JP2000150421A - Device and method for plating substrate - Google Patents

Device and method for plating substrate

Info

Publication number
JP2000150421A
JP2000150421A JP10323919A JP32391998A JP2000150421A JP 2000150421 A JP2000150421 A JP 2000150421A JP 10323919 A JP10323919 A JP 10323919A JP 32391998 A JP32391998 A JP 32391998A JP 2000150421 A JP2000150421 A JP 2000150421A
Authority
JP
Japan
Prior art keywords
plating
substrate
jig
holding
holding means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10323919A
Other languages
Japanese (ja)
Inventor
Kenichi Sasabe
憲一 笹部
Fumio Kuriyama
文夫 栗山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP10323919A priority Critical patent/JP2000150421A/en
Publication of JP2000150421A publication Critical patent/JP2000150421A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a device and method for plating substrate by which a highly uniform plated film can be formed on the part to be plated of a substrate, such as the semiconductor wafer, etc., and the adhesion of a plating solution to the part not to be plated of the substrate can be prevented. SOLUTION: A plating jig 20, which holds a substrate wf when the substrate wf is arranged together with an anode plate in an plating tank when the substrate wf is electroplated by means of plating equipment, has an opening 22a formed to expose the surface to be plated of the substrate wf, first and second sealing members 25 and 26 attached to the periphery of the opening 22a, and a conductive member 27 that comes into contact with the surface edge section of the substrate wf which is prevented from coming into contact with a plating solution Q by the sealing members 25 and 26. The jig 20 also has an external electrode contact 28 for the jig which is provided on the external surface of the jig 20 for connecting the jig 20 to a power source. The plating equipment is provided with a jig holding mechanism having a jig holding section which holds the jig 20 in the plating tank and the mechanism is provided with an external electrode contact for holding tool which comes into contact with the external electrode contact 28 for jig in the jig holding section.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体ウエハ等の基
板にメッキ膜を形成する基板のメッキ装置及びメッキ方
法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate plating apparatus and method for forming a plating film on a substrate such as a semiconductor wafer.

【0002】[0002]

【従来の技術】半導体ウエハにメッキを行う場合、メッ
キ膜を形成する面は一般的に半導体ウエハの表面であ
り、裏面や外周部にメッキ金属が付着することは、金属
の半導体ウエハ中への拡散などの原因となり望ましくな
い。そこで、半導体ウエハのメッキ膜を形成しようとす
る表面部分のみをメッキ液に露出し、それ以外の部分を
シール部材によってシールしてメッキ液に触れないよう
にすることが行われている。
2. Description of the Related Art When a semiconductor wafer is plated, the surface on which a plating film is formed is generally the front surface of the semiconductor wafer. This is undesirable because it causes diffusion. Therefore, it has been practiced to expose only a surface portion of a semiconductor wafer on which a plating film is to be formed to a plating solution, and to seal other portions with a sealing member so as not to come into contact with the plating solution.

【0003】半導体ウエハにメッキを施す場合には、電
流密度、電流形態、メッキ液の液組成や液濃度や液温等
メッキに影響する要因が多数あるが、半導体ウエハの表
面に膜厚の均一なメッキを施すには、メッキ液に対して
半導体ウエハを相対的に移動させることも行われてい
る。
When plating a semiconductor wafer, there are many factors that affect plating, such as current density, current form, plating solution composition, solution concentration, and solution temperature. In order to perform appropriate plating, a semiconductor wafer is relatively moved with respect to a plating solution.

【0004】集積回路素子の配線をメッキにより形成す
る場合には、従来に増して膜厚の均一性が要求されてお
り、膜厚のより均一なメッキ膜を形成できるメッキ方法
及び基板のメッキ装置の開発が要望されている。
In the case of forming wiring of an integrated circuit element by plating, uniformity of the film thickness is required more than before, and a plating method and a substrate plating apparatus capable of forming a plating film with a more uniform film thickness. There is a demand for development.

【0005】半導体ウエハにメッキ処理を施す場合、メ
ッキ用治具を用い、該治具に半導体ウエハを装着して、
該治具をメッキ液に浸漬してメッキを行う。銅等の半導
体ウエハ内部に拡散しやすい金属膜をメッキで形成する
場合は、メッキ終了後、基板をメッキ装置やメッキ用治
具から取り出す段階においてもメッキ液が半導体ウエハ
のメッキを施していない部分に付着しないようにしなけ
ればならない。
When plating a semiconductor wafer, a plating jig is used, and the semiconductor wafer is mounted on the jig.
The jig is immersed in a plating solution to perform plating. When a metal film, such as copper, which is easily diffused inside a semiconductor wafer is formed by plating, the plating liquid is not plated on the semiconductor wafer even after the plating is completed, even when the substrate is taken out of a plating apparatus or a plating jig. Must not adhere to

【0006】従来のメッキ用治具では、該治具から半導
体ウエハを取り出す段階でメッキ液を充分取り除くこと
ができないため、半導体ウエハのメッキを施さない部分
にもメッキ液が付着するという問題がある。そのため半
導体ウエハのメッキを施さない部分に前もってバリヤ層
を形成しておく等の対策が採られている。
In the conventional plating jig, since the plating solution cannot be sufficiently removed at the stage of taking out the semiconductor wafer from the jig, there is a problem that the plating solution adheres to a portion of the semiconductor wafer where plating is not performed. . Therefore, measures such as forming a barrier layer in advance on a portion of a semiconductor wafer where plating is not performed are taken.

【0007】[0007]

【発明が解決しようとする課題】本発明は上述の点に鑑
みてなされたもので、半導体ウエハ等の基板のメッキを
施す部分に高い均一性のメッキ膜が形成でき、メッキを
施さない部分へのメッキ液の付着を防止することができ
る基板のメッキ装置及びメッキ方法を提供することを目
的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and a highly uniform plating film can be formed on a portion where a substrate such as a semiconductor wafer is to be plated, and a portion on which no plating is to be performed can be formed. It is an object of the present invention to provide a plating apparatus and a plating method for a substrate which can prevent the plating solution from adhering.

【0008】[0008]

【課題を解決するための手段】上記課題を解決するため
請求項1に記載の発明は、メッキ液を収容したメッキ槽
内でメッキ用治具に保持された基板と陽極電極板を配置
し、該陽極電極板と該基板の間にメッキ電流を通電して
該基板にメッキを施す基板のメッキ装置において、メッ
キ用治具には基板のメッキを施す面を露出する開口が形
成され、該開口の周囲にシール部材が取り付けられ、該
シール部材によりメッキ液に触れないようにした該基板
の表面縁部に当接する導電部材を設け、当該メッキ用治
具の外面の所定の位置に該導電部材に電源を接続するた
めの治具外部電極接点を設け、メッキ槽の内部でメッキ
用治具を保持する治具保持部を有する治具保持手段を設
け、該治具保持手段は治具保持部に該メッキ用治具を保
持した状態で治具外部電極接点に当接する保持具電極接
点を具備することを特徴とする。
According to a first aspect of the present invention, there is provided a method for disposing a substrate held by a plating jig and an anode electrode plate in a plating tank containing a plating solution. In a substrate plating apparatus for plating a substrate by passing a plating current between the anode electrode plate and the substrate, an opening for exposing a surface of the substrate to be plated is formed in the plating jig. A sealing member is attached to the periphery of the substrate, and a conductive member is provided in contact with a surface edge of the substrate, which is prevented from contacting the plating solution by the sealing member, and the conductive member is provided at a predetermined position on an outer surface of the plating jig. A jig external electrode contact for connecting a power supply is provided, and jig holding means having a jig holding part for holding a plating jig inside the plating tank is provided, and the jig holding means is a jig holding part. Jig holding the plating jig Characterized by comprising a holder electrode contact that contacts the part electrode contact.

【0009】上記のように、メッキ用治具に基板を装着
し、該メッキ用治具を治具保持手段の治具保持部に保持
して、電解メッキを行うので、メッキ用治具に装着され
た基板は開口に露出した面しかメッキ液に触れることが
ないから、メッキ面以外にメッキ液が付着し、メッキ金
属が基板内に拡散する等の不都合がなくなる。
As described above, the substrate is mounted on the plating jig, the plating jig is held in the jig holding portion of the jig holding means, and electrolytic plating is performed. Since only the surface of the substrate exposed to the opening is in contact with the plating solution, the plating solution adheres to portions other than the plating surface, and the inconvenience such as diffusion of the plating metal into the substrate is eliminated.

【0010】また、請求項1に記載の基板のメッキ装置
において、治具保持手段は保持したメッキ用治具を開口
に露出した面を上向き又は下向きにし、その状態で回転
させる回転手段及び/又は昇降させる昇降手段を具備す
ることを特徴とする。
Further, in the substrate plating apparatus according to the first aspect, the jig holding means turns the surface of the held plating jig exposed to the opening upward or downward, and rotates the jig in that state. It is characterized by comprising lifting means for lifting and lowering.

【0011】上記のように回転手段を具備することによ
り、電解メッキが行われている間中メッキ用治具を回転
させ、基板の開口に露出した面に膜厚の均一なメッキ膜
を形成することができる。また、回転手段と昇降手段を
設けることにより、メッキ用治具をメッキ液面上に上昇
させ、ここで高速回転させることにより、基板やメッキ
用治具や治具保持部に付着したメッキ液を遠心力で飛散
除去させた後、メッキ用治具を治具保持部から取り出
し、更に基板をメッキ用治具から取り出すので、基板を
取り出す際、メッキ液が付着する恐れがない。
By providing the rotating means as described above, the plating jig is rotated during electrolytic plating to form a plating film having a uniform thickness on the surface exposed to the opening of the substrate. be able to. Also, by providing the rotating means and the elevating means, the plating jig is raised above the plating liquid surface, and rotated at a high speed to remove the plating liquid adhering to the substrate, the plating jig and the jig holding portion. After being scattered and removed by centrifugal force, the plating jig is taken out of the jig holding portion, and the substrate is taken out of the plating jig. Therefore, there is no danger of plating solution sticking when taking out the substrate.

【0012】また、請求項2に記載の発明は、基板を電
解メッキする基板のメッキ方法であって、基板をメッキ
用治具に装着する工程、該基板を装着したメッキ用治具
を治具保持手段に搭載し保持する工程、該治具保持手段
に搭載されたメッキ用治具をメッキ槽のメッキ液中の所
定の位置に配置する工程、陽極電極板をメッキ槽のメッ
キ液中の所定の位置に配置する工程、該陽極電極板と基
板の間にメッキ電流を流し電解メッキを行う工程、該陽
極電極板をメッキ槽外に移動する工程、前記治具保持手
段に搭載されたメッキ用治具をメッキ液外のメッキ用治
具取外し位置に移動する工程、該治具保持手段に搭載さ
れたメッキ用治具の保持を解除する工程、該治具保持手
段からメッキ用治具を取り除く工程、該基板をメッキ用
治具から取り出す工程からなることを特徴とする。
[0012] The invention according to claim 2 is a method of plating a substrate by electroplating the substrate, the step of mounting the substrate on a plating jig, and the step of mounting the plating jig with the substrate on the jig. A step of mounting and holding on the holding means, a step of arranging the plating jig mounted on the jig holding means at a predetermined position in the plating solution of the plating tank, and a step of placing the anode electrode plate in the plating solution of the plating tank. Position, a step of passing a plating current between the anode electrode plate and the substrate to perform electrolytic plating, a step of moving the anode electrode plate out of the plating tank, and a step of plating mounted on the jig holding means. A step of moving the jig to a plating jig removal position outside the plating solution, a step of releasing the holding of the plating jig mounted on the jig holding means, and removing the plating jig from the jig holding means Process, removing the substrate from the plating jig Characterized in that it consists of degree.

【0013】上記基板のメッキ方法は、基板をメッキ用
治具に装着してから、上記各工程を行うので、基板はメ
ッキ用治具でメッキ液に触れるようになっている面以外
にはメッキ液が触れることはない。
In the method of plating the substrate, each of the above-mentioned steps is performed after the substrate is mounted on a plating jig. The liquid does not touch.

【0014】また、請求項3に記載の発明は、基板をメ
ッキする基板のメッキ方法であって、基板をメッキ用治
具に装着する工程、該基板を装着したメッキ用治具を治
具保持手段に搭載し保持する工程、該治具保持手段に搭
載されたメッキ用治具をメッキ槽のメッキ液中の所定の
位置に配置する工程、該メッキ用治具から露出された基
板表面にメッキを行う工程、前記治具保持手段に搭載さ
れたメッキ用治具をメッキ液外に移動させた後回転させ
て遠心力でメッキ液を飛散させ取り除く工程、該治具保
持手段をメッキ用治具を取り外す位置に移動する工程、
該治具保持手段からメッキ用治具を取り除く工程、該メ
ッキ用治具から基板を取り出す工程からなることを特徴
とする。
According to a third aspect of the present invention, there is provided a method of plating a substrate for plating a substrate, the step of mounting the substrate on a plating jig, and holding the plating jig with the substrate mounted on the jig. Means for mounting and holding on the means, means for arranging the plating jig mounted on the jig holding means at a predetermined position in the plating solution in the plating tank, and plating on the surface of the substrate exposed from the plating jig. Performing a step of moving the plating jig mounted on the jig holding means out of the plating solution and then rotating the jig to spatter and remove the plating solution by centrifugal force. Moving to the position to remove the
The method is characterized by comprising a step of removing the plating jig from the jig holding means and a step of removing the substrate from the plating jig.

