JP2001291601A - Low-value resistor - Google Patents

Low-value resistor

Info

Publication number
JP2001291601A
JP2001291601A JP2000102616A JP2000102616A JP2001291601A JP 2001291601 A JP2001291601 A JP 2001291601A JP 2000102616 A JP2000102616 A JP 2000102616A JP 2000102616 A JP2000102616 A JP 2000102616A JP 2001291601 A JP2001291601 A JP 2001291601A
Authority
JP
Japan
Prior art keywords
resistor
low
electrode
metal
metal material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000102616A
Other languages
Japanese (ja)
Inventor
Keiji Nakamura
圭史 仲村
Mikio Tatsukuchi
幹男 辰口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koa Corp
Original Assignee
Koa Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koa Corp filed Critical Koa Corp
Priority to JP2000102616A priority Critical patent/JP2001291601A/en
Priority to DE10116531A priority patent/DE10116531B4/en
Priority to US09/825,446 priority patent/US6794985B2/en
Publication of JP2001291601A publication Critical patent/JP2001291601A/en
Priority to US10/823,666 priority patent/US7042330B2/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a low-value resistor with an electrode structure of sufficiently high mechanically bonding strength and superior in uniformity of a current distribution. SOLUTION: Metal thin pieces 12 and 13 are bonded as electrodes to a resistor 11 of a metallic material by rolling or thermal diffusion for the formation of a low-value resistor. Or a molten solder layer may be provided as an electrode to the resistor.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、金属材の両端に電
極を配設した構造の低抵抗器に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a low resistor having a structure in which electrodes are provided at both ends of a metal material.

【0002】[0002]

【従来の技術】板状またはリボン状の金属材の両端に電
極を配設した低抵抗器は、放熱性が良好で電流容量が大
きくとれるため、電流検出用抵抗器等に広く用いられて
いる。この抵抗体としての金属材は、例えば銅ニッケル
系合金、ニクロム系合金、鉄クロム系合金、マンガニン
系合金等が用いられ、その金属材の両端部に電極が配設
されている。従来の電極構造としては、上述した金属材
にめっき電極を形成することが一般に行われている。
2. Description of the Related Art A low resistor having electrodes at both ends of a plate-shaped or ribbon-shaped metal material is widely used as a current detecting resistor and the like because of its good heat dissipation and large current capacity. . As the metal material as the resistor, for example, a copper-nickel-based alloy, a nichrome-based alloy, an iron-chromium-based alloy, a manganin-based alloy, or the like is used, and electrodes are provided at both ends of the metal material. As a conventional electrode structure, a plating electrode is generally formed on the above-described metal material.

【0003】しかしながら、このようなめっき電極の場
合には、厚くめっき層を形成することが困難であり、こ
れにより電極内の同一電位性が弱く、電流経路が安定せ
ず、高精度の抵抗器を製作するには問題がある。又、め
っきによる電極では抵抗体となる金属材との接合性が弱
く、抵抗体となる金属材を折り曲げて用いるような場合
に、機械的ストレス、熱ストレス、電気ストレスに弱い
という問題点が存在する。
However, in the case of such a plated electrode, it is difficult to form a thick plated layer, so that the same potential in the electrode is weak, the current path is not stable, and a highly accurate resistor is formed. There is a problem to make. In addition, there is a problem that the electrode formed by plating has a weak bonding property with a metal material serving as a resistor, and is weak to mechanical stress, thermal stress, and electric stress when the metal material serving as a resistor is bent and used. I do.

【0004】又、めっき電極に替えて銅またはニッケル
等の薄板を電子ビーム溶接等により固定して電極を形成
する場合がある。係る場合においても、スポット的な溶
接により接合した金属薄片は、溶接点の接合面積が小さ
く、同様に接合強度および電気的な電流分布の均一性に
問題がある。
In some cases, a thin plate made of copper or nickel is fixed by electron beam welding or the like in place of a plated electrode to form an electrode. Even in such a case, the metal flakes joined by spot welding have a small joint area at the welding point, and similarly have a problem in joint strength and uniformity of electric current distribution.

