JP2000277927A - Wiring board, manufacture thereof, and electric apparatus comprising the same - Google Patents

Wiring board, manufacture thereof, and electric apparatus comprising the same

Info

Publication number
JP2000277927A
JP2000277927A JP7878699A JP7878699A JP2000277927A JP 2000277927 A JP2000277927 A JP 2000277927A JP 7878699 A JP7878699 A JP 7878699A JP 7878699 A JP7878699 A JP 7878699A JP 2000277927 A JP2000277927 A JP 2000277927A
Authority
JP
Japan
Prior art keywords
wiring board
conductive
conductive member
conductive layer
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7878699A
Other languages
Japanese (ja)
Inventor
Shigemasa Ariyoshi
重将 有吉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP7878699A priority Critical patent/JP2000277927A/en
Publication of JP2000277927A publication Critical patent/JP2000277927A/en
Pending legal-status Critical Current

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Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To suppress substrate distortion caused by heat in a bonding process for electric parts, when an electric part to be provided on a wiring board is provided on the wiring board, by allowing the joint between the electric part and wiring board to comprise a region where statistically defect is easy to occur. SOLUTION: A broke line region A corresponds to a place, and its vicinity, where the outside corner of a semiconductor chip which is mounted on the wiring board is positioned, and the arrangement factor of a wiring pattern on the wiring board surface within the broken line region A comprising a region where a defect is easy to occur is set lower than the other part. With a wiring pattern where a redundant pattern is added to the wiring board, a redundant pattern B is arranged over the entire substrate so that the gap of wiring pattern is buried without shorting them. Or, a redundant pattern C is so arranged in the broken line region A that the gap of wiring pattern is buried to such extent as no shorting occurs.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、配線基板で特に多
層プリント配線基板で、電気部品のボンディング工程に
おいて加えられる熱により発生する基板の歪みを抑制す
るための処理が施された配線基板とその製造方法に関す
る。また、そのような配線基板を用いて製造された電気
機器、特に持ち運ぶことができるほど小型の電気機器に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board, particularly a multi-layer printed wiring board, which has been subjected to a process for suppressing the distortion of the board caused by heat applied in a bonding step of an electric component, and a wiring board having the same. It relates to a manufacturing method. The present invention also relates to an electric device manufactured using such a wiring board, particularly to an electric device that is small enough to be portable.

【0002】[0002]

【従来の技術】電子部品を実装する配線基板の導体パタ
ーンは、それぞれの設計者が製品形状や電気回路設計に
基づいてパターン設計を行い、そのパターンに応じて銅
張積層板を例えばサブトラクティブ法(Subtrac
tive Process)によれば、銅箔のうち不必
要な部分を薬品で溶解除去し、必要な導体パターンだけ
を得ている。
2. Description of the Related Art A conductor pattern of a wiring board on which electronic components are mounted is designed by a designer based on a product shape or an electric circuit design, and a copper-clad laminate is subjected to a subtractive method according to the pattern. (Subtrac
According to the active process, unnecessary portions of the copper foil are dissolved and removed with a chemical to obtain only necessary conductor patterns.

【0003】さて、この所定の導体パターンが形成され
た配線基板に電子部品を装着して回路基板を製作するた
めに、部品のはんだ付け作業が行われる。このはんだ付
け作業は電子機器に広く使用されているチップ部品の搭
載の場合は、リフローソルディングが用いられるのが通
常である。
[0003] In order to manufacture a circuit board by mounting electronic components on the wiring board on which the predetermined conductor pattern is formed, soldering of the components is performed. In the case of mounting a chip component widely used in an electronic device, this soldering operation usually uses reflow soldering.

【0004】リフローソルディングは、図6に示すよう
にリフロー炉10の中を搬送ベルト12a、12bに載
置された配線基板1に電子部品13が載置された回路基
板14が搬送されることによって行われる。まず、配線
基板1のパッドにクリームはんだを塗布し、次に、チッ
プ部品等の電子部品13の端子部15をプリント配線基
板1の導電層のパッド上に正確に位置決めして装着す
る。そして、この状態を保って赤外線炉や熱風炉等のリ
フロー炉10を通過させて適切な加熱を行い、クリーム
はんだを溶融させてはんだ付を完了し電子部品13を所
定位置に固定する。
In the reflow soldering, as shown in FIG. 6, a circuit board 14 on which electronic components 13 are mounted on a wiring board 1 mounted on conveyor belts 12a and 12b is conveyed in a reflow furnace 10. Done by First, cream solder is applied to the pads of the wiring board 1, and then the terminal portions 15 of the electronic components 13 such as chip components are accurately positioned and mounted on the pads of the conductive layer of the printed wiring board 1. Then, while maintaining this state, the solder paste is passed through a reflow oven 10 such as an infrared oven or a hot blast oven to perform appropriate heating to melt the cream solder, complete the soldering, and fix the electronic component 13 at a predetermined position.

【0005】なお、リフロー炉10内では高温になるた
め、配線基板1を構成している絶縁材が軟化、硬化ある
いは伸長、収縮して配線基板1に反りが発生する。リフ
ロー炉10から搬出した常温の状態でもリフロー炉10
内で発生した反りによる変形が配線基板1に残留する。
リフロー炉によらないボンディング方法として、ツール
により電気部品をチャックし、このツールを150 乃至18
0 ℃程度に加熱させ、電気部品を基板上に配置する異方
性導電膜に対して押し付けて固定する方法も有る。
Since the temperature in the reflow furnace 10 becomes high, the insulating material constituting the wiring board 1 is softened, hardened, expanded or contracted, and the wiring board 1 is warped. The reflow furnace 10 can be removed from the reflow furnace 10 even at room temperature.
The deformation due to the warpage generated in the wiring board remains on the wiring board 1.
As a bonding method not using a reflow furnace, electric parts are chucked with a tool, and this tool is used for 150 to 18
There is also a method in which the electric component is heated to about 0 ° C., and the electric component is pressed against and fixed to the anisotropic conductive film disposed on the substrate.

【0006】[0006]

【発明が解決しようとする課題】これらのプロセスで製
作される回路基板は、それを構成している未だ電子部品
等が搭載されていない配線基板の状態で、すでに反って
おり、電子部品を搭載するためのリフロー炉でのはんだ
付け後にはその反りが更に増加している。
The circuit board manufactured by these processes is already warped in a state of a wiring board on which electronic parts and the like constituting the circuit board are not yet mounted, and the electronic parts are mounted. After soldering in a reflow furnace to perform the warping, the warpage further increases.

【0007】配線基板の反りは、実装された半導体リー
ドと配線との間ではんだ接続不良を引起こす。はんだ接
続不良が発生すると、その不良修正は手作業となるため
多大の作業工数が発生する。さらに場合によっては、実
装ラインで反った配線基板が実装装置から落下して実装
ラインが停止する事故が発生する。
The warpage of the wiring board causes a defective solder connection between the mounted semiconductor lead and the wiring. When a solder connection failure occurs, the repair of the failure is a manual operation, so that a large number of man-hours are required. Further, in some cases, an accident occurs in which the wiring board warped in the mounting line falls from the mounting apparatus and the mounting line stops.