【0015】上記工程からなるメッキ方法は、陽極電極
板がメッキ用治具の上方に無い場合、即ち基板のメッキ
を施す面が下向きで陽極電極板で治具保持手段より下方
にある場合又は陽極電極板が無い場合において、適用で
きるメッキ方法である。
The plating method comprising the above steps is performed when the anode electrode plate is not above the plating jig, that is, when the surface of the substrate to be plated faces downward and is below the jig holding means by the anode electrode plate, or This is a plating method that can be applied when there is no electrode plate.

【0016】また、請求項4に記載の発明は基板にメッ
キをする基板のメッキ方法であって、基板を保持したメ
ッキ用治具を治具保持手段に保持させてメッキを行った
後、メッキを施した基板を該メッキ用治具で保持したま
ま洗浄及び乾燥を行い、該基板のメッキを施していない
面にメッキ液が付着することが無い状態で基板をメッキ
用治具から取り外すことを特徴とする。
The invention according to claim 4 is a substrate plating method for plating a substrate, wherein the plating is performed by holding a plating jig holding the substrate by a jig holding means and then performing plating. Cleaning and drying are performed while holding the substrate subjected to the plating with the plating jig, and the substrate is removed from the plating jig in a state where the plating solution does not adhere to the unplated surface of the substrate. Features.

【0017】上記のように基板を該メッキ用治具で保持
したまま洗浄及び乾燥を行うので、基板をメッキ用治具
から取り外す際、基板にメッキ液が付着する恐れが全く
ない。
Since washing and drying are performed while the substrate is held by the plating jig as described above, there is no danger that the plating solution will adhere to the substrate when the substrate is removed from the plating jig.

【0018】また、請求項5に記載の発明は、メッキ液
を収容したメッキ槽内に配置された基板保持手段に保持
された基板と陽極電極板の間にメッキ電流を通電して該
基板にメッキを施す基板のメッキ装置において、基板保
持手段は基板を挟持する第一保持部材と第二保持部材を
具備し、該第二保持部材は基板のメッキを施す面を露出
する開口と、該開口の周囲に取り付けたシール部材と、
該シール部材によってメッキ液に触れないように区画さ
れた基板の表面縁部に当接する導電部材を具備し、該基
板をメッキを施す面を下に向けて保持するように構成さ
れ、基板保持手段に基板を保持した状態でその面内で回
転軸回りに回転させる回転手段及び/又は該回転軸の軸
方向に移動させる移動手段をメッキ槽の上部に配置され
た上部構造体に取り付け、上部構造体を開閉駆動する構
造体開閉駆動手段を設けたことを特徴とする。
According to a fifth aspect of the present invention, a plating current is passed between a substrate held by a substrate holding means disposed in a plating tank containing a plating solution and an anode electrode plate to plate the substrate. In the apparatus for plating a substrate to be applied, the substrate holding means includes a first holding member and a second holding member for sandwiching the substrate, wherein the second holding member has an opening exposing a surface of the substrate to be plated, and a periphery of the opening. A sealing member attached to the
A substrate holding means, comprising: a conductive member in contact with a surface edge of the substrate partitioned by the seal member so as not to come into contact with the plating solution; and holding the substrate with the surface to be plated facing downward. A rotating means for rotating around a rotation axis in the plane of the substrate while holding the substrate, and / or a moving means for moving in the axial direction of the rotation axis, are attached to an upper structure disposed above the plating tank, A structure opening / closing driving means for driving the body to open / close is provided.

【0019】基板のメッキ装置に上記構成を採用するこ
とにより、基板は基板保持手段の第二保持部材の開口に
露出した面のみがメッキ液に触れるので、他の面はメッ
キ液に触れることなく、電解メッキを終了させ、メッキ
終了後は昇降手段で基板保持手段をメッキ液面上に上昇
させ、回転手段で高速回転させ、メッキ液を除去するこ
とができるから、基板のメッキ面以外は全くメッキ液に
触れることがない。また、メッキ期間中は基板を保持し
た基板保持手段を低速回転させるので開口に露出した基
板の面に膜厚の均一なメッキ膜を形成できる。
By adopting the above-described configuration in the substrate plating apparatus, only the surface of the substrate exposed to the opening of the second holding member of the substrate holding means contacts the plating solution, and the other surface does not contact the plating solution. After the electroplating is completed, after the plating is completed, the substrate holding means is raised above the plating liquid surface by the elevating means, and is rotated at a high speed by the rotating means, so that the plating liquid can be removed. No contact with plating solution. In addition, since the substrate holding means holding the substrate is rotated at a low speed during the plating period, a plating film having a uniform thickness can be formed on the surface of the substrate exposed at the opening.

【0020】また、請求項6に記載の発明は、基板に電
解メッキをする基板のメッキ方法であって、基板を基板
保持手段の第一保持部材と第二保持部材の間に挟持して
保持させる工程、該基板保持手段をメッキ槽内の所定の
位置まで移動させて配置する工程、該基板の露出された
表面にメッキを行う工程、該基板保持手段をメッキ液面
上にまで移動させた後回転させてメッキ液を除去する工
程、該基板保持手段を基板の保持を解除する位置まで移
動させる工程、該基板保持手段の基板保持を解除する工
程、第二保持部材を取り除き基板を取り出す工程からな
ることを特徴とする。
According to a sixth aspect of the present invention, there is provided a method for plating a substrate by electroplating the substrate, wherein the substrate is held between the first holding member and the second holding member of the substrate holding means. Moving the substrate holding means to a predetermined position in the plating bath, disposing the substrate holding means, plating the exposed surface of the substrate, and moving the substrate holding means onto the surface of the plating solution. Removing the plating solution by rotating the substrate, moving the substrate holding means to a position for releasing the holding of the substrate, releasing the substrate holding means from the substrate holding means, removing the second holding member, and removing the substrate It is characterized by consisting of.

【0021】上記基板のメッキ方法は、基板を基板保持
手段の第一保持部材と第二保持部材の間に挟持して保持
させてから、上記各工程を行うので、基板はメッキ用治
具でメッキ液に触れるようになっている面以外にはメッ
キ液が触れることはない。特にメッキ終了後、基板保持
手段をメッキ液面上にまで移動させ回転させてメッキ液
を除去するので、基板を基板保持手段から取り外す際
に、基板がメッキ液に触れることが全くない。
In the method of plating a substrate, the above-described steps are performed after the substrate is sandwiched and held between the first holding member and the second holding member of the substrate holding means. The plating solution does not touch the surface other than the surface that is in contact with the plating solution. In particular, after the plating is completed, the substrate holding means is moved to a position above the plating liquid surface and rotated to remove the plating liquid. Therefore, when the substrate is removed from the substrate holding means, the substrate does not come into contact with the plating liquid at all.

【0022】また、請求項1に記載された基板のメッキ
装置において、治具保持手段の治具保持部は軸から半径
方向に突出した少なくとも3本の腕を具備し、該腕の先
端にメッキ用治具を保持する保持手段を設けたことを特
徴とする。
Further, in the substrate plating apparatus according to the first aspect, the jig holding portion of the jig holding means has at least three arms protruding from an axis in a radial direction, and the tip of the arm is plated. A holding means for holding the tool is provided.

【0023】また、請求項1に記載の基板のメッキ装置
において、保持手段のメッキ用治具の保持を昇降手段の
昇降と協動して解除する解除手段を設けたことを特徴と
する。
In the apparatus for plating a substrate according to the first aspect, a release means is provided for releasing the holding of the plating jig of the holding means in cooperation with the elevation of the elevation means.

【0024】また、請求項1に記載の基板のメッキ装置
において、保持具電極接点は治具外部電極接点に当接し
た状態で該保持具電極接点と治具外部電極接点がシール
部材でメッキ液に触れないようになっていることを特徴
とする。
In the apparatus for plating a substrate according to the first aspect of the present invention, the holder electrode contact and the jig external electrode contact are sealed by a plating solution while the holder electrode contact is in contact with the jig external electrode contact. It is characterized by not being touched.

【0025】また、請求項1に記載された基板のメッキ
装置において、解除手段は治具保持手段の昇降手段と協
動してメッキ用治具の保持を解除する解除手段であるこ
とを特徴とする。
In the apparatus for plating a substrate according to the first aspect, the releasing means is a releasing means for releasing the holding of the plating jig in cooperation with the elevating means of the jig holding means. I do.

【0026】また、請求項1に記載された基板のメッキ
装置において、メッキ用治具の治具外部電極接点はメッ
キ用治具の基板のメッキ面を露出する開口が形成されて
いる外縁部に配置され、該治具外部電極接点に当接する
保持具電極接点は治具保持手段の治具保持部の保持爪に
配置され、該治具外部電極接点と該保持具電極接点は周
囲にシール部材が配置されメッキ液に触れないようにな
っていることを特徴とする。
In the apparatus for plating a substrate according to the first aspect of the present invention, the jig external electrode contact of the plating jig is formed on an outer edge of the plating jig where an opening for exposing the plating surface of the substrate is formed. The holder electrode contact which is disposed and abuts on the jig external electrode contact is disposed on a holding claw of a jig holding portion of the jig holding means, and the jig external electrode contact and the holder electrode contact are surrounded by a sealing member. Are arranged so as not to touch the plating solution.

【0027】また、請求項1に記載された基板のメッキ
装置において、メッキ用治具の治具外部電極接点はメッ
キ用治具の第二治具部材の外面中央部に配置され、該治
具外部電極接点に当接する保持具電極接点は治具保持手
段の軸部に配置され、該治具外部電極接点と該保持具電
極接点は周囲にシール部材が配置されメッキ液に触れな
いようになっていることを特徴とする。
[0027] In the apparatus for plating a substrate according to claim 1, the jig external electrode contact of the plating jig is arranged at the center of the outer surface of the second jig member of the plating jig. The holder electrode contact which abuts on the external electrode contact is arranged on the shaft of the jig holding means, and the jig external electrode contact and the holder electrode contact are provided with a sealing member around so that they do not touch the plating solution. It is characterized by having.

【0028】また、請求項1に記載された基板のメッキ
装置において、陽極電極板を昇降させる陽極電極板昇降
手段を設け、該陽極電極板昇降手段で上昇させた該陽極
電極板の下方で陽極電極板から滴下するメッキ液を受け
る受皿を設け、該受皿をメッキ槽の外と該メッキ槽の上
方に位置する陽極電極板の下方位置の間で移動させる受
皿移動機構を設けたことを特徴とする。
In the apparatus for plating a substrate according to claim 1, an anode electrode plate elevating means for elevating and lowering the anode electrode plate is provided, and an anode is provided below the anode electrode plate raised by the anode electrode plate elevating means. A saucer for receiving a plating solution dropped from the electrode plate is provided, and a saucer moving mechanism for moving the saucer between a position outside the plating tank and a position below the anode electrode plate located above the plating tank is provided. I do.

【0029】また、受皿移動機構は受皿をメッキ槽の外
と該メッキ槽の上方に位置する陽極電極板の下方位置の
間で移動させると共に、該受皿と該陽極電極板を該受皿
が該陽極電極板の下方に位置した状態で同時にメッキ槽
外に移動させる移動機能を具備することを特徴とする。
Further, the pan moving mechanism moves the pan between the outside of the plating tank and a position below the anode electrode plate located above the plating tank, and moves the pan and the anode electrode plate between the anode and the anode. It is characterized by having a moving function of simultaneously moving the plating plate outside the plating tank while being positioned below the electrode plate.

【0030】また、請求項1に記載の基板のメッキ装置
において、メッキ用治具は第一治具部材及び第二治具部
材を具備し、第二治具部材には基板のメッキを施す面を
露出する開口と、該開口の周囲に取り付けられた第一シ
ール部材と、該第一シール部材の外側に取り付けられた
第二シール部材と、該第一シール部材と該第二シール部
材によってメッキ液に触れないように隔離された基板の
表面縁部に当接する導通部材と、該導通部材に電気的に
接続され当該メッキ用治具の外面に設けられた治具外部
電極接点を備えたこと特徴とする。
In the apparatus for plating a substrate according to the first aspect, the plating jig includes a first jig member and a second jig member, and the second jig member has a surface on which the substrate is to be plated. Opening, a first seal member attached around the opening, a second seal member attached outside the first seal member, and plating by the first seal member and the second seal member. A conductive member that is in contact with a surface edge of the substrate that is isolated from contact with the liquid; and a jig external electrode contact that is electrically connected to the conductive member and provided on an outer surface of the plating jig. Features.