【0005】本発明は上述した事情に鑑みて為されたも
ので、機械的に十分な接合強度を有すると共に、電流分
布の均一性に優れた電極構造を備えた低抵抗器を提供す
ることを目的とする。
The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a low resistor having an electrode structure which has mechanically sufficient bonding strength and excellent current distribution uniformity. Aim.

【0006】[0006]

【課題を解決するための手段】請求項1に記載の発明
は、金属材からなる抵抗体に、該抵抗体の電極として圧
延又は及び熱拡散接合した金属薄片を配設したことを特
徴とする低抵抗器である。
According to a first aspect of the present invention, there is provided a resistor made of a metal material, wherein a rolled or heat diffusion bonded metal flake is provided as an electrode of the resistor. It is a low resistor.

【0007】この低抵抗器は、金属材からなる抵抗体の
両端部に、薄い金属薄片を圧延又は及び熱拡散接合によ
り接着したものである。このように圧延又は及び熱拡散
接合により接着された金属薄片は、めっきまたは溶接な
どに比較して、拡散層が抵抗体を構成する金属材の界面
またはその内部に存在する。従って、この拡散層の存在
により、高い接合強度が得られると共に、電気的な電流
分布の均一性が得られる。従って、機械的ストレス、熱
的ストレス、電気的ストレス等に対して安定な低抵抗器
の電極構造が得られる。
In this low-resistance device, thin metal flakes are bonded to both ends of a resistor made of a metal material by rolling or heat diffusion bonding. The metal flake bonded by rolling or thermal diffusion bonding as described above has a diffusion layer existing at the interface of the metal material constituting the resistor or at the inside thereof, as compared with plating or welding. Therefore, due to the presence of the diffusion layer, high bonding strength can be obtained and uniformity of electric current distribution can be obtained. Therefore, an electrode structure of a low-resistance resistor that is stable against mechanical stress, thermal stress, electrical stress, and the like can be obtained.

【0008】請求項2に記載の発明は、金属材からなる
抵抗体に、該抵抗体の電極として溶融はんだ層を配設し
たことを特徴とする低抵抗器である。
According to a second aspect of the present invention, there is provided a low resistor comprising a resistor made of a metal material and a molten solder layer provided as an electrode of the resistor.

【0009】溶融はんだ層は、表面的には厚さが数ミク
ロン程度の極めて薄いはんだ層であるが、母材である抵
抗体となる金属材内部にはんだ層が拡散して形成されて
いる。このため、この内部に拡散したはんだ層の存在に
より、高い接合強度が得られると共に、電気的な電流分
布の均一性が得られる。従って、同様に機械的ストレ
ス、熱的ストレス、および電気的ストレス等に対して安
定な低抵抗器の電極構造が得られる。
The molten solder layer is an extremely thin solder layer having a thickness of about several microns on the surface, but is formed by diffusing the solder layer into a metal material serving as a resistor which is a base material. For this reason, due to the presence of the solder layer diffused into the inside, high bonding strength can be obtained and uniformity of electric current distribution can be obtained. Accordingly, an electrode structure of a low resistor that is similarly stable against mechanical stress, thermal stress, electrical stress, and the like can be obtained.

【0010】[0010]

