JP2000269258A - Device and method for conductive ball mounting - Google Patents

Device and method for conductive ball mounting

Info

Publication number
JP2000269258A
JP2000269258A JP6977399A JP6977399A JP2000269258A JP 2000269258 A JP2000269258 A JP 2000269258A JP 6977399 A JP6977399 A JP 6977399A JP 6977399 A JP6977399 A JP 6977399A JP 2000269258 A JP2000269258 A JP 2000269258A
Authority
JP
Japan
Prior art keywords
suction
mounting
conductive
substrate
conductive ball
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6977399A
Other languages
Japanese (ja)
Other versions
JP3565079B2 (en
Inventor
Tadahiko Sakai
忠彦 境
Seiji Sakami
省二 酒見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP06977399A priority Critical patent/JP3565079B2/en
Publication of JP2000269258A publication Critical patent/JP2000269258A/en
Application granted granted Critical
Publication of JP3565079B2 publication Critical patent/JP3565079B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To obtain a conductive ball mounting device and mounting method with which conductive balls can be mounted efficiently and stably on the electrode of a plurality of electronic parts formed on a substrate. SOLUTION: In this conductive ball mounting method wherein conductive balls are mounted on the electrodes of a plurality of electronic parts formed on a substrate using a chucking tool 12 corresponding to each split division of substrate, a chucking part 14, which is the aggregate of conductive ball chucking holes 12a, is provided on the position corresponding to the electrode formed interfacing to the arrangement of the electronic parts, and the conductive balls are collectively mounted on each split division by the suction tool 12 corresponding to each split division. Accordingly, the conductive balls can be mounted in a highly efficient and stable manner on the substrate where a plurality of electronic parts are irregularly arranged.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、基板に形成された
複数の電子部品(半導体素子)の電極に導電性ボールを
搭載する導電性ボールの搭載装置および搭載方法に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive ball mounting apparatus and method for mounting conductive balls on electrodes of a plurality of electronic components (semiconductor elements) formed on a substrate.

【0002】[0002]

【従来の技術】電子部品に突出電極であるバンプを形成
する工程においては、半田ボールなどの導電性ボールが
電子部品の電極上に搭載される。近年この導電性ボール
の搭載形態として、電子部品が個片に切り出される前の
ウェハの状態、すなわち電子部品である半導体素子が格
子状の配列で多数形成された状態で導電性ボールを搭載
する方法が用いられるようになっている。
2. Description of the Related Art In a process of forming a bump as a protruding electrode on an electronic component, a conductive ball such as a solder ball is mounted on an electrode of the electronic component. In recent years, as a method of mounting the conductive ball, a method of mounting the conductive ball in a state of a wafer before electronic components are cut into individual pieces, that is, a state in which a large number of semiconductor elements as electronic components are formed in a grid-like arrangement. Is used.

【0003】[0003]

【発明が解決しようとする課題】ところが、ウェハに直
接導電性ボールを搭載する場合、従来は以下に述べるよ
うな問題点があった。ウェハは円形状であり、この円形
状のウェハから矩形状の個片電子部品を切り出すことか
ら、切り出し線とウェハの外周とは一致しない。このた
めウェハの外周近傍では切り出し線は不規則な階段状と
なる。この結果ウェハの各電子部品に導電性ボールを搭
載する際に、複数の電子部品をまとまりの良い矩形状の
ブロックとして括ることができず、個片単位で搭載する
か、またはウェハ全体を一括して搭載するかのいずれか
を選択するしかなかった。このため個片で搭載する場合
には多数回の搭載を行う必要があって生産性が低下し、
また全体を一括して搭載する場合には正常な搭載を確保
する信頼性に難点があるなど、従来はウェハへ直接導電
性ボールを搭載する場合には、効率良く安定した搭載が
困難であった。
However, when conductive balls are directly mounted on a wafer, there have been the following problems in the prior art. Since the wafer has a circular shape and rectangular individual electronic components are cut out from the circular wafer, the cutout line does not coincide with the outer periphery of the wafer. Therefore, the cutting line has an irregular step shape near the outer periphery of the wafer. As a result, when the conductive balls are mounted on each electronic component of the wafer, a plurality of electronic components cannot be bundled as a well-formed rectangular block, and may be mounted individually or as a whole. I had no choice but to choose either. For this reason, when mounting in individual pieces, it is necessary to perform mounting many times, reducing productivity,
Conventionally, it was difficult to efficiently and stably mount conductive balls directly on a wafer. .

