JP2000221145A - Apparatus for applying flaw detect solution to ceramics substrate - Google Patents

Apparatus for applying flaw detect solution to ceramics substrate

Info

Publication number
JP2000221145A
JP2000221145A JP11024430A JP2443099A JP2000221145A JP 2000221145 A JP2000221145 A JP 2000221145A JP 11024430 A JP11024430 A JP 11024430A JP 2443099 A JP2443099 A JP 2443099A JP 2000221145 A JP2000221145 A JP 2000221145A
Authority
JP
Japan
Prior art keywords
substrate
flaw detection
ceramic substrate
detection liquid
roller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11024430A
Other languages
Japanese (ja)
Other versions
JP3652155B2 (en
Inventor
Koki Kurachi
幸記 藏治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP02443099A priority Critical patent/JP3652155B2/en
Publication of JP2000221145A publication Critical patent/JP2000221145A/en
Application granted granted Critical
Publication of JP3652155B2 publication Critical patent/JP3652155B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To efficiently and surely apply a flaw detect solution in a short time and improve a detect accuracy for cracks, by letting the flaw detect solution applied to a ceramics substrate penetrate a crack by a porous roller, then washing off the unwanted flaw detect solution, and drying the substrate. SOLUTION: While a ceramics substrate 1 is transferred by a transfer roller 14, a flaw detect solution 2 is supplied by a circulation pump 16 from a flaw detect solution tank 15 to a spray nozzle 5, sprayed and applied from above and below the substrate 1. A pair of porous rollers 8 are pressed from above and below the substrate 1 to rub the flaw detect solution 2 into a crack of the substrate 1. Then water is sprayed at a cleaning part B by a spray nozzle 6 from above and below the substrate 1, thereby washing out the extra flaw detect solution 2. Moisture on the surface of the substrate 1 is squeezed out by a porous moisture-removing roller 9. At a drying part C, the water remaining on the surface of the substrate 1 is removed by a moisture-removing roller 10, and air is sprayed from above and below the substrate 1 to remove the moisture remaining in holes and on the surface of the substrate 1. Hot wind is sprayed from the nozzle of a dryer 11 to have the substrate dried.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、セラミックス基板
のクラック検査の為の、探傷液を塗布する装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for applying a test liquid for crack inspection of a ceramic substrate.

【0002】[0002]

【従来の技術】セラミックス基板のクラックは、目視検
査では検出しにくく検査精度を上げる為に、一般的に探
傷液を塗布してから検査を行う。この探傷液塗布の方法
は以下の通りである。
2. Description of the Related Art In general, cracks in a ceramic substrate are hardly detected by visual inspection, and inspection is generally performed after applying a flaw detection liquid in order to increase inspection accuracy. The method of applying the flaw detection liquid is as follows.

【0003】まず図7(a)に示すように、篭状のコン
テナー102に複数のセラミックス基板1を入れ、図7
(b)に示すように、このコンテナー102を探傷液2
が入った探傷液槽101に入れる。この状態でセラミッ
クス基板1の全体へ探傷液2が付くようにバラバラの状
態にし、5〜20分放置する。次に探傷液槽101から
コンテナー102を出し、セラミックス基板1をシャワ
ー水洗または水中へ浸し、軽く表面の探傷液2を洗い落
とし、乾燥室へコンテナー102ごと入れ、セラミック
ス基板1の表面乾燥を、6〜8時間、80〜90℃の雰
囲気で行う。
First, as shown in FIG. 7 (a), a plurality of ceramic substrates 1 are placed in a basket-shaped container 102, and FIG.
As shown in (b), this container 102 is
Into the flaw detection liquid tank 101 containing. In this state, the entire surface of the ceramic substrate 1 is scattered so that the flaw detection liquid 2 is applied, and the ceramic substrate 1 is left for 5 to 20 minutes. Next, the container 102 is taken out of the flaw detection liquid tank 101, the ceramic substrate 1 is washed with shower water or immersed in water, the flaw detection liquid 2 on the surface is lightly washed off, and the container 102 is put into a drying chamber together with the container. It is performed in an atmosphere at 80 to 90 ° C. for 8 hours.

