JP2001284491A - Plastic board - Google Patents

Plastic board

Info

Publication number
JP2001284491A
JP2001284491A JP2000096695A JP2000096695A JP2001284491A JP 2001284491 A JP2001284491 A JP 2001284491A JP 2000096695 A JP2000096695 A JP 2000096695A JP 2000096695 A JP2000096695 A JP 2000096695A JP 2001284491 A JP2001284491 A JP 2001284491A
Authority
JP
Japan
Prior art keywords
plastic substrate
pattern
wiring
back surface
metal wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000096695A
Other languages
Japanese (ja)
Inventor
Tomio Hioki
富男 日沖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal SMI Electronics Device Inc
Original Assignee
Sumitomo Metal SMI Electronics Device Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal SMI Electronics Device Inc filed Critical Sumitomo Metal SMI Electronics Device Inc
Priority to JP2000096695A priority Critical patent/JP2001284491A/en
Publication of JP2001284491A publication Critical patent/JP2001284491A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a plastic board that is prevented from deforming, i.e., warping, etc., by reducing a density difference of metal wirings between the front and the resin sides. SOLUTION: The plastic board 10 has a wiring pattern 20 on the front plane 11 of the board and round patterns 40 on the rear plane 12 of the board, which are used for mounting. The rear plane 12 of the base plate 10 is provided with dummy patterns 50 that has a metal wiring density equivalent to the metal wiring density difference between wiring on the front plane 11 and that on the rear plane 12, and the plastic board 10 is prevented from deforming caused by the density difference.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、表面に配線パター
ン及びめっき引き出し線を設け、裏面にボードに実装す
るためのランドパターンを設けたプラスチック基板に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plastic substrate provided with a wiring pattern and a plated lead on a front surface and a land pattern on a back surface for mounting on a board.

【0002】[0002]

【従来の技術】従来、小型電子機器に用いられるプラス
チック基板は、例えば図2(A)、(B)に示すよう
に、プラスチックボールグリッドアレイ(PBGA)を
用い、プラスチック基板100の表面110側には配線
パターン200が配置され、更に配線パターン200の
端部に設けたスルーホール210から表面110の周辺
部にわたって配線パターン200にめっきするためのめ
っき引き出し線300が設けられている。プラスチック
基板100の裏面120側にはボードに実装するための
ランドパターン400がスルーホール210と接続され
て配置されている。このランドパターン400に対する
めっき処理は、プラスチック基板100の表面110に
設けて配線パターン200に接続されためっき引き出し
線300を共用し、表面110の配線パターン200と
裏面120のランドパターン400との接続を介してめ
っきするようにしている。
2. Description of the Related Art Conventionally, as shown in FIGS. 2A and 2B, a plastic substrate used for a small electronic device uses a plastic ball grid array (PBGA) and is disposed on the surface 110 side of the plastic substrate 100. The wiring pattern 200 is disposed, and a plated lead 300 for plating the wiring pattern 200 is provided from the through hole 210 provided at the end of the wiring pattern 200 to the periphery of the surface 110. On the back surface 120 side of the plastic substrate 100, a land pattern 400 to be mounted on the board is arranged so as to be connected to the through hole 210. The plating process for the land pattern 400 is performed by sharing the plating lead 300 provided on the front surface 110 of the plastic substrate 100 and connected to the wiring pattern 200, and connecting the wiring pattern 200 on the front surface 110 and the land pattern 400 on the back surface 120. Through plating.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記従
来の方法では、表面110の配線パターン200と裏面
120のランドパターン400とはほぼ金属配線密度が
バランスするが、表面110にのみめっき引き出し線3
00を配置しているため、めっき引き出し線300の分
だけ裏面120側より表面110側の金属配線密度が高
くなる。そのため、プラスチック基板100の表面11
0側と裏面120側との間に金属配線密度差が生じ、金
属と樹脂(プラスチック)との熱膨張の差によってプラ
スチック基板100の周辺端部が反り返り、変形し、歩
留りを悪くするという問題があった。本発明はこのよう
な事情に鑑みてなされたもので、表面側と裏面側の金属
配線密度差を少なくして、反りなどの変形を防止するプ
ラスチック基板を提供することを目的とする。
However, in the above-mentioned conventional method, the wiring pattern 200 on the front surface 110 and the land pattern 400 on the back surface 120 are almost balanced in metal wiring density.
Since 00 is arranged, the metal wiring density on the front surface 110 side becomes higher than the rear surface 120 side by the plating lead wire 300. Therefore, the surface 11 of the plastic substrate 100
There is a problem that a metal wiring density difference occurs between the 0 side and the back surface 120 side, and the peripheral end of the plastic substrate 100 warps and deforms due to a difference in thermal expansion between the metal and the resin (plastic), thereby lowering the yield. there were. The present invention has been made in view of such circumstances, and has as its object to provide a plastic substrate that reduces a difference in metal wiring density between a front surface side and a rear surface side and prevents deformation such as warpage.

