JP2001009398A - Ic socket cleaning method and member therefor - Google Patents
Ic socket cleaning method and member thereforInfo
- Publication number
- JP2001009398A JP2001009398A JP11185471A JP18547199A JP2001009398A JP 2001009398 A JP2001009398 A JP 2001009398A JP 11185471 A JP11185471 A JP 11185471A JP 18547199 A JP18547199 A JP 18547199A JP 2001009398 A JP2001009398 A JP 2001009398A
- Authority
- JP
- Japan
- Prior art keywords
- socket
- solder
- contact portion
- oxide layer
- electrolyte
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/02—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/26—Cleaning or polishing of the conductive pattern
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、ICソケットのク
リーニング部材に関し、特に、被測定デバイスでありパ
ッケージされたICのリードに接触するICソケットの
コンタクト部に付着した半田或いはその酸化物層を除去
するクリーニング方法及びクリーニング部材に関するも
のである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning member for an IC socket, and more particularly to a method of removing a solder or an oxide layer thereof attached to a contact portion of an IC socket which contacts a lead of a packaged IC. The present invention relates to a cleaning method and a cleaning member.
【0002】[0002]
【従来の技術】既知のように、半導体集積回路装置(I
C)はパッケージから導出された多数のリードを有して
おり、また、前記ICの最終的な評価試験を行う試験装
置(テスター)に接続されたICソケットも前記ICの
各リードに対応した多数のコンタクト部を有している。2. Description of the Related Art As is known, a semiconductor integrated circuit device (I
C) has a large number of leads derived from the package, and an IC socket connected to a test device (tester) for performing a final evaluation test of the IC has a large number of leads corresponding to each lead of the IC. Contact portion.
【0003】図5はパッケージの四つの各側辺からリー
ドが導出されたICデバイスを試験し、従来より使用さ
れているICソケットボード40の一例を模式的に示
す。前記ICソケットボード40は前記ICデバイスを
搭載して試験を行うICソケット41と、表面に前記I
Cソケット41が接続ピンを介して設けられ、裏面に試
験装置に接続されるコネクタ(図示しない)を有するプ
リント配線基板42とから構成されている。FIG. 5 schematically shows an example of an IC socket board 40 used for testing an IC device in which leads are led out from four sides of a package. The IC socket board 40 includes an IC socket 41 for mounting and testing the IC device, and an IC socket 41 on the surface.
A C socket 41 is provided via connection pins, and includes a printed wiring board 42 having a connector (not shown) connected to the test apparatus on the back surface.
【0004】前記ICソケット41はパッケージ43の
各側辺からの各リード44と接触するコンタクト部45
と前記各コンタクト部45から導出された前記接続ピン
と前記パッケージ43の位置決めを行う位置決め片46
とを有しており、前記コンタクト部45は前記プリント
配線基板42の配線層を介して前記コネクタに電気的に
接続されている。The IC socket 41 is provided with a contact portion 45 for contacting each lead 44 from each side of the package 43.
And a positioning piece 46 for positioning the connection pin derived from each of the contact portions 45 and the package 43.
And the contact portion 45 is electrically connected to the connector via a wiring layer of the printed wiring board 42.
【0005】しかして、前記各リード44は半田接着性
を考慮して半田メッキが施され、また、前記各コンタク
ト部45は前記各リード44との接触性を良好に保持す
るために金メッキされている。それ故、多数個の前記I
Cデバイスを評価試験を行うにつれて、前記各リード4
4と接触する前記各コンタクト部45の表面上には図5
に示すように徐々に半田層47或いは酸化鉛、酸化錫層
のような半田の酸化物層が付着、堆積して前記各リード
44との接触が良好でなくなり正確な評価試験を行うこ
とができなくなる。The respective leads 44 are plated with solder in consideration of the solder adhesion, and the respective contact portions 45 are plated with gold in order to maintain good contact with the respective leads 44. I have. Therefore, a large number of said I
As the evaluation test of the C device is performed, each of the leads 4
5 is provided on the surface of each of the contact portions 45 in contact with FIG.
As shown in the figure, a solder layer 47 or a solder oxide layer such as a lead oxide or tin oxide layer gradually adheres and deposits, so that the contact with each of the leads 44 is not good and an accurate evaluation test can be performed. Disappears.