【0004】また他の方法として、上記と同様にセラミ
ックス基板1を篭状のコンテナー102へ入れ、このコ
ンテナー102を、探傷液2を入れた密閉出来る容器に
入れ、この容器内へ、セラミックス基板1のクラックへ
探傷液2を浸透させる目的で不活性ガスを供給して加圧
し、1〜2分放置した後取り出し、前述の方法で、洗
浄、乾燥処理を行う。
As another method, the ceramic substrate 1 is placed in a basket-like container 102 in the same manner as described above, and the container 102 is placed in a sealable container containing the flaw detection liquid 2, and the ceramic substrate 1 is placed in the container. Then, an inert gas is supplied and pressurized for the purpose of permeating the flaw detection liquid 2 into the cracks, left for 1 to 2 minutes, taken out, and washed and dried by the methods described above.

【0005】このようにして探傷液を塗布したセラミッ
クス基板1は、図5(a)(b)に示すように、クラッ
ク19に探傷液2が浸透し、目視によって容易に検査を
行うことが出来る。
As shown in FIGS. 5 (a) and 5 (b), the flaw detection liquid 2 penetrates into the cracks 19 on the ceramic substrate 1 coated with the flaw detection liquid in this way, and can be easily inspected visually. .

【0006】[0006]

【発明が解決しようとする課題】ところが従来の方法で
は、セラミックス基板1のクラック19へ探傷液2を浸
透させる為に、図7(b)に示す探傷液2への浸漬時間
を長く置くか、または、同様の状態で密閉加圧する必要
があり、手間が掛かり非効率的であった。更に、その後
の洗浄、乾燥も長時間必要であるという問題があった。
However, in the conventional method, in order to allow the flaw detection liquid 2 to penetrate into the cracks 19 of the ceramic substrate 1, the immersion time in the flaw detection liquid 2 shown in FIG. Alternatively, it is necessary to perform hermetic pressurization in the same state, which is troublesome and inefficient. Further, there has been a problem that subsequent washing and drying are also required for a long time.

【0007】また、洗浄は人手により行う為、例えば図
5(a)に示すように、セラミックス基板1のクラック
19並びにその周囲に探傷液2の残留ムラが生じ、また
乾燥は図7(a)のコンテナー102に入れたまま乾燥
室で行う為、セラミックス基板1の重なりによる乾燥シ
ミがセラミックス基板1の表面に生じる。これらはいず
れも、クラック検査の検出精度低下の要因となってい
た。
In addition, since cleaning is performed manually, for example, as shown in FIG. 5A, cracks 19 of the ceramic substrate 1 and residual unevenness of the flaw detection liquid 2 are generated around the crack 19, and drying is performed as shown in FIG. Since the drying is performed in the drying chamber with the container 102 kept in the container 102, drying stains are generated on the surface of the ceramic substrate 1 due to the overlapping of the ceramic substrates 1. All of these have caused a decrease in the detection accuracy of the crack inspection.

【0008】[0008]

【課題を解決するための手段】本発明は、これらに鑑み
て行われたもので、セラミックス基板に塗布した探傷液
を、上下から押しあてた多孔性のローラーでクラックへ
浸透させるようにした探傷液塗布部と、不要な探傷液を
洗い落とす洗浄部と、乾燥部とからなり、これらを連続
的に備えて探傷液塗布装置を構成したことにより、短時
間で効率的に探傷液塗布処理が出来、また、探傷液のク
ラックへの浸透が確実で、洗浄ムラと重なりによる乾燥
シミを防止出来る為、クラック検査の検出精度を向上出
来るようにしたものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the foregoing, and has been made in consideration of the above circumstances, and has been made so that a flaw detection solution applied to a ceramic substrate is penetrated into cracks by a porous roller pressed from above and below. It consists of a liquid application section, a cleaning section for washing off unnecessary flaw detection liquid, and a drying section. The flaw detection liquid application device is constructed by continuously providing these, so that flaw detection liquid application processing can be performed efficiently in a short time. Further, the penetration of the flaw detection liquid into the cracks is ensured, and the drying spot due to the uneven cleaning and the overlap can be prevented, so that the detection accuracy of the crack inspection can be improved.

