionizer, etc. Figure out. Then, in accordance with the state of generation of static electricity obtained by visually observing the light transmission state of the electrostatic evaluation board 10, readjustment of the static elimination equipment installed in the manufacturing apparatus is performed, and appropriate static electricity measures are taken.

【0017】この後平面表示素子製造装置にて、実際に
液晶表示素子の製造を開始する。又実際に液晶表示素子
を製造する間、所定量の製造工程を実施した場合は、製
造装置に再度静電評価基板10を流品し、その静電気の
発生状況を再観察し、イオナイザ等の劣化によるメンテ
ナンスの必要箇所等を把握し、再度静電気対策を行う。
更に、同じ平面表示素子製造装置を用いて、新たにサイ
ズの異なる液晶表示素子を製造する場合等にあっても、
その製造工程開始前に、新たに製造する液晶表示素子と
同一サイズの静電評価基板を流品し、再度静電気対策を
行う。
Thereafter, the production of the liquid crystal display element is actually started by the flat panel display element production apparatus. If a predetermined amount of manufacturing steps are performed during the actual manufacture of the liquid crystal display element, the static evaluation substrate 10 is flown again to the manufacturing apparatus, the state of generation of the static electricity is re-observed, and the deterioration of the ionizer or the like is checked. Grasp the necessary points for maintenance, etc. and take countermeasures against static electricity again.
Further, even when a liquid crystal display element having a different size is newly manufactured using the same flat display element manufacturing apparatus,
Before starting the manufacturing process, an electrostatic evaluation substrate having the same size as a liquid crystal display element to be newly manufactured is diverted, and countermeasures against static electricity are performed again.

【0018】この様に静電評価基板10を用いて平面表
示素子製造装置における静電気の発生状況を観察し、観
察結果に応じて適切な静電気対策を行った後液晶表示素
子を製造した所、製造工程において発生される静電気に
よる液晶表示素子への影響がほとんど見られず、配線層
の破壊による点欠陥や線状欠陥の無い良好な液晶表示素
子を得られたこの様に構成すれば、必要箇所にセンサを
設置する事無く、静電気の発生により光透過率を変化さ
せる静電評価基板10を製造装置上に流品し、その光透
過状況を観察するのみで、製造工程全体に渡る静電気の
発生状況を正確に把握出来る。また液晶表示素子の大型
化にかかわらず、その全面に渡る静電気の発生状況を正
確に把握出来る。この結果、適切な静電気対策を施すこ
とが出来、大型且つ高精細・高画質の液晶表示素子であ
ってもその製造時、静電気の発生により配線層が破壊さ
れるのを防止出来、液晶表示素子の表示品位向上ひいて
は製造歩留まりの向上を図れ、その生産性向上による低
コスト化を得られる。
As described above, the state of generation of static electricity in the flat panel display device manufacturing apparatus is observed using the electrostatic evaluation substrate 10, and appropriate measures are taken against static electricity according to the observation result. Almost no influence on the liquid crystal display element due to static electricity generated in the process was observed, and a good liquid crystal display element free of point defects and linear defects due to the destruction of the wiring layer was obtained. Without installing a sensor, the static evaluation substrate 10 that changes the light transmittance due to the generation of static electricity is flown onto a manufacturing apparatus, and only by observing the light transmission state, the generation of static electricity throughout the manufacturing process You can grasp the situation accurately. Further, regardless of the size of the liquid crystal display element, it is possible to accurately grasp the state of generation of static electricity over the entire surface. As a result, it is possible to take appropriate countermeasures against static electricity, and to prevent the wiring layer from being destroyed by the generation of static electricity at the time of manufacturing even a large, high-definition, high-quality liquid crystal display element. The display quality can be improved, and the production yield can be improved, and the cost can be reduced by improving the productivity.

【0019】尚本発明は上記実施の形態に限られるもの
でなく、その趣旨を変えない範囲での変更は可能であっ
て、例えば静電評価基板のサイズは限定されず、実際に
製造する平面表示素子のサイズと略同一であれば良い。
又、静電評価基板に封入する光変調層も、静電気発生箇
所の表示状態を変化可能とするものであれば液晶組成物
に限定されない。又静電評価基板のスペーサは球状のス
ペーサを散布する等しても良いし、透明板間の光変調層
を滴下法により封入する等しても良い。更に静電評価基
板の観察は製造装置上を流品している間に行ったり、あ
るいは製造装置から取り出して行う等任意であるし、透
明板の外側に反射板を取着したものであれば、反射光を
観察しても良い。
It should be noted that the present invention is not limited to the above-described embodiment, but can be changed without departing from the spirit of the present invention. For example, the size of the electrostatic evaluation board is not limited. It suffices if the size of the display element is substantially the same.
Further, the light modulation layer sealed in the electrostatic evaluation substrate is not limited to the liquid crystal composition as long as it can change the display state at the place where static electricity is generated. Further, as the spacer of the electrostatic evaluation substrate, a spherical spacer may be sprayed, or the light modulation layer between the transparent plates may be sealed by a dropping method. Furthermore, observation of the electrostatic evaluation substrate is optional while the product is being flown on the manufacturing apparatus, or is taken out of the manufacturing apparatus, and is optional, as long as a reflection plate is attached outside the transparent plate. Alternatively, the reflected light may be observed.

