JP2001217370A - Lead frame and resin sealed device - Google Patents

Lead frame and resin sealed device

Info

Publication number
JP2001217370A
JP2001217370A JP2000028384A JP2000028384A JP2001217370A JP 2001217370 A JP2001217370 A JP 2001217370A JP 2000028384 A JP2000028384 A JP 2000028384A JP 2000028384 A JP2000028384 A JP 2000028384A JP 2001217370 A JP2001217370 A JP 2001217370A
Authority
JP
Japan
Prior art keywords
resin
lead frame
runner
resin sealing
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000028384A
Other languages
Japanese (ja)
Inventor
Matsukichi Takahashi
松吉 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP2000028384A priority Critical patent/JP2001217370A/en
Publication of JP2001217370A publication Critical patent/JP2001217370A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

PROBLEM TO BE SOLVED: To obtain a lead frame and a resin sealed device in which residual resin is removed without causing any cracking in the resin remaining on a runner by the impact of a punch. SOLUTION: A lead frame 12 is provided with cut holes 19 and an upper die 1 is provided with recesses 3 facing the cut holes 19, at the time of resin sealing, so that no protrusion, projecting from the cut hole 19 of the lead frame 12 and adhering to the lead frame 12 after resin sealing, is formed on the resin mass of a runner 16.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体チップが搭
載されるアイランドと該アイランドの周囲から派生する
複数のリ−ドとを含む樹脂封止成形領域が一枚の金属板
に縦横に配列され形成されたリ−ドフレ−ム及び該リ−
ドフレ−ムに搭載された前記半導体チップを樹脂封止し
樹脂封止されたリ−ドフレ−ムの樹脂バリを除去する樹
脂封止装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin molded area including an island on which a semiconductor chip is mounted and a plurality of leads derived from the periphery of the island are arranged vertically and horizontally on a single metal plate. Lead frame formed and said lead frame
The present invention relates to a resin sealing device for sealing a semiconductor chip mounted on a do frame with a resin and removing resin burrs of the lead frame sealed with the resin.

【0002】[0002]

【従来の技術】従来、この種のリ−ドフレ−ムは、半導
体チップが搭載され樹脂封止されるアイランドが一枚の
金属板にマトリックス状に配列してプレスまたはエッチ
ング加工されたものである。特に、QFP型パッケ−ジ
の半導体装置には、生産性が高いという観点からこのリ
−ドフレ−ムが使用されていた。
2. Description of the Related Art Conventionally, a lead frame of this type is formed by arranging islands on which a semiconductor chip is mounted and sealed with a resin on a single metal plate in a matrix and pressing or etching. . In particular, this lead frame has been used in a semiconductor device of a QFP type package from the viewpoint of high productivity.

【0003】図7はマトリックス型リ−ドフレ−ムへの
半導体チップの組立工程の一例を説明するための流れ図
である。このQFPパッケ−ジの半導体装置の組立は、
図7に示すように、まず、リ−ドフレ−ムのアイランド
に半導体チップをマウントし、半導体チップの電極パッ
ドとリ−ドフレ−ムの内部リ−ドとをワイヤリングし、
半導体チップとワイヤとリ−ドを含む樹脂封止形成領域
を樹脂封止していた。また、樹脂封止された樹脂封止形
成領域における不要なランナ−部やゲ−ト部の樹脂残り
である樹脂バリ等をポンチで打ち抜き除去していた。
FIG. 7 is a flow chart for explaining an example of a process of assembling a semiconductor chip into a matrix type lead frame. The assembly of the semiconductor device of this QFP package
As shown in FIG. 7, first, a semiconductor chip is mounted on an island of a lead frame, and an electrode pad of the semiconductor chip and an internal lead of the lead frame are wired.
A resin-sealed formation region including a semiconductor chip, a wire, and a lead is sealed with a resin. Unnecessary runner portions and resin burrs remaining in the gate portion in the resin-sealed resin-sealed formation region are punched and removed with a punch.

【0004】しかしながら、この組立工程では、外装メ
ッキ後のタイバ−切断の際に発生する樹脂屑がタイバ−
切断金型またはリ−ド成形金型に落下し、タイバ−切断
金型のダイを損傷さえたり、樹脂屑がリ−ド成形金型の
成形ポンチに固着し、リ−ドのコンタクト不良を起こす
という問題が起きていた。
[0004] However, in this assembling process, resin dust generated at the time of cutting the tie bar after the outer plating is generated.
Dropping on the cutting die or lead forming die, even damaging the die of the tie bar cutting die, or resin dust sticking to the forming punch of the lead forming die, causing poor contact of the lead. That was the problem.

【0005】図8はマトリックス型リ−ドフレ−ムへの
半導体チップの組立工程の他の例を説明するための流れ
図である。そこで、図8に示すように、タイバ−切断工
程を外装メッキ工程の前に行うことにより、樹脂屑がリ
−ドに付着しても、外装メッキ工程において付着した樹
脂屑を除去することで解消していた。
FIG. 8 is a flow chart for explaining another example of the process of assembling a semiconductor chip into a matrix type lead frame. Therefore, as shown in FIG. 8, by performing the tie-bar cutting step before the exterior plating step, even if resin dust adheres to the lead, the resin dust attached in the exterior plating step is eliminated by removing the resin waste. Was.