【0009】[0009]

【発明の実施の形態】以下に本発明の実施形態について
詳述する。
Embodiments of the present invention will be described below in detail.

【0010】図1に示すように、本発明の探傷液塗布装
置は、探傷液塗布部A、洗浄部B、乾燥部Cで構成され
ている。
As shown in FIG. 1, the flaw detection liquid application apparatus of the present invention comprises a flaw detection liquid application section A, a cleaning section B, and a drying section C.

【0011】探傷液塗布部Aは、図1に示す探傷液槽1
5から探傷液2を、循環ポンプ16によりスプレーノズ
ル5へ供給し、セラミックス基板1へ吹き付けた後、ロ
ーラー8で塗布するようになっている。探傷液塗布部A
の詳細を図2(a)に示すように、セラミックス基板1
を搬送ローラー14で矢印方向に搬送しながら、スプレ
ーノズル5よりセラミックス基板1の上下から探傷液2
を吹き付けて塗布する。次に図2(b)に示すように一
対のローラー8をセラミックス基板1の上下から押しあ
てて、探傷液2を擦り込む。
The flaw detection liquid application section A is a flaw detection liquid tank 1 shown in FIG.
From 5, the flaw detection liquid 2 is supplied to the spray nozzle 5 by the circulation pump 16, sprayed onto the ceramic substrate 1, and then applied by the roller 8. Flaw detection liquid application part A
As shown in FIG.
While the wafer is conveyed in the direction of the arrow by the conveyance roller 14, the flaw detection liquid 2 is sprayed from above and below the ceramic substrate 1 by the spray nozzle 5.
And apply. Next, as shown in FIG. 2B, a pair of rollers 8 are pressed from above and below the ceramic substrate 1 to rub the flaw detection liquid 2 thereon.

【0012】ここでローラー8は、多孔性の材質からな
り、例えば表1に示すスポンジローラーのような多孔性
樹脂が好適である。またローラー8の径D1は35mm
以下とし、セラミックス基板1の上下から押しあてる圧
力は、3〜5Kgf/cm2とすることが好ましい。ロ
ーラー8の径D1を35mmφ以下とした根拠は、本発
明の探傷液塗布装置は、一般的なセラミックス基板へ対
応出来る汎用機であり、一般的なセラミックス基板の最
小外辺サイズが25.4mmであることから、これに対
応するため搬送ローラー14のピッチPは25mmと
し、また、搬送ローラー14の径D2が10mmである
ことより、その間に入るローラー8の径D1は、最大3
5mmとした。
The roller 8 is made of a porous material. For example, a porous resin such as a sponge roller shown in Table 1 is preferable. The diameter D1 of the roller 8 is 35 mm.
In the following, it is preferable that the pressure applied from above and below the ceramic substrate 1 be 3 to 5 kgf / cm 2 . The basis for setting the diameter D1 of the roller 8 to 35 mmφ or less is that the flaw detection liquid application device of the present invention is a general-purpose machine that can support a general ceramic substrate, and the minimum outer side size of the general ceramic substrate is 25.4 mm. Therefore, in order to cope with this, the pitch P of the transport roller 14 is set to 25 mm, and since the diameter D2 of the transport roller 14 is 10 mm, the diameter D1 of the roller 8 interposed therebetween is a maximum of 3 mm.
5 mm.

【0013】また、ローラー8をセラミックス基板1の
上下から押しあてる圧力を3〜5Kgf/cm2 とした
のは、3Kgf/cm2 未満では、セラミックス基板1
のクラック19への探傷液2の浸透が確実でなく、5K
gf/cm2 を越えると、セラミックス基板1のローラ
ー8部分での搬送速度が遅くなり、セラミックス基板1
の滞留が発生するからである。
The pressure at which the roller 8 is pressed from above and below the ceramic substrate 1 is set to 3 to 5 Kgf / cm 2 if the pressure is less than 3 kgf / cm 2.
Of the test solution 2 into the crack 19 of
If it exceeds gf / cm 2 , the transport speed of the ceramic substrate 1 at the roller 8 becomes slow, and the ceramic substrate 1
This is because stagnation occurs.

