JP2001267404A - Substrate mounting apparatus - Google Patents

Substrate mounting apparatus

Info

Publication number
JP2001267404A
JP2001267404A JP2000080695A JP2000080695A JP2001267404A JP 2001267404 A JP2001267404 A JP 2001267404A JP 2000080695 A JP2000080695 A JP 2000080695A JP 2000080695 A JP2000080695 A JP 2000080695A JP 2001267404 A JP2001267404 A JP 2001267404A
Authority
JP
Japan
Prior art keywords
substrate
air
rim
chuck body
mounting apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000080695A
Other languages
Japanese (ja)
Other versions
JP3936828B2 (en
Inventor
Shinichi Matsumoto
信一 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP2000080695A priority Critical patent/JP3936828B2/en
Publication of JP2001267404A publication Critical patent/JP2001267404A/en
Application granted granted Critical
Publication of JP3936828B2 publication Critical patent/JP3936828B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To hold a rear surface of a substrate in a non-contact state while maintaining planarity of the substrate. SOLUTION: A chuck main body 2 holds a substrate. A rim 3 is provided on the chuck main body 2 according to the shape of a substrate 50. Suction ports 31-33 are provided in the upper surface of the rim portion and suck support members 51-53 to hold the substrate 50. Air supply ports 71-76 spray the substrate 50 with air from below. Air exhaust ports 41-46, 91-96 discharge air from a space formed by the substrate 50, the chuck main body 2 and the rim 3. Since the substrate 50 is sprayed with air from the air supply ports 71-76, the rear surface of the substrate 50 is not brought into contact with the chuck main body 2. Since a pressure (air) in a predetermined amount is supplied to the space formed by the substrate 50, the chuck main body 2 and the rim 3 and then discharged, a predetermined air pressure is maintained in the space. This air pressure corrects bending due to a dead weight of the substrate 50. Thus, the bending of the substrate is reduced and the planarity is maintained.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、IC,LSI等
の半導体デバイス、液晶ディスプレイ装置、磁気ディス
クなどを製造する工程でこれらの基板を真空吸着保持す
る基板搭載装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate mounting device for vacuum-holding and holding these substrates in a process of manufacturing semiconductor devices such as ICs and LSIs, liquid crystal display devices, and magnetic disks.

【0002】[0002]

【従来の技術】半導体デバイスや液晶ディスプレイデバ
イス、磁気ディスクなどの製造工程では、基板を基板搭
載装置で真空吸着保持して各種の処理を施している。従
来の基板搭載装置は、例えば基板がウェハ基板の場合、
円板状のチャック本体と、このチャック本体の外周に沿
って設けられたリング状のリムと、このリムの内側に設
けられた無数の円柱状の突起ピンと、チャック本体、リ
ム及びウェハ基板によって形成される密閉空間を真空に
するための真空経路とを含んで構成される。リムは、ウ
ェハ基板の外周形状と同等又はそれよりも若干小さな形
状をしている。また、突起ピンは、チャック本体上にお
けるウェハ基板の平面度を維持するものであり、リム内
のチャック本体上に2〜4mm間隔で無数に配置され
た、リムと同じ高さの円柱状のピンで構成されている。
2. Description of the Related Art In a process of manufacturing a semiconductor device, a liquid crystal display device, a magnetic disk, and the like, various processes are performed by holding a substrate by vacuum suction with a substrate mounting device. Conventional substrate mounting devices, for example, when the substrate is a wafer substrate,
A disk-shaped chuck main body, a ring-shaped rim provided along the outer periphery of the chuck main body, countless columnar projection pins provided inside the rim, a chuck main body, a rim, and a wafer substrate. And a vacuum path for evacuating the enclosed space. The rim has a shape equal to or slightly smaller than the outer peripheral shape of the wafer substrate. Further, the projecting pins are for maintaining the flatness of the wafer substrate on the chuck body, and are innumerably arranged on the chuck body in the rim at intervals of 2 to 4 mm, and are cylindrical pins having the same height as the rim. It is composed of

【0003】[0003]

【発明が解決しようとする課題】従来の基板搭載装置
は、ウェハ基板の裏面が突起ピンやリムに接触するた
め、接触した部分が汚染していた。そこで、裏面を接触
しないように、ウェハ基板の側面を支持した場合、ウェ
ハ基板自体の重量によってウェハ基板がたわんでしま
い、基板自体の平面度が損なわれ、各種処理の障害とな
っていた。
In the conventional substrate mounting apparatus, since the rear surface of the wafer substrate comes into contact with the projection pins and the rim, the contacted portion is contaminated. Therefore, when the side surface of the wafer substrate is supported so as not to contact the back surface, the wafer substrate is bent by the weight of the wafer substrate itself, and the flatness of the substrate itself is impaired, which is an obstacle to various processes.