【0004】[0004]

【課題を解決するための手段】前記目的に沿う本発明に
係るプラスチック基板は、表面に配線パターンを設け、
裏面にボードに実装するためのランドパターンを設けた
プラスチック基板であって、プラスチック基板の裏面に
表面側配線と裏面側配線との金属配線密度差に相当する
金属配線密度を有するダミーパターンを設け、金属配線
密度差によって生じるプラスチック基板の変形を防止す
る。このような構成により、ダミーパターンによってプ
ラスチック基板の表面側と裏面側の金属配線密度差を小
さくすることにより、表面側と裏面側の熱膨張の差を少
なくし、プラスチック基板の反りなどの変形を防止する
ことが可能となる。本発明に係るプラスチック基板にお
いては、プラスチック基板の裏面に設けたダミーパター
ンは、表面に設けた配線パターンのめっき引き出し線に
対応する位置に設けてもよい。従来は表面のめっき引き
出し線に対応する裏面の位置は空白の状態であったた
め、表面側と裏面側の金属配線密度差が大きかったが、
この場合は、金属配線密度をめっき引き出し線とほぼ同
じにしたダミーパターンをめっき引き出し線に対応させ
た位置に設けるので、ダミーパターンがプラスチック基
板の表面側と裏面側の金属配線密度差を補って小さく
し、効果的にプラスチック基板の表面側と裏面側の熱膨
張の差を少なくすることが可能となる。
According to the present invention, there is provided a plastic substrate provided with a wiring pattern on a surface thereof.
A plastic substrate provided with a land pattern for mounting on a board on a back surface, and a dummy pattern having a metal wiring density corresponding to a metal wiring density difference between a front surface side wiring and a back side wiring on a back surface of the plastic substrate, This prevents deformation of the plastic substrate caused by a difference in metal wiring density. With such a configuration, the difference in the metal wiring density between the front side and the back side of the plastic substrate is reduced by the dummy pattern, so that the difference in thermal expansion between the front side and the back side is reduced, and deformation such as warpage of the plastic substrate is reduced. This can be prevented. In the plastic substrate according to the present invention, the dummy pattern provided on the back surface of the plastic substrate may be provided at a position corresponding to the plated lead of the wiring pattern provided on the front surface. Conventionally, the position of the back side corresponding to the plating lead wire on the front side was blank, so the difference in metal wiring density between the front side and the back side was large,
In this case, since the dummy pattern having the same metal wiring density as the plating lead wire is provided at a position corresponding to the plating lead wire, the dummy pattern compensates for the metal wiring density difference between the front side and the back side of the plastic substrate. This makes it possible to effectively reduce the difference in thermal expansion between the front side and the back side of the plastic substrate.

【0005】[0005]

【発明の実施の形態】続いて、添付した図面を参照しつ
つ、本発明を具体化した実施の形態について説明し、本
発明の理解に供する。ここに、図1(A)、(B)は、
それぞれ本発明の一実施の形態に係るプラスチック基板
の表面及び裏面の部分拡大正面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, embodiments of the present invention will be described with reference to the accompanying drawings to provide an understanding of the present invention. Here, FIGS. 1 (A) and 1 (B)
FIG. 2 is a partially enlarged front view of a front surface and a back surface of a plastic substrate according to one embodiment of the present invention.