【0031】また、第一治具部材の外周部に第二治具部
材をバネによって該第一治具部材に結合させる複数の結
合手段を具備し、該結合手段の突出部と該第一保持部材
とを相対移動させることにより該結合手段の結合を解除
する解除手段を備えたことを特徴とする。
Further, a plurality of connecting means for connecting the second jig member to the first jig member by a spring at an outer peripheral portion of the first jig member are provided, and a projecting portion of the connecting means and the first holding member are provided. A release means is provided for releasing the connection of the connection means by relatively moving the member.

【0032】また、前記結合手段の突出部と第一治具部
材との相対運動が該結合手段の突起部を半径方向に移動
させることであることを特徴とする。
Further, the relative movement between the projecting portion of the coupling means and the first jig member is to move the projection of the coupling means in the radial direction.

【0033】また、前記結合手段の結合を解除する解除
手段はメッキ槽の上部構造体に取付けられた解除部材を
具備し、該解除部材を移動させることにより、該結合手
段の突起部に当接させその結合を解除するように構成さ
れていることを特徴とする。
The releasing means for releasing the connection of the connecting means includes a releasing member attached to the upper structure of the plating tank, and by moving the releasing member, the releasing means comes into contact with the projection of the connecting means. And the connection is released.

【0034】また、請求項2に記載の基板のメッキ方法
であって、電解メッキを行う工程の終了後、治具保持手
段に搭載されたメッキ用治具をメッキ液外に移動し、回
転させ遠心力でメッキ液を飛散させ取り除く工程を含む
ことを特徴とする。
Further, in the method of plating a substrate according to claim 2, after the step of performing electrolytic plating is completed, the plating jig mounted on the jig holding means is moved out of the plating solution and rotated. It is characterized by including a step of scattering and removing the plating solution by centrifugal force.

【0035】上記のように、電解メッキの終了後、メッ
キ用治具をメッキ液外に移動し、回転させ遠心力でメッ
キ液を飛散させ取り除く工程を含むので、基板の取り出
しに際してメッキ液が付着する恐れがなくなる。
As described above, after the electrolytic plating is completed, the plating jig is moved out of the plating solution, and the plating solution is spun and removed by centrifugal force to remove the plating solution. There is no fear of doing.

【0036】また、請求項5に記載の基板のメッキ装置
において、基板保持手段は第一保持部材の外周部に第二
保持部材をバネによって該第一保持部材と結合させる複
数の結合手段を具備し、該結合手段の突出部を第一保持
部材に対して相対的に移動させることにより結合を解除
する解除手段を具備することを特徴とする。
In the apparatus for plating a substrate according to the fifth aspect, the substrate holding means includes a plurality of connecting means on an outer peripheral portion of the first holding member for connecting the second holding member to the first holding member by a spring. Further, there is provided a release means for releasing the connection by moving the protrusion of the connection means relative to the first holding member.

【0037】[0037]

【発明の実施の形態】以下、本発明の実施の形態例を図
面に基づいて説明する。図1は本発明に係る基板のメッ
キ装置の構成例を示す図であ。図において、10はメッ
キ液Qを収容するメッキ槽、20は半導体ウエハ等の基
板wfを保持するメッキ用治具、30は該メッキ用治具
20を保持する治具保持機構、40は陽極電極板、50
は受皿である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a configuration example of a substrate plating apparatus according to the present invention. In the drawing, reference numeral 10 denotes a plating tank containing a plating solution Q, 20 a plating jig for holding a substrate wf such as a semiconductor wafer, 30 a jig holding mechanism for holding the plating jig 20, and 40 an anode electrode. Board, 50
Is a saucer.

【0038】メッキ槽10にはメッキ液供給口11、メ
ッキ液排出口12が設けられ、メッキ液Qのメッキ槽1
0への供給及びメッキ槽10からの排出ができるように
なっている。また、メッキ槽10の上端には後述するよ
うに、治具保持機構30の治具保持部31の保持爪32
の保持を解除する複数個(ここでは4個)の解除部材1
3が設けられている。該解除部材13はそれぞれメッキ
槽の中央部に向かって矢印Bに示すように進退できるよ
うになっている。
The plating tank 10 is provided with a plating liquid supply port 11 and a plating liquid discharge port 12.
0 and discharge from the plating tank 10. As described later, the holding claws 32 of the jig holding portion 31 of the jig holding mechanism 30 are provided on the upper end of the plating tank 10.
(Here, four) release members 1 for releasing the holding of
3 are provided. The release members 13 can move forward and backward as shown by arrows B toward the center of the plating tank.

【0039】メッキ用治具20は後に詳述するように、
基板wfをそのメッキを施す面を露出して保持するよう
になっている。治具保持機構30はメッキ用治具20を
保持する治具保持部31を具備し、後に詳述するように
該治具保持部31に少なくとも3本以上の腕31−2を
具備し、該腕31−2の先端にメッキ用治具20を保持
するための保持爪32が設けられている。
As will be described in detail later, the plating jig 20
The substrate wf is held by exposing the surface to be plated. The jig holding mechanism 30 includes a jig holding unit 31 that holds the plating jig 20, and the jig holding unit 31 includes at least three or more arms 31-2 as described later in detail. A holding claw 32 for holding the plating jig 20 is provided at the tip of the arm 31-2.

【0040】治具保持部31の中央部には回転軸33が
垂直に設けられ、該回転軸33はモータ34により歯車
35を介して回転できるようになっている。即ち、回転
軸33、モータ34及び歯車35等は治具保持部31を
水平姿勢に保持し回転させる回転機構36を構成してい
る。また、該回転機構36はモータ37及びラック・ピ
ニオンギヤ38からなる昇降機構39で昇降できるよう
になっている。
A rotary shaft 33 is provided vertically at the center of the jig holding portion 31, and the rotary shaft 33 can be rotated by a motor 34 via a gear 35. That is, the rotating shaft 33, the motor 34, the gear 35, and the like constitute a rotating mechanism 36 that holds and rotates the jig holding unit 31 in a horizontal posture. The rotating mechanism 36 can be moved up and down by an elevating mechanism 39 including a motor 37 and a rack and pinion gear 38.

【0041】陽極電極板40はアーム41の先端に取り
付けられ、該アーム41は垂直に配置された回転軸42
に固定されている。該回転軸42はモータ43によりラ
ック・ピニオンギヤ44を介して昇降できるようになっ
ている。即ち、回転軸42、モータ43及びラック・ピ
ニオンギヤ44等は陽極電極板40を昇降させる昇降機
構45を構成している。
The anode electrode plate 40 is attached to the tip of an arm 41, and the arm 41 is attached to a vertically disposed rotating shaft 42.
It is fixed to. The rotating shaft 42 can be moved up and down by a motor 43 via a rack and pinion gear 44. That is, the rotating shaft 42, the motor 43, the rack and pinion gear 44, and the like constitute a lifting mechanism 45 that raises and lowers the anode electrode plate 40.

【0042】受皿50はアーム51の先端に取り付けら
れ、該アーム51の他端は回転軸52に固定されてい
る。該回転軸52は回転軸42の外側に同心円状に配置
され、モータ53により、歯車54を介して回転できる
ようになっている。即ち、回転軸52、モータ53及び
歯車54等で受皿50を支持するアーム51を旋回させ
る回転機構55を構成している。
The receiving tray 50 is attached to the tip of an arm 51, and the other end of the arm 51 is fixed to a rotating shaft 52. The rotating shaft 52 is arranged concentrically outside the rotating shaft 42 and can be rotated by a motor 53 via a gear 54. That is, a rotating mechanism 55 for rotating the arm 51 that supports the tray 50 with the rotating shaft 52, the motor 53, the gear 54, and the like is configured.

【0043】図2はメッキ用治具20の構造を示す図
で、図2(a)は正面図、図2(b)は平面図、図2
(c)は断面図である。メッキ用治具20は円板状の第
一治具部材21と基板wfのメッキを施す面を露出させ
るための開口部22aが形成された円環状の第二治具部
材22を具備する。第一治具部材21の外周部には複数
個(図では4個)の結合爪23が設けられている。第一
治具部材21の基板収容凹部に基板wfを収容し、その
上に第二治具部材22を載置し、結合爪23で第二治具
部材22の縁部を挟持することにより、基板wfをその
メッキを施す面を部開口22aに露出させて、第一治具
部材21と第二治具部材22の間に挟持する。
FIG. 2 is a view showing the structure of the plating jig 20. FIG. 2 (a) is a front view, FIG. 2 (b) is a plan view, and FIG.
(C) is a sectional view. The plating jig 20 includes a disc-shaped first jig member 21 and an annular second jig member 22 having an opening 22a for exposing a surface of the substrate wf to be plated. A plurality (four in the figure) of coupling claws 23 are provided on the outer peripheral portion of the first jig member 21. The substrate wf is accommodated in the substrate accommodating recess of the first jig member 21, the second jig member 22 is placed thereon, and the edge of the second jig member 22 is clamped by the coupling claws 23. The surface of the substrate wf to be plated is exposed to the opening 22a, and is sandwiched between the first jig member 21 and the second jig member 22.

【0044】第二治具部材22の開口部22aの外周部
には第一シール部材25が設けられ、その外側に所定の
間隔を設けて第二シール部材26が設けられている。第
一シール部材25と第二シール部材26により、基板w
fの表面縁部と裏面がメッキ液Qに触れないようになっ
ている。メッキ液Qに触れない基板wfの表面縁部に当
接する導電部材27を設け、該導電部材27は第二治具
部材22の上面外周部に複数個(図では4個)設けられ
た治具外部電極接点28に電気的に接続されている。な
お、結合爪23はバネ23aで常時支軸23bを中心に
第二治具部材22と第一治具部材21を互いに結合する
方向に付勢され、該結合爪23の後端部を押すことによ
り、支軸23bを中心にして該結合を解除する方向に回
動する。
A first seal member 25 is provided on an outer peripheral portion of the opening 22a of the second jig member 22, and a second seal member 26 is provided outside the first seal member 25 at a predetermined interval. The substrate w is formed by the first seal member 25 and the second seal member 26.
The front edge and the rear surface of f do not touch the plating solution Q. A jig provided with a plurality of (four in the figure) jigs provided on the outer periphery of the upper surface of the second jig member 22 is provided with a conductive member 27 which is in contact with the surface edge of the substrate wf which does not touch the plating solution Q. It is electrically connected to the external electrode contact 28. The connecting claw 23 is constantly urged by the spring 23a around the support shaft 23b in a direction of connecting the second jig member 22 and the first jig member 21 to each other, and pushing the rear end of the connecting claw 23. As a result, it turns around the support shaft 23b in the direction to release the connection.

【0045】図3は治具保持機構30の治具保持部31
の構造を示す図で、図3(a)は正面図、図3(b)は
平面図、図3(c)は保持爪を示す斜視図である。図示
するように、治具保持部31は基台31−1に取付られ
た複数本(図では4本)の腕31−2を具備し、該腕3
1−2の先端にメッキ用治具20を保持する保持爪32
が設けられている。保持爪32は図4(図1のA部分の
詳細)に示すように、腕31−2の先端部に支軸32−
1により回動自在に支承され、常時バネ32−4により
メッキ用治具20を保持する方向(矢印B方向)に付勢
している。爪解除部材32−3を押すことにより、保持
爪32はメッキ用治具20の保持を解除する方向に(反
矢印B方向)回転し、メッキ用治具20の保持を解除す
るようになっている。
FIG. 3 shows a jig holding portion 31 of the jig holding mechanism 30.
3A is a front view, FIG. 3B is a plan view, and FIG. 3C is a perspective view showing a holding claw. As shown in the drawing, the jig holding section 31 includes a plurality of (four in the figure) arms 31-2 attached to a base 31-1.
1-2, holding claws 32 for holding plating jig 20 at the tip
Is provided. As shown in FIG. 4 (details of the portion A in FIG. 1), the holding claw 32 is attached to the tip of the arm 31-2 by a support shaft 32-.
1, and is always urged by a spring 32-4 in the direction of holding the plating jig 20 (the direction of arrow B). By pressing the claw release member 32-3, the holding claw 32 is rotated in a direction for releasing the holding of the plating jig 20 (in the direction indicated by the arrow B) to release the holding of the plating jig 20. I have.

【0046】保持爪32の先端部下面には上記メッキ用
治具20の第二治具部材22の上面外周部に設けられた
治具外部電極接点28に当接する保持具電極接点32−
2が設けられている。該保持具電極接点32−2は図5
に示すように、電極筐体32−2aと可動電極部材32
−2bを具備し、電極筐体32−2aと可動電極部材3
2−2bの間にバネ32−2cが介在し、可動電極部材
32−2bは上下動できる構造となっている。更に、可
動電極部材32−2bとバネ32−2cの外周に電極筐
体32−2aの外周部に密着固定されたシール部材32
−2dを設けた構造である。
On the lower surface of the distal end portion of the holding claw 32, a holding tool electrode contact 32-abutting on a jig external electrode contact 28 provided on the outer circumference of the upper surface of the second jig member 22 of the plating jig 20.
2 are provided. The holder electrode contact 32-2 is shown in FIG.
As shown in FIG. 3, the electrode housing 32-2a and the movable electrode member 32
-2b, the electrode housing 32-2a and the movable electrode member 3
A spring 32-2c is interposed between 2-2b, and the movable electrode member 32-2b has a structure capable of moving up and down. Furthermore, a seal member 32 tightly fixed to the outer periphery of the electrode housing 32-2a on the outer periphery of the movable electrode member 32-2b and the spring 32-2c.
-2d.