【0004】本発明は、上述の点に鑑みてなされたもの
であり、基板の平面度を維持したまま裏面を非接触状態
で保持することのできる基板搭載装置を提供することを
目的とする。
[0004] The present invention has been made in view of the above points, and has as its object to provide a substrate mounting apparatus capable of holding the back surface in a non-contact state while maintaining the flatness of the substrate.

【0005】[0005]

【課題を解決するための手段】請求項1に記載された基
板搭載装置は、基板を保持するチャック本体と、前記基
板の形状に従って前記チャック本体に設けられたリム手
段と、前記リム手段の上面で前記基板の側面部を支持す
る支持手段と、前記基板に対して下側からエアを吹きつ
けるエア供給手段と、前記基板と前記チャック本体と前
記リムとによって形成される空間内の空気を排出するエ
ア排出手段とを含んで構成されたものである。基板はそ
の側面部が支持手段とチャック本体のリム手段とによっ
て支持される。基板が側面部だけで支持されると、基板
の中央付近が自重によってたわむ。そこで、エア供給手
段から基板にエアを吹きつけることによって基板とチャ
ック本体との間にエアギャップを形成し、基板裏面がチ
ャック本体に接触しないようにした。基板が支持手段に
よって支持されると、基板とチャック本体とリム手段と
によって空間が形成される。この空間にはエア供給手段
から所定量の圧力(エア)が供給されると共に順次エア
排出手段から排出されているので、空間内は所定の気圧
に保たれる。この気圧によって基板の自重によるたわみ
がさらに矯正され、基板のたわみは減少し、平面度が維
持されるようになる。
According to a first aspect of the present invention, there is provided a substrate mounting apparatus, comprising: a chuck body for holding a substrate; rim means provided on the chuck body in accordance with a shape of the substrate; and an upper surface of the rim means. Supporting means for supporting the side surface portion of the substrate, air supply means for blowing air from below to the substrate, and discharging air in a space formed by the substrate, the chuck body and the rim. And an air discharging means. The side surface of the substrate is supported by the supporting means and the rim means of the chuck body. When the substrate is supported only by the side portions, the vicinity of the center of the substrate is bent by its own weight. Therefore, an air gap is formed between the substrate and the chuck body by blowing air from the air supply means to the substrate so that the back surface of the substrate does not contact the chuck body. When the substrate is supported by the supporting means, a space is formed by the substrate, the chuck body, and the rim means. Since a predetermined amount of pressure (air) is supplied from the air supply means to the space and is sequentially discharged from the air discharge means, the inside of the space is maintained at a predetermined pressure. This pressure further corrects the deflection of the substrate due to its own weight, reduces the deflection of the substrate, and maintains the flatness.

【0006】請求項2に記載された基板搭載装置は、請
求項1において、前記エア排気手段が前記リム手段の側
面部及び前記チャック本体の下面部の少なくとも一方に
1又は複数設けられているものである。エア排気手段
は、リム手段の側面に設けられた開口や、チャック本体
に設けられた開口で構成される。エア供給手段から供給
されるエアの量と空間内の気圧を所定値に保持するため
に適当な数の開口がチャック本体やリム手段に設けられ
る。
According to a second aspect of the present invention, in the first aspect, one or more of the air exhaust means are provided on at least one of a side surface of the rim means and a lower surface of the chuck body. It is. The air exhaust means includes an opening provided on a side surface of the rim means and an opening provided on the chuck body. An appropriate number of openings are provided in the chuck body and the rim means to maintain the amount of air supplied from the air supply means and the pressure in the space at predetermined values.

