JP2001021603A - Characteristic inspecting device of surface mount-type electronic part - Google Patents

Abstract

PROBLEM TO BE SOLVED: To safely make a work able to be fitted by a simple operation by mounting a probe in contact with the electrode of the work onto the bottom surface of an accommodation recessed part for surface mount-type electronic parts (work) with the electrode so that the probe can travel in the vertical direction for connecting to a measurement circuit. SOLUTION: An accommodation recessed part 3 for accommodating a work 2 with a work electrode 2a and a spring probe 5 that is mounted on the bottom surface of the accommodation recessed part 3 so that it can travel in the vertical direction and touches the electrode 2a of the work 2 are provided, and the work 2 is fixed and retained and is electrically connected by each independent mechanism. While the work 2 is fitted to the accommodation recessed part 3, further the probe 5 is moved in an direction marked by an arrow Q for bringing the probe 5 into contact with the work electrode 2a, a holder 1 is accommodated in a temperature-testing tank. The characteristics of the work 2 under a plurality of temperature environments are inspected by a measurement circuit 7 that is connected to the work electrode 2a via a lead 6 and the probe 5.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to a characteristic inspection apparatus used for characteristic inspection for inspecting the characteristics of a surface mount electronic component under various temperature environments.

[0002]

2. Description of the Related Art For example, it is necessary to inspect the characteristics of surface-mounted electronic components such as a high-precision crystal oscillator under a plurality of temperature environments. Such a characteristic inspection is performed by a characteristic inspection apparatus including a socket for mounting the surface-mounted electronic component, a probe that contacts an electrode of the surface-mounted electronic component, a measurement circuit connected to the probe, and the like. It is performed with wearing.

FIG. 5 shows a socket 1 of a conventional characteristic inspection apparatus.
FIG. The characteristic inspection apparatus includes a surface mount type (SMD) crystal oscillator (hereinafter simply referred to as a work) 1.
1 is provided with an insertion port 12 into which 1 is inserted. Insertion port 1
2, the socket terminal 13 is exposed on the inner surface,
Further, a lead 14 is connected to the socket terminal 13, and the lead 14 passes through the inside of the socket and is connected to a measurement circuit (not shown). That is, the socket terminal 13 and the measuring circuit are electrically connected via the lead.

As described above, in this characteristic inspection apparatus, the work 11 is inserted in the direction indicated by the arrow R in FIG. A work terminal 11a is exposed on the outer surface of the work 11, and the work terminal 11a contacts the socket terminal 13 in a state where the work 11 is housed in the insertion opening 12 of the socket 10, whereby the work terminal 11a Is electrically connected to the measurement circuit.

[0005] As described above, with the work 11 stored in the insertion opening 12, the socket 10 is further stored in the temperature test tank. The temperature test tank provides the work 11 with a plurality of predetermined temperature environments, and at the same time, the characteristics of the work 11 at each temperature are inspected by the measurement circuit.

[0006]

The above-described characteristic inspection apparatus requires the socket 10 having a relatively complicated shape. In addition, the size of the insertion opening 12 is substantially equal to the outer dimensions of the work 11, and it is necessary to accurately insert the work 11 into the insertion opening.
A mechanism for performing complicated and highly accurate operations is required. Further, although a leaf spring is used for the socket terminal 13, it is necessary to increase the strength of the leaf spring in order to maintain good contact between the socket terminal 13 and the work terminal 11a. But,
If the strength of the leaf spring is excessively increased, problems such as a problem in taking the work 11 in and out, or a possibility of damaging the work 11 arise.

In addition to the above-described socket 10, a socket having a shape in which the work 11 is pressed by a lid while the work 11 is installed horizontally has been proposed. However, such a socket has a problem that a complicated mechanism for opening and closing the lid is required.

Accordingly, the present invention has been made in view of the above-described problems, and has as its object to provide a relatively inexpensive characteristic inspection apparatus capable of safely mounting a work with a simple operation. I do.

[0009]

In order to achieve the above-mentioned object, a characteristic inspection apparatus according to the present invention comprises a housing recess for housing a surface-mounted electronic component having electrodes, and a bottom surface of the housing recess. The probe includes a probe that is movably mounted in the vertical direction and contacts an electrode of the surface-mounted electronic component, and a measurement circuit connected to the probe. Further, the characteristic inspection apparatus according to the present invention preferably includes a magnet buried in the bottom surface of the storage recess or a vacuum suction means provided on the bottom surface of the storage recess.

