ITMI20051681A1 - Componente micromeccanico e corrispondente procedimento di produzione - Google Patents
Componente micromeccanico e corrispondente procedimento di produzioneInfo
- Publication number
- ITMI20051681A1 ITMI20051681A1 IT001681A ITMI20051681A ITMI20051681A1 IT MI20051681 A1 ITMI20051681 A1 IT MI20051681A1 IT 001681 A IT001681 A IT 001681A IT MI20051681 A ITMI20051681 A IT MI20051681A IT MI20051681 A1 ITMI20051681 A1 IT MI20051681A1
- Authority
- IT
- Italy
- Prior art keywords
- correspondent
- production procedure
- micromechanical component
- micromechanical
- component
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00134—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
- B81C1/00158—Diaphragms, membranes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0278—Temperature sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/03—Static structures
- B81B2203/0315—Cavities
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Micromachines (AREA)
- Pressure Sensors (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Measuring Fluid Pressure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004044222A DE102004044222A1 (de) | 2004-09-14 | 2004-09-14 | Mikromechanisches Bauelement und entsprechendes Herstellungsverfahren |
Publications (1)
Publication Number | Publication Date |
---|---|
ITMI20051681A1 true ITMI20051681A1 (it) | 2006-03-15 |
Family
ID=35853588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT001681A ITMI20051681A1 (it) | 2004-09-14 | 2005-09-13 | Componente micromeccanico e corrispondente procedimento di produzione |
Country Status (4)
Country | Link |
---|---|
US (1) | US7435691B2 (it) |
JP (1) | JP2006084469A (it) |
DE (1) | DE102004044222A1 (it) |
IT (1) | ITMI20051681A1 (it) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100718141B1 (ko) * | 2005-12-01 | 2007-05-14 | 삼성전자주식회사 | 임베드된 정렬 마크를 이용한 양면 식각 방법 |
KR100749619B1 (ko) | 2006-08-24 | 2007-08-14 | 동부일렉트로닉스 주식회사 | 반도체 장치 형성 방법 |
US7976714B2 (en) * | 2008-01-04 | 2011-07-12 | Honeywell International Inc. | Single SOI wafer accelerometer fabrication process |
DE102008002332B4 (de) * | 2008-06-10 | 2017-02-09 | Robert Bosch Gmbh | Verfahren zur Herstellung einer mikromechanischen Membranstruktur mit Zugang von der Substratrückseite |
NL2003514C2 (en) * | 2009-09-18 | 2011-03-21 | Otb Solar Bv | Thin film deposition apparatus and method for the same. |
DE102017218635B4 (de) * | 2017-10-18 | 2021-03-18 | Infineon Technologies Ag | Verfahren zum Verschließen einer Zugangsöffnung zu einer Kavität und MEMS-Bauelement mit einem Verschlusselement |
DE102020200333A1 (de) * | 2020-01-14 | 2021-07-15 | Robert Bosch Gesellschaft mit beschränkter Haftung | Mikromechanisches Bauteil für eine Sensor- oder Mikrofonvorrichtung |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5175123A (en) * | 1990-11-13 | 1992-12-29 | Motorola, Inc. | High-pressure polysilicon encapsulated localized oxidation of silicon |
FR2672731A1 (fr) * | 1991-02-07 | 1992-08-14 | France Telecom | Procede d'oxydation localisee enterree d'un substrat de silicium et circuit integre correspondant. |
JP2850558B2 (ja) * | 1991-03-28 | 1999-01-27 | 株式会社デンソー | 半導体圧力センサおよびその製造方法 |
KR950002188B1 (ko) * | 1992-02-12 | 1995-03-14 | 삼성전자주식회사 | 반도체 장치의 소자분리 방법 |
JPH05326687A (ja) * | 1992-05-25 | 1993-12-10 | Fujitsu Ltd | Soi構造半導体装置 |
KR960005553B1 (ko) * | 1993-03-31 | 1996-04-26 | 현대전자산업주식회사 | 필드산화막 형성 방법 |
US5393692A (en) * | 1993-07-28 | 1995-02-28 | Taiwan Semiconductor Manufacturing Company | Recessed side-wall poly plugged local oxidation |
SE9304145D0 (sv) * | 1993-12-10 | 1993-12-10 | Pharmacia Lkb Biotech | Sätt att tillverka hålrumsstrukturer |
JP3403850B2 (ja) * | 1995-04-03 | 2003-05-06 | 富士通株式会社 | 半導体装置の製造方法 |
US5994203A (en) * | 1996-02-28 | 1999-11-30 | Micron Technology, Inc. | Process for stress reduction in silicon during field isolation |
US5789305A (en) * | 1997-01-27 | 1998-08-04 | Chartered Semiconductor Manufacturing Ltd. | Locos with bird's beak suppression by a nitrogen implantation |
JPH11135806A (ja) * | 1997-10-28 | 1999-05-21 | Denso Corp | 半導体圧力センサおよびその製造方法 |
US6245643B1 (en) * | 1999-04-30 | 2001-06-12 | Mosel Vitelic, Inc. | Method of removing polysilicon residual in a LOCOS isolation process using an etching selectivity solution |
-
2004
- 2004-09-14 DE DE102004044222A patent/DE102004044222A1/de not_active Withdrawn
-
2005
- 2005-09-07 US US11/221,520 patent/US7435691B2/en not_active Expired - Fee Related
- 2005-09-13 IT IT001681A patent/ITMI20051681A1/it unknown
- 2005-09-14 JP JP2005267223A patent/JP2006084469A/ja not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
US20060057755A1 (en) | 2006-03-16 |
JP2006084469A (ja) | 2006-03-30 |
US7435691B2 (en) | 2008-10-14 |
DE102004044222A1 (de) | 2006-03-16 |
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