【0047】保持具電極接点32−2を上記構造とする
ことにより、治具保持部31にメッキ用治具20を載置
し保持爪32で第二治具部材22の外周面を押圧して保
持した場合、シール部材32−2dの先端部が該外周面
に密接するので、治具外部電極接点28と保持具電極接
点32−2が該シール部材32−2dで囲まれ、メッキ
液に触れることはない。
With the above-described structure of the holder electrode contact 32-2, the plating jig 20 is placed on the jig holder 31, and the outer peripheral surface of the second jig member 22 is pressed by the holding claw 32. When held, the distal end of the seal member 32-2d is in close contact with the outer peripheral surface, so that the jig external electrode contact 28 and the holder electrode contact 32-2 are surrounded by the seal member 32-2d and come into contact with the plating solution. Never.

【0048】上記構成の基板のメッキ装置において、基
板wfをメッキする際は、先ず、基板wfをメッキ用治
具20に装着する。即ち、第一治具部材21の基板収納
凹部に基板wfを収容し、その上に第二治具部材22を
載置し、該第二治具部材22の縁部を結合爪23で挟持
させてメッキ用治具20に基板wfを装着する。
When plating the substrate wf in the substrate plating apparatus having the above structure, first, the substrate wf is mounted on the plating jig 20. That is, the substrate wf is accommodated in the substrate accommodating recess of the first jig member 21, the second jig member 22 is placed thereon, and the edge of the second jig member 22 is clamped by the coupling claws 23. The substrate wf is mounted on the plating jig 20.

【0049】続いて、モータ37を起動して、昇降機構
39を作動させ治具保持部31をメッキ液面W上方の解
除部材13の上まで上昇させる。この状態で、複数の解
除部材13をメッキ槽10の中央部に向かって前進さ
せ、爪解除部材32−3の下方に位置させる。この状態
で、昇降機構39により治具保持部31を下降させる
と、爪解除部材32−3の下端が解除部材13に当接
し、爪解除部材32−3が相対的に押し上げられる。こ
れにより保持爪32が支軸32−1を中心にメッキ用治
具20の保持を解除する方向(図4の反矢印B方向)に
回動する。
Subsequently, the motor 37 is started, and the elevating mechanism 39 is operated to raise the jig holding portion 31 to above the release member 13 above the plating liquid level W. In this state, the plurality of release members 13 are advanced toward the center of the plating tank 10 and positioned below the claw release members 32-3. In this state, when the jig holding unit 31 is lowered by the elevating mechanism 39, the lower end of the claw release member 32-3 contacts the release member 13, and the claw release member 32-3 is relatively pushed up. Thereby, the holding claw 32 rotates about the support shaft 32-1 in the direction of releasing the holding of the plating jig 20 (the direction of the arrow B in FIG. 4).

【0050】続いて、上記基板wfを装着したメッキ用
治具20を治具保持機構30の治具保持部31に第二治
具部材22の開口部22aを上方にして載置する。この
状態で、昇降機構39により治具保持部31を上昇させ
ると、爪解除部材32−3が解除部材13から離れ、バ
ネ32−2cにより保持爪32をメッキ用治具20を保
持する方向(図4の矢印B方向)に回動させてメッキ用
治具20を保持する。図6は治具保持機構30の治具保
持部31にメッキ用治具20を保持した状態を示す図
で、図6(a)は正面図、図6(b)は平面図である。
また、治具保持部31にメッキ用治具20を保持させた
後は、解除部材13を後退させ元の位置に戻す。これに
より、治具保持部31を解除部材13に妨害されること
なく、メッキ槽10に下降させることができるようにな
る。
Subsequently, the plating jig 20 on which the substrate wf is mounted is placed on the jig holding portion 31 of the jig holding mechanism 30 with the opening 22a of the second jig member 22 facing upward. In this state, when the jig holding portion 31 is raised by the elevating mechanism 39, the claw release member 32-3 is separated from the release member 13, and the holding claw 32 is held by the spring 32-2c in the direction of holding the plating jig 20 ( The plating jig 20 is held by rotating in the direction of arrow B in FIG. 6A and 6B are diagrams showing a state where the plating jig 20 is held by the jig holding portion 31 of the jig holding mechanism 30. FIG. 6A is a front view, and FIG. 6B is a plan view.
After the jig holding section 31 holds the plating jig 20, the release member 13 is retracted and returned to the original position. Thereby, the jig holding portion 31 can be lowered into the plating tank 10 without being disturbed by the release member 13.

【0051】この状態で、昇降機構39により治具保持
部31を下降させ、メッキ槽10のメッキ液Qの中でメ
ッキを行う所定の位置まで下降させる。続いて、モータ
53を起動して回転機構55を作動させて回転軸42及
びアーム41を介して、メッキ槽10の外側に待避して
いた陽極電極板40をメッキ槽10の真上まで移動さ
る。続いてモータ43を起動し、昇降機構45を作動
し、陽極電極板40をメッキ槽10のメッキ液Qの中で
メッキを行う所定の位置まで下降させる。
In this state, the jig holding unit 31 is lowered by the lifting mechanism 39 to lower the plating solution Q in the plating tank 10 to a predetermined position where plating is performed. Subsequently, the motor 53 is activated to operate the rotating mechanism 55 to move the anode electrode plate 40 evacuated outside the plating tank 10 to a position directly above the plating tank 10 via the rotating shaft 42 and the arm 41. . Subsequently, the motor 43 is started, and the elevating mechanism 45 is operated to lower the anode electrode plate 40 to a predetermined position in the plating solution Q of the plating tank 10 where plating is performed.

【0052】次に、メッキ用電源(図示せず)の陽極を
陽極電極板40に電気的に接続(接続方法の図示は省
略)すると共に、陰極を治具保持部31の保持爪32の
保持具電極接点32−2、メッキ用治具20の治具外部
電極接点28及び導電部材27を通して基板wfの表面
の導電部に電気的に接続する。続いて、該メッキ用電源
から陽極電極板40と基板wfの間にメッキ電流を通電
し、基板wfのメッキ用治具20の開口部22aに露出
している面にメッキを施す。このメッキ期間中は、回転
機構36により、治具保持部31を低速で回転させる。
これにより、基板wfの露出面には膜厚の均一なメッキ
膜を形成できる。
Next, the anode of a plating power source (not shown) is electrically connected to the anode electrode plate 40 (the connection method is not shown), and the cathode is held by the holding claws 32 of the jig holding portion 31. It is electrically connected to the conductive portion on the surface of the substrate wf through the fixture electrode contact 32-2, the jig external electrode contact 28 of the plating jig 20, and the conductive member 27. Subsequently, a plating current is passed between the anode electrode plate 40 and the substrate wf from the plating power source, and plating is performed on the surface of the substrate wf exposed at the opening 22a of the plating jig 20. During this plating period, the jig holding unit 31 is rotated at a low speed by the rotation mechanism 36.
Thereby, a plating film having a uniform thickness can be formed on the exposed surface of the substrate wf.

【0053】上記メッキが終了したら、昇降機構45に
より、陽極電極板40をメッキ液面Wのメッキ槽10の
真上の所定の位置まで上昇させる。続いてモータ53を
起動し、回転機構55を動作させ、アーム51を介して
受皿50を陽極電極板40の真下に旋回移動させる。受
皿50は図7に示すように、縦横の寸法が陽極電極板4
0の直径より大きく、陽極電極板40から滴下するメッ
キ液を全て受けることができるようになっている。ま
た、受皿50に滴下したメッキ液は排出口56から排出
パイプ57を通ってメッキ装置外に排出される。
When the plating is completed, the raising / lowering mechanism 45 raises the anode electrode plate 40 to a predetermined position on the plating liquid surface W just above the plating tank 10. Subsequently, the motor 53 is started, the rotation mechanism 55 is operated, and the pan 50 is swirled and moved directly below the anode electrode plate 40 via the arm 51. As shown in FIG. 7, the pan 50 has the vertical and horizontal dimensions of the anode electrode plate 4.
It is larger than the diameter of 0 and can receive all of the plating solution dropped from the anode electrode plate 40. The plating solution dropped on the tray 50 is discharged from the plating apparatus through a discharge port 56 through a discharge pipe 57.

【0054】陽極電極板40を旋回させる回転軸42の
外周の所定の位置には、図8に示すように、突起部42
aが設けられており、受皿50を回転させる回転軸52
の内周には軸方向に2本の溝52a及び52bが設けら
れ、該溝52a及び52bに回転軸42の突起部42a
が挿入されるようになっている。該溝52aと52bは
略直角の角度間隔を設けて形成されている。
At a predetermined position on the outer periphery of the rotating shaft 42 for rotating the anode electrode plate 40, as shown in FIG.
a is provided, and a rotation shaft 52 for rotating the pan 50 is provided.
Are provided with two grooves 52a and 52b in the axial direction on the inner circumference thereof. The protrusions 42a of the rotating shaft 42 are formed in the grooves 52a and 52b.
Is to be inserted. The grooves 52a and 52b are formed at substantially right angle intervals.

【0055】上記のように、受皿50が陽極電極板40
の真下に位置した時はアーム51はアーム41の真下と
なり、この状態でアーム41を下降させると突起部42
aは溝52aに挿入される。この状態で回転機構55に
より回転軸52を回転させると陽極電極板40は受皿5
0と連動してメッキ槽10の外側に移動し、メッキ槽1
0の上方を開放する。
As described above, the tray 50 is connected to the anode electrode plate 40.
When the arm 51 is positioned directly below the arm 41, the arm 51 is positioned immediately below the arm 41.
a is inserted into the groove 52a. When the rotating shaft 52 is rotated by the rotating mechanism 55 in this state, the anode electrode plate 40 is
0 and moves to the outside of the plating tank 10 so that the plating tank 1
Open above 0.

【0056】続いて、昇降機構39により、治具保持部
31をメッキ液面Wの上の所定の位置まで上昇させる。
この状態で回転機構36により、治具保持部31を回転
軸33回りに高速回転させ、該回転による遠心力によ
り、基板wf、メッキ用治具20及び治具保持部31に
付着したメッキ液を飛散させ、該メッキ液を除去する。
Subsequently, the jig holding section 31 is raised to a predetermined position above the plating liquid level W by the lifting mechanism 39.
In this state, the jig holding unit 31 is rotated at high speed around the rotation axis 33 by the rotation mechanism 36, and the plating solution adhered to the substrate wf, the plating jig 20 and the jig holding unit 31 is removed by centrifugal force due to the rotation. Spatter and remove the plating solution.

【0057】続いて、昇降機構39により、治具保持部
31に解除部材13の上方まで移動させ、上記のように
複数の解除部材13をメッキ槽10の中央部に向かって
前進させ、爪解除部材32−3の下方に位置させる。続
いて昇降機構39により治具保持部31を下降させる
と、爪解除部材32−3の下端が解除部材13に当接
し、爪解除部材32−3は相対的に押し上げられる。こ
れにより保持爪32が支軸32−1を中心にメッキ用治
具20の保持を解除する方向に回動する。この状態で上
記基板wfを装着したメッキ用治具20を、例えばロボ
ットアームで取り出し、次の処理工程に移動させる。
Subsequently, the lifting mechanism 39 moves the jig holding unit 31 to a position above the release member 13, and advances the plurality of release members 13 toward the center of the plating tank 10 as described above to release the claw. It is located below the member 32-3. Subsequently, when the jig holding unit 31 is lowered by the elevating mechanism 39, the lower end of the claw release member 32-3 contacts the release member 13, and the claw release member 32-3 is relatively pushed up. Accordingly, the holding claw 32 rotates about the support shaft 32-1 in a direction in which the holding of the plating jig 20 is released. In this state, the plating jig 20 on which the substrate wf is mounted is taken out by, for example, a robot arm and moved to the next processing step.

【0058】なお、上記治具保持部31を回転軸33回
りに高速回転させ、該回転による遠心力によりメッキ液
を除去した後、治具保持部31から取り出したメッキ用
治具20を基板wfを装着したまま、洗浄し、乾燥させ
てから、基板wfを取り出せば、付着したメッキ液は完
全に除去される。
The jig holding section 31 is rotated at a high speed around the rotation axis 33, and after the plating solution is removed by centrifugal force due to the rotation, the plating jig 20 taken out of the jig holding section 31 is transferred to the substrate wf. If the substrate wf is taken out after washing and drying with the substrate mounted, the attached plating solution is completely removed.

