JP2001504992A - 光検出装置 - Google Patents
光検出装置Info
- Publication number
- JP2001504992A JP2001504992A JP52314998A JP52314998A JP2001504992A JP 2001504992 A JP2001504992 A JP 2001504992A JP 52314998 A JP52314998 A JP 52314998A JP 52314998 A JP52314998 A JP 52314998A JP 2001504992 A JP2001504992 A JP 2001504992A
- Authority
- JP
- Japan
- Prior art keywords
- bias
- resistor
- transistor
- reverse
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000001514 detection method Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 4
- 229920005591 polysilicon Polymers 0.000 claims description 4
- 239000004020 conductor Substances 0.000 claims 1
- 230000003071 parasitic effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.バイアス電流を提供するために配置されたバイアス回路; 前記バイアス回路によって逆バイアスするように配置された制御電極および導 電性電極を有する逆バイアス・トランジスタ;および 供給電圧と前記逆バイアス・トランジスタの前記導電性電極との間に結合され た抵抗; から構成され、 前記逆バイアス・トランジスタの前記導電性電極における電圧降下より入射光 を検出することを特徴をする光検出装置。 2.前記抵抗は高インピーダンス抵抗であることを特徴とする請求項1記載の光 検出装置。 3.前記抵抗はアンドープド・ポリシリコン抵抗であることを特徴とする請求項 1記載の光検出装置。 4.前記バイアス回路バイアス抵抗を介して前記供給電圧に結合された導電性電 極を有するバイアス・トランジスタから成ることを特徴とする請求項1,2,又 は3記載の光検出装置。 5.前記バイアス抵抗は高インピーダンス抵抗であることを特徴とする請求項4 記載の光検出装置。 6.前記バイアス抵抗はアンドープド・ポリシリコン抵抗で あることを特徴とする請求項5記載の光検出装置。 7.これまでに実質的に表わされ、単一の図面により参照される光検出装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9624198A GB2319602B (en) | 1996-11-21 | 1996-11-21 | Light detection device |
GB9624198.9 | 1996-11-21 | ||
PCT/EP1997/006168 WO1998022905A1 (en) | 1996-11-21 | 1997-11-03 | Light detection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001504992A true JP2001504992A (ja) | 2001-04-10 |
JP2001504992A5 JP2001504992A5 (ja) | 2005-06-16 |
Family
ID=10803264
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52314998A Ceased JP2001504992A (ja) | 1996-11-21 | 1997-11-03 | 光検出装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6232591B1 (ja) |
EP (1) | EP0939933B1 (ja) |
JP (1) | JP2001504992A (ja) |
CN (1) | CN1146999C (ja) |
DE (1) | DE69720029T2 (ja) |
GB (1) | GB2319602B (ja) |
HK (1) | HK1024323A1 (ja) |
WO (1) | WO1998022905A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006091708A (ja) * | 2004-09-27 | 2006-04-06 | Sony Corp | アクティブマトリクス型液晶表示装置 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100308216B1 (ko) * | 1999-03-15 | 2001-09-26 | 윤종용 | 밀봉된 전자기기의 비인가된 개봉을 검출하는 장치 |
TW502286B (en) | 1999-12-09 | 2002-09-11 | Koninkl Philips Electronics Nv | Semiconductor device comprising a security coating and smartcard provided with such a device |
DE10101995A1 (de) * | 2001-01-18 | 2002-07-25 | Philips Corp Intellectual Pty | Schaltungsanordnung und Verfahren zum Schützen mindestens einer Chipanordnung vor Manipulation und/oder vor Mißbrauch |
DE10164419A1 (de) * | 2001-12-29 | 2003-07-17 | Philips Intellectual Property | Verfahren und Anordnung zum Schutz von digitalen Schaltungsteilen |
CN100347858C (zh) * | 2002-10-31 | 2007-11-07 | 上海华虹集成电路有限责任公司 | 光检测电路 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56150871A (en) * | 1980-04-24 | 1981-11-21 | Toshiba Corp | Semiconductor device |
JPS6184054A (ja) * | 1984-09-27 | 1986-04-28 | シーメンス、アクチエンゲゼルシヤフト | 集積mos回路 |
JPS6290967A (ja) * | 1985-10-17 | 1987-04-25 | Nissan Motor Co Ltd | 受光用半導体集積回路 |
FR2619959B1 (fr) * | 1987-08-31 | 1991-06-14 | Thomson Semiconducteurs | Circuit de detection de lumiere |
JPH03101364A (ja) * | 1989-09-13 | 1991-04-26 | Ricoh Co Ltd | 光電変換素子 |
US5172211A (en) * | 1990-01-12 | 1992-12-15 | Paradigm Technology, Inc. | High resistance polysilicon load resistor |
-
1996
- 1996-11-21 GB GB9624198A patent/GB2319602B/en not_active Expired - Fee Related
-
1997
- 1997-11-03 DE DE69720029T patent/DE69720029T2/de not_active Expired - Fee Related
- 1997-11-03 EP EP97948896A patent/EP0939933B1/en not_active Expired - Lifetime
- 1997-11-03 US US09/308,606 patent/US6232591B1/en not_active Expired - Lifetime
- 1997-11-03 JP JP52314998A patent/JP2001504992A/ja not_active Ceased
- 1997-11-03 CN CNB971809569A patent/CN1146999C/zh not_active Expired - Fee Related
- 1997-11-03 WO PCT/EP1997/006168 patent/WO1998022905A1/en active IP Right Grant
-
2000
- 2000-05-30 HK HK00103184A patent/HK1024323A1/xx not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006091708A (ja) * | 2004-09-27 | 2006-04-06 | Sony Corp | アクティブマトリクス型液晶表示装置 |
JP4613562B2 (ja) * | 2004-09-27 | 2011-01-19 | ソニー株式会社 | アクティブマトリクス型液晶表示装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0939933B1 (en) | 2003-03-19 |
GB2319602B (en) | 2000-10-04 |
CN1146999C (zh) | 2004-04-21 |
GB9624198D0 (en) | 1997-01-08 |
DE69720029D1 (de) | 2003-04-24 |
HK1024323A1 (en) | 2000-10-05 |
US6232591B1 (en) | 2001-05-15 |
GB2319602A (en) | 1998-05-27 |
EP0939933A1 (en) | 1999-09-08 |
DE69720029T2 (de) | 2003-11-27 |
WO1998022905A1 (en) | 1998-05-28 |
CN1242093A (zh) | 2000-01-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041007 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041007 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20060704 |
|
A313 | Final decision of rejection without a dissenting response from the applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A313 Effective date: 20061127 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20070116 |