【0008】製品の軽量化要求により回路基板はますま
す薄くなる傾向に有り、板圧の薄いプリント配線基板
は、電子部品を搭載していく過程で反りが増加する傾向
が強いため、薄型化に伴って反りによるプリント回路基
板の不良発生率が高くなる。このため、その後の工程で
電子部品を実装する際の自動組立装置の許容する反り量
を越える場合が発生して、電子部品の実装精度が得られ
ないケースが発生する。
[0008] Circuit boards tend to be thinner and thinner due to demands for lighter products, and a printed circuit board having a lower board pressure tends to increase in the course of mounting electronic components. As a result, the occurrence rate of defects of the printed circuit board due to the warpage increases. For this reason, the warpage amount allowed by the automatic assembling apparatus when mounting the electronic components in the subsequent process may occur, and the mounting accuracy of the electronic components may not be obtained.

【0009】リフロー工程での反りを防止するために、
図7に示すような反り防止治具を用いる場合も有る。こ
の治具はプリント配線基板1のリフロー炉内の進行方向
の両端側に反り防止治具3a、3bを設けたり、あるい
は、プリント配線基板1自体に図示しない反り防止バー
をを取付けることが行われている。
In order to prevent warpage in the reflow process,
In some cases, a warp prevention jig as shown in FIG. 7 is used. This jig is provided with warp preventing jigs 3a and 3b on both ends of the printed wiring board 1 in the direction of travel in the reflow furnace, or a warp preventing bar (not shown) is attached to the printed wiring board 1 itself. ing.

【0010】治具を用いる場合は、治具の自動装着が困
難であるため、装着用の作業者が必要になる。また、費
用面でも防止治具製作費が発生して好ましくない。反り
防止バーを取付ける場合も、工程が増えて好ましくな
い。また、治具では、基板表面に発生する局所的な変形
を抑制できない。
[0010] When a jig is used, it is difficult to automatically mount the jig, and a mounting worker is required. In addition, in terms of cost, the production cost of the prevention jig is disadvantageously increased. Also in the case where a warpage prevention bar is attached, the number of steps increases, which is not preferable. Also, the jig cannot suppress local deformation occurring on the substrate surface.

【0011】また、反りが生じていないまでも、リフロ
ー工程中において高温雰囲気中に放置されることになる
ので、基板全体が伸長し、リフロー工程後には縮小する
という現象がおきている。これによるものと見られる不
良も確認されている。
Further, even if no warpage occurs, the substrate is left in a high-temperature atmosphere during the reflow process, so that the entire substrate expands and shrinks after the reflow process. Defects considered to be due to this have also been confirmed.

【0012】また、ボンディングツールにチャックして
ボンディングを行う方法においては、基板全体は反らな
いが、局所的な変形が起きる場合がある。本発明はこれ
らの事情に基づいてなされたもので、リフロー炉等での
熱の影響を受けても接合不良の発生していない回路基板
が得られるような配線基板を提供することを目的として
いる。また、このような熱変形による接合不良が低減さ
れた基板を用いた電気機器を提供することを目的とす
る。
In the method of performing bonding by chucking a bonding tool, the whole substrate does not warp, but local deformation may occur. The present invention has been made based on these circumstances, and it is an object of the present invention to provide a wiring board that can obtain a circuit board free from bonding failure even under the influence of heat in a reflow furnace or the like. . Another object of the present invention is to provide an electric device using a substrate in which bonding defects due to such thermal deformation are reduced.

【0013】[0013]

【課題を解決するための手段】本発明は上記したような
課題を解決するためになされたものであって、冗長パタ
ーンにより敷設面積が増大している導電部材を少なくと
も一部分に有する導電層と、この導電層と交互に積層さ
れている絶縁層とを具備した配線基板であって、前記一
部分は、前記冗長パターンが形成されていないとき、前
記配線基板上に設けられるべき電気部品が前記配線基板
上に設けられた際に、この電気部品と前記配線基板との
接合に統計的に不良が起き易い領域を含むことを特徴と
する配線基板である。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and has a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern; A wiring board comprising: the conductive layer; and an insulating layer alternately laminated, wherein the part is configured such that, when the redundant pattern is not formed, an electric component to be provided on the wiring board is the wiring board. When provided on the wiring board, the wiring board is characterized by including a region where the electrical component and the wiring board are likely to be statistically defective in bonding.

【0014】また、冗長パターンにより敷設面積が増大
している導電部材を少なくとも一部分に有する導電層
と、この導電層と交互に積層されている絶縁層とを具備
した配線基板であって、前記一部分は、電気部品が配線
基板上に設けられる際にこの電気部品の外形の角部に相
当する部分が位置する領域を含むことを特徴とする配線
基板である。
A wiring board comprising a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern, and an insulating layer alternately stacked with the conductive layer. Is a wiring board characterized by including a region where a portion corresponding to a corner of the outer shape of the electric component is located when the electric component is provided on the wiring board.

【0015】また、冗長パターンにより敷設面積が増大
している導電部材を少なくとも一部分に有する導電層
と、この導電層と交互に積層されている絶縁層とを具備
した配線基板であって、前記一部分は、半導体装置が配
線基板上に設けられる際にこの半導体装置の外形の角部
に相当する部分が位置する領域を含むことであることを
特徴とする配線基板である。
A wiring board comprising a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern, and an insulating layer alternately stacked with the conductive layer. Is a wiring board characterized by including a region where a portion corresponding to a corner of the outer shape of the semiconductor device is located when the semiconductor device is provided on the wiring board.

【0016】このとき、前記導電層はこの配線基板の板
厚方向の中心を基準とする板厚方向の導電部材の量のば
らつきが所定範囲内であることが好ましい。また、板面
がなす面積に対する前記導電部材がなす面積の割合を導
電部材の配設率、Nを導電部材層の数、Z軸は板厚方向
に平行で板の中心を原点とする軸とするとき、
At this time, it is preferable that the variation in the amount of the conductive member in the thickness direction of the conductive layer with respect to the center of the wiring substrate in the thickness direction is within a predetermined range. Further, the ratio of the area formed by the conductive member to the area formed by the plate surface is the ratio of the conductive member disposed, N is the number of conductive member layers, and the Z axis is an axis parallel to the plate thickness direction and having the origin at the center of the plate. and when,

【0017】[0017]

【数3】 の値が反りを生じにくい所定範囲内にあることが好まし
い。
(Equation 3) Is preferably within a predetermined range where warpage is unlikely to occur.

【0018】また、板厚方向に対称の位置にある導電層
の面積が等しいことが好ましい。また、導電部材に面積
低減穴を具える導電層を有することが好ましい。また、
導電部材からなる面積増加パターンを具える導電層を有
することが好ましい。
It is preferable that the areas of the conductive layers located symmetrically in the thickness direction are equal. Further, it is preferable that the conductive member has a conductive layer having an area reduction hole. Also,
It is preferable to have a conductive layer having an area increasing pattern made of a conductive member.

