JP2000260922A - Method of manufacturing lead frame for semiconductor device - Google Patents

Method of manufacturing lead frame for semiconductor device

Info

Publication number
JP2000260922A
JP2000260922A JP2000105396A JP2000105396A JP2000260922A JP 2000260922 A JP2000260922 A JP 2000260922A JP 2000105396 A JP2000105396 A JP 2000105396A JP 2000105396 A JP2000105396 A JP 2000105396A JP 2000260922 A JP2000260922 A JP 2000260922A
Authority
JP
Japan
Prior art keywords
lead frame
adhesive
heating
temperature
cooling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000105396A
Other languages
Japanese (ja)
Other versions
JP3399439B2 (en
Inventor
Yasuharu Kameyama
康晴 亀山
Tatsuya Otaka
達也 大高
Takashi Suzumura
隆志 鈴村
Takumi Sato
佐藤  巧
Shigeo Hagitani
重男 萩谷
Shigeji Takahagi
茂治 高萩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP30922893A external-priority patent/JP3077483B2/en
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP2000105396A priority Critical patent/JP3399439B2/en
Publication of JP2000260922A publication Critical patent/JP2000260922A/en
Application granted granted Critical
Publication of JP3399439B2 publication Critical patent/JP3399439B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To reduce warpage and undulation of a lead frame by using a thermoplastic adhesive as an adhesive used for forming a multilayer structure. SOLUTION: The side of a heat spreader 3 of the completed product of a lead frame 10 with a heat sink is set onto a heating plate 8 for reducing warpage and is heated, so that the entire lead frame 1 becomes flat at a temperature at which a thermoplastic adhesive becomes soft. Then, when the lead frame 1 becomes flat by heating, heating is stopped, the lead frame 1 is moved onto a cooling plate 9 for reducing warpage from the heating plate 8 for reducing the warpage, thus cooling the side of the heat spreader 3. A heat treatment is conducted so that the amount of thermal expansion of each member becomes equal at junction temperature where the adhesive becomes hard.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は多層構造をもつ半導体装
置用リードフレームの製造方法に係り、特に放熱板付リ
ードフレームの反りやうねりの低減に好適な方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a lead frame for a semiconductor device having a multilayer structure, and more particularly to a method suitable for reducing warpage and undulation of a lead frame with a heat sink.

【0002】[0002]

【従来の技術】一般に多層構造の半導体装置用リードフ
レームを製造する場合、信号層であるリードフレームに
電源層やグランド層(以下、単に電源層という)を積層
接合するか、あるいは信号層に放熱板を積層接合するな
どの構造をとる。これら信号層と電源層、あるいは信号
層と放熱板の接合に絶縁材料、例えばポリイミドフィル
ムの両面に接着剤を塗布したものを用いている。
2. Description of the Related Art In general, when manufacturing a lead frame for a semiconductor device having a multilayer structure, a power supply layer or a ground layer (hereinafter simply referred to as a power supply layer) is laminated and joined to a lead frame as a signal layer, or heat is radiated to the signal layer. A structure such as stacking and joining boards is adopted. An insulating material such as a polyimide film coated with an adhesive on both sides is used for joining the signal layer and the power supply layer or the signal layer and the heat sink.

【0003】図3に放熱板付リードフレームの一例を示
した。部材構成は信号層であるリードフレーム1、放熱
板であるヒートスプレッダ3、リードフレーム1とヒー
トスプレッダ3を接合する両面接着剤付フィルム2であ
る。放熱板付リードフレーム10の組立は、通常、リー
ドフレーム1に両面接着剤付フィルム2を貼り付けた
後、ヒートスプレッダ3を貼り付けて完成する(a〜
d)。
FIG. 3 shows an example of a lead frame with a heat sink. The components are a lead frame 1 as a signal layer, a heat spreader 3 as a heat sink, and a film 2 with a double-sided adhesive for joining the lead frame 1 and the heat spreader 3. The assembly of the lead frame 10 with the heat sink is usually completed by attaching the film 2 with the double-sided adhesive to the lead frame 1 and then attaching the heat spreader 3 (a to
d).