【0007】請求項3に記載された基板搭載装置は、請
求項1又は2において、前記エア供給手段が、前記チャ
ック本体の中央付近に設けられた前記リム手段よりも低
い平坦部を有する島状のエアギャップ形成部の複数によ
って構成されているものである。エア供給手段は、チャ
ック本体の中央付近に設けられることによって、基板の
最もたわみの大きい部分にエアを吹きつけ、基板裏面と
チャック本体とが接触するのを防止する。また、エアギ
ャップ形成部はリム手段よりも低い平坦部なので、この
平坦部分をエアが流れ、エアギャップが形成されるの
で、基板の平坦度を保持することが可能となる。
According to a third aspect of the present invention, in the substrate mounting apparatus according to the first or second aspect, the air supply means has an island shape having a flat portion lower than the rim means provided near the center of the chuck body. And a plurality of air gap forming portions. The air supply means is provided in the vicinity of the center of the chuck main body, thereby blowing air to the portion of the substrate having the largest deflection, thereby preventing the back surface of the substrate from coming into contact with the chuck main body. Further, since the air gap forming portion is a flat portion lower than the rim means, air flows through this flat portion and an air gap is formed, so that the flatness of the substrate can be maintained.

【0008】請求項4に記載された基板搭載装置は、請
求項1、2又は3において、前記チャック本体を回転可
能なように固定するエアスピンドル手段と、前記エアス
ピンドル手段に回転駆動力を与えるモータ手段とを備え
たものである。これは、モータ手段によって、チャック
本体を高速で回転し、基板表面にレーザ光を照射して、
表面検査する場合に、基板の平面度が保持されているこ
とによって、有効に表面検査を行うことが可能となる。
請求項5に記載された基板搭載装置は、請求項1から4
までのいずれか一つにおいて、前記リム手段が、その上
面が前記チャック本体の中央に向かって傾斜しており、
前記基板の側面部のみと接触するように構成されている
ものである。基板がリム手段上に搭載されても、リム手
段の上面が傾斜しているので、基板の裏面はリム手段に
接触することはなく、その側面部のみがリム手段の上面
と接触するようになる。
According to a fourth aspect of the present invention, there is provided a substrate mounting apparatus according to the first, second or third aspect, wherein air spindle means for rotatably fixing the chuck body and rotational driving force are applied to the air spindle means. Motor means. This means that the chuck body is rotated at high speed by motor means, and the substrate surface is irradiated with laser light,
When the surface inspection is performed, the surface inspection can be effectively performed by maintaining the flatness of the substrate.
The substrate mounting apparatus according to the fifth aspect is characterized in that:
In any one of the above, the rim means, the upper surface of which is inclined toward the center of the chuck body,
It is configured to be in contact with only the side surface of the substrate. Even when the substrate is mounted on the rim means, since the upper surface of the rim means is inclined, the back surface of the substrate does not contact the rim means, and only the side surface thereof comes into contact with the upper surface of the rim means. .

【0009】請求項6に記載された基板搭載装置は、請
求項5において、前記支持手段が、前記リム手段の上面
に回転自在に設けられ、前記基板の側面部に接触する接
触部を備えた略長方形状の板材からなるレバー部材と、
前記レバー部材を前記リム手段に吸着する吸着口と、前
記レバー部材が前記チャック本体から離れる方向に常時
回転力を与えるバネ部材とを含んで構成されているもの
である。基板を支持手段によって保持する場合、レバー
部材の接触部を基板の側面に押し付け、その位置で吸着
口によって吸着保持する。これによって、基板はリム手
段に押し付けられ、基板の半円形状の側面のみが接触部
及びリム手段の上面に接触支持されるようになる。ま
た、吸着口の吸着動作を停止すると、レバー部材はバネ
部材の回転力によって元の位置に復帰し、基板を開放す
る。
According to a sixth aspect of the present invention, in the substrate mounting apparatus according to the fifth aspect, the support means is provided rotatably on an upper surface of the rim means and has a contact portion which comes into contact with a side surface of the substrate. A lever member made of a substantially rectangular plate material,
The lever member is configured to include a suction port for suctioning the lever member to the rim means, and a spring member that constantly applies a rotational force in a direction in which the lever member is separated from the chuck body. When the substrate is held by the supporting means, the contact portion of the lever member is pressed against the side surface of the substrate, and is suction-held at the position by the suction port. As a result, the substrate is pressed against the rim means, and only the semicircular side surface of the substrate is supported in contact with the contact portion and the upper surface of the rim means. When the suction operation of the suction port is stopped, the lever member returns to the original position by the rotational force of the spring member, and releases the substrate.

