JP2000513873A - 質量分析計のためのイオン源および分析のためにイオン源を供する方法 - Google Patents

質量分析計のためのイオン源および分析のためにイオン源を供する方法

Info

Publication number
JP2000513873A
JP2000513873A JP10546740A JP54674098A JP2000513873A JP 2000513873 A JP2000513873 A JP 2000513873A JP 10546740 A JP10546740 A JP 10546740A JP 54674098 A JP54674098 A JP 54674098A JP 2000513873 A JP2000513873 A JP 2000513873A
Authority
JP
Japan
Prior art keywords
flow
ion source
sample
chamber
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP10546740A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000513873A5 (enExample
Inventor
ステバン バジック
Original Assignee
マスラボ リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by マスラボ リミテッド filed Critical マスラボ リミテッド
Publication of JP2000513873A publication Critical patent/JP2000513873A/ja
Publication of JP2000513873A5 publication Critical patent/JP2000513873A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP10546740A 1997-04-29 1998-04-28 質量分析計のためのイオン源および分析のためにイオン源を供する方法 Ceased JP2000513873A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9708715.9 1997-04-29
GB9708715A GB2324906B (en) 1997-04-29 1997-04-29 Ion source for a mass analyser and method of providing a source of ions for analysis
PCT/GB1998/001232 WO1998049710A1 (en) 1997-04-29 1998-04-28 Ion source for a mass analyser and method of providing a source of ions for analysis

Publications (2)

Publication Number Publication Date
JP2000513873A true JP2000513873A (ja) 2000-10-17
JP2000513873A5 JP2000513873A5 (enExample) 2005-10-06

Family

ID=10811558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10546740A Ceased JP2000513873A (ja) 1997-04-29 1998-04-28 質量分析計のためのイオン源および分析のためにイオン源を供する方法

Country Status (6)

Country Link
US (1) US6462336B1 (enExample)
EP (1) EP0912988A1 (enExample)
JP (1) JP2000513873A (enExample)
CA (1) CA2259352C (enExample)
GB (1) GB2324906B (enExample)
WO (1) WO1998049710A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013540341A (ja) * 2010-10-21 2013-10-31 アドヴィオン インコーポレーテッド 質量分析計の大気圧イオン化導入口
US9905409B2 (en) 2007-11-30 2018-02-27 Waters Technologies Corporation Devices and methods for performing mass analysis

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2346730B (en) 1999-02-11 2003-04-23 Masslab Ltd Ion source for mass analyser
GB2404784B (en) 2001-03-23 2005-06-22 Thermo Finnigan Llc Mass spectrometry method and apparatus
US20040238754A1 (en) * 2001-09-17 2004-12-02 Baranov Vladimir I. Method and apparatus for cooling and focusing ions
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置
DE602004024286D1 (de) * 2003-02-14 2010-01-07 Mds Sciex Atmosphärendruck-diskriminator für geladene teilchen für massenspektrometrie
US7091477B2 (en) 2003-06-09 2006-08-15 Ionica Mass Spectrometry Group, Inc. Mass spectrometer interface
US7015466B2 (en) 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
US7385189B2 (en) * 2005-06-29 2008-06-10 Agilent Technologies, Inc. Nanospray ionization device and method
US7391019B2 (en) * 2006-07-21 2008-06-24 Thermo Finnigan Llc Electrospray ion source
US7770431B2 (en) 2006-07-31 2010-08-10 Applied Materials, Inc. Methods and apparatus for insitu analysis of gases in electronic device fabrication systems
US8288719B1 (en) * 2006-12-29 2012-10-16 Griffin Analytical Technologies, Llc Analytical instruments, assemblies, and methods
US8035088B2 (en) * 2007-04-06 2011-10-11 Waters Technologies Corporation Device, apparatus and methods for mass spectrometry
US7868289B2 (en) 2007-04-30 2011-01-11 Ionics Mass Spectrometry Group Inc. Mass spectrometer ion guide providing axial field, and method
US7564029B2 (en) * 2007-08-15 2009-07-21 Varian, Inc. Sample ionization at above-vacuum pressures
US8324565B2 (en) 2009-12-17 2012-12-04 Agilent Technologies, Inc. Ion funnel for mass spectrometry
GB2499681B (en) * 2011-04-20 2016-02-10 Micromass Ltd Atmospheric pressure ion source by interacting high velocity spray with a target
US9851333B2 (en) 2013-05-29 2017-12-26 Dionex Corporation Nebulizer for charged aerosol detection (CAD) system
US10109472B2 (en) 2013-09-20 2018-10-23 Micromass Uk Limited Tool free gas cone retaining device for mass spectrometer ion block assembly
GB201316697D0 (en) * 2013-09-20 2013-11-06 Micromass Ltd Tool free gas cone retaining device for mass spectrometer ion block assembly
DE112015000977B4 (de) * 2014-02-26 2023-05-17 Micromass Uk Limited Umgebungsionisation mit einer Impaktorsprayquelle
GB2632683A (en) * 2023-08-17 2025-02-19 Thermo Fisher Scient Bremen Gmbh Mass spectrometer comprising a vacuum system and a method of operation

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153113A3 (en) 1984-02-10 1987-09-23 Finnigan Corporation Thermospray ion sampling device
JPH07118295B2 (ja) 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
US4861988A (en) 1987-09-30 1989-08-29 Cornell Research Foundation, Inc. Ion spray apparatus and method
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
US4999493A (en) * 1990-04-24 1991-03-12 Vestec Corporation Electrospray ionization interface and method for mass spectrometry
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
US5171990A (en) * 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
GB9110960D0 (en) * 1991-05-21 1991-07-10 Logicflit Limited Mass spectrometer
US5565679A (en) 1993-05-11 1996-10-15 Mds Health Group Limited Method and apparatus for plasma mass analysis with reduced space charge effects
US5349186A (en) * 1993-06-25 1994-09-20 The Governors Of The University Of Alberta Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer
US5495108A (en) * 1994-07-11 1996-02-27 Hewlett-Packard Company Orthogonal ion sampling for electrospray LC/MS
US5753910A (en) * 1996-07-12 1998-05-19 Hewlett-Packard Company Angled chamber seal for atmospheric pressure ionization mass spectrometry

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9905409B2 (en) 2007-11-30 2018-02-27 Waters Technologies Corporation Devices and methods for performing mass analysis
JP2013540341A (ja) * 2010-10-21 2013-10-31 アドヴィオン インコーポレーテッド 質量分析計の大気圧イオン化導入口

Also Published As

Publication number Publication date
US6462336B1 (en) 2002-10-08
GB2324906A (en) 1998-11-04
EP0912988A1 (en) 1999-05-06
GB2324906B (en) 2002-01-09
CA2259352A1 (en) 1998-11-05
CA2259352C (en) 2006-11-07
WO1998049710A1 (en) 1998-11-05
GB9708715D0 (en) 1997-06-18

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