【0019】また、導電部材は、銅または銅合金である
ことが好ましい。また本発明は、冗長パターンにより敷
設面積が増大している導電部材を少なくとも一部分に有
する導電層と絶縁層とを交互に積層する積層工程を具え
る配線基板の製造方法であって、前記積層工程は、前記
一部分が、前記冗長パターンが形成されていないとき、
前記配線基板上に設けられるべき電気部品が前記配線基
板上に設けられた際に、この電気部品と前記配線基板と
の接合に統計的に不良が起き易い領域であることを特徴
とする配線基板の製造方法である。
The conductive member is preferably made of copper or a copper alloy. The present invention also provides a method for manufacturing a wiring board, comprising a laminating step of alternately laminating conductive layers and insulating layers each having at least a part of a conductive member whose laying area is increased by a redundant pattern. When the part is not formed with the redundant pattern,
A wiring board, wherein when an electric component to be provided on the wiring board is provided on the wiring board, a region where a failure is statistically likely to occur in joining between the electric component and the wiring board; It is a manufacturing method of.

【0020】また、冗長パターンにより敷設面積が増大
している導電部材を少なくとも一部分に有する導電層と
絶縁層とを交互に積層する積層工程を具える配線基板の
製造方法であって、前記積層工程は、前記一部分が、電
気部品が配線基板上に設けられる際にこの電気部品の外
形の角部に相当する部分が位置する領域であることを特
徴とする配線基板の製造方法である。
A method for manufacturing a wiring board, comprising: a laminating step of alternately laminating conductive layers having at least a portion of a conductive member whose laying area is increased by a redundant pattern and insulating layers. Is a method for manufacturing a wiring board, wherein the part is a region where a part corresponding to a corner of an outer shape of the electric component is located when the electric component is provided on the wiring board.

【0021】また、冗長パターンにより敷設面積が増大
している導電部材を少なくとも一部分に有する導電層と
絶縁層とを交互に積層する積層工程を具える配線基板の
製造方法であって、前記積層工程は、前記一部分が、半
導体装置が配線基板上に設けられる際にこの半導体装置
の外形の角部に相当する部分が位置する領域であること
を特徴とする配線基板の製造方法である。
The present invention also provides a method for manufacturing a wiring board, comprising: a laminating step of alternately laminating a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern and an insulating layer. Is a method for manufacturing a wiring board, wherein the part is a region where a part corresponding to a corner of an outer shape of the semiconductor device is located when the semiconductor device is provided on the wiring board.

【0022】このとき、前記導電層はこの配線基板の板
厚方向の中心を基準とする板厚方向の導電部材の量のば
らつきが所定範囲内である導電層を積層する工程を具え
ることが好ましい。
In this case, the conductive layer may include a step of laminating a conductive layer in which the variation in the amount of the conductive member in the thickness direction with respect to the center of the wiring substrate in the thickness direction is within a predetermined range. preferable.

【0023】また、板面がなす面積に対する前記導電部
材がなす面積の割合を導電部材の配設率、Nを導電部材
層の数、Z軸は板厚方向に平行で板の中心を原点とする
軸とするとき、
The ratio of the area formed by the conductive member to the area formed by the plate surface is defined as the ratio of the conductive member provided, N is the number of conductive member layers, the Z axis is parallel to the plate thickness direction, and the center of the plate is defined as the origin. When the axis is

【0024】[0024]

【数4】 の値が反りを生じにくい所定範囲内になる導電層を配設
する工程を具えることが好ましい。
(Equation 4) It is preferable to include a step of arranging a conductive layer in which the value is within a predetermined range in which warpage hardly occurs.

【0025】また、板厚方向に対称の位置にある他の導
電層と面積が等しい導電層を設けることが好ましい。ま
た、導電部材に面積低減穴を具える導電層を配設するこ
とが好ましい。
It is preferable to provide a conductive layer having an area equal to that of another conductive layer located symmetrically in the thickness direction. Further, it is preferable to dispose a conductive layer having an area reduction hole in the conductive member.

【0026】また、導電部材からなる面積増加パターン
を具える導電層を配設することが好ましい。また、導電
部材は、銅または銅合金であることが好ましい。また本
発明は、上記のような配線基板からなる回路基板と、前
記回路基板とを納める筐体と、を具備することを特徴と
する電気機器である。
It is preferable to provide a conductive layer having an area increasing pattern made of a conductive member. Preferably, the conductive member is copper or a copper alloy. According to another aspect of the present invention, there is provided an electrical apparatus including: a circuit board including the wiring board as described above; and a housing that houses the circuit board.

【0027】[0027]

【発明の実施の形態】配線基板として、絶縁層の表裏両
面のものに限らず、内面にも導体パターンを形成したプ
リント配線基板がある。このような複数の導電層を有す
る多層プリント配線基板は、電子機器の小型化、高密度
実装化に伴い電子計算機等で4層板(導体パターンが導
電層で4層重ね合せて形成されているもの)、6層板、
8層板或いはそれ以上のもの(例えば、44層板)が実
用化されている。このような配線基板と電気素子との間
に起こる接合不良は、基板の熱膨張に起因する。熱膨張
により基板に反りが生じたり、局所的な変形が起きるこ
とで、接合部分が剥離するものと考えられる。ただし、
反りが生じていても、反りが原因で接合不良が生じてい
るのではなく、基板の局所的変形に伴って生じる応力の
作用によって接合不良が生じている場合が有るので、常
に2つの要因が同時に解消されている必要はない。
DESCRIPTION OF THE PREFERRED EMBODIMENTS As a wiring board, there is not only a printed wiring board having both front and back surfaces of an insulating layer, but also a printed wiring board having a conductor pattern formed on an inner surface. Such a multilayer printed wiring board having a plurality of conductive layers is formed by a four-layer plate (a conductive pattern is formed by superposing four conductive patterns on a conductive layer) by an electronic computer or the like in accordance with miniaturization and high-density mounting of electronic devices. Thing), 6-layer board,
An eight-layer plate or more (for example, a 44-layer plate) has been put to practical use. Such poor bonding between the wiring board and the electric element is caused by thermal expansion of the board. It is considered that the bonding portion is peeled off when the substrate is warped or locally deformed due to thermal expansion. However,
Even if warpage occurs, bonding failure may not occur due to warpage but may occur due to the effect of stress caused by local deformation of the substrate. Therefore, two factors are always present. It does not have to be eliminated at the same time.