【0010】[0010]

【発明の実施の形態】以下、本発明の一実施の形態を添
付図面に従って説明する。図1は本発明に係る基板搭載
装置の概略構成を示す図であり、基板搭載装置を上面か
ら見た図である。図2は図1の断面図であり、図2
(A)は図1のA−A面、図2(B)は図1のB−B面
の断面図である。
An embodiment of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is a view showing a schematic configuration of a substrate mounting apparatus according to the present invention, and is a view of the substrate mounting apparatus as viewed from above. FIG. 2 is a sectional view of FIG.
2A is a cross-sectional view taken along a plane AA in FIG. 1, and FIG. 2B is a cross-sectional view taken along a plane BB in FIG. 1.

【0011】この実施の形態に係る基板搭載装置1は、
円板状のチャック本体2と、回転モータ6と、この回転
モータ6の回転駆動力をチャック本体2に伝達するエア
スピンドル5とを含んで構成される。回転モータ6に
は、回転検出器としてエンコーダが設けられているがこ
こでは図示を省略してある。
The substrate mounting apparatus 1 according to this embodiment is
The chuck body 2 includes a disk-shaped chuck body 2, a rotation motor 6, and an air spindle 5 that transmits the rotation driving force of the rotation motor 6 to the chuck body 2. The rotary motor 6 is provided with an encoder as a rotation detector, but is not shown here.

【0012】チャック本体2の外周には、ウェハ基板5
0の形状に沿ったリング状のリム3が設けられている。
リム3の上面側には、ウェハ基板50を支持する支持部
材51〜53を真空吸着するための吸着口31〜33が
設けられている。この吸着口31〜33からは、チャッ
ク本体2の内部に設けられた真空路3D及びエアスピン
ドル5の内部に設けられた真空路3Eを介して空気の吸
引が行われるようになっている。リム3の側面には、チ
ャック本体2とウェハ基板50によって形成される空間
4内の空気を排出するための側面排気口41〜46が設
けられている。なお、ウェハ基板50は、その側面部分
のみを支持部材51〜53によって3点支持されてい
る。なお、図1では、支持部材51〜53の図示は省略
してある。
On the outer periphery of the chuck body 2, a wafer substrate 5
A ring-shaped rim 3 along the shape of 0 is provided.
On the upper surface side of the rim 3, suction ports 31 to 33 for vacuum suction of the support members 51 to 53 supporting the wafer substrate 50 are provided. Air is sucked from the suction ports 31 to 33 through a vacuum path 3D provided inside the chuck body 2 and a vacuum path 3E provided inside the air spindle 5. On the side surface of the rim 3, there are provided side surface exhaust ports 41 to 46 for discharging air in a space 4 formed by the chuck body 2 and the wafer substrate 50. The wafer substrate 50 is supported at three points only by the side members by the supporting members 51 to 53. In FIG. 1, illustration of the support members 51 to 53 is omitted.