【0059】また、回転軸52の溝52bは陽極電極板
40をメッキを行う位置に下降する時、回転軸42の突
起部42aが挿入される溝であり、該突起部42aが溝
52bの底部に当接した時、該陽極電極板40がメッキ
槽10内のメッキを行う位置(図1に示す位置)になる
ように形成している。
The groove 52b of the rotating shaft 52 is a groove into which the projection 42a of the rotating shaft 42 is inserted when the anode electrode plate 40 is lowered to the position where plating is performed, and the projection 42a is formed at the bottom of the groove 52b. The anode electrode plate 40 is formed so as to be in a position where plating is performed in the plating tank 10 (the position shown in FIG. 1) when the anode electrode plate 40 comes into contact therewith.

【0060】上記のように陽極電極板40をメッキ槽1
0の外側に移動させるとき、真下に該陽極電極板40よ
り若干大きい受皿50を配置するので、陽極電極板40
に付着したメッキ液が受皿50の外に滴下することはな
い。また、治具保持部31を回転軸33回りに回転さ
せ、該回転による遠心力により、基板wf、メッキ用治
具20及び治具保持部31に付着したメッキ液を除去し
てから、基板wfを装着したメッキ用治具20を移動さ
せ、該メッキ用治具20を取り出すので、基板wfの取
り出しに際し、基板wfにメッキ液が付着する恐れはな
い。
As described above, the anode electrode plate 40 is
0, the saucer 50 slightly larger than the anode electrode plate 40 is disposed immediately below the anode electrode plate 40.
The plating solution adhering to the plate does not drop out of the tray 50. Further, the jig holding unit 31 is rotated around the rotation axis 33, and the centrifugal force of the rotation removes the substrate wf, the plating jig 20 and the plating liquid attached to the jig holding unit 31, and then removes the substrate wf Is moved and the plating jig 20 is taken out, so that there is no possibility that the plating solution adheres to the substrate wf when the substrate wf is taken out.

【0061】図9は本発明に係る基板のメッキ装置の他
の構成例を示す図であ。図において、図1〜図9と同一
符号を付した部分は同一又は相当部分を示す(以下、他
の図面においても同様とする)。本メッキ装置はメッキ
槽10の上部に上部構造体15を設けると共に、該上部
構造体15に昇降・回転機構60を搭載している。昇降
・回転機構60には垂直下方に延びる回転軸61を設
け、該回転軸61の下端に治具保持部31を取り付けて
いる。即ち、ここでは治具保持部31、回転軸61及び
昇降・回転機構60等で治具保持機構30を構成してい
る。
FIG. 9 is a diagram showing another configuration example of the substrate plating apparatus according to the present invention. In the drawings, the portions denoted by the same reference numerals as those in FIGS. 1 to 9 indicate the same or corresponding portions (hereinafter, the same applies to other drawings). In the present plating apparatus, an upper structure 15 is provided above the plating tank 10, and an elevating / rotating mechanism 60 is mounted on the upper structure 15. The lifting / rotating mechanism 60 is provided with a rotating shaft 61 extending vertically downward, and the jig holding portion 31 is attached to a lower end of the rotating shaft 61. That is, here, the jig holding mechanism 30 includes the jig holding unit 31, the rotating shaft 61, the elevating / rotating mechanism 60, and the like.

【0062】治具保持機構30の治具保持部31は図3
に示す治具保持部31と略同一構造である。該治具保持
部31に保持されるメッキ用治具20は図2に示すメッ
キ用治具20と略同一構造である。ここでは治具保持部
31は上部構造体15から下向きに取り付けられ、メッ
キ用治具20はその開口部22aに露出される基板wf
の面が,下側になるように該治具保持部31に保持され
ている。また、陽極電極板40はメッキ用治具20の開
口部22aに対向して下方に配置されている。上部構造
体15の下面には治具保持部31の保持爪32を解除す
る爪解除部材32−3が当接する解除突起14が設けら
れている。
The jig holding section 31 of the jig holding mechanism 30 is shown in FIG.
Has substantially the same structure as the jig holder 31 shown in FIG. The plating jig 20 held by the jig holding portion 31 has substantially the same structure as the plating jig 20 shown in FIG. Here, the jig holding portion 31 is attached downward from the upper structure 15, and the plating jig 20 is mounted on the substrate wf exposed at the opening 22a.
Is held by the jig holding portion 31 such that the surface of the jig is on the lower side. Further, the anode electrode plate 40 is disposed below and facing the opening 22 a of the plating jig 20. A release projection 14 is provided on the lower surface of the upper structure 15 for contacting a claw release member 32-3 for releasing the holding claw 32 of the jig holding portion 31.

【0063】導電部材27はメッキ用治具20の第一治
具部材21の裏面(反開口部22aの側)の中央部に設
けられた、治具外部電極接点28に電気的に接続されて
いる。また、治具保持部31の基台31−1の中央部に
は該治具保持部31にメッキ用治具20を保持した場
合、上記治具外部電極接点28に当接する保持具電極接
点32−5が設けられている。
The conductive member 27 is electrically connected to a jig external electrode contact 28 provided at the center of the back surface (the side opposite to the opening 22 a) of the first jig member 21 of the plating jig 20. I have. When the plating jig 20 is held in the jig holding portion 31 at the center of the base 31-1 of the jig holding portion 31, the holding electrode contact 32 abuts on the jig external electrode contact 28. -5 is provided.

【0064】保持具電極接点32−5は図11に示すよ
うに、可動電極部材32−5bを具備し、基台31−1
の中央部に形成された凹状穴31−1aと可動電極部材
32−5bの間にバネ32−5cが介在し、可動電極部
材32−5bは上下動できる構造となっている。更に、
可動電極部材32−5bとバネ32−5cの外周に基台
31−1の中央部に形成された凸状部31−1bの外周
部に密着固定されたシール部材32−5dを設けた構造
である。
As shown in FIG. 11, the holder electrode contact 32-5 includes a movable electrode member 32-5b and a base 31-1.
A spring 32-5c is interposed between a concave hole 31-1a formed in the center of the movable electrode member and the movable electrode member 32-5b, and the movable electrode member 32-5b has a structure capable of moving up and down. Furthermore,
It has a structure in which a seal member 32-5d is provided on the outer periphery of the movable electrode member 32-5b and the spring 32-5c, which is tightly fixed to the outer periphery of the convex portion 31-1b formed at the center of the base 31-1. is there.

【0065】メッキ用治具20を治具保持部31に保持
した時、シール部材32−5dの先端部がメッキ用治具
20の第一治具部材21の表面に密接するから、治具外
部電極接点28と保持具電極接点32−5がメッキ液に
触れることがない。可動電極部材32−5bはメッキ電
源Eの陰極に電気的に接続され、該可動電極部材32−
5bは治具外部電極接点28を介して導電部材27に電
気的に接続されている。また、メッキ電源Eの陽極は陽
極電極板40に接続されている。
When the plating jig 20 is held by the jig holding portion 31, the tip of the sealing member 32-5 d comes into close contact with the surface of the first jig member 21 of the plating jig 20. The electrode contact 28 and the holder electrode contact 32-5 do not come into contact with the plating solution. The movable electrode member 32-5b is electrically connected to the cathode of the plating power source E,
5b is electrically connected to the conductive member 27 via the jig external electrode contact 28. The anode of the plating power source E is connected to the anode electrode plate 40.

【0066】上記構成の基板のメッキ装置において、基
板wfをメッキする際は、先ず、基板wfをメッキ用治
具20に装着する。治具保持機構30の治具保持部31
は、昇降・回転機構60により回転軸61を介してメッ
キ液面Wの上方で爪解除部材32−3が解除突起14に
当接位置より若干下方位置まで上昇され、昇降・回転機
構60により回転軸61を介して高速回転することによ
り、その遠心力により、治具保持部31に付着したメッ
キ液は飛散させ除去しておく。次に、昇降・回転機構を
搭載した上部構造体15を開閉手段により、図10に示
すようにメッキ用治具20を脱着する位置に移動し、こ
の状態で、昇降・回転機構60により治具保持部31を
上昇させ、爪解除部材32−3を解除突起14に当接さ
せると、保持爪32は開放する。
When plating the substrate wf in the substrate plating apparatus having the above configuration, first, the substrate wf is mounted on the plating jig 20. Jig holding part 31 of jig holding mechanism 30
The claw release member 32-3 is lifted above the plating liquid surface W by the lifting / lowering / rotating mechanism 60 via the rotating shaft 61 to a position slightly below the contact position with the release protrusion 14, and is rotated by the lifting / lowering / rotating mechanism 60. By rotating at high speed through the shaft 61, the centrifugal force causes the plating solution attached to the jig holding portion 31 to be scattered and removed. Next, the upper structure 15 equipped with the lifting / lowering / rotating mechanism is moved to a position where the plating jig 20 is attached / detached by the opening / closing means as shown in FIG. When the holding portion 31 is raised and the claw release member 32-3 is brought into contact with the release protrusion 14, the holding claw 32 is opened.

【0067】この状態で、例えばロボットアームで上記
基板wfを装着したメッキ用治具20をその第一治具部
材21が治具保持部31側になるように、治具保持部3
1に当接する。この状態で、昇降・回転機構60により
治具保持部31を爪解除部材32−3が解除突起14か
ら離れるまで移動させると、保持爪32はメッキ用治具
20を保持する方向に回動し、メッキ用治具20を治具
保持部31に保持する。
In this state, the plating jig 20 on which the substrate wf is mounted by, for example, a robot arm is moved so that the first jig member 21 is on the jig holding section 31 side.
Contact 1 In this state, when the jig holding unit 31 is moved by the lifting / lowering / rotating mechanism 60 until the claw release member 32-3 is separated from the release protrusion 14, the holding claw 32 rotates in the direction of holding the plating jig 20. Then, the plating jig 20 is held by the jig holding section 31.

【0068】次に、上部構造体を開閉手段によりメッキ
槽10上部の閉じた位置に移動し、昇降・回転機構60
により治具保持部31を下降させ、メッキ用治具20が
メッキ液Qの中でメッキを行う位置まで下降させる。こ
の状態で、メッキ電源Eより、陽極電極板40と基板w
fの間にメッキ電流を流し、メッキを行う。このメッキ
が行われている時、昇降・回転機構60により治具保持
部31を回転軸61回りに低速で回転させることによ
り、基板wfの開口部22aに露出した面に均一な膜厚
のメッキ膜を形成できる。
Next, the upper structure is moved to a closed position above the plating tank 10 by the opening / closing means, and the elevating / rotating mechanism 60 is moved.
As a result, the jig holding unit 31 is lowered, and the plating jig 20 is lowered to a position where plating is performed in the plating solution Q. In this state, the anode electrode plate 40 and the substrate w
A plating current is applied during f to perform plating. When this plating is being performed, the jig holding unit 31 is rotated around the rotation axis 61 at a low speed by the lifting / lowering / rotating mechanism 60, so that the surface exposed to the opening 22a of the substrate wf has a uniform thickness. A film can be formed.

【0069】メッキが終了した後は、昇降・回転機構6
0により治具保持部31をメッキ液面Wの上方で爪解除
部材32−3が解除突起14に当接する位置より若干下
方位置まで上昇させ、続いて昇降・回転機構60により
回転軸61を介して高速回転する。これにより遠心力
で、基板wfやメッキ用保持具20や治具保持部31に
付着したメッキ液を飛散させ除去する。次に上部構造体
15を開いた位置に移動し、この状態で、昇降・回転機
構60により治具保持部31を若干上部構造体15側に
移動させ、爪解除部材32−3を解除突起14に当接さ
せると、保持爪32は開放される。
After the plating is completed, the lifting and rotating mechanism 6
0, the jig holding portion 31 is raised above the plating liquid surface W to a position slightly below the position where the claw release member 32-3 abuts on the release protrusion 14, and then the lift / rotation mechanism 60 rotates the rotary shaft 61. Rotate at high speed. Thus, the plating solution adhering to the substrate wf, the plating holder 20 and the jig holder 31 is scattered and removed by the centrifugal force. Next, the upper structure 15 is moved to the open position. In this state, the jig holding portion 31 is slightly moved to the upper structure 15 side by the elevating / lowering mechanism 60, and the claw release member 32-3 is released from the release protrusion 14. , The holding claws 32 are released.

【0070】ロボットアームによりメッキ用治具20を
取り出し、次の工程の基板wfを取り出す位置に移送
し、そこで基板wfを、メッキ用治具20から取り出
す。このように治具保持部31を回転軸33回りに高速
回転させ、遠心力により、基板wf、メッキ用治具20
及び治具保持部31に付着したメッキ液を除去してか
ら、基板wfをメッキ用治具20を取り出すので、基板
wfの取り出しに際し該基板wfにメッキ液が付着する
恐れはない。
The plating jig 20 is taken out by the robot arm and transferred to a position where the substrate wf in the next step is taken out, and the substrate wf is taken out of the plating jig 20 there. Thus, the jig holding unit 31 is rotated at a high speed around the rotation axis 33, and the substrate wf and the plating jig 20 are rotated by centrifugal force.
The plating jig 20 is taken out of the substrate wf after removing the plating solution attached to the jig holding portion 31. Therefore, there is no possibility that the plating solution adheres to the substrate wf when the substrate wf is taken out.

