ITUB20153221A1 - Circuito e metodo di polarizzazione di celle di memoria non volatile - Google Patents

Circuito e metodo di polarizzazione di celle di memoria non volatile

Info

Publication number
ITUB20153221A1
ITUB20153221A1 ITUB2015A003221A ITUB20153221A ITUB20153221A1 IT UB20153221 A1 ITUB20153221 A1 IT UB20153221A1 IT UB2015A003221 A ITUB2015A003221 A IT UB2015A003221A IT UB20153221 A ITUB20153221 A IT UB20153221A IT UB20153221 A1 ITUB20153221 A1 IT UB20153221A1
Authority
IT
Italy
Prior art keywords
polarization
circuit
volatile memory
memory cells
volatile
Prior art date
Application number
ITUB2015A003221A
Other languages
English (en)
Inventor
Fabio Enrico Carlo Disegni
Giuseppe Castagna
Maurizio Francesco Perroni
Original Assignee
St Microelectronics Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by St Microelectronics Srl filed Critical St Microelectronics Srl
Priority to ITUB2015A003221A priority Critical patent/ITUB20153221A1/it
Priority to EP16162017.4A priority patent/EP3136395B8/en
Priority to US15/140,796 priority patent/US9830995B2/en
Publication of ITUB20153221A1 publication Critical patent/ITUB20153221A1/it
Priority to US15/804,790 priority patent/US10115470B2/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is DC
    • G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/24—Bit-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/14—Dummy cell management; Sense reference voltage generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/10—Decoders

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Read Only Memory (AREA)
ITUB2015A003221A 2015-08-25 2015-08-25 Circuito e metodo di polarizzazione di celle di memoria non volatile ITUB20153221A1 (it)

Priority Applications (4)

Application Number Priority Date Filing Date Title
ITUB2015A003221A ITUB20153221A1 (it) 2015-08-25 2015-08-25 Circuito e metodo di polarizzazione di celle di memoria non volatile
EP16162017.4A EP3136395B8 (en) 2015-08-25 2016-03-23 Circuit and method for biasing non-volatile memory cells
US15/140,796 US9830995B2 (en) 2015-08-25 2016-04-28 Circuit and method for biasing nonvolatile memory cells
US15/804,790 US10115470B2 (en) 2015-08-25 2017-11-06 Circuit and method for biasing nonvolatile memory cells

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITUB2015A003221A ITUB20153221A1 (it) 2015-08-25 2015-08-25 Circuito e metodo di polarizzazione di celle di memoria non volatile

Publications (1)

Publication Number Publication Date
ITUB20153221A1 true ITUB20153221A1 (it) 2017-02-25

Family

ID=54477189

Family Applications (1)

Application Number Title Priority Date Filing Date
ITUB2015A003221A ITUB20153221A1 (it) 2015-08-25 2015-08-25 Circuito e metodo di polarizzazione di celle di memoria non volatile

Country Status (3)

Country Link
US (2) US9830995B2 (it)
EP (1) EP3136395B8 (it)
IT (1) ITUB20153221A1 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201900013695A1 (it) * 2019-08-01 2021-02-01 St Microelectronics Srl Circuito generatore di corrente, dispositivo includente il circuito generatore di corrente e sistema elettronico
US11355164B2 (en) 2020-04-02 2022-06-07 Micron Technology, Inc. Bias current generator circuitry
CN115774464A (zh) * 2021-09-08 2023-03-10 上海江波龙微电子技术有限公司 偏置电压提供电路、偏置电压提供方法及非易失存储芯片

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5929621A (en) * 1997-10-23 1999-07-27 Stmicroelectronics S.R.L. Generation of temperature compensated low noise symmetrical reference voltages
US6184670B1 (en) * 1997-11-05 2001-02-06 Stmicroelectronics S.R.L. Memory cell voltage regulator with temperature correlated voltage generator circuit
US20050180188A1 (en) * 2003-11-12 2005-08-18 Stmicroelectronics S.R.L. Phase-change memory device with overvoltage protection and method for protecting a phase-change memory device against overvoltages
US20080298122A1 (en) * 2007-06-01 2008-12-04 Ferdinando Bedeschi Biasing a phase change memory device
US20120218837A1 (en) * 2011-02-28 2012-08-30 Stmicroelectronics S.R.L. Voltage regulator
US20130148405A1 (en) * 2011-12-08 2013-06-13 Sang-beom Kang Semiconductor memory device and method of performing burn-in test on the same
US20130321068A1 (en) * 2012-05-31 2013-12-05 Stmicroelectronics S.R.L. Circuit for generation of an electric current with a configurable value
US20150092470A1 (en) * 2013-09-30 2015-04-02 Micron Technology, Inc. Configurable reference current generation for non volatile memory

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6134141A (en) * 1998-12-31 2000-10-17 Sandisk Corporation Dynamic write process for high bandwidth multi-bit-per-cell and analog/multi-level non-volatile memories
DE60227534D1 (de) * 2002-11-18 2008-08-21 St Microelectronics Srl Schaltung und Anordnung zur Tempeaturüberwachung von chalcogenische Elementen, insbesondere von Phasenänderungsspeicherelementen
US7012841B1 (en) * 2004-08-24 2006-03-14 Freescale Semiconductor, Inc. Circuit and method for current pulse compensation
US9917991B2 (en) * 2014-10-24 2018-03-13 Apple Inc. Camera actuator

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5929621A (en) * 1997-10-23 1999-07-27 Stmicroelectronics S.R.L. Generation of temperature compensated low noise symmetrical reference voltages
US6184670B1 (en) * 1997-11-05 2001-02-06 Stmicroelectronics S.R.L. Memory cell voltage regulator with temperature correlated voltage generator circuit
US20050180188A1 (en) * 2003-11-12 2005-08-18 Stmicroelectronics S.R.L. Phase-change memory device with overvoltage protection and method for protecting a phase-change memory device against overvoltages
US20080298122A1 (en) * 2007-06-01 2008-12-04 Ferdinando Bedeschi Biasing a phase change memory device
US20120218837A1 (en) * 2011-02-28 2012-08-30 Stmicroelectronics S.R.L. Voltage regulator
US20130148405A1 (en) * 2011-12-08 2013-06-13 Sang-beom Kang Semiconductor memory device and method of performing burn-in test on the same
US20130321068A1 (en) * 2012-05-31 2013-12-05 Stmicroelectronics S.R.L. Circuit for generation of an electric current with a configurable value
US20150092470A1 (en) * 2013-09-30 2015-04-02 Micron Technology, Inc. Configurable reference current generation for non volatile memory

Also Published As

Publication number Publication date
US20170062064A1 (en) 2017-03-02
EP3136395A1 (en) 2017-03-01
EP3136395B1 (en) 2019-09-18
EP3136395B8 (en) 2019-10-23
US20180061499A1 (en) 2018-03-01
US9830995B2 (en) 2017-11-28
US10115470B2 (en) 2018-10-30

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