【0004】図4に示すように、フィルム2の両面に付
けた接着剤2aは、素子4とボンディングワイヤ5で接
続されるリードフレーム1のワイヤボンディング部1a
の直下にあるため、200〜250℃という高温のワイ
ヤボンディング温度において接着剤が軟化しないような
特性が要求される。このような要求を満たす従来の接着
剤には熱硬化性と熱可塑性がある。
[0004] As shown in FIG. 4, an adhesive 2 a applied to both surfaces of a film 2 is applied to a wire bonding portion 1 a of a lead frame 1 connected to an element 4 and a bonding wire 5.
Is required so that the adhesive is not softened at a high wire bonding temperature of 200 to 250 ° C. Conventional adhesives satisfying such requirements include thermosetting and thermoplastic.

【0005】熱硬化性接着剤は接着温度が200℃以下
で、その後の硬化処理時に200〜250℃に加熱する
ものが多い。一方、熱可塑性接着剤は硬化処理のいらな
い接着剤であるが、接着温度は熱硬化性接着剤より高い
ものが多く、通常300℃以上である。
[0005] Many thermosetting adhesives have an adhesive temperature of 200 ° C or lower, and are heated to 200 to 250 ° C during the subsequent curing treatment. On the other hand, a thermoplastic adhesive is an adhesive that does not require a curing treatment, but the bonding temperature is often higher than that of a thermosetting adhesive, and is usually 300 ° C. or higher.

【0006】これらの接着剤を用いる場合、信号層と電
源層、あるいは信号層と放熱板の接合時に、これら各層
または放熱板を構成する各部材の加熱が必要となる。図
2に、この加熱を必要とする放熱板付リードフレームの
貼り合わせ工程例を示す。リードフレーム1に両面接着
剤付フィルム2を貼り付けて貼付用加熱プレート6上に
セットし、その上にヒートスプレッダ3を乗せて、加熱
パンチ7との間に挟み付け、各部材を加熱する
((a)、(b))。各部材は加熱されると熱膨張し接
着温度に達すると接合される。この時点までは各部材と
も拘束されていないので、膨張係数や、形状が異なる材
料でも反りやうねりのない平坦な状態にある。
When these adhesives are used, it is necessary to heat these layers or the members constituting the heat sink when the signal layer and the power supply layer or the signal layer and the heat sink are joined. FIG. 2 shows an example of a bonding process of a lead frame with a radiator plate that requires this heating. The film 2 with the double-sided adhesive is attached to the lead frame 1 and set on the heating plate 6 for attachment, the heat spreader 3 is placed thereon, sandwiched between the heating punch 7, and each member is heated (( a), (b)). Each member is thermally expanded when heated and joined when the bonding temperature is reached. Up to this point, since each member is not restrained, even materials having different expansion coefficients and shapes are in a flat state without warpage or undulation.

【0007】加熱パンチ7を引き離して加熱を停止する
と、温度低下にともない収縮し始めるが、今度は接合部
において両者が拘束されることになり、その結果、各部
材の収縮量の差によってリードフレームに反りやうねり
が生ずる完成品ができてしまう((c)、(d))。こ
の反りやうねり量は接合される時の温度が高くなるにし
たがって大きくなる(c、d)。
[0007] When the heating punch 7 is separated to stop heating, the heating punch 7 begins to shrink as the temperature drops, but this time, both are restrained at the joint, and as a result, a difference in the shrinkage amount of each member causes the lead frame to shrink. A finished product in which warpage or undulation occurs is produced ((c), (d)). The amount of warpage or undulation increases as the temperature at the time of joining increases (c, d).

【0008】通常、リードフレームの反りは半導体の組
立装置の関係上0.5mm以下にする必要がある。従って
従来の多層構造のリードフレームは、反りやうねり量を
小さくするため接合温度の低い熱硬化性接着剤を用いる
場合が多かった。
Usually, the warpage of the lead frame needs to be 0.5 mm or less due to a semiconductor assembling apparatus. Therefore, a conventional multi-layered lead frame often uses a thermosetting adhesive having a low joining temperature in order to reduce the amount of warpage or undulation.