【0006】図1(A)、(B)に示すように、本発明
の一実施の形態に係るプラスチック基板10は、例えば
エポキシ樹脂からなり、表面11に精密プリント配線技
術により配線パターン20と、配線パターン20にめっ
き処理を施すために配線パターン20の端部に設けたス
ルーホール21からプラスチック基板10の周辺に伸び
るめっき引き出し線30を設けている。プラスチック基
板10の裏面12には、電子機器のボードに実装するた
めのランドパターン40を設け、表面11の配線パター
ン20とはスルーホール21で導通されている。また、
プラスチック基板10の裏面12の周辺部には、表面1
1に設けためっき引き出し線30に対応する位置に、め
っき引き出し線30の金属配線密度にほぼ相当する金属
配線密度を有するダミーパターン50を設け、ダミーパ
ターン50はランドパターン40やスルーホール21と
接触しないように配置している。
As shown in FIGS. 1A and 1B, a plastic substrate 10 according to an embodiment of the present invention is made of, for example, epoxy resin, and has a wiring pattern 20 formed on a surface 11 thereof by a precision printed wiring technique. In order to apply a plating process to the wiring pattern 20, a plating lead 30 extending from the through hole 21 provided at the end of the wiring pattern 20 to the periphery of the plastic substrate 10 is provided. A land pattern 40 for mounting on a board of an electronic device is provided on the back surface 12 of the plastic substrate 10, and is electrically connected to the wiring pattern 20 on the front surface 11 by a through hole 21. Also,
The peripheral portion of the back surface 12 of the plastic substrate 10 has
1, a dummy pattern 50 having a metal wiring density substantially equivalent to the metal wiring density of the plating lead wire 30 is provided at a position corresponding to the plating lead wire 30, and the dummy pattern 50 is in contact with the land pattern 40 and the through hole 21. It is arranged not to be.

【0007】このような構成により、めっき引き出し線
30によって生じる表面11側配線と裏面12側配線と
の金属配線密度差をダミーパターン50によって補うこ
とができる。したがって、表面11側と裏面12側の金
属配線密度はバランスし、プラスチック基板10の表面
11側と裏面12側の熱膨張の差が小さくなり、プラス
チック基板10の反りなどの変形が防止される。なお、
プラスチック基板10の裏面12にダミーパターン50
を設けた場合と設けなかった場合のそれぞれ試料数10
000個について、基板端部の反り不良率を調べた。温
度サイクルテスト後の反り量が0.05/25.4mm
以下を合格とするMIL883D規格を採用した。その
結果、ダミーパターン50を設けた場合の不良率は0.
01%未満であったが、ダミーパターン50を設けなか
った場合の不良率は0.1〜1.0%であった。この結
果から、プラスチック基板10の裏面12にダミーパタ
ーン50を設けることによって、プラスチック基板10
の反りを減少させる効果が十分あることが確認された。
With such a configuration, the difference in metal wiring density between the wiring on the front surface 11 and the wiring on the back surface 12 caused by the plated lead 30 can be compensated for by the dummy pattern 50. Therefore, the metal wiring densities on the front surface 11 side and the back surface 12 side are balanced, the difference in thermal expansion between the front surface 11 side and the back surface 12 side of the plastic substrate 10 is reduced, and deformation such as warpage of the plastic substrate 10 is prevented. In addition,
A dummy pattern 50 is formed on the back surface 12 of the plastic substrate 10.
10 samples each with and without
For 000 pieces, the warpage failure rate at the substrate end was examined. The warpage after the temperature cycle test is 0.05 / 25.4mm
The MIL883D standard that passed the following was adopted. As a result, the defect rate in the case where the dummy pattern 50 is provided is 0.
Although it was less than 01%, the defect rate when the dummy pattern 50 was not provided was 0.1 to 1.0%. From this result, by providing the dummy pattern 50 on the back surface 12 of the plastic substrate 10, the plastic substrate 10
It was confirmed that the effect of reducing the warpage was sufficient.

【0008】[0008]

【発明の効果】請求項1及び2記載のプラスチック基板
においては、プラスチック基板の裏面にダミーパターン
を設けるので、ダミーパターンによってプラスチック基
板の表面側と裏面側の金属配線密度差が小さくなり、プ
ラスチック基板の反りなどの変形が防止される。特に、
請求項2記載のプラスチック基板においては、プラスチ
ック基板の裏面に設けたダミーパターンは、表面に設け
た配線パターンのめっき引き出し線に対応する位置に設
けているので、プラスチック基板の表面のめっき引き出
し線に対応する裏面の位置にダミーパターンが無い場合
に比べて、表面側と裏面側の金属配線密度差が小さくな
り、効果的にプラスチック基板の表面側と裏面側の熱膨
張の差を少なくすることが可能となる。
According to the first and second aspects of the present invention, since the dummy pattern is provided on the back surface of the plastic substrate, the difference in the metal wiring density between the front side and the back side of the plastic substrate is reduced by the dummy pattern. Deformation such as warpage is prevented. In particular,
In the plastic substrate according to the second aspect, the dummy pattern provided on the back surface of the plastic substrate is provided at a position corresponding to the plating lead line of the wiring pattern provided on the front surface. Compared to the case where there is no dummy pattern at the corresponding back side position, the difference in metal wiring density between the front side and the back side is smaller, and the difference in thermal expansion between the front side and the back side of the plastic substrate can be effectively reduced. It becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(A)、(B)は、それぞれ本発明の一実施の
形態に係るプラスチック基板の表面及び裏面の部分拡大
正面図である。
FIGS. 1A and 1B are partially enlarged front views of a front surface and a back surface of a plastic substrate according to an embodiment of the present invention, respectively.