【0014】なお、以上の実施形態では、スプレーノズ
ル5から探傷液2を塗布したが、例えばローラ8の中央
部から探傷液2を供給し、ローラ8を通して探傷液2を
塗布するとともに押圧してクラックに浸透させるように
することもできる。また、セラミック基板1の両面を保
証する場合は、上記実施形態のように両面に探傷液2を
塗布するが、片面のみ保証する場合は片面のみ探傷液2
を塗布すればよく、このような場合に、ローラ8を通し
て探傷液2を塗布する方法が好適である。
In the above-described embodiment, the flaw detection liquid 2 is applied from the spray nozzle 5, but, for example, the flaw detection liquid 2 is supplied from the center of the roller 8, and the flaw detection liquid 2 is applied through the roller 8 and pressed. It can be made to penetrate cracks. When both sides of the ceramic substrate 1 are guaranteed, the flaw detection liquid 2 is applied to both sides as in the above-described embodiment. However, when only one side is guaranteed, the flaw detection liquid 2 is applied to only one side.
In such a case, a method of applying the flaw detection liquid 2 through the roller 8 is preferable.

【0015】さらに、この工程でセラミック基板1に超
音波を作用させてよりクラックへの浸透度を高めること
もできる。
Further, in this step, ultrasonic waves can be applied to the ceramic substrate 1 to further increase the degree of penetration into cracks.

【0016】[0016]

【表1】 [Table 1]

【0017】次に洗浄部Bは、図1に示すようにスプレ
ーノズル6、6aと、水分除去ローラー9で構成されて
いる。洗浄部Bの詳細な説明は、図3(a)に示すよう
に、セラミックス基板1へ、上下からスプレーノズル6
で水3を吹き付け探傷液2を洗い落とす。次に図3
(b)に示すように、多孔性の水分除去ローラー9で、
上下よりセラミックス基板1の表面の水3を搾りとって
行く。尚、水分除去ローラー9のセラミックス基板1の
進入側の上方には、更にスプレーノズル6aを追加して
あるが、これは、水分除去ローラー9が探傷液2で汚れ
やすい為、この汚れを洗い落とす目的で、水3を水分除
去ローラー9へ吹き付けている。洗浄部Bの水分除去ロ
ーラー9の材質、サイズ、加圧条件は、探傷液塗布部A
のローラー8と同一としている。
Next, the cleaning section B comprises spray nozzles 6 and 6a and a water removing roller 9 as shown in FIG. The detailed description of the cleaning section B is as follows: As shown in FIG.
Sprays water 3 to wash off the flaw detection liquid 2. Next, FIG.
As shown in (b), the porous moisture removal roller 9
The water 3 on the surface of the ceramic substrate 1 is squeezed from above and below. In addition, a spray nozzle 6a is further provided above the water removing roller 9 on the side of the ceramic substrate 1 entering, but this is because the water removing roller 9 is easily stained with the flaw detection liquid 2, and the purpose is to wash the stain. Thus, the water 3 is sprayed on the water removing roller 9. The material, size, and pressure conditions of the water removing roller 9 in the cleaning section B are determined by the flaw detection liquid application section A.
Roller 8 is the same.