【0009】[0009]

【発明が解決しようとする課題】上述したように従来の
多層構造のリードフレームには熱硬化性接着剤を用いて
きたが、この接着剤は硬化処理時にガスを発生し、リー
ドフレームのAgめっき面に吸着してこれを汚染するた
め、ワイヤボンディング不良が発生するという問題があ
った。
As described above, a thermosetting adhesive has been used for a conventional multi-layered lead frame. However, this adhesive generates a gas during the curing process and causes the Ag plating of the lead frame. There is a problem that wire bonding failure occurs because it is adsorbed on the surface and contaminates it.

【0010】そのため、リードフレーム洗浄工程が必要
となり、製造コストのアップという問題が生じていた。
また接着剤の保管も、硬化が進まないように冷蔵庫等の
低温で保管する必要があり取り扱いが不便であるという
問題もあった。
[0010] Therefore, a lead frame cleaning step is required, and there has been a problem that the manufacturing cost is increased.
Also, the adhesive must be stored at a low temperature in a refrigerator or the like in order to prevent the curing from proceeding, and there is a problem that handling is inconvenient.

【0011】これらの理由から、多層構造のリードフレ
ームに硬化処理、洗浄処理を必要としない熱可塑性接着
剤を適用することが望まれている。熱可塑性接着剤は硬
化処理の必要がないため、リードフレーム汚染の心配は
なく、製造コストの面で熱硬化性接着剤よりも有利であ
る。また、熱可塑性のため放置しておいても硬化するこ
とがなく、保管の点でも便利である。
For these reasons, it is desired to apply a thermoplastic adhesive which does not require a curing treatment or a cleaning treatment to a lead frame having a multilayer structure. Since the thermoplastic adhesive does not require a curing treatment, there is no fear of lead frame contamination, and it is more advantageous than the thermosetting adhesive in terms of manufacturing cost. In addition, since it is thermoplastic, it does not harden even when left to stand, which is convenient in terms of storage.

【0012】しかし、熱可塑性接着剤は接着温度が高
く、通常300℃以上もあるため、リードフレームの反
りやうねりが非常に大きいという問題があり、反りやう
ねりを半導体の組立装置の関係上要求される規定値
(0.5mm)以下にすることが困難であった。
However, since the thermoplastic adhesive has a high bonding temperature and usually has a temperature of 300 ° C. or more, there is a problem that the warpage or undulation of the lead frame is very large. It is difficult to reduce the value to a specified value (0.5 mm) or less.

【0013】本発明の目的は、熱硬化性に比して優れた
特性をもつ熱可塑性接着剤を用いながら、前記した従来
技術の欠点を解消し、反りやうねりを大幅に低減させる
ことが可能な半導体装置用リードフレームの製造方法を
提供することにある。
An object of the present invention is to solve the above-mentioned drawbacks of the prior art and to greatly reduce warpage and swell while using a thermoplastic adhesive having characteristics superior to thermosetting properties. Another object of the present invention is to provide a method for manufacturing a lead frame for a semiconductor device.

【0014】[0014]

【課題を解決するための手段】本発明の半導体装置用リ
ードフレームの製造方法は、リードフレームに膨張係数
が異なる放熱板等の積層部材を接着剤により貼り付けた
多層構造の半導体装置用リードフレームの製造方法にお
いて、上記接着剤に熱可塑性接着剤を用い、この熱可塑
性接着剤をその接合温度で可塑化して積層部材をリード
フレームに貼り付け、貼り付け後、再度加熱処理してリ
ードフレームと積層部材との熱収縮量の差により変形し
たリードフレームを平坦化し、次いで冷却処理して熱可
塑性接着剤の接合温度でのリードフレームと積層部材の
熱膨張量を等しく調整するようにしたものである。
A method of manufacturing a lead frame for a semiconductor device according to the present invention is directed to a lead frame for a semiconductor device having a multilayer structure in which laminated members such as heat sinks having different expansion coefficients are adhered to a lead frame by an adhesive. In the manufacturing method, a thermoplastic adhesive is used as the adhesive, the thermoplastic adhesive is plasticized at the joining temperature, and the laminated member is attached to the lead frame. The lead frame deformed due to the difference in heat shrinkage with the laminated member is flattened, and then cooled to adjust the amount of thermal expansion of the lead frame and the laminated member at the joining temperature of the thermoplastic adhesive equally. is there.