【発明の実施の形態】以下、本発明の実施の形態につい
て添付図面を参照しながら説明する。図1(a)(b)
は、本発明の第1の実施形態の低抵抗器の構造例を示
す。図示するように抵抗体を構成する金属材(母材)1
1の両端部に圧延又は及び熱拡散接合により接合された
金属薄片12,13を備えている。ここで、金属薄片1
2,13は、母材の金属材11に埋め込まれた構造であ
る、いわゆるインレイクラッド構造を為している。ここ
で、母材金属は、銅ニッケル系合金、ニクロム系合金ま
たは鉄クロム系合金が好適である。そして圧延又は及び
熱拡散接合により接合する金属薄片は、銅またはニッケ
ルの50乃至200μ程度の肉厚の薄板が用いられる。
Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 (a) (b)
3 shows a structural example of the low resistor according to the first embodiment of the present invention. Metal material (base material) 1 constituting a resistor as shown in the figure
1 are provided with metal flakes 12 and 13 joined to both ends by rolling or heat diffusion bonding. Here, metal flake 1
Reference numerals 2 and 13 have a so-called inlay clad structure, which is a structure embedded in the base metal material 11. Here, the base metal is preferably a copper-nickel alloy, a nichrome alloy, or an iron-chromium alloy. As the metal flake to be joined by rolling or thermal diffusion joining, a thin plate of copper or nickel having a thickness of about 50 to 200 μm is used.

【0011】この低抵抗器は、例えば、その長さ(展開
長)が20mm程度又はそれ以下であり、幅が5mm程
度であり、圧延金属薄片の接合部がそれぞれ両端から
2.5mm程度である。尚、母材の厚さは150乃至6
00μm程度である。これにより、抵抗値が例えば数m
Ω乃至数十mΩ程度の低抵抗値が得られる。尚、この実
施形態の場合は圧延又は及び熱拡散接合する金属薄板が
母材に埋め込まれたいわゆるインレイクラッド構造を有
しているが、平坦な母材上に金属薄片を載置して、これ
を圧延又は及び熱拡散接合により接合したいわゆるトッ
プレイクラッド構造としても良い。
The low resistor has a length (development length) of about 20 mm or less, a width of about 5 mm, and a joint between the rolled metal flakes of about 2.5 mm from both ends. . The thickness of the base material is 150 to 6
It is about 00 μm. Thereby, the resistance value is, for example, several m.
A low resistance value of about Ω to several tens mΩ can be obtained. Incidentally, in the case of this embodiment, a so-called inlay clad structure in which a metal sheet to be rolled or thermally diffusion-bonded is embedded in a base material, but a metal thin piece is placed on a flat base material and May be so-called top lay clad structure joined by rolling or heat diffusion bonding.

【0012】このような構造を有する低抵抗器は、まず
母材となる金属材を準備して、その母材となる金属材の
両側に金属薄板を圧延又は及び熱拡散接合により接合し
て形成する。圧延又は及び熱拡散接合は所定の温度を加
えつつ、圧力を加えることにより行われる。これによ
り、金属薄片の材料の拡散層が母材の接合面又はその内
部に形成される。その後、所定の寸法に切断して、図1
(a)又は(b)に示すような形状に折り曲げることに
より形成される。尚、埋め込み構造(インレイクラッド
構造)の場合には、予め母材に埋め込み部分の溝を設け
ておくことが必要である。
A low resistor having such a structure is formed by first preparing a metal material serving as a base material, and joining a thin metal plate to both sides of the metal material serving as the base material by rolling or heat diffusion bonding. I do. Rolling or thermal diffusion bonding is performed by applying pressure while applying a predetermined temperature. As a result, a diffusion layer of the metal flake material is formed on or at the joint surface of the base material. Then, it is cut to a predetermined size, and FIG.
It is formed by bending into a shape as shown in (a) or (b). In the case of the buried structure (inlay clad structure), it is necessary to previously provide a groove for the buried portion in the base material.