【0006】前記各コンタクト部45の表面上に付着、
堆積した前記した不要な半田層47或いは半田の酸化物
層を除去、洗浄する技術として、例えば、特開平7−2
34262号公報に開示されているように、ICソケッ
トを酸性の薬液、例えば、塩酸中に浸漬し、次いで、純
水で洗浄する方法、或いは、前記不要な半田層47或い
は半田の酸化物層に対して研磨剤を噴射して除去する方
法が提案されている。Attached on the surface of each contact portion 45,
As a technique for removing and cleaning the unnecessary solder layer 47 or the solder oxide layer deposited as described above, for example, JP-A-7-2
As disclosed in Japanese Patent No. 34262, a method in which an IC socket is immersed in an acidic chemical solution, for example, hydrochloric acid, and then washed with pure water, or the unnecessary solder layer 47 or the oxide layer of solder is removed. On the other hand, there has been proposed a method of removing the abrasive by spraying it.
【0007】しかしながら、前記したように、前記IC
ソケットは通常プリント配線基板に取付けて使用される
ので、前者の洗浄技術においては、洗浄毎に前記ICソ
ケットを前記プリント配線基板から取り外さなければな
らず、その取り外し作業は極めて困難であり、逆に、前
記プリント配線基板に取り付けられた前記ICソケット
を前記薬液に浸漬し、純水で洗浄しようとすれば、前記
プリント配線基板も前記薬液に浸されるので、前記プリ
ント配線基板の半田付け部、配線部、配線保護部等が損
傷を受けてしまう。また、後者の方法においては、前記
ICソケットを前記プリント配線基板から必ずしも取り
外す必要なないものの、マスク作業を必要とすると共に
前記コンタクト部35の金メッキ表面が損傷してしま
う。However, as described above, the IC
Since the socket is usually used by being attached to a printed wiring board, in the former cleaning technique, the IC socket must be removed from the printed wiring board every time cleaning is performed, and the removal operation is extremely difficult. If the IC socket attached to the printed circuit board is immersed in the chemical solution and is to be washed with pure water, the printed circuit board is also immersed in the chemical solution. The wiring section, the wiring protection section, and the like are damaged. Further, in the latter method, although it is not necessary to remove the IC socket from the printed wiring board, a masking operation is required and the gold-plated surface of the contact portion 35 is damaged.
【0008】[0008]
【発明が解決しようとする課題】本発明の一つの目的
は、前記した従来のICソケットの洗浄方法の欠点を解
消してICソケットをプリント配線基板から取り外すこ
となくICソケットのコンタクト部の表面上に付着、堆
積した不要な半田層或いは半田の酸化物層を除去する方
法を提供することにある。SUMMARY OF THE INVENTION One object of the present invention is to solve the above-mentioned drawbacks of the conventional method for cleaning an IC socket and to remove the IC socket from the printed wiring board without removing the IC socket from the printed circuit board. It is an object of the present invention to provide a method for removing an unnecessary solder layer or an oxide layer of solder, which is adhered to and deposited on a substrate.
【0009】本発明の他の目的は、ICソケットのコン
タクト部の表面上に付着、堆積した不要な半田層或いは
半田の酸化物層を除去してコンタクト部の表面をクリー
ニングするクリーニング部材を提供することにある。Another object of the present invention is to provide a cleaning member for cleaning the surface of a contact portion by removing an unnecessary solder layer or a solder oxide layer adhered and deposited on the surface of a contact portion of an IC socket. It is in.
【0010】[0010]
【課題を解決するための手段】ICソケットのコンタク
ト部の表面上に付着、堆積した不要な半田層或いは半田
の酸化物層を除去して前記コンタクト部の表面をクリー
ニングする際、前記コンタクト部の表面上に電解質ゲル
を載置して電気分解により前記不要な半田層或いは半田
の酸化物層を除去して前記コンタクト部の表面をクリー
ニングしている。When the surface of the contact portion is cleaned by removing an unnecessary solder layer or a solder oxide layer adhered and deposited on the surface of the contact portion of the IC socket, the surface of the contact portion is removed. An electrolyte gel is placed on the surface, and the unnecessary solder layer or solder oxide layer is removed by electrolysis to clean the surface of the contact portion.
【0011】[0011]
【発明の実施の形態】本発明においては、ICソケット
のコンタクト部の表面上に付着、堆積した不要な半田層
或いは半田の酸化物層を除去する際、前記コンタクト部
の表面上に電解質ゲルを載置して、前記電解質ゲルが正
極、前記コンタクト部が負極となるように直流電源を接
続して通電し、前記半田層或いは半田の酸化物層を電気
分解して前記電解質ゲルに取り込んで前記コンタクト部
の表面をクリーニングしている。前記電解質ゲルの代わ
りに、電解質を含浸させた電解質パッドを用いることも
できる。DESCRIPTION OF THE PREFERRED EMBODIMENTS In the present invention, when an unnecessary solder layer or solder oxide layer adhered and deposited on the surface of a contact portion of an IC socket is removed, an electrolyte gel is applied to the surface of the contact portion. Placed, the electrolyte gel is a positive electrode, a direct current power supply is connected so that the contact portion is a negative electrode, electricity is supplied, and the solder layer or the oxide layer of solder is electrolyzed and taken into the electrolyte gel. The contact surface is being cleaned. An electrolyte pad impregnated with an electrolyte may be used instead of the electrolyte gel.