【0004】そこで本発明は、基板に形成された複数の
電子部品の電極に効率良く安定した導電性ボールの搭載
を行うことができる導電性ボールの搭載装置および搭載
方法を提供することを目的とする。
Accordingly, an object of the present invention is to provide a conductive ball mounting apparatus and a mounting method capable of efficiently and stably mounting conductive balls on electrodes of a plurality of electronic components formed on a substrate. I do.

【0005】[0005]

【課題を解決するための手段】請求項1記載の導電性ボ
ールの搭載装置は、基板に形成された複数の電子部品の
電極に吸着ツールによって導電性ボールを搭載する導電
性ボールの搭載装置であって、前記基板を複数区画に分
割した各分割区画に個別に対応した複数の吸着ツール
と、これらの吸着ツールの吸着面に前記電子部品の配列
に対応して形成され前記電極に対応する位置に導電性ボ
ールを真空吸着する吸着孔が設けられた吸着部とを備え
た。
According to a first aspect of the present invention, there is provided a conductive ball mounting apparatus for mounting a conductive ball on an electrode of a plurality of electronic components formed on a substrate by a suction tool. A plurality of suction tools individually corresponding to the divided sections obtained by dividing the substrate into a plurality of sections; and positions formed on the suction surfaces of these suction tools corresponding to the arrangement of the electronic components and corresponding to the electrodes. And a suction portion provided with a suction hole for vacuum-suctioning the conductive ball.

【0006】請求項2記載の導電性ボールの搭載方法
は、基板に形成された複数の電子部品の電極に吸着ツー
ルによって導電性ボールを搭載する導電性ボールの搭載
方法であって、前記電極に対応する位置に導電性ボール
を真空吸着する吸着孔が設けられた吸着部が前記電子部
品の配列に対応して形成された吸着ツールを前記基板を
複数区画に分割した各分割区画に個別に対応させて複数
準備し、導電性ボールを前記基板に搭載する際には前記
各分割区画に対応した吸着ツールによって各分割区画ご
とに導電性ボールを一括して搭載するようにした。
According to a second aspect of the present invention, there is provided a method for mounting a conductive ball on an electrode of a plurality of electronic components formed on a substrate, the conductive ball being mounted on the electrode by a suction tool. A suction portion provided with a suction hole for vacuum-suctioning the conductive ball at a corresponding position corresponds to a suction tool formed corresponding to the arrangement of the electronic components individually to each divided section obtained by dividing the substrate into a plurality of sections. When a plurality of conductive balls are mounted on the substrate, conductive balls are collectively mounted on each of the divided sections by a suction tool corresponding to each of the divided sections.

【0007】本発明によれば、導電性ボールの搭載エリ
アを複数区画に分割した分割区画に個別に対応した吸着
ツールによって各分割区画ごとに導電性ボールを一括し
て搭載することにより、複数の電子部品が不規則に配列
された基板に対しても効率良く安定して導電性ボールを
搭載することができる。
According to the present invention, a plurality of conductive balls are collectively mounted on each of the divided sections by a suction tool individually corresponding to the divided sections obtained by dividing the conductive ball mounting area into a plurality of sections. The conductive balls can be efficiently and stably mounted on a substrate on which electronic components are irregularly arranged.

【0008】[0008]

【発明の実施の形態】次に本発明の実施の形態を図面を
参照して説明する。図1は本発明の一実施の形態の導電
性ボールの搭載装置の斜視図、図2(a)は同導電性ボ
ールの搭載装置のピックアップヘッドの断面図、図2
(b)は同導電性ボールの搭載装置のピックアップヘッ
ド下面の平面図、図3(a),(c)は同ウェハの平面
図、図3(b)は同ウェハの部分平面図、図4は同導電
性ボールの搭載装置の吸着ツール載置部の平面図、図5
(a),(b),(c),(d),(e)は同導電性ボ
ールの搭載方法の工程説明図である。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a perspective view of a conductive ball mounting apparatus according to an embodiment of the present invention. FIG. 2A is a sectional view of a pickup head of the conductive ball mounting apparatus.
3B is a plan view of the lower surface of the pickup head of the conductive ball mounting apparatus, FIGS. 3A and 3C are plan views of the same wafer, FIG. 3B is a partial plan view of the same wafer, and FIG. FIG. 5 is a plan view of a suction tool mounting portion of the conductive ball mounting device, and FIG.
(A), (b), (c), (d), and (e) are process explanatory views of the method of mounting the conductive ball.