【0013】このようにして製造された低抵抗器は、図
1(a)(b)に示すような折り曲げ形状の加工に際し
て、圧延又は及び熱拡散接合により接合された電極部分
が十分な機械的強度を有するので、加工中に電極のクラ
ックまたは剥離等を起こすという問題が全くない。ま
た、できあがった低抵抗器はその電極の電流分布の均一
性が良好であるので、低抵抗器の良好な電気的特性が得
られる。そして、この抵抗器をプリント基板上に実装す
るに際しても、機械的強度、熱的強度、電気的強度に優
れるため、これら各種のストレスに対して安定に実装す
ることが可能であり、実装後の経時変化を小さく抑える
ことができる。
The low-resistance resistor manufactured as described above has a sufficient mechanical strength at the electrode portion joined by rolling or thermal diffusion bonding when working in a bent shape as shown in FIGS. 1 (a) and 1 (b). Since it has strength, there is no problem of cracking or peeling of the electrode during processing. In addition, since the completed low resistor has good uniformity of current distribution of its electrode, good electrical characteristics of the low resistor can be obtained. Also, when mounting this resistor on a printed circuit board, since it has excellent mechanical strength, thermal strength, and electrical strength, it is possible to mount it stably against these various stresses. The change with time can be kept small.

【0014】図2(a)(b)は、本発明の第2の実施
形態の低抵抗器の構造例を示す。この低抵抗器の母材と
なる金属材は、第1の実施形態と略同様であり、銅ニッ
ケル系合金、ニクロム系合金、マンガニン系合金等が用
いられている。そして、抵抗体となる金属材11の両端
には溶融はんだ層による電極15,16が配設されてい
る。溶融はんだ層による電極は、はんだ層を母材となる
金属内に拡散させることにより形成したもので、その表
面上の厚みはわずか数μm程度である。このような溶融
はんだ層は、従来のめっきまたは溶接などの電極構造に
比較して、はんだ拡散層が金属母材との界面及びその内
部に存在するため、機械的強度及び電流安定性に優れて
いる。
FIGS. 2A and 2B show an example of the structure of a low resistor according to a second embodiment of the present invention. The metal material serving as the base material of the low resistor is substantially the same as that of the first embodiment, and a copper-nickel alloy, a nichrome alloy, a manganin alloy, or the like is used. Further, electrodes 15 and 16 made of a molten solder layer are provided at both ends of the metal material 11 serving as a resistor. The electrode made of the molten solder layer is formed by diffusing the solder layer into a metal serving as a base material, and has a thickness on the surface of only a few μm. Such a molten solder layer has excellent mechanical strength and current stability because the solder diffusion layer exists at the interface with and inside the metal base material as compared with the conventional electrode structure such as plating or welding. I have.

【0015】そして、その厚みはわずか数μm程度であ
るが、これにより曲げ加工に対して十分な強度を有する
と共に、その拡散した溶融はんだ層により電気抵抗が極
めて小さいという特徴がある。更に、従来の例えば銅の
薄板を溶接した電極構造またはめっきにより形成した電
極構造と比較して、抵抗温度係数(TCR)特性が良好
になることが期待される。例えば、めっき電極のある期
間の抵抗値変化が0.5〜2.0%程度であるのに対し
て、溶融はんだ層を用いた場合には抵抗値変化が0〜
0.1%と大幅に低減する。又、抵抗温度係数(TC
R)としては、銅材のTCRが4000〜5000pp
m/℃程度であるのに対して、溶融はんだ層を用いた場
合には約2000ppm/℃程度である。
Although the thickness is only about several μm, it has a feature that it has sufficient strength for bending and that the electric resistance is extremely small due to the diffused molten solder layer. Furthermore, it is expected that the temperature coefficient of resistance (TCR) characteristics will be better as compared with a conventional electrode structure formed by welding a thin copper plate or formed by plating. For example, while the change in resistance during a certain period of the plating electrode is about 0.5 to 2.0%, the change in resistance is 0 to 0 when a molten solder layer is used.
It is greatly reduced to 0.1%. Also, the temperature coefficient of resistance (TC
R), the TCR of the copper material is 4000 to 5000 pp
On the other hand, when the molten solder layer is used, it is about 2000 ppm / ° C.