【0006】[0006]

【発明が解決しようとする課題】図9(a)および
(b)は課題を説明するための樹脂封止後のリ−ドフレ
−ムの状態を示す図である。しかしながら、タイバ−切
断を外装メッキ前に行うことにより新たな問題が発生す
ることになった。
FIGS. 9A and 9B are views showing the state of a lead frame after resin sealing for explaining the problem. However, performing the tie-bar cutting before the outer plating causes a new problem.

【0007】図8の封入工程における樹脂封入では、リ
−ドフレ−ム上の半導体チップを含む樹脂封止形成領域
が樹脂封止されると、図9(a)に示すように、樹脂封
止金型のランナ−の両側にあるキャビティで成形される
樹脂体13と、ランナ−に充填された樹脂が成形された
ランナ−上の残り20bとランナ−からゲ−トに通じる
溶融樹脂の流路で成形されるゲ−ト残り20aがリ−ド
フレ−ム12に付着した状態に成形される。
In the resin encapsulation in the encapsulation step of FIG. 8, when the resin encapsulation forming area including the semiconductor chip on the lead frame is encapsulated with resin, as shown in FIG. The resin body 13 molded in the cavities on both sides of the mold runner, the remaining 20b on the runner in which the resin filled in the runner is molded, and the flow path of the molten resin from the runner to the gate. The gate residue 20a formed in the step (1) is formed in a state of being attached to the lead frame (12).

【0008】このように樹脂体13と連なりリ−ドフレ
−ム12に付着するゲ−ト残り20aとランナ−残り2
0bとをリ−ドフレ−ム12から除去するには、ポンチ
14及び15をもつ樹脂バリ除去金型が使用された。ポ
ンチ15で打ち抜かれるゲ−ト残り20aは、ゲ−トの
くびれた部分が破断し容易に除去される。
As described above, the remaining gate 20a and the remaining runner 2 are connected to the resin body 13 and adhere to the lead frame 12.
In order to remove Ob from the lead frame 12, a resin deburring mold having punches 14 and 15 was used. The remaining gate 20a punched by the punch 15 is easily removed because the constricted portion of the gate is broken.

【0009】しかし、ランナ−上の残り20bは、ポン
チ14の衝撃力によって、図9(b)に示すように、リ
−ドフレ−ム12の樹脂保持穴の側壁部の樹脂部にクラ
ック22が生じ、クラック22によって分離された大き
な樹脂塊に分離され下方に落下する。しかしながら、長
いランナ−上のリ−ドフレ−ムの変形防止に設けられた
樹脂保持穴の内壁に円形状の樹脂屑21は付着したまま
残る。この樹脂屑21は、リ−ドフレ−ムをタイバ−切
断金型に搬送したときの衝撃で剥離し下方に落下し、タ
イバ−切断金型のダイ上に載せらる。そして、タイバ−
切断ポンチの下降によって、リ−ドが樹脂屑により破損
したり、高価な金型のダイの刃先を破損させたりする問
題が生じていた。
However, the remaining 20b on the runner is cracked by the impact force of the punch 14 at the resin portion on the side wall of the resin holding hole of the lead frame 12, as shown in FIG. Then, they are separated into large resin blocks separated by the cracks 22 and fall downward. However, the circular resin waste 21 remains adhered to the inner wall of the resin holding hole provided for preventing deformation of the lead frame on the long runner. The resin dust 21 is peeled off by the impact when the lead frame is transported to the tie-bar cutting die, falls downward, and is placed on the die of the tie-bar cutting die. And the tie bar
When the cutting punch descends, there are problems that the lead is broken by resin dust and the blade of an expensive die is damaged.

【0010】従って、本発明の目的は、ポンチの衝撃に
よるランナ−上の樹脂残りにクラックを発生させること
なく樹脂残りを除去できるリ−ドフレ−ム及び樹脂封止
装置を提供することにある。
Accordingly, an object of the present invention is to provide a lead frame and a resin sealing device capable of removing the resin residue without causing cracks in the resin residue on the runner due to the impact of the punch.

【0011】[0011]

【課題を解決するための手段】本発明の第1の特徴は、
半導体チップが搭載されるアイランドとこのアイランド
の周辺から外方に伸びる複数のリ−ドと該リ−ドどうし
を連結するタイバ−とを含む複数の方形状の樹脂封止形
成領域が一枚の金属板に縦横に形成されているリ−ドフ
レ−ムにおいて、縦方向に2列に並ぶ前記樹脂封止形成
領域の隣接する角部の間にあって横方向に伸びる短冊状
の切り欠き穴を有するリ−ドフレ−ムである。また、前
記切り欠き穴の端部は円形状であることが望ましい。
A first feature of the present invention is as follows.
A plurality of rectangular resin sealing formation regions including an island on which the semiconductor chip is mounted, a plurality of leads extending outward from the periphery of the island, and a tie connecting the leads to one another are provided. In a lead frame formed in a metal plate vertically and horizontally, a strip having a strip-shaped notch hole extending in a horizontal direction between adjacent corners of the resin sealing formation region arranged in two rows in a vertical direction. -Do frame. Further, it is desirable that the end of the notch hole has a circular shape.