【0013】チャック本体2の中央付近には、エア供給
口71〜76を有するエアギャップ形成部61〜66が
設けられている。エア供給口71〜76は、チャック本
体2の内部に設けられたエア供給路77及びエアスピン
ドル5の内部に設けられたエア供給路78を介して外部
からエアが供給されるようになっている。エアギャップ
形成部61〜66は、リム3よりも低い平坦部を有する
扇形をしている。各エアギャップ形成部61〜66間に
は、エア供給口71〜76から供給されたエアを外周に
向かって排気するための中心部エア排気溝81〜86が
設けられている。また、エアギャップ形成部61〜66
とリム3との間には、チャック本体2とウェハ基板5に
よって形成される空間4内の空気をチャック本体2の裏
面側から排出するための下面排気口91〜96が設けら
れている。従って、エア供給口71〜76から吹き出し
たエアはウェハ基板50の裏面に当たり、エアギャップ
形成部61〜66の平坦部から中心部エア排気溝81〜
86に流れ込む。中心部エア排気溝81〜86に流れ込
んだエアは、中心部エア排気溝81〜86を介して外周
に向かい、側面排気口41〜46及び下面排気口91〜
96から排出される。これによって、エアギャップ形成
部61〜66とウェハ基板50との間には所定量のエア
ギャップが常時形成される共にウェハ基板50、チャッ
ク本体2及びリム3に囲まれた空間4内が所定の気圧に
保たれるようになる。
Near the center of the chuck body 2, there are provided air gap forming portions 61 to 66 having air supply ports 71 to 76. The air supply ports 71 to 76 are supplied with air from the outside via an air supply path 77 provided inside the chuck body 2 and an air supply path 78 provided inside the air spindle 5. . The air gap forming portions 61 to 66 have a fan shape having a flat portion lower than the rim 3. Central air exhaust grooves 81 to 86 for exhausting the air supplied from the air supply ports 71 to 76 toward the outer periphery are provided between the air gap forming portions 61 to 66. In addition, the air gap forming portions 61 to 66
Between the rim 3 and the rim 3, lower surface exhaust ports 91 to 96 are provided for discharging air in a space 4 formed by the chuck body 2 and the wafer substrate 5 from the back side of the chuck body 2. Therefore, the air blown out from the air supply ports 71 to 76 hits the back surface of the wafer substrate 50, and from the flat portions of the air gap forming portions 61 to 66 to the central air exhaust grooves 81 to 76.
It flows into 86. The air that has flowed into the central air exhaust grooves 81 to 86 flows toward the outer periphery through the central air exhaust grooves 81 to 86, and the side exhaust ports 41 to 46 and the lower exhaust ports 91 to 86.
Exhausted from 96. As a result, a predetermined amount of air gap is always formed between the air gap forming portions 61 to 66 and the wafer substrate 50, and the space 4 surrounded by the wafer substrate 50, the chuck body 2 and the rim 3 has a predetermined width. Atmospheric pressure will be maintained.

【0014】図3は基板支持部材53(51,52)の
詳細構成を示す図であり、図3(A)は基板支持部材5
3を上面から見た図であり、図3(B)はその一部断面
構造を示す図である。基板支持部材53は、略長方形状
の板材からなるレバー55と、このレバー55に取り付
けられた円柱状のピン56によって構成され、ピン56
がリム3にボールベアリング57を介して回転自在に取
り付けられている。ピン56の下側には、止め輪59が
設けられ、ピン56が離脱しないようにしてある。な
お、図示していないが、レバー55には矢印58の方向
に常時回転力を与えるバネ部材が設けられている。接触
部60は、レバー55の中でウェハ基板50の側面に対
して2箇所で接触するようになっている。また、リム3
の上面は、チャック本体2の中心に向かって傾斜してお
り、ウェハ基板50の側面部のみがリム3の上面と接触
し、ウェハ基板50の裏面はリム3の上面に接触しない
ようになっている。従って、ウェハ基板50が基板支持
部材53によって保持される場合、ウェハ基板50の半
円形状の側面のみが接触部60及びリム3によって支持
されるようになっている。レバー55はリム3の外周付
近に設けられたガイドローラ(図示せず)によって矢印
58と反対方向に回転させられ、ウェハ基板50の側面
に押し付けられるようになっている。また、レバー55
はその位置で吸着口33によって吸着保持され、ウェハ
基板50をリム3側に押し付けるように動作する。な
お、レバー55は回転モータ6の力でチャック本体2が
回転したときの遠心力によりウェハ基板50をリム3側
に押し付ける働きをする形状にすることで、より確実に
ウェハ基板50を保持する。従って、回転モータ6が停
止し、チャック本体2が停止したとき、吸着口33の真
空吸着動作を停止すると、レバー55は一点鎖線で描か
れたレバー55aの位置の移動し、ウェハ基板50を開
放するようになっている。同様に、吸着口31で基板支
持部材51を、吸着口32で基板支持部材52のレバー
55を吸着保持する。
FIG. 3 is a view showing a detailed structure of the substrate supporting member 53 (51, 52). FIG.
FIG. 3 is a view of the device 3 as viewed from above, and FIG. 3B is a diagram showing a partial cross-sectional structure thereof. The substrate support member 53 includes a lever 55 made of a substantially rectangular plate material, and a cylindrical pin 56 attached to the lever 55.
Is rotatably attached to the rim 3 via a ball bearing 57. A retaining ring 59 is provided below the pin 56 so that the pin 56 does not come off. Although not shown, the lever 55 is provided with a spring member that constantly applies a rotational force in the direction of the arrow 58. The contact portion 60 comes into contact with the side surface of the wafer substrate 50 at two places in the lever 55. Also, rim 3
Is inclined toward the center of the chuck body 2, so that only the side surface of the wafer substrate 50 contacts the upper surface of the rim 3, and the back surface of the wafer substrate 50 does not contact the upper surface of the rim 3. I have. Therefore, when the wafer substrate 50 is held by the substrate support member 53, only the semicircular side surface of the wafer substrate 50 is supported by the contact portion 60 and the rim 3. The lever 55 is rotated in the direction opposite to the arrow 58 by a guide roller (not shown) provided near the outer periphery of the rim 3, and is pressed against the side surface of the wafer substrate 50. Also, lever 55
Is sucked and held by the suction port 33 at that position, and operates so as to press the wafer substrate 50 against the rim 3 side. Note that the lever 55 has a shape that functions to press the wafer substrate 50 against the rim 3 by centrifugal force when the chuck main body 2 is rotated by the force of the rotary motor 6, so that the wafer substrate 50 is more reliably held. Accordingly, when the rotation motor 6 stops and the chuck body 2 stops, when the vacuum suction operation of the suction port 33 is stopped, the lever 55 moves to the position of the lever 55a drawn by the one-dot chain line, and opens the wafer substrate 50. It is supposed to. Similarly, the suction port 31 suction-holds the substrate support member 51, and the suction port 32 suction-holds the lever 55 of the substrate support member 52.

