JP2002048673A5 - - Google Patents

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Publication number
JP2002048673A5
JP2002048673A5 JP2000236748A JP2000236748A JP2002048673A5 JP 2002048673 A5 JP2002048673 A5 JP 2002048673A5 JP 2000236748 A JP2000236748 A JP 2000236748A JP 2000236748 A JP2000236748 A JP 2000236748A JP 2002048673 A5 JP2002048673 A5 JP 2002048673A5
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JP
Japan
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JP2000236748A
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Japanese (ja)
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JP2002048673A (ja
JP4768904B2 (ja
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Publication of JP2002048673A5 publication Critical patent/JP2002048673A5/ja
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JP2000236748A 2000-08-04 2000-08-04 光学素子又は光学系の物理量測定方法 Expired - Fee Related JP4768904B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000236748A JP4768904B2 (ja) 2000-08-04 2000-08-04 光学素子又は光学系の物理量測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000236748A JP4768904B2 (ja) 2000-08-04 2000-08-04 光学素子又は光学系の物理量測定方法

Publications (3)

Publication Number Publication Date
JP2002048673A JP2002048673A (ja) 2002-02-15
JP2002048673A5 true JP2002048673A5 (enrdf_load_stackoverflow) 2007-09-27
JP4768904B2 JP4768904B2 (ja) 2011-09-07

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ID=18728747

Family Applications (1)

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JP2000236748A Expired - Fee Related JP4768904B2 (ja) 2000-08-04 2000-08-04 光学素子又は光学系の物理量測定方法

Country Status (1)

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JP (1) JP4768904B2 (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4000086B2 (ja) * 2003-04-17 2007-10-31 株式会社トーメーコーポレーション レンズの基礎データの測定方法及び測定装置
JP2004325880A (ja) * 2003-04-25 2004-11-18 Olympus Corp 光学系の設計方法
JP5721420B2 (ja) * 2010-12-17 2015-05-20 キヤノン株式会社 計測方法及び計測装置
JP6029429B2 (ja) * 2012-11-19 2016-11-24 キヤノン株式会社 波面収差測定方法、波面収差測定装置、及び光学系の製造方法
WO2022224344A1 (ja) * 2021-04-20 2022-10-27 オリンパス株式会社 偏心測定方法および偏心測定装置
CN115436016B (zh) * 2022-07-29 2024-04-12 中国人民解放军32181部队 激光销毁设备变焦与穿透能力的一体化测试评估方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05226228A (ja) * 1992-02-14 1993-09-03 Fujitsu Ltd Ｘ線発生装置及びｘ線反射鏡光軸合わせ方法
JP3597222B2 (ja) * 1993-09-01 2004-12-02 オリンパス株式会社 レンズ，反射鏡等の偏心測定法及びそれを利用した機械
US6747702B1 (en) * 1998-12-23 2004-06-08 Eastman Kodak Company Apparatus and method for producing images without distortion and lateral color aberration

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