【図2】(A)、(B)は、それぞれ従来例のプラスチ
ック基板の表面及び裏面の部分拡大正面図である。
FIGS. 2A and 2B are partially enlarged front views of a front surface and a back surface of a conventional plastic substrate, respectively.

【符号の説明】[Explanation of symbols]

10:プラスチック基板、11:表面、12:裏面、2
0:配線パターン、21:スルーホール、30:めっき
引き出し線、40:ランドパターン、50:ダミーパタ
ーン
10: plastic substrate, 11: front surface, 12: back surface, 2
0: wiring pattern, 21: through hole, 30: plating lead wire, 40: land pattern, 50: dummy pattern

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 表面に配線パターンを設け、裏面にボー
ドに実装するためのランドパターンを設けたプラスチッ
ク基板であって、前記プラスチック基板の裏面に表面側
配線と裏面側配線との金属配線密度差に相当する金属配
線密度を有するダミーパターンを設け、前記金属配線密
度差によって生じる前記プラスチック基板の変形を防止
することを特徴とするプラスチック基板。
1. A plastic substrate provided with a wiring pattern on a front surface and a land pattern on a back surface for mounting on a board, wherein a metal wiring density difference between a front surface wiring and a back surface wiring on the back surface of the plastic substrate. A plastic pattern provided with a dummy pattern having a metal wiring density corresponding to the above, and preventing deformation of the plastic substrate caused by the metal wiring density difference.
【請求項2】 請求項1記載のプラスチック基板におい
て、前記裏面に設けたダミーパターンは、前記表面に設
けた配線パターンのめっき引き出し線に対応する位置に
設けたことを特徴とするプラスチック基板。
2. The plastic substrate according to claim 1, wherein the dummy pattern provided on the back surface is provided at a position corresponding to a plated lead of a wiring pattern provided on the front surface.
JP2000096695A 2000-03-31 2000-03-31 Plastic board Pending JP2001284491A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000096695A JP2001284491A (en) 2000-03-31 2000-03-31 Plastic board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000096695A JP2001284491A (en) 2000-03-31 2000-03-31 Plastic board

Publications (1)

Publication Number Publication Date
JP2001284491A true JP2001284491A (en) 2001-10-12

Family

ID=18611424

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000096695A Pending JP2001284491A (en) 2000-03-31 2000-03-31 Plastic board

Country Status (1)

Country Link
JP (1) JP2001284491A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6835897B2 (en) * 2002-10-08 2004-12-28 Siliconware Precision Industries Co., Ltd. Warpage preventing substrate
US7408252B2 (en) * 2005-03-18 2008-08-05 Renesas Technology Corp. Semiconductor device and a manufacturing method of the same
WO2010122944A1 (en) * 2009-04-21 2010-10-28 アルプス電気株式会社 Magnetic sensor package
US11189750B2 (en) 2013-10-29 2021-11-30 Lumileds Llc Separating a wafer of light emitting devices

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6835897B2 (en) * 2002-10-08 2004-12-28 Siliconware Precision Industries Co., Ltd. Warpage preventing substrate
US7408252B2 (en) * 2005-03-18 2008-08-05 Renesas Technology Corp. Semiconductor device and a manufacturing method of the same
US7576422B2 (en) 2005-03-18 2009-08-18 Renesas Technology Corp. Semiconductor device
US7803658B2 (en) 2005-03-18 2010-09-28 Renesas Electronics Corporation Semiconductor device
WO2010122944A1 (en) * 2009-04-21 2010-10-28 アルプス電気株式会社 Magnetic sensor package
US11189750B2 (en) 2013-10-29 2021-11-30 Lumileds Llc Separating a wafer of light emitting devices

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