【0028】<「反り」(基板の全体的変形)について
>これらの多層プリント配線基板の各導電層は、各々製
品形状による設置スペースの制約や実装部品の放熱効率
等を考慮して所定の電気回路を基に導電パターンが設計
されている。通常、これらの設計では電気回路設計と製
品形状設計が優先しているため、プリント配線基板が所
定の電子部品を装着してリフロー炉を通過した後の反り
を想定しての、反り防止の設計は行われていない。その
ため、通常の多層プリント配線基板の各導電層毎のパタ
ーンは反りに対する相互関係が考慮されておらず、結果
として多層プリント配線基板全体の反りを助長してい
る。
<Regarding "Warping" (Overall Deformation of Board)> Each of the conductive layers of the multilayer printed wiring board has a predetermined electric power in consideration of the installation space restriction due to the product shape, the heat radiation efficiency of the mounted components, and the like. The conductive pattern is designed based on the circuit. Usually, in these designs, the electric circuit design and the product shape design are prioritized, so that the printed wiring board is designed to prevent warpage after mounting the specified electronic components and assuming warpage after passing through a reflow furnace. Has not been done. For this reason, the pattern of each conductive layer of a normal multilayer printed wiring board does not consider the mutual relationship with respect to the warpage, and as a result, promotes the warpage of the entire multilayer printed wiring board.

【0029】リフロー炉によるプリント配線基板の反り
は、プリント配線基板を形成している絶縁層と導電層と
の材質の差による熱膨張係数の差、さらにこの膨張係数
の差が基板の表裏で異なることにより発生する応力に起
因している。この要因は特に軽薄短小化した携帯電話等
の小型電子機器用途の基板に顕著である。
The warpage of the printed wiring board caused by the reflow furnace is caused by a difference in thermal expansion coefficient due to a difference in material between the insulating layer and the conductive layer forming the printed wiring board, and the difference in expansion coefficient is different between the front and back of the board. This is caused by the stress generated. This factor is particularly remarkable in substrates for small electronic devices such as mobile phones that have been reduced in size and weight.

【0030】従って、多層プリント配線基板の場合は、
中心層に対して対称の位置関係にある導電層の相互バラ
ンスをとる処理を施せば、それぞれから発生する応力が
相殺されて反りを防止することが出来る。導電層相互の
バランスは基板に対する銅の面積とその配置を適切にす
ることで得られる。
Therefore, in the case of a multilayer printed wiring board,
By performing a process of balancing the conductive layers having a symmetrical positional relationship with respect to the center layer, the stresses generated from the respective layers are cancelled, and the warpage can be prevented. The balance between the conductive layers can be obtained by optimizing the area of copper with respect to the substrate and its arrangement.

【0031】反りを防止する方法として、導電層の配線
パターンの敷設面積を増大させて剛性を高くする手法が
取られる場合が有るが、銅材が理論上不要な部分にまで
くまなく敷設する必要が生じるため、材料の無駄を生じ
る。また、基板の重量が増してしまい、特に携帯型の電
気機器に組み込まれる基板としては好ましくない。した
がって、導電層の銅材は、各層毎のバランスを調整して
適量を配設することが好ましいものとなる。
As a method of preventing warpage, a method of increasing the laying area of the wiring pattern of the conductive layer to increase the rigidity may be adopted. However, it is necessary to lay the copper material all over theoretically unnecessary portions. Is generated, resulting in waste of material. Further, the weight of the substrate increases, which is not preferable particularly as a substrate incorporated in a portable electric device. Therefore, it is preferable to arrange an appropriate amount of the copper material of the conductive layer by adjusting the balance of each layer.

【0032】バランスの取り方としては、各層毎の銅材
の敷設面積を反りが生じない程度に均一化する手法が有
るが、多層構造化するほど、この手法は容易でなくな
る。したがって、以下の方法でバランス処理を行う。
As a method of balancing, there is a method of making the laying area of the copper material for each layer uniform so that warpage does not occur. However, this method becomes more difficult as a multilayer structure is formed. Therefore, the balance processing is performed by the following method.

【0033】図1は本発明の調整原理を説明するための
モデルで、反りが発生したプリント配線基板の力学的関
係を示す断面図である。このモデルにおいては、プリン
ト配線基板1は銅からなる導電層が4層で構成され、第
1〜第4導電層L1、L2、L3、L4がそれぞれ絶縁
層2を介して積層されている。
FIG. 1 is a model for explaining the adjustment principle of the present invention, and is a cross-sectional view showing the mechanical relationship of a warped printed wiring board. In this model, the printed wiring board 1 includes four conductive layers made of copper, and the first to fourth conductive layers L1, L2, L3, and L4 are stacked with the insulating layer 2 interposed therebetween.

【0034】いま、プリント配線基板1(以下基板)が
図1で基板端部が下方に湾曲した反りが発生した場合の
曲げモーメントは(1)式で表すことが出来る。なお、
曲げモーメントはY軸方向の単位長さあたりの値であ
る。また、熱応力は熱応力のX方向成分である。
Now, when the printed circuit board 1 (hereinafter referred to as the board) warps in FIG. 1 with the board end curving downward, the bending moment can be expressed by equation (1). In addition,
The bending moment is a value per unit length in the Y-axis direction. The thermal stress is an X-direction component of the thermal stress.

【0035】[0035]

【数5】 (Equation 5)

【0036】ただし、Z軸は基板の方線に平行で、基板
の厚み方向の中心を原点とした基準軸(仮想軸)LCで
ある。一般に、導電層L1〜L4の剛性は絶縁層2の剛
性よりも十分に大きいため、Nを導電層数とすると、曲
げモーメントは式(2)で表すことが出来る。
However, the Z axis is a reference axis (virtual axis) LC which is parallel to the normal line of the substrate and whose origin is the center in the thickness direction of the substrate. In general, the rigidity of the conductive layers L1 to L4 is sufficiently larger than the rigidity of the insulating layer 2, and therefore, if N is the number of conductive layers, the bending moment can be expressed by the equation (2).

【0037】[0037]

【数6】 (Equation 6)

【0038】また、基板がなす面の面積に対する銅が配
設されている部分の面積の割合を残銅率と定義すれば、
導電層の弾性係数および線膨張係数は、式(3)および
(4)で、また[ 第i銅箔層の中心のZ座標] は式(5
−1)および(5−2)で表される。
If the ratio of the area of the portion where the copper is disposed to the area of the surface formed by the substrate is defined as the residual copper ratio,
The elastic coefficient and linear expansion coefficient of the conductive layer are given by equations (3) and (4), and [Z coordinate of the center of the i-th copper foil layer] is given by equation (5).
-1) and (5-2).

【0039】[0039]

【数7】 (Equation 7)

【0040】[0040]

【数8】 <i=1の場合>(Equation 8) <When i = 1>

【0041】[0041]

【数9】 <i=2〜Nの場合>(Equation 9) <When i = 2 to N>

【0042】[0042]

【数10】 式(3)と式(4)を曲げモーメントを表す式(2)に
代入して整理すると式(6)になる。
(Equation 10) Equations (3) and (4) are substituted into equation (2) representing the bending moment and rearranged into equation (6).

【0043】[0043]

【数11】 [Equation 11]

【0044】この式(6)において、〔 〕で挟んだΣ
の式を[板厚方向の銅の量のばらつき]と定義した。従
って、[板厚方向の銅の量のばらつき]は式(7)で表
すことが出来る。
In the equation (6), the expression is enclosed by [].
Is defined as [variation in the amount of copper in the thickness direction]. Therefore, [variation in the amount of copper in the thickness direction] can be expressed by equation (7).

