JP2002271700A5 - - Google Patents

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Publication number
JP2002271700A5
JP2002271700A5 JP2002037631A JP2002037631A JP2002271700A5 JP 2002271700 A5 JP2002271700 A5 JP 2002271700A5 JP 2002037631 A JP2002037631 A JP 2002037631A JP 2002037631 A JP2002037631 A JP 2002037631A JP 2002271700 A5 JP2002271700 A5 JP 2002271700A5
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JP
Japan
Prior art keywords
intensity
circuit element
response
exposure period
time signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002037631A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002271700A (ja
JP4164790B2 (ja
Filing date
Publication date
Priority claimed from US09/788,044 external-priority patent/US20020113887A1/en
Application filed filed Critical
Publication of JP2002271700A publication Critical patent/JP2002271700A/ja
Publication of JP2002271700A5 publication Critical patent/JP2002271700A5/ja
Application granted granted Critical
Publication of JP4164790B2 publication Critical patent/JP4164790B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2002037631A 2001-02-16 2002-02-15 アクティブ・ピクセル・センサ・システムおよびアクティブ・ピクセル検知方法 Expired - Fee Related JP4164790B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/788,044 US20020113887A1 (en) 2001-02-16 2001-02-16 CMOS image sensor with extended dynamic range
US09/788044 2001-02-16

Publications (3)

Publication Number Publication Date
JP2002271700A JP2002271700A (ja) 2002-09-20
JP2002271700A5 true JP2002271700A5 (enExample) 2005-08-25
JP4164790B2 JP4164790B2 (ja) 2008-10-15

Family

ID=25143272

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002037631A Expired - Fee Related JP4164790B2 (ja) 2001-02-16 2002-02-15 アクティブ・ピクセル・センサ・システムおよびアクティブ・ピクセル検知方法

Country Status (3)

Country Link
US (1) US20020113887A1 (enExample)
EP (1) EP1233612B1 (enExample)
JP (1) JP4164790B2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7474345B2 (en) * 2001-10-24 2009-01-06 Texas Instruments Incorporated System and method to facilitate time domain sampling for solid state imager
US20030206236A1 (en) * 2002-05-06 2003-11-06 Agfa Corporation CMOS digital image sensor system and method
US7489352B2 (en) * 2002-11-15 2009-02-10 Micron Technology, Inc. Wide dynamic range pinned photodiode active pixel sensor (APS)
EP1759525A1 (en) * 2004-06-09 2007-03-07 Philips Intellectual Property & Standards GmbH Electronic circuit
US7462811B2 (en) * 2004-11-24 2008-12-09 Eastman Kodak Company Light detection circuit
US7489351B2 (en) * 2005-01-21 2009-02-10 Bae Systems Information And Electronic Systems Integration Inc. Dynamic range extension for focal plane arrays
KR100744117B1 (ko) * 2005-08-24 2007-08-01 삼성전자주식회사 손실이 없는 비선형 아날로그 게인 콘트롤러를 지닌 이미지 센서 및 제조 방법
JP5059767B2 (ja) * 2005-09-21 2012-10-31 アール・ジェイ・エス・テクノロジー・インコーポレイテッド 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
US7969490B2 (en) 2006-08-25 2011-06-28 Micron Technology, Inc. Method, apparatus, and system providing an imager with pixels having extended dynamic range
US8288701B2 (en) * 2009-03-03 2012-10-16 Aptina Imaging Corporation Method and system for controlling power to pixels in an imager
US9131142B2 (en) 2009-07-17 2015-09-08 Nikon Corporation Focusing device and camera
KR20110129626A (ko) * 2010-05-26 2011-12-02 삼성전자주식회사 화상독취장치, 이를 구비하는 화상형성장치 및 화상독취장치의 화상품질 제어방법
TWI513301B (zh) * 2010-06-02 2015-12-11 新力股份有限公司 半導體裝置，固態成像裝置及相機系統
JP2013009194A (ja) * 2011-06-24 2013-01-10 Denso Corp 画素回路およびイメージセンサ
FR3131493B1 (fr) * 2021-12-29 2024-11-08 Commissariat Energie Atomique Procédé et capteur d'image à large gamme dynamique
FR3131494B1 (fr) * 2021-12-29 2024-11-08 Commissariat Energie Atomique Procédé et capteur d'image à large gamme dynamique piloté par événement

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6344877B1 (en) * 1997-06-12 2002-02-05 International Business Machines Corporation Image sensor with dummy pixel or dummy pixel array
US6115066A (en) * 1997-06-12 2000-09-05 International Business Machines Corporation Image sensor with direct digital correlated sampling
US5877715A (en) * 1997-06-12 1999-03-02 International Business Machines Corporation Correlated double sampling with up/down counter
US5920274A (en) * 1997-08-05 1999-07-06 International Business Machines Corporation Image sensor employing non-uniform A/D conversion
US6580454B1 (en) * 1998-11-18 2003-06-17 Agilent Technologies, Inc. CMOS active pixel sensor having in-pixel local exposure control
US6525304B1 (en) * 2000-11-28 2003-02-25 Foveon, Inc. Circuitry for converting analog signals from pixel sensor to a digital and for storing the digital signal

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