IT9020522A0 - dispositivo ottico - Google Patents
dispositivo otticoInfo
- Publication number
- IT9020522A0 IT9020522A0 IT9020522A IT2052290A IT9020522A0 IT 9020522 A0 IT9020522 A0 IT 9020522A0 IT 9020522 A IT9020522 A IT 9020522A IT 2052290 A IT2052290 A IT 2052290A IT 9020522 A0 IT9020522 A0 IT 9020522A0
- Authority
- IT
- Italy
- Prior art keywords
- optical device
- optical
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/50—Optics for phase object visualisation
- G02B27/52—Phase contrast optics
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
- G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Prostheses (AREA)
- Eyeglasses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8907385A FR2647913B1 (fr) | 1989-06-05 | 1989-06-05 | Dispositif optique a reseau et element separateur pour le controle, par detection de phase, d'un quelconque systeme optique, en particulier d'une lentille ophtalmique |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| IT9020522A0 true IT9020522A0 (it) | 1990-06-04 |
| IT9020522A1 IT9020522A1 (it) | 1991-12-04 |
| IT1248938B IT1248938B (it) | 1995-02-11 |
Family
ID=9382357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT02052290A IT1248938B (it) | 1989-06-05 | 1990-06-04 | Dispositivo ottico a reticolo ed elemento separatore per il controllo,per rilevazione di fase,di un qualunque sistema ottico,in particolare di una lente oftalmica |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5066119A (it) |
| JP (1) | JPH0324431A (it) |
| DE (1) | DE4018004C2 (it) |
| FR (1) | FR2647913B1 (it) |
| GB (1) | GB2233449B (it) |
| IT (1) | IT1248938B (it) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5187539A (en) * | 1991-09-23 | 1993-02-16 | Rockwell International Corporation | Mirror surface characteristic testing |
| FR2689653B1 (fr) * | 1992-04-01 | 1994-05-20 | Angenieux P Ets | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure. |
| FR2710162B1 (fr) * | 1993-09-17 | 1995-11-17 | Essilor Int | Procédé de mesure absolue de la structure géométrique ou optique d'un composant optique et dispositif pour sa mise en Óoeuvre. |
| EP0644411B1 (fr) * | 1993-09-17 | 1997-03-26 | ESSILOR INTERNATIONAL (Compagnie Générale d'Optique) | Procédé de mesure absolue de la structure géométrique ou optique d'un composant optique et dispositif pour sa mise en oeuvre |
| ES2103654B1 (es) * | 1994-09-12 | 1998-05-01 | Univ Catalunya Politecnica | Dispositivo de medida de los parametros optico-geometricos de las lentes oftalmicas durante el proceso de fabricacion. |
| US6148097A (en) * | 1995-06-07 | 2000-11-14 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical member inspecting apparatus and method of inspection thereof |
| CN1041018C (zh) * | 1995-03-08 | 1998-12-02 | 中国科学院上海光学精密机械研究所 | 检测大型激光放大器的l形菲索干涉仪 |
| FR2737568B1 (fr) * | 1995-08-02 | 1997-09-26 | Essilor Int | Appareil et procede de deflectometrie a franges |
| US6043885A (en) * | 1996-07-12 | 2000-03-28 | Essilor International | Fringe deflectometry apparatus and method |
| ES2156558B1 (es) * | 1999-07-09 | 2002-03-16 | Consejo Superior Investigacion | Metodo de trazado de rayos con laser para control de calidad de lentes y sistemas opticos en general. |
| DE10327019A1 (de) * | 2003-06-12 | 2004-12-30 | Carl Zeiss Sms Gmbh | Verfahren zur Bestimmung der Abbildungsgüte eines optischen Abbildungssystems |
| US8422030B2 (en) * | 2008-03-05 | 2013-04-16 | General Electric Company | Fringe projection system with intensity modulating by columns of a plurality of grating elements |
| US7821649B2 (en) * | 2008-03-05 | 2010-10-26 | Ge Inspection Technologies, Lp | Fringe projection system and method for a probe suitable for phase-shift analysis |
| JP4805977B2 (ja) * | 2008-06-06 | 2011-11-02 | 株式会社神鋼環境ソリューション | グラスライニング製多管式熱交換器の使用方法 |
| US10157495B2 (en) | 2011-03-04 | 2018-12-18 | General Electric Company | Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object |
| US9984474B2 (en) | 2011-03-04 | 2018-05-29 | General Electric Company | Method and device for measuring features on or near an object |
| US10586341B2 (en) | 2011-03-04 | 2020-03-10 | General Electric Company | Method and device for measuring features on or near an object |
| US9875574B2 (en) | 2013-12-17 | 2018-01-23 | General Electric Company | Method and device for automatically identifying the deepest point on the surface of an anomaly |
| US10019812B2 (en) | 2011-03-04 | 2018-07-10 | General Electric Company | Graphic overlay for measuring dimensions of features using a video inspection device |
| PL2790875T3 (pl) * | 2011-12-15 | 2016-04-29 | Essilor Int | Sposób wytwarzania soczewki optycznej |
| US9818039B2 (en) | 2013-12-17 | 2017-11-14 | General Electric Company | Method and device for automatically identifying a point of interest in a depth measurement on a viewed object |
| US9842430B2 (en) | 2013-12-17 | 2017-12-12 | General Electric Company | Method and device for automatically identifying a point of interest on a viewed object |
| CN105675262B (zh) * | 2016-01-14 | 2018-12-25 | 中国科学院上海光学精密机械研究所 | 大口径高平行度光学元件波前检测装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB844933A (en) * | 1956-04-05 | 1960-08-17 | Rochelle Prescott | Optical gratings and grids, and the testing of optical elements by means of them |
| DD213056A1 (de) * | 1983-01-03 | 1984-08-29 | Zeiss Jena Veb Carl | Verfahren und einrichtung zum messen der formabweichung polierter optischer flaechen |
-
1989
- 1989-06-05 FR FR8907385A patent/FR2647913B1/fr not_active Expired - Lifetime
-
1990
- 1990-05-23 US US07/527,435 patent/US5066119A/en not_active Expired - Fee Related
- 1990-05-23 GB GB9011562A patent/GB2233449B/en not_active Expired - Fee Related
- 1990-06-04 IT IT02052290A patent/IT1248938B/it active IP Right Grant
- 1990-06-05 DE DE4018004A patent/DE4018004C2/de not_active Expired - Fee Related
- 1990-06-05 JP JP2147155A patent/JPH0324431A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR2647913A1 (fr) | 1990-12-07 |
| DE4018004C2 (de) | 1994-06-01 |
| US5066119A (en) | 1991-11-19 |
| DE4018004A1 (de) | 1990-12-13 |
| IT9020522A1 (it) | 1991-12-04 |
| GB2233449A (en) | 1991-01-09 |
| GB9011562D0 (en) | 1990-07-11 |
| IT1248938B (it) | 1995-02-11 |
| FR2647913B1 (fr) | 1991-09-13 |
| GB2233449B (en) | 1993-06-30 |
| JPH0324431A (ja) | 1991-02-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 0001 | Granted |