【0012】本発明の第2の特徴は、前記リ−ドフレ−
ムの該切り欠き穴に対向する窪みとキャビティの上半分
を形成する凹みと前記リ−ドフレ−ムの通過穴から溶融
樹脂を流し込むゲ−トに至る溶融樹脂流路の一部とが形
成される上型1と、前記溶融樹脂が流れ込むランナ−と
該ランナ−から派生し前記ゲ−トと通ずるサブランナ−
と前記キャビティの下半分を形成する凹みとが形成され
る下型とを具備する樹脂封止金型を備える樹脂封止装置
である。また、前記窪みの底部から突出しその高さが前
記窪みの深さより低い突出部を有することが望ましい。
さらに、前記窪みが形成されるとともに前記上型に取付
け取外し可能な駒部材を有することが望ましい。
[0012] A second feature of the present invention is the above-mentioned lead frame.
And a recess forming the upper half of the cavity and a part of the molten resin flow path from the passage hole of the lead frame to the gate into which the molten resin flows. Upper mold 1, a runner into which the molten resin flows, and a sub-runner derived from the runner and communicating with the gate.
A resin sealing device, comprising: a resin molding die comprising: a lower mold in which a recess forming the lower half of the cavity is formed. In addition, it is preferable that the projection has a projection projecting from the bottom of the depression and having a height lower than the depth of the depression.
Further, it is desirable to have a piece member in which the recess is formed and which can be attached to and detached from the upper mold.

【0013】そして、最も望ましい形態は、本発明の第
2の特徴である樹脂封止金型によって前記リ−ドフレ−
ムの前記樹脂封止形成領域が樹脂封止され前記窪みによ
って成形される樹脂突起部材を打ち抜き落とす第1のポ
ンチと、前記ゲ−トに至る前記サブランナ−で成形され
るゲ−ト樹脂残りを打ち抜き落とす第2のポンチとを具
備する樹脂バリ除去金型を備えることである。
[0013] The most desirable mode is that the lead frame is formed by a resin mold which is the second feature of the present invention.
A first punch for punching out a resin projecting member formed by the recess in which the resin sealing formation region of the system is sealed with the resin, and a gate resin residue formed by the sub-runner reaching the gate. The present invention is to provide a resin deburring mold including a second punch to be punched and dropped.

【0014】[0014]

【発明の実施の形態】次に、本発明について図面を参照
して説明する。
Next, the present invention will be described with reference to the drawings.

【0015】図1(a)および(b)は本発明の一実施
の形態におけるリ−ドフレ−ム及び樹脂封止装置を説明
するための下型に載置されたリ−ドフレ−ムの平面図及
びAA断面矢視図である。このマトリックス型のリ−ド
フレ−ム12は、図1に示すように、半導体チップ24
が搭載されるアイランド21とこのアイランド21の周
辺から外方に伸びる複数のリ−ド22とを含む複数の樹
脂封止形成領域12aが1枚の金属板に縦横に形成され
ている。
FIGS. 1A and 1B are plan views of a lead frame placed on a lower mold for explaining a lead frame and a resin sealing device according to an embodiment of the present invention. It is a figure and AA sectional arrow view. As shown in FIG. 1, the lead frame 12 of the matrix type has a semiconductor chip 24.
Are formed vertically and horizontally on a single metal plate, including an island 21 on which is mounted and a plurality of leads 22 extending outward from the periphery of the island 21.

【0016】また、このリ−ドフレ−ム12には、樹脂
体が成形される金型のキャビティ4のゲ−ト5に溶融樹
脂を流しこむ通過穴18の他に、紙面の縦方向に隣接す
る樹脂封止形成領域12aの角部の間を横方向に伸びる
短冊状の切り欠き穴19を設けている。この切り欠き穴
19の端部は円形状であることが望ましい。なお、この
切り欠き穴19は後述する突起部を形成する役割を担う
ことになる。
Further, the lead frame 12 is adjacent to the lead frame 12 in the longitudinal direction of the paper surface, in addition to the passage hole 18 for pouring the molten resin into the gate 5 of the cavity 4 of the mold in which the resin body is molded. A rectangular cutout hole 19 extending horizontally between the corners of the resin sealing formation region 12a is provided. The end of the notch 19 is desirably circular. The notch 19 plays a role of forming a projection described later.