【0015】この実施の形態に係る基板搭載装置1がど
のようにして、ウェハ基板50のたわみを矯正するの
か、その動作を説明する。ウェハ基板50が基板支持部
材51〜53とリム3の上面によって支持されると、ウ
ェハ基板50の中央付近が自重によってたわむ。このと
き、エアギャップ形成部61〜66のエア供給口71〜
76から適量のエアが噴出しているので、このエアによ
ってウェハ基板50は、エアギャップ形成部61〜66
に接触することなく、所定のエアギャップを保持するよ
うになる。
The operation of the substrate mounting apparatus 1 according to this embodiment for correcting the deflection of the wafer substrate 50 will be described. When the wafer substrate 50 is supported by the substrate supporting members 51 to 53 and the upper surface of the rim 3, the vicinity of the center of the wafer substrate 50 is bent by its own weight. At this time, the air supply ports 71 to 71 of the air gap forming portions 61 to 66 are provided.
Since an appropriate amount of air is ejected from the air 76, the air causes the wafer substrate 50 to be separated from the air gap forming portions 61 to 66.
The predetermined air gap is maintained without contacting the air gap.

【0016】一方、ウェハ基板50が基板支持部材51
〜53及びリム3によって支持されると、ウェハ基板5
0、チャック本体2及びリム3に囲まれた空間4が形成
される。この空間4には、エア供給口71〜76から所
定量のエアが供給され、側面排気口41〜46及び下面
排気口91〜96から排出されているので、空間4内は
所定の気圧に保たれる。この気圧によってウェハ基板5
0の自重によるたわみが矯正され、ウェハ基板50のた
わみは減少すると共にほぼ平坦を維持するようになる。
On the other hand, the wafer substrate 50 is
53 and the rim 3, the wafer substrate 5
0, a space 4 surrounded by the chuck body 2 and the rim 3 is formed. Since a predetermined amount of air is supplied to the space 4 from the air supply ports 71 to 76 and discharged from the side exhaust ports 41 to 46 and the lower surface exhaust ports 91 to 96, the inside of the space 4 is maintained at a predetermined pressure. Dripping. This pressure causes the wafer substrate 5
The deflection caused by the weight of zero is corrected, the deflection of the wafer substrate 50 is reduced, and the wafer substrate 50 is maintained almost flat.

