JP2000097864A5 - - Google Patents

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JP2000097864A5
JP2000097864A5 JP1998266631A JP26663198A JP2000097864A5 JP 2000097864 A5 JP2000097864 A5 JP 2000097864A5 JP 1998266631 A JP1998266631 A JP 1998266631A JP 26663198 A JP26663198 A JP 26663198A JP 2000097864 A5 JP2000097864 A5 JP 2000097864A5
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Prior art keywords
illumination light
light source
substrate
illumination
visual inspection
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JP1998266631A
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JP2000097864A (en
JP4576006B2 (en
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Description

【特許請求の範囲】
【請求項1】 基板の表面を照射して目視で検査する外観検査装置において、
反射ミラーを介して前記基板に対して部分照明する照明光源と、
この照明光源と前記反射ミラーの相対位置関係に応じて照明光束の照射方向を可変する照射可変手段とを具備したことを特徴とする外観検査用投光装置。
【請求項2】 基板の表面を照射して欠陥などの検査する外観検査装置において、
前記基板面積に対して小さな領域を部分照明する照明光源と、
この記照明光源の照明光路中に配置され、前記照明光源から照射される照明光を前記基板に収束させるフレネルレンズと、
このフレネルレンズを通して前記照明光源からの照明光を前記基板上で走査させるように照明光束の照射方向を可変する照射可変手段とを具備したことを特徴とする外観検査用投光装置。
【請求項3】 前記基板を保持して観察者による目視検査のために所定角度に傾斜させるホルダと、
このホルダより上方に配置され、前記基板を部分照明する照明光源と、
この照明光源と前記ホルダとの間に配置され、前記照明光源から出射された照明光を前記ホルダに保持された前記基板に向けて反射させる反射ミラーと、
この記反射ミラーと前記ホルダとの間に配置され、前記反射ミラー7で反射した前記照明光を収束させるフレネルレンズと、
前記照明光源と前記反射ミラーの相対位置関係に応じて照明光束の照射方向を可変する照射可変手段とを具備したことを特徴とする外観検査用投光装置。
【請求項4】 前記照射可変手段は、照明光軸が中心向くように前記照明光源を直線移動可能に設けたことを特徴とする請求項1乃至3のいずれかに記載の外観検査用投光装置。
【請求項5】 前記照射可変手段は、前記基板の外形データに応じて前記基板上に複数の観察区画が設定され、これらの各観察区画を照明する各照明位置に前記照明光源を移動させることを特徴とする請求項1乃至3のいずれかに記載の外観検査用投光装置。
【請求項6】 前記照射可変手段は、前記基板の外形データに応じて複数の照明位置が決められ、前記各照明位置に前記照明光源順次移動することを特徴とする請求項1乃至3のいずれかに記載の外観検査用投光装置。
【請求項7】 前記照射可変手段は、前記基板の外形データに応じて前記照明光源の移動範囲が設定され、こに移動範囲内で前記照明光源を移動させることを特徴とする請求項1乃至3のいずれかに記載の外観検査用投光装置。
【請求項8】 前記照射可変手段は、前記反射ミラーの反射角度を調整して、この反射ミラーで反射された前記照明光束を前記基板上で走査させることを特徴とする請求項1乃至3のいずれかに記載の外観検査用投光装置。
[Claims]
[Claim 1] In a visual inspection device that irradiates the surface of a substrate and visually inspects it.
An illumination light source that partially illuminates the substrate via a reflection mirror,
A light projecting apparatus for visual inspection, comprising: an irradiation variable means for changing an irradiation direction of an illumination luminous flux according to a relative positional relationship between the illumination light source and the reflection mirror.
2. In a visual inspection device that irradiates the surface of a substrate to inspect for defects, etc.
An illumination light source that partially illuminates a small area with respect to the substrate area,
thisA Fresnel lens that is arranged in the illumination optical path of the illumination light source and converges the illumination light emitted from the illumination light source on the substrate.
A light projecting apparatus for visual inspection, comprising: an irradiation variable means for changing an irradiation direction of an illumination light flux so that the illumination light from the illumination light source is scanned on the substrate through the Fresnel lens.
3. A holder that holds the substrate and inclines it at a predetermined angle for visual inspection by an observer.
An illumination light source, which is arranged above the holder and partially illuminates the substrate,
A reflective mirror arranged between the illumination light source and the holder and reflecting the illumination light emitted from the illumination light source toward the substrate held by the holder.
A Fresnel lens arranged between the reflection mirror and the holder and for converging the illumination light reflected by the reflection mirror 7.
A light projecting apparatus for visual inspection, comprising: an irradiation variable means for changing an irradiation direction of an illumination luminous flux according to a relative positional relationship between the illumination light source and the reflection mirror.
4. The irradiation variable means isAccording to any one of claims 1 to 3, the illumination light source is provided so as to be linearly movable so that the illumination optical axis faces the center.The above-mentioned floodlight for visual inspection.
5. The illuminating variable means is characterized in that a plurality of observation sections are set on the substrate according to the external shape data of the substrate, and the illumination light source is moved to each illumination position for illuminating each of these observation sections. Item 3. The light source for visual inspection according to any one of Items 1 to 3.
6. The appearance according to any one of claims 1 to 3, wherein a plurality of illumination positions are determined according to the external shape data of the substrate, and the illumination light source sequentially moves to each illumination position. Light source for inspection.
7. The irradiation variable means according to any one of claims 1 to 3, wherein a moving range of the illumination light source is set according to the external shape data of the substrate, and the illumination light source is moved within the moving range. The described light source for visual inspection.
8. The method according to any one of claims 1 to 3, wherein the irradiation variable means adjusts the reflection angle of the reflection mirror to scan the illumination light flux reflected by the reflection mirror on the substrate. Floodlight for visual inspection.