【0017】一方、半導体チップ24がアイランド21
に搭載されワイヤリングされたリ−ドフレ−ム12を下
型2に載置して樹脂封止形成領域12aを樹脂封止する
樹脂封止金型は、図1(b)に示すように、リ−ドフレ
−ム12の切り欠き穴19に対向する窪み3とキャビテ
ィ4の上半分を形成する凹みと通過穴18から溶融樹脂
を流し込むゲ−ト5への溶融樹脂の流路の一部のとが形
成される上型1と、図示していないポットからの溶融樹
脂が流れ込むランナ−16とランナ−16から派生しゲ
−ト5と通ずるサブランナ−17とキャビティ4の下半
分を形成する凹みとが形成される下型2とを備えてい
る。
On the other hand, the semiconductor chip 24 is
As shown in FIG. 1 (b), a resin sealing mold for mounting the lead frame 12 mounted and wired on the lower mold 2 and sealing the resin sealing formation region 12a with a resin is shown in FIG. The recess 3 facing the notch hole 19 of the frame 12, the recess forming the upper half of the cavity 4, and a part of the flow path of the molten resin to the gate 5 into which the molten resin flows from the passage hole 18. Is formed, a runner 16 into which molten resin flows from a pot (not shown), a subrunner 17 derived from the runner 16 and communicating with the gate 5, and a recess forming the lower half of the cavity 4. Is formed.

【0018】次に、図1のリ−ドフレ−ムを使用して樹
脂封止する動作について説明する。まず、半導体チップ
24がアイランド21に搭載されたリ−ドフレ−ム12
を下型2に載置する。そして、型締めしてから、ポット
からランナ−16に溶融樹脂を流し込む。溶融樹脂は紙
面の左から右にランナ−16に流れ込み一番端のランナ
−16に到達すると、溶融樹脂の圧力が上昇し、圧力の
上昇に伴い溶融樹脂は切り欠き穴19から入り込み溶融
樹脂が窪み3に充填されると同時にサブランナ−17を
通りゲ−ト5からキャビティ4に充填される。
Next, the operation of resin sealing using the lead frame of FIG. 1 will be described. First, the lead frame 12 in which the semiconductor chip 24 is mounted on the island 21
Is placed on the lower mold 2. Then, after closing the mold, the molten resin is poured from the pot into the runner 16. The molten resin flows into the runner 16 from left to right on the plane of the paper, and when it reaches the foremost runner 16, the pressure of the molten resin increases. As the pressure increases, the molten resin enters through the notch 19, and the molten resin is removed. At the same time as the cavity 3 is filled, the cavity 4 is filled from the gate 5 through the sub-runner 17.

【0019】図2は樹脂封止後のリ−ドフレ−ムの一部
分を抽出して示す斜視図である。上述した樹脂封止金型
で樹脂封止され型離れしたリ−ドフレ−ム12は、図2
に示すように、ランナ−16から型離れしたランナ−上
の残り20bと一体化し窪み3により成形された突起部
20cと、ゲ−ト5からサブランナ−17に至る溶融樹
脂の流路から型離れしたゲ−ト残り20aと、このゲ−
ト残り20aと連なりキャビティ4から型離れした樹脂
体13とがリ−ドフレ−ム12の表裏面に被着した状態
になっている。
FIG. 2 is a perspective view showing a part of the lead frame after resin sealing. The lead frame 12 which is resin-sealed by the above-described resin-sealing mold and separated from the mold is shown in FIG.
As shown in FIG. 7, the protrusion 20c formed by the depression 3 integrated with the rest 20b on the runner separated from the runner 16 and the mold from the flow path of the molten resin from the gate 5 to the sub-runner 17. The remaining gate 20a and this gate
The resin body 13 connected to the rest 20a and separated from the cavity 4 is adhered to the front and back surfaces of the lead frame 12.

【0020】また、図面には示していないが、樹脂体1
3の周辺部からはリ−ド22及びタイバ−23は樹脂体
13から露出した状態になっている。そして、隣合う樹
脂体13の側面から導出するリ−ド22の下面は、突起
部20cから離れたランナ−上の残り20bの上に被着
された状態になっている。しかし、この被着強さは弱
く、後述するポンチの衝撃により簡単に剥離できる。
Although not shown in the drawings, the resin body 1
The lead 22 and the tie bar 23 are exposed from the resin body 13 from the peripheral portion 3. The lower surface of the lead 22 extending from the side surface of the adjacent resin body 13 is attached to the rest 20b on the runner away from the projection 20c. However, the adhesion strength is weak, and it can be easily peeled off by the impact of a punch described later.

【0021】図3は図2の突起部とゲ−ト残りとランナ
−上の残りの樹脂を除去する樹脂バリ除去金型を説明す
るための図である。この樹脂バリ除去金型は,樹脂体1
3を入れ込みリ−ドフレ−ム12を載置するとともに抜
き穴7を有する下型6と、窪み3で成形された突起部2
0cを叩くポンチ14と、図1のゲ−ト5に至るサブラ
ンナ−17によって成形されるゲ−ト残り20aを叩く
ポンチ15とを備えている。
FIG. 3 is a view for explaining a resin burr removing mold for removing the protrusion, the remaining gate and the remaining resin on the runner of FIG. This mold for removing resin burrs has a resin body 1
3, a lower die 6 on which a lead frame 12 is placed and which has a hole 7;
It comprises a punch 14 for hitting 0c, and a punch 15 for hitting the remaining gate 20a formed by the sub-runner 17 leading to the gate 5 in FIG.