【0017】なお、上述の実施の形態では、エア供給口
71〜76がエアギャップ形成部61〜66にそれぞれ
一個ずつ設けられている場合について説明したが、複数
個設けてもよいし、設ける位置も任意でよいことは言う
までもない。また、エアギャップ形成部61〜66、側
面排気口41〜46又は下面排気口91〜96の数は、
6個に限らず、任意の数設けてもよい。エアギャップ形
成部61〜66の形状は、扇形以外の円形や四角形など
の任意の形状でよい。チャック本体の形状が円板状の場
合を説明したが、これ以外の四角形など基板(例えば、
フォトマスク、ガラス基板、液晶基板、カラーフィルタ
など)の形状に合わせて適宜変形可能なことはいうまで
もない。また、支持部材は3個以上設けてもよい。
In the above embodiment, the case where one air supply port 71-76 is provided in each of the air gap forming portions 61-66 has been described. Needless to say, this is optional. The number of the air gap forming portions 61 to 66, the side exhaust ports 41 to 46 or the lower exhaust ports 91 to 96 is as follows.
The number is not limited to six, and any number may be provided. The shape of the air gap forming portions 61 to 66 may be an arbitrary shape such as a circle or a square other than the fan shape. Although the case where the shape of the chuck body is a disk is described, a substrate such as a square other than this (for example,
Needless to say, the shape can be appropriately changed according to the shape of a photomask, a glass substrate, a liquid crystal substrate, a color filter, and the like. Further, three or more support members may be provided.

【0018】[0018]

【発明の効果】本発明の基板搭載装置によれば、基板の
平面度を維持したまま裏面を非接触状態で保持すること
ができるという効果がある。
According to the substrate mounting apparatus of the present invention, there is an effect that the back surface can be held in a non-contact state while maintaining the flatness of the substrate.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明に係る基板搭載装置の概略構成を示す
図である。
FIG. 1 is a view showing a schematic configuration of a substrate mounting apparatus according to the present invention.

【図2】 図1の断面図であり、図2(A)は図1のA
−A面、図2(B)は図1のB−B面の断面図である。
FIG. 2 is a cross-sectional view of FIG. 1, and FIG.
FIG. 2B is a cross-sectional view taken along a plane BB in FIG. 1.

【図3】 図3は基板支持部材の詳細構成を示す図であ
る。
FIG. 3 is a diagram illustrating a detailed configuration of a substrate supporting member.

【符号の説明】[Explanation of symbols]

1…基板搭載装置 2…チャック本体 3…リム 31〜33…吸着口 41〜46…排気口 5…エアスピンドル 50…ウェハ基板 51〜53…基板支持部材 6…回転モータ 61〜66…エアギャップ形成部 71〜76…エア供給口 81〜86…中心部エア排気溝 91〜96…排気口 DESCRIPTION OF SYMBOLS 1 ... Board mounting apparatus 2 ... Chuck main body 3 ... Rim 31-33 ... Suction port 41-46 ... Exhaust port 5 ... Air spindle 50 ... Wafer substrate 51-53 ... Substrate support member 6 ... Rotary motor 61-66 ... Air gap formation Portions 71 to 76 Air supply ports 81 to 86 Central air exhaust grooves 91 to 96 Exhaust ports