【0018】さらに、乾燥部Cは図1で示すように、セ
ラミックス基板1の水分除去ローラー10と、エアーブ
ローの為のスプレーノズル7と、乾燥機11で構成さ
れ、スプレーノズル7へはリングブロー17を付加し、
乾燥機11へは熱風発生器18より熱風を供給してい
る。乾燥部Cの詳細は図4(a)に示すように、まず水
分除去ローラー10をセラミックス基板1の上下から押
しあてるが、この水分除去ローラー10の材質、サイ
ズ、加圧条件は、探傷液塗布部Aのローラー8と同一と
し、その目的は、洗浄部の水分除去ローラー9と同じ
で、セラミックス基板1の表面へ残留した水3を搾り取
る為のものである。この後、図4(b)に示すエアーブ
ロー用のスプレーノズル7で、セラミックス基板1の上
下からエアー4を吹き付ける。このエアーブローは、セ
ラミックス基板1には穴を有するものがあり、その穴内
部へ水分が残留している為この水分の除去と、表面の水
分除去を目的とし、セラミックス基板1の上下からスプ
レーノズル7で、エアー4を4〜5Kgf/cm2 の圧
力で、セラミックス基板1の搬送方向と逆の方向から傾
斜角15〜20°で吹き付ける。この後、図4(c)で
示すように、セラミックス基板1は乾燥機11へ搬送さ
れていく。この乾燥機11の内部温度は、80〜150
℃で、パイプ12が上下4組からなり、一つのパイプ1
2に2.5mmφの穴径のノズル13を5カ所付け、こ
のノズル13より熱風を噴射するようになっている。
Further, as shown in FIG. 1, the drying section C comprises a water removing roller 10 for the ceramic substrate 1, a spray nozzle 7 for air blow, and a drier 11, and a ring blow to the spray nozzle 7. Add 17
Hot air is supplied from a hot air generator 18 to the dryer 11. As shown in FIG. 4A, the details of the drying section C are as follows. First, the moisture removing roller 10 is pressed from above and below the ceramic substrate 1. It is the same as the roller 8 in the section A, and the purpose is to squeeze out the water 3 remaining on the surface of the ceramic substrate 1 in the same manner as the water removing roller 9 in the washing section. Thereafter, air 4 is blown from above and below the ceramic substrate 1 by a spray nozzle 7 for air blow shown in FIG. In this air blow, there is a ceramic substrate 1 having a hole, and since water remains in the hole, a spray nozzle is provided from above and below the ceramic substrate 1 for the purpose of removing the water and removing the surface water. In step 7, the air 4 is blown at a pressure of 4 to 5 kgf / cm 2 at an inclination angle of 15 to 20 ° from a direction opposite to the direction in which the ceramic substrate 1 is conveyed. Thereafter, as shown in FIG. 4C, the ceramic substrate 1 is transported to the dryer 11. The internal temperature of the dryer 11 is 80 to 150
℃, pipe 12 consists of four sets of upper and lower, one pipe 1
2, two nozzles 13 having a hole diameter of 2.5 mmφ are provided, and hot air is injected from the nozzles 13.

【0019】本発明の探傷液塗布装置の、探傷液塗布部
A、洗浄部B、乾燥部Cの各部のセラミックス基板1を
処理出来る有効幅は500mm程度とし、この範囲内で
あれば同時に最多5列迄並行して、セラミックス基板1
の探傷液塗布処理が出来る。
The effective width in which the ceramic substrate 1 of each of the flaw detection liquid application section A, the cleaning section B, and the drying section C of the flaw detection liquid application apparatus of the present invention can be processed is about 500 mm. In parallel up to the row, ceramic substrate 1
Flaw detection liquid application treatment.

【0020】以上の装置構成により、例えば図5(a)
に示すような、セラミックス基板1のクラック19へ、
図5(b)に示すように探傷液2を自動的に確実に浸透
させることが出来、塗布ムラ、乾燥シミの無い綺麗な処
理面が得られ、また探傷液塗布処理時間も、10〜15
秒と短時間で行える。
With the above device configuration, for example, FIG.
To the crack 19 of the ceramic substrate 1 as shown in FIG.
As shown in FIG. 5 (b), the flaw detection liquid 2 can be automatically and reliably penetrated, and a clean treated surface free from coating unevenness and dry spots can be obtained.
It can be done in a short time in seconds.

【0021】[0021]

【実施例】本発明の実施例について以下に説明する。Embodiments of the present invention will be described below.