【0022】次に、この樹脂バリ除去金型による樹脂バ
リ除去動作について説明する。樹脂封止形成領域12a
が樹脂封止されたリ−ドフレ−ム12は、図示していな
い搬送装置により下型6に載置される。次に、上型が下
降し、ポンチ14は突起部20cを叩くと同時にポンチ
15はゲ−ト残り20aを叩く。
Next, the operation of removing the resin burr by the resin burr removing mold will be described. Resin sealing formation region 12a
The lead frame 12 sealed with resin is placed on the lower die 6 by a transfer device (not shown). Next, the upper die is lowered, and the punch 14 hits the projection 20c and the punch 15 hits the remaining gate 20a.

【0023】このことにより突起部20cはリ−ドフレ
−ム12から離脱しランナ−上の残り20bとともに抜
け穴7を通して下方に落下する。一方、ポンチ15で叩
かれたゲ−ト残り20aはくびれたゲ−ト5の部分で破
断し抜け穴7を通して下方に落下する。ここで、突起部
20cとランナ−上の残り20bとが接する隅部は、図
2に示すように、Rをもたせているので、従来のよう
に、この部分で切り欠き効果が起きずクラックが発生す
ることがない。
As a result, the projection 20c separates from the lead frame 12 and falls downward through the through hole 7 together with the rest 20b on the runner. On the other hand, the remaining gate 20a hit by the punch 15 breaks at the constricted gate 5 and falls downward through the through hole 7. Here, as shown in FIG. 2, the corner where the projection 20c and the remaining 20b on the runner contact each other has a radius, so that the notch effect does not occur in this portion and cracks occur as in the related art. Does not occur.

【0024】このように完全に樹脂バリが除去されたリ
−ドフレ−ムは、タイバ−切断金型に搬送装置によって
送られ、リ−ドを連結するタイバ−が切断される。この
ように突起部20cを設けることによって、クラックを
発生させることなく樹脂バリを完全に除去されるので、
タイバ−切断金型のダイに樹脂屑が落下することが無く
なり、従来起きていたリ−ドの打痕が皆無となる。
The lead frame from which the resin burrs have been completely removed in this manner is sent to a tie-cutting die by a transfer device, and the tie connecting the leads is cut. By providing the projections 20c in this manner, the resin burr can be completely removed without generating cracks.
The resin chips do not fall onto the die of the tie-bar cutting die, and there is no dent on the lead, which has conventionally occurred.

【0025】図4(a)および(b)は突起部の最適設
計を説明するための図である。前述したようにクラック
を生じさせないでランナ−上の残り20bを除去するた
めに設けられた突起部20cの形状は、短冊状であって
その端部が円形状であることが望ましい。
FIGS. 4A and 4B are diagrams for explaining the optimum design of the projection. As described above, the shape of the projection 20c provided for removing the remaining portion 20b on the runner without causing cracks is desirably a strip shape and its end is preferably a circular shape.

【0026】そして、形状を決定する寸法は、図4に示
すように、L1、W1、H1とし、リ−ドフレ−ム12
の切り欠き穴19の寸法L2、W2とすれば、この寸法
を設定するに当たって、例えば、上型と下型の相対的位
置ずれは、クリアランスを含めても0.05mm以内で
あることが必要である。また、このときのL1はL2よ
り0.025mm小さくなる。また、突起部20cの幅
W1も切り欠き穴19の幅より0.025mm小さくな
る。
The dimensions for determining the shape are L1, W1, and H1, as shown in FIG.
When the dimensions L2 and W2 of the notch holes 19 are set, for example, in setting these dimensions, it is necessary that the relative displacement between the upper die and the lower die be within 0.05 mm including the clearance. is there. L1 at this time is smaller than L2 by 0.025 mm. Further, the width W1 of the projection 20c is also smaller by 0.025 mm than the width of the notch hole 19.

【0027】一方、突起部20cの高さH1となる図1
の窪み3の彫り込み深さについては、リ−ドフレ−ム1
2の厚さより深くすることである。例えば、リ−ドフレ
−ム12の厚さが0.15mmであれば、金型からの離
脱し易いように抜き勾配を含めても0.2mm程度の深
さが必要になる。要は、ポンチで打ち抜くときに、クラ
ックが発生しないように突起部20cの周辺の樹脂強度
をもたせれば良い。
On the other hand, FIG. 1 shows the height H1 of the projection 20c.
The depth of engraving of the recess 3 of the lead frame 1
2 is to be deeper than the thickness. For example, if the thickness of the lead frame 12 is 0.15 mm, a depth of about 0.2 mm is required including the draft to facilitate detachment from the mold. In short, it is only necessary to give the resin strength around the protruding portion 20c so that cracks do not occur when punching with a punch.

