JP2001201521A - 電流検出装置及びインピーダンス測定器及び電力測定装置 - Google Patents

電流検出装置及びインピーダンス測定器及び電力測定装置

Info

Publication number
JP2001201521A
JP2001201521A JP2000009082A JP2000009082A JP2001201521A JP 2001201521 A JP2001201521 A JP 2001201521A JP 2000009082 A JP2000009082 A JP 2000009082A JP 2000009082 A JP2000009082 A JP 2000009082A JP 2001201521 A JP2001201521 A JP 2001201521A
Authority
JP
Japan
Prior art keywords
current
terminal
voltage
balun
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000009082A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001201521A5 (enExample
Inventor
Toshiyuki Yagi
利幸 矢木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Japan Ltd
Original Assignee
Agilent Technologies Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Japan Ltd filed Critical Agilent Technologies Japan Ltd
Priority to JP2000009082A priority Critical patent/JP2001201521A/ja
Priority to US09/764,773 priority patent/US6414476B2/en
Publication of JP2001201521A publication Critical patent/JP2001201521A/ja
Publication of JP2001201521A5 publication Critical patent/JP2001201521A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • G01R15/183—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/06—Arrangements for measuring electric power or power factor by measuring current and voltage
    • G01R21/07—Arrangements for measuring electric power or power factor by measuring current and voltage in circuits having distributed constants

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2000009082A 2000-01-18 2000-01-18 電流検出装置及びインピーダンス測定器及び電力測定装置 Pending JP2001201521A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000009082A JP2001201521A (ja) 2000-01-18 2000-01-18 電流検出装置及びインピーダンス測定器及び電力測定装置
US09/764,773 US6414476B2 (en) 2000-01-18 2001-01-17 Current detecting device, impedance measuring instrument and power measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000009082A JP2001201521A (ja) 2000-01-18 2000-01-18 電流検出装置及びインピーダンス測定器及び電力測定装置

Publications (2)

Publication Number Publication Date
JP2001201521A true JP2001201521A (ja) 2001-07-27
JP2001201521A5 JP2001201521A5 (enExample) 2007-03-08

Family

ID=18537274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000009082A Pending JP2001201521A (ja) 2000-01-18 2000-01-18 電流検出装置及びインピーダンス測定器及び電力測定装置

Country Status (2)

Country Link
US (1) US6414476B2 (enExample)
JP (1) JP2001201521A (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7554829B2 (en) 1999-07-30 2009-06-30 Micron Technology, Inc. Transmission lines for CMOS integrated circuits
US7013482B1 (en) 2000-07-07 2006-03-14 802 Systems Llc Methods for packet filtering including packet invalidation if packet validity determination not timely made
US7031267B2 (en) 2000-12-21 2006-04-18 802 Systems Llc PLD-based packet filtering methods with PLD configuration data update of filtering rules
US20020083331A1 (en) * 2000-12-21 2002-06-27 802 Systems, Inc. Methods and systems using PLD-based network communication protocols
US20020080784A1 (en) * 2000-12-21 2002-06-27 802 Systems, Inc. Methods and systems using PLD-based network communication protocols
US7101770B2 (en) 2002-01-30 2006-09-05 Micron Technology, Inc. Capacitive techniques to reduce noise in high speed interconnections
US7235457B2 (en) 2002-03-13 2007-06-26 Micron Technology, Inc. High permeability layered films to reduce noise in high speed interconnects
US6846738B2 (en) * 2002-03-13 2005-01-25 Micron Technology, Inc. High permeability composite films to reduce noise in high speed interconnects
US7160577B2 (en) 2002-05-02 2007-01-09 Micron Technology, Inc. Methods for atomic-layer deposition of aluminum oxides in integrated circuits
US6750752B2 (en) * 2002-11-05 2004-06-15 Werlatone, Inc. High power wideband balun and power combiner/divider incorporating such a balun
US7192892B2 (en) 2003-03-04 2007-03-20 Micron Technology, Inc. Atomic layer deposited dielectric layers
US6970053B2 (en) * 2003-05-22 2005-11-29 Micron Technology, Inc. Atomic layer deposition (ALD) high permeability layered magnetic films to reduce noise in high speed interconnection
US7927948B2 (en) 2005-07-20 2011-04-19 Micron Technology, Inc. Devices with nanocrystals and methods of formation
CA2972737C (en) * 2014-03-21 2019-01-08 Guildline Instruments Limited Methods and devices for ac current sources, precision current transducers and detectors
CN113030572A (zh) * 2021-02-26 2021-06-25 佛山市中研非晶科技股份有限公司 一种磁芯阻抗特征分析方法及应用其的磁芯阻抗测试系统
US12061215B2 (en) * 2022-05-05 2024-08-13 Applied Materials, Inc. RF measurement from a transmission line sensor

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61164167A (ja) * 1985-01-17 1986-07-24 Shiojiri Kogyo Kk デイジタルマルチメーター
JPS61230417A (ja) * 1985-04-03 1986-10-14 Nippon Ferrite Ltd ノイズフイルタ
JPH04232877A (ja) * 1990-07-10 1992-08-21 Rohde & Schwarz Gmbh & Co Kg 反射係数測定用ブリッジ
JPH05312859A (ja) * 1991-10-31 1993-11-26 Yokogawa Hewlett Packard Ltd インピーダンス・メータ

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES244069Y (es) * 1979-06-21 1980-04-01 Circuito detector de corriente.
DK149238C (da) * 1983-09-15 1987-01-19 Danfysik As Detektorkredslaeb til brug ved straemmaaling
DE3650062T2 (de) * 1985-06-07 1995-01-19 Hitachi Ltd Supraleitende Stromfühlerschaltung.
JP3329555B2 (ja) 1993-12-28 2002-09-30 アジレント・テクノロジー株式会社 インピーダンス・メータ
US6018238A (en) * 1995-03-03 2000-01-25 Bell Technologies Inc. Hybrid non-contact clamp-on current meter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61164167A (ja) * 1985-01-17 1986-07-24 Shiojiri Kogyo Kk デイジタルマルチメーター
JPS61230417A (ja) * 1985-04-03 1986-10-14 Nippon Ferrite Ltd ノイズフイルタ
JPH04232877A (ja) * 1990-07-10 1992-08-21 Rohde & Schwarz Gmbh & Co Kg 反射係数測定用ブリッジ
JPH05312859A (ja) * 1991-10-31 1993-11-26 Yokogawa Hewlett Packard Ltd インピーダンス・メータ

Also Published As

Publication number Publication date
US6414476B2 (en) 2002-07-02
US20010008375A1 (en) 2001-07-19

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