【0045】[0045]

【数12】 (Equation 12)

【0046】式(6)における〔 〕で挟んだΣの式、
すなわち式(7)を除く項は0にできない物理量である
から、式(7)を0に近づけることが出来るように特定
の導電層の銅材の量を調整することで、各導電層毎の銅
材の量が決定する。実際にはこの項が0である必要はな
く、反りが生じることによる不良が発生しない程度に0
に近づいていれば良い。
Equation (6) sandwiched by [] in equation (6),
That is, since the terms other than the expression (7) are physical quantities that cannot be set to 0, the amount of the copper material of the specific conductive layer is adjusted so that the expression (7) can be brought close to 0. The amount of copper material is determined. Actually, this term does not need to be 0, and is 0 to the extent that a defect due to warpage does not occur.
I just need to get closer to.

【0047】これまでの議論は導電層の導電部材が銅で
ある場合についてなされているが、[銅]を[導電部
材]に、[銅箔層]を[導電層]に、[残銅率]を[導
電部材の配設率]と読みかえることで、他の導電性の材
料を用いたときにおいても、同様の説明が可能となる。
The discussion so far has been made on the case where the conductive member of the conductive layer is copper. However, [copper] is used as the [conductive member], [copper foil layer] is used as the [conductive layer], and [residual copper ratio] is used. ] Can be read as [arrangement ratio of conductive member], the same description can be made even when another conductive material is used.

【0048】<「局所的変形」(基板の部分的変形)に
ついて>熱膨張係数のバランスを所定の基準に近づくよ
うに設定することで、基板の反りは軽減される。しかし
ながら、基板全体として一律に膨張しているために反り
が生じていないのであって、熱膨張自体は依然として発
生しているから、素子を実装した後で温度変化が与えら
れることにより生じる局所的変形によって、素子の端子
と配線基板上の接合されるべき端子部分とに位置ずれが
発生することがあり、これが接合不良を生じる原因とな
る。したがって、十分な接合強度を確保できない端子と
の接合や、伸縮に対して複合的な方向に拘束作用を有す
る基板上の部位に存する端子での接合については、その
接合される部分およびその周辺に対して、基板の伸縮を
鈍化させて変形を軽減する手段を、少なくとも不良の発
生し易い部位に設けることが必要である。基板表面全体
にわたって設けても構わないが、有効に作用する部位に
限って配設することにより、材料の必要量を低減でき
る。
<Regarding "Local Deformation" (Partial Deformation of Substrate)> By setting the balance of the thermal expansion coefficients so as to approach a predetermined reference, the warpage of the substrate is reduced. However, since the substrate as a whole expands uniformly, no warpage has occurred, and thermal expansion itself still occurs, so local deformation caused by a temperature change after mounting the element is performed. As a result, a position shift may occur between a terminal of the element and a terminal portion to be bonded on the wiring board, which causes a bonding failure. Therefore, for bonding with a terminal that cannot secure sufficient bonding strength or bonding at a terminal on a portion of the substrate that has a restricting action in a composite direction with respect to expansion and contraction, On the other hand, it is necessary to provide a means for reducing the deformation by slowing the expansion and contraction of the substrate, at least in a portion where defects are likely to occur. Although it may be provided over the entire surface of the substrate, it is possible to reduce the required amount of material by arranging it only at a site where it works effectively.

【0049】回路基板に用いられる材料間の性質を考察
する。配線基板はFR4などの絶縁材料からなる絶縁層
と、Cuなどの良導体からなる導電層と、から構成され
る。この配線基板には電気素子が接続される。ACFを
媒介とするBGAのベアチップ接続である場合の各材料
についての物性値を表1に示す。
Consider the properties between the materials used for the circuit board. The wiring board includes an insulating layer made of an insulating material such as FR4 and a conductive layer made of a good conductor such as Cu. An electric element is connected to this wiring board. Table 1 shows the physical property values of each material in the case of BGA bare chip connection via ACF.

【0050】[0050]

【表1】 表1によれば、ヤング率や横弾性係数で見た関係は以下
の通り。
[Table 1] According to Table 1, the relationship in terms of Young's modulus and transverse elastic modulus is as follows.

【0051】[0051]

【数13】 (Equation 13)

【0052】ただし、FR4 ,ACF に比してSi,Cuのヤン
グ率はオーダーが異なるほどに差が大きい。Siに比して
Cuの線膨張係数が1桁大きいが、機械特性の観点と併せ
て考慮すると、総体としてSi,Cuの変形のしにくさは同
程度ある。一方、従来、配線材料と絶縁層との剥離不良
はほとんど発生していない。
However, as compared with FR4 and ACF, the Young's modulus of Si and Cu has a larger difference as the order is different. Compared to Si
Although the linear expansion coefficient of Cu is one order of magnitude higher, when considered in view of the mechanical properties as well, the difficulty of deformation of Si and Cu as a whole is about the same. On the other hand, conventionally, peeling failure between the wiring material and the insulating layer has hardly occurred.

【0053】以上のことから、接合不良が発生する部位
またはその近傍においては基板の伸縮を鈍化させる措置
を講じることが適当であり、その具体的手段としては、
統計的に接合不良が発生しやすい領域について、この領
域の導電層の配線パターンの密度または厚さを他の領域
に比して高く設定する、あるいは、回路の導電作用には
無関係な冗長パターンをこの領域あるいはその近傍に付
加する、などの方法が有効である。統計的に接合不良が
発生し易い領域としては、例えば、BGA 接合されるベア
チップの角部近傍にある端子部分などがあげられる。こ
の部分は変形または歪みによる応力が大きく作用し、オ
ープン不良が発生しやすい。以上は、接合強度の差は有
れども、ACFによらない実装についても同様に説明可
能である。
From the above, it is appropriate to take measures to slow down the expansion and contraction of the substrate at or near the site where the bonding failure occurs.
In areas where bonding defects are likely to occur statistically, set the density or thickness of the wiring pattern of the conductive layer in this area higher than in other areas, or use redundant patterns unrelated to the conductive function of the circuit. A method such as adding to this area or its vicinity is effective. Examples of the region where a bonding failure is statistically likely to occur include a terminal portion near a corner of a bare chip to be BGA-bonded. In this portion, stress due to deformation or distortion acts greatly, and an open defect is likely to occur. The above description can be similarly applied to a mounting not using the ACF, although there is a difference in bonding strength.