【0012】[0012]
【実施例】図1はICソケットのコンタクト部の表面上
に載置する、例えば、直方体状にカットされた電解質ゲ
ル10を示す。前記電解質ゲル10は下記のように形成
される。FIG. 1 shows an electrolyte gel 10 mounted on the surface of a contact portion of an IC socket, for example, cut into a rectangular parallelepiped. The electrolyte gel 10 is formed as follows.
【0013】即ち、硫酸カリウム、硫酸マグネシウム、
硫酸ナトリウム、硝酸ナトリウム等の電解質材料からな
り、前記電解質材料が飽和状態の水溶液を形成した後、
この電解質水溶液にゲル成分としてガラクトマンナン、
寒天、カラギーナン、ゼラチン、ポリビニルアルコール
等から選択されたゲル化剤を加えて、加熱、溶解させ
る。次いで、加熱溶融された電解質ゲル材料を所定形状
の容器に流し込み、冷却、成形する。That is, potassium sulfate, magnesium sulfate,
After being formed of an electrolyte material such as sodium sulfate and sodium nitrate, the electrolyte material forms a saturated aqueous solution,
Galactomannan as a gel component in this aqueous electrolyte solution,
A gelling agent selected from agar, carrageenan, gelatin, polyvinyl alcohol and the like is added, and the mixture is heated and dissolved. Next, the heated and melted electrolyte gel material is poured into a container having a predetermined shape, cooled and molded.
【0014】図2は前記ICソケットのコンタクト部の
表面をクリーニングするクリーニング部材20を示し、
前記クリーニング部材20はプラス電極となる白金プレ
ート21と、前記白金プレート21の一部を覆い、前記
電解質材料或いは電解質水溶液を含浸させた電解質パッ
ド22とから構成されている。FIG. 2 shows a cleaning member 20 for cleaning the surface of the contact portion of the IC socket.
The cleaning member 20 includes a platinum plate 21 serving as a positive electrode, and an electrolyte pad 22 that covers a part of the platinum plate 21 and is impregnated with the electrolyte material or the aqueous electrolyte solution.
【0015】前記電解質パッド22は不織布、発泡体、
紙等から形成され、例えば、所定の大きさの不織布を前
記電解質材料或いは電解質水溶液に含浸させることによ
り形成される。The electrolyte pad 22 is made of non-woven fabric, foam,
It is formed of paper or the like, and is formed, for example, by impregnating a nonwoven fabric of a predetermined size with the electrolyte material or the aqueous electrolyte solution.
【0016】図3はパッケージの四つの各側辺からリー
ドが導出されたICデバイスを試験し、従来より使用さ
れている図5と同様なICソケットボード30を模式的
に示すと共に、ICソケットから前記ICデバイスのパ
ッケージを取り外して前記ICソケットをクリーニング
する状態を示す。FIG. 3 schematically shows an IC socket board 30 similar to FIG. 5 which has been conventionally used, in which an IC device having leads led out from four sides of the package is tested. 5 shows a state in which the package of the IC device is removed and the IC socket is cleaned.
【0017】前記ICソケットボード30は前記ICデ
バイスを搭載して試験を行うICソケット31と、表面
に前記ICソケット31が接続ピンを介して設けられ、
裏面に試験装置に接続されるコネクタ(図示しない)を
有するプリント配線基板32とから構成されている。The IC socket board 30 is provided with an IC socket 31 on which the IC device is mounted for testing, and the IC socket 31 is provided on the surface via connection pins.
And a printed wiring board 32 having a connector (not shown) connected to the test apparatus on the back surface.
【0018】前記ICソケット31は図示しないパッケ
ージの各側辺からの各リードと接触するコンタクト部3
3と前記各コンタクト部33から導出された前記接続ピ
ンと前記パッケージの位置決めを行う位置決め片34と
を有しており、前記コンタクト部33は前記プリント配
線基板32の配線層を介して前記コネクタに電気的に接
続されている。The IC socket 31 is provided with a contact portion 3 which comes into contact with each lead from each side of a package (not shown).