【0009】まず図1を参照して導電性ボールの搭載装
置の構造を説明する。図1において、基台1の中央には
搬送路2が設けられている。搬送路2はウェハ4を保持
したプレート3を搬送し位置決めする。このウェハ4は
略円形状の基板であり、後述するように複数の半導体素
子が格子状に多数形成されている。基台1の上面の両端
部には2台のY軸テーブル5が配設されている。2台の
Y軸テーブル5にはX軸テーブル6が架設されており、
X軸テーブル6には搭載ヘッド7が装着されている。
First, the structure of the conductive ball mounting device will be described with reference to FIG. In FIG. 1, a transport path 2 is provided at the center of a base 1. The transfer path 2 transfers and positions the plate 3 holding the wafer 4. The wafer 4 is a substantially circular substrate, and a plurality of semiconductor elements are formed in a lattice shape as described later. Two Y-axis tables 5 are arranged at both ends of the upper surface of the base 1. An X-axis table 6 is installed on the two Y-axis tables 5,
A mounting head 7 is mounted on the X-axis table 6.

【0010】搭載ヘッド7の下部はピックアップヘッド
8を備えている。X軸テーブル6およびY軸テーブル5
を駆動することにより搭載ヘッド7は水平移動する。搬
送路2の前方にはボール供給部9が配設されており、ボ
ール供給部9には導電性ボール10が多数貯溜されてい
る。搭載ヘッド7をボール供給部9の上方に位置させて
ピックアップヘッド8を上下動させることにより、ピッ
クアップヘッド8は導電性ボール10をピックアップす
る。そして搭載ヘッド7を位置決めされたウェハ4上に
位置させてピックアップヘッド8を再度上下動させるこ
とにより、ピックアップヘッド8に保持された導電性ボ
ール10をウェハ4上に搭載する。
A pickup head 8 is provided below the mounting head 7. X axis table 6 and Y axis table 5
, The mounting head 7 moves horizontally. A ball supply unit 9 is provided in front of the transport path 2, and a large number of conductive balls 10 are stored in the ball supply unit 9. The pickup head 8 picks up the conductive balls 10 by moving the pickup head 8 up and down with the mounting head 7 positioned above the ball supply unit 9. Then, by positioning the mounting head 7 on the positioned wafer 4 and moving the pickup head 8 up and down again, the conductive balls 10 held by the pickup head 8 are mounted on the wafer 4.

【0011】ボール供給部9の側方には、ピックアップ
ヘッド8に装着される吸着ツール12を載置する吸着ツ
ール載置部11が配設されている。吸着ツール載置部1
1に対してピックアップヘッド8を上下動させることに
より、ピックアップヘッド8に吸着ツール12を着脱・
交換することができる。
On the side of the ball supply section 9, there is provided a suction tool mounting section 11 on which a suction tool 12 mounted on the pickup head 8 is mounted. Suction tool mounting part 1
By moving the pickup head 8 up and down with respect to 1, the suction tool 12 is attached to and detached from the pickup head 8.
Can be exchanged.

【0012】ここで、ウェハ4について図3を参照して
説明する。図3(a)に示すようにウェハ4は略円形状
の基板であり、ウェハ4には矩形の電子部品である半導
体素子4aが格子状に多数形成されている。図3(a)
において、太線内はウェハ4のボール搭載エリアを示し
ており、その外形は階段状となっている。図3(b)で
示すように、各半導体素子4aには導電性ボール10が
搭載される電極4bが所定の電極配列パターンで多数形
成されており、これらの電極4bは電極群4cを形成し
ている。
Here, the wafer 4 will be described with reference to FIG. As shown in FIG. 3A, the wafer 4 is a substantially circular substrate, and a large number of semiconductor elements 4a, which are rectangular electronic components, are formed on the wafer 4 in a lattice shape. FIG. 3 (a)
In the figure, the bold line indicates the ball mounting area of the wafer 4, and its outer shape is stepped. As shown in FIG. 3B, a large number of electrodes 4b on which conductive balls 10 are mounted are formed in a predetermined electrode arrangement pattern on each semiconductor element 4a, and these electrodes 4b form an electrode group 4c. ing.