【0054】<具体的な実施形態>本発明の具体的な実
施形態について図面を参照しながら説明する。図2乃至
図5に示す配線基板の配線パターンは、配線基板表面の
不良が発生し易い領域を含む部分を示すものである。図
2は従来の配線パターンを示すものであり、接合不良が
図中破線領域において顕著であった。この破線領域A内
はこの配線基板に実装される半導体チップの外形Xの角
部が位置する場所およびその近傍に相当しており、破線
領域A内の配線パターンの配設率が他の部分に比して低
い。
<Specific Embodiment> A specific embodiment of the present invention will be described with reference to the drawings. The wiring patterns of the wiring board shown in FIG. 2 to FIG. 5 indicate portions including areas where defects are likely to occur on the surface of the wiring board. FIG. 2 shows a conventional wiring pattern, and the bonding failure is remarkable in a broken line region in the figure. The area inside the broken line area A corresponds to the position where the corner of the outer shape X of the semiconductor chip mounted on the wiring board is located and in the vicinity thereof. Lower than that.

【0055】図3は、図2の配線基板に冗長パターンを
付加した配線パターンを有する配線基板を示す図であ
り、互いに短絡しない様に配線パターンの隙間を埋める
よう、基板全域にわたって冗長パターンBの配設を施し
たものである。
FIG. 3 is a view showing a wiring board having a wiring pattern obtained by adding a redundant pattern to the wiring board shown in FIG. 2, and the redundant pattern B is formed over the entire area of the wiring board so as to fill gaps between the wiring patterns so as not to short-circuit each other. It has been arranged.

【0056】また、図4は、図2の配線基板に冗長パタ
ーンを付加した配線パターンを有する配線基板を示す図
であり、配線パターンの隙間を短絡しない程度に埋める
よう、破線領域内に冗長パターンCの配設を施したもの
である。
FIG. 4 is a view showing a wiring board having a wiring pattern obtained by adding a redundant pattern to the wiring board shown in FIG. 2. The redundant pattern is enclosed in a broken line region so as to fill the gap between the wiring patterns without short-circuiting. C is provided.

【0057】また、図5は、図2の配線基板に配線パタ
ーンを付加した配線基板を示す図であり、配線パターン
の隙間を短絡しない程度に破線領域A内を埋めるように
他の異なる配線パターンDが配設されるよう、パターン
の再構成を施したものである。
FIG. 5 is a view showing a wiring board in which a wiring pattern is added to the wiring board of FIG. 2. In FIG. 5, another different wiring pattern is filled so as not to short-circuit a gap between the wiring patterns. The pattern is reconfigured so that D is provided.

【0058】図3乃至図5において、冗長パターンは配
線パターンと同一部材、すなわち銅材で構成されてお
り、不良が発生し易い領域において、配線基板の絶縁材
料と電気部品との間に導電部材である銅材が配設されて
いる。これにより、電気部品と配線基板との接合不良の
発生が低減される。
In FIGS. 3 to 5, the redundant pattern is made of the same material as the wiring pattern, that is, made of copper material, and a conductive member is provided between the insulating material of the wiring board and the electric component in a region where defects easily occur. Is provided. As a result, occurrence of bonding failure between the electric component and the wiring board is reduced.

【0059】上記の例においては、電気部品の角部近傍
に相当する領域から配線を引き出している構成の配線パ
ターンが説明されたが、可能な限り配線間の隙間を塞ぐ
観点からは、角部近傍に相当する不良が発生し易い領域
に配線パターンを配設せず、この部位を冗長パターンで
覆う構成にすることが好ましい。このとき、電気配線
は、電気部品の外形の角部近傍からではなく、電気部品
の角部と角部とを結ぶ辺部の位置に相当する配線基板上
の領域に配設されていることが好ましいものとなる。
In the above example, the wiring pattern has been described in which the wiring is drawn out from the area corresponding to the vicinity of the corner of the electric component. However, from the viewpoint of closing the gap between the wirings as much as possible, It is preferable that a wiring pattern is not provided in a region corresponding to the vicinity where a failure is likely to occur, and that this region is covered with a redundant pattern. At this time, the electric wiring may be provided not in the vicinity of the corner of the outer shape of the electric component but in the area on the wiring board corresponding to the position of the side connecting the corners of the electric component. It will be preferable.

【0060】<電気機器への適用>上記したように、熱
によって反らないように導電層の残銅率が調整された
り、局所的な変形が軽減された配線基板は、半導体集積
回路や半導体メモリ、その他各種電気部品がリフロー炉
などではんだ付けされたり、ACF 接続されたりすること
により、高い信頼性を有する回路基板を構成する。この
回路基板には、電子回路の内部状態を表示するディスプ
レイやあるいはLEDなどの表示装置や、回路基板に電
子情報を入力するためのマイクや各種センサあるいはキ
ーパッドなどの入力部品、また、携帯電話など、音を取
り扱う装置にあたってはスピーカーなどの、熱を取り扱
う装置にあたっては電熱線やマイクロ波発生装置など
の、動力を取り扱う装置にあたっては回転機やリニアモ
ータなどの出力装置が組み付けられて、これらを一体的
に保持する筐体に納められ、あらゆる種類の電気機器が
構成される。
<Application to Electric Apparatus> As described above, a wiring board in which the residual copper ratio of a conductive layer is adjusted so that it does not warp due to heat, or whose local deformation is reduced, is a semiconductor integrated circuit or a semiconductor. A memory board and other various electrical components are soldered in a reflow furnace or connected by ACF to form a highly reliable circuit board. The circuit board includes a display device that displays the internal state of the electronic circuit, a display device such as an LED, an input component such as a microphone, various sensors, or a keypad for inputting electronic information to the circuit board. For devices that handle sound, such as speakers, for devices that handle heat, heating devices such as heating wires and microwave generators, and for devices that handle power, output devices such as rotating machines and linear motors are installed. It is housed in a housing that is integrally held, and all types of electrical devices are configured.

【0061】従来の配線基板の設計思想においては、配
線基板に反りが生じた場合、基板全体の剛性をあげるた
めに、図7に示すように基板の両端を重量物で押え込む
などして反りの発生を抑えていたが、このような処置に
より製造された回路基板を用いて電気機器を製造した場
合、電気機器自身が発する熱のために製品に組み込まれ
た後で配線基板が反ったり、局所的な変形が起きたりし
てしまう可能性があり、このような問題は特に小型化/
軽量化/高密度実装化していく携帯電話やポータブルコ
ンピュータや電子手帳などの携帯情報端末機器において
は、無視することができない問題になりつつある。本発
明の配線基板は、残銅率の違いに起因する導電層間の膨
張の度合いの違いに着目し、この導電層間の膨張の度合
いを反りが発生しないようにバランスさせたり、局所的
変形に着目してこの変形を軽減させているので、本質的
に接合部分にかかる応力の発生が抑止されているから、
小型化/ 軽量化の進む携帯情報端末機器において、特別
な熱対策を施すこと無く本発明の配線基板を使用するこ
とが出来、この配線基板を使用した電気機器は、熱によ
る故障が生じにくいものとなる。
In the conventional wiring board design concept, when the wiring board is warped, the board is bent by pressing both ends of the board with heavy objects as shown in FIG. 7 in order to increase the rigidity of the entire board. However, when electrical equipment was manufactured using a circuit board manufactured by such a process, the wiring board warped after being incorporated into the product due to the heat generated by the electrical equipment itself, Local deformation may occur, and such a problem is particularly caused by miniaturization /
In portable information terminal devices such as mobile phones, portable computers, and electronic organizers that are becoming lighter / higher-density packages, the problem cannot be ignored. The wiring board of the present invention focuses on the difference in the degree of expansion between the conductive layers caused by the difference in the residual copper ratio, and balances the degree of expansion between the conductive layers so that warpage does not occur, and focuses on local deformation. Since this deformation is reduced, the generation of stress applied to the joint is essentially suppressed,
In portable information terminal devices that are becoming smaller and lighter, the wiring board of the present invention can be used without taking special heat measures, and electrical equipment using this wiring board is unlikely to cause failure due to heat. Becomes

