FR2689653B1 - Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure. - Google Patents
Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure.Info
- Publication number
- FR2689653B1 FR2689653B1 FR9203937A FR9203937A FR2689653B1 FR 2689653 B1 FR2689653 B1 FR 2689653B1 FR 9203937 A FR9203937 A FR 9203937A FR 9203937 A FR9203937 A FR 9203937A FR 2689653 B1 FR2689653 B1 FR 2689653B1
- Authority
- FR
- France
- Prior art keywords
- deflectometer
- optical device
- type optical
- phase detection
- measurement area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/0095—Relay lenses or rod lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9203937A FR2689653B1 (fr) | 1992-04-01 | 1992-04-01 | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure. |
JP5517164A JPH06508218A (ja) | 1992-04-01 | 1993-03-31 | 広い測定範囲を有する偏向型光学装置 |
US08/150,127 US5440383A (en) | 1992-04-01 | 1993-03-31 | Phase detection deflectometer-type optical device having a large measuring range |
PCT/FR1993/000323 WO1993020416A1 (fr) | 1992-04-01 | 1993-03-31 | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure |
EP93907915A EP0592631A1 (fr) | 1992-04-01 | 1993-03-31 | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9203937A FR2689653B1 (fr) | 1992-04-01 | 1992-04-01 | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2689653A1 FR2689653A1 (fr) | 1993-10-08 |
FR2689653B1 true FR2689653B1 (fr) | 1994-05-20 |
Family
ID=9428333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9203937A Expired - Fee Related FR2689653B1 (fr) | 1992-04-01 | 1992-04-01 | Dispositif optique du type deflectometre, notamment a detection de phase, a grand domaine de mesure. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5440383A (fr) |
EP (1) | EP0592631A1 (fr) |
JP (1) | JPH06508218A (fr) |
FR (1) | FR2689653B1 (fr) |
WO (1) | WO1993020416A1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5938697A (en) * | 1998-03-04 | 1999-08-17 | Scimed Life Systems, Inc. | Stent having variable properties |
GB2336444B (en) * | 1998-04-16 | 2000-08-02 | Abakus Scient Limited | Image forming apparatus with intermediate image surface |
US6592371B2 (en) | 2000-10-25 | 2003-07-15 | Duane Durbin | Method and system for imaging and modeling a three dimensional structure |
US6493073B2 (en) | 2000-12-11 | 2002-12-10 | Sheldon L. Epstein | System and method for measuring properties of an optical component |
ES2177471B2 (es) * | 2001-05-29 | 2003-11-01 | Univ Madrid Complutense | Aparato para caracterizacion optica utilizando imagenes controladas automaticamente. |
US8436997B2 (en) * | 2010-12-17 | 2013-05-07 | Xyratex Technology Limited | Optical inspection system with polarization isolation of detection system reflections |
CN102288392A (zh) * | 2011-07-29 | 2011-12-21 | 温州医学院 | 一种基于二维朗奇光栅的自由曲面眼镜片光焦度测量装置 |
CN111947603B (zh) * | 2020-07-31 | 2022-04-01 | 湘潭大学 | 一种基于openmv的无人机阳台危险物鉴定系统和方法 |
CN115655154B (zh) * | 2022-12-26 | 2023-03-10 | 常州微亿智造科技有限公司 | 一种高分辨率相位测量偏折术动态缺陷检测装置及方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2647913B1 (fr) * | 1989-06-05 | 1991-09-13 | Essilor Int | Dispositif optique a reseau et element separateur pour le controle, par detection de phase, d'un quelconque systeme optique, en particulier d'une lentille ophtalmique |
FR2647912B1 (fr) * | 1989-06-05 | 1991-09-13 | Essilor Int | Dispositif optique a reseau pour le controle, en transmission, par detection de phase, d'un quelconque systeme optique, en particulier d'une lentille ophtalmique |
US5187539A (en) * | 1991-09-23 | 1993-02-16 | Rockwell International Corporation | Mirror surface characteristic testing |
US5225890A (en) * | 1991-10-28 | 1993-07-06 | Gencorp Inc. | Surface inspection apparatus and method |
-
1992
- 1992-04-01 FR FR9203937A patent/FR2689653B1/fr not_active Expired - Fee Related
-
1993
- 1993-03-31 EP EP93907915A patent/EP0592631A1/fr not_active Ceased
- 1993-03-31 WO PCT/FR1993/000323 patent/WO1993020416A1/fr not_active Application Discontinuation
- 1993-03-31 JP JP5517164A patent/JPH06508218A/ja active Pending
- 1993-03-31 US US08/150,127 patent/US5440383A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2689653A1 (fr) | 1993-10-08 |
US5440383A (en) | 1995-08-08 |
WO1993020416A1 (fr) | 1993-10-14 |
JPH06508218A (ja) | 1994-09-14 |
EP0592631A1 (fr) | 1994-04-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property | ||
ST | Notification of lapse |