3 and a positioning piece 34 for positioning the package and the connection pin derived from each of the contact portions 33, and the contact portion 33 is electrically connected to the connector via a wiring layer of the printed wiring board 32. Connected.
【0019】図3及び図4に示すように、前記各コンタ
クト部33をクリーニングする際、前記クリーニング部
材20の前記白金プレート21には直流電源の正極を接
続すると共に、前記プリント配線基板32の裏面に設け
られた前記コネクタを介して前記ICソケット31の前
記コンタクト部33には前記直流電源の負極を接続し、
前記クリーニング部材20を前記コンタクト部33の表
面上に付着、堆積した半田層35或いは半田の酸化物層
に接触させ、例えば、前記コンタクト部33の長手方向
及び前記コンタクト部33の配列方向に摺動させて前記
コンタクト部33に順次電流を流して前記コンタクト部
33の表面上に付着、堆積した前記半田層35或いは酸
化鉛、酸化錫層のような半田の酸化物層を電気分解によ
り除去する。As shown in FIGS. 3 and 4, when cleaning the contact portions 33, a positive electrode of a DC power source is connected to the platinum plate 21 of the cleaning member 20, and the back surface of the printed wiring board 32 is cleaned. A negative electrode of the DC power supply is connected to the contact portion 33 of the IC socket 31 via the connector provided at
The cleaning member 20 is brought into contact with a solder layer 35 or a solder oxide layer adhered and deposited on the surface of the contact portion 33, and slides in, for example, the longitudinal direction of the contact portion 33 and the arrangement direction of the contact portion 33. Then, a current is sequentially passed through the contact portion 33 to remove the solder layer 35 or a solder oxide layer such as a lead oxide or tin oxide layer deposited and deposited on the surface of the contact portion 33 by electrolysis.
【0020】前記した電気分解により、前記コンタクト
部33の表面上に付着、堆積した前記半田層35或いは
半田の酸化物層はカソード還元によりイオン化して前記
クリーニング部材20の前記電解質パッド22に吸着さ
れて取り込まれる。By the above-described electrolysis, the solder layer 35 or the oxide layer of the solder deposited and deposited on the surface of the contact portion 33 is ionized by cathode reduction and adsorbed on the electrolyte pad 22 of the cleaning member 20. It is taken in.
【0021】前記コンタクト部33をクリーニングする
際、前記実施例においては、前記クリーニング部材20
を用いているが、所定形状の前記した電解質ゲルを前記
コンタクト部33の配列に応じて配置し、前記電解質ゲ
ルに前記直流電源の正極を接続された金属ロッドを結
合、接続して電気分解により前記コンタクト部33の表
面上に付着、堆積した前記半田層35或いは半田の酸化
物層を除去することもできる。When cleaning the contact portion 33, in the above-described embodiment, the cleaning member 20 is used.
Is used, but the above-mentioned electrolyte gel having a predetermined shape is arranged according to the arrangement of the contact portions 33, and a metal rod connected to the positive electrode of the DC power supply is connected to the electrolyte gel, and the electrolyte gel is electrolyzed. It is also possible to remove the solder layer 35 or the oxide layer of the solder adhered and deposited on the surface of the contact portion 33.
【0022】また、前記半田層35或いは半田の酸化物
層を前記コンタクト部33から除去した後、イオン交換
水により処理してもよい。Further, after removing the solder layer 35 or the oxide layer of the solder from the contact portion 33, it may be treated with ion-exchanged water.
【0023】[0023]
【発明の効果】本発明によれば、前記ICソケットのコ
ンタクト部の表面上に付着、堆積した不要な半田層或い
は半田の酸化物層は、前記電解質ゲル或いは電解質パッ
ドにより簡単に除去することができ、また、前記ICソ
ケットを前記プリント配線基板から取り外す必要がない
ので、前記ICソケット及び前記プリント配線基板を損
傷させることはなく、さらに、薬液を入れた大きな洗浄
槽を使用する必要としない。According to the present invention, unnecessary solder layers or solder oxide layers adhered and deposited on the surface of the contact portion of the IC socket can be easily removed by the electrolyte gel or the electrolyte pad. Since the IC socket does not need to be removed from the printed wiring board, the IC socket and the printed wiring board are not damaged, and a large cleaning tank containing a chemical solution is not required.
【図1】本発明の実施例による電解質ゲルを示す斜視図
である。FIG. 1 is a perspective view illustrating an electrolyte gel according to an embodiment of the present invention.
【図2】本発明の実施例によるクリーニング部材示す斜
視図である。FIG. 2 is a perspective view illustrating a cleaning member according to an embodiment of the present invention.