【0062】[0062]

【発明の効果】以上に述べたように、本発明は配線基板
の導電層の板厚方向の銅の量のばらつきを低減するため
に、導電層の残銅率や導電層と絶縁層の厚みを調整する
ことで、結果的に熱変形による曲げモーメントを低減さ
せて配線基板の反りを防止でき、反りづらくなる。熱対
策をすることが難しい小形の電気機器に適用すること
で、他の熱対策部品を用いる必要が無くなるので、信頼
性を維持しながら装置の簡素化に貢献できる。
As described above, according to the present invention, in order to reduce the variation in the amount of copper in the thickness direction of the conductive layer of the wiring board, the residual copper ratio of the conductive layer and the thickness of the conductive layer and the insulating layer are reduced. As a result, the bending moment due to the thermal deformation can be reduced to prevent the wiring board from warping, thereby making it difficult to warp. By applying the present invention to a small-sized electric device in which it is difficult to take measures against heat, it is not necessary to use other heat measures parts, so that it is possible to contribute to simplification of the apparatus while maintaining reliability.

【図面の簡単な説明】[Brief description of the drawings]

【図1】基板がリフロー炉の搬送ベルトで搬送される状
態を示す平面図。
FIG. 1 is a plan view showing a state in which a substrate is transferred by a transfer belt of a reflow furnace.

【図2】従来の配線基板の不良が起き易い領域とその近
傍をを示す模式図。
FIG. 2 is a schematic view showing a region where a conventional wiring board is likely to be defective and its vicinity.

【図3】従来の配線基板に対して本発明を適用した実施
形態を示す模式図。
FIG. 3 is a schematic view showing an embodiment in which the present invention is applied to a conventional wiring board.

【図4】従来の配線基板に対して本発明を適用した実施
形態を示す模式図。
FIG. 4 is a schematic diagram showing an embodiment in which the present invention is applied to a conventional wiring board.

【図5】従来の配線基板に対して本発明を適用した実施
形態を示す模式図。
FIG. 5 is a schematic view showing an embodiment in which the present invention is applied to a conventional wiring board.

【図6】リフロー炉による工程の概要を示す概要説明
図。
FIG. 6 is a schematic explanatory view showing an outline of a process using a reflow furnace.

【図7】基板に反り防止治具を用いた例を示す概略図。FIG. 7 is a schematic view showing an example in which a warp prevention jig is used for a substrate.

【符号の説明】[Explanation of symbols]

1…配線基板、2…絶縁層、L1〜L6…導電層、5a
…面積低減穴、6…面積増加パターン、10…リフロー
炉、110…配線基板。
DESCRIPTION OF SYMBOLS 1 ... Wiring board, 2 ... Insulating layer, L1-L6 ... Conductive layer, 5a
... area reduction hole, 6 ... area increase pattern, 10 ... reflow furnace, 110 ... wiring board.

Claims (19)