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 基板を保持するチャック本体と、 前記基板の形状に従って前記チャック本体に設けられた
リム手段と、 前記リム手段の上面で前記基板の側面部を支持する支持
手段と、 前記基板に対して下側からエアを吹きつけるエア供給手
段と、 前記基板と前記チャック本体と前記リムとによって形成
される空間内の空気を排出するエア排出手段とを含んで
構成されたことを特徴とする基板搭載装置。
A chuck body for holding a substrate; rim means provided on the chuck body in accordance with a shape of the substrate; supporting means for supporting a side portion of the substrate on an upper surface of the rim means; Air supply means for blowing air from below, and air discharge means for discharging air in a space formed by the substrate, the chuck body and the rim. Board mounting equipment.
【請求項2】 請求項1において、 前記エア排気手段は前記リム手段の側面部及び前記チャ
ック本体の下面部の少なくとも一方に1又は複数設けら
れていることを特徴とする基板搭載装置。
2. The substrate mounting apparatus according to claim 1, wherein one or a plurality of the air exhaust units are provided on at least one of a side surface of the rim unit and a lower surface of the chuck body.
【請求項3】 請求項1又は2において、 前記エア供給手段は、前記チャック本体の中央付近に設
けられた前記リム手段よりも低い平坦部を有する島状の
エアギャップ形成部の複数によって構成されていること
を特徴とする基板搭載装置。
3. The air supply means according to claim 1, wherein the air supply means comprises a plurality of island-shaped air gap forming portions provided near the center of the chuck body and having a flat portion lower than the rim means. A substrate mounting device, characterized in that:
【請求項4】 請求項1、2又は3において、さらに、 前記チャック本体を回転可能なように固定するエアスピ
ンドル手段と、 前記エアスピンドル手段に回転駆動力を与えるモータ手
段とを備えたことを特徴とする基板搭載装置。
4. The air conditioner according to claim 1, further comprising: air spindle means for rotatably fixing the chuck body; and motor means for applying a rotational driving force to the air spindle means. Characteristic board mounting equipment.
【請求項5】 請求項1から4までのいずれか一つにお
いて、 前記リム手段の上面が前記チャック本体の中央に向かっ
て傾斜し、前記基板の側面部のみと接触するように構成
されていることを特徴とする基板搭載装置。
5. The rim means according to claim 1, wherein an upper surface of the rim means is inclined toward a center of the chuck body and is in contact with only a side surface of the substrate. A substrate mounting apparatus characterized by the above-mentioned.
【請求項6】 請求項5において、前記支持手段が、 前記リム手段の上面に回転自在に設けられ、前記基板の
側面部に接触する接触部を備えた略長方形状の板材から
なるレバー部材と、 前記レバー部材を前記リム手段に吸着する吸着口と、 前記レバー部材が前記チャック本体から離れる方向に常
時回転力を与えるバネ部材とを含んで構成されているこ
とを特徴とする基板搭載装置。
6. The lever member according to claim 5, wherein the support means is provided on a top surface of the rim means so as to be rotatable, and comprises a substantially rectangular plate member provided with a contact portion which comes into contact with a side surface of the substrate. A substrate mounting apparatus, comprising: a suction port for sucking the lever member to the rim means; and a spring member for constantly applying a rotational force in a direction in which the lever member is separated from the chuck body.
JP2000080695A 2000-03-22 2000-03-22 Board mounting device Expired - Lifetime JP3936828B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000080695A JP3936828B2 (en) 2000-03-22 2000-03-22 Board mounting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000080695A JP3936828B2 (en) 2000-03-22 2000-03-22 Board mounting device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006218563A Division JP4643520B2 (en) 2006-08-10 2006-08-10 Inspection method and inspection apparatus

Publications (2)

Publication Number Publication Date
JP2001267404A true JP2001267404A (en) 2001-09-28
JP3936828B2 JP3936828B2 (en) 2007-06-27

Family

ID=18597764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000080695A Expired - Lifetime JP3936828B2 (en) 2000-03-22 2000-03-22 Board mounting device

Country Status (1)

Country Link
JP (1) JP3936828B2 (en)

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JP2007081450A (en) * 2006-12-26 2007-03-29 Dainippon Printing Co Ltd Work stage of aligner and exposure method
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JP2007081450A (en) * 2006-12-26 2007-03-29 Dainippon Printing Co Ltd Work stage of aligner and exposure method
JP2009070996A (en) * 2007-09-12 2009-04-02 Mitsubishi Electric Corp Vacuum suction stage and semiconductor manufacturing method using the same
JP2009277795A (en) * 2008-05-13 2009-11-26 Tokyo Electron Ltd Applying apparatus, applying method and storage medium
JP2009277870A (en) * 2008-05-14 2009-11-26 Tokyo Electron Ltd Applying apparatus, applying method, applying developing apparatus, and storage medium
JP2009277872A (en) * 2008-05-14 2009-11-26 Tokyo Electron Ltd Substrate processing apparatus, substrate processing method, applying and developing apparatus, and storage medium
JP2011211136A (en) * 2010-03-31 2011-10-20 Hitachi High-Technologies Corp Substrate holding apparatus, substrate holding method, and inspecting apparatus, and inspecting method using the substrate holding apparatus and the substrate holding method
US8723536B2 (en) 2010-03-31 2014-05-13 Hitachi High-Technologies Corporation Inspection apparatus, substrate mounting device and inspection method
JP2017506002A (en) * 2014-02-11 2017-02-23 ズス・マイクロテック・リソグラフィ・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツングSuss MicroTec Lithography GmbH Method and apparatus for preventing deformation of a substrate supported in an edge region
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CN110517968B (en) * 2019-08-19 2022-12-20 西安奕斯伟材料科技有限公司 Warping degree control method and device

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