【0009】
【課題を解決するための手段】 上記目的を達成するため、本願発明の外観検査用投光装置は、基板の表面を照射して目視で検査する外観検査装置において、反射ミラーを介して前記基板に対して部分照明する照明光源と、この照明光源と前記反射ミラーの相対位置関係に応じて照明光束の照射方向を可変する照射可変手段とにより構成している。
0009
[Means for solving problems] In order to achieve the above object, the visual inspection floodlight device of the present invention is an visual inspection device that irradiates the surface of a substrate and visually inspects it.It is composed of an illumination light source that partially illuminates the substrate via a reflection mirror, and an irradiation variable means that changes the irradiation direction of the illumination light flux according to the relative positional relationship between the illumination light source and the reflection mirror.

また、本願発明の外観検査用投光装置は、基板の表面を照射して欠陥などの検査する外観検査装置において、前記基板面積に対して小さな領域を部分照明する照明光源と、この記照明光源の照明光路中に配置され、前記照明光源から照射される照明光を前記基板に収束させるフレネルレンズと、このフレネルレンズを通して前記照明光源からの照明光を前記基板上で走査させるように照明光束の照射方向を可変する照射可変手段とにより構成している。 Further, the appearance inspection light projecting device of the present invention, in the inspection appearance inspection apparatus, such as a defect by irradiating the surface of the substrate, and an illumination light source for partial illumination of a small area with respect to the substrate area, this serial illumination source A Frenel lens that is arranged in the illumination light path of the above and converges the illumination light emitted from the illumination light source on the substrate, and an illumination light beam that scans the illumination light from the illumination light source on the substrate through the Frenel lens. It is composed of an irradiation variable means that changes the irradiation direction.

また、本願発明の外観検査用投光装置は、前記基板を保持して観察者による目視検査のために所定角度に傾斜させるホルダと、このホルダより上方に配置され、前記基板を部分照明する照明光源と、この照明光源と前記ホルダとの間に配置され、前記照明光源から出射された照明光を前記ホルダに保持された前記基板に向けて反射させる反射ミラーと、この記反射ミラーと前記ホルダとの間に配置され、前記反射ミラー7で反射した前記照明光を収束させるフレネルレンズと、前記照明光源と前記反射ミラーの相対位置関係に応じて照明光束の照射方向を可変する照射可変手段とにより構成している。Further, the light source for visual inspection of the present invention includes a holder that holds the substrate and inclines it at a predetermined angle for visual inspection by an observer, and an illumination that is arranged above the holder and partially illuminates the substrate. A reflection mirror arranged between the light source, the illumination light source, and the holder, and reflecting the illumination light emitted from the illumination light source toward the substrate held by the holder, and the reflection mirror and the holder. A Frenel lens that is arranged between the two and converges the illumination light reflected by the reflection mirror 7, and an irradiation variable means that changes the irradiation direction of the illumination light beam according to the relative positional relationship between the illumination light source and the reflection mirror. It is composed of.

JP26663198A 1998-09-21 1998-09-21 Projection device for visual inspection Expired - Fee Related JP4576006B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26663198A JP4576006B2 (en) 1998-09-21 1998-09-21 Projection device for visual inspection

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Application Number Priority Date Filing Date Title
JP26663198A JP4576006B2 (en) 1998-09-21 1998-09-21 Projection device for visual inspection

Publications (3)

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JP2000097864A JP2000097864A (en) 2000-04-07
JP2000097864A5 true JP2000097864A5 (en) 2005-11-04
JP4576006B2 JP4576006B2 (en) 2010-11-04

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KR20020065480A (en) * 2000-08-24 2002-08-13 올림파스 고가꾸 고교 가부시키가이샤 Floodlight for appearance inspection
TWI274183B (en) * 2002-05-31 2007-02-21 Olympus Corp Macro illumination apparatus
KR100622853B1 (en) 2004-09-22 2006-09-19 주식회사 에이디피엔지니어링 Device for appearance inspection
KR100694531B1 (en) * 2004-09-22 2007-03-13 주식회사 에이디피엔지니어링 Device for appearance inspection
JP4633499B2 (en) * 2005-02-28 2011-02-16 オリンパス株式会社 Appearance inspection apparatus and appearance inspection method
JP5006024B2 (en) * 2006-12-27 2012-08-22 オリンパス株式会社 Projection device for visual inspection
JP5006025B2 (en) * 2006-12-27 2012-08-22 オリンパス株式会社 Projection device for visual inspection
JP5740894B2 (en) * 2010-09-30 2015-07-01 凸版印刷株式会社 Inspection device for glossy surface

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JPH0358014A (en) * 1989-07-27 1991-03-13 Omron Corp Beam scanning device
JP3095855B2 (en) * 1992-02-19 2000-10-10 オリンパス光学工業株式会社 Light inspection device for visual inspection
JP3255709B2 (en) * 1992-06-17 2002-02-12 オリンパス光学工業株式会社 Board appearance inspection device
JPH08166350A (en) * 1994-12-14 1996-06-25 Omron Corp Inspection-indicating apparatus
JP3625953B2 (en) * 1996-04-03 2005-03-02 オリンパス株式会社 Projection device for visual inspection
JPH1062354A (en) * 1996-08-20 1998-03-06 Nachi Fujikoshi Corp Device and method of inspecting transparent plate for defect

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