[0010] The characteristic inspection apparatus provided by the present invention includes:
In one embodiment, a plurality of sets of storage recesses for storing surface-mounted electronic components having electrodes and probes mounted to be vertically movable with respect to the bottom surface of the storage recesses are provided. Inspect multiple electronic components simultaneously.

According to the characteristic inspection apparatus of the present invention, the structure of the holder for accommodating the surface mount type electronic component is simplified,
In addition, the mounting operation of the surface mount type electronic component is also facilitated.
Further, the area of the holder with respect to the area of the surface-mounted electronic component is reduced, and more surface-mounted electronic components can be inspected at the same time.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an apparatus for inspecting characteristics of a surface mount electronic component according to the present invention will be described in detail with reference to the drawings.

FIG. 1 is a schematic view of a holder 1 of a characteristic inspection apparatus according to an embodiment of the present invention. As shown in FIG. 1, the holder 1 includes a storage recess 3 formed to be substantially larger than an outer dimension of a surface mount type crystal oscillator (hereinafter, simply referred to as a work) 2 to be inspected for characteristics. A magnet is embedded on the bottom side of the storage recess 3 as described later.

FIG. 2 is a schematic sectional view showing a state where the work 2 is inserted into the holder 1. As described above, the magnet 4 is embedded in the bottom surface of the storage recess 3 provided in the holder 1. In this embodiment, since the lid of the work 2 is formed of Kovar material,
Is attracted to the bottom surface of the storage recess 3 by the magnetic force of the magnet 4. Instead of the mechanism using the magnet 4 as shown in FIG. 2, a structure may be employed in which a vacuum suction mechanism is provided on the bottom surface of the storage recess 3 so that the work 2 is suction-fixed.

The characteristic inspection apparatus further includes a spring probe 5 movably mounted in a direction perpendicular to the bottom surface of the storage recess 3, that is, in the directions of arrows P and Q shown in FIG. When the work 2 is mounted in the storage recess 3, the spring probe 5 retreats in the direction of the arrow P.
When the work 2 is mounted in the storage recess 3, the spring probe is moved in the direction of arrow Q, whereby the spring probe 5 comes into contact with the work electrode 2a of the work 2. The spring probe 5 is connected to a measuring circuit 7 via a lead 6.

In the state where the work 2 is mounted in the storage recess 3 and the spring probe 5 is further moved in the direction of arrow Q to bring the spring probe 5 into contact with the work electrode 2a, the holder 1 is placed in the temperature test tank ( (Not shown). The temperature test chamber provides the work 2 with a plurality of predetermined temperature environments. And lead 6 as described above.
In addition, the characteristics of the work 2 under a plurality of temperature environments are inspected by the measurement circuit 7 connected to the work electrode 2a via the spring probe 5. At this time, if the retreat distance of the spring probe 5 cannot secure a sufficient gap to avoid the work mounting means (work supply mechanism),
At a place different from the place where the spring probe 5 is applied, the holder 1 may be moved to a predetermined spring probe position after the work 2 is mounted on the holder 1 in advance.

As described above, the fixing and holding of the work 2 and the electrical connection are performed by independent mechanisms, so that the work of loading and unloading the work 2 becomes extremely easy, and the reliability of the electrical connection is enhanced. it can. That is, in the holder 1, the work can be loaded and unloaded in one direction, so that the work can be easily automated.

Further, the structure of the holder 1 is extremely simple, and there is no need to provide an electric circuit on the holder 1 side. Therefore, the holder 1 can be manufactured at low cost by a resin molding method using a simple mold. can do.

Further, the holder 1 does not need a very large area for the size of the work 2. Therefore, it is possible to increase the number of works 2 that can be stored in the constant temperature chamber at one time, thereby reducing or reducing the number of expensive constant temperature chambers. That is, the time required for raising and lowering the temperature can be shortened, so that the processing time required for the inspection can be reduced, and the equipment cost for the constant temperature chamber can be reduced.

Further, according to the present invention, one work 2
Since the space required for
A mechanism for probing at the same time can be produced relatively easily. FIG. 3 shows a characteristic inspection apparatus having such a mechanism. In the characteristic inspection apparatus shown in FIG.
2 are denoted by the same reference numerals, and description thereof is omitted.