【0016】更に、溶融はんだ層を用いた電極を使用す
ることにより、鉛を用いないはんだ接続等への対応が容
易に可能となる。即ち、プリント基板等への実装に際し
て、各種のはんだ材料への対応が可能であり、鉛を用い
ないはんだ材料を用いた実装が可能である。これによ
り、環境問題への適合性に優れた電極構造が得られる。
Further, by using an electrode using a molten solder layer, it is possible to easily cope with solder connection without using lead. That is, when mounting on a printed circuit board or the like, various solder materials can be used, and mounting using a lead-free solder material is possible. As a result, an electrode structure having excellent compatibility with environmental problems can be obtained.

【0017】尚、上述した低抵抗器の形状例及び寸法例
等は一例を示したもので、本発明の趣旨を逸脱すること
なく種々の変形実施例が可能なことは勿論である。
The above-described examples of the shape and dimensions of the low resistor are merely examples, and it goes without saying that various modifications can be made without departing from the spirit of the present invention.

【0018】[0018]

【発明の効果】以上説明したように本発明によれば、良
好な電気的特性を有すると共に、十分な機械的強度を有
する電極構造を備えた低抵抗器を提供することができ
る。
As described above, according to the present invention, it is possible to provide a low resistor having an electrode structure having good electrical characteristics and sufficient mechanical strength.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)(b)は、本発明の第1の実施形態の低
抵抗器を示す斜視図である。
FIGS. 1A and 1B are perspective views showing a low resistor according to a first embodiment of the present invention.

【図2】(a)(b)は、本発明の第2の実施形態の低
抵抗器を示す斜視図である。
FIGS. 2A and 2B are perspective views showing a low resistor according to a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

11 抵抗体となる金属材(母材) 12,13 金属薄板の圧延又は及び熱拡散接合
により形成した電極 15,16 溶融はんだ層により形成した電極
11 Metal material (base material) to be a resistor 12, 13 Electrode formed by rolling or heat diffusion bonding of thin metal plate 15, 16 Electrode formed by molten solder layer

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 金属材からなる抵抗体に、該抵抗体の電
極として圧延又は及び熱拡散接合した金属薄片を配設し
たことを特徴とする低抵抗器。
1. A low-resistance device comprising a resistor made of a metal material and a rolled or heat-diffused metal flake as an electrode of the resistor.
【請求項2】 金属材からなる抵抗体に、該抵抗体の電
極として溶融はんだ層を配設したことを特徴とする低抵
抗器。
2. A low-resistance device comprising a resistor made of a metal material and a molten solder layer provided as an electrode of the resistor.
JP2000102616A 2000-04-04 2000-04-04 Low-value resistor Pending JP2001291601A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2000102616A JP2001291601A (en) 2000-04-04 2000-04-04 Low-value resistor
DE10116531A DE10116531B4 (en) 2000-04-04 2001-04-03 Resistor with low resistance
US09/825,446 US6794985B2 (en) 2000-04-04 2001-04-04 Low resistance value resistor
US10/823,666 US7042330B2 (en) 2000-04-04 2004-04-14 Low resistance value resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000102616A JP2001291601A (en) 2000-04-04 2000-04-04 Low-value resistor

Publications (1)

Publication Number Publication Date
JP2001291601A true JP2001291601A (en) 2001-10-19

Family

ID=18616462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000102616A Pending JP2001291601A (en) 2000-04-04 2000-04-04 Low-value resistor

Country Status (1)

Country Link
JP (1) JP2001291601A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141909A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor and method of manufacturing same
JP2007220714A (en) * 2006-02-14 2007-08-30 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof
JP2008282910A (en) * 2007-05-09 2008-11-20 Koa Corp Circuit board with resistor for detecting current

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007141909A (en) * 2005-11-15 2007-06-07 Matsushita Electric Ind Co Ltd Resistor and method of manufacturing same
JP2007220714A (en) * 2006-02-14 2007-08-30 Matsushita Electric Ind Co Ltd Resistor and manufacturing method thereof
JP2008282910A (en) * 2007-05-09 2008-11-20 Koa Corp Circuit board with resistor for detecting current

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