【0015】この場合において、上記貼り付け後の加熱
処理を積層部材を加熱することによって行うようにした
り、上記冷却処理を積層部材を冷却することによって行
うようにしたりすることが好ましい。
In this case, it is preferable that the heat treatment after the attachment is performed by heating the laminated member, or that the cooling treatment is performed by cooling the laminated member.

【0016】さらに、上記積層部材の加熱温度は熱可塑
性接着剤が軟化する温度以上、冷却温度は軟化する温度
より低いことが好ましい。また、加熱時間は上記積層部
材全体が平坦化するまで行ない、冷却時間は上記積層部
材全体が熱可塑性接着剤の軟化する温度以下になるまで
行なうことが好ましい。なぜなら、この処理条件を外れ
ると反りやうねりを平坦化することができないからであ
る。具体的な好ましい条件としては、上記積層部材の加
熱温度は熱可塑性接着剤が軟化する200〜400℃、
加熱時間は1〜2min であり、上記積層部材の冷却温度
が0〜40℃、冷却時間は10〜60sec である。
Further, the heating temperature of the laminated member is preferably higher than the temperature at which the thermoplastic adhesive softens, and the cooling temperature is preferably lower than the softening temperature. It is preferable that the heating is performed until the entire laminated member is flattened, and the cooling time is performed until the temperature of the entire laminated member becomes equal to or lower than the temperature at which the thermoplastic adhesive softens. This is because, if the processing conditions are not satisfied, the warpage and undulation cannot be flattened. As specific preferable conditions, the heating temperature of the laminated member is 200 to 400 ° C. at which the thermoplastic adhesive softens,
The heating time is 1 to 2 minutes, the cooling temperature of the laminated member is 0 to 40 ° C, and the cooling time is 10 to 60 seconds.

【0017】[0017]

【作用】熱可塑性接着剤は、接着温度が高く通常300
℃以上であるため、この熱可塑性接着剤を用いて積層部
材をリードフレームに貼り付けると、その後の温度低下
にともなうリードフレームと積層部材との熱収縮量の差
により、リードフレームの反りやうねりが非常に大きく
なる。
[Function] A thermoplastic adhesive has a high bonding temperature and is usually 300.
° C or more, when the laminate is attached to the lead frame using this thermoplastic adhesive, the difference in the amount of heat shrinkage between the lead frame and the laminate due to a subsequent temperature drop causes the lead frame to warp or undulate. Becomes very large.

【0018】そこで、貼り付け後、再度熱可塑性接着剤
が軟化する温度で加熱処理してリードフレームの反りや
うねりを平坦化する。このとき平坦化するのは、接着剤
が軟化するため接着剤で拘束されていた各部材が解放さ
れるからである。次いで熱可塑性接着剤が軟化する温度
より低い温度で冷却する。この冷却処理では、熱膨張率
の大きい部材(Y1と呼ぶ)を他の部材よりも速く冷却
することが重要である。熱膨張率の小さい部材(Y2と
呼ぶ)が接着剤の硬化する温度(t2℃と仮定する)に
なった時点で、Y1はさらに低い温度(t1℃と仮定す
る)になっていることが必要である。このときt1での
Y1の熱膨張量とt2でのY2の熱膨張量とが等しくな
る温度がt1である。さらに冷却していくと、Y1とY
2の収縮量は同じなので冷却後は熱歪みによるリードフ
レームの反りやうねりがなくなる。
Therefore, after pasting, a heat treatment is again performed at a temperature at which the thermoplastic adhesive softens to flatten the warpage and undulation of the lead frame. At this time, the flattening is performed because the members softened by the adhesive are released because the adhesive is softened. It is then cooled at a temperature below the temperature at which the thermoplastic adhesive softens. In this cooling process, it is important that a member having a large coefficient of thermal expansion (referred to as Y1) be cooled faster than other members. When a member having a small coefficient of thermal expansion (referred to as Y2) reaches a temperature at which the adhesive cures (assumed to be t2 ° C.), Y1 needs to be at a lower temperature (assumed to be t1 ° C.). It is. At this time, the temperature at which the amount of thermal expansion of Y1 at t1 equals the amount of thermal expansion of Y2 at t2 is t1. As it cools further, Y1 and Y
Since the contraction amount of the lead frame 2 is the same, warping and undulation of the lead frame due to thermal distortion after cooling is eliminated.

