JP2000356680A5 - - Google Patents

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Publication number
JP2000356680A5
JP2000356680A5 JP1999165353A JP16535399A JP2000356680A5 JP 2000356680 A5 JP2000356680 A5 JP 2000356680A5 JP 1999165353 A JP1999165353 A JP 1999165353A JP 16535399 A JP16535399 A JP 16535399A JP 2000356680 A5 JP2000356680 A5 JP 2000356680A5
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JP
Japan
Prior art keywords
charge
semiconductor
threshold value
radiation detection
semiconductor radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999165353A
Other languages
English (en)
Japanese (ja)
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JP2000356680A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP16535399A priority Critical patent/JP2000356680A/ja
Priority claimed from JP16535399A external-priority patent/JP2000356680A/ja
Publication of JP2000356680A publication Critical patent/JP2000356680A/ja
Publication of JP2000356680A5 publication Critical patent/JP2000356680A5/ja
Pending legal-status Critical Current

Links

JP16535399A 1999-06-11 1999-06-11 半導体放射線検出装置 Pending JP2000356680A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16535399A JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16535399A JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Publications (2)

Publication Number Publication Date
JP2000356680A JP2000356680A (ja) 2000-12-26
JP2000356680A5 true JP2000356680A5 (enrdf_load_stackoverflow) 2005-12-22

Family

ID=15810761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16535399A Pending JP2000356680A (ja) 1999-06-11 1999-06-11 半導体放射線検出装置

Country Status (1)

Country Link
JP (1) JP2000356680A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012083307A (ja) 2010-10-14 2012-04-26 Fujifilm Corp 放射線検出装置、放射線画像撮影システム、放射線検出プログラム、及び放射線検出方法
JP5725188B2 (ja) * 2011-04-04 2015-05-27 株式会社島津製作所 撮像装置
JP2013057598A (ja) 2011-09-08 2013-03-28 Rigaku Corp 半導体ストリップ検出器

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