【0028】また、突起部20cの強度をより大きくす
るために、高さH1を大きくすることは、樹脂の使用量
を増大させるだけで、コスト面から必ずしも得策の方法
ではない。むしろ、突起部20cとランナ−上の残り2
0bとの繋ぎ部にア−ルや面をもたせることが望まし
い。このア−ルまたは傾斜面をもたせるには、上型の窪
み3の入口部分を面取りするか、ア−ル形状にすれば良
い。なお、実際の突起部20cの容積は、0.1立方セ
ンチメ−トル程度であって、一回の封入で樹脂使用量は
0.2g程度で全体の使用量に対して誤差の範囲であ
る。
In order to further increase the strength of the projection 20c, increasing the height H1 only increases the amount of resin used, and is not necessarily a cost-effective method. Rather, the protrusion 20c and the remaining 2 on the runner
It is desirable to provide an arc or a surface at the connecting portion with 0b. In order to provide the arc or the inclined surface, the entrance portion of the upper mold cavity 3 may be chamfered or formed in an arc shape. Note that the actual volume of the projection 20c is about 0.1 cubic centimeter, and the amount of resin used per encapsulation is about 0.2 g, which is within the range of error with respect to the entire amount used.

【0029】図5は上型の窪みの変形例によって樹脂封
止されたリ−ドフレ−ムを示す図である。この樹脂封止
金型は、図1の窪み3は底部から突出しその高さが窪み
3の深さより低い突出部を設けたことである。このこと
により、図5の突起部20cに凹み20dが形成され
る。それ以外は図1の樹脂封止金型と同じである。
FIG. 5 is a view showing a lead frame sealed with resin by a modified example of the upper die. In this resin-sealing mold, the depression 3 in FIG. 1 is provided with a projection projecting from the bottom and having a height lower than the depth of the depression 3. As a result, a recess 20d is formed in the protrusion 20c of FIG. Other than that, it is the same as the resin sealing mold of FIG.

【0030】この窪み3の中に突出部を設けることによ
り、図5に示すように、突起部20cに凹み20dが生
じ、その分樹脂使用量を減らすことができる。特にリ−
ドフレ−ム12が大きくなり、窪み3の数が増加する
と、窪み3に使用する樹脂量が無視し得なくなり、この
ように窪み3に突出部を設け、消費される樹脂量をより
少なくすることが望ましい。
By providing the protruding portion in the recess 3, as shown in FIG. 5, a recess 20d is formed in the protruding portion 20c, and the amount of resin used can be reduced accordingly. Especially Lee
As the do frame 12 becomes larger and the number of the dents 3 increases, the amount of resin used for the dents 3 cannot be ignored, and thus the protrusions are provided in the dents 3 to reduce the amount of resin consumed. Is desirable.

【0031】図6は図1の上型の変形例を示す上型の一
部の断面図である。図1の上型1の窪み3は上型の面に
直接彫り下げて製作している。しかし、リ−ドフレ−ム
の変更に伴い窪み3の大きさが変更されたとき、上型1
を製作し直すことは、多大な工数と費用が必要となる。
そこで、本金型では、図6に示すように、窪み3が形成
された駒8を単体で別途製作し、金型の上型10に駒8
を取付け取外しできるようにしたことである。
FIG. 6 is a sectional view of a part of the upper die showing a modification of the upper die of FIG. The depression 3 of the upper die 1 of FIG. 1 is manufactured by directly engraving the surface of the upper die. However, when the size of the recess 3 is changed due to the change of the lead frame, the upper mold 1
Re-producing a large amount of man-hours and costs is required.
Therefore, in the present mold, as shown in FIG. 6, a piece 8 having a depression 3 is separately manufactured as a single piece, and the piece 8 is attached to the upper mold 10 of the mold.
Can be attached and detached.

【0032】この駒8は、上型10と同じ材質の工具鋼
で製作し、予め上型10の窪みにはめ込み、位置ずれし
ないように皿ねじ9で固定する。また、皿ねじ9の代わ
りに、吊りボルトを使用して、上型1の上から掘り下げ
吊りボルトで駒8を上型1に固定しても良い。
The block 8 is made of tool steel of the same material as that of the upper die 10, is fitted in advance in a recess of the upper die 10, and is fixed with a flat head screw 9 so as not to be displaced. Further, instead of the flathead screw 9, a hanging bolt may be used, and the piece 8 may be dug down from above the upper die 1 and fixed to the upper die 1 with the hanging bolt.

【0033】[0033]

【発明の効果】以上説明したように本発明は、樹脂封止
後にリ−ドフレ−ムに付着する樹脂塊の上にリ−ドフレ
−ムから突出する突起部が成形されるようにリ−ドフレ
−ムに切り欠き穴とこの切り欠き穴に対向する窪みを上
型に設けることによって、リ−ドフレ−ムと樹脂塊の境
界にクラックを発生させることなく樹脂塊をポンチで打
ち抜きリ−ドフレ−ムから除去することができるので、
タイバ−切断金型に樹脂屑を落とすことが無くなり、リ
−ドの打痕による不良が低減され品質の歩留まりが向上
するという効果がある。
As described above, according to the present invention, the lead frame is formed so that the protrusion protruding from the lead frame is formed on the resin mass adhering to the lead frame after the resin sealing. -By providing a cutout hole and a recess facing the cutout hole in the upper die, the resin mass is punched out with a punch without generating cracks at the boundary between the lead frame and the resin mass. Can be removed from the
There is no dropping of resin dust on the tie-bar cutting die, and there is an effect that defects due to dents on the lead are reduced and the yield of quality is improved.