【0019】このように接着剤に熱可塑性接着剤を使っ
ても、リードフレームに加熱・冷却処理を施すことによ
り、多層構造リードフレームの反りあるいはうねりを大
幅に低減させることができる。したがって、熱硬化性接
着剤を用いた場合のように、硬化処理時に発生するガス
によりリードフレームが汚染されてワイヤボンディング
不良が発生したり、リードフレーム洗浄工程が必要とな
ったり、製造コストがアップするということがなくな
る。また冷蔵庫等の低温で保管する必要がなく接着剤の
取り扱いも便利になる。
As described above, even if a thermoplastic adhesive is used as the adhesive, warping or undulation of the multilayer lead frame can be greatly reduced by subjecting the lead frame to heating and cooling. Therefore, as in the case of using a thermosetting adhesive, the gas generated during the curing process contaminates the lead frame, causing wire bonding failure, requiring a lead frame cleaning step, and increasing the manufacturing cost. You will not have to. In addition, it is not necessary to store the adhesive at a low temperature in a refrigerator or the like, and the handling of the adhesive becomes convenient.

【0020】[0020]

【実施例】以下、本発明の実施例を図面を用いて説明す
る。両面接着剤付フィルムを用いて放熱板付リードフレ
ームの組立をする工程は、図2に示した従来の方法と同
様である。本実施例では、接着剤として、熱硬化性接着
剤ではなく、これよりも接合温度の高い熱可塑性接着剤
を用いる。その結果、貼り合わせ完成品は、リードフレ
ームに大きな反りやうねりが発生するが、このリードフ
レームの反りやうねりを、図1に示すように、多層リー
ドフレーム反り低減工程により低減する。
Embodiments of the present invention will be described below with reference to the drawings. The process of assembling a lead frame with a heat sink using a film with a double-sided adhesive is the same as the conventional method shown in FIG. In this embodiment, a thermoplastic adhesive having a higher bonding temperature than the thermosetting adhesive is used as the adhesive. As a result, in the finished bonded product, a large warpage or undulation occurs in the lead frame. However, as shown in FIG. 1, the warpage or undulation of the lead frame is reduced by a multilayer lead frame warpage reduction step.

【0021】まず、放熱板付リードフレーム10の完成
品のヒートスプレッダ3側を反り低減用加熱プレート8
上にセットし、リードフレーム1全体が平坦になるまで
加熱処理する((a)〜(c))。このときの加熱温度
は熱可塑性接着剤が軟化する温度で通常200〜400
℃、加熱時間は1〜2min である。
First, the heat spreader 3 side of the finished product of the lead frame 10 with a heat sink is heated by a heating plate 8 for reducing warpage.
The lead frame 1 is set on the upper side and heat-treated until the entire lead frame 1 becomes flat ((a) to (c)). The heating temperature at this time is a temperature at which the thermoplastic adhesive softens, and is usually 200 to 400.
C. and the heating time is 1-2 min.

【0022】次に、加熱によりリードフレーム1が平坦
になった時点で加熱を止め、すぐに反り低減用加熱プレ
ート8から反り低減用冷却プレート9上に移して、ヒー
トスプレッダ3を冷却処理する。このときの冷却温度は
通常0〜40℃程度、冷却時間は10〜60sec であ
る。この冷却処理は接着剤が硬くなる接合温度での各部
材の熱膨張量を等しくするために行うもので、これによ
り前記理由で発生するリードフレームの反りやうねりを
低減させることができる((d)〜(e))。
Next, when the lead frame 1 is flattened by heating, the heating is stopped, and the heat spreader 3 is cooled by immediately moving from the warp reducing heating plate 8 onto the warp reducing cooling plate 9. The cooling temperature at this time is usually about 0 to 40 ° C., and the cooling time is 10 to 60 sec. This cooling treatment is performed in order to equalize the thermal expansion of each member at the joining temperature at which the adhesive becomes hard, and thereby it is possible to reduce the warpage and undulation of the lead frame generated for the above-mentioned reason ((d )-(E)).