【0013】次に図2を参照して搭載ヘッド7に備えら
れたピックアップヘッド8およびピックアップヘッド8
の下面に着脱自在に装着される吸着ツール12について
説明する。図2(a)に示すようにピックアップヘッド
8の下面には吸着ツール12が装着されている。吸着ツ
ール12は、位置決めピン13によってピックアップヘ
ッド8に対して位置決めされ、吸引孔8bから真空吸引
することにより保持される。吸着ツール12の下面には
多数の吸着孔12aが設けられており、吸引孔8aから
真空吸引することにより、吸着孔12aには導電性ボー
ル10が吸着保持される。
Next, referring to FIG. 2, a pickup head 8 provided on the mounting head 7 and the pickup head 8
The suction tool 12 detachably mounted on the lower surface of the device will be described. As shown in FIG. 2A, a suction tool 12 is mounted on the lower surface of the pickup head 8. The suction tool 12 is positioned with respect to the pickup head 8 by the positioning pin 13, and is held by vacuum suction from the suction hole 8b. A large number of suction holes 12a are provided on the lower surface of the suction tool 12, and the conductive balls 10 are sucked and held in the suction holes 12a by vacuum suction from the suction holes 8a.

【0014】吸着ツール12は、ウェハ4を複数の4区
画に分割した分割区画(ハッチング部にて示す)をカバ
ーする矩形状の吸着面(寸法WX,WYの矩形区画)を
有している(図3(a)参照)。図2(b)に示すよう
に、吸着ツール12の吸着面には導電性ボール10を吸
着して保持する複数の吸着孔12aの集合である吸着部
14が形成されている。各吸着部14内における複数の
吸着孔12aの配列は、1個の半導体素子4aの電極4
bの配列と一致している。吸着部14の配列はウェハ4
における半導体素子4aの配列に対応したものとなって
おり、所定範囲A(ハッチング部分)のみに半導体素子
4aの配列ピッチと同様の配列ピッチで格子状に形成さ
れている。吸着部14は半導体素子4aの電極群4cの
電極配列パターンに対応した位置に導電性ボール10を
吸着する。
The suction tool 12 has a rectangular suction surface (rectangular section having dimensions WX and WY) covering a divided section (indicated by hatching) obtained by dividing the wafer 4 into a plurality of four sections. FIG. 3A). As shown in FIG. 2B, on the suction surface of the suction tool 12, a suction portion 14, which is a collection of a plurality of suction holes 12a for sucking and holding the conductive ball 10, is formed. The arrangement of the plurality of suction holes 12a in each suction portion 14 is based on the electrode 4 of one semiconductor element 4a.
The sequence matches b. The arrangement of the suction parts 14 is the wafer 4
, And are formed in a lattice pattern only at a predetermined range A (hatched portion) at an arrangement pitch similar to the arrangement pitch of the semiconductor elements 4a. The suction unit 14 suctions the conductive ball 10 to a position corresponding to the electrode arrangement pattern of the electrode group 4c of the semiconductor element 4a.

【0015】図3(c)に示すように、ウェハ4上の導
電性ボール10のボール搭載エリアは中心に対して点対
称の4つの分割区画[1],[2],[3],[4]に
分割されており各分割区画[1],[2],[3],
[4]に応じて個別の吸着ツール12を備えている。す
なわち、分割区画[1]に導電性ボールを搭載する際に
用いられる吸着ツール12Aは、図2(b)に示すよう
な吸着部14の配置となっており、ウェハ4の分割区画
[1]に属する半導体素子4aを対象とする所定範囲A
に限定して導電性ボール10を吸着するようになってい
る。分割区画[2],[3],[4]に導電性ボール1
0を搭載する場合に用いられる吸着ツール12B,12
C,12Dについても同様に、それぞれの分割区画に属
する半導体素子4aを対象とする所定範囲に限定して導
電性ボール10を吸着する。
As shown in FIG. 3 (c), the ball mounting area of the conductive ball 10 on the wafer 4 has four divided sections [1], [2], [3], [3] which are point-symmetric with respect to the center. 4], and each of the divided sections [1], [2], [3],
An individual suction tool 12 is provided according to [4]. That is, the suction tool 12A used when mounting the conductive ball in the divided section [1] has the arrangement of the suction portions 14 as shown in FIG. Range A for semiconductor element 4a belonging to
The conductive balls 10 are adsorbed only when the conductive balls 10 are sucked. Conductive ball 1 in divided sections [2], [3], [4]
0 suction tools 12B, 12 used when mounting
Similarly, the conductive balls 10 are attracted to the semiconductor elements 4a belonging to the respective divided sections only in a predetermined range for C and 12D.