【0020】[0020]

【発明の効果】以上説明したように本発明によれば、静
電気の発生により表示状態が変化する静電評価基板を平
面表示素子製造装置上の製造工程に沿って流品して、そ
の表示状態を観察するのみで、製造工程全体にわたり、
大型の平面表示素子であってもその全面の静電気の発生
状況を正確に把握出来る。従って、製造工程において適
切な静電気対策を実施でき、大型且つ高精細・高画質の
平面表示素子であっても静電気を起因とする配線層の破
壊による不良を生じることが無く、表示品位の向上ひい
ては製造歩留まり向上によるコストの削減を図る事が出
来る。
As described above, according to the present invention, an electrostatic evaluation substrate, whose display state changes due to the generation of static electricity, is flown along the manufacturing process on a flat display element manufacturing apparatus, and the display state is changed. Only by observing the whole process
Even in the case of a large flat display element, the state of generation of static electricity on the entire surface can be accurately grasped. Accordingly, appropriate static electricity countermeasures can be taken in the manufacturing process, and even a large-sized, high-definition, high-quality flat display element does not cause a failure due to the destruction of the wiring layer due to static electricity, thereby improving display quality. The cost can be reduced by improving the manufacturing yield.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態の静電気評価基板の一部を
示す概略説明図である。
FIG. 1 is a schematic explanatory view showing a part of an electrostatic evaluation board according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

10…静電気評価基板 11…第1の透明ガラス板 12…第2の透明ガラス板 13…スペーサ 14、16…配向膜 17…シール剤 18…液晶組成物 20…第1の偏光板 21…第2の偏光板 DESCRIPTION OF SYMBOLS 10 ... Static evaluation board 11 ... 1st transparent glass plate 12 ... 2nd transparent glass plate 13 ... Spacer 14, 16 ... Alignment film 17 ... Sealant 18 ... Liquid crystal composition 20 ... 1st polarizing plate 21 ... 2nd Polarizer

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2H088 FA11 FA17 FA24 FA30 MA20 2H092 JB79 NA27 NA30  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2H088 FA11 FA17 FA24 FA30 MA20 2H092 JB79 NA27 NA30

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 少なくともいずれか一方に電極を有し対
向配置される一対の電極基板の間隙に光変調層を封入し
てなる平面表示素子と略同等サイズの一対の透明板と、 この一対の透明板に成膜され配向処理される配向膜と、 この配向膜を対向配置してなる前記一対の透明板の間隙
に封入される光変調層と、 前記一対の透明板の外面に形成される偏光板とを具備す
る事を特徴とする平面表示素子製造装置の静電気評価基
板。
1. A pair of transparent plates having substantially the same size as a flat display element in which a light modulation layer is sealed in a gap between a pair of electrode substrates having electrodes on at least one of them and opposed to each other. An alignment film formed on a transparent plate and subjected to an alignment treatment; a light modulating layer sealed in a gap between the pair of transparent plates having the alignment film opposed to each other; formed on outer surfaces of the pair of transparent plates A static evaluation board for a flat panel display device manufacturing apparatus, comprising: a polarizing plate.
【請求項2】 前記光変調層が液晶組成物であることを
特徴とする請求項1に記載の平面表示素子製造装置の静
電気評価基板。
2. The static evaluation board according to claim 1, wherein the light modulation layer is a liquid crystal composition.
【請求項3】 少なくともいずれか一方に電極を有し対
向配置される一対の電極基板の間隙に光変調層を封入し
てなる平面表示素子を製造する平面表示素子製造装置の
静電気評価方法において、 前記平面表示素子と略同等サイズであり、配向処理して
なる配向膜を有する一対の透明板の間隙に光変調層を封
入すると共に前記一対の透明板の外面に偏光板を形成し
てなる静電気評価基板を、前記平面表示素子製造装置に
おける前記平面表示素子の製造工程に沿って搬送し、前
記静電気評価基板の表示状態を観察する事を特徴とする
平面表示素子製造装置の静電気評価方法。
3. A static electricity evaluation method for a flat display element manufacturing apparatus for manufacturing a flat display element in which a light modulation layer is sealed in a gap between a pair of electrode substrates having electrodes on at least one of them and opposed to each other. A static electricity formed by enclosing a light modulation layer in a gap between a pair of transparent plates having an alignment film formed by performing an alignment process and having a polarizing plate formed on the outer surfaces of the pair of transparent plates. An electrostatic evaluation method for a flat display element manufacturing apparatus, comprising: transporting an evaluation substrate along a manufacturing process of the flat display element in the flat display element manufacturing apparatus, and observing a display state of the electrostatic evaluation substrate.
【請求項4】 前記静電気評価基板の表示状態の観察
を、前記静電気評価基板の光透過状態を観察することに
よりおこなうことを特徴とする請求項3に記載の平面表
示素子製造装置の静電気評価方法。
4. The method according to claim 3, wherein the observation of the display state of the static evaluation board is performed by observing the light transmission state of the static evaluation board. .
【請求項5】 前記光変調層が液晶組成物であることを
特徴とする請求項3又は請求項4のいずれかに記載の平
面表示素子製造装置の静電気評価方法。
5. The method according to claim 3, wherein the light modulation layer is a liquid crystal composition.
JP2001097471A 2001-03-29 2001-03-29 Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device Pending JP2002296559A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001097471A JP2002296559A (en) 2001-03-29 2001-03-29 Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001097471A JP2002296559A (en) 2001-03-29 2001-03-29 Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device

Publications (1)

Publication Number Publication Date
JP2002296559A true JP2002296559A (en) 2002-10-09

Family

ID=18951253

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001097471A Pending JP2002296559A (en) 2001-03-29 2001-03-29 Static electricity evaluation substrate for planar display element manufacturing device and static electricity evaluation method for planar display element manufacturing device

Country Status (1)

Country Link
JP (1) JP2002296559A (en)

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