【0022】実施例に用いたセラミックス基板1はAl
2 3 含有量96%アルミナセラミックスからなり、図
6(a)に示すように、外辺サイズL1=62mm、L
2=60mm、スルーホール20の径D3=0.4m
m、スルーホール20とセラミックス基板1の外辺間距
離L3=0.8mmのものを用いた。またセラミックス
基板1のスルーホール20から外辺迄の間に、長さ0.
8mmのクラック19が入り、図6(b)に示すように
クラック19の幅W1並びにW2=2〜4μmで、その
深さT=0.64mmでセラミックス基板1の表裏貫通
しているものであり、このクラック19があることを倍
率32倍の顕微鏡で確認した。
The ceramic substrate 1 used in the embodiment is made of Al
Consists 2 O 3 content of 96% alumina ceramic, as illustrated in FIG. 6 (a), perimeter size L1 = 62 mm, L
2 = 60 mm, diameter D3 of through hole 20 = 0.4 m
m, the distance L3 between the through hole 20 and the outer side of the ceramic substrate 1 was 0.8 mm. In addition, a length between the through hole 20 and the outer side of the ceramic substrate 1 is set to be 0.
An 8 mm crack 19 is formed, and as shown in FIG. 6B, the width W1 and W2 of the crack 19 are 2 to 4 μm, and the crack T penetrates the ceramic substrate 1 with the depth T = 0.64 mm. The presence of the crack 19 was confirmed with a microscope of 32 times magnification.

【0023】このセラミックス基板1を、従来技術の図
7(b)に示す探傷液2の浸積処理により塗布したもの
と、図1に示す本発明による探傷液塗布装置を使用した
もの、各300シート準備した。この探傷液2は、染色
浸透探傷液で表2に示すものを用いた。尚、本発明の探
傷液塗布装置のセラミックス基板1の処理は、横方向に
5列並行して連続し処理した。
The ceramic substrate 1 is applied by the immersion treatment of the flaw detection liquid 2 shown in FIG. 7 (b) of the prior art, the one using the flaw detection liquid application apparatus according to the present invention shown in FIG. Sheet prepared. As the flaw detection solution 2, the dye permeation flaw detection solution shown in Table 2 was used. The processing of the ceramics substrate 1 of the flaw detection liquid application device of the present invention was performed continuously in five rows in parallel.

【0024】[0024]

【表2】 [Table 2]

【0025】以上の探傷液塗布処理を施したセラミック
ス基板1を、同一検査員が、100Wの白熱電球照明下
で、目視にてクラック19の検査をし検出精度を比較調
査した。まず従来技術による探傷液塗布処理と、本発明
による探傷液塗布装置の処理時間の比較を行った結果、
従来技術による探傷液塗布方式は、セラミックス基板1
を300シート探傷液2に塗布し洗浄する迄の処理時間
が20分を要し、その後の乾燥に6時間を要した。これ
に対し、本発明による探傷液塗布装置での処理時間は、
セラミックス基板1を300シート探傷液塗布、洗浄、
乾燥迄行うのに15分で済み、従来技術に比較し短時間
で効率的な処理が出来た。
The same inspector visually inspected the cracks 19 on the ceramic substrate 1 subjected to the above-mentioned flaw detection liquid application treatment under illumination of a 100 W incandescent lamp, and compared the detection accuracy. First, as a result of comparing the processing time of the flaw detection liquid application processing according to the conventional technology and the flaw detection liquid application apparatus according to the present invention,
The flaw detection liquid application method according to the prior art uses a ceramic substrate 1
Was applied to 300 sheets of flaw detection liquid 2 and processing time required for washing was 20 minutes, and subsequent drying required 6 hours. In contrast, the processing time in the flaw detection liquid application device according to the present invention is:
300 sheets of ceramic substrate 1 are applied with flaw detection liquid, washed,
It took 15 minutes to perform drying, and efficient processing could be performed in a shorter time than in the prior art.