【0023】ここに、具体的な反りの低減効果を示す。
リードフレーム材質が42Ni−Fe合金、ヒートスプ
レッダ材質が無酸素銅、熱可塑性接着剤がポリエーテル
アミドイミドからなる接着剤例えば日立化成(株)製の
HM−1(商品名)の場合、各部材間の膨張係数が大き
く異なるため通常の組立を行うと、リードフレームの反
りが3mm以上生じるが、加熱処理を350〜400℃、
60sec 行い冷却処理を室温である20〜30℃、60
sec 行うとリードフレームの反りが規定値の0.5mm以
下に低減できる。
Here, a specific warp reduction effect will be described.
When the lead frame material is 42Ni-Fe alloy, the heat spreader material is oxygen-free copper, and the thermoplastic adhesive is an adhesive composed of polyetheramideimide, for example, HM-1 (trade name) manufactured by Hitachi Chemical Co., Ltd. Since the expansion coefficient of the lead frame is greatly different, warping of the lead frame is caused by 3 mm or more when normal assembly is performed.
Cooling treatment is performed at room temperature of 20 to 30 ° C. for 60 seconds.
When sec is performed, the warpage of the lead frame can be reduced to a specified value of 0.5 mm or less.

【0024】工程的には、熱可塑性接着剤の場合、反り
低減処理の加熱に1〜2min 、冷却に10〜60sec と
両工程合せて3min あればよい。熱硬化性接着剤の場合
には、硬化処理だけで2〜20時間かかり、さらにリー
ドフレーム洗浄も行う必要があることを考えると、熱可
塑性接着剤のほうが工程的に単純で、しかも製造コスト
も下げることができる。
In the case of a thermoplastic adhesive, it is sufficient that heating for the warpage reduction treatment is 1-2 minutes, and cooling is 10 to 60 seconds, which is 3 minutes in both steps. In the case of a thermosetting adhesive, it takes 2 to 20 hours to perform only the curing process, and furthermore, it is necessary to perform lead frame cleaning, so that the thermoplastic adhesive is simpler in process and has a lower manufacturing cost. Can be lowered.

【0025】なお、前記実施例においては、リードフレ
ームとヒートスプレッダの接合に両面接着剤付フィルム
を用いた場合について説明しているが、それ以外にも、
加熱すると流動する熱可塑性の物質を用いるようにして
もよく、例えば、熱可塑性接着剤のみをフィルム状に成
形したものを用いることができる。また、リードフレー
ムに積層する部材はヒートスプレッダに限定されず、既
述した電源層、グランド層でもよく、さらに2層に限ら
ず、3層以上のものにも適用できる。
In the above embodiment, the case where a film with a double-sided adhesive is used for joining the lead frame and the heat spreader is described.
A thermoplastic substance which flows when heated may be used. For example, a thermoplastic adhesive alone formed into a film may be used. Further, the member to be laminated on the lead frame is not limited to the heat spreader, and may be the power supply layer or the ground layer described above, and is not limited to two layers but may be applied to three or more layers.

【0026】また、前記実施例においては、プレート上
にヒートスプレッダをセットするようにして、加熱・冷
却を下側から行っているが、横側や上側から行ってもよ
い。また、前記実施例においては、加熱処理方法に加熱
プレートを用いているが、これ以外の加熱方法としてヒ
ーター、ホットエア、高周波加熱等一般的に用いられて
いる加熱方法を採用することができる。また、冷却処理
方法では冷却プレートにアルミニウム等の金属板やセラ
ミックス板等を用いることができ、プレート以外の冷却
方法として空冷等一般的に用いられている冷却方法を採
用することができる。冷却温度は加熱温度以下であれば
0〜40℃以外でもよい。
In the above embodiment, the heating and cooling are performed from the lower side by setting the heat spreader on the plate, but may be performed from the side or the upper side. In the above-described embodiment, a heating plate is used for the heat treatment method. However, other heating methods such as a heater, hot air, and high-frequency heating can be used. In the cooling method, a metal plate such as aluminum, a ceramic plate, or the like can be used for the cooling plate, and a commonly used cooling method such as air cooling can be used as a cooling method other than the plate. The cooling temperature may be other than 0 to 40 ° C as long as it is lower than the heating temperature.