【0034】また、樹脂屑のタイバ−切断金型のダイへ
の落下が無くなり、ダイの切刃の損傷が無くなり、ダイ
の寿命も長くなり、設備コスト及び運用コストが大幅に
節減できるという効果もある。
In addition, there is no dropping of the resin waste to the die of the tie-bar cutting die, the damage of the die cutting edge is eliminated, the life of the die is prolonged, and the facility and operation costs can be greatly reduced. is there.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態におけるリ−ドフレ−ム
及び樹脂封止装置を説明するための下型に載置されたリ
−ドフレ−ムの平面図及びAA断面矢視図である。
FIG. 1 is a plan view of a lead frame placed on a lower mold and a cross-sectional view taken along a line AA for explaining a lead frame and a resin sealing device according to an embodiment of the present invention. .

【図2】樹脂封止後のリ−ドフレ−ムの一部分を抽出し
て示す斜視図である。
FIG. 2 is a perspective view extracting and showing a part of a lead frame after resin sealing.

【図3】図2の突起部とゲ−ト残りとランナ−上の残り
の樹脂を除去する樹脂バリ除去金型を説明するための図
である。
FIG. 3 is a view for explaining a resin burr removing mold for removing a protrusion, a gate residue, and a resin remaining on a runner of FIG. 2;

【図4】突起部の最適設計を説明するための図である。FIG. 4 is a diagram for explaining an optimal design of a protrusion.

【図5】上型の窪みの変形例によって樹脂封止されたリ
−ドフレ−ムを示す図である。
FIG. 5 is a view showing a lead frame which is sealed with a resin by a modified example of the depression of the upper die.

【図6】図1の上型の変形例を示す上型の一部の断面図
である。
FIG. 6 is a partial cross-sectional view of an upper mold showing a modification of the upper mold shown in FIG. 1;

【図7】マトリックス型リ−ドフレ−ムへの半導体チッ
プの組立工程の一例を説明するための流れ図である。
FIG. 7 is a flowchart illustrating an example of a process of assembling a semiconductor chip into a matrix-type lead frame.

【図8】マトリックス型リ−ドフレ−ムへの半導体チッ
プの組立工程の他の例を説明するための流れ図である。
FIG. 8 is a flow chart for explaining another example of a process of assembling a semiconductor chip into a matrix type lead frame.

【図9】課題を説明するための樹脂封止後のリ−ドフレ
−ムの状態を示す図である。
FIG. 9 is a view showing a state of a lead frame after resin sealing for explaining a problem.

【符号の説明】[Explanation of symbols]

1,10 上型 2,6 下型 3 窪み 4 キャビティ 5 ゲ−ト 7 抜き穴 8 駒 9 皿ねじ 12 リ−ドフレ−ム 12a 樹脂封止形成領域 13 樹脂体 14,15 ポンチ 16 ランナ− 17 サブランナ− 18 通過穴 19 切り欠き穴 20a ゲ−ト残り 20b ランナ−上の残り 20c 突起部 DESCRIPTION OF SYMBOLS 1, 10 Upper die 2, 6 Lower die 3 Depression 4 Cavity 5 Gate 7 Drilled hole 8 Piece 9 Countersunk screw 12 Lead frame 12a Resin sealing formation area 13 Resin body 14, 15 Punch 16 Runner 17 Subrunner -18 Passing hole 19 Notch hole 20a Gate remaining 20b Remaining on runner 20c Projection

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 21/56 H01L 21/56 D H // B29L 31:34 B29L 31:34 Fターム(参考) 4F202 AH36 AH37 AM32 AM33 CA12 CB01 CB17 CK02 CK35 CK81 CK84 CK86 CQ01 4F206 AH36 AH37 AM32 AM33 JA07 JB17 JF05 JQ81 5F061 AA01 BA01 CA21 DA04 DD12 EA02 EA03 EA13 5F067 AA09 AB03 BA01 DE02 DE19──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01L 21/56 H01L 21/56 DH // B29L 31:34 B29L 31:34 F term (Reference) 4F202 AH36 AH37 AM32 AM33 CA12 CB01 CB17 CK02 CK35 CK81 CK84 CK86 CQ01 4F206 AH36 AH37 AM32 AM33 JA07 JB17 JF05 JQ81 5F061 AA01 BA01 CA21 DA04 DD12 EA02 EA03 EA13 5F067 AA09 AB03 BA01 DE02 DE19