【0026】また以上の探傷液塗布処理したセラミック
ス基板1で、クラック検出精度について比較した結果
は、従来技術により探傷液塗布処理を行ったセラミック
ス基板1のクラック19の検出精度が88.3%に対
し、本発明による探傷液塗布装置により処理したセラミ
ックス基板1のクラック19の検出精度は100%とい
う結果が得られ、クラック検出精度の向上が確認出来
た。
The results of comparison of the crack detection accuracy of the ceramic substrate 1 subjected to the above-described flaw detection liquid application show that the detection accuracy of the crack 19 of the ceramic substrate 1 subjected to the flaw detection liquid application processing by the conventional technique is 88.3%. On the other hand, the detection accuracy of the crack 19 of the ceramic substrate 1 processed by the flaw detection liquid application device according to the present invention was 100%, and the improvement of the crack detection accuracy was confirmed.

【0027】[0027]

【発明の効果】本発明によれば、探傷液槽からスプレー
ノズルへ探傷液を供給し、セラミックス基板へ吹き付
け、多孔性のローラーを、セラミックス基板の上下から
押しあて探傷液をクラック部へ浸透させ、その後、洗
浄、乾燥を連続的に実施する装置としたことにより、探
傷液の塗布処理が効率的に出来、またセラミックス基板
のクラック部への探傷液浸透も確実で、セラミックス基
板表面の塗布ムラ、乾燥シミも無いため、クラック検査
の検出精度を向上させることができる。
According to the present invention, the flaw detection liquid is supplied from the flaw detection liquid tank to the spray nozzle, sprayed onto the ceramic substrate, and a porous roller is pressed from above and below the ceramic substrate to allow the flaw detection liquid to penetrate into the crack portion. The cleaning and drying system is continuously implemented, so that the flaw detection liquid can be applied efficiently and the flaw detection liquid permeates into cracks on the ceramic substrate. Since there is no drying spot, the detection accuracy of crack inspection can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のセラミックス基板の探傷液塗布装置の
概略の断面図である。
FIG. 1 is a schematic sectional view of an apparatus for applying a test liquid for a ceramic substrate according to the present invention.

【図2】(a)(b)は本発明のセラミックス基板の探
傷液塗布装置の探傷液塗布部の断面図である。
FIGS. 2A and 2B are cross-sectional views of a flaw detection liquid application unit of the flaw detection liquid application apparatus for a ceramic substrate according to the present invention.

【図3】(a)(b)は本発明のセラミックス基板の探
傷液塗布装置の洗浄部の断面図である。
FIGS. 3A and 3B are cross-sectional views of a cleaning unit of the apparatus for applying a test liquid for a ceramic substrate according to the present invention.

【図4】(a)〜(c)は本発明のセラミックス基板の
探傷液塗布装置の乾燥部の断面図である。
FIGS. 4A to 4C are cross-sectional views of a drying unit of the apparatus for applying a flaw detection liquid for a ceramic substrate according to the present invention.

【図5】(a)はセラミックス基板の平面図、(b)は
セラミックス基板のクラック部分の断面図である。
5A is a plan view of a ceramic substrate, and FIG. 5B is a cross-sectional view of a crack portion of the ceramic substrate.

【図6】(a)は本発明の実施例に用いたセラミックス
基板の平面図、(b)はクラック部分の断面図である。
6A is a plan view of a ceramic substrate used in an example of the present invention, and FIG. 6B is a sectional view of a crack portion.

【図7】従来の探傷液の塗布方法を説明する図で、
(a)はコンテナーとセラミックス基板の斜視図、
(b)は探傷液槽へ浸漬したセラミックス基板の断面図
である。
FIG. 7 is a view for explaining a conventional method for applying a test liquid.
(A) is a perspective view of the container and the ceramic substrate,
(B) is a sectional view of the ceramic substrate immersed in the flaw detection liquid tank.