【0071】図12は本発明に係る基板のメッキ装置の
他の構成例を示す図である。本メッキ装置は図示するよ
うに、メッキ槽10の上部構造体16の後端部に突起部
16aが形成されると共に該後端部がメッキ槽10の側
部に設けたブラケット67の上端部に支軸65を介して
回動自在に支承されている。突起部16aには支軸64
を介してシリンダ62のピストンロッド63の先端が支
承され、ブラケット67の下端分には支軸66を介して
シリンダ62の後端が支承されている。
FIG. 12 is a diagram showing another configuration example of the substrate plating apparatus according to the present invention. As shown in the figure, the present plating apparatus has a projection 16a formed at the rear end of the upper structure 16 of the plating tank 10, and the rear end is formed on the upper end of a bracket 67 provided on the side of the plating tank 10. It is rotatably supported via a support shaft 65. A support shaft 64 is provided on the protrusion 16a.
The front end of the piston rod 63 of the cylinder 62 is supported via the shaft 62, and the rear end of the cylinder 62 is supported at the lower end of the bracket 67 via the support shaft 66.

【0072】そしてシリンダ62を作動させてピストン
ロッド63を伸ばすことにより、上部構造体16はメッ
キ槽10の上部を覆って閉塞すると共に、ピストンロッ
ド63を縮めることにより、上部構造体16は支軸65
を中心に回動し、図13に示すような位置、即ち基板保
持手段100に基板wfを装着したり、基板保持手段1
00から基板wfを取り外す位置(上部構造体16を開
放した状態)に移動する。ここでシリンダ62、ピスト
ンロッド63は上部構造体16の開閉を行う開閉機構を
構成している。この開閉機構は図9の上部構造体15を
開閉する開閉機構と略同じ構造である。
By operating the cylinder 62 to extend the piston rod 63, the upper structure 16 covers and covers the upper part of the plating tank 10, and by contracting the piston rod 63, the upper structure 16 is pivoted. 65
To the position shown in FIG. 13, that is, when the substrate wf is mounted on the substrate holding means 100 or the substrate holding means 1
The substrate is moved from 00 to a position where the substrate wf is removed (the upper structure 16 is opened). Here, the cylinder 62 and the piston rod 63 constitute an opening and closing mechanism for opening and closing the upper structure 16. This opening and closing mechanism has substantially the same structure as the opening and closing mechanism for opening and closing the upper structure 15 in FIG.

【0073】基板保持手段100は円板状の第一保持部
材101と基板wfのメッキを施す面を露出させるため
の開口部102aが形成された円環状の第二治具保持部
材102を具備する。第一保持部材101の外周部には
複数個(ここでは3個)の保持爪103が設けられてい
る。第一保持部材101の基板収容凹部に基板wfを収
容し、その上に第二保持部材102を載置し、保持爪1
03で第二保持部材102の縁部を挟持することによ
り、基板wfをそのメッキを施す面を開口部102aに
露出させて、第一保持部材101と第二保持部材102
の間に挟持する。
The substrate holding means 100 includes a disk-shaped first holding member 101 and an annular second jig holding member 102 having an opening 102a for exposing a surface of the substrate wf to be plated. . A plurality of (here, three) holding claws 103 are provided on an outer peripheral portion of the first holding member 101. The substrate wf is accommodated in the substrate accommodating recess of the first holding member 101, and the second holding member 102 is placed thereon, and the holding claw 1
03, the edge of the second holding member 102 is sandwiched to expose the plating surface of the substrate wf to the opening 102a, and the first holding member 101 and the second holding member 102
Sandwiched between.

【0074】第二保持部材102の開口部102aの外
周部には第一シール部材105が設けられ、その外側に
所定の間隔を設けて第二シール部材106が設けられて
いる。第一シール部材105と第二シール部材106に
より、基板wfの表面縁部と裏面がメッキ液Qに触れな
いようになっている。なお、図14に示すように、保持
爪103はバネ103aで常時支軸103bを中心に第
二保持部材102と第一保持部材101を互いに結合す
る方向に付勢され、該保持爪103の後端部を押すこと
により、支軸103bを中心にして該結合を解除する方
向に回動する。
A first seal member 105 is provided on the outer periphery of the opening 102a of the second holding member 102, and a second seal member 106 is provided outside the first seal member 105 at a predetermined interval. The first seal member 105 and the second seal member 106 prevent the front edge and the rear surface of the substrate wf from touching the plating solution Q. As shown in FIG. 14, the holding claw 103 is constantly urged by a spring 103a in a direction of connecting the second holding member 102 and the first holding member 101 around the support shaft 103b. By pressing the end, the pivot is turned around the support shaft 103b in a direction to release the connection.

【0075】上部構造体16の上部には移動・回転機構
80が搭載され、該移動・回転機構80から回転軸68
が延びて設けられ、該回転軸68の先端には基板保持手
段100の第一保持部材101が固定されている。即
ち、ここでは図1に示すように、治具保持機構30の治
具保持部31を介することなく、直接又は間接的に回転
軸68の先端に基板保持手段100を取り付けている。
また、第一保持部材101の外周部には複数個(ここで
は3個)の保持爪103を設けている。
A moving / rotating mechanism 80 is mounted on the upper part of the upper structure 16.
The first holding member 101 of the substrate holding means 100 is fixed to the tip of the rotating shaft 68. That is, as shown in FIG. 1, the substrate holding means 100 is directly or indirectly attached to the tip of the rotating shaft 68 without going through the jig holding portion 31 of the jig holding mechanism 30.
Further, a plurality of (here, three) holding claws 103 are provided on an outer peripheral portion of the first holding member 101.

【0076】図14は上記保持爪103の構造を示す斜
視図である。図示するように、保持爪103は第一保持
部材101の外周部に取り付けたブラケット101aの
端部に支軸103bで回動自在に支承され、更にバネ1
03aで第二保持部材102を第一保持部材101に押
し付ける矢印A方向(第一保持部材101と第二保持部
材102を結合させる方向)に付勢されている。保持爪
103の後端部103cを押すことにより、該保持爪1
03は反矢印A方向(第一保持部材101と第二保持部
材102の結合を解除する方向)に回動する。
FIG. 14 is a perspective view showing the structure of the holding claw 103. As shown in FIG. As shown in the drawing, the holding claw 103 is rotatably supported on an end of a bracket 101a attached to the outer periphery of the first holding member 101 by a support shaft 103b.
At 03a, the second holding member 102 is urged in the arrow A direction (the direction in which the first holding member 101 and the second holding member 102 are joined) to press the first holding member 101 against the first holding member 101. By pressing the rear end 103c of the holding claw 103, the holding claw 1 is pressed.
Numeral 03 rotates in a direction opposite to arrow A (a direction in which the first holding member 101 and the second holding member 102 are disconnected).

【0077】上部構造体16の下面には保持爪103の
後端部103cを押す複数個(ここでは3個)の解除部
材17が設けられており、該解除部材17がメッキ槽1
0の中央部に向かって(矢印B方向)進退できるように
なっている。図15はこの解除機構の構成を示す図であ
り、シリンダ18により、解除部材17を矢印B方向に
進退させることができるようになっている。即ち、解除
部材17とシリンダ18等で保持爪103の結合を解除
する解除機構70を構成している。該解除機構70は保
持爪103の数に応じた個数(ここでは3個)が基板保
持手段100の外周に配置されている。なお、図15
(a)は平面図、図15(b)は側面図である。
A plurality (three in this case) of release members 17 for pressing the rear end portion 103c of the holding claw 103 are provided on the lower surface of the upper structure 16, and the release members 17
0 (in the direction of arrow B). FIG. 15 is a view showing the configuration of this release mechanism. The release member 17 can be advanced and retracted in the direction of arrow B by the cylinder 18. That is, a release mechanism 70 that releases the connection between the holding claw 103 by the release member 17 and the cylinder 18 or the like is configured. The number of the release mechanisms 70 (three in this case) corresponding to the number of the holding claws 103 is arranged on the outer periphery of the substrate holding means 100. Note that FIG.
15A is a plan view, and FIG. 15B is a side view.

【0078】図16は上記解除部材17を矢印D方向に
進退させる解除機構70の他の構成例を示す図である。
解除機構70は図示するように、回転軸68の外周に回
転可能な円板状歯車71を配置し、該円板状歯車71に
は支軸73で回転自在に支承された3個のクランク72
の一端が枢着され、該クランク72の他端にはロッド7
4が支承され、更に該ロッド74に解除部材17が取り
付けられている。円板状歯車71はモータ76によりウ
ォーム歯車75を介して矢印E方向に回動できるように
なっている。従って、モータ76により円板状歯車71
を矢印E方向に回動することにより、解除部材17は矢
印B方向に進退し、3個の保持爪103を同時に解除す
ることができる。
FIG. 16 is a view showing another configuration example of the release mechanism 70 for moving the release member 17 in the direction of arrow D.
As shown in the figure, the release mechanism 70 has a rotatable disk gear 71 disposed on the outer periphery of a rotary shaft 68, and three cranks 72 rotatably supported by a support shaft 73 on the disk gear 71.
One end of the crank 72 is pivotally mounted, and the other end of the crank 72 is
4 is supported, and a release member 17 is further attached to the rod 74. The disk gear 71 can be rotated in the direction of arrow E by a motor 76 via a worm gear 75. Therefore, the disk-shaped gear 71 is
Is rotated in the direction of arrow E, the release member 17 advances and retreats in the direction of arrow B, and the three holding claws 103 can be released simultaneously.

【0079】移動・回転機構80は回転軸68を回転さ
せて基板保持手段100を回転すると共に、該回転軸6
8を軸方向に移動させて基板保持手段100を同方向に
移動させるようになっている。図17は上記移動・回転
機構80の構成例を示す図で、図17(a)は正面図、
図17(b)は上面図(フレーム81を除いた状態)で
ある。上部構造体16のフレーム81の下面には所定の
間隔をおいて円板82が固定され、該円板82の上部に
は内歯車83がその外周を3個の案内ローラー84に案
内されて回転可能に配置されている。
The moving / rotating mechanism 80 rotates the rotating shaft 68 to rotate the substrate holding means 100 and the rotating shaft 6
8 is moved in the axial direction to move the substrate holding means 100 in the same direction. FIG. 17 is a diagram showing a configuration example of the moving / rotating mechanism 80. FIG.
FIG. 17B is a top view (with the frame 81 removed). A disc 82 is fixed at a predetermined interval to the lower surface of the frame 81 of the upper structure 16, and an internal gear 83 is guided above the disc 82 by rotating its outer periphery by three guide rollers 84. It is arranged as possible.

【0080】85は螺子棒で、該螺子棒85は内歯車8
3の内側に3本等角度で配置され、各々の螺子棒85の
下端には内歯車83の内歯に噛み合う歯車86が設けら
れている。87は移動・回転機構80の枠体であり、該
枠体87は円筒状でその外周には上下一対ずつ計6個の
ブラケット88が取り付けられている。上下一対のブラ
ケット88はその内側に各螺子棒85に螺合する螺子溝
が形成されている。また、枠体87には回転軸68を回
転させるモータ89が搭載されている。また、内歯車8
3はモータ90により歯車91を介して回転するように
なっている。
Reference numeral 85 denotes a screw rod.
The three gear rods 85 are arranged at equal angles on the inside of the gear 3, and the lower end of each screw rod 85 is provided with a gear 86 that meshes with the internal teeth of the internal gear 83. Reference numeral 87 denotes a frame of the moving / rotating mechanism 80. The frame 87 has a cylindrical shape, and a pair of upper and lower brackets 88 are mounted on the outer periphery of the frame 87. A pair of upper and lower brackets 88 has screw grooves formed on the inside thereof to be screwed into the respective screw rods 85. A motor 89 for rotating the rotating shaft 68 is mounted on the frame 87. Also, the internal gear 8
The motor 3 is rotated by a motor 90 via a gear 91.

【0081】上記構成の移動・回転機構80において、
モータ90を起動して内歯車83を回転させると、3個
の歯車86が同時に回転し、3本の螺子棒85も同時に
回転する。これによりブラケット88を介して枠体87
が昇降し、回転軸68及びこれに取り付けられた基板保
持手段100も昇降する。また、モータ89を起動する
ことにより、回転軸68及びこれに取り付けられた基板
保持手段100が回転する。
In the moving / rotating mechanism 80 having the above structure,
When the motor 90 is started to rotate the internal gear 83, the three gears 86 rotate at the same time, and the three screw rods 85 rotate at the same time. As a result, the frame 87 via the bracket 88
Move up and down, and the rotating shaft 68 and the substrate holding means 100 attached thereto also move up and down. When the motor 89 is started, the rotating shaft 68 and the substrate holding means 100 attached to the rotating shaft 68 rotate.