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 半導体チップが搭載されるアイランドと
このアイランドの周辺から外方に伸びる複数のリ−ドと
該リ−ドどうしを連結するタイバ−とを含む複数の方形
状の樹脂封止形成領域が一枚の金属板に縦横に形成され
ているリ−ドフレ−ムにおいて、縦方向に2列に並ぶ前
記樹脂封止形成領域の隣接する角部の間にあって横方向
に伸びる短冊状の切り欠き穴を有することを特徴とする
リ−ドフレ−ム。
1. A plurality of square resin moldings including an island on which a semiconductor chip is mounted, a plurality of leads extending outward from the periphery of the island, and a tie bar connecting the leads. In a lead frame in which regions are formed vertically and horizontally on a single metal plate, strip-like cuts extending in the horizontal direction are provided between adjacent corners of the resin sealing formation regions arranged in two rows in the vertical direction. A lead frame having a notch.
【請求項2】 前記切り欠き穴の端部は円形状であるこ
とを特徴とする請求項1記載のリ−ドフレ−ム。
2. The lead frame according to claim 1, wherein an end of said notch hole is circular.
【請求項3】 請求項1または請求項2記載の前記リ−
ドフレ−ムの該切り欠き穴に対向する窪みとキャビティ
の上半分を形成する凹みと前記リ−ドフレ−ムの通過穴
から溶融樹脂を流し込むゲ−トに至る溶融樹脂流路の一
部とが形成される上型1と、前記溶融樹脂が流れ込むラ
ンナ−と該ランナ−から派生し前記ゲ−トと通ずるサブ
ランナ−と前記キャビティの下半分を形成する凹みとが
形成される下型とを具備する樹脂封止金型を備えること
を特徴とする樹脂封止装置。
3. The lead according to claim 1 or 2,
The recess facing the notch hole of the dove frame, the recess forming the upper half of the cavity, and a part of the molten resin flow path from the passage hole of the lead frame to the gate into which the molten resin flows are formed. An upper mold 1 to be formed, a lower mold having a runner into which the molten resin flows, a subrunner derived from the runner and communicating with the gate, and a recess forming the lower half of the cavity are formed. A resin sealing device, comprising:
【請求項4】 前記窪みの底部から突出しその高さが前
記窪みの深さより低い突出部を有することを特徴とする
請求項3記載の樹脂封止装置。
4. The resin sealing device according to claim 3, wherein the resin sealing device has a protrusion projecting from a bottom of the depression and having a height lower than a depth of the depression.
【請求項5】 前記窪みが形成されるとともに前記上型
に取付け取外し可能な駒部材を有することを特徴とする
請求項3または請求項4記載の樹脂封止装置。
5. The resin sealing device according to claim 3, wherein the recess is formed and a piece member is attached to and detachable from the upper mold.
【請求項6】 請求項3記載の樹脂封止金型によって前
記リ−ドフレ−ムの前記樹脂封止形成領域が樹脂封止さ
れ前記窪みによって成形される樹脂突起部材を打ち抜き
落とす第1のポンチと、前記ゲ−トに至る前記サブラン
ナ−で成形されるゲ−ト樹脂残りを打ち抜き落とす第2
のポンチとを具備する樹脂バリ除去金型を備えることを
特徴とする請求項3記載の樹脂封止装置。
6. A first punch for punching out a resin projection member formed by the recess, wherein the resin sealing formation region of the lead frame is resin sealed by the resin sealing mold according to claim 3. And a second step of punching and removing gate resin residue formed by the sub-runner to the gate.
The resin sealing device according to claim 3, further comprising a resin deburring mold including the punch.
JP2000028384A 2000-02-04 2000-02-04 Lead frame and resin sealed device Pending JP2001217370A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000028384A JP2001217370A (en) 2000-02-04 2000-02-04 Lead frame and resin sealed device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000028384A JP2001217370A (en) 2000-02-04 2000-02-04 Lead frame and resin sealed device

Publications (1)

Publication Number Publication Date
JP2001217370A true JP2001217370A (en) 2001-08-10

Family

ID=18553796

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000028384A Pending JP2001217370A (en) 2000-02-04 2000-02-04 Lead frame and resin sealed device

Country Status (1)

Country Link
JP (1) JP2001217370A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007194558A (en) * 2006-01-23 2007-08-02 Towa Corp Resin sealing formation method for electronic component, metallic mold, and lead frame
JP2014511044A (en) * 2011-04-15 2014-05-01 日本テキサス・インスツルメンツ株式会社 Leadframe strip for reduced mold sticking during delegation
JP2020185721A (en) * 2019-05-14 2020-11-19 富士電機株式会社 Resin molded product and manufacturing method of resin molded product

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007194558A (en) * 2006-01-23 2007-08-02 Towa Corp Resin sealing formation method for electronic component, metallic mold, and lead frame
JP2014511044A (en) * 2011-04-15 2014-05-01 日本テキサス・インスツルメンツ株式会社 Leadframe strip for reduced mold sticking during delegation
JP2020185721A (en) * 2019-05-14 2020-11-19 富士電機株式会社 Resin molded product and manufacturing method of resin molded product
JP7314612B2 (en) 2019-05-14 2023-07-26 富士電機株式会社 RESIN MOLDED PRODUCT AND METHOD FOR MANUFACTURING RESIN MOLDED PRODUCT

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