【0027】そして、前記実施例において、加熱・冷却
処理するためのプレート等の装置を多層構造リードフレ
ームの組立装置に組み込むようにすれば、熱可塑性接着
剤を用いて反り等のない多層構造リードフレームを大量
に生産することができる。
In the above embodiment, if a device such as a plate for heating / cooling treatment is incorporated in an assembling device for a multilayer lead frame, a multilayer lead having no warpage using a thermoplastic adhesive is used. Frames can be produced in large quantities.

【0028】[0028]

【発明の効果】(1)請求項1に記載の半導体装置用リ
ードフレームの製造方法によれば、熱可塑性接着剤を用
いながら、平坦化のための加熱処理と冷却処理を施すと
いう簡単な工程で、反りあるいはうねりを有効に低減さ
せることができ、熱硬化性接着剤を用いる場合に比して
製造コストも下げることができる。
(1) According to the method for manufacturing a lead frame for a semiconductor device according to the first aspect, a simple process of performing a heating process and a cooling process for planarization while using a thermoplastic adhesive. Thus, warpage or undulation can be effectively reduced, and the manufacturing cost can be reduced as compared with the case where a thermosetting adhesive is used.

【0029】(2)請求項2に記載の半導体装置用リー
ドフレームの製造方法によれば、加熱処理を、リードフ
レームよりも形状や構造の簡単で熱伝導性のよい積層部
材から行うようにしたので、処理作業が容易である。
(2) According to the method of manufacturing a lead frame for a semiconductor device according to the second aspect, the heat treatment is performed from a laminated member having a simpler shape and structure than the lead frame and having better heat conductivity. Therefore, the processing operation is easy.

【0030】(3)請求項3に記載の半導体装置用リー
ドフレームの製造方法によれば、冷却処理を、リードフ
レームよりも形状や構造の簡単で熱伝導性のよい積層部
材から行うようにしたので、処理作業が容易である。
(3) According to the method of manufacturing a lead frame for a semiconductor device according to the third aspect, the cooling process is performed from a laminated member having a simpler shape and structure than the lead frame and having better heat conductivity. Therefore, the processing operation is easy.

【0031】(4)請求項4に記載の半導体装置用リー
ドフレームの製造方法によれば、加熱・冷却を所定条件
下で行うようにしたので、熱硬化性接着剤を用いた場合
に比して、反りやうねりを大幅に低減でき、しかも短時
間で各部材を接合することができる。
(4) According to the method of manufacturing a lead frame for a semiconductor device according to the fourth aspect, since heating and cooling are performed under predetermined conditions, compared with the case where a thermosetting adhesive is used. Thus, warpage and undulation can be significantly reduced, and the members can be joined in a short time.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の半導体装置用リードフレームの製造方
法の実施例を示すリードフレームの反り低減工程図。
FIG. 1 is a view showing a process of reducing warpage of a lead frame according to an embodiment of a method of manufacturing a lead frame for a semiconductor device of the present invention.

【図2】従来の半導体装置用リードフレームの放熱板貼
り付け工程図。
FIG. 2 is a process diagram of attaching a heat sink to a conventional lead frame for a semiconductor device.

【図3】従来の半導体装置用リードフレームの製造工程
図。
FIG. 3 is a manufacturing process diagram of a conventional lead frame for a semiconductor device.

【図4】従来のリードフレームの断面構造図。FIG. 4 is a sectional structural view of a conventional lead frame.

【符号の説明】[Explanation of symbols]

1 リードフレーム 2 両面接着剤付フィルム 3 ヒートスプレッダ(放熱板) 8 反り低減用加熱プレート 9 反り低減用冷却プレート 10 放熱板付リードフレーム DESCRIPTION OF SYMBOLS 1 Lead frame 2 Film with double-sided adhesive 3 Heat spreader (heat radiating plate) 8 Heating plate for reducing warping 9 Cooling plate for reducing warping 10 Lead frame with heat radiating plate