【0016】これらの4種類の吸着ツール12A,12
B,12C,12Dは、図4に示すように吸着ツール載
置部11上に載置され、吸着ツール載置部11に対して
ピックアップヘッド8を上下動させることにより、既装
着の吸着ツール12の吸着を解除して吸着ツール載置部
11上に載置し、他の任意の吸着ツール12の新たな装
着を行うことが出来る。
These four kinds of suction tools 12A, 12A
B, 12C, and 12D are mounted on the suction tool mounting portion 11 as shown in FIG. 4, and the pick-up head 8 is moved up and down with respect to the suction tool mounting portion 11, so that the already mounted suction tool 12 is mounted. Can be released and placed on the suction tool mounting portion 11, and another arbitrary suction tool 12 can be newly mounted.

【0017】この導電性ボールの搭載装置は上記の様に
構成されており、以下導電性ボールの搭載方法について
図5を参照して説明する。図5(a)において、ピック
アップヘッド8には吸着ツール12Aが装着されてお
り、このピックアップヘッド8をボール供給部9内の導
電性ボール10に対して下降させ、吸着ツール12Aに
よって導電性ボール10を真空吸着する。
The conductive ball mounting apparatus is configured as described above, and a method for mounting the conductive balls will be described below with reference to FIG. In FIG. 5A, a suction tool 12A is mounted on the pickup head 8, and the pickup head 8 is lowered with respect to the conductive balls 10 in the ball supply unit 9, and the suction tools 12A are used by the suction tools 12A. Is vacuum-adsorbed.

【0018】このとき、吸着ツール12Aにはウェハ4
の分割区画[1]に対応した所定範囲にのみ吸着部14
が設けられているため、当該範囲のみに導電性ボール1
0が吸着される。次いでピックアップヘッド8を上昇さ
せてウェハ4上に移動させ、ウェハ4の所定部位に対し
て位置合わせしてピックアップヘッド8を下降させ、図
5(b),(c)に示すようにウェハ4の分割区画
[1]に属する各半導体素子4aの各電極4b(図3参
照)に導電性ボール10を搭載する。
At this time, the wafer 4 is attached to the suction tool 12A.
Suction section 14 only in a predetermined range corresponding to the divided section [1] of FIG.
Is provided, the conductive ball 1 is located only in that range.
0 is adsorbed. Next, the pickup head 8 is raised and moved onto the wafer 4, and is positioned with respect to a predetermined portion of the wafer 4, and the pickup head 8 is lowered, as shown in FIGS. 5 (b) and 5 (c). The conductive ball 10 is mounted on each electrode 4b (see FIG. 3) of each semiconductor element 4a belonging to the divided section [1].

【0019】この後ピックアップヘッド8を上昇させ、
次いで吸着ツール載置部11上へ移動させる。そしてピ
ックアップヘッド8を下降させ、図5(d)に示すよう
に吸着ツール12Aの吸着保持を解除して吸着ツール1
2Aを所定位置に載置する。次いでピックアップヘッド
8を次回使用の吸着ツール12B上に移動させて下降さ
せることにより、ピックアップヘッド8の下面には吸着
ツール12Bが新たに装着される。
Thereafter, the pickup head 8 is raised,
Next, it is moved onto the suction tool mounting portion 11. Then, the pickup head 8 is lowered to release the suction holding of the suction tool 12A as shown in FIG.
2A is placed at a predetermined position. Next, the pickup head 8 is moved to the next use suction tool 12B and lowered, whereby the suction tool 12B is newly mounted on the lower surface of the pickup head 8.

【0020】次にピックアップヘッド8を再度ボール供
給部9上に移動させ、ここで上下動作を行わせることに
より、吸着ツール12Bの下面の所定範囲にはウェハ4
の分割区画[2]に対応した範囲に導電性ボール10が
吸着される。そして同様にウェハ4の分割区画[2]に
属する半導体素子4aの各電極に導電性ボール10が搭
載される。上記動作を吸着ツール12を交換しながら4
回反復することにより、ウェハ4の全半導体素子4aの
各電極に対して導電性ボール10を搭載することができ
る。
Next, the pick-up head 8 is moved again onto the ball supply section 9 and is moved up and down to thereby move the wafer 4 in a predetermined range on the lower surface of the suction tool 12B.
The conductive ball 10 is sucked in a range corresponding to the divided section [2]. Similarly, the conductive balls 10 are mounted on the respective electrodes of the semiconductor element 4a belonging to the division [2] of the wafer 4. The above operation is performed while replacing the suction tool 12.
By repeating the process twice, the conductive balls 10 can be mounted on each electrode of all the semiconductor elements 4a of the wafer 4.

