JP2000356680A - 半導体放射線検出装置 - Google Patents
半導体放射線検出装置Info
- Publication number
- JP2000356680A JP2000356680A JP16535399A JP16535399A JP2000356680A JP 2000356680 A JP2000356680 A JP 2000356680A JP 16535399 A JP16535399 A JP 16535399A JP 16535399 A JP16535399 A JP 16535399A JP 2000356680 A JP2000356680 A JP 2000356680A
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- signal
- charge
- semiconductor
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 79
- 239000004065 semiconductor Substances 0.000 title claims abstract description 76
- 239000013078 crystal Substances 0.000 claims abstract description 36
- 230000000903 blocking effect Effects 0.000 claims description 3
- 230000008859 change Effects 0.000 abstract description 10
- 238000001228 spectrum Methods 0.000 abstract description 2
- 230000005251 gamma ray Effects 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 description 19
- 238000001514 detection method Methods 0.000 description 12
- 239000003990 capacitor Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000007493 shaping process Methods 0.000 description 5
- 230000009467 reduction Effects 0.000 description 4
- 229910004613 CdTe Inorganic materials 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006872 improvement Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910004611 CdZnTe Inorganic materials 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Measurement Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16535399A JP2000356680A (ja) | 1999-06-11 | 1999-06-11 | 半導体放射線検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16535399A JP2000356680A (ja) | 1999-06-11 | 1999-06-11 | 半導体放射線検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000356680A true JP2000356680A (ja) | 2000-12-26 |
JP2000356680A5 JP2000356680A5 (enrdf_load_stackoverflow) | 2005-12-22 |
Family
ID=15810761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16535399A Pending JP2000356680A (ja) | 1999-06-11 | 1999-06-11 | 半導体放射線検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000356680A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012083307A (ja) * | 2010-10-14 | 2012-04-26 | Fujifilm Corp | 放射線検出装置、放射線画像撮影システム、放射線検出プログラム、及び放射線検出方法 |
WO2012137484A1 (ja) * | 2011-04-04 | 2012-10-11 | 株式会社島津製作所 | 撮像装置 |
DE102012215800A1 (de) | 2011-09-08 | 2013-03-14 | Rigaku Corp. | Halbleiterstreifendetektor |
-
1999
- 1999-06-11 JP JP16535399A patent/JP2000356680A/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012083307A (ja) * | 2010-10-14 | 2012-04-26 | Fujifilm Corp | 放射線検出装置、放射線画像撮影システム、放射線検出プログラム、及び放射線検出方法 |
US8885795B2 (en) | 2010-10-14 | 2014-11-11 | Fujifilm Corporation | Radiation detector, radiographic image capturing system, radiation detection method, and radiation detection program storage medium |
WO2012137484A1 (ja) * | 2011-04-04 | 2012-10-11 | 株式会社島津製作所 | 撮像装置 |
JPWO2012137484A1 (ja) * | 2011-04-04 | 2015-02-23 | 株式会社島津製作所 | 撮像装置 |
DE102012215800A1 (de) | 2011-09-08 | 2013-03-14 | Rigaku Corp. | Halbleiterstreifendetektor |
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