【0082】上記構成の基板のメッキ装置で基板wfに
メッキする場合は、図18に示す手順に従って行う。先
ず、シリンダ62を起動し、上部構造体16を図18
(a)に示すように、その底面が斜め上方を向くように
する。このとき図15又は図16に示す解除機構を起動
し、3個の解除部材17は同時に上部構造体16の中央
側に前進させ、各々の保持爪103の後端を同時に押
し、結合を解除する。これにより、基板保持手段100
の第二保持部材102は第一保持部材101から取り外
すことができるようになる。
When plating the substrate wf with the substrate plating apparatus having the above structure, the plating is performed according to the procedure shown in FIG. First, the cylinder 62 is activated, and the upper structure 16 is moved to the position shown in FIG.
As shown in (a), the bottom face is directed obliquely upward. At this time, the release mechanism shown in FIG. 15 or FIG. 16 is activated, and the three release members 17 are simultaneously advanced toward the center of the upper structure 16 to simultaneously push the rear ends of the holding claws 103 to release the connection. . Thereby, the substrate holding means 100
The second holding member 102 can be detached from the first holding member 101.

【0083】この状態で、基板wfを第一保持部材10
1の基板収納用凹部にメッキを施す面を上にして載置す
る。その上に第二保持部材102を載置し、上記解除機
構により3個の解除部材17をもとの位置に戻すと、図
18(b)に示すように、第一保持部材101と第二保
持部材102の間に基板wfを挟んで、該第一保持部材
101と第二保持部材102を3個の結合爪103で結
合させる。
In this state, the substrate wf is moved to the first holding member 10.
The substrate-receiving recess is placed with the surface to be plated facing up. When the second holding member 102 is placed thereon and the three release members 17 are returned to their original positions by the above-described release mechanism, as shown in FIG. The first holding member 101 and the second holding member 102 are joined by three joining claws 103 with the substrate wf interposed between the holding members 102.

【0084】続いて、シリンダ62を起動し、図18
(c)に示すように、上部構造体16をメッキ槽10の
上部に被せる。この状態で移動・回転機構80により、
基板保持手段100をメッキ液Q中の所定の位置まで下
降させる。この状態で基板wfと陽極電極板40の間に
メッキ電流を通電しメッキを行う。このメッキに際し、
移動・回転機構80により図18(d)に示すように、
基板保持手段100を低速で回転させることにより、基
板wfに均一な膜厚のメッキ膜を形成できる。
Subsequently, the cylinder 62 is started, and FIG.
As shown in (c), the upper structure 16 is put on the plating tank 10. In this state, the moving / rotating mechanism 80
The substrate holding means 100 is lowered to a predetermined position in the plating solution Q. In this state, plating current is applied between the substrate wf and the anode electrode plate 40 to perform plating. When plating,
As shown in FIG. 18D by the movement / rotation mechanism 80,
By rotating the substrate holding means 100 at a low speed, a plating film having a uniform thickness can be formed on the substrate wf.

【0085】メッキが終了したら、移動・回転機構80
により、基板保持手段100をメッキ液Qの液面上に上
昇させる。続いて、図18(e)に示すように、この位
置で基板保持手段100を高速回転させ、その遠心力で
基板wfや基板保持手段100に付着したメッキ液を除
去する。
When the plating is completed, the moving / rotating mechanism 80
As a result, the substrate holding means 100 is raised above the level of the plating solution Q. Subsequently, as shown in FIG. 18E, the substrate holding means 100 is rotated at this position at a high speed, and the plating solution attached to the substrate wf and the substrate holding means 100 is removed by the centrifugal force.

【0086】続いて、シリンダ62を起動し、図18
(f)に示すように、上部構造体16の底面が斜め上方
を向く位置まで回動させる。この状態で、図18(g)
に示すように、上記解除機構70を起動し、3個の解除
部材17は同時に上部構造体16の中央側に前進させ、
各々の保持爪103の後端を同時に押し、結合を解除す
る。これにより、基板保持手段100の第二保持部材1
02は第一保持部材101から取り外し、メッキの終了
した基板wfをロボットアーム等により取り外し、次の
工程に移送する。
Subsequently, the cylinder 62 is started, and FIG.
As shown in (f), the upper structure 16 is rotated to a position where the bottom surface faces obliquely upward. In this state, FIG.
As shown in FIG. 7, the release mechanism 70 is activated, and the three release members 17 are simultaneously advanced toward the center of the upper structure 16,
The rear ends of the holding claws 103 are simultaneously pushed to release the connection. Thereby, the second holding member 1 of the substrate holding means 100
02 is removed from the first holding member 101, the substrate wf after plating is removed by a robot arm or the like, and transferred to the next step.

【0087】上記のように、基板保持手段100を高速
回転させ、遠心力により、基板wfや基板保持手段10
0に付着したメッキ液を除去してから、基板wfを基板
保持手段100を取り出すので、基板wfの取り出しに
際し該基板wfにメッキ液が付着する恐れはない。
As described above, the substrate holding means 100 is rotated at a high speed, and the substrate wf and the substrate holding means 10 are rotated by centrifugal force.
After removing the plating solution attached to the substrate 0, the substrate wf is taken out of the substrate holding means 100. Therefore, there is no danger that the plating solution will adhere to the substrate wf when the substrate wf is taken out.

【0088】[0088]

【発明の効果】以上、説明したように各請求項に記載の
発明によれば下記のような優れた効果が得られる。
As described above, according to the invention described in each claim, the following excellent effects can be obtained.

【0089】請求項1に記載の発明によれば、メッキ用
治具に基板を装着し、該メッキ用治具を治具保持手段の
治具保持部に保持して、電解メッキを行うので、メッキ
用治具に装着された基板は開口に露出した面しかメッキ
液に触れることがないから、メッキ面以外にメッキ液が
付着し、メッキ金属が基板内に拡散する等の不都合がな
くなる。
According to the first aspect of the present invention, the substrate is mounted on the plating jig, the plating jig is held by the jig holding portion of the jig holding means, and electrolytic plating is performed. Since only the surface of the substrate mounted on the plating jig is exposed to the plating solution, the plating solution does not adhere to the surface other than the plating surface, thereby eliminating the inconvenience of the plating metal being diffused into the substrate.

【0090】また、請求項2に記載の発明によれば、基
板をメッキ用治具に装着してから、各工程を行うので、
基板はメッキ用治具でメッキ液に触れるようになってい
る面以外にはメッキ液が触れることはないので、メッキ
金属が基板内に拡散する等の不都合がない基板のメッキ
を行うことができる。
According to the second aspect of the present invention, each step is performed after the substrate is mounted on the plating jig.
Since the substrate does not come into contact with the plating solution except for the surface where the plating jig comes into contact with the plating solution, it is possible to perform plating of the substrate without inconvenience such as diffusion of the plating metal into the substrate. .

【0091】また、請求項3に記載の発明は、メッキ工
程が終了した後、治具保持手段に搭載されたメッキ用治
具をメッキ液外に移動させた後回転させて遠心力でメッ
キ液を飛散させ取り除くので、陽極電極板がメッキ用治
具の上方に無い場合、即ち基板のメッキを施す面が下向
きで陽極電極板で治具保持手段より下方にある場合又は
陽極電極板が無い場合においても、基板をメッキ用治具
から取り外す際、基板にメッキ液が付着する恐れが全く
ない。
Further, according to the third aspect of the present invention, after the plating step is completed, the plating jig mounted on the jig holding means is moved out of the plating solution and then rotated to rotate the plating solution by centrifugal force. When the anode electrode plate is not above the jig for plating, that is, when the surface to be plated of the substrate faces downward and the anode electrode plate is below the jig holding means, or when there is no anode electrode plate Also, when the substrate is removed from the plating jig, there is no possibility that the plating solution adheres to the substrate.

【0092】また、請求項4に記載の発明によれば、基
板を該メッキ用治具で保持したまま洗浄及び乾燥を行う
ので、基板をメッキ用治具から取り外す際、基板にメッ
キ液が付着する恐れが全くない。
According to the fourth aspect of the present invention, since the substrate is washed and dried while holding the substrate with the plating jig, when the substrate is removed from the plating jig, the plating solution adheres to the substrate. There is no fear of doing it.

【0093】また、請求項5に記載の発明によれば、基
板は基板保持手段の第二保持部材の開口に露出した面の
みがメッキ液に触れるので、他の面はメッキ液に触れる
ことなく、電解メッキを終了させ、メッキ終了後は昇降
手段で基板保持手段をメッキ液面上に上昇させ、回転手
段で高速回転させ、メッキ液を除去することができるか
ら、基板のメッキ面以外は全くメッキ液に触れることが
ない。また、メッキ期間中は基板を保持した基板保持手
段を低速回転させるので開口に露出した基板の面に膜厚
の均一なメッキ膜を形成できる。
According to the fifth aspect of the present invention, only the surface of the substrate exposed to the opening of the second holding member of the substrate holding means contacts the plating solution, so that the other surface does not contact the plating solution. After the electroplating is completed, after the plating is completed, the substrate holding means is raised above the plating liquid surface by the elevating means, and is rotated at a high speed by the rotating means, so that the plating liquid can be removed. No contact with plating solution. In addition, since the substrate holding means holding the substrate is rotated at a low speed during the plating period, a plating film having a uniform thickness can be formed on the surface of the substrate exposed at the opening.

【0094】また、請求項6に記載の発明によれば、基
板を基板保持手段の第一保持部材と第二保持部材の間に
挟持して保持させてから、上記各工程を行うので、基板
はメッキ用治具でメッキ液に触れるようになっている面
以外にはメッキ液が触れることはない。特にメッキ終了
後、基板保持手段をメッキ液面上にまで移動させ回転さ
せてメッキ液を除去するので、基板を基板保持手段から
取り外す際に、基板にメッキ液が付着する恐れがない。
According to the present invention, each of the above-described steps is performed after the substrate is sandwiched and held between the first holding member and the second holding member of the substrate holding means. The plating solution does not come into contact with the plating jig except for the surface that is in contact with the plating solution. In particular, since the plating solution is removed by moving the substrate holding means above the plating liquid surface and rotating it after plating is completed, there is no possibility that the plating liquid will adhere to the substrate when the substrate is removed from the substrate holding means.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の基板のメッキ装置の構成例を示す図で
ある。
FIG. 1 is a diagram showing a configuration example of a substrate plating apparatus of the present invention.

【図2】本発明のメッキ装置に用いるメッキ用治具の構
造を示す図で、図2(a)は正面図、図2(b)は平面
図、図2(c)は断面図である。
2 (a) is a front view, FIG. 2 (b) is a plan view, and FIG. 2 (c) is a cross-sectional view showing the structure of a plating jig used in the plating apparatus of the present invention. .

【図3】本発明のメッキ装置の治具保持部の構造を示す
図で、図3(a)は正面図、図3(b)は平面図、図3
(c)は保持爪を示す斜視図である。
3 (a) is a front view, FIG. 3 (b) is a plan view, and FIG. 3 (b) is a view showing a structure of a jig holding portion of the plating apparatus of the present invention.
(C) is a perspective view showing a holding claw.

【図4】図1のA部分の詳細を示す図である。FIG. 4 is a diagram showing details of a portion A in FIG. 1;

【図5】本発明のメッキ装置の治具保持部の保持具電極
接点の構造を示す断面図である。
FIG. 5 is a cross-sectional view showing a structure of a holder electrode contact of a jig holder of the plating apparatus of the present invention.

【図6】本発明のメッキ装置の治具保持部にメッキ用治
具を保持した状態を示す図で、図6(a)は正面図、図
6(b)は平面図である。
6A and 6B are diagrams showing a state in which a plating jig is held by a jig holding portion of the plating apparatus of the present invention, wherein FIG. 6A is a front view and FIG. 6B is a plan view.

【図7】本発明のメッキ装置の陽極電極板及び受皿を示
す平面図である。
FIG. 7 is a plan view showing an anode electrode plate and a saucer of the plating apparatus of the present invention.

【図8】陽極電極板及び受皿を旋回させる回転軸の上部
構造を示す図である。
FIG. 8 is a diagram showing an upper structure of a rotating shaft for rotating the anode electrode plate and the tray.

【図9】本発明の基板のメッキ装置の構成例を示す図で
あ。
FIG. 9 is a diagram showing a configuration example of a substrate plating apparatus of the present invention.

【図10】図9に示す基板のメッキ装置の上部構造体を
開放した状態を示す図である。
10 is a diagram showing a state where an upper structure of the plating apparatus for a substrate shown in FIG. 9 is opened.

【図11】本発明のメッキ装置の治具保持部の保持具電
極接点の構造を示す断面図である。
FIG. 11 is a cross-sectional view showing a structure of a holder electrode contact of a jig holder of the plating apparatus of the present invention.

【図12】本発明の基板のメッキ装置の構成例を示す図
である。
FIG. 12 is a diagram showing a configuration example of a substrate plating apparatus according to the present invention.

【図13】図11に示す基板のメッキ装置の上部構造体
を開放した状態を示す図である。
13 is a diagram showing a state where an upper structure of the plating apparatus for a substrate shown in FIG. 11 is opened.