【0021】上記搭載動作において搭載ヘッド7の往復
回数は4回のみでよく、従来の個片ごとに搭載を行う方
法と比較すれば往復回数は格段に少なくてすみ、したが
って導電性ボールの搭載効率を向上させることができ
る。また分割区画の大きさは従来実績からみて過大とな
らない妥当な範囲で設定されるため、搭載不良の少ない
安定した導電性ボールの搭載が確保される。すなわち、
従来方法では実現が困難であった、良好な搭載効率と安
定した搭載品質とを両立させることが可能となる。
In the above mounting operation, the number of reciprocations of the mounting head 7 only needs to be four times, and the number of reciprocations is much smaller than the conventional method of mounting the individual heads. Can be improved. In addition, since the size of the divided section is set within an appropriate range that does not become excessive in view of the conventional results, stable mounting of the conductive ball with less mounting failure is ensured. That is,
It is possible to achieve both good mounting efficiency and stable mounting quality, which were difficult to achieve with the conventional method.

【0022】また、導電性ボールが搭載される基板の例
として、本実施の形態では半導体素子が形成されたウェ
ハを示しているがこれに限定されるものではなく、例え
ば複数の電子部品が格子状に作り込まれた基板であって
もよい。この場合には、電子部品の電極に導電性ボール
が搭載される。さらに本実施の形態では、分割区画
[1],[2],[3],[4]を点対称形状に設定す
る例を示しているが、各分割区画はそれぞれ異る形状で
あってもよい。この場合には、各分割区画に応じて異な
った形状の吸着ツールが用いられる。
In this embodiment, a wafer on which semiconductor elements are formed is shown as an example of a substrate on which conductive balls are mounted. However, the present invention is not limited to this. The substrate may be formed in a shape. In this case, conductive balls are mounted on the electrodes of the electronic component. Further, in the present embodiment, an example is shown in which the divided sections [1], [2], [3], and [4] are set to point-symmetric shapes, but each divided section may have a different shape. Good. In this case, suction tools having different shapes are used depending on each divided section.

【0023】[0023]

【発明の効果】本発明によれば、導電性ボールの搭載エ
リアを複数区画に分割した分割区画に個別に対応した吸
着ツールによって各分割区画ごとに導電性ボールを一括
して搭載するようにしたので、複数の電子部品が不規則
に配列された基板に対しても効率良く安定して導電性ボ
ールを搭載することができる。
According to the present invention, the conductive balls are collectively mounted on each of the divided sections by the suction tools individually corresponding to the divided sections obtained by dividing the conductive ball mounting area into a plurality of sections. Therefore, the conductive balls can be efficiently and stably mounted on a substrate on which a plurality of electronic components are irregularly arranged.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態の導電性ボールの搭載装
置の斜視図
FIG. 1 is a perspective view of a conductive ball mounting device according to an embodiment of the present invention.

【図2】(a)本発明の一実施の形態の導電性ボールの
搭載装置のピックアップヘッドの断面図 (b)本発明の一実施の形態の導電性ボールの搭載装置
のピックアップヘッド下面の平面図
FIG. 2A is a cross-sectional view of a pickup head of a conductive ball mounting apparatus according to an embodiment of the present invention. FIG. 2B is a plan view of a lower surface of the pickup head of the conductive ball mounting apparatus of one embodiment of the present invention. Figure

【図3】(a)本発明の一実施の形態のウェハの平面図 (b)本発明の一実施の形態のウェハの部分平面図
(c)本発明の一実施の形態のウェハの平面図
3A is a plan view of a wafer according to an embodiment of the present invention. FIG. 3B is a partial plan view of a wafer according to an embodiment of the present invention. FIG.

