JP2001305038A - 近接場光学顕微鏡および近接場光学顕微鏡用探針 - Google Patents

近接場光学顕微鏡および近接場光学顕微鏡用探針

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Publication number
JP2001305038A
JP2001305038A JP2000121198A JP2000121198A JP2001305038A JP 2001305038 A JP2001305038 A JP 2001305038A JP 2000121198 A JP2000121198 A JP 2000121198A JP 2000121198 A JP2000121198 A JP 2000121198A JP 2001305038 A JP2001305038 A JP 2001305038A
Authority
JP
Japan
Prior art keywords
probe
light
tip
diameter
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000121198A
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English (en)
Japanese (ja)
Other versions
JP2001305038A5 (https=
Inventor
Yasuo Sasaki
靖夫 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP2000121198A priority Critical patent/JP2001305038A/ja
Priority to US09/571,442 priority patent/US6469288B1/en
Priority to EP00110546A priority patent/EP1054283A3/en
Publication of JP2001305038A publication Critical patent/JP2001305038A/ja
Publication of JP2001305038A5 publication Critical patent/JP2001305038A5/ja
Pending legal-status Critical Current

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Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP2000121198A 1999-05-17 2000-04-21 近接場光学顕微鏡および近接場光学顕微鏡用探針 Pending JP2001305038A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2000121198A JP2001305038A (ja) 2000-04-21 2000-04-21 近接場光学顕微鏡および近接場光学顕微鏡用探針
US09/571,442 US6469288B1 (en) 1999-05-17 2000-05-15 Near field optical microscope and probe for near field optical microscope
EP00110546A EP1054283A3 (en) 1999-05-17 2000-05-17 Near field optical microscope and probe for near field optical microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000121198A JP2001305038A (ja) 2000-04-21 2000-04-21 近接場光学顕微鏡および近接場光学顕微鏡用探針

Publications (2)

Publication Number Publication Date
JP2001305038A true JP2001305038A (ja) 2001-10-31
JP2001305038A5 JP2001305038A5 (https=) 2008-09-11

Family

ID=18631887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000121198A Pending JP2001305038A (ja) 1999-05-17 2000-04-21 近接場光学顕微鏡および近接場光学顕微鏡用探針

Country Status (1)

Country Link
JP (1) JP2001305038A (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003315240A (ja) * 2002-04-18 2003-11-06 Nec Corp ナノチューブ、近接場光検出装置および近接場光検出方法
JP2010139306A (ja) * 2008-12-10 2010-06-24 Shoichi Shimada 測定装置
JP2014070959A (ja) * 2012-09-28 2014-04-21 Hitachi High-Technologies Corp 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置
JP2014071925A (ja) * 2012-09-28 2014-04-21 Hitachi High-Technologies Corp 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置
CN109682995A (zh) * 2019-01-21 2019-04-26 仪晟科学仪器(嘉兴)有限公司 一种散射式低温扫描近场光学显微镜
WO2023021867A1 (ja) * 2021-08-20 2023-02-23 株式会社日立ハイテク 走査プローブ顕微鏡とそれに使用される試料

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003315240A (ja) * 2002-04-18 2003-11-06 Nec Corp ナノチューブ、近接場光検出装置および近接場光検出方法
US6995367B2 (en) 2002-04-18 2006-02-07 Nec Corporation Nanotube, near-field light detecting apparatus and near-field light detecting method
JP2010139306A (ja) * 2008-12-10 2010-06-24 Shoichi Shimada 測定装置
JP2014070959A (ja) * 2012-09-28 2014-04-21 Hitachi High-Technologies Corp 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置
JP2014071925A (ja) * 2012-09-28 2014-04-21 Hitachi High-Technologies Corp 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置
CN109682995A (zh) * 2019-01-21 2019-04-26 仪晟科学仪器(嘉兴)有限公司 一种散射式低温扫描近场光学显微镜
WO2023021867A1 (ja) * 2021-08-20 2023-02-23 株式会社日立ハイテク 走査プローブ顕微鏡とそれに使用される試料
JP2023028765A (ja) * 2021-08-20 2023-03-03 株式会社日立ハイテク 走査プローブ顕微鏡とそれに使用される試料

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