【特許請求の範囲】[Claims] 【請求項1】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と、この
導電層と交互に積層されている絶縁層とを具備した配線
基板であって、前記一部分は、前記冗長パターンが形成
されていないとき、前記配線基板上に設けられるべき電
気部品が前記配線基板上に設けられた際に、この電気部
品と前記配線基板との接合に統計的に不良が起き易い領
域を含むことを特徴とする配線基板。
1. A wiring board, comprising: a conductive layer having at least a part of a conductive member whose laying area is increased by a redundant pattern; and an insulating layer alternately laminated with the conductive layer. When the redundant pattern is not formed, when an electrical component to be provided on the wiring board is provided on the wiring board, statistically defective bonding between the electrical component and the wiring board is performed. A wiring board comprising a region which is likely to occur.
【請求項2】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と、この
導電層と交互に積層されている絶縁層とを具備した配線
基板であって、前記一部分は、電気部品が配線基板上に
設けられる際にこの電気部品の外形の角部に相当する部
分が位置する領域を含むことを特徴とする配線基板。
2. A wiring board, comprising: a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern; and an insulating layer alternately stacked with the conductive layer. A wiring board characterized by including a region where a portion corresponding to a corner of an outer shape of the electric component is located when the electric component is provided on the wiring board.
【請求項3】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と、この
導電層と交互に積層されている絶縁層とを具備した配線
基板であって、前記一部分は、半導体装置が配線基板上
に設けられる際にこの半導体装置の外形の角部に相当す
る部分が位置する領域を含むことであることを特徴とす
る配線基板。
3. A wiring board, comprising: a conductive layer having at least a portion of a conductive member whose laying area is increased by a redundant pattern; and an insulating layer alternately laminated with the conductive layer. The present invention provides a wiring board characterized by including a region where a portion corresponding to a corner of an outer shape of the semiconductor device is located when the semiconductor device is provided on the wiring board.
【請求項4】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と絶縁層
とを交互に積層する積層工程を具える配線基板の製造方
法であって、前記積層工程は、前記一部分が、前記冗長
パターンが形成されていないとき、前記配線基板上に設
けられるべき電気部品が前記配線基板上に設けられた際
に、この電気部品と前記配線基板との接合に統計的に不
良が起き易い領域であることを特徴とする配線基板の製
造方法。
4. A method for manufacturing a wiring board, comprising: a laminating step of alternately laminating conductive layers having at least a portion of a conductive member whose laying area is increased by a redundant pattern and insulating layers. When the part is not formed with the redundant pattern, when an electric component to be provided on the wiring board is provided on the wiring board, the electric component is statistically bonded to the wiring board. A method for manufacturing a wiring board, wherein the method is a region in which a defect is likely to occur in a circuit.
【請求項5】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と絶縁層
とを交互に積層する積層工程を具える配線基板の製造方
法であって、前記積層工程は、前記一部分が、電気部品
が配線基板上に設けられる際にこの電気部品の外形の角
部に相当する部分が位置する領域であることを特徴とす
る配線基板の製造方法。
5. A method for manufacturing a wiring board, comprising: a laminating step of alternately laminating conductive layers and insulating layers each having at least a portion of a conductive member whose laying area is increased by a redundant pattern. The method of manufacturing a wiring board according to claim 1, wherein the part is a region where a part corresponding to a corner of an outer shape of the electric component is located when the electric component is provided on the wiring board.
【請求項6】冗長パターンにより敷設面積が増大してい
る導電部材を少なくとも一部分に有する導電層と絶縁層
とを交互に積層する積層工程を具える配線基板の製造方
法であって、前記積層工程は、前記一部分が、半導体装
置が配線基板上に設けられる際にこの半導体装置の外形
の角部に相当する部分が位置する領域であることを特徴
とする配線基板の製造方法。
6. A method for manufacturing a wiring board, comprising: a laminating step of alternately laminating conductive layers having at least a portion of a conductive member whose laying area is increased by a redundant pattern and insulating layers. Wherein the portion is a region where a portion corresponding to a corner of the outer shape of the semiconductor device is located when the semiconductor device is provided on the wiring substrate.
【請求項7】請求項1、2または3記載の配線基板であ
って、前記導電層はこの配線基板の板厚方向の中心を基
準とする板厚方向の導電部材の量のばらつきが所定範囲
内であることを特徴とする配線基板。
7. The wiring board according to claim 1, wherein the conductive layer has a predetermined range of variation in the amount of conductive members in the thickness direction with respect to the center of the wiring board in the thickness direction. A wiring board characterized by being inside.
【請求項8】請求項4、5または6配線基板の製造方法
であって、前記導電層はこの配線基板の板厚方向の中心
を基準とする板厚方向の導電部材の量のばらつきが所定
範囲内である導電層を積層する工程を具えることを特徴
とする配線基板の製造方法。
8. A method for manufacturing a wiring board according to claim 4, wherein the conductive layer has a predetermined variation in the amount of conductive members in the thickness direction with respect to the center of the wiring board in the thickness direction. A method for manufacturing a wiring board, comprising a step of laminating a conductive layer within a range.
【請求項9】板面がなす面積に対する前記導電部材がな
す面積の割合を導電部材の配設率、Nを導電部材層の
数、Z軸は板厚方向に平行で板の中心を原点とする軸と
するとき、 【数1】 の値が反りを生じにくい所定範囲内にあることを特徴と
する請求項1、2または3記載の配線基板。
9. The ratio of the area formed by the conductive member to the area formed by the plate surface is defined as the ratio of the conductive member disposed, N is the number of conductive member layers, the Z axis is parallel to the plate thickness direction, and the center of the plate is defined as the origin. When the axis is to be 4. The wiring board according to claim 1, wherein the value of the wiring board is within a predetermined range in which warpage is unlikely to occur.
【請求項10】板面がなす面積に対する前記導電部材が
なす面積の割合を導電部材の配設率、Nを導電部材層の
数、Z軸は板厚方向に平行で板の中心を原点とする軸と
するとき、 【数2】 の値が反りを生じにくい所定範囲内になる導電層を配設
する工程を具えることを特徴とする請求項4、5または
6記載の配線基板の製造方法。
10. The ratio of the area formed by the conductive member to the area formed by the plate surface is defined as the ratio of the conductive member, N is the number of conductive member layers, the Z axis is parallel to the plate thickness direction, and the center of the plate is defined as the origin. When the axis is to be 7. The method for manufacturing a wiring board according to claim 4, further comprising the step of arranging a conductive layer whose value is within a predetermined range in which warpage hardly occurs.
【請求項11】板厚方向に対称の位置にある導電層の面
積が等しい請求項1、2または3記載の配線基板。
11. The wiring board according to claim 1, wherein the conductive layers located symmetrically in the thickness direction have the same area.
【請求項12】板厚方向に対称の位置にある他の導電層
と面積が等しい導電層を設けることを特徴とする請求項
4、5または6記載の配線基板の製造方法。
12. The method for manufacturing a wiring board according to claim 4, wherein a conductive layer having an area equal to that of another conductive layer located symmetrically in the thickness direction is provided.
【請求項13】導電部材に面積低減穴を具える導電層を
有することを特徴とする請求項7または9記載の配線基
板。
13. The wiring board according to claim 7, wherein the conductive member has a conductive layer having an area reducing hole.
【請求項14】導電部材からなる面積増加パターンを具
える導電層を有することを特徴とする請求項7または9
記載の配線基板。
14. A conductive layer having an area increasing pattern made of a conductive member.
The wiring board as described.
【請求項15】導電部材に面積低減穴を具える導電層を
配設することを特徴とする請求項8または10記載の配
線基板の製造方法。
15. The method for manufacturing a wiring board according to claim 8, wherein a conductive layer having an area reduction hole is provided in the conductive member.
【請求項16】導電部材からなる面積増加パターンを具
える導電層を配設することを特徴とする請求項8または
10記載の配線基板の製造方法。
16. The method for manufacturing a wiring board according to claim 8, wherein a conductive layer having an area increasing pattern made of a conductive member is provided.
【請求項17】導電部材は、銅または銅合金であること
を特徴とする請求項1、2、3、7または9いずれか記
載の配線基板。
17. The wiring board according to claim 1, wherein the conductive member is copper or a copper alloy.
【請求項18】導電部材は、銅または銅合金であること
を特徴とする請求項4、5、6、8または10いずれか
記載の配線基板の製造方法。
18. The method according to claim 4, wherein the conductive member is copper or a copper alloy.
【請求項19】請求項1、2、3、7または9いずれか
記載の配線基板からなる回路基板と、 前記回路基板とを納める筐体と、を具備することを特徴
とする電気機器。
19. An electric device comprising: a circuit board comprising the wiring board according to claim 1, and a housing for accommodating the circuit board.
JP7878699A 1999-03-24 1999-03-24 Wiring board, manufacture thereof, and electric apparatus comprising the same Pending JP2000277927A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7878699A JP2000277927A (en) 1999-03-24 1999-03-24 Wiring board, manufacture thereof, and electric apparatus comprising the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7878699A JP2000277927A (en) 1999-03-24 1999-03-24 Wiring board, manufacture thereof, and electric apparatus comprising the same

Publications (1)

Publication Number Publication Date
JP2000277927A true JP2000277927A (en) 2000-10-06

Family

ID=13671579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7878699A Pending JP2000277927A (en) 1999-03-24 1999-03-24 Wiring board, manufacture thereof, and electric apparatus comprising the same

Country Status (1)

Country Link
JP (1) JP2000277927A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080080153A1 (en) 2006-09-29 2008-04-03 Fujitsu Limited Printed wiring board reliably achieving electric connection with electronic component
JP2014110331A (en) * 2012-12-03 2014-06-12 Denso Corp Warpage prevention jig and method of manufacturing circuit board

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080080153A1 (en) 2006-09-29 2008-04-03 Fujitsu Limited Printed wiring board reliably achieving electric connection with electronic component
KR100988585B1 (en) * 2006-09-29 2010-10-18 후지쯔 가부시끼가이샤 Printed wiring board reliably achieving electric connection with electronic component
US8305767B2 (en) 2006-09-29 2012-11-06 Fujitsu Limited Printed wiring board reliably achieving electric connection with electronic component
JP2014110331A (en) * 2012-12-03 2014-06-12 Denso Corp Warpage prevention jig and method of manufacturing circuit board

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