【図3】本発明の実施例によるプリント配線基板に取り
付けられたICソケットのコンタクト部をクリーニング
する状態を模式的に示す図である。FIG. 3 is a diagram schematically showing a state of cleaning a contact portion of an IC socket attached to a printed wiring board according to an embodiment of the present invention.
【図4】本発明の実施例によるICソケットのコンタク
ト部をクリーニングする状態を模式的に示す拡大平面図
である。FIG. 4 is an enlarged plan view schematically showing a state of cleaning a contact portion of the IC socket according to the embodiment of the present invention.
【図5】従来のICソケットボードを模式的に示す斜視
図である。FIG. 5 is a perspective view schematically showing a conventional IC socket board.
【図6】ICデバイスのリードとICソケットのコンタ
クト部との接触状態を模式的に示す拡大断面図である。FIG. 6 is an enlarged sectional view schematically showing a contact state between a lead of an IC device and a contact portion of an IC socket.
10…電解質ゲル、20…クリーニング部材、21…白
金プレート、22…電解質パッド、30…ICソケット
ボード、31…ICソケット、32…プリント配線基
板、33…コンタクト部、34…位置決め片、35…半
田層或いは半田の酸化物層DESCRIPTION OF SYMBOLS 10 ... Electrolyte gel, 20 ... Cleaning member, 21 ... Platinum plate, 22 ... Electrolyte pad, 30 ... IC socket board, 31 ... IC socket, 32 ... Printed wiring board, 33 ... Contact part, 34 ... Positioning piece, 35 ... Solder Layer or solder oxide layer
Claims (3)
されたプリント配線基板とからなるICソケットボード
であって、前記ICソケットのコンタクト部の表面上に
付着、堆積した半田層或いは半田の酸化物層を除去して
前記コンタクト部の表面をクリーニングする際、前記コ
ンタクト部の表面上に電解質ゲルを載置して電気分解に
より前記半田層或いは半田の酸化物層を除去して前記コ
ンタクト部の表面をクリーニングする方法。1. An IC socket board comprising an IC socket and a printed wiring board to which the IC socket is connected, wherein a solder layer or a solder oxide layer adhered and deposited on a surface of a contact portion of the IC socket. When cleaning the surface of the contact portion by removing the contact portion, an electrolyte gel is placed on the surface of the contact portion, and the solder layer or the oxide layer of the solder is removed by electrolysis to remove the surface of the contact portion. How to clean.
を特徴とする請求項1記載のクリーニングする方法。2. The cleaning method according to claim 1, wherein an impregnating material impregnated with an electrolyte is used.
ことを特徴とするICソケットのコンタクト部をクリー
ニングするクリーニング部材。3. A cleaning member for cleaning a contact portion of an IC socket, said cleaning member comprising an impregnating material impregnated with said electrolyte.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11185471A JP2001009398A (en) | 1999-06-30 | 1999-06-30 | Ic socket cleaning method and member therefor |
KR1019990031081A KR20010005421A (en) | 1999-06-30 | 1999-07-29 | Method for Cleaning an Integrated Circuit and Cleaning Element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11185471A JP2001009398A (en) | 1999-06-30 | 1999-06-30 | Ic socket cleaning method and member therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2001009398A true JP2001009398A (en) | 2001-01-16 |
Family
ID=16171360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11185471A Pending JP2001009398A (en) | 1999-06-30 | 1999-06-30 | Ic socket cleaning method and member therefor |
Country Status (2)
Country | Link |
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JP (1) | JP2001009398A (en) |
KR (1) | KR20010005421A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003076087A1 (en) * | 2002-03-05 | 2003-09-18 | Erik Orwoll | Electro-chemical cleaning process for electrical connectors |
US7025600B2 (en) | 2003-02-25 | 2006-04-11 | Shinko Electric Industries Co., Ltd. | Semiconductor device having external contact terminals and method for using the same |
-
1999
- 1999-06-30 JP JP11185471A patent/JP2001009398A/en active Pending
- 1999-07-29 KR KR1019990031081A patent/KR20010005421A/en not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003076087A1 (en) * | 2002-03-05 | 2003-09-18 | Erik Orwoll | Electro-chemical cleaning process for electrical connectors |
US7025600B2 (en) | 2003-02-25 | 2006-04-11 | Shinko Electric Industries Co., Ltd. | Semiconductor device having external contact terminals and method for using the same |
Also Published As
Publication number | Publication date |
---|---|
KR20010005421A (en) | 2001-01-15 |
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