───────────────────────────────────────────────────── フロントページの続き (72)発明者 佐藤 巧 茨城県土浦市木田余町3550番地 日立電線 株式会社システムマテリアル研究所内 (72)発明者 萩谷 重男 茨城県土浦市木田余町3550番地 日立電線 株式会社システムマテリアル研究所内 (72)発明者 高萩 茂治 茨城県土浦市木田余町3550番地 日立電線 株式会社システムマテリアル研究所内 ──────────────────────────────────────────────────の Continuing from the front page (72) Inventor Takumi Sato 3550 Kida Yomachi, Tsuchiura City, Ibaraki Prefecture Within Hitachi Cable System Materials Laboratory (72) Inventor Shigeo Hagiya 3550 Kida Yomachi, Tsuchiura City, Ibaraki Prefecture Hitachi Cable, Ltd. (72) Inventor Shigeharu Takahagi 3550 Kida Yomachi, Tsuchiura City, Ibaraki Prefecture Hitachi Cable, Ltd.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】リードフレームに、これに積層する放熱板
等の積層部材を接着剤により貼り付けた多層構造の半導
体装置用リードフレームの製造方法において、上記接着
剤に熱可塑性接着剤を用いてリードフレームに積層部材
を貼り付け、貼り付け後、再度加熱処理してリードフレ
ームと積層部材との熱収縮量の差により変形したリード
フレームを平坦化し、次いで冷却処理して熱可塑性接着
剤の接合温度でのリードフレームと積層部材の熱膨張量
を等しくするようにしたことを特徴とする半導体装置用
リードフレームの製造方法。
1. A method of manufacturing a lead frame for a semiconductor device having a multilayer structure in which a laminated member such as a heat radiating plate to be laminated on the lead frame is adhered to the lead frame by using an adhesive. The laminated member is attached to the lead frame, and after the attachment, heat treatment is again performed to flatten the lead frame deformed due to the difference in the amount of heat shrinkage between the lead frame and the laminated member, and then cooled to join the thermoplastic adhesive. A method for manufacturing a lead frame for a semiconductor device, wherein a thermal expansion amount of a lead frame and a laminated member at a temperature are made equal.
【請求項2】上記貼り付け後の加熱処理を積層部材を加
熱することによって行うようにした請求項1に記載の半
導体装置用リードフレームの製造方法。
2. The method of manufacturing a lead frame for a semiconductor device according to claim 1, wherein the heat treatment after the bonding is performed by heating the laminated member.
【請求項3】上記冷却処理を積層部材を冷却することに
よって行うようにした請求項1または2に記載の半導体
装置用リードフレームの製造方法。
3. The method of manufacturing a lead frame for a semiconductor device according to claim 1, wherein the cooling process is performed by cooling the laminated member.
【請求項4】上記積層部材の加熱温度が熱可塑性接着剤
が軟化する200〜400℃、加熱時間は1〜2min で
あり、上記積層部材の冷却温度が0〜40℃、冷却時間
は10〜60sec である請求項1ないし3のいずれかに
記載の半導体装置用リードフレームの製造方法。
4. The heating temperature of the laminated member is 200 to 400 ° C. at which the thermoplastic adhesive is softened, the heating time is 1 to 2 min, the cooling temperature of the laminated member is 0 to 40 ° C., and the cooling time is 10 to 10 minutes. 4. The method of manufacturing a lead frame for a semiconductor device according to claim 1, wherein the time is 60 seconds.
JP2000105396A 1993-12-09 2000-04-03 Method for manufacturing lead frame for semiconductor device Expired - Lifetime JP3399439B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000105396A JP3399439B2 (en) 1993-12-09 2000-04-03 Method for manufacturing lead frame for semiconductor device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP30922893A JP3077483B2 (en) 1993-12-09 1993-12-09 Method for manufacturing lead frame for semiconductor device
JP2000105396A JP3399439B2 (en) 1993-12-09 2000-04-03 Method for manufacturing lead frame for semiconductor device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
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Publication Number Publication Date
JP2000260922A true JP2000260922A (en) 2000-09-22
JP3399439B2 JP3399439B2 (en) 2003-04-21

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ID=26565881

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Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6702173B2 (en) * 2001-09-26 2004-03-09 Minami Co., Ltd. Reflow apparatus in continuous printing and mounting apparatus for film-like printing body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6702173B2 (en) * 2001-09-26 2004-03-09 Minami Co., Ltd. Reflow apparatus in continuous printing and mounting apparatus for film-like printing body

Also Published As

Publication number Publication date
JP3399439B2 (en) 2003-04-21

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