【符号の説明】[Explanation of symbols]

1、セラミックス基板 2、探傷液 3、水 4、エアー 5、スプレーノズル 6、6a、スプレーノズル 7、スプレーノズル 8、ローラー 9、水分除去ローラー 10、水分除去ローラー 11、乾燥機 12、パイプ 13、ノズル 14、搬送ローラー 15、探傷液槽 16、循環ポンプ 17、リングブロー 18、熱風発生器 19、クラック 20、スルーホール 101、探傷液槽 102、コンテナー A、探傷液塗布部 B、洗浄部 C、乾燥部 D1、D2、D3、径 P、ピッチ L1、L2、外辺寸法 L3、外辺間距離 T、深さ W1、W2、幅 1, ceramic substrate 2, flaw detection liquid 3, water 4, air 5, spray nozzle 6, 6a, spray nozzle 7, spray nozzle 8, roller 9, moisture removal roller 10, moisture removal roller 11, dryer 12, pipe 13, Nozzle 14, transport roller 15, flaw detection liquid tank 16, circulation pump 17, ring blow 18, hot air generator 19, crack 20, through hole 101, flaw detection liquid tank 102, container A, flaw detection liquid application section B, cleaning section C, Drying part D1, D2, D3, diameter P, pitch L1, L2, outer dimension L3, distance between outer edges T, depth W1, W2, width

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】セラミックス基板に塗布した探傷液を、上
下から押しあてた多孔性のローラーでクラックへ浸透さ
せるようにした探傷液塗布部と、不要な探傷液を洗い落
とす洗浄部と、乾燥部とからなり、これらを連続的に備
えたことを特徴とするセラミックス基板の探傷液塗布装
置。
1. A flaw detection liquid application section in which a flaw detection liquid applied to a ceramic substrate is penetrated into cracks by a porous roller pressed from above and below, a cleaning section for washing off unnecessary flaw detection liquid, and a drying section. A flaw detection liquid application device for a ceramic substrate, comprising:
JP02443099A 1999-02-01 1999-02-01 Ceramic substrate flaw detection liquid application equipment Expired - Fee Related JP3652155B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02443099A JP3652155B2 (en) 1999-02-01 1999-02-01 Ceramic substrate flaw detection liquid application equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02443099A JP3652155B2 (en) 1999-02-01 1999-02-01 Ceramic substrate flaw detection liquid application equipment

Publications (2)

Publication Number Publication Date
JP2000221145A true JP2000221145A (en) 2000-08-11
JP3652155B2 JP3652155B2 (en) 2005-05-25

Family

ID=12137945

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3652155B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002059071A (en) * 2000-08-24 2002-02-26 Ibiden Co Ltd Processing liquid feeding method
JP2010119997A (en) * 2008-11-21 2010-06-03 Miyako Roller Industry Co Method of coating with resist
CN102721704A (en) * 2012-06-26 2012-10-10 潮州三环(集团)股份有限公司 Method and device for automatically detecting defects of electronic ceramic chips
CN108323183A (en) * 2018-02-09 2018-07-24 深圳达闼科技控股有限公司 Raman detection ancillary equipment, Raman detection terminal and method
CN108627517A (en) * 2018-04-16 2018-10-09 九豪精密陶瓷(昆山)有限公司 Ceramic substrate slight crack detection device
CN113333200A (en) * 2021-05-13 2021-09-03 廖海宁 Ceramic substrate limiting spraying preparation device based on electronic paste

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Publication number Priority date Publication date Assignee Title
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002059071A (en) * 2000-08-24 2002-02-26 Ibiden Co Ltd Processing liquid feeding method
JP2010119997A (en) * 2008-11-21 2010-06-03 Miyako Roller Industry Co Method of coating with resist
CN102721704A (en) * 2012-06-26 2012-10-10 潮州三环(集团)股份有限公司 Method and device for automatically detecting defects of electronic ceramic chips
CN108323183A (en) * 2018-02-09 2018-07-24 深圳达闼科技控股有限公司 Raman detection ancillary equipment, Raman detection terminal and method
CN108627517A (en) * 2018-04-16 2018-10-09 九豪精密陶瓷(昆山)有限公司 Ceramic substrate slight crack detection device
CN113333200A (en) * 2021-05-13 2021-09-03 廖海宁 Ceramic substrate limiting spraying preparation device based on electronic paste

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