DE3871371D1 - Optische messeinrichtung. - Google Patents

Optische messeinrichtung.

Info

Publication number
DE3871371D1
DE3871371D1 DE8888311091T DE3871371T DE3871371D1 DE 3871371 D1 DE3871371 D1 DE 3871371D1 DE 8888311091 T DE8888311091 T DE 8888311091T DE 3871371 T DE3871371 T DE 3871371T DE 3871371 D1 DE3871371 D1 DE 3871371D1
Authority
DE
Germany
Prior art keywords
measuring device
optical measuring
optical
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888311091T
Other languages
English (en)
Inventor
Toshishige C O Mitsubish Nagao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE3871371D1 publication Critical patent/DE3871371D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
DE8888311091T 1988-03-15 1988-11-23 Optische messeinrichtung. Expired - Fee Related DE3871371D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63062139A JPH0674968B2 (ja) 1988-03-15 1988-03-15 光学式測定装置

Publications (1)

Publication Number Publication Date
DE3871371D1 true DE3871371D1 (de) 1992-06-25

Family

ID=13191459

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888311091T Expired - Fee Related DE3871371D1 (de) 1988-03-15 1988-11-23 Optische messeinrichtung.

Country Status (6)

Country Link
US (1) US4924105A (de)
EP (1) EP0332781B1 (de)
JP (1) JPH0674968B2 (de)
KR (1) KR920003615B1 (de)
CA (1) CA1295829C (de)
DE (1) DE3871371D1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03118405A (ja) * 1989-09-30 1991-05-21 Anritsu Corp レーザ厚み計
DE9017645U1 (de) * 1990-03-17 1991-07-04 Koenig & Bauer AG, 8700 Würzburg Laser-Mehrfachbogenkontrolle
US5351126A (en) * 1991-10-31 1994-09-27 Matsushita Electric Works, Ltd. Optical measurement system for determination of an object's profile or thickness
SE470560B (sv) * 1993-01-11 1994-08-22 Limab Laser Instrumentmek Förfarande och anordning vid mätning av avstånd varvid ett område på ett mätföremål belyses med ljus från en laserljuskälla
DE19931710C2 (de) 1999-07-08 2001-07-26 Bayer Bitterfeld Gmbh Überwachungseinrichtung für die Siegelstegbreite
JP3565178B2 (ja) * 2001-03-23 2004-09-15 オムロン株式会社 変位センサ
US6650422B2 (en) * 2001-03-26 2003-11-18 Advanced Micro Devices, Inc. Scatterometry techniques to ascertain asymmetry profile of features and generate a feedback or feedforward process control data associated therewith
US6731380B2 (en) 2001-06-18 2004-05-04 Applied Optics Center Of Delaware, Inc. Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films
JP2006308378A (ja) * 2005-04-27 2006-11-09 Yokohama Rubber Co Ltd:The 厚み測定方法及びその装置
KR100815151B1 (ko) 2005-12-09 2008-03-19 한국전자통신연구원 역산란파 측정방법과 이를 이용한 전파식별 트랜스폰더 및 판독기의 불량품 확인장치
JP2009079933A (ja) * 2007-09-25 2009-04-16 Fujinon Corp 大型サンプル測定用干渉計装置
WO2010119562A1 (ja) * 2009-04-17 2010-10-21 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
WO2010119561A1 (ja) * 2009-04-17 2010-10-21 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
JP2011059000A (ja) * 2009-09-11 2011-03-24 Toshiba Corp 放射線厚さ計
WO2017068813A1 (ja) 2015-10-23 2017-04-27 株式会社カツラ・オプト・システムズ 光学素子特性測定装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3994589A (en) * 1975-04-30 1976-11-30 Canadian Patents And Development Limited Apparatus for determining the position of a surface
JPS5428090A (en) * 1977-08-02 1979-03-02 Takayuki Wakizaka Lens centering machine
DE2926025A1 (de) * 1979-06-28 1981-01-08 Basf Ag Neuer brauner kuepenfarbstoff und verfahren zu seiner herstellung
US4806776A (en) * 1980-03-10 1989-02-21 Kley Victor B Electrical illumination and detecting apparatus
US4375921A (en) * 1980-03-13 1983-03-08 Selective Electronic Co. Ab Dimension measuring apparatus
US4298286A (en) * 1980-06-02 1981-11-03 The Carl Maxey Company Measuring apparatus
JPS6051043B2 (ja) * 1980-06-30 1985-11-12 オムロン株式会社 光電スイッチ
SE425126B (sv) * 1981-08-26 1982-08-30 Kockumation Ab Forfarande for indikering av ett foremals nervaro i en metzon och anordning for genomforande av forfarandet
JPS6117905A (ja) * 1984-07-05 1986-01-25 Canon Inc 厚さ測定装置
JPS6356015A (ja) * 1986-08-26 1988-03-10 Sankusu Kk 多光軸式光電スイツチ

Also Published As

Publication number Publication date
EP0332781A3 (en) 1990-08-29
KR890014990A (ko) 1989-10-28
CA1295829C (en) 1992-02-18
EP0332781B1 (de) 1992-05-20
JPH01235806A (ja) 1989-09-20
JPH0674968B2 (ja) 1994-09-21
US4924105A (en) 1990-05-08
KR920003615B1 (ko) 1992-05-04
EP0332781A2 (de) 1989-09-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee