JP2001056214A - Optical surface displacement detection device, pattern recognition device, and optical surface displacement detection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an optical surface displacement detection device and a pattern recognition device capable of reducing cost and power consumption and being miniaturized. SOLUTION: Linear light emitted from an LD (light source) 101 is irradiated on a surface of an object 107 to be detected using a cylindrical lens (optical element having condensing action in one directly only 105 to lead reflected light on the surface of the object 107 to be detected into a PD (light receiving element) 115 in order to detect displacement distribution on the surface of the object 107 to be detected. Consequently, it is possible to provide an optical surface displacement detection device, a pattern recognition device, and an optical surface displacement detection method capable of reducing cost and improving reading accuracy of a projecting part or a recessed part by a simple configuration.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical surface displacement detecting device, a pattern recognizing device, and an optical surface displacement detecting method for detecting a concave or convex portion or a through hole of a test object.

[0002]

2. Description of the Related Art FIG. 9 shows an example of a conventional surface displacement detecting device for detecting unevenness of a test object.

In FIG. 1, a line-shaped light source 1 irradiates broad light to a card-shaped test object 10 which is conveyed in the direction of an arrow and has irregularities. When light is irradiated on the test object 10, as shown in FIG.
A shadow G due to the projection a is generated.

The shadow G is read by an image sensor (line sensor) 15 via a condenser lens (rod lens array) 11 as a condenser.

[0005]

However, in the surface displacement detecting device having the above-mentioned structure, when the direction of the line light source 1 and the extending direction of the projection of the convex portion coincide with each other, there is a problem that the shading in the extending direction does not occur. is there.

That is, as shown in FIG. 11, when a character “E” is formed on a test object 10 at a convex portion and the line light source 1 has a positional relationship as shown in FIG. There is a problem that the region where the shadow G does not occur becomes longer, making it difficult to recognize the shape of the character.

In the surface displacement detecting device having the structure shown in FIG.
Although the line light source 1 is arranged so as to obliquely intersect with the transport direction of the test object 10, a phenomenon occurs in which the test object 10 is transported diagonally or is difficult to recognize depending on the shape of the character. .

SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and has as its object to provide an optical surface displacement detecting device which has a low cost and simple structure, and has improved reading accuracy of a convex or concave portion, and a pattern recognition device. It is an object of the present invention to provide an apparatus and an optical surface displacement detection method.

[0009]

The main invention for solving the above-mentioned problems will be described below. A light source, an optical element for irradiating the test object with light emitted from the light source, and reflected light reflected by the test object when irradiating the test object with light from the light source through the optical element. A light-collecting means for condensing light, and a light-receiving element for receiving the light condensed by the light-collecting means; An optical surface displacement detection device that detects a hole, wherein the plurality of light receiving elements are arranged in a line and the light receiving elements are arranged in a line, or the light receiving elements are arranged in a line and An optical surface displacement detection device characterized by being divided.

The optical surface displacement detecting device is provided, and a pattern on the surface of the test object is recognized based on a detection result of a concave portion, a convex portion, or a through hole of the test object by the optical surface displacement detecting device. A pattern recognition device comprising:

Further, the light emitted from the light source is irradiated on the test object, the reflected light reflected by the test object is condensed by the light condensing means, and the reflected light condensed by the light condensing means is received by the light receiving element. And detecting a concave portion, a convex portion, or a through hole of the test object based on a light receiving position on the light receiving element.

Next, preferred embodiments of the present invention will be described below. The optical surface displacement detection device of the present invention is a device that optically detects a concave portion or a convex portion or a through hole of the test object, and light from a light source applied to the test object, and the test object Scanning means for relatively moving. It is preferable that the scanning unit has an object transporting unit such as a roller or a belt, but a light source, an optical element for irradiating the object with light emitted from the light source, and the light source through the optical element. Light collecting means for collecting the light reflected by the test object when irradiating the test object with light from the light receiving element, and a light receiving element for receiving the light collected by the light collecting means May be provided with an optical device transport unit for moving an optical device (optical system) having the above. The speed of relative movement is 1 m
/ Sec or more, and more preferably 2 m / sec or more.

The optical surface displacement detecting device may detect only a concave portion or a convex portion or a through hole, but the displacement amount of the concave portion or the convex portion (the displacement of the surface of the test object from the base surface in the height direction). Is more preferred.

[0014] Further, a pattern comprising an optical surface displacement detecting device and pattern means for recognizing a pattern on the surface of the test object based on a detection result of a concave portion or a convex portion or a through hole of the test object by the device. It can be a recognition device.

As the light source, various light sources can be used. It may be an LED or a halogen lamp, or a laser light source such as a laser diode that emits a laser beam. A laser light source having a large light condensing effect is preferable. When a PD or PSD is used as the light receiving element, the wavelength of the light source is preferably 600 nm to 1000 nm.

It is preferable that the light receiving element is a light receiving element that generates an output signal according to a light receiving position on the light receiving element. As a specific example, a semiconductor position detecting element (PSD) or a photodiode (PD) is preferable. In particular, a PSD array or an array PD is preferable. Also, CC
As shown in D, a light receiving element in which the light receiving section is divided into multiple parts may be used. Preferably, the displacement of the light receiving position on the light receiving element is a displacement of a position in a direction perpendicular to the optical axis of the light collecting means.
It is preferable that the displacement is not a displacement of a position in all directions on a plane but a displacement of a linear (one-dimensional) position. With such a configuration, it is possible to obtain a device that can accurately and inexpensively detect a concave portion, a convex portion, or a through-hole of a test object, and preferably can also detect a displacement amount thereof.

It is preferable that the light receiving element has means for linearly transferring changes in the amount of received light and the position of the received light with the passage of time as electric signals. Thereby, when detecting the surface displacement of the concave or convex portion or the through hole or the like of the test object while relatively moving the test object and the light irradiated on the test object, This is preferable because a change in surface displacement accompanying movement to the detection position can be detected.

The optical element preferably has a lens or a member having a predetermined opening. The optical element collects or deflects light emitted from the light source,
Alternatively, it is preferable to have a linear light generating optical element that partially blocks light so that light on the test object becomes linear light. As the linear light generating optical element, a cylindrical lens or the like is preferable. In the case of using a cylindrical lens or the like, it is preferable that the light emitted from the light source be linearly illuminated on the test object via an optical element such as a cylindrical lens which has a directivity for light collection. In this case, if the light emitted from the light source is once converted into parallel light by a collimating lens and then incident on a cylindrical lens or the like, the imaging performance on the test object is improved, but the light emitted from the light source is directly transmitted to the cylindrical lens or the like. The light can be guided and irradiated onto the test object.

[0019] Further, a collimating lens and a slit may be provided. As a specific example, there is a method in which light emitted from a light source is made parallel by a collimating lens, and then the light is passed through a slit such as a rectangular hole, and the test object is irradiated with the light passing through the slit. When a slit and a collimating lens are combined, it is not necessary to provide the slit near the test object, and an arrangement with a relatively high degree of freedom is possible. On the other hand, the optical element may be only the slit. In this case, since the light passing through the slit does not become parallel light, if the distance between the test object and the slit is large, the illumination range on the test object becomes broad, and the reading resolution decreases. For this reason, it is necessary to arrange a slit near the test object, and it is necessary to irradiate the test object with light through a predetermined opening near the test object (preferably 5 mm or less).

The particularly preferred configurations exemplified above include a mode of irradiating light converged on a test object with a cylindrical lens or the like, a mode of passing a slit as parallel light by a collimating lens, and a method of forming a slit near a test object. An example is provided. These configurations are preferable because the reading resolution can be increased.

Further, the optical element may have a dividing portion for dividing the light emitted from the light source into a plurality of light beams. Specifically, a plate having a plurality of microlenses and a plurality of holes may be used. In this case, by arranging the microlenses and holes in a row, a plurality of illumination spots are provided in a row on the test object. Further, in order to focus light on the test object when detecting a convex portion or a concave portion or a through hole of the test object,
It is preferable that the optical element that illuminates the test object does not move in the optical axis direction. This eliminates the need for a movable means for moving the optical element in the optical axis direction, and has the advantage that the device has excellent reliability and durability. It is preferable that the condensing lens and the optical element having a condensing property are aspherical lenses in order to suppress aberration.

When light emitted from a light source is condensed and irradiated onto a test object, an optical element for illumination has a numerical aperture (N
A) A condenser lens such as a positive lens having a small size such as a hologram, a GRIN lens, or a diffractive lens can collect light on the test object when detecting a convex portion, a concave portion, or a through hole of the test object. The optical element that illuminates the test object to emit light
This is preferable from the viewpoint of not moving in the optical axis direction. By using a condensing lens or an optical element with a condensing property with a small NA, the depth of focus on the test object becomes deep, and the luminous flux is sufficiently focused regardless of the position of the test object in the optical axis direction. Can be received by the light receiving element. As a specific example, in the case of a positive lens, it is preferable to use a lens having an NA of 0.2 or less. In this case, the depth of focus for making the spot diameter having high resolution 0.3 mm or less is ± 0.7.
It is preferably 5 mm or more. In particular, it is preferable to use a lens having an NA of 0.15 or less. In this case, the depth of focus for making the spot diameter having high resolution 0.3 mm or less is more preferably ± 1.0 mm or more.

The test object detected by the optical surface displacement detecting device is preferably a flat object having a concave or convex portion or a through hole, and particularly preferably a card.
Further, the type of the concave portion or the convex portion or the through hole is not particularly limited, and the concave portion or the convex portion or the through hole which is embossed so as to have the shape of a character or a number, a simple point or a line, the maximum width 0. 0.3 mm or less minute concave or convex portions or through holes. Also, a combination of these may be used. It is preferable that the range of the concave or convex portion (displacement in the height direction) of the test object to be detected is 1 mm or less. More preferably, it is 0.5 mm or less.

When the concave or convex portion or the through hole of the test object exists over a long range in a direction intersecting with the scanning direction of the optical surface displacement detecting device, one preferable mode is as follows. The light emitted from the light source is converted into linear light by a linear light generating optical element that generates linear light in a direction crossing the scanning direction (preferably, a direction in which a plurality of light receiving elements arranged in a row are arranged). The linear light is irradiated on the test object, the reflected light from the test object is condensed through the light condensing means, and is incident on each of the plurality of light receiving elements. At this time, it is preferable that the plurality of light receiving elements are arranged in a line in the direction of the linear light. Further, in the above description, a plurality of light receiving elements may be replaced with one divided light receiving element and used.

In this embodiment, as the linear light generating optical element, one side is a flat surface, and the opposite surface is a cylindrical surface, and a directional effect on the light condensing action of a cylindrical lens, a GRIN lens, a hologram, a diffraction grating, or the like. Are preferred. When such an optical element having directionality in the light condensing action is used as a linear light generating optical element, light from a light source can be used more effectively than when linear light is generated by a slit. Becomes unnecessary.

In the case where an optical element having directivity in the light condensing action is used as a linear light generating optical element and a laser diode is used as a light source, the long axis direction of the oblong far-field pattern of the laser diode is linear. It is preferable to provide a laser diode so as to coincide with the line direction.
Thereby, for the linear direction of the linear light, in addition to obtaining a high uniformity of the light intensity, since the light collecting property in one direction by the optical element having the directionality in the light collecting direction is improved, The linear light on the test object is uniformly thinned, and the optical reading performance is improved. In addition, the light use efficiency is increased.

In the case where an optical element having directional light collecting action is used to illuminate the test object, the light collecting action is provided because a sufficient depth of focus for the test object can be obtained. N / A in the direction is preferably 0.20 or less, particularly preferably 0.15 or less.

In the above embodiment, it is preferable to use a PSD array or an array of PDs as the light receiving element. Further, it is preferable that the width of light in the scanning direction (moving direction) on the test object is smaller than the width in the scanning direction of the concave or convex portion or the through hole of the test object. Specifically, the width of the light is preferably 0.3 mm or less, and more preferably 0.1 mm or less. This can cause a situation in which light is irradiated to the concave portion, the convex portion, or the through-hole, and is not irradiated to the flat portion (base surface), and the light is irradiated to the concave portion, the convex portion, the through-hole, or the flat portion. Can be easily detected, and the reading accuracy of the concave portion or the convex portion (preferably, the displacement amount) or the through hole can be improved.

Further, another preferred embodiment of the present invention includes the following configuration. (1) The light emitted from the light source is irradiated with linear light to the test object using the linear light generating means, and the light reflected by the surface of the test object is received at least by the linear light. An optical surface displacement device that guides the light receiving element divided into a plurality of parts with respect to the linear direction and detects a displacement distribution of the surface of the test object, wherein the linear light generating means is directed to a light condensing function. An optical surface displacement detection device characterized by using an optical element having a property.

The light emitted from the light source is irradiated with linear light over the entire displacement area of the test object in the height direction using the linear light generating means, and the light reflected on the surface of the test object is received by a light receiving unit. Is guided to the light receiving element divided into a plurality of at least with respect to the linear direction of the linear light, by detecting the displacement distribution of the surface of the test object, one-dimensional in the height direction of the test object surface Displacement can be detected.

By using an optical element having a directional light collecting function as the linear light generating means, the light from the light source can be used effectively, thereby eliminating the need for a large light source. Here, examples of the optical element having a directionality in the light collecting action include a cylindrical lens, a Grin lens, a hologram, and a diffraction grating, but are not limited thereto.

(2) As the light source according to the above (1),
An optical surface displacement detection, wherein a laser diode is used, and the laser diode is further provided such that a major axis direction of the elliptical far-field pattern of the laser diode coincides with a line direction of the linear light. Device.

When a laser diode is used as a light source, the laser diode is provided so that the major axis direction of the oblong far-field pattern of the laser diode coincides with the line direction of the linear light. In addition to obtaining high uniformity of light intensity with respect to the linear direction of the shape of the light, the optical element having directionality in the light collecting direction improves the light collecting property in one direction, so that the light Is uniformly thinned, and the optical reading performance is improved.

In addition, the light use efficiency is improved. (3) The light receiving element according to (1) or (2) above,
An optical surface displacement detection device characterized in that it is an array of photodiodes divided into × n divisions (one of m and n is an integer of 1 or more and the other is an integer of 2 or more).

Since the light receiving element is an array-type photodiode having an m × n division (one of m and n is an integer of 1 or more and the other is an integer of 2 or more), the cost can be reduced as compared with the case of using a PSD array. I can do it.

(4) The linear light according to any one of the above (1) to (3) and the test object are relatively moved in a direction intersecting the line direction of the linear light. An optical surface displacement detection device comprising scanning means.

By providing scanning means for relatively moving the linear light and the test object in a direction intersecting the line direction of the linear light, the scanning means is provided in the height direction of the surface of the test object. Two-dimensional displacement can be detected.

(5) A pattern recognizing means for recognizing a pattern on the surface of the test object from information on a displacement distribution on the surface of the test object detected by the optical displacement detecting device according to (4). A pattern recognition device characterized by the following.

The pattern recognizing means can recognize the pattern on the surface of the test object from the information on the displacement distribution of the surface of the test object detected by the optical displacement detecting device described in (4).

[0040]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, an embodiment of the present invention will be described with reference to the drawings. In FIG. 1, an optical surface displacement detecting device includes a laser diode (hereinafter, referred to as an LD) 101 as a light source and a collimator lens 103 as an optical element.
And a cylindrical lens 105 (the cylindrical lens 105 is also a linear light generating optical element), a condenser lens 111, and an array photodiode (hereinafter referred to as PD) 115 as a light receiving element. Then, the test object 107 is moved in the moving direction by a scanning unit of an optical surface displacement detection device (not shown).

The laser light emitted from the LD 101 is collimated by the collimator lens 103, is condensed in one direction by the cylindrical lens 105, becomes linear light, and has a flat portion 107a and a concave portion 107b formed on the surface. Irradiated on the test object 107.

The test object 107 is moved by the scanning means in a direction intersecting the line direction of the linear light (the direction of arrow I in the figure). The surface of the test object 107 is
As shown in FIG. 2, the concave portion 1 formed in the flat portion 107a
A character (the numeral 4 in the present embodiment) is formed by 07b.

Referring back to FIG. 1, the reflected light diffusely reflected on the surface of the test object 107 is condensed by a condensing lens 11 as condensing means.
The light is collected at 1 and reaches the PD 115. As shown in FIG. 3, the light receiving surface 115a of the PD 115 is divided into m × n (in the present embodiment, 2 × 8).

Further, the PD 115 is arranged for the reflected light such that the linear direction of the linear light on the test object 107 coincides with the n divided rows of the light receiving surface 115a. LD10
In FIG. 1, the far field pattern FF is an ellipse of a major axis a and a minor axis b as shown in FIG.

In this embodiment, as shown in FIG.
4 so that the direction of the long axis a in FIG. 4 coincides with the line direction of the linear light generated by the cylindrical lens 105.
Is arranged.

Next, the operation of the above configuration will be described. As shown in FIG. 6, the light diffusely reflected by the flat portion 107a of the test object 107 reaches A 'of the PD 115, and the light diffusely reflected by the concave portion 107b reaches B' of the PD 115, and the light receiving positions are different. When the test object 107 has a through-hole, no light is received by any of A ′ and B ′ because reflection does not occur at the through-hole.

Therefore, when the output from the PD 115 shown in FIG. 3 is viewed from A 'or B', the corresponding light is the light diffusely reflected by the flat portion 107a of the test object 107 or the light reflected by the concave portion 107b. It can be determined whether the light is diffusely reflected. That is,
The displacement of the light receiving position of the PD which is the light receiving element (from A '
From B ′), a concave portion or a convex portion or a through hole of the test object can be detected. The hole can be detected based on whether the value of A '+ B' is equal to or less than a predetermined value. In addition, the displacement amount of each of the concave portion, the convex portion, and the through hole can be detected from the ratio of the outputs of A 'and B'. Further, the PD 11 whose light receiving portion is divided into n in the linear direction of the linear light
Based on an output signal from the light receiving unit 5, a one-dimensional displacement distribution (a direction perpendicular to the scanning direction) in the height direction of the surface of the test object 107 can be detected.

By moving the test object 107 in the direction of arrow I in FIG. 1, two-dimensional displacement (scanning direction and direction perpendicular to the scanning direction) in the height direction of the surface of the test object 107 is performed. The distribution can be detected.

By providing a pattern recognition circuit as shown in FIG. 7 as pattern recognition means, a pattern recognition device can be obtained. 7, reference numeral 121 denotes an amplifier for amplifying the analog signal of the PD 115, reference numeral 123 denotes a binarization circuit for binarizing the amplified analog signal, and reference numeral 125 denotes a comparison between the binarized signal and the character pattern table 127. , A character determination circuit for determining a character.

According to the above configuration, as the linear light generating means, the cylindrical lens 1 having a light condensing function in one direction.
Since the light from the LD 101 can be used effectively by using the light emitting device 05, a light source of a large light emission is not required, and the device can be reduced in cost, power consumption and size.

By providing the LD 101 such that the major axis a of the elliptical far-field pattern of the LD 101 coincides with the linear direction of the linear light, high uniformity of light intensity can be obtained in the linear light ray direction. In addition to this, the light collecting property in one direction by the cylindrical lens 105 is improved, so that the linear light on the test object 107 is uniform and thin, and the optical signal reading performance is improved. In addition, the light use efficiency is increased.

By using the PD 115 in the form of a 2 × 8 array as a light receiving element, the cost can be reduced as compared with the case where a PSD array is used. Note that the present invention is not limited to the above embodiment. In the above embodiment, the PD 115 with m = 2 is used. However, even when m = 1, the flat portion 107a and the concave portion 107b of the test object 107 can be detected. That is, the flat portion 107a and the concave portion 107
b, one of the reflected light beams enters the light receiving surface of the PD and the other does not.
07a and the concave portion 107b can be detected.

When the test object 107 is composed of a flat portion, a concave portion, and a convex portion, the PD, m = 3, can detect the flat portion, the concave portion, and the convex portion. Further, if any one of the reflected light from the flat portion, the concave portion, and the convex portion is prevented from being incident on the light receiving surface of the PD, m = 2.

Further, as the value of n of the PD 115 increases, the resolution improves. Further, in addition to an array PD having an m × n division as a light receiving element, an array PSD or a linear light line which is n-divided with respect to the linear direction of the linear light applied to the test object. A plurality of PDs or PSDs arranged in n directions may be used.

When the light to be irradiated on the test object is a row of spots, PDs or PSDs arranged in an n-divided array or arranged in n rows in the row direction of the spots are used.

In this case, if the individual spots are guided to different light receiving sections, displacement information of the test object due to the individual spots can be obtained independently, and a good reading resolution can be obtained.

In the case of using a PSD, when linear light or an irradiation spot is located on a concave portion or a convex portion or a through-hole of a test object, compared to when linear light or an irradiation spot is located on a flat surface portion, It is necessary to give the direction of the PSD so that the output is different. FIG. 8 shows an example of an arrangement of PSDs when the test object is irradiated with linear light.

Note that the PSD can detect the light receiving position with higher accuracy than the PD.
It is preferable to use D. In addition, the PSD has the advantage that the displacement of the concave and convex portions of the surface of the test object with respect to the base surface (plane in the case of a card) can be read from the output signal, so that the tolerance for the positional accuracy of the test object is wide.
On the other hand, PD is cheaper than PSD, so it is preferable to use PD when emphasizing cost.

Further, a light receiving element whose light receiving section is divided into multiple parts, such as a CCD, may be arranged so that the reflected light from the test object is guided to the light receiving element divided into multiple parts. Further, an optical element having a directionality in the light condensing action is limited to an optical element having a light condensing action in only one direction, such as a cylindrical lens 105 having one surface flat and the opposite surface formed of a cylindrical surface. is not.

For example, an optical element having different light condensing functions in two directions may be used. That is, by using an optical element having different light condensing functions in one direction (X direction) and a direction (Y direction) perpendicular to the certain direction (X direction) in the vertical section of the optical axis (Z direction). It is possible to replace one collimator lens 103 and one cylindrical lens 105 with one optical element having directivity in light collecting property.

In this case, one of the X direction and the Y direction coincides with the generatrix direction of the cylindrical lens 105.

[0062]

According to the present invention, there are provided an optical surface displacement detecting device, a pattern recognizing device, and an optical surface displacement detecting method capable of improving the reading accuracy of a convex portion or a concave portion with a low-cost and simple structure. be able to.

[Brief description of the drawings]

FIG. 1 is a diagram illustrating a detection unit according to an embodiment.

FIG. 2 is a diagram illustrating a surface of a test object in FIG. 1;

FIG. 3 is a diagram illustrating a light receiving surface of the PD of FIG. 1;

FIG. 4 is a diagram illustrating a far field pattern of the LD of FIG. 1;

FIG. 5 is a diagram illustrating an installation direction of the LD in FIG. 1;

FIG. 6 is a diagram illustrating the operation of FIG.

FIG. 7 is a block diagram illustrating an example of a pattern recognition circuit.

FIG. 8 is a diagram showing a P when a PSD is used instead of a PD in FIG. 1;
It is a figure explaining the light receiving surface of SD.

FIG. 9 is a diagram illustrating a conventional example.

FIG. 10 is a diagram for explaining the operation of FIG. 9;

FIG. 11 is a diagram illustrating a problem.

[Explanation of symbols]

 101 LD (light source) 105 cylindrical lens 107 test object 115 PD (light receiving element) 116 PSD (light receiving element)

Claims (11)

[Claims] A light source, an optical element for irradiating the object with light emitted from the light source, and a light reflected from the object when the light from the light source is applied to the object through the optical element. A condensing unit for condensing the reflected light, and a light receiving element for receiving the light condensed by the condensing unit, and a concave portion of the test object according to a light receiving position on the light receiving element. Or an optical surface displacement detection device for detecting a convex portion or a through hole, wherein a plurality of the light receiving elements are provided and the plurality of light receiving elements are arranged in a row, or the light receiving elements are in a row An optical surface displacement detecting device, wherein the optical surface displacement detecting device is divided into a plurality of parts. 2. The optical surface displacement detecting device according to claim 1, wherein the optical element is not moved in the optical axis direction when detecting a concave portion, a convex portion, or a through hole of the test object. 3. The optical element is a linear light generating optical element that converts light emitted from the light source into linear light in a direction in which the plurality of light receiving elements are arranged on a test object. The optical surface displacement detecting device according to claim 1 or 2, wherein 4. The light source is a laser diode,
4. The optical surface displacement detecting device according to claim 3, wherein the laser diode is provided such that a major axis direction of the oval far field pattern of the laser diode coincides with a linear direction of the linear light. 5. The optical surface displacement detecting device according to claim 1, wherein the optical element has a directionality in a light collecting action. 6. The optical surface displacement detecting device according to claim 1, wherein the optical element has a lens. 7. The optical surface displacement detecting device according to claim 1, wherein the optical element has a slit. 8. The apparatus according to claim 1, further comprising scanning means for relatively moving the light from the light source irradiating the test object and the test object. Optical surface displacement detection device. 9. The card according to claim 1, wherein the test object is a card having a concave portion, a convex portion, or a through hole on the surface.
The optical surface displacement detection device according to any one of the above. 10. An optical surface displacement detecting device according to claim 1, wherein the optical surface displacement detecting device detects a concave portion, a convex portion, or a through hole of the test object by the optical surface displacement detecting device. A pattern recognition device for recognizing a pattern on the surface of the test object. 11. An object irradiated with light emitted from a light source, the light reflected by the object is condensed by a light condensing means, and the reflected light condensed by the light condensing means is received by a light receiving element. And detecting a concave or convex portion or a through hole of the test object based on a light receiving position on the light receiving element.