The characteristic inspection apparatus shown in FIG.
Has a structure in which a plurality of characteristic inspection devices shown in FIG. That is, the characteristic inspection apparatus includes a plurality of storage recesses 3 provided in the holder 1, and the work 2 is stored in each of the storage recesses 3. Further, this characteristic inspection apparatus is provided with a plurality of sets of spring probes 5 corresponding to the work electrodes 2a exposed on the surface of the work 2. The spring probe 5 is movable in the direction perpendicular to the bottom surface of the storage recess 3, that is, perpendicular to the surface of the work 2. The spring probe 5 is connected to a measurement circuit 7 via a lead 6. ing. Further, in this characteristic inspection device, positioning pins 8 are provided to reliably position the spring probe 5 with respect to the work electrode 2a. The pins 8 are provided on the probe block 5 side, and guide holes are provided on the holder 1 side. Provided. Further, holder arrays 20A and 20B may be provided in which the holder unit 9 of the characteristic inspection apparatus is arranged in a plane shape or a cylindrical shape as shown in FIGS. 4 (a) and 4 (b).

As described above, according to the present invention, the structure of the holder 1 can be simplified, and the area required for one work 2 can be minimized.
It is possible to easily realize a structure in which a plurality of sets of the housing concave portion 3 and the spring probe 5 are provided to simultaneously inspect a plurality of surface mount components. Further, if holder arrays 20A and 20B in which the part of the holder unit 9 of the characteristic inspection apparatus of FIG. A large number of works 2 can be collectively mounted or taken out at the location, and the workability can be further improved.

[0023]

As described above, the characteristic inspection apparatus according to the present invention is mounted movably in the vertical direction with respect to the storage recess for storing the surface-mounted electronic component having the electrode, and the bottom surface of the storage recess. It has a probe that contacts the electrodes of the surface-mounted electronic component, and a measurement circuit connected to the probe.In other words, since the fixed holding and electrical connection of the surface-mounted electronic component are performed by independent mechanisms, The mounting and dismounting work of the electronic components becomes extremely easy, and the electrical connection can be reliably performed. Further, according to the characteristic inspection apparatus of the present invention, since the mounting / dismounting operation of the surface mount electronic component can be performed in one-way operation, automation of this operation can be easily realized. Further, according to the present invention, the structure of the holder for holding the surface mount type electronic component can be formed extremely simply, and there is no need to provide an electric circuit on the holder side. By using the conventional resin molding method, the holder can be manufactured at low cost. Further, according to the present invention, it is possible to increase the number of surface-mounted electronic components that can be accommodated in the constant temperature chamber at one time, thereby reducing or reducing the number of expensive constant temperature chambers and reducing equipment costs. it can. Further, according to the present invention, since a space required for one surface-mounted electronic component is small, a mechanism for simultaneously probing many surface-mounted electronic components can be relatively easily manufactured.

[Brief description of the drawings]

FIG. 1 is a perspective view schematically showing a holder of a characteristic inspection apparatus according to an embodiment of the present invention.

FIG. 2 is a side sectional view showing a state in which a surface mount electronic component is mounted on the characteristic inspection apparatus according to the embodiment of the present invention.

FIG. 3 is a side sectional view of a characteristic inspection apparatus capable of simultaneously mounting a plurality of surface mount electronic components.

FIG. 4A is a perspective view of a planar holder array as an example of the holder unit of FIG. 3; FIG. 4B is a perspective view of a cylindrical planar holder array as an example of the holder unit shown in FIG. 3.

FIG. 5 is a diagram schematically showing a socket of a conventional characteristic inspection device.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Holder 2 Work 2a Work electrode 3 Storage recess 4 Magnet 5 Spring probe 6 Lead 7 Measurement circuit 8 Pin 9 Holder unit 20A Flat holder array 20B Cylindrical holder array

Claims (4)

[Claims] A storage recess for storing a surface-mounted electronic component having an electrode; a probe mounted movably in a vertical direction with respect to a bottom surface of the storage recess to contact an electrode of the surface-mounted electronic component. A characteristic inspection apparatus for a surface-mounted electronic component, comprising: a measurement circuit connected to the probe. 2. The characteristic inspection apparatus according to claim 1, further comprising a magnet embedded in a bottom surface of the storage recess. 3. The characteristic inspection apparatus according to claim 1, further comprising a vacuum suction means provided on a bottom surface of said storage recess. 4. The characteristic inspection apparatus according to claim 1, wherein a plurality of sets of the storage recess and the probe are provided, and the characteristics of the plurality of surface mount electronic components are inspected simultaneously.