【図14】本発明の基板のメッキ装置の基板保持手段の
保持爪の構造を示す斜視図である。
FIG. 14 is a perspective view showing the structure of the holding claws of the substrate holding means of the substrate plating apparatus of the present invention.

【図15】本発明の基板のメッキ装置の基板保持手段の
保持爪解除機構の構成例を示す図で、図15(a)は平
面図、図15(b)は側面図である。
15A and 15B are diagrams showing a configuration example of a holding claw releasing mechanism of a substrate holding means of the substrate plating apparatus of the present invention, wherein FIG. 15A is a plan view and FIG. 15B is a side view.

【図16】本発明の基板のメッキ装置の基板保持手段の
保持爪解除機構の構成例を示す平面図である。
FIG. 16 is a plan view showing a configuration example of a holding claw releasing mechanism of a substrate holding means of the substrate plating apparatus of the present invention.

【図17】本発明の基板のメッキ装置の移動・回転機構
の構成例を示す図で、図17(a)は正面図、図17
(b)は上面図である。
17A and 17B are diagrams showing a configuration example of a moving / rotating mechanism of a substrate plating apparatus according to the present invention, wherein FIG.
(B) is a top view.

【図18】図11に示す基板のメッキ装置を用いたメッ
キ手順を示す図である。
18 is a diagram showing a plating procedure using the substrate plating apparatus shown in FIG.

【符号の説明】[Explanation of symbols]

10 メッキ槽 13 解除部材 20 メッキ用治具 21 第一治具部材 22 第二治具部材 23 結合爪 25 第一シール部材 26 第二シール部材 27 導電部材 28 治具外部電極接点 30 治具保持機構 31 治具保持部 32 保持爪 33 回転軸 36 回転機構 39 昇降機構 40 陽極電極板 41 アーム 42 回転軸 45 昇降機構 50 受皿 51 アーム 52 回転軸 55 回転機構 60 昇降・回転機構 61 回転軸 62 シリンダ 68 回転軸 70 解除機構 80 移動・回転機構 100 基板保持手段 101 第一保持部材 102 第二保持部材 103 保持爪 105 第一シール部材 106 第二シール部材 107 導電部材 DESCRIPTION OF SYMBOLS 10 Plating tank 13 Release member 20 Plating jig 21 First jig member 22 Second jig member 23 Coupling claw 25 First seal member 26 Second seal member 27 Conductive member 28 Jig external electrode contact 30 Jig holding mechanism REFERENCE SIGNS LIST 31 jig holding portion 32 holding claw 33 rotating shaft 36 rotating mechanism 39 elevating mechanism 40 anode electrode plate 41 arm 42 rotating shaft 45 elevating mechanism 50 receiving pan 51 arm 52 rotating shaft 55 rotating mechanism 60 elevating / rotating mechanism 61 rotating shaft 62 cylinder 68 Rotating shaft 70 Release mechanism 80 Moving / rotating mechanism 100 Substrate holding means 101 First holding member 102 Second holding member 103 Holding claw 105 First seal member 106 Second seal member 107 Conductive member

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 メッキ液を収容したメッキ槽内でメッキ
用治具に保持された基板と陽極電極板を配置し、該陽極
電極板と該基板の間にメッキ電流を通電して該基板にメ
ッキを施す基板のメッキ装置において、 前記メッキ用治具には前記基板のメッキを施す面を露出
する開口が形成され、該開口の周囲にシール部材が取り
付けられ、該シール部材によりメッキ液に触れないよう
にした該基板の表面縁部に当接する導電部材を設け、当
該メッキ用治具の外面の所定の位置に該導電部材に電源
を接続するための治具外部電極接点を設け、 前記メッキ槽の内部で前記メッキ用治具を保持する治具
保持部を有する治具保持手段を設け、該治具保持手段は
治具保持部に該メッキ用治具を保持した状態で前記治具
外部電極接点に当接する保持具電極接点を具備すること
を特徴とする基板のメッキ装置。
A substrate held by a plating jig and an anode electrode plate are arranged in a plating tank containing a plating solution, and a plating current is applied between the anode electrode plate and the substrate to apply a current to the substrate. In a plating apparatus for a substrate to be plated, an opening for exposing a surface of the substrate to be plated is formed in the plating jig, a seal member is attached around the opening, and the plating member is exposed to a plating solution by the seal member. A conductive member is provided in contact with a surface edge of the substrate, and a jig external electrode contact for connecting a power source to the conductive member is provided at a predetermined position on an outer surface of the plating jig. A jig holding unit having a jig holding unit for holding the plating jig is provided inside the tank, and the jig holding unit holds the plating jig in the jig holding unit. Holder that contacts the electrode contact Plating apparatus of the substrate, characterized by.
【請求項2】 基板を電解メッキする基板のメッキ方法
であって、 前記基板をメッキ用治具に装着する工程、該基板を装着
したメッキ用治具を治具保持手段に搭載し保持する工
程、該治具保持手段に搭載されたメッキ用治具をメッキ
槽のメッキ液中の所定の位置に配置する工程、陽極電極
板をメッキ槽のメッキ液中の所定の位置に配置する工
程、該陽極電極板と基板の間にメッキ電流を流し電解メ
ッキを行う工程、該陽極電極板をメッキ槽外に移動する
工程、前記治具保持手段に搭載されたメッキ用治具をメ
ッキ液外のメッキ用治具取外し位置に移動する工程、該
治具保持手段に搭載されたメッキ用治具の保持を解除す
る工程、該治具保持手段からメッキ用治具を取り除く工
程、該基板をメッキ用治具から取り出す工程からなるこ
とを特徴とする基板のメッキ方法。
2. A method of plating a substrate by electroplating the substrate, comprising: mounting the substrate on a plating jig; and mounting and holding the plating jig with the substrate mounted on a jig holding means. Arranging a plating jig mounted on the jig holding means at a predetermined position in a plating solution of a plating tank; arranging an anode electrode plate at a predetermined position in a plating solution of a plating tank; A step of flowing a plating current between the anode electrode plate and the substrate to perform electrolytic plating, a step of moving the anode electrode plate out of the plating tank, and plating the plating jig mounted on the jig holding means outside the plating solution. Moving the jig to the jig removal position, releasing the holding of the plating jig mounted on the jig holding means, removing the plating jig from the jig holding means, and removing the plating jig from the jig holding means. It is characterized by comprising the process of taking out from the tool Plating method of a substrate that.
【請求項3】 基板をメッキする基板のメッキ方法であ
って、 前記基板をメッキ用治具に装着する工程、該基板を装着
したメッキ用治具を治具保持手段に搭載し保持する工
程、該治具保持手段に搭載されたメッキ用治具をメッキ
槽のメッキ液中の所定の位置に配置する工程、該メッキ
用治具から露出された基板表面にメッキを行う工程、前
記治具保持手段に搭載されたメッキ用治具をメッキ液外
に移動させた後回転させて遠心力でメッキ液を飛散させ
取り除く工程、該治具保持手段をメッキ用治具を取り外
す位置に移動する工程、該治具保持手段からメッキ用治
具を取り除く工程、該メッキ用治具から基板を取り出す
工程からなることを特徴とする基板のメッキ方法。
3. A method of plating a substrate for plating a substrate, comprising: mounting the substrate on a plating jig; mounting and holding the plating jig with the substrate mounted on a jig holding means; Disposing a plating jig mounted on the jig holding means at a predetermined position in a plating solution in a plating tank; performing plating on a substrate surface exposed from the plating jig; Moving the plating jig mounted on the means out of the plating solution and then rotating to remove the plating solution by centrifugal force, removing the plating jig, and moving the jig holding means to a position where the plating jig is removed; A method for plating a substrate, comprising: a step of removing a plating jig from the jig holding means; and a step of removing a substrate from the plating jig.
【請求項4】 基板にメッキをする基板のメッキ方法で
あって、 前記基板を保持したメッキ用治具を治具保持手段に保持
させてメッキを行った後、メッキを施した基板を該メッ
キ用治具で保持したまま洗浄及び乾燥を行い、該基板の
メッキを施していない面にメッキ液が付着することが無
い状態で基板をメッキ用治具から取り外すことを特徴と
する基板のメッキ方法。
4. A method of plating a substrate, wherein the plating is performed by holding a plating jig holding the substrate by a jig holding means, and then plating the plated substrate. Cleaning and drying while holding the substrate with a jig, and removing the substrate from the plating jig in a state where the plating solution does not adhere to the unplated surface of the substrate. .
【請求項5】 メッキ液を収容したメッキ槽内に配置さ
れた基板保持手段に保持された基板と陽極電極板の間に
メッキ電流を通電して該基板にメッキを施す基板のメッ
キ装置において、 前記基板保持手段は基板を挟持する第一保持部材と第二
保持部材を具備し、該第二保持部材は基板のメッキを施
す面を露出する開口と、該開口の周囲に取り付けたシー
ル部材と、該シール部材によってメッキ液に触れないよ
うに区画された前記基板の表面縁部に当接する導電部材
を具備し、該基板をメッキを施す面を下に向けて保持す
るように構成され、 前記基板保持手段に基板を保持した状態でその面内で回
転軸回りに回転させる回転手段及び/又は該回転軸の軸
方向に移動させる移動手段を前記メッキ槽の上部に配置
された上部構造体に取り付け、 前記上部構造体を開閉駆動する構造体開閉駆動手段を設
けたことを特徴とする基板のメッキ装置。
5. A plating apparatus for plating a substrate by applying a plating current between an anode electrode plate and a substrate held by a substrate holding means disposed in a plating tank containing a plating solution, wherein the substrate is plated. The holding means has a first holding member and a second holding member for holding the substrate, the second holding member has an opening exposing a surface of the substrate to be plated, a sealing member attached around the opening, A conductive member that is in contact with a surface edge of the substrate partitioned by a seal member so as not to come into contact with a plating solution, and is configured to hold the substrate with a surface to be plated facing downward; A rotating means for rotating around a rotation axis in a plane holding the substrate in the means and / or a moving means for moving in the axial direction of the rotation axis is attached to the upper structure disposed on the plating tank, Said A plating apparatus for a substrate, further comprising a structure opening / closing drive means for driving an upper structure to open / close.
【請求項6】 基板に電解メッキをする基板のメッキ方
法であって、 基板を基板保持手段の第一保持部材と第二保持部材の間
に挟持して保持させる工程、該基板保持手段をメッキ槽
内の所定の位置まで移動させて配置する工程、該基板の
露出された表面にメッキを行う工程、該基板保持手段を
メッキ液面上にまで移動させた後回転させてメッキ液を
除去する工程、該基板保持手段を基板の保持を解除する
位置まで移動させる工程、該基板保持手段の基板保持を
解除する工程、第二保持部材を取り除き基板を取り出す
工程からなることを特徴とする基板のメッキ方法。
6. A method for plating a substrate by electroplating the substrate, wherein the substrate is sandwiched and held between a first holding member and a second holding member of the substrate holding means, and the substrate holding means is plated. Removing the plating solution by moving the substrate holding means to a predetermined position in the tank, plating the exposed surface of the substrate, and moving the substrate holding means onto the plating solution surface and then rotating the substrate holding means; A step of moving the substrate holding means to a position where the holding of the substrate is released, a step of releasing the holding of the substrate by the substrate holding means, and a step of removing the second holding member and removing the substrate. Plating method.
JP10323919A 1998-11-13 1998-11-13 Device and method for plating substrate Pending JP2000150421A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10323919A JP2000150421A (en) 1998-11-13 1998-11-13 Device and method for plating substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10323919A JP2000150421A (en) 1998-11-13 1998-11-13 Device and method for plating substrate

Publications (1)

Publication Number Publication Date
JP2000150421A true JP2000150421A (en) 2000-05-30

Family

ID=18160099

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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JP2019007075A (en) * 2017-06-28 2019-01-17 株式会社荏原製作所 Substrate holder and plating device
WO2019003891A1 (en) * 2017-06-28 2019-01-03 株式会社荏原製作所 Substrate holder and plating device
KR20200021919A (en) * 2017-06-28 2020-03-02 가부시키가이샤 에바라 세이사꾸쇼 Board Holders & Plating Devices
JP2021191902A (en) * 2017-06-28 2021-12-16 株式会社荏原製作所 Substrate holder and plating device
US11299817B2 (en) 2017-06-28 2022-04-12 Ebara Corporation Holder for holding substrate and system for plating
JP7220758B2 (en) 2017-06-28 2023-02-10 株式会社荏原製作所 Substrate holder and plating equipment
KR102498053B1 (en) 2017-06-28 2023-02-10 가부시키가이샤 에바라 세이사꾸쇼 Substrate holder and plating device
US11718925B2 (en) 2017-06-28 2023-08-08 Ebara Corporation Holder for holding substrate and system for plating
CN112864084A (en) * 2021-03-10 2021-05-28 新阳硅密(上海)半导体技术有限公司 Wafer clamp

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