【図4】本発明の一実施の形態の導電性ボールの搭載装
置の吸着ツール載置部の平面図
FIG. 4 is a plan view of a suction tool mounting portion of the conductive ball mounting device according to one embodiment of the present invention;

【図5】(a)本発明の一実施の形態の導電性ボールの
搭載方法の工程説明図 (b)本発明の一実施の形態の導電性ボールの搭載方法
の工程説明図 (c)本発明の一実施の形態の導電性ボールの搭載方法
の工程説明図 (d)本発明の一実施の形態の導電性ボールの搭載方法
の工程説明図 (e)本発明の一実施の形態の導電性ボールの搭載方法
の工程説明図
FIG. 5A is a process explanatory view of a conductive ball mounting method according to an embodiment of the present invention. FIG. 5B is a process explanatory view of a conductive ball mounting method according to an embodiment of the present invention. Process description diagram of a method for mounting a conductive ball according to an embodiment of the present invention (d) Process description diagram of a method for mounting a conductive ball according to an embodiment of the present invention (e) Conductivity of an embodiment of the present invention Explanatory drawing of the process of mounting the conductive ball

【符号の説明】[Explanation of symbols]

4 ウェハ 4a 半導体素子 4b 電極 8 ピックアップヘッド 10 導電性ボール 12,12A,12B,12C,12D 吸着ツール 12a 吸着孔 Reference Signs List 4 wafer 4a semiconductor element 4b electrode 8 pickup head 10 conductive ball 12, 12A, 12B, 12C, 12D suction tool 12a suction hole

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】基板に形成された複数の電子部品の電極に
吸着ツールによって導電性ボールを搭載する導電性ボー
ルの搭載装置であって、前記基板を複数区画に分割した
各分割区画に個別に対応した複数の吸着ツールと、これ
らの吸着ツールの吸着面に前記電子部品の配列に対応し
て形成され前記電極に対応する位置に導電性ボールを真
空吸着する吸着孔が設けられた吸着部とを備えたことを
特徴とする導電性ボールの吸着装置。
1. A conductive ball mounting apparatus for mounting conductive balls on electrodes of a plurality of electronic components formed on a substrate by means of a suction tool, wherein the substrate is divided into a plurality of divided sections. A plurality of suction tools corresponding to the suction tool, and a suction portion formed on the suction surface of these suction tools corresponding to the arrangement of the electronic components and provided with suction holes for vacuum-sucking conductive balls at positions corresponding to the electrodes; A conductive ball suction device comprising:
【請求項2】基板に形成された複数の電子部品の電極に
吸着ツールによって導電性ボールを搭載する導電性ボー
ルの搭載方法であって、前記電極に対応する位置に導電
性ボールを真空吸着する吸着孔が設けられた吸着部が前
記電子部品の配列に対応して形成された吸着ツールを前
記基板を複数区画に分割した各分割区画に個別に対応さ
せて複数準備し、導電性ボールを前記基板に搭載する際
には前記各分割区画に対応した吸着ツールによって各分
割区画ごとに導電性ボールを一括して搭載することを特
徴とする導電性ボールの搭載方法。
2. A method for mounting conductive balls on electrodes of a plurality of electronic components formed on a substrate by means of a suction tool, wherein the conductive balls are vacuum-sucked at positions corresponding to the electrodes. A plurality of suction tools provided with suction holes provided corresponding to the arrangement of the electronic components are prepared by individually corresponding to each of the divided sections obtained by dividing the substrate into a plurality of sections. A method of mounting conductive balls, wherein when mounting on a substrate, conductive balls are collectively mounted on each of the divided sections by a suction tool corresponding to each of the divided sections.
JP06977399A 1999-03-16 1999-03-16 Apparatus and method for mounting conductive ball Expired - Fee Related JP3565079B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP06977399A JP3565079B2 (en) 1999-03-16 1999-03-16 Apparatus and method for mounting conductive ball

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP06977399A JP3565079B2 (en) 1999-03-16 1999-03-16 Apparatus and method for mounting conductive ball

Publications (2)

Publication Number Publication Date
JP2000269258A true JP2000269258A (en) 2000-09-29
JP3565079B2 JP3565079B2 (en) 2004-09-15

Family

ID=13412455

Family Applications (1)

Application Number Title Priority Date Filing Date
JP06977399A Expired - Fee Related JP3565079B2 (en) 1999-03-16 1999-03-16 Apparatus and method for mounting conductive ball

Country Status (1)

Country Link
JP (1) JP3565079B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008168413A (en) * 2007-01-15 2008-07-24 Lintec Corp Holding device and holding method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008168413A (en) * 2007-01-15 2008-07-24 Lintec Corp Holding device and holding method

Also Published As

Publication number Publication date
JP3565079B2 (en) 2004-09-15

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